Probe coupling adjusting device

Abstract

A probe coupling adjusting device relates to the field of dielectric property testing of dielectric materials, and relates to microwave testing methods such as a resonant cavity method, a quasi-optical cavity method and a strip line method which need to adjust probe coupling, and comprises a probe fixing block (1), an indexing ring (2) and a fixing bottom block (3), the probe fixing block (1) is movably connected with the indexing ring (2) through an external thread (8) and an internal thread (9), and the position of the probe fixing block (1) is adjusted by rotating the indexing ring (2), so that the coupling amount is controlled; the indexing ring (2) is movably connected with the fixed bottom block (3), and the indexing ring (2) can rotate relative to the fixed bottom block (3); by rotating the indexing ring (2), the probe fixing block (1) can drive the probe to move back and forth along the X axis so as to adjust the coupling strength. The device is small in size, easy to install and high in adjusting precision.

Description

Technical Field

[0001] A probe coupling adjustment device relates to the field of material dielectric property testing, in particular to testing methods such as cylindrical cavity method, stripline method, quasi-optical cavity method and dielectric resonator method which require probe coupling adjustment. Background Art

[0002] The performance of dielectric materials is an important factor in determining the development of microelectronics and semiconductor manufacturing technologies. Accurately measuring the electromagnetic parameters of dielectric materials plays a vital role in the development of wireless communication technology and microwave and millimeter wave circuit integration. One of the important electromagnetic parameters is the complex dielectric constant. Currently, the main test methods for the complex dielectric constant are the network parameter method and the resonance method. Typical network parameter methods include the transmission reflection method, the terminal short-circuit method, and the free space method. These methods have a wide test frequency band and many test frequency points, but the test accuracy is lower than that of the resonance method and cannot meet the needs of high-precision testing. Typical resonance methods include the cylindrical cavity method, the stripline method, the quasi-optical cavity method, and the dielectric resonator method.

[0003] For the resonance method, a probe is required for coupling, so the adjustment and control of the probe coupling strength is extremely important for test accuracy and test repeatability. Summary of the Invention

[0004] The purpose of the present invention is to provide a probe coupling adjustment device to address the defects of coupling adjustment in existing resonance method tests, which can achieve precise coupling strength adjustment and control, while improving test efficiency and effectively reducing test errors caused by adjusting coupling.

[0005] To achieve the above purpose, the technical solution of the present invention is as follows:

[0006] A probe coupling adjustment device, such as Figure 1 As shown, it comprises a probe fixing block (1), a dividing ring (2), and a fixed bottom block (3); its characteristics are that the probe fixing block (1) and the dividing ring (2) are movably connected through an external thread (8) and an internal thread (9), and the dividing ring (2) is rotated to adjust the position of the probe fixing block (1), thereby controlling the coupling amount; the dividing ring (2) is movably connected to the fixed bottom block (3), and the dividing ring (2) can rotate relative to the fixed bottom block (3).

[0007] As a preferred embodiment, the position and size of the probe mounting hole (4) can be adjusted according to the probe situation, so as to adapt to different probes.

[0008] As a preferred embodiment, the lengths of the scale lines (7), the external threads (8) and the internal threads (9) can be adjusted according to actual conditions to meet different coupling adjustment stroke requirements.

[0009] As a preferred embodiment, the density of the graduation lines (10) can be adjusted according to actual conditions, thereby adapting to different coupling adjustment accuracy requirements.

[0010] As a preferred embodiment, the positioning groove (15) and the four polar positioning recesses of the positioning hole (11) are matched with ball screws, so that the indexing ring (2) can rotate relative to the fixed bottom block (3).

[0011] As a preferred embodiment, the position and size of the mounting hole (14) can be adjusted according to actual conditions to adapt to different mounting conditions; the anti-rotation hole (5) and the anti-rotation pin (12) are connected to determine the stability of the device.

[0012] The probe coupling adjustment device provided by the present invention has the following characteristics and beneficial effects:

[0013] 1. The position and size of the probe mounting hole (4) can be adjusted according to actual conditions to accommodate different probes;

[0014] Second, the position and size of the mounting hole (14) can be adjusted according to actual conditions to adapt to different mounting conditions; third, the probe coupling adjustment device can achieve fast and precise adjustment of different coupling requirements, thereby improving test efficiency; fourth, the probe coupling adjustment device can effectively reduce the repeatability error caused by adjusting the coupling. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 This is a schematic diagram of the three-dimensional structure of a probe coupling adjustment device provided by the present invention.

[0016] Figure 2 This is a schematic diagram of the internal structure of a probe coupling adjustment device provided by the present invention.

[0017] Figure 3 This is a diagram showing an example of using the probe coupling adjustment device provided by the present invention.

[0018] Among them, (1) the probe fixing block, (2) the dividing ring, (3) the fixed bottom block, (4) the probe mounting hole, (5) the anti-rotation hole, (6) the first probe hole, (7) the scale line, (8) the external thread, (9) the internal thread, (10) the dividing line, (11) the positioning hole, (12) the anti-rotation pin, (13) the second probe hole, (14) the mounting hole, and (15) the positioning groove. DETAILED DESCRIPTION

[0019] The following describes the embodiments of the present invention through specific examples. Those skilled in the art can easily understand other advantages and effects of the present invention from the contents disclosed in this specification.

[0020] A probe coupling adjustment device, such as Figure 1 As shown, it comprises a probe fixing block (1), a dividing ring (2), and a fixed bottom block (3); its characteristics are that the probe fixing block (1) and the dividing ring (2) are movably connected through an external thread (8) and an internal thread (9), and the dividing ring (2) is rotated to adjust the position of the probe fixing block (1), thereby controlling the coupling amount; the dividing ring (2) is movably connected to the fixed bottom block (3), and the dividing ring (2) can rotate relative to the fixed bottom block (3).

[0021] Furthermore, the probe fixing block (1) is provided with a probe mounting hole (4) for fixing the probe; an anti-rotation hole (5) is provided, which cooperates with an anti-rotation pin (12) on the fixed bottom block (3) to prevent the probe fixing block (1) from rotating when the dividing ring (2) rotates; a first probe hole (6) is provided for the probe to pass through; and a scale line (7) is provided for indicating the probe adjustment position.

[0022] Furthermore, the position and size of the probe mounting hole (4) can be adjusted according to actual conditions to accommodate different probes.

[0023] Furthermore, the lengths of the scale lines (7), the external threads (8) and the internal threads (9) can be adjusted according to actual conditions to meet different coupling adjustment stroke requirements.

[0024] Furthermore, the indexing ring (2) has a graduation line (10) which can accurately indicate the probe adjustment position; an internal thread (9) which cooperates with the external thread (8); and a positioning hole (11) which cooperates with the positioning groove (15) via a ball screw, so that the indexing ring (2) can rotate relative to the fixed bottom block (3).

[0025] Furthermore, the density of the graduation lines (10) can be adjusted according to actual conditions, thereby adapting to different coupling adjustment accuracy requirements.

[0026] Furthermore, the fixed bottom block (3) is provided with an anti-rotation pin (12) connected to the anti-rotation hole (5) on the probe fixing block (1) and used to fix the probe fixing block (1) when the dividing ring (2) rotates; a second probe hole (13) is provided for the probe to pass through; a mounting hole (14) is provided for fixing the probe coupling adjustment device on the equipment in use; and a positioning groove (15) is provided, which cooperates with the positioning hole (11) on the dividing ring (2) through a ball screw, so that the dividing ring (2) can rotate relative to the fixed bottom block (3).

[0027] Furthermore, the position and size of the mounting hole (14) can be adjusted according to actual conditions to adapt to different installation conditions.

[0028] An application example of a probe coupling adjustment device, such as Figure 3As shown, the dividing ring (2) can rotate around the X-axis. During the rotation, under the action of the external thread (8) and the internal thread (9), the probe fixing block (1) can drive the probe to move forward and backward along the X-axis, thereby adjusting the coupling strength.

[0029] The above embodiments are merely illustrative of the principles and effects of the present invention and are not intended to limit the present invention. Those skilled in the art may make several modifications and improvements without departing from the scope of the present invention, which all fall within the scope of protection of the present invention and should still be covered by the claims of the present invention.

Claims

1. A probe coupling adjustment device, comprising a probe fixing block (1), a dividing ring (2), and a fixed bottom block (3); wherein: The probe fixing block (1) is movably connected to the dividing ring (2) via an external thread (8) and an internal thread (9); the dividing ring (2) is rotated to adjust the position of the probe fixing block (1), thereby controlling the coupling amount; the dividing ring (2) is movably connected to the fixed bottom block (3); the dividing ring (2) can rotate relative to the fixed bottom block (3).

2. The probe coupling adjustment device according to claim 1, wherein: The probe fixing block (1) is provided with a probe mounting hole (4) for fixing the probe; an anti-rotation hole (5) is provided, which cooperates with an anti-rotation pin (12) on the fixed bottom block (3) to prevent the probe fixing block (1) from rotating when the indexing ring (2) rotates; a first probe hole (6) is provided for the probe to pass through; and a scale line (7) is provided for indicating the probe adjustment position.

3. The probe coupling adjustment device according to claim 2, wherein: The position and size of the probe mounting hole (4) can be adjusted according to actual conditions to accommodate different probes.

4. The probe coupling adjustment device according to claim 2, wherein: The lengths of the scale lines (7), external threads (8) and internal threads (9) can be adjusted according to actual conditions to meet different coupling adjustment stroke requirements.

5. The probe coupling adjustment device according to claim 1, wherein: The indexing ring (2) is provided with a graduation line (10) which can accurately indicate the probe adjustment position; an internal thread (9) is provided which cooperates with the external thread (8); and a positioning hole (11) is provided which cooperates with the positioning groove (15) via a ball screw so that the indexing ring (2) can rotate relative to the fixed bottom block (3).

6. The probe coupling adjustment device according to claim 5, characterized in that: The density of the graduation lines (10) can be adjusted according to actual conditions to meet different coupling adjustment accuracy requirements.

7. The probe coupling adjustment device according to claim 1, wherein: The fixed bottom block (3) is provided with an anti-rotation pin (12) connected to the anti-rotation hole (5) on the probe fixing block (1) and used to fix the probe fixing block (1) when the dividing ring (2) rotates; a second probe hole (13) is provided for the probe to pass through; a mounting hole (14) is provided for fixing the probe coupling adjustment device on the equipment in use; and a positioning groove (15) is provided, which cooperates with the positioning hole (11) on the dividing ring (2) through a ball screw, so that the dividing ring (2) can rotate relative to the fixed bottom block (3).

8. The probe coupling adjustment device according to claim 7, characterized in that: The position and size of the mounting hole (14) can be adjusted according to actual conditions to adapt to different mounting conditions.

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