Device for batch detection of infrared detectors

Abstract

The utility model provides a device for batch detection of infrared detectors, which comprises a case and a test computer arranged outside the case, and is characterized in that a black body module, a driving circuit board and a test Dewar installation mechanism are arranged on the case, and a manipulator and a test Dewar placement table are arranged beside the test Dewar installation mechanism. The black body module and the test Dewar installation mechanism are electrically connected with the drive circuit board through wires, and the drive circuit board and the manipulator are electrically connected with the test computer through wires. The test Dewar with infrared detectors to be tested inside can be placed on the test Dewar placing table in batches, and after the test Dewar is grabbed to the test Dewar mounting mechanism one by one through the manipulator, the infrared detectors to be tested inside the test Dewar are tested through the black body module. And the test data is preliminarily processed by the driving circuit board and then uploaded to the test computer for final processing, so that the infrared detector detection is completed in batches, and the test efficiency, accuracy and reliability are improved.

Description

Technical Field

[0001] The utility model relates to a testing device, in particular to a device for batch testing infrared detectors, belonging to the field of photoelectric technology. Background Art

[0002] Before an infrared detector is officially put into use, it needs to undergo multiple performance tests. During these tests, the infrared detector is usually installed in a test dewar that is easy to disassemble, and then the test dewar is connected to the test system for performance testing or inspection.

[0003] Currently, to simultaneously meet the experimental requirements of various environments in the scientific research phase, building an infrared detector test system only requires a driver circuit board, test leads, and a test computer. The test principle is as follows: a test chamber, in which the infrared detector to be tested is installed, is connected to the driver circuit board via test leads. The driver circuit board generates a DC voltage signal and a high-frequency timing signal that enable the infrared detector to operate normally. These signals are then transmitted to the infrared detector to be tested in the test chamber via the test leads. If the infrared detector to be tested is normal, a corresponding response signal is generated. These response signals are then transmitted to the driver circuit board via the test leads. The driver circuit board filters, amplifies, and splices these response signals, and then outputs them to an external test computer, thereby presenting an intuitive detection image on the test computer. At the same time, the test computer also performs performance analysis on these obtained response signals, ultimately obtaining the test results of the infrared detector to be tested.

[0004] While the aforementioned test system boasts a simple structure and ease of disassembly, as infrared detectors transition from the research phase to mass production, the surge in production makes it impossible for traditional single-detector test systems to meet the demands of mass testing. Therefore, improvements to existing technology are necessary. Summary of the Invention

[0005] In order to solve the problem that the existing infrared detector testing system cannot meet the batch testing requirements, the utility model provides a device for batch testing of infrared detectors.

[0006] The utility model is completed by the following technical solutions: a device for batch testing of infrared detectors, comprising a chassis and a test computer arranged outside the chassis, characterized in that a blackbody module, a drive circuit board, and a test dewar mounting mechanism are provided on the chassis, a manipulator and a test dewar placement table are provided next to the test dewar mounting mechanism, the blackbody module and the test dewar mounting mechanism are electrically connected to the drive circuit board through a wire, the drive circuit board and the manipulator are electrically connected to the test computer through a wire, so that a batch of test dewars containing infrared detectors to be tested can be placed on the test dewar placement table, after the manipulator grabs a test dewar one by one and places it on the test dewar mounting mechanism, the infrared detector to be tested in the test dewar can be tested by the blackbody module, and the test data is uploaded to the test computer for final processing after preliminary processing by the drive circuit board, until the detection of the infrared detectors is completed in batches.

[0007] The blackbody module includes a No. 1 blackbody and a No. 2 blackbody arranged in parallel on a first movable platform. The first movable platform is slidably arranged on a first transverse horizontal slide rail on a chassis through a slider at its bottom. A driving mechanism connected to the first movable platform is provided on the first transverse horizontal slide rail. A purge pipe and a scanning camera are provided between the No. 1 blackbody and the No. 2 blackbody. The purge pipe is connected to an external air supply mechanism, and the scanning camera is electrically connected to a test computer, so that the first movable platform and the No. 1 blackbody and the No. 2 blackbody thereon are driven to translate along the first transverse horizontal slide rail by the driving mechanism while the infrared detector to be tested in the test dewar connected to the test dewar mounting mechanism is detected, and the dust on the test dewar is purged through the purge pipe to ensure the accuracy of the test. The number on the test dewar is scanned by the scanning camera and then sent to the test computer for recording.

[0008] The test dewar installation mechanism includes a high-position fixing platform and a low-position fixing platform arranged in front of the blackbody module, and a test circuit board respectively arranged on the high and low-position fixing platforms, wherein:

[0009] A platform is provided on the high-position fixed platform, on which two vertical power cylinders are symmetrically and spaced apart. A door-shaped fixing frame is connected between the piston rods of the two vertical power cylinders. The lower ends of the two outer vertical rods of the door-shaped fixing frame are respectively connected to the piston rods, and the lower end of the vertical rod in the middle of the inner side is connected to the top of the test dewar located between the two vertical power cylinders but is not connected;

[0010] A longitudinal horizontal slide rail is provided on the low fixed platform, and the longitudinal horizontal slide rail is slidably connected to the translation platform through a slider. A conventional driving device is provided on the translation platform for driving the translation platform to move along the longitudinal horizontal slide rail;

[0011] The test circuit board includes: a close contact circuit board with a plurality of conductive contacts provided thereon and plugged into the test dewar on the high fixed platform; and a vertical stand provided on top of the translation platform of the low fixed platform and provided with a circuit board, the circuit board being provided with a plurality of spring pins that mate with the plurality of conductive contacts on the close contact circuit board;

[0012] After the test dewar containing the infrared detector to be tested is placed between the two vertical power cylinders on the tabletop of the high-position fixed platform, the lifting and lowering of the piston rods of the two vertical power cylinders drive the door-type fixing frame to rise and fall, while the vertical rod in the middle of the inner side presses the test dewar to complete the fixation. After the close-contact circuit board with several conductive contacts on it is inserted into the test dewar, the driving device drives the translation platform to move along the longitudinal horizontal slide rail until several spring pins on the circuit board on it contact the conductive contacts on the close-contact circuit board, and the infrared detector to be tested in the test dewar can be tested.

[0013] The manipulator is slidably connected to the second transverse horizontal slide rail provided on the chassis through the slider on the second movable platform. The second movable platform is provided with a driving mechanism. Two chucks are provided at intervals at the end of the manipulator so that after the test dewar is alternately picked up by the two chucks, the test dewar is sent to the test dewar installation mechanism for placement through the movement and flipping of the manipulator.

[0014] The test dewar placement table includes a cabinet with moving wheels at the bottom, a plurality of through holes at intervals on the top of the cabinet, an anti-collision ring is provided in each through hole, and a positioning block with one side inclined and the other side vertical is provided on one side of each through hole. The inclined surface of the positioning block is located on one side of the through hole so that the test dewar can be inserted into the through hole. The test dewar is positioned and fixed by the positioning block. At the same time, the anti-collision ring and the positioning block can prevent the test dewar from being damaged by collision when the robot picks up the test dewar.

[0015] A protective cover is provided on the chassis and located on the blackbody module, the test dewar installation mechanism, the manipulator and the outer cover of the test dewar placement table to protect the test process.

[0016] The utility model has the following advantages and effects: by adopting the above scheme, the test dewars containing the infrared detectors to be tested can be placed on the test dewar placing table in batches, and after the test dewars are grabbed one by one by the manipulator and placed on the test dewar mounting mechanism, the infrared detectors to be tested in the test dewars can be tested by the blackbody module, and the test data are preliminarily processed by the driving circuit board and uploaded to the test computer for final processing until the detection of the infrared detectors is completed in batches, thereby improving the test efficiency, reducing the differences caused by human operation, enabling the test to be carried out strictly in accordance with the predetermined test procedures, reducing the probability of erroneous operation, and improving the accuracy and reliability of the test. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0018] Figure 1 It is a structural diagram of the utility model;

[0019] Figure 2 for Figure 1 Structural diagram with protective cover removed;

[0020] Figure 3 for Figure 2 The bold module structure diagram in ;

[0021] Figure 4 for Figure 2 Diagram of the test dewar installation mechanism;

[0022] Figure 5 for Figure 2 The structure diagram of the manipulator in ;

[0023] Figure 6 for Figure 2 The structure diagram of the test dewar platform. DETAILED DESCRIPTION

[0024] The following will be combined with the accompanying drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention. Example

[0025] The utility model provides a device for batch testing infrared detectors, comprising a chassis 8 and a conventional test computer 1 arranged outside the chassis 8, wherein: a blackbody module 2, a conventional drive circuit board 9, and a test dewar mounting mechanism 3 are provided on the chassis 8, and a conventional manipulator 5 and a test dewar placement table 7 are provided next to the test dewar mounting mechanism 3. The blackbody module 2 and the test dewar mounting mechanism 3 are electrically connected to the drive circuit board 9 through wires, and the drive circuit board 9 and the manipulator 5 are electrically connected to the test computer 1 through wires.

[0026] In order to place a batch of conventional test dewars 6 containing infrared detectors to be tested on the test dewar display table 7, the manipulator 5 grabs one test dewar 6 one by one and places it on the test dewar installation mechanism 3, and then the infrared detectors to be tested in the test dewar 6 can be tested by the blackbody module 2, and the test data is preliminarily processed by the driver circuit board 9 and uploaded to the test computer 1 for final processing until the detection of the infrared detectors is completed in batches;

[0027] The blackbody module 2 includes a first blackbody 22 and a second blackbody 25 (the blackbody is a conventional device) arranged in parallel on a first movable platform 21. The first movable platform 21 is slidably mounted on a first horizontal slide rail 26 on the chassis 8 through a slider at its bottom. A driving mechanism (such as a motor or an electric cylinder or an air cylinder) connected to the first movable platform 21 is provided on the first horizontal slide rail 26. A purge pipe 23 and a scanning camera 24 are provided between the first blackbody 22 and the second blackbody 25. The purge pipe 23 is connected to an external air supply mechanism. The scanning camera 24 is connected to the first horizontal slide rail 26. 24 is electrically connected to the test computer 1 so that the first movable platform 21 and the No. 1 blackbody 22 and the No. 2 blackbody 25 thereon are moved along the first transverse horizontal slide rail 26 by the driving mechanism, and the No. 1 and No. 2 blackbodies 22 and 25 are used to detect the infrared detector to be tested in the test dewar 6 connected to the test dewar mounting mechanism 3, and the dust on the test dewar 6 is blown away by the purge pipe 23 to ensure the accuracy of the test, and the number on the test dewar 6 is scanned by the scanning camera 24 and sent to the test computer 1 for recording;

[0028] The test Dewar installation mechanism 3 includes a high-position fixing platform 31 and a low-position fixing platform 313 arranged in front of the blackbody module 2, and a test circuit board respectively arranged on the high and low-position fixing platforms, wherein:

[0029] A platform 32 is provided on the high-position fixed platform 31, and two vertical power cylinders 33 are symmetrically and spaced apart on the platform 32. A gate-shaped fixing frame 36 is connected between the piston rods of the two vertical power cylinders 33. The lower ends of the two outer vertical rods 35 of the gate-shaped fixing frame 36 are respectively connected to the piston rods, and the lower end of the vertical rod 38 in the middle of the inner side is connected to the top of the test dewar 6 located between the two vertical power cylinders 33 but is not connected;

[0030] A longitudinal horizontal slide rail 314 is provided on the low fixed platform 313. The longitudinal horizontal slide rail 314 is slidably connected to the translation platform 312 via a slider. The translation platform 312 is provided with a conventional driving device (such as a motor or a pneumatic cylinder or an electric cylinder) for driving the translation platform 312 to move along the longitudinal horizontal slide rail 314.

[0031] The test circuit board includes: a conventional close-contact circuit board with a plurality of conductive contacts 34, which is plugged into the test dewar 6 on the high-position fixed platform 31; and a vertical stand 39, which is mounted on top of the translation platform 312 of the low-position fixed platform 313 and has a conventional circuit board 310 mounted thereon. The conventional circuit board 310 is provided with a plurality of spring pins 311, which mate with the conductive contacts 34 on the close-contact circuit board.

[0032] After the test dewar containing the infrared detector to be tested is placed between the two vertical power cylinders 33 on the table 32 of the high-position fixed platform 31, the lifting and lowering of the piston rods of the two vertical power cylinders 33 drive the door-shaped fixing frame 36 to rise and fall, while the vertical rod 38 in the middle of the inner side presses the test dewar 6 to complete the fixation. After the close-contact circuit board with several conductive contacts 34 thereon is plugged into the test dewar 6, the driving device drives the translation platform 312 to move along the longitudinal horizontal slide rail 314 until the several spring ejectors 311 on the circuit board 310 thereon contact the conductive contacts 34 on the close-contact circuit board, and then the infrared detector to be tested in the test dewar 6 can be routinely tested.

[0033] The manipulator 5 is a conventional device, which is slidably connected to the second horizontal slide rail 51 provided on the chassis 8 through the slider on the second movable platform 52. The second movable platform 52 is provided with a conventional driving mechanism (such as a motor or a cylinder or an electric cylinder). Two conventional chucks 53 are provided at the end of the manipulator so that after the two chucks 53 alternately pick up the test dewar 6, the test dewar 6 is sent to the test dewar mounting mechanism 3 for placement by moving and flipping the manipulator 5.

[0034] The test dewar placement table 7 includes a cabinet 72 with a moving wheel 71 at the bottom, a plurality of through holes 73 at intervals on the top of the cabinet 72, each through hole 73 is provided with an anti-collision ring 75, and each through hole 73 is provided with a positioning block 74 with one side inclined and the other side vertical on one side. The inclined surface of the positioning block 74 is located on one side of the through hole 73, so that the test dewar 6 can be inserted into the through hole 73. The positioning block 74 is used to position and fix the test dewar 6. At the same time, the anti-collision ring 75 and the positioning block 74 can prevent the manipulator 5 from colliding when taking the test dewar 6, thereby causing damage to the test dewar 6.

[0035] A protective cover 4 is provided on the chassis 8 and outside the blackbody module 2, the test dewar installation mechanism 3, the manipulator 5 and the test dewar placement table 7 to protect the test device.

[0036] Throughout this specification, references to terms such as "one embodiment," "example," or "specific example" indicate that a specific feature, structure, material, or characteristic described in conjunction with that embodiment or example is included in at least one embodiment or example of the present invention. In this specification, schematic representations of these terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.

[0037] The above shows and describes the basic principles, main features, and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited to the above embodiments. The above embodiments and descriptions are merely illustrative of the principles of the present invention. Various changes and improvements may be made to the present invention without departing from the spirit and scope of the present invention. Such changes and improvements are intended to fall within the scope of the present invention. The scope of protection claimed in this invention is defined by the appended claims and their equivalents.

Claims

1. A device for batch testing infrared detectors, comprising a chassis and a test computer arranged outside the chassis, characterized in that A blackbody module, a driving circuit board, and a test dewar installation mechanism are provided on the chassis. A manipulator and a test dewar placement table are provided next to the test dewar installation mechanism. The blackbody module and the test dewar installation mechanism are electrically connected to the driving circuit board through wires, and the driving circuit board and the manipulator are electrically connected to the test computer through wires.

2. The device for batch testing infrared detectors according to claim 1, characterized in that The blackbody module includes a No. 1 blackbody and a No. 2 blackbody arranged in parallel on a first movable platform. The first movable platform is slidably arranged on a first transverse horizontal slide rail on the chassis through a slider at its bottom. A driving mechanism connected to the first movable platform is provided on the first transverse horizontal slide rail. A purge pipe and a scanning camera are provided between the No. 1 blackbody and the No. 2 blackbody. The purge pipe is connected to an external air supply mechanism, and the scanning camera is electrically connected to a test computer.

3. The device for batch testing infrared detectors according to claim 1, characterized in that The test dewar installation mechanism includes a high-position fixing platform and a low-position fixing platform arranged in front of the blackbody module, and a test circuit board respectively arranged on the high and low-position fixing platforms, wherein: A platform is provided on the high-position fixed platform, on which two vertical power cylinders are symmetrically and spaced apart. A door-shaped fixing frame is connected between the piston rods of the two vertical power cylinders. The lower ends of the two outer vertical rods of the door-shaped fixing frame are respectively connected to the piston rods, and the lower end of the vertical rod in the middle of the inner side is connected to the top of the test dewar located between the two vertical power cylinders but is not connected; A longitudinal horizontal slide rail is provided on the low fixed platform, and the longitudinal horizontal slide rail is slidably connected to the translation platform through a slider, and the translation platform is provided with a conventional driving device; The test circuit board includes: a close-contact circuit board with a plurality of conductive contacts on it, which is plugged into the test dewar on the high-position fixed platform, and a vertical stand with a circuit board on it, which is arranged on the top of the translation platform of the low-position fixed platform. The circuit board is provided with a plurality of spring pins, which are matched with a plurality of conductive contacts on the close-contact circuit board.

4. The device for batch testing infrared detectors according to claim 1, characterized in that The manipulator is slidably connected to a second transverse horizontal slide rail arranged on the chassis through a slider on the second movable platform. A driving mechanism is arranged on the second movable platform. Two clamps are arranged at intervals at the end of the manipulator.

5. The device for batch testing infrared detectors according to claim 1, characterized in that The test Dewar display table includes a cabinet with moving wheels at the bottom, a plurality of through holes at intervals on the top of the cabinet, each through hole is sleeved with an anti-collision ring, and a positioning block with one side inclined and the other side vertical is provided on one side of each through hole, and the inclined surface of the positioning block is located on one side of the through hole.

6. The device for batch testing infrared detectors according to claim 1, characterized in that A protective cover is provided on the chassis and located on the blackbody module, the test dewar installation mechanism, the manipulator and the outer cover of the test dewar placement table.

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