Testing device for sensor production
Through the integrated and intelligent sensor testing device, the problems of low efficiency and high cost of traditional sensor testing methods have been solved, efficient and accurate sensor testing and mass production have been achieved, and production efficiency and system integration flexibility have been improved.
Patent Information
- Application Number
- CN202422816565.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-18
- Publication Date
- 2025-09-19
- Estimated Expiration
- 2034-11-18
AI Technical Summary
Traditional sensor testing methods rely on manual operations, resulting in low efficiency, high costs, and inaccurate testing, making it difficult to adapt to the testing needs of mass production and different types of sensors.
An integrated and intelligent sensor testing device is designed, which includes computer equipment, data transceiver module, micro control unit, circuit unit, interface array unit and power circuit unit. It supports simultaneous testing of multiple sensors and combines intelligent analysis module and fault warning module to realize automatic data analysis and warning.
It improves the efficiency and accuracy of sensor testing, reduces human errors, realizes the standardization and normalization of mass production, reduces production costs, and improves production yield and system integration flexibility.
Smart Images

Figure CN223361481U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of sensor detection, in particular to a testing device for sensor production. Background Art
[0002] In modern industrial automation and intelligent manufacturing, sensors, as core components of the perception layer, ensure stable and accurate performance, directly impacting the efficient, safe, and reliable operation of the entire system. With the rapid development of technologies such as the Internet of Things, big data, and artificial intelligence, the demand for sensors has increased dramatically, placing higher demands on sensor production testing. Traditional sensor testing methods may be feasible for small-scale production. Typically, during small-batch sensor testing and production, due to the small production quantities, each sensor can be individually numbered. If problems arise during testing and production, the faulty sensor can be located and tested based on the number. However, faced with the demands of large-scale, high-efficiency production, problems such as low efficiency, high costs, and inaccurate testing have gradually emerged.
[0003] Specifically, traditional testing methods often rely on manual numbering, testing, and recording of each sensor. This is not only time-consuming and labor-intensive, but also prone to human error, resulting in reduced reliability of test results. Furthermore, with the increasing diversity and complexity of sensor types, traditional testing methods are unable to adapt to the testing needs of different sensor types, resulting in limited test coverage and an inability to fully evaluate sensor performance. Therefore, developing a device that can automatically, efficiently, and accurately complete large-scale sensor testing has become a pressing need in current sensor production technology. Utility Model Content
[0004] The main purpose of the utility model is to propose a testing device for sensor production, which aims to at least solve the technical problems of traditional testing methods that often rely on manual numbering, testing, and recording one by one, which is not only time-consuming and labor-intensive, but also prone to human errors, resulting in reduced reliability of test results. In particular, for the testing of large quantities of sensors, the test is inefficient, costly, and inaccurate, as well as how to connect sensors to system integration in mass production.
[0005] To achieve the above objectives, the present invention provides a sensor production test device, which includes:
[0006] A computer device, wherein the computer device is communicatively connected to a plurality of data transceiver modules, and the data transceiver modules are communicatively connected to a plurality of sensors for testing;
[0007] Wherein, the data transceiver module includes:
[0008] A micro control unit, communicatively connected to the computer device;
[0009] a circuit unit, communicatively connected to the micro control unit, and the circuit unit is communicatively connected to a plurality of data selectors;
[0010] an interface array unit connected to the data selector; and
[0011] a power circuit unit electrically connected to the micro control unit, the circuit unit, the data selector, and the interface array unit;
[0012] The interface array unit is connected to a plurality of sensors for testing.
[0013] In one embodiment, the testing device further includes: an intelligent analysis module and a fault warning module; the computer device uses a built-in intelligent analysis module to perform real-time analysis on the collected sensor data and quickly identify sensors with abnormal or unqualified performance; the fault warning module issues a warning based on the analysis results.
[0014] In one embodiment, the micro control unit is connected to the computer device via a CAN bus interface.
[0015] In one embodiment, the circuit unit is an RS485 circuit unit, and the RS485 circuit unit includes an A interface and a B interface.
[0016] In one embodiment, the number of the data selectors is four, and the data selectors are 16-to-1 data selectors or 32-to-1 data selectors;
[0017] Two groups of the data selectors are connected to the A interface, and the other two groups of the data selectors are connected to the B interface.
[0018] In one embodiment, the interface array unit is designed as a modular structure, and each module is a 32-channel sensor interface array unit supporting 32-channel sensor interfaces.
[0019] In one embodiment, the interface array unit includes at least a 485A line and a 485B line, and the sensor for detection is connected to the 485A line and the 485B line.
[0020] Compared with the prior art, the present invention has the following beneficial effects:
[0021] The sensor production testing device provided by the present invention, through its highly integrated and intelligent design, achieves efficient, accurate, and low-cost sensor testing. It effectively reduces the uncertainty caused by manual operation, while enabling mass production, standardized and regularized sensor production, and ensuring quality and reliability through optimized testing algorithms. It boasts higher processing speeds and enhanced data processing capabilities. Furthermore, the circuit unit supports higher data transmission rates, reducing data transmission delays and improving testing efficiency. By connecting up to 32 sensors simultaneously to a single data transceiver module, multiple sensors can be tested and inspected simultaneously. This enables mass production of sensor calibration, enhancing the scalability of calibration production, enabling flexibility in expanding production lines based on production needs, and improving the cost-effectiveness of production line establishment. In large-scale production, automated data collection, analysis, and processing significantly reduce labor costs, improve production yield, and standardize production standards. This effectively improves traditional testing methods, which often rely on manual labor, are not only time-consuming and labor-intensive but also prone to human error, resulting in reduced test result reliability. This is particularly problematic for large-scale sensor testing, which can be inefficient, costly, and inaccurate, as well as technical issues such as sensor integration into system integration in mass production. BRIEF DESCRIPTION OF THE DRAWINGS
[0022] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on the structures shown in these drawings without paying any creative work.
[0023] Figure 1 A schematic diagram of the module structure of an embodiment of a sensor production test device provided by the present invention;
[0024] Figure 2 This is a schematic diagram of the module structure of a data transceiver module of an embodiment of a sensor production test device provided by the present invention.
[0025] The realization of the purpose, functional features and advantages of the present invention will be further explained in conjunction with embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION
[0026] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts shall fall within the scope of protection of the present invention.
[0027] In addition, if the embodiments of the present invention include descriptions of "first," "second," etc., such descriptions are for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of the technical features indicated. Therefore, features specified as "first" or "second" may explicitly or implicitly include at least one of such features.
[0028] See also Figure 1 and Figure 2 The utility model discloses a test device for sensor production, which aims to improve the technical problem of poor results in the current testing process of large quantities of sensors.
[0029] Specifically, the sensor production test device includes a computer and a data transceiver module connected to it. The sensors used for testing are connected to the data transceiver module, and a single data transceiver module can be connected to multiple sensors to enable simultaneous and synchronous testing of multiple sensors.
[0030] The computer device and the data transceiver module are connected in a communication manner to enable the transmission of detection data between the data transceiver module and the computer device. A computer device is a computer device that can operate independently and provide various computing tasks for individual users. It comprises at least two parts: hardware and software. The hardware primarily consists of components such as a central processing unit (CPU), memory (RAM), a hard disk (storage device), a motherboard, a graphics card, a monitor, a keyboard, and a mouse. In this embodiment, the computer device can at least be used to display the detection status of the sensor.
[0031] Furthermore, the data transceiver module includes a microcontroller unit, a circuit unit, an interface array unit, and a power circuit unit. The microcontroller unit is connected to the computer device for communication for data transmission. The microcontroller unit and the computer device are connected via a CAN bus interface to ensure the stability of the data during transmission. The CAN bus interface is a serial communication protocol that adopts a multi-master station working mode. Any node on the network can actively send information to other nodes at any time, regardless of master or slave. Its communication medium can be a twisted pair, a coaxial cable, or an optical fiber. At the same time, the CAN bus transmits data through differential signals, with two lines, CAN_H (high data line) and CAN_L (low data line), which can effectively improve the anti-interference ability.
[0032] The circuit unit is communicatively connected to the microcontroller unit, and the circuit unit is communicatively connected to a plurality of data selectors. Among them, the circuit unit adopts an RS485 circuit unit, and the RS485 circuit unit includes an A interface and a B interface. There are four data selectors, and the data selectors are 16-select-1 data selectors. It should be noted that two groups of data selectors are connected to the A interface, and the other two groups of data selectors are connected to the B interface. By adopting the RS485 circuit unit, it is used for the sensor 485 signal and the MCU serial port to communicate. In the present utility model, the data transceiver module preferably adopts a more advanced microcontroller with a higher processing speed and stronger data processing capability. At the same time, the circuit unit is an RS485 circuit, which supports a higher data transmission rate, reduces data transmission delay, and improves test efficiency. The data selector can also further select a more integrated 32-select-1 data selector, so that a single data transceiver module can handle the test requirements of more sensors at the same time, further improving test efficiency.
[0033] Preferably, in some embodiments, the system architecture of the test device includes, in addition to a computer device and a data transceiver module, an intelligent analysis module and a fault warning module. The computer device is responsible for not only receiving and storing data but also, through a built-in intelligent analysis algorithm, performs real-time analysis of collected sensor data, quickly identifying sensors with abnormal or substandard performance. The fault warning module, based on the analysis results, issues a timely warning signal, facilitating timely intervention by production personnel and reducing the defective rate.
[0034] Furthermore, the interface array unit is connected to the data selector, and the interface array unit is designed as a modular structure. Each module is a 32-way sensor interface array unit, supporting 32-way sensor interfaces. At the same time, the interface array unit includes at least 485A line and 485B line, and the sensor used for detection is connected to the 485A line and the 485B line. The interface array unit is a key component that connects the sensor and the data transceiver module. The interface array unit in the present utility model is designed as a modular structure, which can be flexibly expanded according to actual production needs. Each module supports 32-way sensor interfaces, and the modules can be seamlessly cascaded. In theory, it can support unlimited expansion, meeting the needs of large-scale production testing. At the same time, the interface array unit also has automatic identification and configuration functions, which can automatically identify the type of sensor connected and automatically configure the corresponding test parameters, greatly simplifying the preparation work before testing.
[0035] It's important to note that the power circuit unit is electrically connected to the microcontroller unit, circuit unit, data selector, and interface array unit. This single power supply unit provides power to the microcontroller unit, circuit unit, data selector, and interface array unit. The power circuit unit can also be used to power connected sensors.
[0036] It can be understood that the interface array unit is connected to a plurality of sensors for testing.
[0037] Since sensor signals are transmitted via the 485 interface, communication requires connecting two signal lines, 485A and 485B, for proper communication. Therefore, four 16-to-1 data selectors can simultaneously switch between 32 signals, A and B. A single data transceiver module can simultaneously connect to 32 sensors, enabling simultaneous testing and inspection of multiple sensors.
[0038] In summary, the sensor production test device described above can effectively reduce the uncertainty caused by manual operation. It also enables mass production and reduces production costs. It also standardizes and normalizes sensor production, ensuring quality and reliability, and optimizing test algorithms. By connecting 32 sensors simultaneously to a single data transceiver module, multiple sensors can be tested and inspected simultaneously, effectively addressing the current technical issues that often plague large-scale sensor testing.
[0039] At the same time, the data transceiver module can be used to distribute sensors and achieve mass production. Multiple data transceiver modules can be connected through the bus to enable large quantities of sensors to be connected to the system for production testing.
[0040] The above description is merely an exemplary embodiment of the present invention and does not limit the patent scope of the present invention. All equivalent structural transformations made using the contents of the present invention specification and drawings under the technical concept of the present invention, or direct / indirect application in other related technical fields are included in the patent protection scope of the present invention.
[0041] In addition, if "and / or" or "and / or" appears throughout the text, its meaning includes three parallel solutions. For example, "A and / or B" includes solution A, solution B, or solutions that meet both A and B. In addition, the technical solutions of various embodiments may be combined with each other, but this must be based on the fact that they can be implemented by ordinary technicians in this field. If the combination of technical solutions is mutually contradictory or cannot be implemented, it shall be deemed that such combination of technical solutions does not exist and is not within the scope of protection required by this utility model.
Claims
1. A test device for sensor production, characterized in that: include: A computer device, wherein the computer device is communicatively connected to a plurality of data transceiver modules, and the data transceiver modules are communicatively connected to a plurality of sensors for testing; Wherein, the data transceiver module includes: A micro control unit, communicatively connected to the computer device; a circuit unit, communicatively connected to the micro control unit, and the circuit unit is communicatively connected to a plurality of data selectors; an interface array unit connected to the data selector; and a power circuit unit electrically connected to the micro control unit, the circuit unit, the data selector, and the interface array unit; The interface array unit is connected to a plurality of sensors for testing.
2. The sensor production testing device according to claim 1, characterized in that: The test device also includes: an intelligent analysis module and a fault warning module; the computer device uses the built-in intelligent analysis module to perform real-time analysis on the collected sensor data and quickly identify sensors with abnormal performance or unqualified performance; the fault warning module issues a warning based on the analysis results.
3. The sensor production testing device according to claim 1, characterized in that: The micro control unit is connected to the computer device via a CAN bus interface.
4. The sensor production testing device according to claim 1, characterized in that: The circuit unit adopts an RS485 circuit unit, and the RS485 circuit unit includes an A interface and a B interface.
5. The sensor production testing device according to claim 4, characterized in that: There are four data selectors, and each data selector is a 16-to-1 data selector or a 32-to-1 data selector; Two groups of the data selectors are connected to the A interface, and the other two groups of the data selectors are connected to the B interface.
6. The sensor production testing device according to claim 5, characterized in that: The interface array unit is designed as a modular structure, each module is a 32-way sensor interface array unit, supporting 32-way sensor interfaces.
7. The sensor production testing device according to claim 6, characterized in that: The interface array unit at least includes a 485A line and a 485B line, and the sensor for detection is connected to the 485A line and the 485B line.