Positioning jig for measuring thickness of electrochromic device

Abstract

The utility model discloses a positioning jig for measuring the thickness of an electrochromic device. The positioning jig comprises a base and a chuck, wherein the chuck is used for being detachably positioned and installed on the base, at least one measuring through hole is formed in the base, and a containing through groove used for containing an electrochromic device is formed in the chuck. When the chuck is detachably positioned and installed on the base, the measuring through hole is located below the chuck, and at least part of the measuring through hole is aligned with the placing through groove. The shape of the placing through groove is matched with the shape of the electrochromic device so that the electrochromic device placed in the placing through groove can be positioned. According to the utility model, the electrochromic device can be positioned, the thickness of the electrochromic device can be measured at the same point when the thickness of the electrochromic device is measured each time, and the accuracy, the consistency and the comparability of measurement results can be ensured.

Description

Technical Field

[0001] The utility model relates to a positioning jig for measuring the thickness of an electrochromic device. Background Art

[0002] Currently, because there may be slight differences in thickness at different locations on an electrochromic device, it is necessary to select multiple points in different locations to measure the thickness of the electrochromic device. The points that need to be measured are usually more distributed in the center of the electrochromic device and less distributed at the edges. Typically, different electrochromic devices of the same model need to be measured at the same points when measuring thickness, and the same electrochromic device needs to be measured at the same points twice to ensure the accuracy and consistency of the measurement results. If each measurement is not performed at the same point, the data obtained will not accurately reflect the actual thickness, and the results of different measurements will not be comparable, which will affect the accurate assessment of quality and performance.

[0003] Optical thickness gauges are commonly used in the field of electrochromic device thickness measurement, such as, but not limited to, laser thickness gauges and white light interferometer thickness gauges. For example, Chinese Patent Publication No. CN221666863U discloses a high-precision laser thickness measurement device. When using an optical thickness gauge to measure thickness, the electrochromic device must be placed on the measuring platform within the optical thickness gauge. However, the electrochromic device cannot be accurately positioned on the measuring platform, resulting in the inability to measure at the same point each time. Summary of the Invention

[0004] The technical problem to be solved by the present invention is to overcome the defects of the prior art and provide a positioning jig for measuring the thickness of an electrochromic device, which can position the electrochromic device and enable the thickness of the electrochromic device to be measured at the same point each time, thereby ensuring the accuracy, consistency and comparability of the measurement results.

[0005] In order to solve the above technical problems, the technical solution of the utility model is: a positioning fixture for measuring the thickness of an electrochromic device, comprising a base and a chuck;

[0006] The chuck is used to be detachably positioned and mounted on the base;

[0007] At least one measuring through-hole is provided on the base, and a placement through-slot for placing the electrochromic device is provided in the chuck. When the chuck is detachably positioned on the base, the measuring through-hole is located below the chuck, and at least a portion of the measuring through-hole is aligned with the placement through-slot.

[0008] The shape of the placement groove is adapted to the outer shape of the electrochromic device so as to position the electrochromic device placed in the placement groove.

[0009] Furthermore, a plurality of the measuring through holes are distributed on the base.

[0010] Furthermore, a positioning structure is provided on the base, and the chuck is used to be detachably mounted on the base and the position of the chuck on the base is defined by the positioning structure.

[0011] A specific structure of the positioning structure is further provided, wherein the positioning structure includes a positioning groove provided on the base, the chuck is used to be installed in the positioning groove, and the side wall of the positioning groove is used to abut against the edge of the chuck to limit the position of the chuck on the base.

[0012] Furthermore, a first magnetic component is provided on the base, and a second magnetic component is provided on the chuck, and the first magnetic component is used to be attracted to the second magnetic component when the chuck is installed in the positioning groove.

[0013] Furthermore, a plurality of the second magnetic components are provided, and the second magnetic components are arranged around the outer side of the placement slot.

[0014] Furthermore, the measuring through hole is located in the positioning groove.

[0015] Another specific structure of the base is further provided, wherein the base is provided with a slot, a left limiting portion, a right limiting portion, a hollow groove and a positioning portion;

[0016] The slot is used for inserting the chuck;

[0017] The left limiting portion is located above the left end portion of the slot and is used to clamp the left end portion of the chuck when the chuck is inserted into the slot;

[0018] The right limiting portion is located above the right end portion of the slot and is used to clamp the right end portion of the chuck when the chuck is inserted into the slot;

[0019] The hollow groove is located between the left limiting portion and the right limiting portion, located above the slot and communicated with the slot, and the measuring through hole is provided on the bottom wall of the slot and aligned with the hollow groove;

[0020] When the chuck is inserted into the slot and in place, the placement slot is aligned with the hollow slot and at least part of the measurement through hole is aligned with the placement slot and the positioning portion abuts against the chuck to position the chuck.

[0021] After adopting the above technical solution, the chuck is first positioned and installed on the base, and the relative position between the chuck and the base is fixed. Then, the electrochromic device is placed in the placement groove. The placement groove can position the electrochromic device and thus fix the relative position between the electrochromic device and the chuck. Then, the base is placed on the measuring platform in the optical thickness gauge, and then the base is moved so that the measuring through hole in the base is aligned with the measuring point of the optical thickness gauge. Then, the optical thickness gauge can measure the thickness of the electrochromic device at the position where the measuring through hole is located. After the measurement of one position is completed, the next measuring through hole is moved to align with the measuring point of the optical thickness gauge so that the thickness of the next position can be measured. Therefore, when measuring the thickness of different electrochromic devices and when measuring the thickness of the same electrochromic device twice, the thickness can be measured at multiple identical points each time, thereby ensuring the accuracy, consistency and comparability of the measurement results. Taking the white light interferometer thickness gauge as an example, when measuring the thickness, a white light spot will hit the electrochromic device. The position of the white light spot is the measurement point of the optical thickness gauge. Aligning the measuring through-hole with the measurement point of the optical thickness gauge is to align the measuring through-hole with the white light spot. When it is necessary to measure the thickness of electrochromic devices of different shapes, it is only necessary to remove the original chuck from the base and replace it with a new chuck and install it on the base. The shape of the placement groove on the replaced new chuck is adapted to the shape of the electrochromic device that needs to be measured, so that electrochromic devices of different shapes can also be measured at the same point. In addition, the positioning fixture for measuring the thickness of electrochromic devices according to the embodiment of the present application can also prevent the electrochromic device from being scratched by particles on the measuring platform. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Figure 1 This is a schematic structural diagram of a positioning jig for measuring the thickness of an electrochromic device according to the first embodiment of the present utility model;

[0023] Figure 2 This is a structural diagram of the chuck installed in the positioning groove according to the first embodiment of the present utility model;

[0024] Figure 3 This is a schematic structural diagram of a positioning fixture for measuring the thickness of an electrochromic device according to a second embodiment of the present utility model;

[0025] Figure 4 A structural schematic diagram of the chuck of the present utility model;

[0026] Figure 5 This is another structural schematic diagram of the chuck of the present utility model. DETAILED DESCRIPTION

[0027] In order to make the contents of the present invention more clearly understood, the present invention is further described in detail below based on specific embodiments in conjunction with the accompanying drawings. Example

[0028] like Figure 1 、 2 , 4, and 5, a positioning fixture for measuring the thickness of an electrochromic device, comprising a base 1 and a chuck 2;

[0029] The chuck 2 is used to be detachably positioned and mounted on the base 1;

[0030] The base 1 is provided with at least one measuring through-hole 3, and the chuck 2 is provided with a placement through-slot 4 for placing the electrochromic device. When the chuck 2 is detachably positioned on the base 1, the measuring through-hole 3 is located below the chuck 2 and at least a portion of the measuring through-hole 3 is aligned with the placement through-slot 4.

[0031] The shape of the placement groove 4 is adapted to the outer shape of the electrochromic device so as to position the electrochromic device placed in the placement groove 4. Specifically, the chuck 2 is first positioned and mounted on the base 1, with the relative position between the chuck 2 and the base 1 fixed. The electrochromic device is then placed in the placement groove 4. The placement groove 4 can position the electrochromic device and thus fix the relative position between the electrochromic device and the chuck 2. The base 1 is then placed on the measuring platform of the optical thickness gauge, and the base 1 is then moved so that the measuring through-hole 3 in the base 1 is aligned with the measuring point of the optical thickness gauge. The optical thickness gauge can then measure the thickness of the electrochromic device at the location of the measuring through-hole 3. After the measurement of one position is completed, the next measuring through hole 3 is moved to align with the measuring point of the optical thickness gauge, and the thickness of the next position can be measured. Therefore, when measuring the thickness of different electrochromic devices and when measuring the thickness of the same electrochromic device twice, the thickness can be measured at multiple identical points each time, thereby ensuring the accuracy, consistency and comparability of the measurement results.

[0032] To be more specific, taking the white light interferometer thickness gauge as an example, when measuring thickness, a white light spot will be hit on the electrochromic device. The position of the white light spot is the measurement point of the optical thickness gauge. Aligning the measuring through hole 3 with the measurement point of the optical thickness gauge is to align the measuring through hole 3 with the white light spot.

[0033] To be more specific, when it is necessary to measure the thickness of electrochromic devices of different shapes, it is only necessary to remove the original chuck 2 from the base 1 and replace it with a new chuck 2 and install it on the base 1. The shape of the placement slot 4 on the replaced new chuck 2 is adapted to the shape of the electrochromic device that needs to be measured, so that electrochromic devices of different shapes can also be measured at the same point.

[0034] In addition, the positioning jig for measuring the thickness of an electrochromic device according to an embodiment of the present application can also prevent the electrochromic device from being scratched by particles on the measurement platform.

[0035] like Figure 1 、 2 As shown, a plurality of measuring through holes 3 are distributed on the base 1 .

[0036] like Figure 1 、 2 As shown, a positioning structure is provided on the base 1 , and the chuck 2 is used to be detachably mounted on the base 1 and the position of the chuck 2 on the base 1 is defined by the positioning structure.

[0037] like Figure 1 、 2 As shown, the positioning structure includes a positioning groove 5 provided on the base 1, and the chuck 2 is used to be installed in the positioning groove 5. The side wall of the positioning groove 5 is used to abut against the edge of the chuck 2 to limit the position of the chuck 2 on the base 1.

[0038] like Figure 1 、 2 As shown in Figures 4 and 5, a first magnetic component 6 is provided on the base 1, and a second magnetic component 7 is provided on the chuck 2. The first magnetic component 6 is used to engage with the second magnetic component 7 when the chuck 2 is installed in the positioning groove 5, thereby magnetically adsorbing the chuck 2 in the positioning groove 5. Specifically, when installing the chuck 2, it is only necessary to place the chuck 2 in the positioning groove 5 so that the chuck 2 can be adsorbed in the positioning groove 5 by magnetic attraction. When taking it out, it is only necessary to directly remove the chuck 2 from the positioning groove 5. This is conducive to quickly replacing chucks 2 with different shapes of through grooves 4.

[0039] like Figure 1 、 2 As shown in Figures 4 and 5, there are multiple second magnetic components 7, and the second magnetic components 7 are arranged around the outer side of the placement slot 4; in this embodiment, the first magnetic components correspond to the second magnetic components 7 one by one and are respectively provided with 8.

[0040] like Figure 1 、 2As shown, the measuring through hole 3 is located in the positioning groove 5 ; in this embodiment, the first magnetic component 6 is also located in the positioning groove 5 . Example

[0041] like Figures 3-5 As shown, another positioning fixture for measuring the thickness of an electrochromic device includes a base 1 and a chuck 2;

[0042] The chuck 2 is used to be detachably positioned and mounted on the base 1;

[0043] The base 1 is provided with at least one measuring through-hole 3, and the chuck 2 is provided with a placement through-slot 4 for placing the electrochromic device. When the chuck 2 is detachably positioned on the base 1, the measuring through-hole 3 is located below the chuck 2 and at least a portion of the measuring through-hole 3 is aligned with the placement through-slot 4.

[0044] The shape of the placement groove 4 is adapted to the outer shape of the electrochromic device so as to position the electrochromic device placed in the placement groove 4. Specifically, the chuck 2 is first positioned and mounted on the base 1, with the relative position between the chuck 2 and the base 1 fixed. The electrochromic device is then placed in the placement groove 4. The placement groove 4 can position the electrochromic device and thus fix the relative position between the electrochromic device and the chuck 2. The base 1 is then placed on the measuring platform of the optical thickness gauge, and the base 1 is then moved so that the measuring through-hole 3 in the base 1 is aligned with the measuring point of the optical thickness gauge. The optical thickness gauge can then measure the thickness of the electrochromic device at the location of the measuring through-hole 3. After the measurement of one position is completed, the next measuring through hole 3 is moved to align with the measuring point of the optical thickness gauge, and the thickness of the next position can be measured. Therefore, when measuring the thickness of different electrochromic devices and when measuring the thickness of the same electrochromic device twice, the thickness can be measured at multiple identical points each time, thereby ensuring the accuracy, consistency and comparability of the measurement results.

[0045] To be more specific, taking the white light interferometer thickness gauge as an example, when measuring thickness, a white light spot will be hit on the electrochromic device. The position of the white light spot is the measurement point of the optical thickness gauge. Aligning the measuring through hole 3 with the measurement point of the optical thickness gauge is to align the measuring through hole 3 with the white light spot.

[0046] To be more specific, when it is necessary to measure the thickness of electrochromic devices of different shapes, it is only necessary to remove the original chuck 2 from the base 1 and replace it with a new chuck 2 and install it on the base 1. The shape of the placement slot 4 on the replaced new chuck 2 is adapted to the shape of the electrochromic device that needs to be measured, so that electrochromic devices of different shapes can also be measured at the same point.

[0047] In addition, the positioning jig for measuring the thickness of an electrochromic device according to an embodiment of the present application can also prevent the electrochromic device from being scratched by particles on the measurement platform.

[0048] like Figure 3 As shown, a plurality of measuring through holes 3 are distributed on the base 1 .

[0049] like Figure 3 As shown, the base 1 may be provided with a slot 8, a left limiting portion 9, a right limiting portion 10, a hollow groove 11 and a positioning portion 12;

[0050] The slot 8 is used for inserting the chuck 2;

[0051] The left limiting portion 9 is located above the left end portion of the slot 8 and is used to clamp the left end portion of the chuck 2 when the chuck 2 is inserted into the slot 8;

[0052] The right limiting portion 10 is located above the right end portion of the slot 8 and is used to clamp the right end portion of the chuck 2 when the chuck 2 is inserted into the slot 8;

[0053] The hollow groove 11 is located between the left limiting portion 9 and the right limiting portion 10, above the slot 8 and communicated with the slot 8, and the measuring through hole 3 is provided on the bottom wall of the slot 8 and aligned with the hollow groove 11;

[0054] When the chuck 2 is inserted into the slot 8, the placement slot 4 is aligned with the hollow slot 11 and at least part of the measuring through hole 3 is aligned with the placement slot 4 and the positioning portion 12 is against the chuck 2 to position the chuck 2; specifically, when installing the chuck 2, it is only necessary to insert the chuck 2 into the slot 8 and insert it to the bottom so that the positioning portion 12 is against the chuck 2 to position the chuck 2. When removing it, it is only necessary to directly pull the chuck 2 out of the slot 8. This is conducive to quickly replacing chucks 2 with different shapes of placement slots 4.

[0055] To summarize, first, the chuck 2 is positioned and installed on the base 1, and the relative position between the chuck 2 and the base 1 is fixed. Then, the electrochromic device is placed in the placement groove 4. The placement groove 4 can position the electrochromic device and thus fix the relative position between the electrochromic device and the chuck 2. Then, the base 1 is placed on the measuring platform in the optical thickness gauge, and then the base 1 is moved so that the measuring through hole 3 in the base 1 is aligned with the measuring point of the optical thickness gauge. Then, the optical thickness gauge can measure the thickness of the electrochromic device at the position where the measuring through hole 3 is located. After the measurement of one position is completed, the next measuring through hole 3 is moved to align with the measuring point of the optical thickness gauge, and the thickness of the next position can be measured. Therefore, when measuring the thickness of different electrochromic devices and when measuring the thickness of the same electrochromic device twice, the thickness can be measured at multiple identical points each time the thickness is measured, thereby ensuring the accuracy, consistency and comparability of the measurement results. Taking the white light interferometer thickness gauge as an example, when measuring the thickness, a white light spot will hit the electrochromic device. The position of the white light spot is the measurement point of the optical thickness gauge. Aligning the measuring through-hole 3 with the measurement point of the optical thickness gauge is to align the measuring through-hole 3 with the white light spot. When it is necessary to measure the thickness of electrochromic devices of different shapes, it is only necessary to remove the original chuck 2 from the base 1 and replace it with a new chuck 2 and install it on the base 1. The shape of the placement slot 4 on the replaced new chuck 2 is adapted to the shape of the electrochromic device that needs to be measured, so that electrochromic devices of different shapes can also be measured at the same point. In addition, the positioning fixture for measuring the thickness of electrochromic devices according to the embodiment of the present application can also prevent the electrochromic device from being scratched by particles on the measuring platform.

[0056] The specific embodiments described above further illustrate the technical problems, technical solutions and beneficial effects solved by the present invention. It should be understood that the above are only specific embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A positioning fixture for measuring the thickness of an electrochromic device, characterized in that: It includes a base (1) and a chuck (2); The chuck (2) is used to be detachably positioned and mounted on the base (1); At least one measuring through hole (3) is provided on the base (1), and a placement through slot (4) for placing the electrochromic device is provided in the chuck (2); when the chuck (2) is detachably positioned and mounted on the base (1), the measuring through hole (3) is located below the chuck (2) and at least a portion of the measuring through hole (3) is aligned with the placement through slot (4); The shape of the placement through groove (4) is adapted to the outer shape of the electrochromic device so as to position the electrochromic device placed in the placement through groove (4).

2. The positioning jig for measuring the thickness of an electrochromic device according to claim 1, characterized in that: A plurality of measuring through holes (3) are distributed on the base (1).

3. The positioning jig for measuring the thickness of an electrochromic device according to claim 1, characterized in that: A positioning structure is provided on the base (1); the chuck (2) is used to be detachably mounted on the base (1); and the position of the chuck (2) on the base (1) is defined by the positioning structure.

4. The positioning jig for measuring the thickness of an electrochromic device according to claim 3, characterized in that: The positioning structure comprises a positioning groove (5) provided on the base (1); the chuck (2) is used to be installed in the positioning groove (5); and the side wall of the positioning groove (5) is used to abut against the edge of the chuck (2) to define the position of the chuck (2) on the base (1).

5. The positioning jig for measuring the thickness of an electrochromic device according to claim 4, characterized in that: A first magnetic component (6) is provided on the base (1), and a second magnetic component (7) is provided on the chuck (2). The first magnetic component (6) is used to attract the second magnetic component (7) when the chuck (2) is installed in the positioning groove (5).

6. The positioning jig for measuring the thickness of an electrochromic device according to claim 5, characterized in that: A plurality of the second magnetic components (7) are provided, and the second magnetic components (7) are arranged around the outside of the placement slot (4).

7. The positioning jig for measuring the thickness of an electrochromic device according to claim 4, characterized in that: The measuring through hole (3) is located in the positioning groove (5).

8. The positioning jig for measuring the thickness of an electrochromic device according to claim 1, characterized in that: The base (1) is provided with a slot (8), a left limiting portion (9), a right limiting portion (10), a hollow slot (11) and a positioning portion (12); The slot (8) is used for inserting the chuck (2); The left limiting portion (9) is located above the left end portion of the slot (8) and is used to clamp the left end portion of the chuck (2) when the chuck (2) is inserted into the slot (8); The right limiting portion (10) is located above the right end portion of the slot (8) and is used to clamp the right end portion of the chuck (2) when the chuck (2) is inserted into the slot (8); The hollow groove (11) is located between the left limiting portion (9) and the right limiting portion (10), is located above the slot (8) and is in communication with the slot (8); the measuring through hole (3) is provided on the bottom wall of the slot (8) and is aligned with the hollow groove (11); When the chuck (2) is inserted into the slot (8) in place, the placement slot (4) is aligned with the hollow slot (11), at least a portion of the measurement through hole (3) is aligned with the placement slot (4), and the positioning portion (12) abuts against the chuck (2) to position the chuck (2).

Images