Test board for integrated circuit

Abstract

The utility model discloses a test board for an integrated circuit, which relates to the technical field of test boards and comprises a bottom board, guide rods are fixedly mounted on two sides of the middle of the upper end of the bottom board, guide sliding grooves are formed in the middles of the guide rods, and a fixing frame is slidably clamped in the middles of the guide sliding grooves. According to the utility model, a to-be-detected device is placed in the middle of the fixed frame, at the moment, the two baffles are close to each other to be in a closed state and can support the device, the deflector rod is pressed to enable the fixed frame to move downwards along the guide sliding groove and the sliding rod, and when the fixed frame moves to the position above the detection groove, the motor is started to drive the bidirectional lead screw to rotate; the two baffles are driven to move in the opposite directions along the sliding grooves until the sliding grooves are in the opening and closing state, at the moment, the devices can vertically enter the detection grooves, the motor is started to drive the baffles to retract, and the devices make contact with the bottom by pressing the shifting rods so that detection can be conveniently conducted, and the guide rods can limit horizontal movement of the devices in the middle of the fixing frame. Therefore, the accuracy in the vertical direction is ensured.

Description

Technical Field

[0001] This utility model relates to the field of test board technology, and in particular to a test board for integrated circuits. Background Technology

[0002] An integrated circuit is a miniature electronic device or component. When testing integrated circuits, a test board is used. By placing the integrated circuit device inside the test board, it is then tested by instruments. An integrated circuit test board is a special device used to verify and evaluate the performance, reliability, and functional integrity of integrated circuits (ICs).

[0003] In the prior art, such as Chinese patent CN217034153U, a test board for integrated circuits is disclosed, including a test board body. The surface of the test board body is provided with a fixed pin insertion plate, and the test board body is provided with a movable pin insertion plate by means of a reset spring. A tension member is also inserted into the surface of the test board body and is connected to the surface of the movable pin insertion plate. The surface of the test board body is provided with a pinless detection part. The test board body has a hollow structure, and a detection chip is provided on the surface of the test board body.

[0004] In the prior art, the aforementioned patent solves the problem that due to the inconvenience of adjusting according to the chip size, it is necessary to spend a lot of time building circuits for chips of different sizes each time, and it is inconvenient to test chips with different package structures at the same time. However, there are still some shortcomings when using the above device. The device under test needs to be placed manually by the operator. Due to the difference in the operator's technical level and experience, manual placement of the device may introduce some human errors, resulting in inaccurate or skewed placement of the device under test, which in turn leads to poor pin contact. Poor pin contact will directly affect the transmission and reception of test signals, resulting in distorted or incorrect test data, which has certain limitations. Utility Model Content

[0005] The purpose of this invention is to address the limitations of existing technologies where the placement of devices under test (DUTs) requires manual placement by workers. This manual placement can lead to human error due to variations in operator skill and experience, resulting in inaccurate or misaligned placement of the DUTs, and consequently, poor pin contact. Poor pin contact directly affects the transmission and reception of test signals, leading to distorted or incorrect test data. Therefore, this invention proposes a test board for integrated circuits.

[0006] To achieve the above objectives, the present invention adopts the following technical solution: a test board for integrated circuits, comprising a base plate, guide rods fixedly installed on both sides of the upper middle portion of the base plate, guide grooves formed in the middle of each guide rod, a fixed frame slidably engaged in the middle of each guide groove, grooves formed on both sides of the middle portion of the fixed frame, baffles slidably engaged in the middle of each of the two grooves, a fixed block fixedly installed above the middle portion of one end of the fixed frame, a bidirectional lead screw threadedly connected to the middle portion of the fixed block, two baffles threadedly connected to the two ends of the bidirectional lead screw, a motor fixedly installed at one end of the bidirectional lead screw, guide sliders fixedly connected to both ends of the fixed frame, rollers rotatably installed on both sides of the middle portion of one of the guide sliders, a slide rod fixedly installed in the middle portion of one of the guide rods, the slide rod slidably engaged with the other guide slider.

[0007] Preferably, the guide slider is slidably engaged with the middle of the guide groove.

[0008] Preferably, a lever is fixedly installed on one side of the upper middle part of the fixed frame.

[0009] Preferably, a detection groove is provided in the middle of the upper end of the base plate, and the detection groove is located directly below the fixed frame.

[0010] Preferably, connecting seats are fixedly installed at all four corners of the base plate.

[0011] Compared with the prior art, the advantages and positive effects of this utility model are as follows:

[0012] 1. In this utility model, by setting a fixed frame perpendicular to the detection groove, the device to be tested is placed in the middle of the fixed frame during use. At this time, the two baffles are close together and in a closed state, which can cooperate with the fixed frame to support the device. Then, press the lever to make the fixed frame move downward along the guide slide and the slide rod. When the fixed frame moves above the detection groove, the motor is started to drive the bidirectional lead screw to rotate, which in turn drives the two baffles to move away from each other along the slide. At this time, the slide is open and closed, which makes it convenient for the device in the middle to enter the middle of the detection groove vertically. The motor is started to drive the baffles to retract, and the device is continued to touch the bottom by pressing the lever to facilitate detection. The guide rod can restrict the horizontal movement of the device in the middle of the fixed frame, thereby ensuring its accurate positioning in the vertical direction and reducing the occurrence of poor contact caused by misalignment of the pins due to human factors.

[0013] 2. In this utility model, by setting a roller that can rotate along the guide groove, the process of moving the fixed frame up and down by the lever is smoother, which can reduce vibration and thus ensure that the device to be tested is not affected. Attached Figure Description

[0014] Figure 1 This utility model provides a three-dimensional structural diagram of a test board for integrated circuits;

[0015] Figure 2 This utility model provides a schematic diagram showing the positional relationship between the base plate and the guide rod of a test board for integrated circuits;

[0016] Figure 3 This utility model provides a first three-dimensional structural diagram of a fixing frame for a test board used in integrated circuits.

[0017] Figure 4 This utility model provides a second three-dimensional structural diagram of a fixing frame for a test board used in integrated circuits.

[0018] Legend: 1. Base plate; 11. Connecting seat; 12. Detection groove; 2. Guide rod; 21. Fixing frame; 22. Guide slide; 23. Guide slider; 24. Roller; 25. Slide rod; 26. Slide groove; 27. Baffle; 28. Fixing block; 29. ​​Two-way lead screw; 30. Motor; 31. Lever. Detailed Implementation

[0019] To better understand the above-mentioned objectives, features, and advantages of this utility model, the present utility model will be further described below with reference to the accompanying drawings and embodiments. It should be noted that, unless otherwise specified, the embodiments and features described in these embodiments can be combined with each other.

[0020] Many specific details are set forth in the following description in order to provide a full understanding of the present invention. However, the present invention may also be implemented in other ways different from those described herein. Therefore, the present invention is not limited to the specific embodiments disclosed in the following specification.

[0021] Example 1, as Figure 1-4 As shown, this utility model provides a test board for integrated circuits, including a base plate 1. Guide rods 2 are fixedly installed on both sides of the upper middle part of the base plate 1. Guide grooves 22 are opened in the middle of the guide rods 2. A fixed frame 21 is slidably engaged in the middle of the guide grooves 22. Slide grooves 26 are opened on both sides of the middle of the fixed frame 21. Baffles 27 are slidably engaged in the middle of the two slide grooves 26. A fixed block 28 is fixedly installed on the upper part of the middle of one end of the fixed frame 21. A bidirectional lead screw 29 is threadedly connected to the middle of the fixed block 28. Two baffles 27 are threadedly connected to the two ends of the bidirectional lead screw 29. A motor 30 is fixedly installed on one end of the bidirectional lead screw 29. Guide sliders 23 are fixedly connected to both ends of the fixed frame 21. Rollers 24 are rotatably installed on both sides of the middle of one of the guide sliders 23. A slide rod 25 is fixedly installed in the middle of one of the guide rods 2. The slide rod 25 is slidably engaged with the other guide slider 23.

[0022] The specific settings and functions of this embodiment are described below. The device to be tested is placed in the middle of the fixed frame 21. At this time, the two baffles 27 are close together and in a closed state, which can cooperate with the fixed frame 21 to support the device. Then, press the lever 31 to make the fixed frame 21 move downward along the guide groove 22 and the slide rod 25. The guide rod 2 can restrict the horizontal movement of the device in the middle of the fixed frame 21, thereby ensuring its accurate positioning in the vertical direction. When the fixed frame 21 moves above the detection slot 12, the start motor 30 drives the bidirectional lead screw 29 to rotate, which in turn drives the two baffles 27 to move away from each other along the slide groove 26. At this time, the slide groove 26 is in an open and closed state, which makes it convenient for the device in the middle to enter the middle of the detection slot 12 vertically. The start motor 30 drives the baffles 27 to retract, and the device touches the bottom by pressing the lever 31 again, which is convenient for detection. By reducing the placement error caused by human factors, the accuracy and reliability of the overall test are improved.

[0023] Example 2, as Figure 1 , Figure 2 , Figure 3 and Figure 4 As shown, the guide slider 23 is slidably engaged with the middle of the guide groove 22, a lever 31 is fixedly installed on one side of the middle of the upper end of the fixed frame 21, a detection groove 12 is opened in the middle of the upper end of the base plate 1, the detection groove 12 is located directly below the fixed frame 21, and a connecting seat 11 is fixedly installed at each of the four corners of the base plate 1.

[0024] The overall effect of this embodiment is that when the device to be tested is placed in the middle of the fixed frame 21, the two baffles 27 are close together in a closed state, which can support the device in conjunction with the fixed frame 21. Then, pressing the lever 31 causes the fixed frame 21 to move downward along the guide groove 22 and the slide rod 25. The roller 24 makes the up-and-down movement of the fixed frame 21 driven by the lever 31 smoother, reduces vibration, and ensures that the device to be tested is not affected. The guide rod 2 can limit the horizontal movement of the device in the middle of the fixed frame 21. This ensures precise vertical positioning and improves overall test accuracy and reliability by reducing placement errors caused by human factors. When the fixed frame 21 moves above the detection slot 12, the start motor 30 drives the bidirectional lead screw 29 to rotate, which in turn drives the two baffles 27 to move away from each other along the slide 26. At this time, the slide 26 is open, which facilitates the vertical entry of the device in the middle into the middle of the detection slot 12. The start motor 30 drives the baffles 27 to retract, and the device is brought to the bottom by pressing the lever 31, which facilitates the detection.

[0025] The device is used and operates as follows: The device to be tested is placed in the middle of the fixed frame 21. At this time, the two baffles 27 are close together and closed, supporting the device in conjunction with the fixed frame 21. Then, press the lever 31 to move the fixed frame 21 downwards along the guide groove 22 and the slide rod 25. The rollers 24 ensure smoother movement of the fixed frame 21 via the lever 31, reducing vibration and ensuring the device to be tested is not affected. When the fixed frame 21 moves above the detection slot 12, the motor is started. Motor 30 drives the bidirectional lead screw 29 to rotate, which in turn drives the two baffles 27 to move away from each other along the slide 26. At this time, the slide 26 is in an open or closed state, which facilitates the vertical entry of the device in the middle into the middle of the detection slot 12. When the motor 30 starts, it drives the baffles 27 to retract. Then, by pressing the lever 31, the device touches the bottom, which is convenient for detection. The guide rod 2 can restrict the horizontal movement of the device in the middle of the fixed frame 21, thereby ensuring its accurate positioning in the vertical direction. By reducing the placement error caused by human factors, the accuracy and reliability of the overall test are improved.

[0026] The above description is merely a preferred embodiment of the present utility model and is not intended to limit the present utility model in any other way. Any person skilled in the art may make changes or modifications to the above-disclosed technical content to create equivalent embodiments for application in other fields. However, any simple modifications, equivalent changes, and modifications made to the above embodiments based on the technical essence of the present utility model without departing from the technical solution of the present utility model shall still fall within the protection scope of the technical solution of the present utility model.

Claims

1. A test board for integrated circuits, comprising a base plate (1), characterized in that: Guide rods (2) are fixedly installed on both sides of the upper middle part of the base plate (1). Guide grooves (22) are opened in the middle of the guide rods (2). A fixed frame (21) is slidably engaged in the middle of the guide grooves (22). Slide grooves (26) are opened on both sides of the middle of the fixed frame (21). Baffles (27) are slidably engaged in the middle of the two slide grooves (26). A fixing block (28) is fixedly installed on the upper part of the middle of one end of the fixed frame (21). A bidirectional thread is threaded into the middle of the fixing block (28). The rod (29) and the two baffles (27) are respectively threaded to the two ends of the bidirectional lead screw (29). A motor (30) is fixedly installed at one end of the bidirectional lead screw (29). Guide sliders (23) are fixedly connected to both ends of the fixed frame (21). Rollers (24) are rotatably installed on both sides of the middle part of one of the guide sliders (23). A slide rod (25) is fixedly installed in the middle part of one of the guide rods (2). The slide rod (25) is slidably engaged with the other guide slider (23).

2. A test board for integrated circuits according to claim 1, characterized in that: The guide slider (23) is slidably engaged with the middle part of the guide groove (22).

3. A test board for integrated circuits according to claim 1, characterized in that: A lever (31) is fixedly installed on one side of the upper middle part of the fixed frame (21).

4. A test board for integrated circuits according to claim 1, characterized in that: A detection groove (12) is provided in the middle of the upper end of the base plate (1), and the detection groove (12) is located directly below the fixed frame (21).

5. A test board for integrated circuits according to claim 1, characterized in that: Connecting seats (11) are fixedly installed at the four corners of the base plate (1).

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