Measuring device

Abstract

The utility model relates to a measuring device which is characterized in that when the thickness of a flattened welding strip on a battery string is measured, a first abutting plate can abut against one side face of the flattened welding strip between two adjacent battery pieces, a second abutting plate is opposite to the other side face of the flattened welding strip between the two adjacent battery pieces, and an adjusting knob is rotated to adjust the thickness of the flattened welding strip on the battery string. And after the welding strip is clamped by the first measuring column and the second measuring column, the distance between the first measuring column and the second measuring column is the thickness of the flattened welding strip, so that the thickness of the flattened welding strip is directly measured through the measuring mechanism. Compared with a measurement mode in the prior art, the thickness of the flattened welding strip is directly measured, the measurement accuracy is high, meanwhile, the thickness of the first abutting plate and the thickness of the second abutting plate are small, the first abutting plate and the second abutting plate cannot make contact with the battery piece in the measurement process, and damage to the battery piece can be avoided.

Description

Technical Field

[0001] This application relates to the field of photovoltaic technology, and in particular to a measuring device. Background Technology

[0002] In the manufacturing process of photovoltaic modules, the flattening of the solder ribbons of the cell string is a key process step, and its role is mainly reflected in the following aspects: (1) Improve the stability of the cell string. Through the flattening process, good contact between the cells can be ensured, reducing contact resistance and thus improving the overall stability of the cell string; (2) Reduce the risk of microcracks / fractures of the cells. For the current small-pitch / micro-pitch cell modules in the industry, under the same cell spacing and lamination conditions, the larger the thickness of the flattened solder ribbon, the greater the proportion of microcracks and fractures of the cells under stress. Controlling the thickness of the solder ribbon after flattening within the preset range can greatly reduce the stress damage to the edge of the cells by the solder ribbon during the lamination process; (3) Optimize the current collection efficiency. The flattening process helps to distribute the current evenly between the cells, ensuring that each cell can effectively collect current and improve the output power of the photovoltaic module; (4) Reduce the hot spot effect. The hot spot effect refers to the effect of certain cells in the photovoltaic module. (5) Simplify module installation. Flattened battery strings are easier to connect and install with other parts of the module, simplifying the module assembly process and improving production efficiency. (6) Enhance mechanical strength. Flattened battery strings can enhance mechanical strength, making them less prone to damage during installation and use, and extending the service life of photovoltaic modules. (7) Control of module flattening. The industry currently has four aspects of flattening control. Among them, the most important indicator is the control of flattening thickness. Factors affecting flattening thickness include flattening column specifications (material), flattening air pressure, and soldering conditions. The thickness of the solder strip after flattening is generally required to be 0.08mm-0.13mm. That is, when the thickness of each solder strip after flattening on the battery string is measured to be 0.08mm-0.13mm, it is considered qualified.

[0003] In related technologies, the spacing between adjacent solar cells is small, typically 0.5mm to 1mm. This makes it impossible to use a micrometer to measure the thickness of the flattened solder strip between adjacent solar cells. Measurements must simultaneously measure the thickness of both the solar cell and the solder strip on it to calculate the flattened solder strip thickness. However, this process involves contact with the solar cell, which can easily damage it. Furthermore, the micrometer's design makes it difficult to measure the thickness of all solder strips on the solar cell, especially those near the center. Additionally, some methods use a micrometer to directly measure the solder strip thickness before the solar cell and solder strip are welded together, using this to estimate the flattened thickness. However, after high-temperature welding in a light box, the actual flattened solder strip thickness differs significantly from the pre-welding measurement, leading to numerous subsequent problems. Utility Model Content

[0004] Therefore, it is necessary to overcome the shortcomings of the existing technology and provide a measuring device that can measure the thickness of the solder strip on the battery cell after it has been flattened, with high measurement accuracy, while avoiding damage to the battery cell.

[0005] A measuring device, the measuring device comprising:

[0006] Fixture;

[0007] A first measuring column, the first measuring column being mounted on the fixed frame; and

[0008] A measuring mechanism is mounted on the fixed frame. The measuring mechanism is provided with an adjustment knob and a second measuring column. The second measuring column is arranged at a distance from the first measuring column. When the adjustment knob is rotated, it can drive the second measuring column to move towards or away from the first measuring column.

[0009] Wherein, the first measuring column is provided with a first abutment plate at one end near the second measuring column, and the thickness D1 of the first abutment plate is 0.15mm≤D1≤0.45mm; the second measuring column is provided with a second abutment plate at one end near the first measuring column, and the thickness D2 of the second abutment plate is 0.15mm≤D2≤0.45mm.

[0010] In one embodiment, the length L1 of the first abutment plate is 3mm ≤ L1 ≤ 7mm; the length L2 of the second abutment plate is 3mm ≤ L2 ≤ 7mm.

[0011] In one embodiment, the width W1 of the first abutment plate is 1.5mm ≤ W1 ≤ 5mm; the width W2 of the second abutment plate is 1.5mm ≤ W2 ≤ 5mm.

[0012] In one embodiment, the first measuring column and the second measuring column are each made of cemented carbide material independently.

[0013] In one embodiment, the first measuring column further includes a first root portion connected to the first abutment plate, wherein the thickness D3 of the first root portion is greater than the thickness D1 of the first abutment plate; the second measuring column further includes a second root portion connected to the second abutment plate, wherein the thickness D4 of the second root portion is greater than the thickness D2 of the second abutment plate.

[0014] In one embodiment, the measuring device further includes a base connected between the first measuring column and the fixed frame, the first root being connected to the base and coaxially arranged with the base, and the axial cross-sectional profile of the base being larger than the axial cross-sectional profile of the first root; the measuring mechanism further includes a movable rod disposed between the second measuring column and the adjusting knob, the second root being connected to the movable rod and coaxially arranged with the movable rod, and the axial cross-sectional profile of the movable rod being larger than the axial cross-sectional profile of the second root.

[0015] In one embodiment, the fixing frame is provided with a first mounting base and a second mounting base arranged at a relative interval, the base is mounted on the first mounting base, and the measuring mechanism is mounted on the second mounting base.

[0016] In one embodiment, the first measuring column and the second measuring column are coaxially arranged; and / or, the shape and size of the first measuring column are the same as those of the second measuring column.

[0017] In one embodiment, the fixing bracket is provided with a clearance recess for avoiding the battery cell, the depth K of the clearance recess being 200mm≤K≤270mm; the first measuring column is arranged on one side of the opening of the clearance recess, and the measuring mechanism is arranged on the other side of the opening of the clearance recess.

[0018] In one embodiment, the measuring mechanism includes a micrometer, ten-thousand-digit meter, or a micrometer screw gauge.

[0019] When the aforementioned measuring device measures the thickness d of the flattened solder strip on the battery string, a first abutment plate is provided at the end of the first measuring post near the second measuring post, with a thickness D1 of 0.15mm ≤ D1 ≤ 0.45mm. A second abutment plate is provided at the end of the second measuring post near the first measuring post, with a thickness D2 of 0.15mm ≤ D2 ≤ 0.45mm. That is, the thickness D1 of the first abutment plate is less than the distance S1 between two adjacent battery cells in the battery string, and the thickness D2 of the second abutment plate is less than the distance S1 between two adjacent battery cells in the battery string. The thickness of the flattened solder strip is smaller than the spacing S1 between two adjacent cells in the battery string. This allows the first abutment plate to contact one side of the flattened solder strip between two adjacent cells, and the second abutment plate to contact the other side of the flattened solder strip between two adjacent cells. Rotating the adjustment knob brings the second abutment plate into contact with the other side of the solder strip. After the solder strip is clamped by the first and second measuring posts, the distance between the first and second measuring posts is the thickness of the flattened solder strip. Thus, the thickness of the flattened solder strip can be directly measured by the measuring mechanism. Compared to measurement methods in related technologies, this embodiment directly measures the thickness of the flattened solder strip, resulting in higher accuracy. Furthermore, the thickness of the first and second abutment plates is relatively small, and they do not contact the cells during measurement, thus avoiding damage to the cells. Attached Figure Description

[0020] Figure 1 This is a one-view structural diagram of a battery string in a related technology.

[0021] Figure 2 for Figure 1 Another view of the battery string structure shown.

[0022] Figure 3 This is a structural view of a measuring device according to an embodiment of this application.

[0023] Figure 4 for Figure 3 The diagram shows an enlarged view of the measuring device at point A.

[0024] Figure 5 for Figure 3 The diagram shows the structure of the measuring device used to measure the flattened weld strip.

[0025] Figure 6 for Figure 5 The diagram shows an enlarged view of the structure at point B.

[0026] Figure 7 for Figure 3 Another view of the structural diagram of the measuring device shown.

[0027] 10. Battery string; 11. Battery cell; 12. Welding strip; 20. Fixing bracket; 21. First mounting base; 22. Second mounting base; 23. Clearance recess; 30. First measuring column; 31. First abutment plate; 32. First root; 40. Measuring mechanism; 41. Adjustment knob; 42. Second measuring column; 421. Second abutment plate; 422. Second root; 43. Movable rod; 50. Base. Detailed Implementation

[0028] To make the above-mentioned objectives, features, and advantages of this application more apparent and understandable, the specific embodiments of this application are described in detail below with reference to the accompanying drawings. Many specific details are set forth in the following description to provide a thorough understanding of this application. However, this application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar modifications without departing from the spirit of this application. Therefore, this application is not limited to the specific embodiments disclosed below.

[0029] As described in the background technology, please refer to Figure 1 and Figure 2 In the prior art, the spacing S1 between adjacent battery cells 11 in the battery string 10 is small, typically 0.5mm to 1mm. This makes it impossible to use a micrometer to measure the thickness of the flattened solder strip 12 between adjacent battery cells 11. The inventors have discovered that this problem arises because, in order to ensure sufficient strength, the diameter of the two measuring posts of the micrometer used to clamp the object to be measured is usually set to be greater than or equal to 2mm. This means that the measuring posts cannot extend into the area between two adjacent battery cells 11 to clamp the opposite sides of the solder strip 12, and thus it is impossible to measure the thickness of the flattened solder strip 12.

[0030] For the reasons mentioned above, this application provides a measuring device that can measure the thickness of the solder strip 12 on the battery cell 11 after it has been flattened, with high measurement accuracy, while avoiding damage to the battery cell 11.

[0031] See Figures 3 to 5 , Figure 3 A structural view of a measuring device according to an embodiment of this application is shown. Figure 4 It shows Figure 3 Enlarged structural diagram at point A. Figure 5 It shows Figure 3The diagram shows the structure of the measuring device used to measure the flattened solder strip 12. One embodiment of this application provides a measuring device comprising: a fixed frame 20, a first measuring column 30, and a measuring mechanism 40. The first measuring column 30 is mounted on the fixed frame 20. The measuring mechanism 40 is mounted on the fixed frame 20 and includes an adjustment knob 41 and a second measuring column 42. The second measuring column 42 is spaced apart from the first measuring column 30. Rotating the adjustment knob 41 drives the second measuring column 42 to move closer to or further away from the first measuring column 30.

[0032] Please refer to Figure 4 and Figure 6 The first measuring post 30 is provided with a first abutting plate 31 at one end near the second measuring post 42, and the thickness D1 of the first abutting plate 31 is 0.15mm≤D1≤0.45mm; the second measuring post 42 is provided with a second abutting plate 421 at one end near the first measuring post 30, and the thickness D2 of the second abutting plate 421 is 0.15mm≤D2≤0.45mm.

[0033] When the aforementioned measuring device measures the thickness d of the flattened solder strip 12 on the battery string 10, since the first measuring post 30 is provided with a first abutment plate 31 at one end near the second measuring post 42, the thickness D1 of the first abutment plate 31 is 0.15mm≤D1≤0.45mm, and the second measuring post 42 is provided with a second abutment plate 421 at one end near the first measuring post 30, the thickness D2 of the second abutment plate 421 is 0.15mm≤D2≤0.45mm, that is, the thickness D1 of the first abutment plate 31 is less than the distance S1 between two adjacent battery pieces 11 in the battery string 10, and the thickness D2 of the second abutment plate 421 is less than the distance S1 between two adjacent battery pieces 11 in the battery string 10. In this way, the first abutment plate 31 can abut against one side of the flattened solder strip 12 between two adjacent battery cells 11, and the second abutment plate 421 is positioned opposite the other side of the flattened solder strip 12 between two adjacent battery cells 11. By rotating the adjustment knob 41, the second abutment plate 421 abuts against the other side of the solder strip 12. After the solder strip 12 is clamped by the first measuring post 30 and the second measuring post 42, the distance between the first measuring post 30 and the second measuring post 42 is the thickness of the flattened solder strip 12. Thus, the thickness d of the flattened solder strip 12 can be directly measured by the measuring mechanism 40. Compared with the measurement methods in related technologies, the direct measurement of the thickness d of the flattened solder strip 12 in this embodiment has a higher measurement accuracy. At the same time, the thickness of the first abutment plate 31 and the second abutment plate 421 is small, and they will not come into contact with the battery cells 11 during the measurement process, thus avoiding damage to the battery cells 11.

[0034] In addition, conventional measurements require stopping the machine to pull out the welding strip 12 for measurement. The measuring device in this embodiment can directly measure the flattened welding strip 12 in the welding machine's discharge area, which makes the measurement efficiency higher.

[0035] In addition, once the thickness d of the flattened solder strip 12 is measured, the measured thickness value can be used to determine whether the flattened solder strip 12 is an abnormal solder strip 12, thus facilitating troubleshooting and processing.

[0036] The fixed frame 20 serves as the mounting base for the first measuring column 30 and the measuring mechanism 40, making it easy for personnel to hold, carry, and operate.

[0037] In some embodiments, the thickness D1 of the first abutment plate 31 and the thickness D2 of the second abutment plate 421 can be the same or different, and can be flexibly adjusted and set according to actual needs. Each can be, but is not limited to, 0.15mm, 0.2mm, 0.22mm, 0.25mm, 0.3mm, 0.35mm, 0.4mm, or 0.45mm, etc. Thus, when the thickness D1 of the first abutment plate 31 is greater than 0.45mm, especially greater than 0.5mm, it is easy for the first abutment plate 31 to fail to pass through the gap between two adjacent battery cells 11 and abut against the side of the welding strip 12, thereby failing to perform the thickness d measurement operation of the flattened welding strip 12. Furthermore, the first abutment plate 31 will contact the battery cell 11, posing a risk of damage to the battery cell 11. When the thickness D1 of the first abutment plate 31 is less than 0.15mm, that is, the thickness D1 of the first abutment plate 31 is small, making the first abutment plate 31 prone to deformation and damage when subjected to external force or collision, thus failing to perform its measurement function. Similarly, when the thickness D2 of the second abutment plate 421 is greater than 0.45mm, especially greater than 0.5mm, it will be easy for the second abutment plate 421 to fail to pass through the gap between two adjacent battery cells 11 and abut against the side of the welding strip 12, thus making it impossible to measure the thickness d of the flattened welding strip 12. Moreover, the second abutment plate 421 will come into contact with the battery cell 11, which may cause damage to the battery cell 11. When the thickness D2 of the second abutment plate 421 is less than 0.15mm, that is, the thickness D2 of the second abutment plate 421 is small, the second abutment plate 421 is easy to deform and be damaged when subjected to external force or collision, thus failing to play a measurement role.

[0038] Optionally, the first measuring column 30 and the second measuring column 42 are specifically arranged coaxially, for example, in the axial direction as follows: Figure 3 As shown in Z. Under the adjustment operation of the adjustment knob 41, the second measuring column 42 moves closer to or further away from the first measuring column 30 along the axial direction Z, thereby adaptively adjusting the distance between the second measuring column 42 and the first measuring column 30.

[0039] Wherein, the length L1 of the first abutting plate 31 is the distance between the two end faces of the first abutting plate 31 along the axial direction Z of the first measuring column 30; the length L2 of the second abutting plate 421 is the distance between the two end faces of the second abutting plate 421 along the axial direction Z of the second measuring column 42.

[0040] It is worth noting that the length L1 of the first abutting plate 31 and the length L2 of the second abutting plate 421 can be the same or different. They can be flexibly adjusted and set according to actual needs, as long as the first abutting plate 31 and the second abutting plate 421 can respectively abut against the two opposite sides of the flattened welding strip 12, avoiding the defect that they cannot abut against the sides of the welding strip 12 due to interference from the battery cell 11 because their lengths are insufficient. For example, when the thickness of the battery cell 11 increases, in order to ensure that the first abutting plate 31 and the second abutting plate 421 can properly extend into the gap between two adjacent battery cells 11 to meet the need for abutting against the two opposite sides of the flattened welding strip 12, the lengths L1 and L2 can be increased accordingly.

[0041] The thickness of a single battery cell 11 can be set to 1mm, 2mm, 3mm, or 4mm, etc., and is usually no greater than 4mm. In some embodiments, the length L1 of the first abutment plate 31 includes, but is not limited to, 3mm ≤ L1 ≤ 7mm, specifically, for example, 3mm, 4mm, 5mm, 6mm, or 7mm, etc. Thus, the appropriate setting of the length L1 of the first abutment plate 31 ensures that, on the one hand, the first abutment plate 31 can properly extend into the gap between two adjacent battery cells 11 and abut against the side of the welding strip 12, preventing the first measuring post 30 from contacting the battery cell 11 and causing damage to it; on the other hand, the length L1 of the second abutment plate 421 is not too large, which would easily lead to deformation or breakage defects under force or impact. Similar to the setting of the length L1 of the first abutment plate 31, the length L2 of the second abutment plate 421 includes, but is not limited to, 3mm ≤ L2 ≤ 7mm, specifically, for example, 3mm, 4mm, 5mm, 6mm, or 7mm, etc.

[0042] Of course, as some alternative solutions, when the thickness of the battery cell 11 is set to be greater than 7mm, the length L1 of the first abutment plate 31 and the length L2 of the second abutment plate 421 are respectively set to be greater than 7mm according to the actual thickness of the battery cell 11.

[0043] Among them, the battery cell 11 includes, but is not limited to, a 16-busbar, 18-busbar or other types of battery cell 11, and has a large number of solder strips 12. Each solder strip 12 is arranged sequentially along the width direction of the battery cell 11, and the thickness d of the multiple solder strips 12 on the battery cell 11 needs to be measured separately.

[0044] Please see Figure 4 and Figure 6 In this embodiment, the width W1 of the first abutting plate 31 refers to the distance between the two opposite sides of the first abutting plate 31 in the direction perpendicular to the axial direction Z and the thickness direction, respectively; the width W2 of the second abutting plate 421 refers to the distance between the two opposite sides of the second abutting plate 421 in the direction perpendicular to the axial direction Z and the thickness direction, respectively.

[0045] Optionally, W1 can be set to a value of 1.5mm ≤ W1 ≤ 5mm, specifically, for example, 1.5mm, 1.8mm, 2mm, 2.2mm, 3mm, 3.5mm, or 5mm. This setting of W1 is suitable because, on the one hand, a larger W1 (not less than 1.5mm) prevents the first abutment plate 31 from easily deforming or being damaged under force or impact; on the other hand, W1 is not too large (not greater than 5mm) so that the first abutment plate 31 does not simultaneously abut against two solder strips 12, ensuring that the first abutment plate 31 abuts against a single solder strip 12 during each measurement. This improves measurement accuracy and allows for sequential measurement of the thickness d of each solder strip 12 on the battery cell 11. Similar to the setting of the width W1 of the first abutment plate 31, the width W2 of the second abutment plate 421 can be set to a value of 1.5mm ≤ W1 ≤ 5mm, specifically, for example, 1.5mm, 1.8mm, 2mm, 2.2mm, 3mm, 3.5mm, or 5mm.

[0046] Of course, as some optional options, W1 and W2 can each be set to any value less than 1.5mm or greater than 5mm, depending on the actual situation.

[0047] In some embodiments, the first measuring column 30 and the second measuring column 42 are each made of independently selected materials, such as hard alloy materials. In this way, by selecting materials with high hardness, the first measuring column 30 and the second measuring column 42 can compensate for the defects caused by the thinness of the first abutment plate 31 and the second abutment plate 421, which are prone to deformation and damage under force or impact. This also ensures that the first abutment plate 31 and the second abutment plate 421 are not easily deformed and damaged during use, and can maintain a high measurement accuracy over a long period of time.

[0048] Optionally, the cemented carbide material may include, but is not limited to, cemented carbon steel alloys, tungsten-cobalt alloys, or carbon-nickel alloys, etc., and can be flexibly selected according to actual needs.

[0049] In one embodiment, the first measuring post 30 further includes a first root portion 32. The first root portion 32 is connected to the first abutment plate 31, and the thickness D3 of the first root portion 32 is greater than the thickness D1 of the first abutment plate 31. Furthermore, the second measuring post 42 includes a second root portion 422. The second root portion 422 is connected to the second abutment plate 421, and the thickness D4 of the second root portion 422 is greater than the thickness D2 of the second abutment plate 421. Thus, the larger thickness D3 of the first root portion 32 results in greater structural strength for the first measuring post 30, making it less prone to deformation and damage under stress; similarly, the larger thickness D4 of the second root portion 422 results in greater structural strength for the second measuring post 42, making it less prone to deformation and damage under stress.

[0050] In some embodiments, the connection between the first root portion 32 and the first abutment plate 31 is smoothly transitioned with an arc-shaped surface or a slope, that is, the thickness of the connection between the first root portion 32 and the first abutment plate 31 gradually decreases to prevent stress concentration and damage defects under stress. Similarly, the connection between the second root portion 422 and the second abutment plate 421 is smoothly transitioned with an arc-shaped surface or a slope, that is, the thickness of the connection between the second root portion 422 and the second abutment plate 421 gradually decreases to prevent stress concentration and damage defects under stress.

[0051] Based on the aforementioned embodiments, the first root portion 32 and the first abutting plate 31 are integrated into a single structure, including but not limited to being processed by means of laser milling, grinding, or stamping. Similarly, the second root portion 422 and the second abutting plate 421 are integrated into a single structure, including but not limited to being processed by means of laser milling, grinding, or stamping.

[0052] The first root 32 and the second root 422 are each set independently, including but not limited to being set as regular shapes such as circular columns or square columns or other irregular shapes, which can be flexibly selected according to actual needs.

[0053] The width of the first root portion 32 is the same as the width W1 of the first abutment plate 31; the width of the second root portion 422 is the same as the width W2 of the second abutment plate 421. This facilitates the processing of the first measuring post 30 and the second measuring post 42.

[0054] Of course, the width of the first root 32 and the width W1 of the first abutting plate 31 may not be the same, and the width of the second root 422 and the width W2 of the second abutting plate 421 may not be the same.

[0055] In some embodiments, the length L3 of the first measuring column 30 includes, but is not limited to, 7mm ≤ L3 ≤ 10mm, specifically, for example, 7mm, 8mm, 8.5mm, 9mm or 10mm; the length L4 of the second measuring column 42 includes, but is not limited to, 7mm ≤ L4 ≤ 10mm, specifically, for example, 7mm, 8mm, 8.5mm, 9mm or 10mm, etc.

[0056] Please see Figure 3 In some embodiments, the measuring device further includes a base 50 connected between the first measuring column 30 and the fixing frame 20. A first root portion 32 is connected to the base 50 and is coaxially arranged with the base 50. The axial cross-sectional profile of the base 50 is larger than that of the first root portion 32. Thus, the base 50 acts as a transition, facilitating the stable mounting of the first measuring column 30 onto the fixing frame 20.

[0057] The first measuring column 30 and the base 50 are designed as an integrated structure, including but not limited to being processed by means of laser milling, grinding or stamping.

[0058] Please see Figure 3 In some embodiments, the measuring mechanism 40 further includes a movable rod 43 disposed between the second measuring column 42 and the adjusting knob 41. A second root portion 422 is connected to the movable rod 43, and the second root portion 422 and the movable rod 43 are coaxially arranged. The axial cross-sectional profile of the movable rod 43 is larger than that of the second root portion 422. Thus, the structural strength of the movable rod 43 is higher than that of the second measuring column 42, and it is less prone to damage during adjustment by the adjusting knob 41.

[0059] The second measuring column 42 and the movable rod 43 are designed as an integrated structure, including but not limited to being processed by means of laser milling, grinding or stamping.

[0060] In one embodiment, the mounting bracket 20 is provided with a first mounting base 21 and a second mounting base 22 arranged at relative intervals, the base 50 is mounted on the first mounting base 21, and the measuring mechanism 40 is mounted on the second mounting base 22.

[0061] In some embodiments, the shape and dimensions of the first measuring column 30 are the same as those of the second measuring column 42. Thus, the first measuring column 30 and the second measuring column 42 can be produced as a standard part, manufactured using the same mold, which reduces mold costs.

[0062] In some embodiments, the mounting bracket 20 is provided with a clearance recess 23 for avoiding the battery sheet 11. The depth K of the clearance recess 23 includes, but is not limited to, 200mm ≤ K ≤ 270mm, specifically, 200mm, 210mm, 220mm, 235mm, 240mm, 250mm, or 270mm. The first measuring post 30 is arranged on one side of the opening of the clearance recess 23, and the measuring mechanism 40 is arranged on the other side of the opening of the clearance recess 23. Thus, during the clamping process of the flattened welding strip 12, the clearance recess 23 serves to avoid the battery sheet 11, providing space for the movement of the battery sheet 11. The battery sheet 11 can be placed in the clearance recess 23, thereby ensuring the normal operation of the measurement of each welding strip 12 on the battery string 10, which is carried out sequentially.

[0063] Please see Figure 3 , Figure 5 and Figure 7 Specifically, the mounting bracket 20 includes, but is not limited to, being configured as a U-shaped bracket. During the measurement process, the mounting bracket 20 spans over the battery cell 11 to prevent the mounting bracket 20 from touching the battery cell 11 and causing damage to the battery cell 11.

[0064] It should be noted that the measuring mechanism 40 in this embodiment includes, but is not limited to, a micrometer, a ten-thousandth-degree meter, or a micrometer screw gauge, etc., which can be flexibly selected according to actual needs. For example, there are two adjustment knobs 41: one for coarse adjustment and the other for fine adjustment. The measuring mechanism 40 is provided with scale lines, through which real-time measurement values ​​can be read. Furthermore, the measuring range of the measuring mechanism 40 includes, but is not limited to, 0-25mm, with a graduation value of 0.001mm and a measurement accuracy of ±0.002mm.

[0065] In the description of this application, it should be understood that if terms such as "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential" appear, these terms indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application.

[0066] Furthermore, where the terms "first" and "second" appear, these terms are for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined with "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, where the term "multiple" appears, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0067] In this application, unless otherwise expressly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise expressly limited. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.

[0068] In this application, unless otherwise expressly specified and limited, the use of descriptions such as "above" or "below" the second feature indicates that the first and second features are in direct contact or indirect contact via an intermediate medium. Furthermore, "above," "on top of," and "over" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. Similarly, "below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.

[0069] It should be noted that if an element is referred to as being "fixed to" or "set on" another element, it can be directly on the other element or there may be an intervening element. If an element is considered to be "connected to" another element, it can be directly connected to the other element or there may be an intervening element. If so, the terms "vertical," "horizontal," "upper," "lower," "left," "right," and similar expressions used in this application are for illustrative purposes only and do not represent the only possible implementation.

[0070] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0071] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.

Claims

1. A measuring device, characterized in that, The measuring device includes: Fixture (20); The first measuring column (30) is mounted on the fixing frame (20); and A measuring mechanism (40) is mounted on the fixed frame (20). The measuring mechanism (40) is provided with an adjustment knob (41) and a second measuring column (42). The second measuring column (42) is arranged at a distance from the first measuring column (30). When the adjustment knob (41) is rotated, it can drive the second measuring column (42) to move towards or away from the first measuring column (30). The first measuring column (30) has a first abutment plate (31) at one end near the second measuring column (42), and the thickness D1 of the first abutment plate (31) is 0.15mm≤D1≤0.45mm; the second measuring column (42) has a second abutment plate (421) at one end near the first measuring column (30), and the thickness D2 of the second abutment plate (421) is 0.15mm≤D1≤0.45mm.

2. The measuring device according to claim 1, characterized in that, The length L1 of the first abutment plate (31) is 3mm≤L1≤7mm; the length L2 of the second abutment plate (421) is 3mm≤L2≤7mm.

3. The measuring device according to claim 1, characterized in that, The width W1 of the first abutment plate (31) is 1.5mm≤W1≤5mm; the width W2 of the second abutment plate (421) is 1.5mm≤W2≤5mm.

4. The measuring device according to claim 1, characterized in that, The first measuring column (30) and the second measuring column (42) are each made of hard alloy material independently.

5. The measuring device according to claim 1, characterized in that, The first measuring column (30) further includes a first root (32), which is connected to the first abutment plate (31), and the thickness D3 of the first root (32) is greater than the thickness D1 of the first abutment plate (31); the second measuring column (42) further includes a second root (422), which is connected to the second abutment plate (421), and the thickness D4 of the second root (422) is greater than the thickness D2 of the second abutment plate (421).

6. The measuring device according to claim 5, characterized in that, The measuring device further includes a base (50) connected between the first measuring column (30) and the fixed frame (20), the first root (32) is connected to the base (50), the first root (32) and the base (50) are coaxially arranged, and the axial cross-sectional profile dimension of the base (50) is larger than the axial cross-sectional profile dimension of the first root (32); the measuring mechanism (40) further includes a movable rod (43) disposed between the second measuring column (42) and the adjusting knob (41), the second root (422) is connected to the movable rod (43), the second root (422) and the movable rod (43) are coaxially arranged, and the axial cross-sectional profile dimension of the movable rod (43) is larger than the axial cross-sectional profile dimension of the second root (422).

7. The measuring device according to claim 6, characterized in that, The fixed frame (20) is provided with a first mounting seat (21) and a second mounting seat (22) arranged at relative intervals. The base (50) is mounted on the first mounting seat (21), and the measuring mechanism (40) is mounted on the second mounting seat (22).

8. The measuring device according to claim 1, characterized in that, The first measuring column (30) is coaxially arranged with the second measuring column (42); and / or, the shape and size of the first measuring column (30) are the same as the shape and size of the second measuring column (42).

9. The measuring device according to claim 1, characterized in that, The mounting bracket (20) is provided with a clearance recess (23) for avoiding the battery cell (11), and the depth K of the clearance recess (23) is 200mm≤K≤270mm; the first measuring column (30) is arranged on one side of the opening of the clearance recess (23), and the measuring mechanism (40) is arranged on the other side of the opening of the clearance recess (23).

10. The measuring device according to any one of claims 1 to 9, characterized in that, The measuring mechanism (40) includes a micrometer, ten-thousand-digit meter, or a micrometer screw gauge.

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