BMS chip reliability testing device

Abstract

The utility model discloses a BMS chip reliability testing device comprising a testing machine body, the left surface of the testing machine body is provided with a test bench, the front surface of the testing machine body is provided with a wire, one end of the wire far away from the testing machine body is provided with an energizing test pen, the inner surface of the test bench is fixedly connected with a spring, and the spring is fixedly connected with the test bench. A clamping plate is fixedly connected to the end, away from the test board, of the spring, a rubber plate is fixedly connected to the outer surface of the clamping plate, a partition plate is fixedly connected to the inner surface of the test board, a through hole is formed in the outer surface of the partition plate, and a first guide rail is fixedly connected to the inner surface of the test board. Through arrangement of a partition plate, a first guide rail, a first motor, a reciprocating lead screw, a U-shaped frame, a second motor, a rotating shaft, heat dissipation blades, a guide rod and a second guide rail, air blowing and heat reduction can be performed on a chip in a testing process, so that heat is taken away from the outer surface of the chip, and an overheating condition is prevented.

Description

Technical Field

[0001] This utility model relates to the field of chip testing equipment technology, and in particular to a BMS chip reliability testing device. Background Technology

[0002] With the rapid development of electric vehicles, portable electronic devices, and renewable energy storage systems, the importance of battery management systems (BMS) is becoming increasingly prominent. As a core component of the BMS, the reliability of the BMS chip directly affects the safety and efficiency of the entire system. Therefore, rigorous reliability testing of the BMS chip is crucial.

[0003] However, existing BMS chip reliability testing equipment still has certain shortcomings. For example, the chip may generate a lot of heat during the testing process. If this heat cannot be removed in time, the chip may overheat, leading to performance degradation, reduced reliability, or even permanent damage. Utility Model Content

[0004] The purpose of this invention is to at least solve one of the technical problems existing in the prior art, and to provide a BMS chip reliability testing device that can blow air to cool the chip during the testing process, thereby removing heat from the outer surface of the chip and preventing overheating.

[0005] This utility model also provides a BMS chip reliability testing device as described above, comprising:

[0006] The testing machine body has a testing platform on its left surface and a wire on its front surface. A power test pen is attached to the end of the wire furthest from the testing machine body. A spring is fixedly connected to the inner surface of the testing platform, and a clamping plate is fixedly connected to the end of the spring furthest from the testing platform. A rubber plate is fixedly connected to the outer surface of the clamping plate. A partition is fixedly connected to the inner surface of the testing platform, and a through hole is provided on the outer surface of the partition. A first guide rail is fixedly connected to the inner surface of the testing platform, and a first motor is fixedly connected to the inner surface of the first guide rail. A reciprocating screw is fixedly connected to the output end of the first motor. A U-shaped frame is threadedly connected to the outer surface of the reciprocating screw. A guide rod is slidably connected to the inner surface of the U-shaped frame, and second guide rails are fixedly connected to both ends of the guide rod. A second motor is fixedly connected to the lower surface of the U-shaped frame, and a rotating shaft is fixedly connected to the output end of the second motor. Heat dissipation fins are fixedly connected to the outer surface of the rotating shaft.

[0007] The right surface of the test bench is provided with an air inlet, the inner surface of the air inlet is provided with a dust filter, the outer surface of the dust filter is provided with a first threaded hole, and the inner surface of the first threaded hole is threaded with a fixing bolt.

[0008] The right surface of the test bench is provided with a second threaded hole, the inner surface of which is adapted to the fixing bolt, so as to facilitate the installation of the dust filter.

[0009] The upper surface of the clamping plate is fixedly connected to a T-shaped handle to facilitate the movement of the clamping plate. There are two clamping plates, which are symmetrically distributed.

[0010] The outer surface of the reciprocating screw is rotatably connected to the first guide rail, and the inner surface of the test bench is fixedly connected to the second guide rail.

[0011] The inner surface of the first guide rail is slidably connected to the U-shaped frame, and the inner surface of the second guide rail is slidably connected to the U-shaped frame.

[0012] The outer surface of the rotating shaft is rotatably connected to the U-shaped frame, and the number of heat dissipation blades is three.

[0013] The second threaded hole corresponds to the first threaded hole, which facilitates the positioning of the dust filter during installation.

[0014] The testing machine body, the first motor, and the second motor are all electrically connected to an external power source, and the energized test pen is electrically connected to the testing machine body via a wire.

[0015] Compared with the prior art, the beneficial effects of this utility model are:

[0016] 1. By setting up a partition, a first guide rail, a first motor, a reciprocating lead screw, a U-shaped frame, a second motor, a rotating shaft, heat dissipation blades, a guide rod, and a second guide rail, the chip during the testing process can be cooled by blowing air, thereby removing heat from the outer surface of the chip and preventing overheating.

[0017] 2. By setting up air inlets and dust filters, external dust can be prevented from being blown onto the outer surface of the chip, thereby reducing the risk of chip damage. In addition, by setting up fixing bolts, the dust filter can be easily disassembled, improving practicality. Attached Figure Description

[0018] Figure 1 This is a schematic diagram of the overall structure of a BMS chip reliability testing device according to the present invention.

[0019] Figure 2 This is a partial structural schematic diagram of a BMS chip reliability testing device according to the present invention.

[0020] Figure 3 for Figure 2 A magnified schematic diagram of the structure at point A in the middle.

[0021] Figure 4 This is a partial exploded view of the BMS chip reliability testing device of this utility model.

[0022] Legend:

[0023] 1. Test machine body; 2. Test platform; 3. Wires; 4. Power-on test pen; 5. Spring; 6. Clamping plate; 7. Rubber plate; 8. Partition plate; 9. Through hole; 10. First guide rail; 11. First motor; 12. Reciprocating lead screw; 13. U-shaped frame; 14. Second motor; 15. Rotating shaft; 16. Heat dissipation fins; 17. Air inlet; 18. Dust filter; 19. First threaded hole; 20. Fixing bolt; 21. Second threaded hole; 22. T-shaped handle; 23. Guide rod; 24. Second guide rail. Detailed Implementation

[0024] Reference Figure 1-4 This utility model discloses a BMS chip reliability testing device, comprising a testing machine body 1, a testing platform 2 on the left surface of the testing machine body 1, a wire 3 on the front surface of the testing machine body 1, a power-conducting test pen 4 at the end of the wire 3 away from the testing machine body 1, a spring 5 fixedly connected to the inner surface of the testing platform 2, a clamping plate 6 fixedly connected to the end of the spring 5 away from the testing platform 2, a rubber plate 7 fixedly connected to the outer surface of the clamping plate 6, a partition 8 fixedly connected to the inner surface of the testing platform 2, a through hole 9 on the outer surface of the partition 8, a first guide rail 10 fixedly connected to the inner surface of the testing platform 2, a first motor 11 fixedly connected to the inner surface of the first guide rail 10, a reciprocating screw 12 fixedly connected to the output end of the first motor 11, a U-shaped frame 13 threadedly connected to the outer surface of the reciprocating screw 12, a guide rod 23 slidably connected to the inner surface of the U-shaped frame 13, and both ends of the guide rod 23 fixed. The test platform 2 is connected to a second guide rail 24. A second motor 14 is fixedly connected to the lower surface of the U-shaped frame 13. A rotating shaft 15 is fixedly connected to the output end of the second motor 14. A heat dissipation fin 16 is fixedly connected to the outer surface of the rotating shaft 15. A second threaded hole 21 is provided on the right surface of the test platform 2. A T-shaped handle 22 is fixedly connected to the upper surface of the clamping plate 6. There are two clamping plates 6, which are symmetrically distributed. The outer surface of the reciprocating screw 12 is rotatably connected to the first guide rail 10. The inner surface of the test platform 2 is fixedly connected to the second guide rail 24. The inner surface of the first guide rail 10 is slidably connected to the U-shaped frame 13. The inner surface of the second guide rail 24 is slidably connected to the U-shaped frame 13. The outer surface of the rotating shaft 15 is rotatably connected to the U-shaped frame 13. There are three heat dissipation fins 16. The test machine body 1, the first motor 11, and the second motor 14 are all electrically connected to an external power source. The powered test pen 4 is electrically connected to the test machine body 1 through a wire 3.

[0025] The right surface of the test bench 2 is provided with an air inlet 17. The inner surface of the air inlet 17 is provided with a dust filter 18. The outer surface of the dust filter 18 is provided with a first threaded hole 19. The inner surface of the first threaded hole 19 is threaded with a fixing bolt 20. The inner surface of the second threaded hole 21 is adapted to the fixing bolt 20. The second threaded hole 21 corresponds to the first threaded hole 19.

[0026] In use, pull the T-shaped handle 22 to move the two clamping plates 6 away from each other and compress the spring 5. Then place the chip to be tested on the partition 8. Release the T-shaped handle 22, and the chip will be clamped by the rubber plate 7 under the rebound force of the spring 5. Then connect the external power supply, start the test machine body 1, and contact the chip with the power-on test probe 4 to power the chip. Then perform a reliability test on the chip through the test machine body 1 and the wire 3. During the test, the first motor 11 and the second motor 14 are started at the same time. Under the action of the second motor 14, the rotating shaft 15 drives the heat sink 16 to rotate, thereby filtering the outside air through the dust filter 18 before it passes through the through hole. 9 blows out cool air to dissipate heat from the chip. Under the action of the first motor 11, the reciprocating screw 12 drives the heat dissipation blades 16 on the U-shaped frame 13 to move back and forth along the guide rod 23, thereby improving the heat dissipation effect. When the dust filter 18 needs to be replaced and cleaned, simply loosen and remove the fixing bolt 20 to release the restriction on the dust filter 18. Then, pull the dust filter 18 out from the inside of the air inlet 17 to complete the disassembly. Then, insert the new dust filter 18 into the air inlet 17, aligning the first threaded hole 19 on the new dust filter 18 with the second threaded hole 21. Then, screw in the fixing bolt 20 again to complete the installation of the new dust filter 18. It is simple and convenient.

Claims

1. A BMS chip reliability testing device, characterized in that, The test machine includes a main body (1), a test platform (2) is provided on the left surface of the main body (1), a wire (3) is provided on the front surface of the main body (1), a power-conducting test pen (4) is provided at the end of the wire (3) away from the main body (1), a spring (5) is fixedly connected to the inner surface of the test platform (2), a clamping plate (6) is fixedly connected to the end of the spring (5) away from the test platform (2), a rubber plate (7) is fixedly connected to the outer surface of the clamping plate (6), a partition (8) is fixedly connected to the inner surface of the test platform (2), a through hole (9) is provided on the outer surface of the partition (8), and the inner surface of the test platform (2) is fixedly connected to... A first guide rail (10) is connected to the inner surface of the first guide rail (10), a first motor (11) is fixedly connected to the inner surface of the first guide rail (10), a reciprocating screw (12) is fixedly connected to the output end of the first motor (11), a U-shaped frame (13) is threadedly connected to the outer surface of the reciprocating screw (12), a guide rod (23) is slidably connected to the inner surface of the U-shaped frame (13), a second guide rail (24) is fixedly connected to both ends of the guide rod (23), a second motor (14) is fixedly connected to the lower surface of the U-shaped frame (13), a rotating shaft (15) is fixedly connected to the output end of the second motor (14), and a heat dissipation blade (16) is fixedly connected to the outer surface of the rotating shaft (15). The right surface of the test bench (2) is provided with an air inlet (17), the inner surface of the air inlet (17) is provided with a dust filter (18), the outer surface of the dust filter (18) is provided with a first threaded hole (19), and the inner surface of the first threaded hole (19) is threaded with a fixing bolt (20).

2. The BMS chip reliability testing device according to claim 1, characterized in that, The right surface of the test bench (2) is provided with a second threaded hole (21), and the inner surface of the second threaded hole (21) is adapted to the fixing bolt (20).

3. The BMS chip reliability testing device according to claim 1, characterized in that, The upper surface of the clamping plate (6) is fixedly connected with a T-shaped handle (22), and there are two clamping plates (6) that are symmetrically distributed.

4. The BMS chip reliability testing device according to claim 1, characterized in that, The outer surface of the reciprocating screw (12) is rotatably connected to the first guide rail (10), and the inner surface of the test bench (2) is fixedly connected to the second guide rail (24).

5. The BMS chip reliability testing device according to claim 1, characterized in that, The inner surface of the first guide rail (10) is slidably connected to the U-shaped frame (13), and the inner surface of the second guide rail (24) is slidably connected to the U-shaped frame (13).

6. The BMS chip reliability testing device according to claim 1, characterized in that, The outer surface of the rotating shaft (15) is rotatably connected to the U-shaped frame (13), and the number of heat dissipation blades (16) is three.

7. The BMS chip reliability testing device according to claim 2, characterized in that, The second threaded hole (21) corresponds to the first threaded hole (19).

8. The BMS chip reliability testing device according to claim 1, characterized in that, The test machine body (1), the first motor (11), and the second motor (14) are all electrically connected to an external power source, and the power-on test pen (4) is electrically connected to the test machine body (1) through a wire (3).

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