Power supply circuit of multichannel avalanche diode, power supply device and optical module receiving end

By using the same chip to power and sample the current of multiple APDs, the complexity of power supply for multiple APDs is solved, and a simplified circuit structure and high-precision current detection are achieved.

CN223488086UActive Publication Date: 2025-10-28HANGZHOU XIN YUN TECH CO LTD
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Patent Information

Application Number
CN202422824408.2
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-11-19
Publication Date
2025-10-28
Estimated Expiration
2034-11-19

AI Technical Summary

Technical Problem

The power supply method of existing multi-channel avalanche diodes (APDs) is complex, making it difficult to achieve simple current determination. In addition, an additional sampling circuit is required to sample each channel, which increases the circuit complexity.

Method used

The same chip is used to power and sample the current of multiple channels of APD. The current is managed in a unified manner through the power supply unit, sampling unit, voltage conversion unit and output unit. The first and second sampling units are used to sample the current under different conditions, which simplifies the circuit structure.

Benefits of technology

It achieves simplified power supply and current sampling for multi-channel APDs, with a simple circuit structure, enabling high-precision detection under different light intensity conditions and reducing circuit complexity.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model provides a power supply circuit of a multichannel avalanche diode, a power supply device and an optical module receiving end. The power supply circuit comprises a chip, a power supply unit, a sampling unit, a voltage conversion unit and an output unit, wherein the power supply unit is used for supplying power to the chip; the voltage conversion unit is connected with the power supply unit and the chip and is used for performing voltage conversion on the input voltage of the power supply unit to obtain converted voltage; the output unit is connected with the chip and comprises multiple paths of voltage output ends; wherein each path of voltage output end supplies power to each channel of a multi-channel avalanche diode APD based on the conversion voltage; and the sampling unit is connected with the chip and is used for sampling current of each channel of the multi-channel APD, converting the sampling current into sampling voltage and outputting the sampling voltage through a sampling output pin of the chip. According to the application, the same chip can be used for power supply and current sampling of the multi-channel APD, and the circuit structure is simple.
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Description

Technical Field

[0001] This application relates to avalanche diode (APD) power supply technology, and more particularly to a power supply circuit, power supply device, and optical module receiver for a multi-channel avalanche diode. Background Technology

[0002] In related technologies, the APD requires a relatively high reverse bias voltage to operate. Its internal gain is positively correlated with the bias voltage and is determined by the ratio of the bias voltage to the breakdown voltage. With a fixed bias voltage, the higher the incident light intensity of the APD, the greater the current in the APD, and vice versa. The Clock Data Recovery (CDR) circuit requires a relatively stable input amplitude. Therefore, when the light intensity from the fiber optic signal increases, the APD current increases accordingly, and the TIA output voltage also increases. The AGC will limit the amplitude of this signal to a level suitable for the CDR circuit application. Conversely, when the light intensity from the fiber optic signal decreases, the APD current decreases accordingly, and the TIA output voltage also decreases. The AGC will amplify this signal to a level suitable for the CDR circuit application. Therefore, the power supply to the APD and the determination of the APD current are crucial.

[0003] However, the current power supply method for multi-channel APDs is usually to use a chip to power each channel, which makes the circuit structure very complex and makes it difficult to easily determine the current of each channel of the multi-channel APD. It is necessary to use additional sampling circuits to sample each channel, which further increases the circuit complexity. Summary of the Invention

[0004] This application provides a power supply circuit, power supply device, and optical module receiver for a multi-channel avalanche diode, which can power and sample the current of multiple channels of APD using the same chip, and the circuit structure is simple.

[0005] The technical solution of this application embodiment is implemented as follows:

[0006] This application provides a power supply circuit for a multi-channel avalanche diode, including: a chip, a power supply unit, a sampling unit, a voltage conversion unit, and an output unit; wherein,

[0007] The power supply unit is used to supply power to the chip;

[0008] The voltage conversion unit is connected to the power supply unit and the chip, and is used to convert the input voltage of the power supply unit to obtain the converted voltage.

[0009] The output unit, connected to the chip, includes multiple voltage output terminals; wherein each voltage output terminal supplies power to each channel of the multi-channel avalanche diode APD based on the conversion voltage.

[0010] The sampling unit is connected to the chip and is used to sample the current of each channel of the multi-channel APD. The sampled current is converted into a sampled voltage and then output through the sampling output pin of the chip.

[0011] In the above scheme, the sampling unit includes a first sampling unit and a second sampling unit. Both the first sampling unit and the second sampling unit include multiple sampling channels for sampling the current of each channel of the multi-channel APD.

[0012] The current sampling ratio of the first sampling unit for the multi-channel APD is different from that of the second sampling unit for the multi-channel APD.

[0013] In the above scheme, the chip has a register inside;

[0014] When the register is written with a first value, the current of the multi-channel APD is sampled by the first sampling unit;

[0015] When the register is written with a second value, the current of the multi-channel APD is sampled by the second sampling unit.

[0016] In the above scheme, the chip includes a sampling selection pin;

[0017] When the sampling selection pin is at a low level, the current of the multi-channel APD is sampled through the first sampling unit;

[0018] When the sampling selection pin is at a high level, the current of the multi-channel APD is sampled by the second sampling unit.

[0019] In the above scheme, the chip also includes a sampling trigger pin;

[0020] When a rising edge signal is received at the sampling trigger pin, the sampling unit is triggered to sample.

[0021] When a falling edge signal is received at the sampling trigger pin, the sample-and-hold function of the chip is triggered.

[0022] In the above scheme, the sampling output pin is used to connect to the detection device.

[0023] In the above scheme, the chip includes multiple APD pins, the number of APD pins being the same as the number of channels of the multi-channel APD; the output unit includes multiple output resistors, the first end of each output resistor being connected to an APD pin, and the second end being connected to a channel of the multi-channel APD.

[0024] In the above scheme, the chip includes multiple first sampling pins and multiple second sampling pins; the first sampling unit includes multiple first sampling resistors, and the second sampling unit includes multiple second sampling resistors; the number of first sampling pins, the number of second sampling pins, the number of first sampling resistors, and the number of second sampling resistors are all the same as the number of channels of the multi-channel APD; the first end of the first sampling resistor is connected to the first sampling pin, and the second end is grounded; the first end of the second sampling resistor is connected to the second sampling pin, and the second end is grounded.

[0025] This application provides a power supply device for a multi-channel avalanche diode, wherein the device includes a power supply circuit for the multi-channel avalanche diode as provided in this application embodiment.

[0026] This application provides an optical module receiver, which includes a multi-channel APD, an amplifier, a receiver-side equalizer, a clock data recovery circuit, a demultiplexer, and a decoder connected in sequence.

[0027] The multi-channel APD is powered by the power supply circuit of the multi-channel avalanche diode provided in the embodiments of this application.

[0028] The power supply circuit for the multi-channel avalanche diode in this application includes: a chip, a power supply unit, a sampling unit, a voltage conversion unit, and an output unit. The voltage conversion unit is connected to the power supply unit and the chip, and is used to convert the input voltage of the power supply unit to obtain a converted voltage. The output unit includes multiple voltage output terminals, each of which supplies power to each channel of the multi-channel avalanche diode (APD) based on the converted voltage, enabling one chip to supply power to all channels of the multi-channel APD. Furthermore, the sampling unit samples the current of each channel of the multi-channel APD, converts the sampled current into a sampled voltage, and outputs it through the sampling output pin of the chip. Using the power supply chip for sampling further simplifies the circuit. Employing the same chip for power supply and current sampling of the multi-channel APD results in a simple circuit structure. Attached Figure Description

[0029] Figure 1 This is a schematic diagram of an optional power supply circuit for an avalanche diode provided in an embodiment of this application;

[0030] Figure 2 This is a schematic diagram of an optional power supply circuit for an avalanche diode provided in an embodiment of this application;

[0031] Figure 3 This is an optional structural diagram of the optical module receiver provided in an embodiment of this application. Detailed Implementation

[0032] To make the objectives, technical solutions, and advantages of this application clearer, the application will be further described in detail below with reference to the accompanying drawings. The described embodiments should not be regarded as limitations on this application. All other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0033] In the following description, reference is made to “some embodiments”, which describes a subset of all possible embodiments, but it will be understood that “some embodiments” may be the same subset or different subsets of all possible embodiments and may be combined with each other without conflict.

[0034] In the following description, the terms "first, second, third" are used merely to distinguish similar objects and do not represent a specific ordering of objects. It is understood that "first, second, third" may be interchanged in a specific order or sequence where permitted, so that the embodiments of this application described herein can be implemented in an order other than that illustrated or described herein.

[0035] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein is for the purpose of describing embodiments of this application only and is not intended to limit this application.

[0036] In related technologies, the APD requires a relatively high reverse bias voltage to operate. Its internal gain is positively correlated with the bias voltage and is determined by the ratio of the bias voltage to the breakdown voltage. With a fixed bias voltage, the higher the incident light intensity of the APD, the greater the current in the APD, and vice versa. The Clock Data Recovery (CDR) circuit requires a relatively stable input amplitude. Therefore, when the light intensity from the fiber optic signal increases, the APD current increases accordingly, and the TIA output voltage also increases. The AGC will limit the amplitude of this signal to a level suitable for CDR circuit applications. Conversely, when the light intensity from the fiber optic signal decreases, the APD current decreases accordingly, and the TIA output voltage also decreases. The AGC will amplify this signal to a level suitable for CDR circuit applications. Therefore, determining the APD current in advance is crucial.

[0037] Based on this, embodiments of this application provide a power supply circuit, power supply device, and optical module receiver for a multi-channel avalanche diode, which can power and sample the current of a multi-channel APD using the same chip, and the circuit structure is simple.

[0038] The power supply circuit for implementing the avalanche diode described above, as provided in the embodiments of this application, will now be described.

[0039] See Figure 1 , Figure 1This is an optional structural diagram of the power supply circuit for an avalanche diode provided in an embodiment of this application. The power supply circuit 100 for a multi-channel avalanche diode includes: a chip 101, a power supply unit 102, a sampling unit 103, a voltage conversion unit 104, and an output unit 105; wherein, the power supply unit 102 is used to supply power to the chip 101; the voltage conversion unit 104 is connected to the power supply unit 102 and the chip 101, and is used to convert the input voltage of the power supply unit 102 to obtain a converted voltage; the output unit 105 is connected to the chip 101 and includes multiple voltage output terminals; wherein, each voltage output terminal supplies power to each channel of the multi-channel avalanche diode APD110 based on the converted voltage; the sampling unit 103 is connected to the chip 101 and is used to sample the current of each channel of the multi-channel APD110, convert the sampled current into a sampled voltage, and output it through the sampling output pin of the chip 101.

[0040] In practical implementation, the power supply unit 102 is connected to the power supply pin of the chip 101 to supply power to the chip 101. Here, the input voltage provided by the power supply unit 102 can be, for example, 2.8V to 5.5V. The chip 101 transmits the input voltage to the voltage conversion unit 104. The voltage conversion unit 104 converts the input voltage to obtain a converted voltage suitable for the multi-channel APD. Here, the converted voltage can be, for example, 30V. The chip 101 transmits the converted voltage to the output unit 105. The output unit 105 then outputs the converted voltage to the multi-channel APD 110. In this embodiment, the output unit 105 includes multiple voltage output terminals, the number of which is the same as the number of channels of the multi-channel APD 110. Each voltage output terminal is used to supply power to one channel of the multi-channel APD 110. In some embodiments, the chip 101 can adjust the supply voltage of each channel of the multi-channel APD 110. Specifically, the power supply circuit can communicate with an external MCU via I2C, and the external MCU can adjust the power supply voltage of each channel of the multi-channel APD110 separately.

[0041] In this embodiment, the power supply circuit 100 further includes a sampling unit 103. The sampling unit 103 can sample the current of each channel of the multi-channel APD to obtain a sampled current, which is then converted into a sampled voltage and output through the sampling output pin of the chip 101. In some embodiments, the sampling output pin is used to connect to a detection device. Here, the detection device is used to detect the value of the sampled voltage at the sampling output pin. The detection device can be, for example, a voltmeter. In practical implementation, the magnitude of the sampled current can be calculated after detecting the sampled voltage. By sampling the current of each channel of the multi-channel APD 110, signal limiting or amplification processing can be conveniently performed by the subsequent circuitry of the multi-channel APD.

[0042] In this embodiment, the power supply circuit of the multi-channel avalanche diode includes a chip, a power supply unit, a sampling unit, a voltage conversion unit, and an output unit. The voltage conversion unit, connected to the power supply unit and the chip, converts the input voltage of the power supply unit to obtain a converted voltage. The output unit includes multiple voltage output terminals, each supplying power to each channel of the multi-channel avalanche diode (APD) based on the converted voltage. This enables a single chip to power all channels of the multi-channel APD. Furthermore, the sampling unit samples the current of each channel of the multi-channel APD, converts the sampled current into a sampled voltage, and outputs it through the sampling output pin of the chip. Using the power supply chip for sampling further simplifies the circuit. Employing the same chip for power supply and current sampling of the multi-channel APD results in a simple circuit structure.

[0043] In some embodiments, the sampling unit 103 includes a first sampling unit 1031 and a second sampling unit 1032. Both the first sampling unit 1031 and the second sampling unit 1032 include multiple sampling channels for sampling the current of each channel of the multi-channel APD 110. The current sampling ratio of the first sampling unit 1031 to the multi-channel APD 110 is different from that of the second sampling unit 1032.

[0044] In practical implementation, when the light intensity of a multi-channel APD is small, the corresponding APD current is also small. If the sampling ratio is small, this will result in a very small voltage component on the sampling output pin. Combined with resistance error and temperature drift, this will lead to low detection accuracy. Furthermore, in the case of a large light intensity from the APD, if the sampling ratio is large, the voltage across the resistor on the sampling output pin may exceed the pin's withstand voltage, causing the large light intensity to fail to be detected.

[0045] Based on this, in this embodiment, the sampling unit 103 includes a first sampling unit 1031 and a second sampling unit 1032. Both the first sampling unit 1031 and the second sampling unit 1032 are used to sample the current of each channel of the multi-channel APD 110. Here, the sampling ratio of the current of the multi-channel APD 110 by the first sampling unit 1031 is different from that by the second sampling unit 1032. In actual implementation, the sampling ratio of the current of the multi-channel APD 110 by the first sampling unit 1031 can be a first ratio, and the sampling ratio of the current of the multi-channel APD 110 by the second sampling unit 1032 can be a second ratio. Here, the sum of the first ratio and the second ratio can be 100%. That is to say, the current of the multi-channel APD 110 at the first ratio flows into the first sampling unit 1031, and the current of the multi-channel APD 110 at the second ratio flows into the second sampling unit 1032. In one embodiment, the current sampling ratio of the first sampling unit 1031 to the multi-channel APD 110 can be 1:5, and the current sampling ratio of the second sampling unit 1032 to the multi-channel APD 110 can be 4:5. That is, 20% of the current of the multi-channel APD 110 will flow into the first sampling unit 1031, and 80% of the current of the multi-channel APD 110 will flow into the second sampling unit 1032.

[0046] In practical implementation, when the multi-channel APD light ratio is small and the corresponding APD current is also small, the second sampling unit 1032 can be selected for sampling. When the APD light ratio is large, the first sampling unit 1031 can be rotated for sampling. By using two sampling units, high-precision detection across the entire range of APD light ratios, from small to large, can be achieved. Here, the selection of the sampling unit can be made by the user.

[0047] In some embodiments, the chip 101 includes a register; when a first value is written to the register, the current of the multi-channel APD 110 is sampled by the first sampling unit 1031; when a second value is written to the register, the current of the multi-channel APD 110 is sampled by the second sampling unit 1032.

[0048] In practical implementation, the user can write values ​​to the registers of chip 101. When a first value is written, the sampling voltage of the first sampling unit 1031 is selected for output to the sampling output pin of chip 101; when a second value is written, the sampling voltage of the second sampling unit 1032 is selected for output to the sampling output pin of chip 101. For example, the first value can be 0x60 and the second value can be 0x70. Selecting the corresponding sampling voltage for output by writing values ​​to the register allows the user to conveniently select the sampling voltage.

[0049] In some embodiments, the chip 101 includes a sampling selection pin; when the level of the sampling selection pin is low, the current of the multi-channel APD 110 is sampled by the first sampling unit 1031; when the level of the sampling selection pin is high, the current of the multi-channel APD 110 is sampled by the second sampling unit 1032.

[0050] In practical implementation, the first sampling unit 1031 and the second sampling unit 1032 can be selected by controlling the level of the sampling selection pin. Specifically, the level of the sampling selection pin can be controlled by connecting an MCU. In this embodiment, there can be multiple sampling selection pins, the number of which is the same as the number of channels of the multi-channel APD. If the level of all pins among the multiple sampling selection pins is low, the sampling voltage of the first sampling unit 1031 is selected and output to the sampling output pin; if the level of all pins among the multiple sampling selection pins is high, the sampling voltage of the second sampling unit 1032 is selected and output to the sampling output pin. In an exemplary embodiment, see [link to exemplary embodiment]. Figure 2 , Figure 2 This is an optional structural diagram of the power supply circuit for the avalanche diode provided in an embodiment of this application. In this diagram, the multi-channel APD110 is a three-channel APD. The sampling selection pins of chip 101 include pins SEL0, SEL1, and SEL2. In one embodiment, the sampling selection pins can be activated when a third value is written to the register, thereby selecting the sampling voltage of the sampling unit according to the level of the sampling selection pins. Here, the third value can be, for example, 0x20.

[0051] In some embodiments, the chip 101 further includes a sampling trigger pin; when the sampling trigger pin receives a rising edge signal, the sampling unit 103 is triggered to sample; when the sampling trigger pin receives a falling edge signal, the sample-and-hold function of the chip 101 is triggered.

[0052] In practice, there can be multiple sampling trigger pins, the same number as the number of channels in a multi-channel APD. Each sampling trigger pin corresponds one-to-one with a channel of the multi-channel APD, and each pin is used to trigger sampling for the corresponding channel. See also... Figure 2 Each channel of the multi-channel APD110 is connected to pins APD0, APD1, and APD2 of chip 101. The sampling trigger pins SH0, SH1, and SH2 correspond to pins APD0, APD1, and APD2, respectively. Furthermore, the number of sampling output pins is the same as the number of channels in the multi-channel APD, with multiple sampling output pins corresponding one-to-one with each channel of the multi-channel APD. Figure 2In the sample output pins MOUT0, MOUT1 and MOUT2 correspond to pins APD0, APD1 and APD2 respectively.

[0053] When one of the sampling trigger pins SH0, SH1, and SH2 receives a rising edge signal (i.e., its level transitions to high), the sampling function of chip 101 is triggered. The sampling unit 103 then samples the current of the multi-channel APD corresponding to the high-level sampling trigger pin. Conversely, when the sampling trigger pin receives a falling edge signal (i.e., its level transitions to low), the sample-and-hold function of chip 101 is triggered. Chip 101 can hold the sampled current in an internal capacitor. The sampled current can also be read from the register via I2C or output to an external MCU, etc.

[0054] In some embodiments, the chip 101 includes a plurality of APD pins, the number of which is the same as the number of channels of the multi-channel APD 110; the output unit includes a plurality of output resistors, the first end of each output resistor being connected to an APD pin and the second end being connected to a channel of the multi-channel APD.

[0055] For example, see Figure 2 The APD pins include pins APD0, APD1, and APD2. The output unit 105 includes resistors R9, R10, and R11. Specifically, the first end of resistor R9 is connected to pin APD0, and the second end is connected to channel D2 of the multi-channel APD110. The first end of resistor R10 is connected to pin APD1, and the second end is connected to channel D3 of the multi-channel APD110. The first end of resistor R11 is connected to pin APD2, and the second end is connected to channel D4 of the multi-channel APD110.

[0056] In some embodiments, the chip 101 includes a plurality of first sampling pins and a plurality of second sampling pins; the first sampling unit 1031 includes a plurality of first sampling resistors, and the second sampling unit 1032 includes a plurality of second sampling resistors; the number of the first sampling pins, the number of the second sampling pins, the number of the first sampling resistors, and the number of the second sampling resistors are all the same as the number of channels of the multi-channel APD 110; the first end of the first sampling resistor is connected to the first sampling pin, and the second end is grounded; the first end of the second sampling resistor is connected to the second sampling pin, and the second end is grounded.

[0057] For example, see Figure 2The first sampling unit 1031 includes three first sampling resistors R12, R13, and R14. The first terminal of first sampling resistor R12 is connected to the first sampling pin MON1_0, and the second terminal is grounded. The first terminal of first sampling resistor R13 is connected to the first sampling pin MON1_1, and the second terminal is grounded. The first terminal of first sampling resistor R14 is connected to the first sampling pin MON1_2, and the second terminal is grounded. The second sampling unit 1032 includes three second sampling resistors R5, R6, and R7. The first terminal of second sampling resistor R5 is connected to the second sampling pin MON2_0, and the second terminal is grounded. The first terminal of second sampling resistor R6 is connected to the second sampling pin MON2_1, and the second terminal is grounded. The first terminal of second sampling resistor R7 is connected to the second sampling pin MON2_2, and the second terminal is grounded.

[0058] This application provides a power supply device for a multi-channel avalanche diode, wherein the device includes a power supply circuit for the multi-channel avalanche diode provided in this application.

[0059] This application also provides an optical module receiver, see [link]. Figure 3 , Figure 3 This is an optional structural diagram of the optical module receiver provided in this application embodiment. The optical module receiver 300 includes a multi-channel APD, an amplifier 301, a receiver-side equalizer 302, a clock data recovery circuit 303, a demultiplexer 304, and a decoder 305 connected in sequence; wherein, the multi-channel APD 110 is powered by the power supply circuit of the multi-channel avalanche diode provided in this application embodiment.

[0060] Here, amplifier 301 may include a first amplifier 3011 and a second amplifier 3012. The first amplifier 3011 may be a transgroup amplifier (TIA), and the second amplifier 3012 may be a limiting amplifier (LA) or an automatic gain control amplifier (AGC).

[0061] In summary, the embodiments of this application enable the use of a single chip to power and sample the current of multiple APDs, resulting in a simple circuit structure.

[0062] The above description is merely an embodiment of this application and is not intended to limit the scope of protection of this application. Any modifications, equivalent substitutions, and improvements made within the spirit and scope of this application are included within the scope of protection of this application.

Claims

1. A power supply circuit for a multi-channel avalanche diode, characterized in that, include: Chip, power supply unit, sampling unit, voltage conversion unit, and output unit; among which, The power supply unit is used to supply power to the chip; The voltage conversion unit is connected to the power supply unit and the chip, and is used to convert the input voltage of the power supply unit to obtain the converted voltage. The output unit, connected to the chip, includes multiple voltage output terminals; wherein each voltage output terminal supplies power to each channel of the multi-channel avalanche diode APD based on the conversion voltage. The sampling unit is connected to the chip and is used to sample the current of each channel of the multi-channel APD. The sampled current is converted into a sampled voltage and then output through the sampling output pin of the chip.

2. The power supply circuit according to claim 1, characterized in that, The sampling unit includes a first sampling unit and a second sampling unit. Both the first sampling unit and the second sampling unit include multiple sampling channels for sampling the current of each channel of the multi-channel APD. The current sampling ratio of the first sampling unit for the multi-channel APD is different from that of the second sampling unit for the multi-channel APD.

3. The power supply circuit according to claim 2, characterized in that, The chip has a built-in register; When the register is written with a first value, the current of the multi-channel APD is sampled by the first sampling unit; When the register is written with a second value, the current of the multi-channel APD is sampled by the second sampling unit.

4. The power supply circuit according to claim 2, characterized in that, The chip includes a sampling selection pin; When the sampling selection pin is at a low level, the current of the multi-channel APD is sampled through the first sampling unit; When the sampling selection pin is at a high level, the current of the multi-channel APD is sampled by the second sampling unit.

5. The power supply circuit according to claim 1, characterized in that, The chip also includes a sampling trigger pin; When a rising edge signal is received at the sampling trigger pin, the sampling unit is triggered to sample. When a falling edge signal is received at the sampling trigger pin, the sample-and-hold function of the chip is triggered.

6. The power supply circuit according to claim 1, characterized in that, The sampling output pin is used to connect to the detection device.

7. The power supply circuit according to claim 1, characterized in that, The chip includes multiple APD pins, the number of which is the same as the number of channels of the multi-channel APD; the output unit includes multiple output resistors, the first end of each output resistor is connected to an APD pin, and the second end is connected to a channel of the multi-channel APD.

8. The power supply circuit according to claim 2, characterized in that, The chip includes multiple first sampling pins and multiple second sampling pins; the first sampling unit includes multiple first sampling resistors, and the second sampling unit includes multiple second sampling resistors; the number of first sampling pins, the number of second sampling pins, the number of first sampling resistors, and the number of second sampling resistors are all the same as the number of channels of the multi-channel APD; the first end of the first sampling resistor is connected to the first sampling pin, and the second end is grounded; the first end of the second sampling resistor is connected to the second sampling pin, and the second end is grounded.

9. A power supply device for a multi-channel avalanche diode, characterized in that, The device is provided with a power supply circuit as described in any one of claims 1-8.

10. An optical module receiver, characterized in that, It includes a multi-channel APD, an amplifier, a receiver-side equalizer, a clock data recovery circuit, a demultiplexer, and a decoder connected in sequence; The multi-channel APD is powered by the power supply circuit described in any one of claims 1-8.