High-frequency test power supply capacitor aging leakage current monitoring circuit
By designing a high-frequency test power supply capacitor aging leakage current monitoring circuit, using an adjustable DC power supply, inductor group and resistor module, combined with signal processing circuit and display screen, the real-time monitoring and historical record of capacitor leakage current is realized, solving the problem of difficulty in monitoring the leakage current change pattern during capacitor aging, and ensuring the stability and safety of capacitor.
Patent Information
- Application Number
- CN202422633776.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-30
- Publication Date
- 2025-10-24
- Estimated Expiration
- 2034-10-30
AI Technical Summary
Existing technologies are unable to effectively monitor the variation patterns of capacitor leakage current, resulting in an inability to timely understand the aging status of the capacitor, affecting its electrical performance and safety.
Design a high-frequency test power supply capacitor aging leakage current monitoring circuit. By combining an adjustable DC power supply, an inductor group, a capacitor group and a resistor module, along with a signal processing circuit and a human-machine interactive display screen, the circuit can realize real-time monitoring and recording of capacitor leakage current.
It realizes real-time monitoring and historical recording of capacitor leakage current, can be continuously adjusted in the frequency range of 1kHz-2MHz, and provides AC output power from tens of watts to hundreds of kilowatts, ensuring the long-term stable operation and safety of the capacitor.
Smart Images
Figure CN223471137U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to a capacitor aging protection circuit, in particular to a kind of high-frequency test power supply capacitor aging leakage current monitoring circuit, belong to capacitor aging monitoring circuit technical field. BACKGROUND
[0002] China is the world's first capacitor production power, capacitor in circuit main function is filtering and direct isolation effect, just its physical meaning is repeatedly to capacitor charging and discharging, the more speed and times of this charging and discharging, capacitor internal heat also will be greater, the accumulation of this heat will make capacitor internal temperature too high and affect the electrical properties of capacitor internal material, capacitor leakage current also increases, because of the aging process cannot monitor the leakage current of each group of capacitors, technical personnel cannot statistical analysis the change rule of capacitor leakage current, for this design a kind of high-frequency test power supply capacitor aging leakage current monitoring circuit to solve the above problems. UTILITY MODEL CONTENTS
[0003] The utility model discloses a kind of high-frequency test power supply capacitor aging leakage current monitoring circuit.
[0004] The utility model discloses the purpose that can be achieved by using the following technical scheme:
[0005] A kind of high-frequency test power supply capacitor aging leakage current monitoring circuit, including adjustable DC power supply, the positive pole of adjustable DC power supply is connected by the inductance group series capacitor group, capacitor group is electrically connected the negative pole of adjustable DC power supply by resistance module.
[0006] Preferably, the inductance group includes inductance L1, inductance L2 to inductance Ln, and each inductance is connected with corresponding capacitor group in series.
[0007] Preferably, the capacitor group includes two groups of polar capacitors, and the negative poles of the two groups of polar capacitors are connected to each other, and the positive poles are connected to the inductance group respectively.
[0008] Preferably, capacitor C1 and capacitor C2 form a capacitor group, the anode of capacitor C1 is electrically connected to one end of inductance L1, the other end of inductance L2 is electrically connected to the other end of inductance L2, one end of inductance L2 is electrically connected to the anode of capacitor C2, the cathode of capacitor C2 is electrically connected to the cathode of capacitor C1 and one end of resistance R1, and the other end of resistance R1 is electrically connected to the negative pole of adjustable DC power supply.
[0009] Preferably, one end of resistance R1 to Rn is also electrically connected to signal processing circuit board, and the signal processing circuit board is electrically connected to man-machine interactive display screen.
[0010] Preferably, the signal processing circuit board comprises a multi-channel analog switch, an AD sampling circuit and a single-chip microcomputer, the multi-channel analog switch is electrically connected to the AD sampling circuit, and the AD sampling circuit is electrically connected to the single-chip microcomputer.
[0011] The utility model discloses a beneficial technical effect:
[0012] The utility model provides a kind of high-frequency test power supply capacitor aging leakage current monitoring circuit, load capacitor is connected by a plurality of groups of capacitors in series, each group of capacitors is connected by two electrolytic capacitors negative pole and negative pole, two positive poles are led out, test equipment capacitor aging protection circuit includes a plurality of inductors, the negative pole of each group of capacitors is connected with one current sampling resistance in series, the direct current leakage current value of each group of capacitors is detected, the positive pole of each group of capacitors is connected with the positive pole of a direct current power supply through one inductor, the negative pole of the direct current power supply is connected with the one end of the negative pole of each group of capacitors through one leakage current sampling resistance, equipment can realize 1kHz-2MHz frequency continuous adjustable, realize dozens of watts to hundreds of kilowatt alternating current output power, long-term stable work. BRIEF DESCRIPTION OF DRAWINGS
[0013] Figure 1 It is a preferred embodiment of the circuit diagram of the high-frequency test power supply capacitor aging leakage current monitoring circuit according to the utility model. DETAILED DESCRIPTION
[0014] To make the skilled in the art more clear and definite technical scheme of the utility model, the utility model is further described in detail below in conjunction with examples and drawings, but the embodiment of the utility model is not limited to this.
[0015] As Figure 1 As shown in the utility model discloses a kind of high-frequency test power supply capacitor aging leakage current monitoring circuit, including adjustable direct current power supply, the positive pole of adjustable direct current power supply is connected through the capacitor group of inductor group series connection, the negative pole of adjustable direct current power supply is electrically connected between capacitor group through resistance module, inductor group includes inductor L1, inductor L2 to inductor Ln, every inductor is connected with corresponding capacitor group in series, capacitor group includes two groups of polar capacitors, and the negative pole of two groups of polar capacitors is connected with each other, and the positive pole is connected inductor group respectively, capacitor C1 and capacitor C2 constitute a group of capacitor group, the anode of capacitor C1 is electrically connected with one end of inductor L1, the other end of inductor L2 is electrically connected with the other end of inductor L2, one end of inductor L2 is electrically connected with the anode of capacitor C2, the cathode of capacitor C2 and the cathode of capacitor C1 and one end of resistance R1 are electrically connected, the other end of resistance R1 is electrically connected with the negative pole of adjustable direct current power supply, one end of resistance R1-Rn is also electrically connected with signal processing circuit board, the signal processing circuit board is electrically connected with man-machine interactive display screen, signal processing circuit board includes multi-channel analog switch, AD sampling circuit and single-chip microcomputer, multi-channel analog switch is electrically connected with AD sampling circuit, and AD sampling circuit is electrically connected with single-chip microcomputer.
[0016] R1, R2, R3-Rn flow through each group of aging capacitor leakage current, the resistance between the two ends of ILD1, ILD2, TLD3..ILDn DC voltage signal, the N DC voltage signal is connected to the signal processing circuit board, the signal processing circuit board in the multiplexing analog switch in turn cycle switching ILD1, ILD2, TLD3..ILDn DC voltage signal into the AD sampling circuit, AD sampling circuit will be converted into digital signal ILD1, ILD2, TLD3..ILDn DC voltage signal, digital signal into single-chip microcomputer, single-chip microcomputer will be calculated and processed into the leakage current value, the leakage current value into the man-machine interaction display screen, display screen in the specified area will be the leakage current value of each group of capacitor, display screen and every certain time will be drawn curve of leakage current value, ultimately get the N group of capacitor leakage current history record curve in the aging process of capacitor.
[0017] The equivalent of C1, C2-Cn+1 in the DC loop is parallel connection, and the DC charging loop of the electrolytic capacitor C1 is: the DC current flows from the positive output of the DC power supply, passes through the inductor L1 to the positive electrode of the capacitor C1, flows out from the negative electrode of the C1 to the resistor R1, and then returns to the negative electrode of the DC power supply.
[0018] The DC charging loop of the electrolytic capacitor C2 is: the DC current flows from the positive output of the DC power supply, passes through the inductor L2 to the positive electrode of the capacitor C2, flows out from the negative electrode of the C2 to the resistor R1, and then returns to the negative electrode of the DC power supply.
[0019] The DC charging loop of the electrolytic capacitor C3 is: the DC current flows from the positive output of the DC power supply, passes through the inductor L2 to the positive electrode of the capacitor C3, flows out from the negative electrode of the C3 to the resistor R2, and then returns to the negative electrode of the DC power supply.
[0020] The DC charging loop of the electrolytic capacitor C4 is: the DC current flows from the positive output of the DC power supply, passes through the inductor L3 to the positive electrode of the capacitor C4, flows out from the negative electrode of the C4 to the resistor R2, and then returns to the negative electrode of the DC power supply.
[0021] The above is only a further embodiment of the present application, but the protection scope of the present application is not limited thereto, and any person skilled in the art can make equivalent replacement or change according to the technical scheme and concept of the present application within the scope disclosed by the present application, which belongs to the protection scope of the present application.
Claims
1. A high frequency test power supply capacitor aging leakage current monitoring circuit, characterized by: The adjustable DC power supply is connected with a positive electrode of the adjustable DC power supply through an inductance group and a capacitor group in series, and a negative electrode of the adjustable DC power supply is connected with the capacitor group through a resistance module.
2. The high-frequency test power capacitor aging leakage current monitoring circuit according to claim 1, characterized in that: The inductance group comprises inductances L1, L2 to Ln, and each inductance is connected with a corresponding capacitor group in series.
3. The high-frequency test power capacitor aging leakage current monitoring circuit according to claim 2, characterized in that: The capacitor group comprises two groups of polarized capacitors, and the negative electrodes of the two groups of polarized capacitors are connected with each other, and the positive electrodes of the two groups of polarized capacitors are connected with the inductance group respectively.
4. The high-frequency test power capacitor aging leakage current monitoring circuit according to claim 3, characterized in that: Capacitors C1 and C2 constitute a capacitor group, an anode of the capacitor C1 is connected with one end of the inductance L1, the other end of the inductance L2 is connected with the other end of the inductance L2, one end of the inductance L2 is connected with an anode of the capacitor C2, a cathode of the capacitor C2 is connected with a cathode of the capacitor C1 and one end of the resistance R1, and the other end of the resistance R1 is connected with a negative electrode of the adjustable DC power supply.
5. The high-frequency test power capacitor aging leakage current monitoring circuit according to claim 4, characterized in that: One end of the resistances R1 to Rn is also connected with a signal processing circuit board, and the signal processing circuit board is connected with a man-machine interactive display screen.
6. The high-frequency test power capacitor aging leakage current monitoring circuit according to claim 5, characterized in that: The signal processing circuit board comprises a multiplexing analog switch, an AD sampling circuit and a single-chip microcomputer, the multiplexing analog switch is connected with the AD sampling circuit, and the AD sampling circuit is connected with the single-chip microcomputer.