Universal test fixture

Abstract

The utility model relates to the field of FPC (Flexible Printed Circuit) test fixtures, in particular to a universal test fixture. The device comprises a base, a lower jig is detachably and fixedly arranged on the base, an upper jig is arranged over the base, and the upper jig moves up and down to be close to or away from the lower jig; the device is characterized in that the upper jig comprises a fixed plate and a magnetic suction plate which are arranged up and down, the magnetic suction plate is detachably and fixedly connected with the fixed plate, and a plurality of magnetic suction probes are fixed on the bottom surface of the magnetic suction plate in a magnetic suction manner. For different products, only the lower jig needs to be redesigned and replaced, then an operator can move the magnetic probe on the magnetic plate of the upper jig to the corresponding position according to the point position, needing to be tested, of the lower jig, electrical performance testing of the different products is completed, the upper jig does not need to be redesigned and replaced, and therefore the testing efficiency is greatly improved. The test cost can be reduced and the test efficiency can be improved.

Description

Technical Field

[0001] The utility model relates to the field of FPC test fixtures, in particular to a universal test fixture. Background Art

[0002] The rapid development of new energy vehicles is driving the growth of the FPC manufacturing industry and, in turn, the rapid development of electronic circuits. New energy products come in a wide variety of types, each requiring a specific electrical performance test fixture. This requires the use of different test fixtures depending on the type and layout. This high cost and slow testing efficiency are the main issues associated with changing test fixtures based on model. Utility Model Content

[0003] In order to overcome the problem of high cost and low test efficiency caused by the need to redesign a set of test fixtures for different models of products, the utility model provides a universal test fixture. The technical solution adopted by the utility model to solve the technical problem is as follows:

[0004] A universal test fixture includes a base, on which a lower fixture is detachably fixedly mounted. An upper fixture is disposed directly above the base, and the upper fixture moves up / down to approach / move away from the lower fixture. The upper fixture includes a fixed plate and a magnetic plate disposed above and below. The magnetic plate is detachably fixed to the fixed plate, and a plurality of magnetic probes are magnetically fixed to the bottom surface of the magnetic plate.

[0005] Furthermore, the fixing plate is made of plastic material, and the magnetic plate is made of stainless steel material.

[0006] Furthermore, a buffer connecting plate is provided between the fixed plate and the magnetic plate. The fixed plate is detachably fixedly connected to the buffer connecting plate by screws, and the magnetic plate is detachably fixedly connected to the buffer connecting plate by screws.

[0007] Furthermore, the buffer connecting plate is made of plastic material.

[0008] Furthermore, the magnetic probe includes an upper fixing seat and a lower fixing seat, which are fixedly connected by a stud. A test probe is provided at the axial position of the upper fixing seat, and the test probe extends downward and passes through the axial center of the lower fixing seat; a magnetic component is provided on the upper fixing seat, and the upper surface of the magnetic component is flush with the upper surface of the upper fixing seat so as to stably adsorb on the bottom surface of the magnetic plate.

[0009] Furthermore, the test probe is electrically connected to the central controller via a flat cable, and the flat cable is wound and fixed on the stud.

[0010] Furthermore, the cable is a magnetic cable, and the cable is magnetically fixed to the bottom surface of the magnetic plate.

[0011] The beneficial effects of the utility model are:

[0012] This universal test fixture includes a base with a lower fixture detachably fixedly mounted on the base, and an upper fixture mounted directly above the base. The upper fixture moves up and down to move closer to and further away from the lower fixture. The upper fixture is characterized in that the upper fixture includes a fixed plate and a magnetic plate disposed vertically, the magnetic plate being detachably fixedly connected to the fixed plate, and a plurality of magnetic probes magnetically fixed to the bottom surface of the magnetic plate. For different products, only the lower fixture needs to be redesigned and replaced. Then, based on the points to be tested on the lower fixture, the operator can move the magnetic probes on the upper fixture's magnetic plate to the corresponding positions to complete the electrical performance testing of different products. Because there is no need to redesign and replace the upper fixture, testing costs can be reduced and test efficiency can be improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] The present invention will be further described below with reference to the accompanying drawings and specific embodiments, wherein:

[0014] Figure 1 This is the main view of the test fixture;

[0015] Figure 2 This is a cross-sectional view of the magnetic probe.

[0016] Figure number mark:

[0017] 100, base; 101, lower fixture;

[0018] 200, upper fixture; 201, fixing plate; 202, magnetic plate; 203, magnetic probe; 2031, upper fixing seat; 2032, lower fixing seat; 2033, stud; 2034, test probe; 2035, magnetic part; 2036, cable; 204, buffer connection plate. DETAILED DESCRIPTION

[0019] In order to better understand the purpose, structure and function of the present invention, the following is a further detailed description of a specific embodiment of the present invention "a universal test fixture" in conjunction with the accompanying drawings.

[0020] See also Figure 1 and Figure 2In this embodiment, the universal test fixture includes a base 100, on which a lower fixture 101 is detachably fixed. An upper fixture 200 is disposed directly above the base 100. The upper fixture 200 can be moved up / down to approach / move away from the lower fixture 101 to complete the test action. The upper fixture 200 includes a fixed plate 201 and a magnetic plate 202 arranged in upper and lower positions. The magnetic plate 202 is detachably fixed to the fixed plate 201, and a plurality of magnetic probes 203 are magnetically fixed to the bottom surface of the magnetic plate 202. When it is necessary to test a different model of product, only the corresponding lower fixture 101 needs to be remade. The operator replaces the remade lower fixture 101 with the base 100, and then moves the magnetic probes 203 on the magnetic plate 202 of the upper fixture 200 to the corresponding position according to the point to be tested on the lower fixture 101, and then the electrical performance test of the new product can be carried out. The entire process only requires redesigning and replacing the lower fixture 101 with a simple structure, and does not require replacing the upper fixture 200 with a relatively more complex structure, which can reduce test costs and improve test efficiency.

[0021] More specifically, in this embodiment, in order to further save costs, the fixing plate 201 is made of plastic material, and the magnetic plate 202 is made of stainless steel material.

[0022] See further Figure 1 In this embodiment, a buffer connecting plate 204 is provided between the fixed plate 201 and the magnetic plate 202. The fixed plate 201 is detachably fixedly connected to the buffer connecting plate 204 by screws, and the magnetic plate 202 is detachably fixedly connected to the buffer connecting plate 204 by screws; the buffer connecting plate 204 can not only play the role of detachably fixing the fixed plate 201 and the magnetic plate 202, but also the buffer connecting plate 204 can serve as a consumable material to play a buffering role between the fixed plate 201 and the magnetic plate 202, preventing the connection between the fixed plate 201 and the magnetic plate 202 from being damaged due to fatigue during repeated testing and requiring frequent replacement; at the same time, in order to reduce costs, the buffer connecting plate 204 is preferably made of plastic material.

[0023] See further Figure 2 In this embodiment, the magnetic probe 203 includes an upper fixing base 2031 and a lower fixing base 2032. The upper fixing base 2031 and the lower fixing base 2032 are fixedly connected by a stud 2033 to form a "mouth" structure. A test probe 2034 is provided at the axial position of the upper fixing base 2031. The test probe 2034 extends downward and passes through the axial center of the lower fixing base 2032; a magnetic component 2035 is provided on the upper fixing base 2031. The magnetic component 2035 is preferably a magnetic screw. The upper surface of the magnetic component 2035 is flush with the upper surface of the upper fixing base 2031, so that it can be stably adsorbed on the bottom surface of the magnetic plate 202.

[0024] More specifically, in this embodiment, the test probe 2034 is electrically connected to the central controller through a cable 2036. The cable 2036 is wound and fixed on the stud 2033. The cable 2036 uses a magnetic cable 2036. The cable 2036 extending out of the magnetic probe 203 can be adsorbed and fixed on the bottom surface of the magnetic plate 202. In this way, there will be no interference between the cables 2036, which facilitates the movement and magnetic fixation of the magnetic probe 203.

[0025] It is understood that the present invention is described by way of certain embodiments, and those skilled in the art will appreciate that various changes or equivalent substitutions may be made to these features and embodiments without departing from the spirit and scope of the present invention. Furthermore, under the guidance of the present invention, these features and embodiments may be modified to suit specific circumstances and materials without departing from the spirit and scope of the present invention. Therefore, the present invention is not limited to the specific embodiments disclosed herein, and all embodiments falling within the scope of the claims of this application are intended to be protected by the present invention.

[0026] In the description of this utility model, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicating positions or relationships, are based on the positions or relationships shown in the accompanying drawings and are intended solely to facilitate the description of this utility model and simplify the description. They do not indicate or imply that the devices or components referred to must have a specific orientation, be constructed, or operate in a specific orientation. Therefore, they should not be construed as limitations on this utility model. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

Claims

1. A universal test fixture, comprising a base (100), a lower fixture (101) being detachably fixedly provided on the base (100), an upper fixture (200) being provided directly above the base (100), and the upper fixture (200) being movable up / down to approach / move away from the lower fixture (101); characterized in that The upper fixture (200) comprises a fixing plate (201) and a magnetic plate (202) arranged above and below, wherein the magnetic plate (202) is detachably fixedly connected to the fixing plate (201), and a plurality of magnetic probes (203) are magnetically fixed on the bottom surface of the magnetic plate (202).

2. A universal test fixture according to claim 1, characterized in that: The fixing plate (201) is made of plastic material, and the magnetic attraction plate (202) is made of stainless steel material.

3. A universal test fixture according to claim 2, characterized in that: A buffer connection plate (204) is provided between the fixing plate (201) and the magnetic plate (202); the fixing plate (201) is detachably fixedly connected to the buffer connection plate (204) via screws; and the magnetic plate (202) is detachably fixedly connected to the buffer connection plate (204) via screws.

4. A universal test fixture according to claim 3, characterized in that: The buffer connecting plate (204) is made of plastic material.

5. A universal test fixture according to any one of claims 1 to 4, characterized in that: The magnetic probe (203) comprises an upper fixing seat (2031) and a lower fixing seat (2032), wherein the upper fixing seat (2031) and the lower fixing seat (2032) are fixedly connected via a stud (2033), and a test probe (2034) is provided at the axis of the upper fixing seat (2031), and the test probe (2034) extends downward and passes through the axis of the lower fixing seat (2032); a magnetic member (2035) is provided on the upper fixing seat (2031), and the upper surface of the magnetic member (2035) is flush with the upper surface of the upper fixing seat (2031) so as to be stably adsorbed on the bottom surface of the magnetic plate (202).

6. A universal test fixture according to claim 5, characterized in that: The test probe (2034) is electrically connected to the central controller via a flat cable (2036), and the flat cable (2036) is wound and fixed on the stud (2033).

7. A universal test fixture according to claim 6, characterized in that: The cable (2036) is a magnetic cable (2036), and the cable (2036) is magnetically fixed to the bottom surface of the magnetic plate (202).

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