Interface device for testing circuit board and circuit board testing system

Abstract

The embodiment of the utility model relates to the technical field of circuit board testing, and discloses an interface device for circuit board testing and a circuit board testing system. The interface device for testing the circuit board comprises a base, a first test needle bed and a bearing piece, the base is provided with a fixed part and a movable part capable of moving, and the movable part can move in the direction close to / away from the fixed part. The first test needle bed is detachably connected with the fixing piece, and the first test needle bed is provided with a plurality of first test probes which are in one-to-one correspondence with a plurality of test points on the circuit board to be tested. The bearing part is connected with the fixed part, is located on the moving path of the movable part, and is used for bearing the to-be-tested circuit board and enabling the test point on the to-be-tested circuit board to face the corresponding first test probe on the first test probe bed. According to the interface device for circuit board testing and the circuit board testing system provided by the embodiment of the invention, the testing efficiency and the testing accuracy can be improved.

Description

Technical Field

[0001] The embodiments of the present application relate to the technical field of circuit board testing, and in particular to an interface device for circuit board testing and a circuit board testing system. Background Art

[0002] Circuit boards are the core components of electronic products, and their functionality and performance directly impact the overall quality of the product. Effective circuit board testing can identify and eliminate defects, faults, and design errors, ensuring product performance and quality. This is crucial for improving product reliability, reducing failure rates and repair costs, complying with regulations and standards, and improving products and processes.

[0003] During circuit board testing, the circuit board under test is connected to the test circuit via a test interface. Due to the diverse types of circuit board test interfaces and the small spacing between some test points, it is necessary to change the corresponding test tool according to the different test interfaces. This makes the testing process cumbersome and time-consuming. Furthermore, it is easy to cause false touches, affecting test accuracy. Utility Model Content

[0004] The purpose of the embodiments of the present application is to provide an interface device for circuit board testing and a circuit board testing system, which can improve test efficiency and test accuracy.

[0005] In order to solve the above technical problems, an embodiment of the present application provides an interface device for circuit board testing, including a base, a first test needle bed and a carrier. The base is provided with a fixed part and a movable movable part, and the movable part can move in a direction close to / away from the fixed part. The first test needle bed is detachably connected to the fixed part, and the first test needle bed is provided with a plurality of first test probes corresponding to a plurality of test points on the circuit board to be tested. The carrier is connected to the first test needle bed, and the carrier is located on the moving path of the movable part. The carrier is used to support the circuit board to be tested and make the test points on the circuit board to be tested face the corresponding first test probes on the first test needle bed.

[0006] An embodiment of the present application further provides a circuit board testing system, which includes the above-mentioned circuit board testing interface device.

[0007] The circuit board testing interface device and circuit board testing system provided in the embodiments of the present application use a test bed of needles to test the circuit board to be tested. A first test probe on the first test bed of needles corresponds to a test point on the circuit board to be tested. After the first test probe makes electrical contact with the corresponding test point, the circuit board to be tested can be connected to the test circuit. This allows the circuit board to be tested to be tested accordingly. By binding the test bed of needles to the circuit board to be tested, the test interface can be unified and fixed, thereby improving the test efficiency and accuracy of the circuit board.

[0008] In some embodiments, the circuit board testing interface device further includes a pressing member connected to the movable member. The pressing member can move with the movable member to press against the circuit board to be tested.

[0009] In some embodiments, one of the pressing piece and the first test needle bed is provided with a guide post, and the other of the pressing piece and the first test needle bed is provided with a guide hole corresponding to the guide post. When the pressing piece is pressed against the circuit board to be tested, the guide post is inserted into the corresponding guide hole.

[0010] In some embodiments, the plurality of first test probes include a first type of probes and a second type of probes. The first type of probes and the second type of probes have different head shapes and are distributed in different areas.

[0011] In some embodiments, the carrier includes a connected positioning portion and a carrying portion, the positioning portion is connected to the first test nail bed, the carrying portion is used to carry the circuit board to be tested, and the carrying portion is provided with a first through hole for the first type of probe to pass through, and a second through hole for the second type of probe to pass through.

[0012] In some embodiments, the first test needle bed is provided with a column, an elastic member is sheathed around the column, one end of the elastic member abuts against the first test needle bed, and the other end of the elastic member abuts against the positioning portion.

[0013] In some embodiments, the interface device for circuit board testing further includes a second test needle bed, which is detachably connected to the movable part and is provided with a plurality of second test probes, which are used to cooperate with the first test probes to test the circuit board to be tested.

[0014] In some embodiments, the fixing member is provided with a support frame, the support frame is connected to an edge of the first test nail bed, and a projection of the support frame toward the first test nail bed is located outside the plurality of first test probes.

[0015] In some embodiments, the circuit board testing interface device further includes a driving member, and an output end of the driving member is connected to the movable member. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] One or more embodiments are exemplarily illustrated by pictures in the corresponding drawings. These exemplifications do not constitute limitations on the embodiments. Elements with the same reference numerals in the drawings are represented as similar elements. Unless otherwise stated, the figures in the drawings do not constitute proportional limitations.

[0017] Figure 1 is a schematic diagram of the three-dimensional structure of a circuit board testing interface device provided in some embodiments of the present application;

[0018] Figure 2This is a schematic diagram of the main structure of the circuit board testing interface device provided in some embodiments of the present application;

[0019] Figure 3 is a schematic diagram of the rear view structure of the circuit board testing interface device provided in some embodiments of the present application;

[0020] Figure 4 This is a schematic diagram of the matching structure of the first test needle bed and the pressing piece in the circuit board testing interface device provided in some embodiments of the present application. DETAILED DESCRIPTION

[0021] In order to make the purpose, technical solutions and advantages of the embodiments of the present application clearer, each embodiment of the present application will be described in detail below with reference to the accompanying drawings. However, it will be understood by those skilled in the art that in each embodiment of the present application, many technical details are proposed in order to enable the reader to better understand the present application. However, even without these technical details and various changes and modifications based on the following embodiments, the technical solutions claimed in the present application can be implemented. The division of the following embodiments is for convenience of description and should not constitute any limitation on the specific implementation of the present application. The various embodiments can be combined with each other and referenced to each other under the premise of no contradiction.

[0022] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the art to which this application belongs; the terms used herein are for the purpose of describing specific embodiments only and are not intended to limit this application; the terms "including" and "having" and any variations thereof in the specification and claims of this application and the above-mentioned figure descriptions are intended to cover non-exclusive inclusions.

[0023] In the description of the embodiments of this application, the technical terms "first" and "second" are used only to distinguish different objects and should not be understood to indicate or imply relative importance or implicitly specify the quantity, specific order, or primary and secondary relationship of the indicated technical features. In the description of the embodiments of this application, the meaning of "plurality" is more than two, unless otherwise clearly and specifically defined.

[0024] In the description of the embodiments of this application, the term "and / or" is simply a description of the association relationship between associated objects, indicating that three relationships can exist. For example, A and / or B can represent the following three situations: A exists alone, A and B exist simultaneously, and B exists alone. In addition, the character " / " in this document generally indicates that the associated objects are in an "or" relationship.

[0025] In the description of the embodiments of the present application, unless otherwise expressly specified or limited, technical terms such as "installed," "connected," and "connected" should be understood in a broad sense. For example, they can refer to fixed connections, detachable connections, or integration; mechanical connections, or electrical connections; direct connections, or indirect connections through an intermediate medium; and can refer to internal connectivity between two components or interaction between two components. Those skilled in the art can understand the specific meanings of the above terms in the embodiments of the present application based on specific circumstances.

[0026] During circuit board testing, stimulus input is provided to the circuit board, and the circuit board's signal output is collected. The collected output results are used to determine the circuit board's performance and promptly troubleshoot defects, faults, and design errors. Circuit board test interfaces vary, and some test points are spaced too closely together, requiring the use of different test tools. This makes the circuit board testing process cumbersome and time-consuming. Furthermore, the close spacing between test points can easily lead to false touches, resulting in test failures or damage to the test equipment and circuit boards.

[0027] To this end, some embodiments of the present application provide a circuit board testing interface device that unifies and stabilizes the test interface. This ensures the accuracy and consistency of the test interface, improves test efficiency, and enhances the security, stability, and reliability of the test process.

[0028] The following combination Figures 1 to 4 , illustrating an interface device for circuit board testing provided by some embodiments of the present application. The circuit board may be an aviation power supply circuit board.

[0029] like Figures 1 to 4 As shown, the interface device for circuit board testing provided in some embodiments of the present application includes a base 11, a first test needle bed 12 and a carrier 13. The base 11 is provided with a fixed part 111 and a movable movable part 112, and the movable part 112 can move in a direction close to / away from the fixed part 111. The first test needle bed 12 is detachably connected to the fixed part 111, and the first test needle bed 12 is provided with a plurality of first test probes 121 corresponding one-to-one to a plurality of test points on the circuit board 20 to be tested. The carrier 13 is connected to the first test needle bed 12, and the carrier 13 is located on the moving path of the movable part 112. The carrier 13 is used to support the circuit board 20 to be tested and to make the test points on the circuit board 20 to be tested face the corresponding first test probes 121 on the first test needle bed 12.

[0030] The base 11 is an important part of the interface device for circuit board testing, and can provide an installation foundation for other components. The base 11 can be set as a frame-type structure or a box-type structure. The fixing part 111 is a part with a fixed position set on the base 11, which can facilitate the installation and fixation of the test needle bed and the circuit board 20 to be tested. The movable part 112 is a part that can change its position and is set on the base 11. Through the movement of the movable part 112, a pressure source can be provided for the fixation of the circuit board, so as to fix the position of the circuit board during the circuit board testing process. The fixing part 111 and the movable part 112 can be in the form of a flat plate, and the movement of the movable part 112 can be driven by setting a driving part 17 such as a motor.

[0031] The first test needle bed 12 is detachably connected to the fixture 111, allowing for easy replacement to test different types of circuit boards. The first test needle bed 12 connects test points on the circuit board to the test circuit via probes, thereby inputting test signals to the circuit board 20 under test and collecting output signals from the circuit board 20 under test. The first test probes 121 on the first test needle bed 12 are designed based on the type of circuit board 20 under test to meet the testing requirements of the circuit board 20 under test.

[0032] The carrier 13 is used to mount the circuit board 20 under test. During circuit board testing, the circuit board 20 under test can be placed on the carrier 13 so that the first test probes 121 can electrically contact corresponding test points on the circuit board 20 under test. The carrier 13 can be in the form of a flat plate.

[0033] Some embodiments of the present application provide a circuit board testing interface device that utilizes a test bed of needles to test a circuit board 20 under test. First test probes 121 on a first test bed of needles 12 correspond to test points on the circuit board 20 under test. After the first test probes 121 make electrical contact with the corresponding test points, the circuit board 20 under test can be connected to a test circuit, thereby performing corresponding tests on the circuit board 20 under test. By binding the test bed of needles to the circuit board 20 under test, a unified and fixed test interface can be achieved, thereby improving circuit board testing efficiency and accuracy.

[0034] In some embodiments, the circuit board testing interface device may further include a pressing member 14 , which is connected to the movable member 112 . The pressing member 14 can move with the movable member 112 and press against the circuit board 20 to be tested.

[0035] The pressing member 14 is connected to the movable member 112 and can move with the movable member 112 to press against the circuit board 20 under test. The pressure transmitted to the circuit board 20 by the pressing member 14 causes the test points on the circuit board 20 to make close contact with the first test probe 121, ensuring connection stability during testing.

[0036] In practice, the pressing member 14 can be a flat plate. Furthermore, a pressure column 141 can be provided on the surface of the pressing member 14 away from the movable member 112. This pressure column 141 applies downward pressure to portions of the circuit board 20 under test. This ensures stable pressure transmission and disperses the pressure across locations where it is applied. By applying downward pressure to locations that do not affect the circuit board structure, damage to the circuit board 20 under test can be avoided.

[0037] In some embodiments, one of the press-fitting part 14 and the first test needle bed 12 may be provided with a guide post 15, and the other of the press-fitting part 14 and the first test needle bed 12 may be provided with a guide hole 16 corresponding to the guide post 15. When the press-fitting part 14 is pressed against the circuit board 20 to be tested, the guide post 15 is inserted into the corresponding guide hole 16.

[0038] The guide post 15 has a certain length and serves to guide the pressing member 14 to its downward position before contacting the circuit board 20 under test. This ensures that the pressing member 14 is pressed against the predetermined position on the circuit board 20 under test and ensures the stability of the pressing member 14 during the downward movement. The guide hole 16 can be a through hole or a linear bearing can be provided, with the bearing hole of the linear bearing guiding the guide post 15.

[0039] In some embodiments, the plurality of first test probes 121 may include first-type probes and second-type probes. The first-type probes and the second-type probes have different head shapes and are distributed in different areas.

[0040] Probes of different types can be adapted to different test points in different areas of the circuit board 20 under test, thereby meeting testing requirements at different locations on the circuit board 20 under test. Different probes can have pointed, cylindrical, or spherical heads. The number of different probes can be designed based on actual conditions. Furthermore, different types of probes can be grouped to identify their locations, facilitating probe inspection and maintenance.

[0041] In some embodiments, as Figure 4 As shown, the carrier 13 may include a connected positioning portion 131 and a carrying portion 132, the positioning portion 131 is connected to the first test needle bed 12, the carrying portion 132 is used to carry the circuit board 20 to be tested, and the carrying portion 132 is provided with a first through hole for the first type of probe to pass through, and a second through hole for the second type of probe to pass through.

[0042] The positioning portion 131 is the portion of the carrier 13 that is used for mounting and positioning, while the supporting portion 132 is the portion of the carrier 13 that mounts the circuit board 20 under test. The positioning portion 131 can be provided with positioning structures, such as positioning holes, to facilitate connection to the first test needle bed 12 via fasteners such as screws. The supporting portion 132 can be contoured to facilitate placement of the circuit board 20 under test. Furthermore, the supporting portion 132 is provided with through-holes to allow the first test probe 121 to pass through the carrier 13 and establish electrical contact with test points on the circuit board 20 under test.

[0043] In some embodiments, the first test needle bed 12 may be provided with a column 122 , and an elastic member 123 is sheathed around the column 122 . One end of the elastic member 123 abuts against the first test needle bed 12 , and the other end of the elastic member 123 abuts against the positioning portion 131 .

[0044] The elastic member 123 is located between the first test needle bed 12 and the positioning portion 131 of the carrier 13. When pressure is applied to the carrier 13, it compresses, thereby applying a force to the carrier 13 from the side of the circuit board 20 under test away from the movable member 112. The interaction between the force of the elastic member 123 and the downward pressure of the pressing member 14 ensures the stability of the circuit board 20 under test when it is fixed.

[0045] In some embodiments, the interface device for circuit board testing may also include a second test needle bed, which is detachably connected to the movable part 112. The second test needle bed is provided with multiple second test probes, which are used to cooperate with the first test probes 121 to test the circuit board 20 to be tested.

[0046] The second test needle bed is connected to a movable member 112 opposite the fixed member 111. This allows testing of the circuit board 20 from a side of the circuit board 20 away from the first test needle bed 12. This means that the second test needle bed and the first test needle bed 12 can test both sides of the circuit board 20, respectively. Furthermore, the second test probes on the second test needle bed can be electrically contacted with the first test probes 121 on the first test needle bed 12, enabling electrical signal extraction and transmission of the electrical signal from the first test probes 121 even when wiring is inconvenient at the bottom of the base 11. In practice, the contact between the different probes can be achieved using a shaft-hole fit.

[0047] In some embodiments, the fixture 111 may be provided with a support frame 101 , which is connected to an edge of the first test needle bed 12 , and a projection of the support frame 101 toward the first test needle bed 12 is located outside the plurality of first test probes 121 .

[0048] The support frame 101 may be a rectangular frame with a hollowed-out middle portion. The first test needle bed 12 may be connected via the support frame 101 without affecting the main structure of the first test needle bed 12 .

[0049] In some embodiments, the circuit board testing interface device may further include a driving member 17 , wherein an output end of the driving member 17 is connected to the movable member 112 .

[0050] The driving member 17 may be an electric push rod, which may drive the movable member 112 to move along a preset direction under the control of the controller, thereby moving toward or away from the fixed member 111 .

[0051] like Figures 1 to 3 As shown, the circuit board test interface device can integrate the electric push rod, test needle bed, etc. into a unified whole through the travel guide 113 and the guide rail fixing plate 114. The test needle bed can be installed with bolt fasteners, which is integrated as a whole. The installation and operation are simple, which facilitates the subsequent maintenance and replacement of the test interface. A power supply interface 115 is provided at the rear of the base 11, which can be used to power the electric push rod and the internal components of the circuit board test interface device. At the same time, the working indicator light 116 installed on the front panel of the base 11 can be used to display the power supply status of the entire test system.

[0052] The rear of the base 11 is equipped with a signal interface 117, which is used for signal transmission and data communication required for circuit board testing. This interface also includes a communication interface with the test system, allowing the test system to remotely control the electric push rod. The electric push rod drives the movable member 112 up and down, completing the connection and disconnection of the test needle bed from the circuit board 20 under test, thus automating the testing process.

[0053] The front panel of the base 11 is equipped with a local operation button 118, which can also be used to manually operate the connection and disconnection of the test interface. The local operation mode and the remote operation mode can be switched on the system software. The front panel of the base 11 is equipped with an emergency stop button 119, which can realize emergency power-off operation of the entire test system to protect the electrical equipment and personal safety during the test process, forming a first-level protection. An electrical interlocking function is designed between the base 11 and the test system. Only after the circuit board test interface device is connected to the test system can the test system start normally and perform testing. Before the circuit board test interface device is connected, the test system will not start and the test process will not be triggered, forming a second-level protection. In addition, the signal interface 117 and the power supply interface 115 are both designed with an interface identification function, that is, the circuit board test interface device must be correctly connected to the test system interface and the self-test is passed before the circuit board 20 to be tested can be tested normally, forming a third-level protection.

[0054] Furthermore, the base 11 is designed with an inspection cover with hinges and buckles, which can facilitate wiring and subsequent maintenance. The circuit board test interface device is small in size, strong in structure, light in weight, cost-effective, and can be placed on a test table in a portable manner.

[0055] Some embodiments of the present application further provide a circuit board testing system, which includes the above-mentioned circuit board testing interface device.

[0056] The PCB test system uses a computer to control the test process and output test results. The test output signal can also be displayed on an oscilloscope. The fixed test bed of nails provided by the interface device enables efficient and accurate testing of the PCB under test.

[0057] Those skilled in the art will appreciate that the above-mentioned embodiments are specific examples for implementing the present application, and that in actual applications, various changes may be made thereto in form and detail without departing from the spirit and scope of the present application.

Claims

1. An interface device for circuit board testing, characterized in that: include: The base is provided with a fixed part and a movable part, and the movable part can move toward or away from the fixed part; a first test needle bed, detachably connected to the fixing member, wherein the first test needle bed is provided with a plurality of first test probes corresponding one-to-one to a plurality of test points on the circuit board to be tested; A carrier is connected to the first test needle bed and is located on the moving path of the movable part. The carrier is used to carry the circuit board to be tested and make the test points on the circuit board to be tested face the first test probes corresponding to the first test needle bed.

2. The circuit board testing interface device according to claim 1, wherein: It also includes a pressing piece, which is connected to the movable piece and can move with the movable piece to press against the circuit board to be tested.

3. The circuit board testing interface device according to claim 2, wherein: One of the pressing part and the first test needle bed is provided with a guide column, and the other of the pressing part and the first test needle bed is provided with a guide hole corresponding to the guide column. When the pressing part is pressed against the circuit board to be tested, the guide column is inserted into the corresponding guide hole.

4. The circuit board testing interface device according to claim 1, wherein: The plurality of first test probes include a first type of probes and a second type of probes. The first type of probes and the second type of probes have different head shapes and are distributed in different areas.

5. The circuit board testing interface device according to claim 4, wherein: The carrier includes a connected positioning part and a carrying part, the positioning part is connected to the first test nail bed, the carrying part is used to carry the circuit board to be tested, and the carrying part is provided with a first through hole for the first type of probe to pass through, and a second through hole for the second type of probe to pass through.

6. The circuit board testing interface device according to claim 5, wherein: The first test needle bed is provided with a column, an elastic member is sheathed around the outer periphery of the column, one end of the elastic member abuts against the first test needle bed, and the other end of the elastic member abuts against the positioning portion.

7. The circuit board testing interface device according to claim 1, wherein: It also includes a second test needle bed, which is detachably connected to the movable part. The second test needle bed is provided with a plurality of second test probes, which are used to cooperate with the first test probes to test the circuit board to be tested.

8. The circuit board testing interface device according to claim 1, wherein: The fixing member is provided with a support frame, the support frame is connected to an edge of the first test needle bed, and a projection of the support frame toward the first test needle bed is located outside the plurality of first test probes.

9. The circuit board testing interface device according to claim 1, wherein: It also includes a driving member, an output end of which is connected to the movable member.

10. A circuit board testing system, characterized in that: The circuit board testing interface device comprises the interface device according to any one of claims 1 to 9.

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