Power-assisted frame device and chip aging test equipment

Abstract

The utility model belongs to the technical field of chip testing, and discloses a power-assisted frame device and chip aging test equipment, a power-assisted handle of the power-assisted frame device is pivoted on a frame assembly, and a pivoting shaft of the power-assisted handle divides the power-assisted handle into a force application part and a power-assisted part along the length direction; the frame assembly is slidably connected to a guide rail component of the test frame in the first direction, and one end, in the first direction, of a power assisting groove of the guide rail component is a first abutting end used for abutting against the power assisting part. The power-assisted handle rotates relative to the frame assembly to form a pull-out state, an avoiding state and a locking state, and when the power-assisted handle is in the pull-out state, the power-assisted part abuts against the first abutting end; when the power-assisted handle is in the avoiding state, the power-assisted handle can rotate relative to the frame assembly, and the power-assisted part is movably arranged in the power-assisted groove. The rotation locking mechanism is arranged between the power-assisted handle and the frame assembly and used for locking rotation of the power-assisted handle relative to the frame assembly so that the power-assisted handle can be kept in the locked state. By means of the arrangement, the pulling-out direction and the pulling-out force can be accurately controlled.

Description

Technical Field

[0001] The utility model relates to the technical field of chip testing, in particular to a power-assisting frame device and chip aging testing equipment. Background Art

[0002] Chip burn-in testing equipment simulates the environmental conditions and time factors experienced in actual use, allowing for long-term stable operation of chips. This allows for verification of chip performance and reliability after extended use, understanding the aging process and rate, and providing a basis for performance improvement and design optimization. During burn-in testing, multiple chips are typically mounted on a burn-in board (burn-in board). This board then interfaces with a resource board within the equipment, providing test signals, enabling unified burn-in testing of multiple chips.

[0003] Existing resource boards are manually plugged in and out directly. The magnitude of the pull-out force and the direction of pull-out are relatively unstable, which can easily cause additional wear at the resource board joints, resulting in poor contact of the resource board and unstable signal provision. Utility Model Content

[0004] The first purpose of the present utility model is to provide a power-assisting frame device, which can solve the problems of wear at the resource board joints, poor contact, and unstable signals provided by the resource board caused by the inconsistency of the pull-out force and the pull-out direction of the existing aging board and resource board when they are manually plugged in and out directly.

[0005] To achieve this purpose, the present invention first adopts the following technical solutions:

[0006] Provide a power-assist frame device, installed in the test frame, including:

[0007] Frame assembly, used to carry PCB board;

[0008] A power-assisting handle, the power-assisting handle being pivotally connected to the frame assembly, wherein the pivot axis of the power-assisting handle divides the power-assisting handle into a force-applying portion and a power-assisting portion along its length;

[0009] The test stand comprises a guide rail component for carrying the frame assembly, the frame assembly being slidably connected to the guide rail component along a first direction, the guide rail component being provided with a power-assisting groove corresponding to the power-assisting handle, one end of the power-assisting groove along the first direction being a first abutting end for abutting against the power-assisting portion; the power-assisting handle is rotated relative to the frame assembly to form a pulled-out state, an avoidance state, and a locked state, and when the power-assisting handle is in the pulled-out state, the power-assisting portion abuts against the first abutting end; when the power-assisting handle is in the avoidance state, the power-assisting handle can be rotated relative to the frame assembly and the power-assisting portion is movably arranged in the power-assisting groove;

[0010] A rotation locking mechanism is further provided between the power-assisting handle and the frame assembly, and the rotation locking mechanism is used to lock the rotation of the power-assisting handle relative to the frame assembly when the power-assisting handle is in a locked state.

[0011] In one embodiment, the rotation locking mechanism includes a threaded hole and a locking bolt that can be threadedly connected to the threaded hole. One of the threaded hole and the locking bolt is arranged on the frame assembly, and the other is arranged on the power-assisting handle. The power-assisting handle can be rotated until the locking bolt and the threaded hole are coaxially arranged.

[0012] In one embodiment, the rotation locking mechanism also includes a fixed block, the threaded hole is opened in the fixed block, the fixed block is arranged on the frame assembly, and the locking bolt is connected to the end of the force-applying part. When the force-applying part rotates to abut the fixed block, along the first direction, the assisting part is constrained in the assisting groove.

[0013] In one embodiment, the other end of the power-assisting groove away from the first abutting end along the first direction is a second abutting end, and the power-assisting handle also has a pushing state. When the power-assisting handle is in the pushing state, the power-assisting part abuts against the second abutting end. When the power-assisting handle is in the locked state, there is a gap between the second abutting end and the power-assisting part.

[0014] In one embodiment, an avoidance groove is further provided on the inner side of the guide rail component, one end of the avoidance groove is connected to the power-assisting groove, and the other end extends along the second direction to an end face of the guide rail component. When the power-assisting handle is in the avoidance state, the projection of the end of the power-assisting part along the second direction is located in the avoidance groove so that the power-assisting handle can be separated from the test frame through the avoidance groove.

[0015] In one embodiment, the frame assembly is provided with a receiving groove, the depth of the receiving groove extends along the thickness direction of the frame assembly, and the force applying portion is rotatably located in the receiving groove.

[0016] In one embodiment, along the thickness direction of the power-assisting handle, a portion of the power-assisting handle protrudes from the accommodating groove.

[0017] In one embodiment, two groups of the power-assisting handles and the rotation locking mechanisms are provided, and the two groups of the power-assisting handles and the two rotation locking mechanisms correspond one to one and are respectively located on both sides of the frame assembly along the width direction.

[0018] In one embodiment, a guide slot is provided on the inner side of the test frame, the length of the guide slot extends along a first direction, and the frame assembly is slidably constrained in the guide slot.

[0019] The second purpose of the present invention is to provide a chip aging test device, which can solve the problems of wear at the resource board joint, poor contact, and unstable signal provided by the resource board caused by the inconsistency of the pull-out force and the pull-out direction when the existing aging board and the resource board are manually plugged in and out directly.

[0020] To achieve this purpose, the present invention adopts the following technical solutions:

[0021] A chip aging test device is provided, comprising the power-assisting frame device as described above. The chip aging test device also comprises a test frame, a PCB board and an aging board. The PCB board is connected to the frame assembly of the power-assisting frame device to form a resource board, and the aging board is connected to the test frame.

[0022] Beneficial effects of the utility model:

[0023] The power-assisting frame device provided by the present invention is installed within a test frame. The test frame includes a guide rail member for supporting a frame assembly. The guide rail member defines a power-assisting groove corresponding to a power-assisting handle. One end of the power-assisting groove along a first direction serves as a first abutting end for abutting against a power-assisting portion. An operator grasps the force-applying portion to rotate the power-assisting handle, which rotates relative to the frame assembly to form a withdrawn state, a retracted state, and a locked state. When the power-assisting handle is in the pull-out state, the power-assisting portion abuts against the first abutting end; while the power-assisting handle applies a force to the first abutting end through the power-assisting portion, the first abutting end applies a reaction force to the power-assisting portion, and drives the frame assembly to move relative to the test frame along the first direction via the pivot shaft, thereby converting the operator's hand-held rotation into a linear motion of the frame assembly along the first direction, and accurately controlling the pull-out direction of the PCB board driven by the frame assembly; moreover, when the power-assisting portion abuts against the first abutting end, it indicates that the power-assisting frame device is already in the process of pulling out the PCB board. At this time, the operator can control the hand-held force-applying portion to slowly apply force, thereby controlling the magnitude of the pull-out force, avoiding excessive wear of the PCB board on the test frame at the connection due to excessive pull-out force or too fast pull-out speed, ensuring that the PCB board is well plugged in and out and can provide a stable signal. When the power-assisting handle is in the avoidance state, the power-assisting handle can rotate relative to the frame assembly and the power-assisting portion is movably arranged in the power-assisting slot. At this time, the frame assembly can move relative to the test frame to ensure that the PCB board is completely detached. A rotation locking mechanism is also provided between the power-assisting handle and the frame assembly. The rotation locking mechanism is used to lock the rotation of the power-assisting handle relative to the frame assembly when the power-assisting handle is in a locked state. The power-assisting handle in the locked state will not rotate, ensuring that the relative position between the frame assembly and the test frame is accurate and the PCB board is reliably connected.

[0024] The chip aging test equipment provided by the present invention has the above-mentioned power-assisting frame device. The power-assisting handle of the power-assisting frame device cooperates with the power-assisting slot of the test frame. The power-assisting handle in the pulled-out state applies a force from the power-assisting part to the first abutting end, and the reaction force applied to the power-assisting part by the first abutting end accurately controls the pulling-out direction of the PCB board driven by the frame assembly, so that the operator can accurately control the size of the pulling-out force, avoid excessive wear of the resource board at the connection due to excessive pulling force and too fast pulling speed, ensure that the resource board is well plugged in and out, can provide a stable signal, and improve the test reliability of the chip aging test equipment. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] Figure 1 This is a schematic structural diagram of a power-assisting frame device provided by an embodiment of the present utility model;

[0026] Figure 2 This is a schematic diagram of the disassembly of the structure of the power-assisting frame device provided by an embodiment of the present utility model;

[0027] Figure 3 This is a schematic diagram of a guide rail component provided by an embodiment of the present utility model;

[0028] Figure 4 This is a structural front view of the power-assisting frame device provided by an embodiment of the utility model;

[0029] Figure 5 yes Figure 4 A magnified schematic diagram of the local structure of part A;

[0030] Figure 6 yes Figure 4 Cross-section along the BB direction;

[0031] Figure 7 yes Figure 6 A magnified schematic diagram of the local structure of part C in the middle;

[0032] Figure 8 yes Figure 6 A magnified schematic diagram of the local structure of part D.

[0033] In the picture:

[0034] 1. Frame assembly; 11. Accommodation tank;

[0035] 2. Power handle; 21. Pivot shaft; 22. Force applying portion; 23. Power assist portion; 24. Rotation locking mechanism; 241. Threaded hole; 242. Locking bolt; 243. Fixing block;

[0036] 100. Test frame; 101. Power-assisting groove; 1011. First abutting end; 1012. Second abutting end; 102. Avoiding groove; 103. Guide slide groove. DETAILED DESCRIPTION

[0037] The following is a clear and complete description of the technical solution of the present invention in conjunction with the accompanying drawings. Obviously, the embodiments described are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making any creative efforts are within the scope of protection of the present invention.

[0038] In the description of the present invention, it should be noted that the terms "center", "up", "down", "left", "right", "vertical", "horizontal", "inside", "outside" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and are not intended to indicate or imply that the devices or elements referred to must have a specific position, be constructed and operated in a specific position, and therefore should not be understood as limiting the present invention. In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance. Among them, the terms "first position" and "second position" are two different positions, and the first feature being "above", "above" and "above" the second feature includes the first feature being directly above and obliquely above the second feature, or simply means that the first feature is at a higher level than the second feature. The first feature being "below", "below" and "below" the second feature includes the first feature being directly below and obliquely below the second feature, or simply means that the first feature is at a lower level than the second feature.

[0039] In the description of this utility model, it should be noted that, unless otherwise expressly specified or limited, the terms "mounted," "connected," and "connected" should be understood in a broad sense. For example, they can refer to fixed connections, detachable connections, or integral connections; mechanical connections, electrical connections; direct connections, indirect connections through an intermediate medium, and internal communication between two components. Those skilled in the art will understand the specific meanings of the above terms in this utility model based on the specific circumstances.

[0040] The following describes in detail embodiments of the present invention. Examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are intended only to explain the present invention and are not to be construed as limiting the present invention.

[0041] like Figures 1 to 3As shown, the embodiment provides first a power-assisted frame device, which is installed in the test rack 100. The power-assisted frame device comprises a frame assembly 1 and a power-assisted handle 2. The frame assembly 1 is used to carry a PCB board (not shown in the figure), which is connected to the frame assembly 1 to form a resource board or an aging board according to different functions of the PCB board. The power-assisted handle 2 is pivotally connected to the frame assembly 1, and a pivot shaft 21 of the power-assisted handle 2 divides the power-assisted handle 2 into a force applying part 22 and a power-assisted part 23 along the length direction of the power-assisted handle 2.

[0042] The test rack 100 has a guide rail member for carrying the frame assembly 1, and the frame assembly 1 is slidingly connected to the guide rail member in a first direction, so as to realize the plugging and unplugging operation of the PCB board. The guide rail member is provided with a power-assisted slot 101 corresponding to the power-assisted handle 2, and one end of the power-assisted slot 101 in the first direction is a first abutting end 1011 for abutting against the power-assisted part 23. An operator holds the force applying part 22 to rotate the power-assisted handle 2, and the power-assisted handle 2 is rotated relative to the frame assembly 1 to form an unplugging state, an avoiding state and a locking state. When the power-assisted handle 2 is in the unplugging state, the power-assisted part 23 abuts against the first abutting end 1011; while the power-assisted handle 2 applies a force to the first abutting end 1011 through the power-assisted part 23, the first abutting end 1011 applies a counterforce to the power-assisted part 23, and the frame assembly 1 is driven to move relative to the test rack 100 in the first direction through the pivot shaft 21, so as to convert the rotation of the hand of the operator into the linear motion of the frame assembly 1 in the first direction, and the direction of unplugging of the PCB board carried by the frame assembly 1 can be accurately controlled; moreover, when the power-assisted part 23 abuts against the first abutting end 1011, it indicates that the power-assisted frame device has entered the unplugging process of the PCB board, at this time, the operator can control the size of the unplugging force by slowly applying force to the force applying part 22, so as to avoid that the unplugging force is too large and the unplugging speed is too fast to cause excessive wear of the PCB board on the test rack 100 at the connection, ensure that the PCB board is plugged and unplugged well, and stable signals can be provided. When the power-assisted handle 2 is in the avoiding state, the power-assisted handle 2 can be rotated relative to the frame assembly 1, and the power-assisted part 23 is movably arranged in the power-assisted slot 101, at this time, the frame assembly 1 can move relative to the test rack 100 to ensure that the PCB board is completely separated. A rotation locking mechanism 24 is further arranged between the power-assisted handle 2 and the frame assembly 1, and the rotation locking mechanism 24 is used to lock the rotation of the power-assisted handle 2 relative to the frame assembly 1 when the power-assisted handle 2 is in the locking state. The power-assisted handle 2 in the locking state will not rotate, so as to ensure that the relative position between the frame assembly 1 and the test rack 100 is accurate, and the PCB board is reliably connected.

[0043] In the embodiment, the first direction is the length direction of the frame assembly 1.

[0044] The rotation locking mechanism 24 comprises a threaded hole 241 and a locking bolt 242 threadedly connected to the threaded hole 241, one of the threaded hole 241 and the locking bolt 242 is arranged on the frame assembly 1, and the other is arranged on the power-assisted handle 2. The power-assisted handle 2 can be rotated to coaxially arrange the locking bolt 242 and the threaded hole 241, and then the locking bolt 242 is screwed into the threaded hole 241 to lock the power-assisted handle 2 and the frame assembly 1. When the power-assisted handle 2 is rotated to the locked state, the threaded hole 241 and the locking bolt 242 of the rotation locking mechanism 24 can be aligned at the same time, which simplifies the locking structure and achieves the purpose of quick locking, and is convenient to use.

[0045] The rotation locking mechanism 24 further comprises a fixed block 243, the threaded hole 241 is arranged in the fixed block 243, and the fixed block 243 is arranged on the frame assembly 1 by screws or other fasteners to avoid affecting the structural strength of the frame assembly 1 by opening holes on the frame assembly 1. The locking bolt 242 is connected to the end of the force applying part 22, and when the force applying part 22 is rotated to abut against the fixed block 243, the power-assisted part 23 is constrained in the power-assisted groove 101 along the first direction. In this way, both ends of the power-assisted handle 2 are constrained, and the power-assisted frame device and the test rack 100 are also locked when the power-assisted handle 2 is locked on the frame assembly 1, thereby maintaining the position stability of the power-assisted frame device.

[0046] The other end of the power-assisted groove 101 away from the first abutting end 1011 along the first direction is a second abutting end 1012, and the power-assisted handle 2 also has a pushing state. When the power-assisted handle 2 is in the pushing state, the power-assisted part 23 abuts against the second abutting end 1012, and the size and direction of the pushing force are controlled by the acting force between the second abutting end 1012 and the power-assisted part 23, so that the frame assembly 1 is smoothly pushed on the guide rail member, and the PCB board is prevented from being damaged due to excessive pushing force or deflection of the pushing force direction. By different rotation directions of the power-assisted handle 2, the pushing state and the pulling-out state can be formed respectively, so that the pushing and pulling-out processes are relatively stable. When the power-assisted handle 2 is in the locked state, as shown in Figure 6 and Figure 7 As shown, there is a gap between the second abutting end 1012 and the power-assisted part 23, which indicates that the PCB board has been inserted in place to form a stable connection. Figure 7 L is the gap between the second abutting end 1012 and the power-assisted part 23.

[0047] An avoidance groove 102 is also provided on the inner side of the guide rail member. One end of the avoidance groove 102 is connected to the power-assisting groove 101, and the other end extends along the second direction to one end face of the guide rail member. When the power-assisting handle 2 is in the avoidance state, the projection of the end of the power-assisting portion 23 along the second direction is located in the avoidance groove 102, so that the power-assisting handle 2 can be separated from the test frame 100 through the avoidance groove 102. The second direction is also the length extension direction of the avoidance groove 102. The second direction can be the same as the first direction, or the second direction and the first direction are set at an angle. For example, in one embodiment, the avoidance groove 102 extends along the front-to-back direction of the guide rail member to one end face. When the power-assisting handle 2 is rotated to the avoidance angle, the end of the power-assisting portion 23 can enter the power-assisting groove 101 through the avoidance groove 102, thereby enabling the frame assembly 1 to be installed on the test frame 100, or the frame assembly 1 to be separated from the test frame 100.

[0048] The frame assembly 1 is provided with a receiving groove 11, such as Figure 4 and Figure 5 As shown, the depth of the accommodating groove 11 extends along the thickness direction of the frame assembly 1, and the force-applying portion 22 is rotatably located in the accommodating groove 11, which can reduce the size of the frame assembly 1 in the thickness direction, thereby facilitating the miniaturization and lightweighting of the assist frame device.

[0049] For easy gripping, part of the power-assisting handle 2 protrudes from the accommodating groove 11 along the thickness direction of the power-assisting handle 2, and part of the power-assisting handle 2 is located in the accommodating groove 11. When the power-assisting handle 2 needs to be rotated, it can be quickly gripped with the help of the protruding part of the power-assisting handle 2, which is more convenient to operate.

[0050] In order to ensure the consistency of movement of the frame assembly 1 in the width direction, as shown in FIG. Figure 6 As shown, there are two sets of power-assisting handles 2 and two rotation locking mechanisms 24, and the two sets of power-assisting handles 2 and the two rotation locking mechanisms 24 correspond to each other and are respectively located on both sides of the width direction of the frame assembly 1. Simultaneously operating the two sets of power-assisting handles 2, thereby applying force on both sides of the width direction of the frame assembly 1, prevents the frame assembly 1 from deflecting on the guide rail member. It should be noted that for the sake of comparison, Figure 6 The two sets of power-assisting handles 2 are respectively in a locked state and a pulled-out state. However, in actual use, the states of the two sets of power-assisting handles 2 on the same frame assembly 1 are exactly the same.

[0051] A guide groove 103 is provided on the inner side of the test frame 100. The length of the guide groove 103 extends along the first direction. The frame assembly 1 can be slidably constrained in the guide groove 103. The guide groove 103 provides movement guidance for the frame assembly 1 and reduces friction resistance during the movement of the frame assembly 1.

[0052] The present invention also provides a chip burn-in test device, comprising the aforementioned power-assisted frame device. The chip burn-in test device further comprises a test frame 100, a PCB, and a burn-in board. The PCB is connected to a frame assembly 1 of the power-assisted frame device to form a resource board. The burn-in board is connected to the test frame 100. The frame assembly 1 drives the PCB to reciprocate in a first direction, thereby moving the PCB toward or away from the burn-in board. The assisting handle 2 of the assisting frame device cooperates with the assisting slot 101 of the test frame 100 to form the assisting handle 2 in the pull-out state, the avoidance state and the locking state relative to the frame assembly 1. The assisting handle 2 in the pull-out state applies a force from the assisting part 23 to the first abutting end 1011, and the reaction force applied to the assisting part 23 by the first abutting end 1011 accurately controls the pull-out direction of the PCB board driven by the frame assembly 1, so that the operator can accurately control the size of the pull-out force, avoid excessive wear of the resource board on the test frame 100 at the connection due to excessive pull-out force and too fast pull-out speed, ensure that the resource board is well plugged in and out, can provide a stable signal, and improve the test reliability of the chip aging test equipment.

[0053] Obviously, the above-described embodiments of the present invention are merely examples for the purpose of clearly illustrating the present invention and are not intended to limit the manner in which the present invention is to be implemented. A person skilled in the art would be able to make various obvious changes, readjustments, and substitutions without departing from the scope of protection of the present invention. It is not necessary and impossible to enumerate all embodiments here. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present invention shall be included within the scope of protection of the claims of the present invention.

Claims

1. A power-assisting frame device, installed in a test frame (100), characterized in that: include: A frame assembly (1) for carrying a PCB board; A power-assisting handle (2), the power-assisting handle (2) being pivotally connected to the frame assembly (1), and a pivot axis (21) of the power-assisting handle (2) dividing the power-assisting handle (2) into a force-applying portion (22) and a power-assisting portion (23) along its length direction; The test stand (100) has a guide rail component for carrying the frame assembly (1), the frame assembly (1) is slidably connected to the guide rail component along a first direction, the guide rail component is provided with a power-assisting groove (101) corresponding to the power-assisting handle (2), one end of the power-assisting groove (101) along the first direction is a first abutting end (1011) for abutting against the power-assisting portion (23); the power-assisting handle (2) rotates relative to the frame assembly (1) to form a pull-out state, an avoidance state and a locked state, when the power-assisting handle (2) is in the pull-out state, the power-assisting portion (23) abuts against the first abutting end (1011); when the power-assisting handle (2) is in the avoidance state, the power-assisting handle (2) can rotate relative to the frame assembly (1) and the power-assisting portion (23) is movably arranged in the power-assisting groove (101); A rotation locking mechanism (24) is also provided between the power-assisting handle (2) and the frame assembly (1), and the rotation locking mechanism (24) is used to lock the rotation of the power-assisting handle (2) relative to the frame assembly (1) when the power-assisting handle (2) is in a locked state.

2. The power-assisting frame device according to claim 1, characterized in that: The rotation locking mechanism (24) comprises a threaded hole (241) and a locking bolt (242) capable of being threadedly connected to the threaded hole (241); one of the threaded hole (241) and the locking bolt (242) is provided on the frame assembly (1), and the other is provided on the power-assisting handle (2); the power-assisting handle (2) can be rotated until the locking bolt (242) and the threaded hole (241) are coaxially arranged.

3. The power-assisting frame device according to claim 2, characterized in that: The rotation locking mechanism (24) further includes a fixed block (243), the threaded hole (241) is opened in the fixed block (243), the fixed block (243) is arranged on the frame assembly (1), and the locking bolt (242) is connected to the end of the force-applying part (22). When the force-applying part (22) rotates to abut against the fixed block (243), the power-assisting part (23) is constrained in the power-assisting groove (101) along the first direction.

4. The power-assisting frame device according to claim 1, characterized in that: The other end of the power-assisting groove (101) away from the first abutting end (1011) along the first direction is a second abutting end (1012); the power-assisting handle (2) also has a pushing state; when the power-assisting handle (2) is in the pushing state, the power-assisting portion (23) abuts against the second abutting end (1012); when the power-assisting handle (2) is in the locking state, a gap exists between the second abutting end (1012) and the power-assisting portion (23).

5. The power-assisting frame device according to claim 1, characterized in that: An avoidance groove (102) is also provided on the inner side of the guide rail component. One end of the avoidance groove (102) is connected to the power-assisting groove (101), and the other end extends along the second direction to an end face of the guide rail component. When the power-assisting handle (2) is in an avoidance state, the projection of the end of the power-assisting portion (23) along the second direction is located in the avoidance groove (102), so that the power-assisting handle (2) is separated from the test stand (100) through the avoidance groove (102).

6. The power-assisting frame device according to claim 1, characterized in that: The frame assembly (1) is provided with a receiving groove (11), the depth of the receiving groove (11) extends along the thickness direction of the frame assembly (1), and the force-applying portion (22) is rotatably located in the receiving groove (11).

7. The power-assisting frame device according to claim 6, characterized in that: Along the thickness direction of the power-assisting handle (2), a portion of the power-assisting handle (2) protrudes from the accommodating groove (11).

8. The power-assisting frame device according to any one of claims 1 to 7, characterized in that: The power-assisting handle (2) and the rotation locking mechanism (24) are both provided in two groups, and the two groups of the power-assisting handle (2) and the two rotation locking mechanisms (24) correspond one to one and are respectively located on both sides of the frame assembly (1) along the width direction.

9. The power-assisting frame device according to any one of claims 1 to 7, characterized in that: A guide slot (103) is provided on the inner side of the test frame (100), the length of the guide slot (103) extending along a first direction, and the frame assembly (1) is slidably constrained in the guide slot (103).

10. Chip aging test equipment, characterized in that, The chip aging test device comprises a power-assisting frame device as described in any one of claims 1 to 9, wherein the chip aging test device further comprises a test frame (100), a PCB board and an aging board, wherein the PCB board is connected to the frame assembly (1) of the power-assisting frame device to form a resource board, and the aging board is connected to the test frame (100).

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