Optical module test tool

Abstract

An optical module test tool disclosed by the present application comprises a support member, a conductive structure and an abutting member, the conductive structure comprises at least two conductive members connected with the support member, the conductive members are used for being electrically connected with a power supply, the conductive members comprise conductive columns protruding out of a support surface of one side of the support member along a first direction, and the conductive columns extend along the first direction. The conductive column is used for being inserted into a wiring terminal of the optical module and is electrically connected with the wiring terminal; the abutting piece is located on one side of the supporting piece in the first direction, the abutting piece can move between an abutting position and a separating position relative to the supporting piece, the abutting piece abuts against one side of the wiring terminal in the first direction when located at the abutting position, and the abutting piece is separated from the wiring terminal when located at the separating position. And a gap for the wiring terminal to pass through is formed between the abutting piece and the conductive column. According to the optical module test tool provided by the embodiment of the invention, the wiring terminal of the optical module can be conveniently sleeved on the conductive column or taken down from the conductive column, and the detection efficiency of the optical module can be improved.

Description

Technical Field

[0001] This application relates to the field of laser technology, and in particular to optical module testing fixtures. Background Technology

[0002] Fiber lasers are lasers that use rare-earth-doped glass fibers as the gain medium. They have found wide applications in industrial manufacturing, medical fields, and military defense. Fiber lasers can be developed based on fiber amplifiers. Under the action of pump light, high power density can easily be formed within the fiber, causing population inversion of the laser energy levels in the laser gain medium. By appropriately adding a positive feedback loop, laser oscillation output can be generated. They are now widely used in industrial processing, such as cutting and welding.

[0003] In the manufacturing process of lasers, they are generally first assembled into optical modules. Then, the optical modules are powered on by optical module testing fixtures to check whether the relevant parameters of the optical modules meet the standards. Only optical modules that meet the standards are then assembled.

[0004] However, existing optical module testing fixtures require connecting the optical module's terminals to the power cord using screws, which is cumbersome and affects the testing efficiency of the optical module. Utility Model Content

[0005] This application provides an optical module testing fixture, which aims to solve the problem that existing optical module testing fixtures require cumbersome operation of connecting the optical module's wiring terminals to the power cord, thus affecting the testing efficiency of the optical module.

[0006] This application provides an optical module testing fixture, including:

[0007] A support member includes a support surface located on one side of the support member along a first direction;

[0008] A conductive structure includes at least two conductive elements connected to the support member, the conductive elements being electrically connected to a power source, the conductive elements including conductive posts protruding from the support surface, the conductive posts extending along the first direction, the conductive posts being used to insert into and electrically connect to the wiring terminals of the optical module.

[0009] An abutment is located on one side of the support member along the first direction. The abutment is movable relative to the support member between an abutment position and a separation position. When the abutment is in the abutment position, it abuts against the terminal along the first direction. When the abutment is in the separation position, it separates from the terminal. A gap exists between the abutment and the conductive post for the terminal to pass through.

[0010] In some embodiments, the abutting member has a clearance hole, and when the abutting member is in the abutting position, the conductive post is at least partially inserted into the clearance hole.

[0011] In some embodiments, the at least two conductive elements are sequentially distributed along a second direction, the conductive post passes through the support member, the conductive element further includes a terminal post, one end of the terminal post is connected to the end of the conductive post away from the abutment member, the terminal post extends along a third direction, and the first direction, the second direction and the third direction are substantially perpendicular to each other.

[0012] In some embodiments, the optical module testing fixture further includes a first support plate and two second support plates. The first support plate is substantially perpendicular to the third direction and is connected to the side of the support member opposite to the third direction. The two second support plates are connected to both sides of the support member along the second direction, and the two second support plates are substantially perpendicular to the second direction, respectively.

[0013] Wherein, the terminal extends out from one side of the support member along the third direction; or,

[0014] The support plate has a through-hole extending in the third direction, and the terminal extends from the conductive post toward the first support plate.

[0015] In some embodiments, the first support plate and the second support plate are made of insulating material.

[0016] In some embodiments, the abutment is slidably connected to the support along the first direction.

[0017] In some embodiments, the abutting member includes an abutting surface opposite to the supporting surface, one of the supporting surface and the abutting surface is provided with a guide post extending along the first direction, and the other of the supporting surface and the abutting surface is provided with a guide hole extending along the first direction. The guide post is slidably mounted in the guide hole along the first direction so that the abutting member is slidably connected to the supporting member along the first direction.

[0018] In some embodiments, the at least two conductive elements are sequentially distributed along a second direction, which is substantially perpendicular to the first direction; there are multiple guide posts, which are distributed at both ends of the support member along the second direction; there are multiple guide holes, which are equal in number to the number of guide posts and correspond one-to-one.

[0019] In some embodiments, the optical module testing fixture further includes a pressing mechanism, wherein when the abutting member is in the abutting position, the pressing mechanism abuts against one side of the abutting member along the first direction; or,

[0020] The optical module testing fixture also includes a driving mechanism, which is connected to the abutment member and is used to drive the abutment member to move between the abutment position and the separation position.

[0021] In some embodiments, the outer periphery of the conductive post is provided with an abutment portion, which is used to abut against the side of the terminal block opposite to the first direction.

[0022] The optical module testing fixture provided in this application embodiment allows the conductive post of the conductive component to protrude from the conductive post of the support surface and extend along a first direction, and allows the abutting member to be positioned relative to the support member between an abutting position and a separating position. This enables the wiring terminals of the optical module to be stably electrically connected to the conductive post, and the wiring terminals of the optical module can be easily fitted onto or removed from the conductive post. The operation is very convenient and helps to improve the testing efficiency of the optical module. Attached Figure Description

[0023] The following detailed description of the specific embodiments of the present application in conjunction with the accompanying drawings will make the technical solutions and other beneficial effects of the present application apparent.

[0024] Figure 1 A schematic diagram of one embodiment of the optical module testing fixture provided in this application;

[0025] Figure 2 for Figure 1 An exploded view of the optical module testing fixture, where the pressing mechanism is not shown;

[0026] Figure 3 A schematic diagram of another embodiment of the optical module testing fixture provided in this application;

[0027] Figure 4 for Figure 3 An exploded view of the optical module testing fixture, where the drive mechanism is not shown;

[0028] Figure 5 This is a schematic diagram of the structure of one embodiment of the conductive element provided in this application.

[0029] Optical module testing fixture 100; support component 110; support surface 111; guide post 112; conductive structure 120; conductive component 121; conductive post 1211; abutment part 1212; terminal post 1213; abutment component 130; clearance hole 131; guide hole 132; first support plate 140; terminal hole 141; second support plate 150; base plate 160; pressing mechanism 170; first handle 171; first connecting rod structure 172; pressing component 173; pressing part 1731; drive mechanism 180; second handle 181; second connecting rod structure 182; connector 183; first direction X; second direction Y; third direction Z. Detailed Implementation

[0030] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the embodiments described are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without making creative efforts are within the scope of protection of this application.

[0031] In the description of this application, it should be understood that the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," and "counterclockwise," etc., indicating orientation or positional relationships based on the orientation or positional relationships shown in the accompanying drawings, are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application. Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Thus, features defined with "first" and "second" may explicitly or implicitly include one or more of the stated features. In the description of this application, "a plurality of" means two or more, unless otherwise explicitly specified.

[0032] In the description of this application, it should be noted that, unless otherwise expressly specified or limited, the terms "installed," "connected," and "connected" should be understood in a broad sense. For example, they can refer to fixed connections, detachable connections, or integral connections; they can refer to mechanical connections, electrical connections, or mutual communication; they can refer to direct connections or indirect connections through an intermediate medium; they can refer to internal communication between two components or the interaction between two components. Those skilled in the art will understand the specific meanings of the above terms in this application based on specific circumstances.

[0033] In this application, unless otherwise expressly specified and limited, "above" or "below" the second feature can include direct contact between the first and second features, or contact between the first and second features through another feature between them. Furthermore, "above," "over," and "on top" of the second feature includes the first feature being directly above or diagonally above the second feature, or simply indicates that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature includes the first feature being directly below or diagonally below the second feature, or simply indicates that the first feature is at a lower horizontal level than the second feature.

[0034] The following disclosure provides many different embodiments or examples for implementing different structures of this application. To simplify the disclosure, specific examples of components and arrangements are described below. Of course, these are merely examples and are not intended to limit the scope of this application. Furthermore, reference numerals and / or letters may be repeated in different examples; such repetition is for simplification and clarity and does not in itself indicate a relationship between the various embodiments and / or arrangements discussed. In addition, examples of various specific processes and materials are provided in this application, but those skilled in the art will recognize the application of other processes and / or the use of other materials.

[0035] This application provides an optical module testing fixture. The following provides a detailed description of each embodiment of the optical module testing fixture.

[0036] Figure 1 This is a schematic diagram of one embodiment of the optical module testing fixture provided in this application. Figure 1 As shown, the optical module testing fixture 100 includes a support 110 and a conductive structure 120. The conductive structure 120 is mounted on the support 110 and is used to electrically connect to a power supply. The conductive structure 120 is also used to electrically connect to the wiring terminals of the optical module, so that the power supply supplies power to the optical module through the conductive structure 120, enabling the optical module to operate and facilitating the detection of whether the relevant parameters of the optical module meet the standards.

[0037] like Figure 1 and Figure 2 As shown, the support member 110 includes a support surface 111 located on one side of the support member 110 along the first direction X. The conductive structure 120 includes at least two conductive elements 121 connected to the support member 110. The conductive elements 121 are used for electrical connection with a power source and for electrical connection with the wiring terminals of the optical module, thereby connecting the power source to the optical module.

[0038] The number of conductive elements 121 can be even, with each pair of conductive elements 121 used for electrical connection to the two terminals of an optical module with opposite polarities. The number of conductive elements 121 can be 2, 4, 6, etc. The more conductive elements 121 there are, the more the conductive structure 120 of the optical module test fixture 100 can simultaneously connect the power supply to multiple optical modules.

[0039] In some embodiments, the conductive member 121 may include a conductive post 1211 protruding from the support surface 111, the conductive post 1211 extending along the first direction X, the conductive post 1211 being used to insert into the wiring terminals of the optical module and electrically connect with the wiring terminals of the tube module. The optical module testing fixture 100 also includes an abutment member 130, the abutment member 130 being located on one side of the support member 110 along the first direction X, and the abutment member 130 being movable relative to the support member 110 between an abutment position and a disengagement position. When the abutment member 130 is in the abutment position (e.g., ...), Figure 1 When the contact member 130 is in the separated position, it abuts against the terminal block on one side along the first direction X, thereby maintaining stable contact between the terminal block of the optical module and the conductive post 1211, improving the conductivity stability between the power supply and the optical module. When the contact member 130 is in the separated position, the contact member 130 is separated from the terminal block of the optical module, and there is a gap between the contact member 130 and the conductive post 1211 for the terminal block of the optical module to pass through, so as to remove the terminal block of the optical module from the conductive post 1211, or to sleeve the terminal block of the optical module onto the conductive post 1211.

[0040] The optical module testing fixture 100 provided in this application embodiment allows the conductive post 1211 of the conductive member 121 to protrude from the conductive post 1211 of the support surface 111 and extend along the first direction X, and allows the abutment member 130 to be between the abutment position and the separation position relative to the support member 110, so that the wiring terminals of the optical module can be stably electrically connected to the conductive post 1211, and the wiring terminals of the optical module can also be easily sleeved on or removed from the conductive post 1211, which is very convenient to operate and helps to improve the testing efficiency of the optical module.

[0041] In some embodiments, as Figure 1 and Figure 2 As shown, a clearance hole 131 can be provided in the abutment member 130. When the abutment member 130 is in the abutment position, the conductive post 1211 is at least partially inserted into the clearance hole 131. Thus, when the abutment member 130 abuts against the wiring terminal of the optical module on one side of the first direction X, the part of the abutment member 130 extending out of the wiring terminal on the side of the first direction X will not interfere with the wiring terminal.

[0042] The number of clearance holes 131 can be the same as the number of conductive posts 1211, and they correspond one-to-one. When the abutment member 130 is in the abutment position, at least part of the multiple conductive posts 1211 are inserted into the multiple clearance holes 131 in a one-to-one correspondence.

[0043] In some embodiments, at least two conductive elements 121 of the conductive structure 120 may be sequentially distributed along the second direction Y, wherein the second direction Y is substantially perpendicular to the first direction X, so that the conductive posts 1211 of at least two conductive elements 121 of the conductive structure 120 can be connected to the wiring terminals of the optical module.

[0044] The conductive post 1211 of the conductive element 121 can pass through the support member 110. The conductive element 121 also includes a terminal post 1213, one end of which is connected to the end of the conductive post 1211 away from the abutment member 130, and the terminal post 1213 extends along the third direction Z. The first direction X, the second direction Y, and the third direction Z are substantially perpendicular to each other, thereby making it easier to connect the terminal post 1213 to the power supply.

[0045] The conductive post 1211 and the terminal post 1213 can be made of the same or different materials, as long as they are conductive. Alternatively, the terminal post 1213 and the conductive post 1211 can be an integral or separate structure, as long as they are electrically connected.

[0046] Specifically, the support member 110 is plate-shaped. The support surface 111 of the support member 110 is the plate surface on one side of the support member 110 in the thickness direction. The support surface 111 of the support member 110 is substantially perpendicular to the first direction X. The conductive post 1211 of the conductive member 121 passes through the support member 110 along the first direction X. The two ends of the conductive post 1211 are located on both sides of the support member 110.

[0047] In some embodiments, as Figure 1 and Figure 2 As shown, the optical module testing fixture 100 also includes a first support plate 140 and two second support plates 150. The first support plate 140 is basically perpendicular to the third direction Z. The first support plate 140 is connected to the support member 110 on the side opposite to the third direction Z. The two second support plates 150 are connected to the support member 110 on both sides along the second direction Y, and the two second support plates 150 are respectively basically perpendicular to the second direction Y.

[0048] By providing second support plates 150 on both sides of the support member 110 along the second direction Y, and providing a first support plate 140 on the side of the support member 110 along the third direction Z in the opposite direction, the support member 110 can be stably supported, making the position of the support member 110 more stable.

[0049] The terminal 1213 can be extended from the support member 110 on the Z-direction side to facilitate electrical connection between the terminal 1213 and the power supply line.

[0050] In other embodiments, such as Figure 3 and Figure 4 As shown, a wiring hole 141 extending in a third direction Z can also be provided in the first support plate 140, and the terminal 1213 can extend from the conductive post 1211 toward the first support plate 140. Thus, the power cord can pass through the wiring hole 141 and be electrically connected to the terminal 1213 of the conductive member 121.

[0051] In some embodiments, the optical module testing fixture 100 may further include a base plate 160, which is located on the side of the support member 110 opposite to the first direction X, and the base plate 160 is connected to the first support plate 140 and two second support plates 150, thereby making the structure of the optical module testing fixture 100 more stable. A cavity is formed between the support member 110 and the base plate 160, and the terminal block 1213 is located within the cavity between the support member 110 and the base plate 160.

[0052] In some embodiments, the first support plate 140 and the second support plate 150 are made of insulating material to improve the safety performance of the optical module testing fixture 100. Alternatively, the base plate 160 may also be made of insulating material.

[0053] In some embodiments, as Figure 1 and Figure 2 As shown, the abutment 130 can be slidably connected to the support 110 along the first direction X, allowing the abutment 130 to slide relative to the support 110 between an abutment position and a disengaged position. Specifically, when the abutment 130 slides toward the support 110 to abut against the terminal sleeved on the conductive post 1211, the abutment 130 is in the abutment position. When the abutment 130 slides away from the support 110 to a position disengaged from the terminal, and the gap between the abutment 130 and the conductive post 1211 allows the terminal to be removed from the conductive post 1211, the abutment 130 is in the disengaged position.

[0054] The abutment 130 includes an abutment surface opposite to the support surface 111 of the support member 110. One of the support surface 111 and the abutment surface of the support member 110 is provided with a guide post 112 extending along the first direction X. The other of the support surface 111 and the abutment surface is provided with a guide hole 132 extending along the first direction X. The guide post 112 is slidably installed in the guide hole 132 along the first direction X so that the abutment 130 is stably slidably connected to the support member 110 along the first direction X.

[0055] It is understood that a guide post 112 extending in the first direction X can be protruded from the support surface 111 of the support member 110, and a guide hole 132 extending in the first direction X can be formed on the abutment surface of the abutment member 130 at a position corresponding to the guide post 112. Alternatively, a guide post 112 extending in the first direction X can be protruded from the abutment surface of the abutment member 130, and a guide hole 132 extending in the first direction X can be formed on the support surface 111 of the support member 110 at a position corresponding to the guide post 112.

[0056] In this design, at least two conductive elements 121 of the conductive structure 120 are sequentially distributed along a second direction Y, which is substantially perpendicular to the first direction X. Simultaneously, there are multiple guide posts 112 distributed at both ends of the support member 110 along the second direction Y. Correspondingly, there are multiple guide holes 132, the number of which is equal to the number of guide posts 112, and they correspond one-to-one. By sliding the multiple guide posts 112 one-to-one with the multiple guide holes 132, the sliding connection stability between the abutment member 130 and the support member 110 can be further improved.

[0057] In some embodiments, as Figure 1 and Figure 2 As shown, the optical module testing fixture 100 may also include a pressing mechanism 170. When the abutting member 130 is in the abutting position, the pressing mechanism 170 abuts against the abutting member 130 on one side along the first direction X, thereby increasing the abutting force applied by the abutting member 130 to the terminal block and making the connection between the terminal block and the conductive post 1211 more stable.

[0058] The pressing mechanism 170 can be multiple, and each pressing mechanism 170 is used to abut against the abutment member 130 on one side along the first direction X, so as to further increase the abutment force applied by the abutment member 130 to the terminal. Specifically, there are two pressing mechanisms 170, which are respectively connected to the side of the first support plate 140 away from the support member 110, and the two pressing mechanisms 170 are distributed sequentially along the second direction Y.

[0059] In some embodiments, the pressing mechanism 170 can be an elbow clamp. The pressing mechanism 170 includes a first handle 171, a first linkage structure 172, and a pressing member 173. The first handle 171 is connected to the pressing member 173 via the first linkage structure 172. The pressing member 173 includes a pressing portion 1731 for abutting against one side of the abutment member 130 along the first direction X. The first handle 171 is rotatable relative to the support member 110, thereby driving the pressing member 173 to move via the first linkage structure 172, causing the pressing portion 1731 of the pressing member 173 to displace in the first direction X, thus causing the pressing portion 1731 to abut against or separate from the abutment member 130 along the first direction X.

[0060] In other embodiments, such as Figure 3 and Figure 4 As shown, the optical module testing fixture 100 may further include a drive mechanism 180, which is connected to the abutment member 130 and is used to drive the abutment member 130 to move between an abutment position and a separation position. The operator can more conveniently drive the abutment member 130 between the abutment position and the separation position using the drive mechanism 180.

[0061] The drive mechanism 180 may include a second handle 181, a second linkage structure 182, and a connector 183. The second handle 181 is connected to the connector 183 through the second linkage structure 182, and the connector 183 is connected to the pressing member 173. The second handle 181 can rotate relative to the support member 110 to drive the connector 183 to move along the first direction X through the second linkage, so that the connector 183 drives the pressing member 173 to move along the first direction X.

[0062] In some embodiments, the outer periphery of the conductive post 1211 is provided with an abutment portion 1212, which is used to abut against the side of the wiring terminal opposite to the first direction X. By providing the abutment portion 1212 on the outer periphery of the conductive post 1211, when the abutment member 130 abuts against the side of the wiring terminal of the optical module along the first direction X, the wiring terminal can be stably contacted with the abutment portion 1212, which is beneficial to improving the conductivity between the wiring terminal and the conductive post 1211.

[0063] The contact portion 1212 can extend circumferentially along the conductive post 1211 in a ring structure to further increase the contact area between the contact portion 1212 and the terminal, thereby improving the conductivity between the conductive post 1211 and the terminal.

[0064] In the above embodiments, the descriptions of each embodiment have different focuses. For parts not described in detail in a certain embodiment, please refer to the relevant descriptions in other embodiments.

[0065] The above provides a detailed description of an optical module testing fixture provided in the embodiments of this application. Specific examples have been used to illustrate the principles and implementation methods of this application. The descriptions of the above embodiments are only for the purpose of helping to understand the technical solutions and core ideas of this application. Those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. These modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application.

Claims

1. A testing fixture for optical modules, characterized in that, include: A support member includes a support surface located on one side of the support member along a first direction; A conductive structure includes at least two conductive elements connected to the support member, the conductive elements being electrically connected to a power source, the conductive elements including conductive posts protruding from the support surface, the conductive posts extending along the first direction, the conductive posts being used to insert into and electrically connect to the wiring terminals of the optical module. An abutment is located on one side of the support member along the first direction. The abutment is movable relative to the support member between an abutment position and a separation position. When the abutment is in the abutment position, it abuts against the terminal along the first direction. When the abutment is in the separation position, it separates from the terminal. A gap exists between the abutment and the conductive post for the terminal to pass through.

2. The optical module testing fixture as described in claim 1, characterized in that, The abutting member has a clearance hole, and when the abutting member is in the abutting position, the conductive post is at least partially inserted into the clearance hole.

3. The optical module testing fixture as described in claim 1, characterized in that, The at least two conductive elements are distributed sequentially along the second direction. The conductive post passes through the support member. The conductive element also includes a terminal post. One end of the terminal post is connected to the end of the conductive post away from the abutment member. The terminal post extends along a third direction. The first direction, the second direction, and the third direction are substantially perpendicular to each other.

4. The optical module testing fixture as described in claim 3, characterized in that, The optical module testing fixture also includes a first support plate and two second support plates. The first support plate is substantially perpendicular to the third direction and is connected to the support member on the side opposite to the third direction. The two second support plates are connected to the support member on both sides along the second direction, and the two second support plates are substantially perpendicular to the second direction, respectively. Wherein, the terminal extends out from one side of the support member along the third direction; or, The first support plate has a through-hole extending in the third direction, and the terminal extends from the conductive post toward the first support plate.

5. The optical module testing fixture as described in claim 4, characterized in that, The first support plate and the second support plate are made of insulating material.

6. The optical module testing fixture as described in any one of claims 1 to 5, characterized in that, The abutment is slidably connected to the support along the first direction.

7. The optical module testing fixture as described in claim 6, characterized in that, The abutting member includes an abutting surface opposite to the supporting surface. One of the supporting surface and the abutting surface is provided with a guide post extending along the first direction. The other of the supporting surface and the abutting surface is provided with a guide hole extending along the first direction. The guide post is slidably installed in the guide hole along the first direction so that the abutting member is slidably connected to the supporting member along the first direction.

8. The optical module testing fixture as described in claim 7, characterized in that, The at least two conductive elements are distributed sequentially along a second direction, which is substantially perpendicular to the first direction; there are multiple guide posts, which are distributed at both ends of the support member along the second direction; there are multiple guide holes, which are equal in number to the number of guide posts and correspond one-to-one.

9. The optical module testing fixture as described in any one of claims 1 to 5, characterized in that, The optical module testing fixture also includes a pressing mechanism. When the abutting member is in the abutting position, the pressing mechanism abuts against the abutting member on one side along the first direction. or, The optical module testing fixture also includes a driving mechanism, which is connected to the abutment member and is used to drive the abutment member to move between the abutment position and the separation position.

10. The optical module testing fixture as described in any one of claims 1 to 5, characterized in that, The outer periphery of the conductive post is provided with an abutment portion, which is used to abut against the side of the terminal block opposite to the first direction.

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