Semiconductor product current test fixture

Abstract

The utility model belongs to the technical field of semiconductor testing, and particularly discloses a semiconductor product current testing clamp, which comprises a substrate, an insulating base and a locking assembly, a supporting column and an electric push rod are fixed above the substrate, a first supporting plate is fixed above the supporting column, a second supporting plate is fixed at the output end of the electric push rod, and the second supporting plate is fixed at the output end of the insulating base. The second supporting plate is located above the first supporting plate, testing clamp assemblies are fixed to the opposite faces of the first supporting plate and the second supporting plate respectively, each testing clamp assembly comprises a bearing table and an insulating base, a plurality of limiting grooves are evenly formed in the upper portion of each bearing table, limiting blocks are fixed to the lower portion of each insulating base, and the limiting blocks are embedded in the limiting grooves. An insulating sheet is connected above the insulating base, and a locking groove is formed in the side edge of the insulating base; and a limiting block is arranged on the insulating base to be matched with the limiting groove and is used for limiting the insulating base, so that follow-up mounting and locking are facilitated. After locking, the test assemblies on the first support plate and the second support plate cooperate with each other to carry out a current test.

Description

Technical Field

[0001] The utility model relates to the technical field of semiconductor testing, in particular to a current testing fixture for semiconductor products. Background Art

[0002] Semiconductor products such as diodes, transistors, MOS, IGBTs with straight-cut PIN pins are tested in high-current test fixture projects. The test current of these products can reach tens to thousands of amperes. If the test piece does not make good contact with the PIN pins of the device under test, it will cause sparks and burn the device or even burn the test instrument.

[0003] Current current test fixtures have difficulty increasing the contact area between semiconductor products. Therefore, some people set the test piece into an arc shape, which will deform when clamped, thereby increasing the contact area between the test piece and the semiconductor product. For example, Chinese utility model patent No. CN219695252U specifically discloses a high-current test fixture for semiconductor products.

[0004] However, during actual use of the current test fixture for the above-mentioned semiconductor products, people will find that in order to facilitate the disassembly and assembly of the base of the test piece, the fixture is set into a dovetail groove structure. This connection structure is relatively unstable. Some test pieces are fixed with bolts, but each disassembly and assembly requires the use of tools to unscrew the bolts, which is relatively cumbersome. Utility Model Content

[0005] The purpose of the present invention is to provide a current testing fixture for semiconductor products to solve the problems raised in the above background technology.

[0006] To achieve the above-mentioned purpose, the present invention provides the following technical solutions: a semiconductor product current test fixture, comprising a substrate, an insulating base and a locking assembly, wherein a support column and an electric push rod are fixed above the substrate, a first support plate is fixed above the support column, a second support plate is fixed to the output end of the electric push rod, the second support plate is located above the first support plate, and a test fixture assembly is fixed to the opposite surfaces of the first support plate and the second support plate, respectively, the test fixture assembly comprises a load platform and an insulating base, a plurality of limit grooves are evenly arranged above the load platform, an insulating base is arranged above each limit groove, a limit block is fixed below the insulating base, the limit block is embedded in the limit groove, an insulating sheet is connected above the insulating base, and a locking groove is arranged on the side of the insulating base. A limit block is arranged on the insulating base to cooperate with the limit groove to limit the insulating base and facilitate subsequent installation and locking. After locking, current testing can be performed by cooperating with the test assembly on the first support plate and the second support plate.

[0007] A locking assembly is installed on the side of the support platform. The locking assembly includes a screw, a movable plate, and a clamping plate. The screw is rotatably connected to the support platform, and the screw passes through the movable plate and is threaded. The clamping plate is fixed above the movable plate. Several locking plugs that adapt to the locking grooves are evenly fixed on the clamping plate. The locking plugs are inserted into the locking grooves to fix the insulating base. The locking assembly fixes the insulating base. To cancel the fixation, simply rotate the screw, use it to drive the movable plate and clamping plate away from the support platform, and withdraw the locking plugs from the locking grooves.

[0008] As a preferred embodiment of the present invention, a stabilizing rod is passed through the second support plate, the stabilizing rod and the electric push rod are parallel to each other, and the end of the stabilizing rod is fixed to the base. The stabilizing rod is provided to improve the stability of the second support plate during lifting.

[0009] As a preferred embodiment of the present invention, the bearing platform provided on the first supporting plate and the bearing platform provided on the second supporting plate are respectively fixed with bolts to achieve assembly and disassembly of the bearing platforms.

[0010] As a preferred embodiment of the present invention, a knob is fixed to the end of the screw rod, and the knob is mainly provided to facilitate the rotation of the screw rod.

[0011] As a preferred embodiment of the present invention, a limit rod is passed through the movable plate, and the end of the limit rod is fixed on the bearing platform. The limit rod can limit the movable plate when the movable plate moves, so as to prevent the movable plate from rotating with the screw rod.

[0012] Compared with the prior art, the beneficial effects of the present invention are:

[0013] The utility model provides a limiting groove on the bearing platform to cooperate with the limiting block of the insulating base to limit the insulating base, and then locks and fixes the insulating base through a locking assembly, which is convenient for later disassembly and replacement, thereby improving the practicality of the device. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 This is a schematic diagram of the three-dimensional structure of the utility model Figure 1 ;

[0015] Figure 2 This is a schematic diagram of the three-dimensional structure of the utility model Figure 2 ;

[0016] Figure 3 This is a schematic diagram of the structure of the test fixture assembly of the utility model;

[0017] Figure 4 This is a schematic diagram of the structure of the load-bearing platform of the utility model;

[0018] Figure 5 This is a schematic diagram of the insulating base structure of the utility model.

[0019] In the figure: 1. Base plate; 2. Support column; 3. First support plate; 4. Electric push rod; 5. Second support plate; 6. Carrying platform; 601. Limiting groove; 7. Insulating base; 701. Insulating sheet; 702. Limiting block; 703. Locking groove; 8. Locking assembly; 801. Screw; 8011. Knob; 802. Movable plate; 8021. Limiting rod; 803. Clamp; 8031. Locking plug. DETAILED DESCRIPTION

[0020] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0021] In the description of the present invention, it should be noted that the terms "vertical", "up", "down", "horizontal", etc. indicating orientations or positional relationships are based on the orientations or positional relationships shown in the accompanying drawings. They are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation. Therefore, they cannot be understood as limitations on the present invention.

[0022] It should also be noted that, in the description of this utility model, unless otherwise expressly specified or limited, the terms "disposed," "installed," "connected," and "connected" should be understood in a broad sense. For example, they may refer to fixed connections, detachable connections, or integral connections; they may refer to mechanical connections or electrical connections; they may refer to direct connections or indirect connections through an intermediate medium; and they may refer to internal communication between two components. Those skilled in the art will be able to understand the specific meanings of the above terms in this utility model based on specific circumstances.

[0023] See also Figure 1-5The utility model provides a technical solution: a semiconductor product current test fixture, including a base plate 1, an insulating base 7 and a locking assembly 8, wherein a support column 2 and an electric push rod 4 are fixed above the base plate 1, a first support plate 3 is fixed above the support column 2, a second support plate 5 is fixed to the output end of the electric push rod 4, the second support plate 5 is located above the first support plate 3, and a test fixture assembly is fixed on the opposite surfaces of the first support plate 3 and the second support plate 5, respectively. The test fixture assembly includes a carrying platform 6 and an insulating base 7, a plurality of limit grooves 601 are evenly opened above the carrying platform 6, an insulating base 7 is provided above each limit groove 601, a limit block 702 is fixed below the insulating base 7, the limit block 702 is embedded in the limit groove 601, an insulating sheet 701 is connected above the insulating base 7, and a locking groove 703 is opened on the side of the insulating base 7. The limit block 702 is provided on the insulating base 7 to cooperate with the limit groove 601 to limit the insulating base 7 and facilitate subsequent installation and locking. After locking, the current test can be performed by using the test components on the first support plate 3 and the second support plate 5 to cooperate with each other.

[0024] Furthermore, a locking assembly 8 is provided on the side of the support platform 6. The locking assembly 8 includes a screw 801, a movable plate 802, and a clamping plate 803. The screw 801 is rotatably connected to the support platform 6. The screw 801 passes through the movable plate 802 and is threadedly connected. The clamping plate 803 is fixed above the movable plate 802. A number of locking plugs 8031 ​​that adapt to the locking grooves 703 are evenly fixed on the clamping plate 803. The locking plugs 8031 ​​are inserted into the locking grooves 703 to fix the insulating base 7. The locking assembly 8 fixes the insulating base 7. To cancel the fixation, simply rotate the screw 801, use the screw 801 to drive the movable plate 802 and clamping plate 803 away from the support platform 6, and withdraw the locking plugs 8031 ​​from the locking grooves 703.

[0025] Furthermore, a stabilizing rod is passed through the second support plate 5 , the stabilizing rod and the electric push rod 4 are parallel to each other, and the end of the stabilizing rod is fixed to the base. The stabilizing rod is provided to improve the stability of the second support plate 5 when it is lifted or lowered.

[0026] Furthermore, the bearing platform 6 provided on the first support plate 3 and the bearing platform 6 provided on the second support plate 5 are respectively fixed with bolts to achieve assembly and disassembly of the bearing platform 6 .

[0027] Furthermore, a knob 8011 is fixed to the end of the screw rod 801 , and the knob 8011 is provided mainly to facilitate the rotation of the screw rod 801 .

[0028] Furthermore, a limiting rod 8021 is passed through the movable plate 802 , and the end of the limiting rod 8021 is fixed on the supporting platform 6 . The provided limiting rod 8021 can limit the movable plate 802 when the movable plate 802 moves, thereby preventing the movable plate 802 from rotating along with the screw rod 801 .

[0029] In summary, when the present device is in use, it is only necessary to place the pins of the semiconductor product between the first support plate 3 and the test fixture assembly on the second support plate 5, and then start the electric push rod 4 so that the electric push rod 4 pulls the second support plate 5 downward so that the insulating sheet 701 of the test fixture on the first support plate 3 and the second support plate 5 clamps the pins. After the test is completed, the second support plate 5 can be pushed upward using the electric push rod 4. When the insulating base 7 needs to be removed, it is only necessary to turn the knob 8011 so that the knob 8011 drives the screw rod 801 to rotate, so that the screw rod 801 drives the movable plate 802 to move, so that the movable plate 802 drives the clamping plate 803 to move, so that the movable plate 802 and the clamping plate 803 are away from the insulating base 7, so that the clamping plate 803 drives the locking plug 8031 ​​to withdraw from the locking groove 703 on the insulating base 7, thereby canceling the fixation and the insulating base 7 can be removed. During installation, simply insert the limit block 702 on the insulating base 7 into the limit groove 601, and then rotate the knob 8011 in the opposite direction so that the screw rod 801 drives the movable plate 802 and the clamping plate 803 close to the insulating base 7. When the locking block 8031 ​​is inserted into the locking groove 703, the insulating base 7 can be fixed.

[0030] It is worth noting that the entire device is controlled by a master control button. Since the devices matched with the control button are commonly used devices and belong to existing mature technologies, their electrical connection relationships and specific circuit structures will not be described in detail here.

[0031] Although the embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and variations may be made to these embodiments without departing from the principles and spirit of the present invention, and the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A current test fixture for semiconductor products, characterized by: The invention comprises a base plate (1), an insulating base (7) and a locking assembly (8), wherein a support column (2) and an electric push rod (4) are fixed above the base plate (1), a first support plate (3) is fixed above the support column (2), a second support plate (5) is fixed to the output end of the electric push rod (4), the second support plate (5) is located above the first support plate (3), and a test fixture assembly is fixed on the opposite surfaces of the first support plate (3) and the second support plate (5), respectively. The test fixture assembly comprises a bearing platform (6) and an insulating base (7), a plurality of limiting grooves (601) are evenly provided above the bearing platform (6), an insulating base (7) is provided above each limiting groove (601), a limiting block (702) is fixed below the insulating base (7), the limiting block (702) is embedded in the limiting groove (601), an insulating sheet (701) is connected above the insulating base (7), and a locking groove (703) is provided on the side of the insulating base (7); A locking assembly (8) is provided on the side of the bearing platform (6), and the locking assembly (8) includes a screw rod (801), a movable plate (802) and a clamping plate (803), wherein the screw rod (801) is rotatably connected to the bearing platform (6), the screw rod (801) passes through the movable plate (802) and is threadedly connected, and the clamping plate (803) is fixed above the movable plate (802), and a plurality of locking plugs (8031) adapted to the locking groove (703) are evenly fixed on the clamping plate (803), and the locking plugs (8031) are inserted into the locking groove (703) to fix the insulating base (7).

2. A semiconductor product current test fixture according to claim 1, characterized in that: A stabilizing rod is passed through the second support plate (5), the stabilizing rod and the electric push rod (4) are parallel to each other, and the end of the stabilizing rod is fixed to the base.

3. The semiconductor product current test fixture according to claim 1, characterized in that: The bearing platform (6) provided on the first supporting plate (3) and the bearing platform (6) provided on the second supporting plate (5) are respectively fixed using bolts.

4. The semiconductor product current test fixture according to claim 1, characterized in that: A knob (8011) is fixed to the end of the screw rod (801), and the knob (8011) is provided mainly to facilitate the rotation of the screw rod (801).

5. The semiconductor product current test fixture according to claim 1, characterized in that: A limiting rod (8021) passes through the movable plate (802), and the end of the limiting rod (8021) is fixed on the supporting platform (6).

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