Subway train door controller test system

Abstract

The utility model discloses a test system for a subway train door controller. The test system comprises an upper computer, a test device and a simulation mechanism, the upper computer is used for sending out a test signal; the test device is connected with the upper computer, the simulation mechanism and the train door controller to be tested, and simulates control information of the train door controller to be tested according to the test signal; the train door controller to be tested receives the control information to control the simulation mechanism; and the testing device is also used for receiving a detection result of the train door controller to be tested and sending the detection result to the upper computer. According to the utility model, hardware conditions are provided for the offline test of the subway train door controller.

Description

Technical Field

[0001] The utility model belongs to the technical field of subway train door controller testing, and in particular relates to a subway train door controller testing system. Background Art

[0002] The train door controller is a core component of the subway train door system. It is responsible for controlling door functions such as opening, closing, and re-opening. It also monitors door status via a communication network with the train control system. In recent years, with the increase in operating hours, the failure rate of train door controllers has also increased. Door failures often require door removal on the main line, which can cause delays and affect the quality of rail transit mainline operations.

[0003] As subway trains age, the failure rate of train door controllers increases dramatically. The shortage of spare parts severely impacts the supply of trains to the mainline, disrupting external operations. Testing train door controllers requires onboard testing, preventing offline testing. The main issues are: 1. This requires onboard testing, making offline testing of the door controllers impossible; 2. During testing, the door controllers cannot automatically perform functional tests such as opening and closing doors and shutting off doors. Utility Model Content

[0004] In order to overcome the above technical defects, the utility model provides a subway train door controller testing system, which realizes offline testing of subway train door controllers.

[0005] The utility model is realized through the following scheme:

[0006] A subway train door controller test system includes: a host computer, a test device, and a simulation mechanism;

[0007] The host computer is used to send a test signal;

[0008] The test device is connected to the host computer, the simulation mechanism, and the door controller of the train to be tested, and simulates the control information of the door controller of the train to be tested according to the test signal;

[0009] The door controller of the train to be tested receives the control information and controls the simulation mechanism;

[0010] The testing device is also used to receive the test results of the door controller of the train to be tested and send them to the host computer.

[0011] As a further improvement of the present invention, the testing device includes: a control unit;

[0012] The control unit is connected to the host computer, the simulation mechanism, and the door controller of the train to be tested, and simulates control information of the door controller of the train to be tested according to the test signal.

[0013] As a further improvement of the present invention, the control unit includes: a relay control module, a single chip microcomputer, and a driver chip;

[0014] The single chip microcomputer is connected to the driver chip to send the control information to the driver chip;

[0015] The driving chip is connected to the relay control module and is used to close the relay control module according to the control information;

[0016] The door controller of the train to be tested is connected to the relay control module and controls the simulation mechanism according to the status information of the relay control module.

[0017] As a further improvement of the present invention, the relay control module includes: a plurality of relay control circuits;

[0018] Each of the relay control circuits is connected to a door controller of a train to be tested.

[0019] As a further improvement of the present invention, the testing device further comprises: a network communication unit;

[0020] The host computer is connected to the door controller of the train to be tested via the network communication unit, so as to realize communication between the host computer and the door controller of the train to be tested.

[0021] As a further improvement of the present invention, the network communication unit includes:

[0022] MVB network module, the host computer is connected to the door controller of the train to be tested through the MVB network module, and is used to realize MVB network communication between the host computer and the door controller of the train to be tested;

[0023] The HDLC network module is used to connect the host computer to the door controller of the train to be tested, and is used to realize HDLC network communication between the host computer and the door controller of the train to be tested.

[0024] As a further improvement of the present invention, the present invention further comprises: a hood and a constant temperature heating fan;

[0025] The door controller of the train to be tested is placed in the hood, and the constant temperature heating fan is placed beside the hood to provide a heating and testing environment.

[0026] As a further improvement of the present invention, the simulation mechanism includes: a door mechanism and a mounting bracket;

[0027] The door mechanism is arranged on the mounting bracket.

[0028] Compared with the prior art, the beneficial effects of the present invention are as follows: by setting the host computer to send a test signal, the test device simulates the control information of the train door controller to be tested, the simulation mechanism simulates the actual working state of the door mechanism, and at the same time, the test results are displayed by the host computer, providing hardware conditions for offline testing of subway train door controllers. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] The specific embodiments of the present invention will be further described in detail below with reference to the accompanying drawings, wherein:

[0030] Figure 1 This is a schematic diagram of the overall structure of the subway train door controller test system of the present invention;

[0031] Figure 2 This is a schematic structural diagram of the relay control circuit of the present invention;

[0032] Figure 3 This is a structural diagram of another relay control circuit of the present invention;

[0033] Figure 4 This is a connection diagram of the driver chip of the utility model;

[0034] Figure 5 This is a connection diagram of another driver chip of the present invention;

[0035] Figure 6 This is a connection diagram of the single chip microcomputer IC1 of the present invention;

[0036] Figure 7 This is a connection diagram of the interface J1 of the present invention;

[0037] Figure 8 This is a connection diagram of the USB bus circuit of the present invention;

[0038] Figure 9 This is a connection diagram of the latch U4 of the present invention;

[0039] Figure 10 This is a connection diagram of the single chip microcomputer U5 of the present invention;

[0040] Figure 11 This is a connection diagram of the single chip microcomputer U6 of the present invention;

[0041] Figure 12 This is a connection diagram of the logic gate circuit of the present utility model;

[0042] Figure 13 This is a connection diagram of the interface circuit of the present invention;

[0043] Figure 14 This is another overall structural diagram of the subway train door controller test system of the present invention;

[0044] Figure 15 This is a schematic structural diagram of the mounting bracket of the present invention.

[0045] Marking explanation: 1. Host computer; 2. Test device; 21. Control unit; 211. Relay control circuit; 22. Network communication unit; 221. MVB network module; 2211. USB bus circuit; 222. HDLC network module; 2221. Logic gate circuit; 2222. Interface circuit; 23. Power supply unit; 3. Simulation mechanism; 31. Mounting bracket; 32. Door mechanism; 4. Machine cover; 5. Constant temperature heating fan; 100. Door controller of the train to be tested. DETAILED DESCRIPTION

[0046] The preferred embodiments of the present invention are described below in conjunction with the accompanying drawings. It should be understood that the preferred embodiments described herein are only used to illustrate and explain the present invention and are not used to limit the present invention.

[0047] The terms used in the embodiments of the present application are for the purpose of describing specific embodiments only and are not intended to limit the embodiments of the present application. The singular forms "a," "the," and "the" used in the embodiments of the present application and the appended claims are also intended to include plural forms unless the context clearly indicates otherwise. It should also be understood that the term "and / or" used herein refers to and includes any or all possible combinations of one or more associated listed items.

[0048] The utility model discloses a subway train door controller test system. Figure 1 As shown, it includes: a host computer 1, a test device 2, and a simulation mechanism 3; the host computer 1 is used to send a test signal; the test device 2 is connected to the host computer 1, the simulation mechanism 3, and the door controller of the train to be tested, and simulates the control information of the door controller of the train to be tested according to the test signal; the door controller of the train to be tested receives the control information to control the simulation mechanism 3; the test device 2 is also used to receive the detection result of the door controller of the train to be tested and send it to the host computer 1.

[0049] The test device 2 includes a control unit 21 ; the control unit 21 is connected to the host computer 1 , the simulation mechanism 3 , and the door controller of the train to be tested, and simulates the control information of the door controller of the train to be tested according to the test signal.

[0050] like Figures 2 to 5As shown, the control unit 21 includes: a relay control module, a single-chip microcomputer U1, and a driver chip U2; the single-chip microcomputer U1 is connected to the driver chip U2 to send control information to the driver chip U2; the driver chip U2 is connected to the relay control module to close the relay control module according to the control information; the door controller of the train to be tested is connected to the relay control module to control the simulation mechanism 3 according to the status information of the relay control module.

[0051] It should be noted that, in the present invention, the relay control modules and the driver chips U2 (U2-1...U2-N) are provided in several groups, wherein each driver chip U2 can drive several groups of relay control modules.

[0052] The test device 2 of the present invention also includes: a network communication unit 22, through which the host computer 1 is connected to the train door controller to be tested, and is used to realize communication between the host computer 1 and the train door controller to be tested. In addition, the network communication unit 22 is also used to realize network-controlled opening and closing of the train door controller to be tested, thereby realizing network function detection of the train door controller to be tested.

[0053] The relay control module includes: a plurality of relay control circuits 211; each relay control circuit 211 is connected to the door controller of the train to be tested.

[0054] The relay control circuit 211 includes: a relay K, a diode D, a resistor R, and a light-emitting diode DK; the two ends of the normally open contact or the normally closed contact of the relay are respectively connected to the door controller of the train to be tested, the two ends of the relay coil are respectively connected to the driver chip, the diode is set in parallel with the relay coil, the resistor and the light-emitting diode DK are connected in series and then set in parallel with the diode D. The normally open and normally closed state of the relay is to meet the 110V contact circuit control logic of the door controller.

[0055] The number of relay control modules can be set based on the actual functions of the subway train door controller. These relay control modules simulate control information from the subway train door controller, such as door opening and closing, emergency unlocking, and door disconnection. The train door controller under test connects to the 110V and 0V logic levels, and achieves this logic conversion through the normally open and normally closed relay contacts, thereby implementing logic functions such as door opening and closing. Upon receiving the relay status information, the train door controller under test controls the simulation mechanism 3, at which point the test results are transmitted to the host computer 1 via the network communication unit 22.

[0056] In order to meet different network communication requirements, two networks, MVB and HDLC, are provided, which can communicate and test the train door controller to be tested of the MVB network and the train door controller to be tested of the HDLC network. The network communication unit 22 includes: an MVB network module 221 and an HDLC network module 222. The host computer 1 is connected to the train door controller to be tested through the MVB network module 221 to realize the MVB network communication between the host computer 1 and the train door controller to be tested; the host computer 1 is connected to the train door controller to be tested through the HDLC network module 222 to realize the HDLC network communication between the host computer 1 and the train door controller to be tested.

[0057] like Figure 6-Figure 9 As shown, MVB network module 221 includes: single-chip microcomputer IC1, MVB chip U9, USB bus circuit 2211, and latch U4. Single-chip microcomputer IC1 is connected to the MVB chip, USB bus circuit 2211, and latch U4, and MVB chip U9 is connected to latch U4. In the present utility model, MVB chip U9 connects to other devices via interface J1, USB bus circuit 2211 is connected to host computer 1, and single-chip microcomputer IC1 is connected to the train door controller under test via a connector (not directly shown in the accompanying drawings). MVB network module 221 is suitable for the train door controller under test in the MVB network, and is used for communication between the train door controller under test and host computer 1. At the same time, MVB network module 221 can also perform network door opening control for the train door controller under test in the MVB network.

[0058] Preferably, the function of the USB bus circuit 2211 can be implemented by a universal interface chip U3, whose model is CH374T, and the latch U4 can be implemented by using the model SN74HC573NSR.

[0059] like Figure 10-13 As shown, HDLC network module 222 includes: single-chip microcomputer U5, single-chip microcomputer U6, logic gate circuit 2221 and interface circuit 2222. Interface circuit 2222 is connected to host computer 1, single-chip microcomputer U5 is connected to latch U4 and single-chip microcomputer U6, single-chip microcomputer U6 is connected to latch U4 and logic gate circuit 2221, logic gate circuit 2221 is connected to interface circuit 2222, and single-chip microcomputer U5 is connected to the train door controller to be tested via a connector (not directly shown in the accompanying drawings). HDLC network module 222 is suitable for the train door controller to be tested of the HDLC network, and is used for communication between the train door controller to be tested and host computer 1. At the same time, HDLC network module 222 can also perform network door opening control for the train door controller to be tested of the MVB network.

[0060] Preferably, the single-chip microcomputer U5 can be implemented by the STC12C5A60S2 model, the single-chip microcomputer U6 can be implemented by the SAF82526 model, the main function of the logic gate circuit 2221 is implemented by the CD74ACT86M model chip, and the function of the interface circuit 2222 is implemented by the MAX1480CEPI+ model chip.

[0061] Aiming at the defect that the existing technology cannot perform heating copy test on the train door controller to be tested, the subway train door controller test system of the present invention also includes: a hood 4 and a constant temperature heating fan 5; Figure 14 As shown, the door controller of the train to be tested is placed in the hood 4, and the constant temperature heating fan 5 is placed beside the hood 4 to provide a heating and copying machine test environment.

[0062] like Figure 15 As shown, the simulation mechanism 3 includes: a door mechanism 32 and a mounting bracket 31; the door mechanism 32 is arranged on the mounting bracket 31, and the door mechanism 32 can be directly implemented by using the door mechanism of the train or can be made separately. The structure of the door mechanism 32 can be referred to the existing technology.

[0063] In summary, the present invention has the following beneficial effects:

[0064] 1. The subway train door controller test system can detect the door opening function, door closing function, "zero speed function", "door cut-off function", "anti-pinch function", "zero speed door unlocking function" and other functions of the subway train door controller. It can quickly and effectively guide operators to find the fault point, realize full function coverage test of the subway train door controller, and improve maintenance quality.

[0065] 2. The subway train door controller test system can realize the functions of heating test, aging test, offline test, etc. for EDCU.

[0066] The above are only preferred embodiments of the present application and are not intended to limit the present application. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present application should be included in the scope of protection of the present application.

Claims

1. A subway train door controller test system, characterized in that: include: Host computer, test device, simulation mechanism; The host computer is used to send a test signal; The test device is connected to the host computer, the simulation mechanism, and the door controller of the train to be tested, and simulates the control information of the door controller of the train to be tested according to the test signal; The door controller of the train to be tested receives the control information and controls the simulation mechanism; The testing device is also used to receive the test results of the door controller of the train to be tested and send them to the host computer.

2. The subway train door controller test system according to claim 1, characterized in that: The testing device comprises: a control unit; The control unit is connected to the host computer, the simulation mechanism, and the door controller of the train to be tested, and simulates control information of the door controller of the train to be tested according to the test signal.

3. The subway train door controller test system according to claim 2, characterized in that: The control unit includes: a relay control module, a single chip microcomputer, and a driver chip; The single chip microcomputer is connected to the driver chip to send the control information to the driver chip; The driving chip is connected to the relay control module and is used to close the relay control module according to the control information; The door controller of the train to be tested is connected to the relay control module and controls the simulation mechanism according to the status information of the relay control module.

4. The subway train door controller test system according to claim 3, characterized in that: The relay control module includes: a plurality of relay control circuits; Each of the relay control circuits is connected to a door controller of a train to be tested.

5. The subway train door controller test system according to claim 2, characterized in that: The testing device further comprises: a network communication unit; The host computer is connected to the door controller of the train to be tested via the network communication unit, so as to realize communication between the host computer and the door controller of the train to be tested.

6. The subway train door controller test system according to claim 5, characterized in that: The network communication unit includes: MVB network module, the host computer is connected to the door controller of the train to be tested through the MVB network module, and is used to realize MVB network communication between the host computer and the door controller of the train to be tested; The HDLC network module is used to connect the host computer to the door controller of the train to be tested, and is used to realize HDLC network communication between the host computer and the door controller of the train to be tested.

7. The subway train door controller test system according to claim 1, characterized in that: Also includes: Hood and constant temperature heating fan; The door controller of the train to be tested is placed in the hood, and the constant temperature heating fan is placed beside the hood to provide a heating and testing environment.

8. The subway train door controller test system according to claim 1, characterized in that: The simulation mechanism includes: a door mechanism and a mounting bracket; The door mechanism is arranged on the mounting bracket.

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