Testing device and baking and drying line

Abstract

The utility model relates to a testing device and a baking and drying line. The testing device comprises a first testing unit and a second testing unit, wherein the first testing unit comprises a first mounting plate and a plurality of first testing probe groups mounted on the first mounting plate, and all the first testing probe groups are in one-to-one correspondence with and are electrically connected with all first testing point position groups on a heating probe plate; the second test unit comprises a second mounting plate and a plurality of second test probe groups mounted on the second mounting plate, and all the second test probe groups are in one-to-one correspondence with and are electrically connected with all the second test point position groups on the sensing probe plate; and the control unit is electrically connected with all the first test probe groups and all the second test probe groups, and is used for judging whether the connection of all the heating plates is qualified or not according to the test results of all the first test probe groups and judging whether the connection of all the sensors is qualified or not according to the test results of all the second test probe groups. According to the testing device and the baking and drying line provided by the invention, the testing efficiency, the testing accuracy and the testing safety can be improved.

Description

Technical Field

[0001] The present application relates to the field of testing technology, and in particular to a testing device and a baking and drying line. Background Art

[0002] After the baking fixture on the baking and drying line is assembled, it is necessary to perform a functional test on the assembled baking fixture to reduce the defective rate of the assembly. The baking fixture includes a heating probe plate, a sensing probe plate, multiple heating plates, and multiple sensors. The heating probe plate contains a group of test points for all heating plates, while the sensor probe plate contains a group of test points for all sensors. By testing all the test points on both the heating probe plate and the sensing probe plate, the connection information related to all heating plates and all sensors can be obtained.

[0003] The traditional testing method requires on-site operators to use a multimeter to test each of the different test points on the heating probe plate and the sensor probe plate. This method requires numerous tests and takes a long time, making the testing time and labor-intensive. Furthermore, due to human factors, the test accuracy may be low, requiring subsequent debugging and extensive repairs, resulting in costly waste. Furthermore, inconsistent testing methods among on-site operators can also lead to safety incidents. Utility Model Content

[0004] Based on this, it is necessary to provide a testing device and a baking and drying line that can improve test efficiency, test accuracy and test safety in order to address the above problems.

[0005] A testing device, comprising:

[0006] A first test unit includes a first mounting plate and a plurality of first test probe groups mounted on the first mounting plate, wherein all the first test probe groups are used to correspond one-to-one with and be electrically connected to all the first test point groups on the heated probe plate;

[0007] A second test unit includes a second mounting board and a plurality of second test probe groups mounted on the second mounting board, wherein all the second test probe groups are used to correspond one-to-one with and be electrically connected to all the second test point groups on the sensor probe board; and

[0008] A control unit is electrically connected to all the first test probe groups and all the second test probe groups. The control unit is used to determine whether all the heating plate connections are qualified based on the test results of all the first test probe groups, and is used to determine whether all the sensor connections are qualified based on the test results of all the second test probe groups.

[0009] In some embodiments, the control unit is configured to determine whether the circuits of all the heating plates are conductive based on the test results of all the first test probe groups; if the circuits of all the heating plates are conductive, then all the heating plates are connected properly;

[0010] The control unit is configured to determine whether the circuits of all the sensors are conductive based on the test results of all the second test probe groups. If the circuits of all the sensors are conductive, then all the sensors are connected properly.

[0011] In some embodiments, the control unit is configured to determine whether all the heating plates are capable of heating and whether the sensors are connected to the corresponding heating plates based on the test results of all the second test probe groups.

[0012] In some embodiments, the first test probe group includes two first test probes, the second test probe group includes two second test probes, and all of the first test probes and all of the second test probes are arranged in a matrix array.

[0013] In some embodiments, the first test unit includes a first driving member and a first fixing frame, the first driving member is mounted on the first fixing frame and is in driving connection with the first mounting plate, the first driving member is used to drive the first mounting plate to drive all the first test probe groups to move toward or away from the heating probe plate;

[0014] The second test unit includes a second driving member and a second fixed frame. The second driving member is installed on the second fixed frame and is transmission-connected to the second mounting plate. The second driving member is used to drive the second mounting plate to drive all the second test probe groups to move toward or back toward the sensing probe plate.

[0015] In some embodiments, the first driving member and the second driving member are push-pull quick clamps;

[0016] The first driving member includes a first push-pull rod, which is provided through the first fixing frame and is in driving connection with the first mounting plate. The first driving member is used to push and pull the first mounting plate and drive the first mounting plate to move all the first test probe groups.

[0017] The second driving member has a second push-pull rod, which is passed through the second fixing frame and is in transmission connection with the second mounting plate. The second driving member is used to push and pull the second mounting plate and drive the second mounting plate to drive all the second test probe groups to move.

[0018] In some embodiments, a first guide hole is formed on the first mounting plate, and the first testing unit includes a first guide post, which is mounted on the first fixing bracket and passes through the first guide hole;

[0019] A second guide hole is formed on the second mounting plate. The second testing unit includes a second guide post. The second guide post is mounted on the second fixing bracket and passes through the second guide hole.

[0020] In some embodiments, the first testing unit further includes a first connecting rod, wherein the first connecting rod is fixedly connected between the first push-pull rod and the first mounting plate;

[0021] The second testing unit further includes a second connecting rod fixedly connected between the second push-pull rod and the second mounting plate.

[0022] In some embodiments, the first test unit further includes a first fixed jaw, a first compression elastic member, a first elastic jaw and a first latch, wherein the first fixed jaw, the first compression elastic member and the first elastic jaw are all mounted on the first fixing frame, the first latch is mounted on the first elastic jaw, the first compression elastic member abuts between the first fixing frame and the first latch, and the first compression elastic member is used to provide a first pre-tightening force that drives the first latch to drive the first elastic jaw to move toward the first fixed jaw and cooperate with the first fixed jaw to clamp the heating probe plate;

[0023] The second test unit also includes a second fixed jaw, a second compression elastic member, a second elastic jaw and a second pin. The second fixed jaw, the second compression elastic member and the second elastic jaw are all installed on the second fixed frame. The second pin is installed on the second elastic jaw. The second compression elastic member abuts between the second fixed frame and the second pin. The second compression elastic member is used to provide a second pre-tightening force that drives the second pin to drive the second elastic jaw to move toward the second fixed jaw and cooperate with the second fixed jaw to clamp the sensor probe board.

[0024] In some embodiments, the first mounting plate and the second mounting plate are both insulating plates.

[0025] A baking and drying line, comprising:

[0026] A baking fixture comprising a heating probe plate and a sensing probe plate, wherein the heating probe plate has a plurality of first test point groups and the sensing probe plate has a plurality of second test point groups; and

[0027] As in the testing device described in any of the above embodiments, all the first test probe groups are used to correspond one-to-one with and be electrically connected to all the first test point groups on the heating probe board, and all the second test probe groups are used to correspond one-to-one with and be electrically connected to all the second test point groups on the sensing probe board.

[0028] The above-mentioned test device and baking drying line, in the present application, by setting a first test unit and a second test unit, when all the first test probe groups of the first test unit are docked with all the first test point groups, and all the second test probe groups of the second test unit are docked with all the second test point groups, the control unit can automatically determine whether all heating plates and all sensor connections are qualified at one time through all the first test probe groups and all the second test probe groups. Compared with the traditional manual testing, the test device of the present application has fewer tests and shorter test time, which greatly reduces the difficulty of the operation, and the test is simple and the test efficiency is high. Moreover, the present application uses the control unit to automatically complete the test and can output the test results, with a high degree of standardization and high test accuracy, which reduces the cost of rework. In addition, the entire testing process has low human participation, which reduces the safety risks brought by human operation and has high safety. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] Figure 1 This is a front view of a baking and drying line in one embodiment of the present application;

[0030] Figure 2 for Figure 1 A top view of the baking and drying line shown;

[0031] Figure 3 for Figure 1 Left side view of the baking and drying line shown;

[0032] Figure 4 for Figure 1 The left side view of the baking fixture in the baking and drying line shown;

[0033] Figure 5 A front view of a first test unit in an embodiment of the present application;

[0034] Figure 6 for Figure 5 A left side view of the first test unit is shown;

[0035] Figure 7 for Figure 5 A top view of the first test unit is shown;

[0036] Figure 8 for Figure 5 A rear view of the first test unit is shown;

[0037] Figure 9 is a front view of a second test unit in an embodiment of the present application;

[0038] Figure 10 for Figure 9 A left side view of the second test unit is shown;

[0039] Figure 11 for Figure 9 A top view of the second test unit is shown;

[0040] Figure 12 for Figure 9 A rear view of the second test unit is shown.

[0041] Figure Number:

[0042] 1000, baking and drying line;

[0043] 100. Testing device; 200. Baking fixture;

[0044] 10. First test unit; 30. Second test unit; 50. Control unit; 70. Connecting wire;

[0045] 11. First mounting plate; 111. First guide hole; 12. First test probe assembly; 121. First test probe; 13. First driving member; 131. First push-pull rod; 14. First fixing bracket; 15. First guide post; 16. First connecting rod; 17. First fixing jaw; 18. First elastic jaw; 19. First compressible elastic member; 21. First latch;

[0046] 31. Second mounting plate; 311. Second guide hole; 32. Second test probe assembly; 321. Second test probe; 33. Second driving member; 331. Second push-pull rod; 34. Second fixing bracket; 35. Second guide post; 36. Second connecting rod; 37. Second fixing jaw; 38. Second elastic jaw; 39. Second compressible elastic member; 41. Second latch;

[0047] 210, heating probe plate; 210a, first test point group; 220, sensing probe plate; 220a, second test point group. DETAILED DESCRIPTION

[0048] To make the above-mentioned objects, features, and advantages of the present application more clearly understood, the following detailed description of the specific embodiments of the present application is provided in conjunction with the accompanying drawings. The following description sets forth many specific details to facilitate a full understanding of the present application. However, the present application can be implemented in many other ways than those described herein, and those skilled in the art can make similar improvements without violating the scope of the present application. Therefore, the present application is not limited to the specific embodiments disclosed below.

[0049] In the description of this application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation of this application.

[0050] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features being referred to. Thus, a feature specified as "first" or "second" may explicitly or implicitly include at least one such feature. Throughout the description of this application, "plurality" means at least two, for example, two, three, etc., unless otherwise specifically defined.

[0051] In this application, unless otherwise specified or limited, the terms "mounted," "connected," "connect," "fixed," and the like should be understood broadly. For example, they may refer to fixed or detachable connections, or integration; mechanical or electrical connections; direct or indirect connections through an intermediate medium; and internal communication between two components or interaction between two components, unless otherwise specified. Those skilled in the art will understand the specific meanings of the above terms in this application based on the specific circumstances.

[0052] In this application, unless otherwise expressly specified or limited, when a first feature is "above" or "below" a second feature, it may mean that the first and second features are in direct contact, or the first and second features are in indirect contact through an intermediate medium. Furthermore, when a first feature is "above," "above," or "above" a second feature, it may mean that the first feature is directly above or diagonally above the second feature, or simply means that the first feature is at a higher level than the second feature. When a first feature is "below," "below," or "below" a second feature, it may mean that the first feature is directly below or diagonally below the second feature, or simply means that the first feature is at a lower level than the second feature.

[0053] It should be noted that when an element is referred to as being "fixed to" or "disposed on" another element, it may be directly on the other element or there may be an intermediate element. When an element is considered to be "connected to" another element, it may be directly connected to the other element or there may be an intermediate element. The terms "vertical," "horizontal," "upper," "lower," "left," "right," and similar expressions used herein are for illustrative purposes only and do not represent the only implementation methods.

[0054] See also Figures 1 to 5 ,as well as Figure 9 The present application provides a testing device 100, which includes a first testing unit 10, a second testing unit 30 and a control unit 50. The first testing unit 10 includes a first mounting plate 11 and a plurality of first test probe groups 12 mounted on the first mounting plate 11, and all first test probe groups 12 are used to correspond one-to-one with and be electrically connected to all first test point groups 210a on the heating probe plate 210. The second testing unit 30 includes a second mounting plate 31 and a plurality of second test probe groups 32 mounted on the second mounting plate 31, and all second test probe groups 32 are used to correspond one-to-one with and be electrically connected to all second test point groups 220a on the sensing probe plate 220. The control unit 50 is electrically connected to all first test probe groups 12 and all second test probe groups 32, and the control unit 50 is used to determine whether all heating plate connections are qualified based on the test results of all first test probe groups 12, and to determine whether all sensor connections are qualified based on the test results of all second test probe groups 32.

[0055] As an example, the first mounting plate 11 and the second mounting plate 31 are both insulating plates. Optionally, the first mounting plate 11 and the second mounting plate 31 can be made of plastic, rubber or other insulating materials. When all the first test probe groups 12 correspond one-to-one with all the first test point groups 210a on the heating probe plate 210 and are electrically connected, and all the second test probe groups 32 correspond one-to-one with all the second test point groups 220a on the sensing probe plate 220 and are electrically connected and tested, the current flowing through the first test probe groups 12 and the second test probe groups 32 will not leak to the first mounting plate 11 and the second mounting plate 31, thereby ensuring the safety of the test operation.

[0056] As an example, each first test probe group 12 in the first test unit 10 and each second test probe group 32 in the second test unit 30 are electrically connected to the control unit 50 via the connecting wires 70 .

[0057] Specifically, all first test probe groups 12 of the first test unit 10 correspond one-to-one with all first test point groups 210a on the heated probe plate 210, and all first test point groups 210a on the heated probe plate 210 correspond one-to-one with all heating plates. Specifically, each first test point group 210a corresponds to a test point group on a corresponding heating plate. When all first test probe groups 12 are connected to all first test point groups 210a, it is equivalent to the first test unit 10 being connected to all heating plates, so that the first test unit 10 can be used to test whether all heating plates are connected properly.

[0058] Specifically, all second test probe groups 32 of the second test unit 30 correspond one-to-one with all second test point groups 220a on the sensor probe card 220. In turn, all second test point groups 220a on the sensor probe card 220 correspond one-to-one with all sensors. Specifically, each second test point group 220a corresponds to a test point group on a corresponding sensor. When all second test probe groups 32 are connected to all second test point groups 220a, the second test unit 30 is connected to all sensors, allowing the second test unit 30 to test all sensor connections for compliance.

[0059] The control unit 50 is electrically connected to all first test probe groups 12 and all second test probe groups 32. The control unit 50 is used to determine whether all heating plate connections are qualified based on the test results of all first test probe groups 12, and to determine whether all sensor connections are qualified based on the test results of all second test probe groups 32.

[0060] As an example, the control unit 50 is configured to determine whether the circuits of all heating plates are conductive based on the test results of all first test probe groups 12. If the circuits of all heating plates are conductive, then all heating plates are connected properly. Furthermore, the control unit 50 is configured to determine whether the circuits of all sensors are conductive based on the test results of all second test probe groups 32. If the circuits of all sensors are conductive, then all sensors are connected properly.

[0061] If there is a heating plate whose circuit cannot be conducted, it means that the connection of the heating plate is unqualified, and the control unit 50 will prompt that there is a faulty heating plate. If there is a sensor whose circuit cannot be conducted, it means that the connection of the sensor is unqualified, and the control unit 50 will prompt that there is a faulty sensor, so that the operator can repair it in time.

[0062] In the present application, by setting up a first test unit 10 and a second test unit 30, when all the first test probe groups 12 of the first test unit 10 are docked with all the first test point groups 210a, and all the second test probe groups 32 of the second test unit 30 are docked with all the second test point groups 220a, the control unit 50 can automatically determine whether all heating plates and all sensor connections are qualified at one time through all the first test probe groups 12 and all the second test probe groups 32. Compared with the traditional manual testing, the test device 100 of the present application has fewer tests and shorter test time, which greatly reduces the difficulty of the operation, and the test is simple and the test efficiency is high. Moreover, the present application uses the control unit 50 to automatically complete the test and can output the test results, with a high degree of standardization and high test accuracy, which reduces the cost of rework. In addition, the entire testing process has low human participation, which reduces the safety risks brought by human operation and has high safety.

[0063] In some optional embodiments, the control unit 50 is configured to determine whether all heating plates are capable of heating and whether the sensors are connected to the corresponding heating plates according to the test results of all second test probe groups 32 .

[0064] If each sensor can detect a steady rise in the temperature of the corresponding heating plate, it means that all heating plates are heating and the sensor is connected to the corresponding heating plate. If a sensor cannot detect a temperature rise in the corresponding heating plate, it means that the heating plate is not heating or the sensor is not connected to the corresponding heating plate. The control unit 50 will then prompt the operator to promptly repair the faulty heating plate or faulty sensor.

[0065] In some optional embodiments, the first test probe group 12 includes two first test probes 121 , the second test probe group 32 includes two second test probes 321 , and all first test probes 121 and all second test probes 321 are arranged in a matrix array.

[0066] The first test point group 210a also includes two first test points, all of which are arranged in a matrix array. The two first test probes 121 on the first test probe group 12 contact the two first test points on the first test point group 210a in a one-to-one correspondence, thereby forming a circuit and performing a test.

[0067] The second test point group 220a also includes two second test points, all of which are arranged in a matrix array. The two second test probes 321 on the second test probe group 32 contact the two second test points on the second test point group 220a in a one-to-one correspondence, thereby forming a circuit and performing a test. As an example, the first test probe 121 and the second test probe 321 are both male probes, and the first and second test points are both female probes. The corresponding male probes are docked with the female probes to achieve a connection between the male and female probes.

[0068] All the first test probes 121 in the first test unit 10 are arranged in a matrix array, and all the second test probes 321 in the second test unit 30 are also arranged in a matrix array. Therefore, the arrangement of all the first test probes 121 in the first test unit 10 and all the second test probes 321 in the second test unit 30 are relatively regular, which facilitates the layout of the first test probes 121 and the second test probes 321.

[0069] As an example, the first test probe 121 and the second test probe 321 are both male probes, the first test point and the second test point are both female probes, and the corresponding male probes are docked with the female probes to achieve connection between the male probes and the female probes.

[0070] Please also refer to Figures 4 to 12 In some optional embodiments, the first test unit 10 includes a first driving member 13 and a first fixing frame 14. The first driving member 13 is mounted on the first fixing frame 14 and is in transmission connection with the first mounting plate 11. The first driving member 13 is used to drive the first mounting plate 11 to drive all first test probe groups 12 to move toward or away from the heating probe card 210. The second test unit 30 includes a second driving member 33 and a second fixing frame 34. The second driving member 33 is mounted on the second fixing frame 34 and is in transmission connection with the second mounting plate 31. The second driving member 33 is used to drive the second mounting plate 31 to drive all second test probe groups 32 to move toward or away from the sensing probe card 220.

[0071] Taking the first test unit 10 as an example, when the first driving member 13 drives the first mounting plate 11 to drive all the first test probe groups 12 to move toward the heating probe plate 210, each first test probe group 12 docks with its corresponding test point group, thereby facilitating the first test unit 10 to test all the heating plates for functional testing. After the test is completed, when the first driving member 13 drives the first mounting plate 11 to drive all the first test probe groups 12 to move away from the heating probe plate 210, each first test probe group 12 separates from the corresponding first test point group 210a, and the first test unit 10 is disconnected from the heating probe plate 210 to facilitate the storage of the first test unit 10.

[0072] The working process of the second test unit 30 is substantially the same as that of the first test unit 10 , and details thereof will not be repeated here.

[0073] The setting of the first driving member 13 and the first fixing member facilitates the docking or disconnection of the first test unit 10 with the heating probe plate 210. The setting of the second driving member 33 and the second fixing member facilitates the docking or disconnection of the second test unit 30 with the sensing probe plate 220. The operation is labor-saving and simple.

[0074] In some optional embodiments, both the first driving member 13 and the second driving member 33 are push-pull quick clamps. The first driving member 13 includes a first push-pull rod 131, which is disposed through the first fixing frame 14 and is in transmission connection with the first mounting plate 11. The first driving member 13 is used to push and pull the first mounting plate 11, thereby driving the first mounting plate 11 to move all first test probe assemblies 12. The second driving member 33 includes a second push-pull rod 331, which is disposed through the second fixing frame 34 and is in transmission connection with the second mounting plate 31. The second driving member 33 is used to push and pull the second mounting plate 31, thereby driving the second mounting plate 31 to move all second test probe assemblies 32.

[0075] The first driving member 13 and the second driving member 33 are both push-pull quick clamps. The first driving member 13 can quickly push each first test probe group 12 to connect or disconnect with its corresponding first test point group 210a, and the second driving member 33 can quickly push each second test probe group 32 to connect or disconnect with its corresponding second test point group 220a. The operation is simple and convenient, and the operation efficiency is high.

[0076] Of course, the specific forms of the first driving member 13 and the second driving member 33 are not limited to the above-mentioned ones. In other embodiments, the first driving member 13 and the second driving member 33 may also be cylinders, electric cylinders or other driving structures.

[0077] See also Figure 5 and Figure 6 ,as well as Figure 9 and Figure 10In some optional embodiments, a first guide hole 111 is defined on the first mounting plate 11, and the first test unit 10 includes a first guide post 15, which is mounted on the first fixing frame 14 and extends through the first guide hole 111. A second guide hole 311 is defined on the second mounting plate 31, and the second test unit 30 includes a second guide post 35, which is mounted on the second fixing frame 34 and extends through the second guide hole 311. For example, there are two first guide holes 111, two first guide posts 15, two second guide holes 311, and two second guide posts 35, and each of the first guide holes 111 corresponds to each of the first guide posts 15, and each of the first guide posts 15 extends through the corresponding first guide hole 111. Each of the second guide holes 311 corresponds to each of the second guide posts 35, and each of the second guide posts 35 extends through the corresponding second guide hole 311.

[0078] The first guide column 15 cooperates with the first guide hole 111, and can guide the movement of the first mounting plate 11 and all the first test probe groups 12 when the first driving member 13 pushes and pulls the first mounting plate 11. The second guide column 35 cooperates with the second guide hole 311, and can guide the movement of the second mounting plate 31 and all the second test probe groups 32 when the second driving member 33 pushes and pulls the second mounting plate 31, thereby improving the stability of the movement.

[0079] See also Figure 7 and Figure 11 In some optional embodiments, the first test unit 10 further includes a first connecting rod 16, which is fixedly connected between the first push-pull rod 131 and the first mounting plate 11. The second test unit 30 further includes a second connecting rod 36, which is fixedly connected between the second push-pull rod 331 and the second mounting plate 31.

[0080] During actual operation, the first driving member 13 pushes the first connecting rod 16 to drive the first mounting plate 11 and all the first test probe groups 12 to move, so as to realize the docking or disconnection of the first test probe group 12 with the first test point group 210a. The second driving member 33 pushes the second connecting rod 36 to drive the second mounting plate 31 and all the second test probe groups 32 to move, so as to realize the docking or disconnection of the second test probe group 32 with the second test point group 220a.

[0081] See also Figure 6 and Figure 7 ,as well as Figure 10 and Figure 11In some optional embodiments, the first test unit 10 also includes a first fixed jaw 17, a first compression elastic member 19, a first elastic jaw 18 and a first pin 21. The first fixed jaw 17, the first compression elastic member 19 and the first elastic jaw 18 are all installed on the first fixed frame 14. The first pin 21 is installed on the first elastic jaw 18. The first compression elastic member 19 is in contact between the first fixed frame 14 and the first pin 21. The first compression elastic member 19 is used to provide a first preload force that drives the first pin 21 to drive the first elastic jaw 18 to move toward the first fixed jaw 17 and cooperate with the first fixed jaw 17 to clamp the heating probe plate 210. The second test unit 30 also includes a second fixed jaw 37, a second compression elastic member 39, a second elastic jaw 38 and a second pin 41. The second fixed jaw 37, the second compression elastic member 39 and the second elastic jaw 38 are all installed on the second fixed frame 34. The second pin 41 is installed on the second elastic jaw 38. The second compression elastic member 39 abuts between the second fixed frame 34 and the second pin 41. The second compression elastic member 39 is used to provide a second pre-tightening force that drives the second pin 41 to drive the second elastic jaw 38 to move toward the second fixed jaw 37 and cooperate with the second fixed jaw 37 to clamp the sensor probe plate 220.

[0082] As an example, the first compression elastic member 19 and the second compression elastic member 39 may both be compression springs.

[0083] Taking the first test unit 10 as an example, during actual assembly, the first fixed jaw 17 first abuts against one side of the heating probe plate 210, and then the first elastic jaw 18 is manually pulled open to increase the distance between the first elastic jaw 18 and the first fixed jaw 17, and the first elastic jaw 18 can abut against the side of the heating probe plate 210 away from the first fixed jaw 17. In this process, the first compression elastic member 19 is further compressed. Thereafter, the first elastic jaw 18 is released, and under the action of the pre-tightening force of the first compression elastic member 19, the first elastic jaw 18 rebounds, and the first elastic jaw 18 cooperates with the first fixed jaw 17 and clamps the heating probe plate 210 to achieve the fixation of the first test unit 10 and the heating probe plate 210. Afterwards, the first driving member 13 is operated to drive the first mounting plate 11 to drive all the test probe groups toward the heating probe plate 210 to achieve the docking of each first test probe group 12 with each first test point group 210a. After the test is completed, the first driving member 13 is operated to drive the first mounting plate 11 and all the test probe groups to move away from the heated probe plate 210, thereby separating the first test probe group 12 from the first test point group 210a. Then, the first elastic clamping jaw 18 is manually opened, and the first fixed clamping jaw 17 and the first elastic clamping jaw 18 are removed.

[0084] The working process of the second test unit 30 is substantially the same as that of the first test unit 10 , and thus will not be described in detail here.

[0085] By setting the first fixed clamp 17, the first compression elastic member 19, the first elastic clamp 18, the second fixed clamp 37, the second compression elastic member 39 and the second elastic clamp 38, it is convenient to fix and separate the first test unit 10 and the heating probe plate 210, and it is convenient to fix and separate the second test unit 30 and the sensing probe plate 220, and the operation is simple and reliable.

[0086] Please also refer to Figures 1 to 5 The present application provides a baking and drying line 1000, which includes a baking fixture 200 and a test device 100 as described in any of the above embodiments. The baking fixture 200 includes a heating probe plate 210 and a sensing probe plate 220. The heating probe plate 210 has multiple groups of first test point groups 210a, and the sensing probe plate 220 has multiple groups of second test point groups 220a. All first test probe groups 12 are used to correspond one-to-one with all first test point groups 210a on the heating probe plate 210 and are electrically connected, and all second test probe groups 32 are used to correspond one-to-one with all second test point groups 220a on the sensing probe plate 220 and are electrically connected.

[0087] The baking and drying line 1000 in the present application has the effects brought about by any of the above embodiments, and the details will not be repeated here.

[0088] The above-mentioned test device 100 and baking drying line 1000, the above-mentioned test device 100 and baking drying line 1000, in the present application, by setting the first test unit 10 and the second test unit 30, when all the first test probe groups 12 of the first test unit 10 are docked with all the first test point groups 210a, and all the second test probe groups 32 of the second test unit 30 are docked with all the second test point groups 220a, the control unit 50 can automatically judge whether all heating plates and all sensor connections are qualified at one time through all the first test probe groups 12 and all the second test probe groups 32. Compared with the traditional manual testing, the test device 100 of the present application has fewer tests and shorter test time, which greatly reduces the difficulty of the operation, and the test is simple and the test efficiency is high. Moreover, the present application uses the control unit 50 to automatically complete the test and can output the test results, with a high degree of standardization and high test accuracy, which reduces the cost of rework. In addition, the entire testing process has low human participation, which reduces the safety risks brought by human operation and has high safety.

[0089] The technical features of the above-mentioned embodiments can be combined arbitrarily. In order to make the description concise, not all possible combinations of the technical features in the above-mentioned embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0090] The above-described embodiments merely represent several implementation methods of the present application. While the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the present application. It should be noted that a person skilled in the art could make various modifications and improvements without departing from the spirit of the present application, all of which fall within the scope of protection of the present application. Therefore, the scope of protection of the present patent application shall be determined by the appended claims.

Claims

1. A testing device, characterized in that: The testing device comprises: A first test unit (10) comprises a first mounting plate (11) and a plurality of first test probe groups (12) mounted on the first mounting plate (11), wherein all the first test probe groups (12) are used to correspond one-to-one with and be electrically connected to all the first test point groups (210a) on the heating probe plate (210); A second test unit (30) comprises a second mounting plate (31) and a plurality of second test probe groups (32) mounted on the second mounting plate (31), wherein all the second test probe groups (32) are used to correspond one-to-one with and be electrically connected to all the second test point groups (220a) on the sensing probe plate (220); and A control unit (50) is electrically connected to all the first test probe groups (12) and all the second test probe groups (32), and the control unit (50) is used to judge whether all the heating plate connections are qualified based on the test results of all the first test probe groups (12), and is used to judge whether all the sensor connections are qualified based on the test results of all the second test probe groups (32).

2. The testing device according to claim 1, wherein: The control unit (50) is used to determine whether the circuits of all the heating plates are connected according to the test results of all the first test probe groups (12); if the circuits of all the heating plates are connected, then all the heating plates are connected properly; The control unit (50) is used to determine whether the circuits of all the sensors are conductive based on the test results of all the second test probe groups (32); if the circuits of all the sensors are conductive, then all the sensors are connected properly.

3. The testing device according to claim 1, wherein: The control unit (50) is used to determine whether all the heating plates are capable of heating and whether the sensors are connected to the corresponding heating plates according to the test results of all the second test probe groups (32).

4. The testing device according to claim 1, wherein: The first test probe group (12) includes two first test probes (121), the second test probe group (32) includes two second test probes (321), and all the first test probes (121) and all the second test probes (321) are arranged in a matrix array.

5. The testing device according to any one of claims 1 to 4, characterized in that: The first test unit (10) includes a first driving member (13) and a first fixing frame (14), wherein the first driving member (13) is mounted on the first fixing frame (14) and is in transmission connection with the first mounting plate (11), and the first driving member (13) is used to drive the first mounting plate (11) to drive all the first test probe groups (12) to move toward or away from the heating probe plate (210); The second test unit (30) includes a second driving member (33) and a second fixing frame (34). The second driving member (33) is installed on the second fixing frame (34) and is transmission-connected to the second mounting plate (31). The second driving member (33) is used to drive the second mounting plate (31) to drive all the second test probe groups (32) to move toward or away from the sensing probe plate (220).

6. The testing device according to claim 5, characterized in that: The first driving member (13) and the second driving member (33) are both push-pull type quick clamps; The first driving member (13) has a first push-pull rod (131), the first push-pull rod (131) is provided in the first fixing frame (14), and is in transmission connection with the first mounting plate (11), the first driving member (13) is used for pushing and pulling the first mounting plate (11) and driving the first mounting plate (11) to drive all the first test probe groups (12) to move; The second driving member (33) has a second push-pull rod (331), which is passed through the second fixing frame (34) and is in transmission connection with the second mounting plate (31). The second driving member (33) is used to push and pull the second mounting plate (31) and drive the second mounting plate (31) to drive all the second test probe groups (32) to move.

7. The testing device according to claim 6, characterized in that A first guide hole (111) is formed on the first mounting plate (11), and the first test unit (10) includes a first guide column (15), the first guide column (15) is mounted on the first fixing frame (14) and is inserted into the first guide hole (111); A second guide hole (311) is provided on the second mounting plate (31), and the second test unit (30) includes a second guide column (35). The second guide column (35) is mounted on the second fixing frame (34) and passes through the second guide hole (311).

8. The testing device according to claim 6, characterized in that The first test unit (10) further includes a first connecting rod (16), wherein the first connecting rod (16) is fixedly connected between the first push-pull rod (131) and the first mounting plate (11); The second testing unit (30) further includes a second connecting rod (36), wherein the second connecting rod (36) is fixedly connected between the second push-pull rod (331) and the second mounting plate (31).

9. The testing device according to claim 5, characterized in that: The first test unit (10) further includes a first fixed jaw (17), a first compression elastic member (19), a first elastic jaw (18) and a first latch (21), wherein the first fixed jaw (17), the first compression elastic member (19) and the first elastic jaw (18) are all mounted on the first fixed frame (14), the first latch (21) is mounted on the first elastic jaw (18), the first compression elastic member (19) is in contact between the first fixed frame (14) and the first latch (21), and the first compression elastic member (19) is used to provide a first pre-tightening force for driving the first latch (21) to drive the first elastic jaw (18) to move toward the first fixed jaw (17) and cooperate with the first fixed jaw (17) to clamp the heating probe plate (210); The second test unit (30) also includes a second fixed jaw (37), a second compression elastic member (39), a second elastic jaw (38) and a second pin (41). The second fixed jaw (37), the second compression elastic member (39) and the second elastic jaw (38) are all installed on the second fixed frame (34). The second pin (41) is installed on the second elastic jaw (38). The second compression elastic member (39) is in contact between the second fixed frame (34) and the second pin (41). The second compression elastic member (39) is used to provide a second preload force that drives the second pin (41) to drive the second elastic jaw (38) to move toward the second fixed jaw (37) and cooperate with the second fixed jaw (37) to clamp the sensing probe plate (220).

10. The testing device according to claim 1, wherein: The first mounting plate (11) and the second mounting plate (31) are both insulating plates.

11. A baking and drying line, characterized in that: The baking and drying line comprises: A baking fixture (200) comprises a heating probe plate (210) and a sensing probe plate (220), wherein the heating probe plate (210) has a plurality of first test point groups (210a), and the sensing probe plate (220) has a plurality of second test point groups (220a); and In the test device according to any one of claims 1 to 10 above, all the first test probe groups (12) are used to correspond one-to-one with and be electrically connected to all the first test point groups (210a) on the heating probe plate (210), and all the second test probe groups (32) are used to correspond one-to-one with and be electrically connected to all the second test point groups (220a) on the sensing probe plate (220).

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