Auxiliary device for plane resistivity test
By designing an auxiliary device for planar resistivity testing and using a test slot to limit the sample and probe, the current and voltage fluctuation problems caused by manual alignment in existing technologies are solved, achieving fast, accurate and stable testing results.
Patent Information
- Application Number
- CN202422680387.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-05
- Publication Date
- 2025-09-23
- Estimated Expiration
- 2034-11-05
AI Technical Summary
In existing technologies, when testing planar resistivity, manual alignment of samples and test probes is cumbersome, resulting in current and voltage fluctuations, making it difficult to achieve fast, accurate, and stable testing.
An auxiliary device including a base plate and a test slot is designed. The test slot is used to hold samples and ensure stable alignment of the probe and the sample through limiters, which simplifies the operating procedures during the test. Through testing, it is found that the base plate and the test slot are made of non-conductive materials, which simplifies the operating procedures during the test and ensures stable contact between the probe and the sample.
It achieves stable alignment of the sample and probe, reduces fluctuations caused by manual operation, improves test accuracy and efficiency, and simplifies the test process.
Smart Images

Figure CN223377399U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of electronic testing, in particular to an auxiliary device for plane resistivity testing. Background Art
[0002] The existing method of testing planar resistivity using a precision DC voltage and current source is to manually align the sample and the test probe to ensure good contact. However, this method is cumbersome to operate and is prone to significant current and voltage fluctuations when testing low-resistivity samples, which can also lead to data deviation problems.
[0003] Patent publication number CN201302593Y discloses a fixture for measuring the plane resistivity of germanium crystals. A guide rail is fixed to a base, bearings are mounted on the rails and slide along them, a base plate is fixed to the bearings, and four vertical arms are provided. These arms are fixed to the base plate via pressure rings and rotate along the pressure rings on the base plate. Each arm has a horizontal arm at the top, which is free to move and fixed to the arm by an upper cover. A contact with an angle is provided at the front end of the horizontal arm, and a rubber pad is fixed to the contact. The probe moves up and down on the vertical rod of the base. However, its structure is complex, and the measurement process is time-consuming. Therefore, there is an urgent need for an auxiliary device for plane resistivity testing that is fast, accurate, and stable. Summary of the Invention
[0004] The purpose of the utility model is to provide an auxiliary device for plane resistivity testing, so as to solve the problems existing in the above-mentioned prior art and make the plane resistivity testing fast, accurate and stable.
[0005] To achieve the above purpose, the present invention provides the following solutions:
[0006] The utility model provides an auxiliary device for plane resistivity testing, comprising a base plate and a test slot, wherein the test slot is provided in the middle of the upper surface of the base plate, the test slot is a groove protruding upward on the upper surface of the base plate, and the test slot is used to hold a sample to be tested.
[0007] Optionally, a gasket is further provided at the bottom of the test slot.
[0008] Optionally, the gasket has a length of 100 mm, a width of 11 mm, and a thickness of 1 mm.
[0009] Optionally, the gasket is an elastic sheet.
[0010] Optionally, the base plate has a length of 120 mm, a width of 50 mm, and a thickness of 3 mm.
[0011] Optionally, the test slot has a height of 20 mm, an inner length of 100 mm, an inner width of 11 mm, and a wall thickness of 2 mm.
[0012] Optionally, the bottom plate and the test slot are both made of non-conductive materials.
[0013] Compared with the prior art, the utility model has achieved the following technical effects:
[0014] The utility model is an auxiliary device for plane resistivity testing. The probe and the sample are limited by the test slot, and reliable and stable contact between the probe and the sample can be ensured without manual support. The test process is simplified, and fluctuations caused by manual operation are reduced. The numerical value can be stabilized, and the tester can read it accurately, thereby improving the test accuracy. BRIEF DESCRIPTION OF THE DRAWINGS
[0015] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.
[0016] Figure 1 This is a schematic top view of the auxiliary device for plane resistivity testing in the present invention;
[0017] Figure 2 This is a schematic diagram of the lateral structure of the auxiliary device for plane resistivity testing in the present utility model;
[0018] Figure 3 This is a schematic structural diagram of a gasket in the auxiliary device for plane resistivity testing in the present invention;
[0019] Figure 4 This is a schematic structural diagram of the auxiliary device for plane resistivity testing in the present invention during testing.
[0020] Description of reference numerals:
[0021] 1. Base plate; 2. Test slot; 3. Gasket; 4. Sample; 5. Probe. DETAILED DESCRIPTION
[0022] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.
[0023] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and easy to understand, the present invention is further described in detail below with reference to the accompanying drawings and specific implementation methods.
[0024] like Figures 1 to 4 As shown, this embodiment provides an auxiliary device for planar resistivity testing, including a base plate 1 and a test slot 2. The test slot 2 is provided in the middle of the upper surface of the base plate 1. The test slot 2 is a groove protruding upward on the upper surface of the base plate 1. The test slot 2 is used to hold the sample 4 to be tested.
[0025] The test slot 2 allows the sample 4 and the probe 5 to enter and limit the sample 4 and the probe 5 to prevent the probe 5 and the sample 4 from moving, so that the sample 4 and the probe 5 are stably aligned and in contact, thereby reducing fluctuations caused by manual operation, ensuring numerical stability, and improving test accuracy.
[0026] Place the sample 4 at the bottom of the test slot 2, then place the probe 5 in the test slot 2, and let the probe press on the sample 4 by its own gravity, so that the sample 4 and the probe 5 can be stably aligned and contacted, simplifying the test process.
[0027] In this specific embodiment, a gasket 3 is also installed on the bottom of the test slot 2. This gasket 3 is an elastic sheet with a length of 100 mm, a width of 11 mm, and a thickness of 1 mm. The base plate 1 is 120 mm long, 50 mm wide, and 3 mm thick. This results in a test slot 2 with a height of 20 mm, an internal length of 100 mm, an internal width of 11 mm, and a wall thickness of 2 mm. Both the base plate 1 and the test slot 2 are made of non-conductive materials.
[0028] The auxiliary device for plane resistivity testing of the present invention addresses the defects of excessive current and voltage fluctuations caused by manual alignment of the sample 4 and the test probe 5 and stable contact when testing the plane resistivity using a precision DC voltage and current source. An auxiliary device is added to ensure stable alignment and contact between the sample 4 and the probe 5, making the plane resistivity test fast, accurate, and stable.
[0029] It should be noted that it is obvious to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above, and that the present invention can be implemented in other specific forms without departing from the spirit or essential features of the present invention. Therefore, from all perspectives, the embodiments should be regarded as illustrative and non-restrictive, and the scope of the present invention is defined by the appended claims rather than the above description. Therefore, it is intended that all changes that fall within the meaning and range of equivalents of the claims be included in the present invention, and any reference signs in the claims should not be regarded as limiting the claims involved.
[0030] This specification uses specific examples to illustrate the principles and implementation methods of the present invention. The above examples are only intended to help understand the method and core concept of the present invention. At the same time, those skilled in the art will find that the specific implementation methods and application scopes may vary based on the concept of the present invention. In summary, the contents of this specification should not be construed as limiting the present invention.
Claims
1. An auxiliary device for plane resistivity testing, characterized in that: The test chamber comprises a bottom plate and a test slot. The test slot is provided in the middle of the upper surface of the bottom plate. The test slot is a groove protruding upward on the upper surface of the bottom plate. The test slot is used to hold samples to be tested.
2. The auxiliary device for plane resistivity testing according to claim 1, characterized in that: A gasket is also provided at the bottom of the test slot.
3. The auxiliary device for plane resistivity testing according to claim 2, characterized in that: The length of the gasket is 100 mm, the width is 11 mm, and the thickness is 1 mm.
4. The auxiliary device for plane resistivity testing according to claim 3, characterized in that: The gasket is an elastic sheet.
5. The auxiliary device for plane resistivity testing according to claim 1, characterized in that: The bottom plate has a length of 120 mm, a width of 50 mm and a thickness of 3 mm.
6. The auxiliary device for plane resistivity testing according to claim 1, characterized in that: The test tank has a height of 20 mm, an inner length of 100 mm, an inner width of 11 mm, and a wall thickness of 2 mm.
7. The auxiliary device for plane resistivity testing according to claim 1, characterized in that: The bottom plate and the test slot are both made of non-conductive materials.
Citation Information
Patent Citations
A fixing device for plane resistivity measurement of germanium crystal
CN201302593Y
Cited By
Method and device for testing surface resistance of flexible conductive film
CN121431955A