Withstand voltage test fixture for enameled wire

Abstract

The utility model discloses a withstand voltage test fixture for an enameled wire. The withstand voltage test fixture comprises a detection table; the first movable contact assembly is connected to the detection table, and the first movable contact assembly can move close to or away from a to-be-detected enameled wire so as to abut against or be away from the to-be-detected enameled wire; and the at least two second movable contact assemblies are arranged on the detection table, and the second movable contact assemblies can perform relative clamping or far-away movement relative to the to-be-detected enameled wire so as to fixedly abut against or be far away from the to-be-detected enameled wire. According to the voltage withstanding test fixture provided by the utility model, positions, which need to be detected, of the to-be-tested enameled wire are contacted through the first movable contact assembly and the second movable contact assembly, so that the voltage withstanding performance of the to-be-tested enameled wire can be tested, and the fixture is high in universality, high in test efficiency and high in safety.

Description

Technical Field

[0001] This utility model relates to the field of fixture technology, and in particular to a pressure resistance testing fixture for enameled wire. Background Technology

[0002] Enamelled wire is a major type of winding wire, consisting of a conductor and an insulation layer. The bare wire is annealed and softened, then coated with enamel multiple times and baked. Existing enamelled wires generally suffer from poor consistency, weak adhesion, and lengthy stripping processes. Due to the limited temperature resistance of the enamel materials used in current enamelled wires, they are difficult to withstand high-voltage environments. Currently, commonly used enamelled wires generally have a withstand voltage of no more than 4000V (cylindrical method) or 8000V (twisted pair method), which basically meets the voltage requirements of ordinary electrical components, but are prone to oxidation and embrittlement under high-voltage conditions. In contrast, ultra-high voltage enamelled wire products have extremely high requirements for the insulating varnish; its performance must meet both the requirements and the usage characteristics to prevent high-voltage oxidation. Furthermore, when multiple enamelled wires are used simultaneously, current technology uses them directly, leading to mutual interference between the wires and poor signal stability.

[0003] Therefore, it is necessary to test the withstand voltage performance of enameled wire when using it. However, the current test requires scraping off the protective varnish on the surface of the enameled wire with an external tool to expose the metal wire. The metal wire can then be clamped with a conductive clamp to perform the withstand voltage test. However, it is very inconvenient to find another tool to scrape off the protective varnish.

[0004] In view of this, it is necessary to propose further improvements to the current structure. Utility Model Content

[0005] Therefore, the purpose of this utility model is to at least partially address the shortcomings of the prior art, thereby proposing a pressure resistance test fixture for enameled wire.

[0006] To achieve the above objectives, the present invention adopts the following technical solution:

[0007] This utility model provides a pressure resistance testing fixture for enameled wires, comprising:

[0008] Testing station;

[0009] A first movable contact component is connected to the testing stage. The first movable contact component can move closer to or further away from the enameled wire to be tested, so as to come into contact with or move away from the enameled wire to be tested.

[0010] At least two second movable contact components are disposed on the testing stage. The second movable contact components can move relative to the enameled wire to be tested, clamping or moving away from it to fix them against or away from the enameled wire to be tested.

[0011] Furthermore, a base is connected to one side of the testing station, and the first movable contact component is connected to the side opposite to the base. A groove for placing the enameled wire to be tested is provided on the base. At least two second movable contact components are connected to the side of the testing station where the base is located, so as to clamp or move away from the enameled wire to be tested in the groove.

[0012] Furthermore, the first movable contact component includes a driving element and a plurality of detection elements. The driving element can drive the detection elements to approach or move away from the enameled wire under test, so that the detection elements abut or move away from the enameled wire under test.

[0013] Furthermore, the first movable contact assembly also includes a connecting plate. One end of the driving member is connected to the detection stage, and the other end is connected to the connecting plate. A plurality of detection elements are connected at intervals on the connecting plate. The driving member can drive the connecting plate to move the detection elements to abut or move away from the enameled wire to be tested.

[0014] Furthermore, at least two second movable contact components are arranged opposite to each other, and each second movable contact component includes a first profiler, a second profiler, and a positioning member. The first profiler and the second profiler are arranged opposite to each other, and the positioning member is connected to the side of the second profiler away from the first profiler. The positioning member can drive the second profiler to move closer to or away from the first profiler, so that the second profiler and the first profiler clamp or release the enameled wire to be tested.

[0015] Furthermore, each of the first and second contouring parts has a limiting groove adapted to the enameled wire to be tested on its opposite side. The first contouring part is connected to the groove, and the groove is also provided with a slot adapted to the second contouring part, so that the positioning part can drive the second contouring part to move closer to or away from the first contouring part.

[0016] Furthermore, the positioning component includes a rotating component, a pushing component, and a connecting seat. The rotating component and the pushing component are connected to the connecting seat. One end of the pushing component is connected to the rotating component, and the other end is connected to the second contouring component. The rotating component can drive the pushing component to move the second contouring component closer to or away from the first contouring component.

[0017] Furthermore, the rotating component also includes a first rotating part and a second rotating part. One end of the first rotating part is connected to the pushing component, and the other end is rotatably connected to the second rotating part. The end of the second rotating part near the first rotating part is also rotatably connected to the connecting seat.

[0018] Furthermore, the diameter of the second rotating part gradually increases from the end closest to the first rotating part to the end furthest from the first rotating part.

[0019] Furthermore, the testing platform is also equipped with a heightening component, and the connecting seat is connected to the heightening component.

[0020] This invention provides a withstand voltage testing fixture for enameled wire, comprising: a testing platform; a first movable contact component connected to the testing platform, capable of moving closer to or away from the enameled wire to be tested, thereby contacting or moving away from the wire; and at least two second movable contact components disposed on the testing platform, capable of clamping or moving away from the wire to be tested, thereby fixing them against or away from the wire. Using the withstand voltage testing fixture provided by this invention, the first and second movable contact components make contact with all the required testing positions of the enameled wire, allowing for the commencement of the withstand voltage test. This fixture offers high versatility, high testing efficiency, and high safety. Attached Figure Description

[0021] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on the structures shown in these drawings without creative effort.

[0022] Figure 1 This is a schematic diagram of the overall structure of the voltage withstand test fixture for enameled wires according to this utility model.

[0023] Figure 2 This is a schematic diagram of the first moving contact component of the withstand voltage test fixture for enameled wire of this utility model.

[0024] Figure 3 This is a schematic diagram of the structure of the enameled wire withstand voltage test fixture of the present invention, in which a second movable contact component is provided on the test platform to contact the enameled wire to be tested.

[0025] Figure 4A cross-sectional view of the test platform of the withstand voltage test fixture for enameled wire of this utility model, wherein a second movable contact component is provided;

[0026] Figure 5 This is a schematic diagram of the positioning component of the pressure resistance test fixture for enameled wire according to this utility model.

[0027] The reference numerals in the figure are as follows: 1. Testing platform; 11. Base; 111. Groove; 12. Heightening component; 2. First moving contact assembly; 21. Driving component; 22. Connecting plate; 23. Testing component; 3. Second moving contact assembly; 31. First contouring component; 32. Second contouring component; 33. Positioning component; 331. Rotating component; 3311. First rotating part; 3312. Second rotating part; 332. Pushing component; 333. Connecting seat; 4. Enamelled wire to be tested. Detailed Implementation

[0028] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0029] It should be noted that the descriptions involving "first," "second," etc., in this utility model are for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined with "first" or "second" may explicitly or implicitly include at least one of those features. Furthermore, the technical solutions of the various embodiments can be combined with each other, but this must be based on the ability of those skilled in the art to implement them. If the combination of technical solutions is contradictory or impossible to implement, such a combination of technical solutions should be considered non-existent and not within the scope of protection claimed by this utility model.

[0030] Please refer to Figures 1 to 5 This utility model provides a pressure resistance test fixture for enameled wire, comprising:

[0031] Testing station 1;

[0032] The first movable contact component 2 is connected to the test table 1. The first movable contact component 2 can move closer to or further away from the enameled wire 4 to be tested, so as to come into contact with or move away from the enameled wire 4 to be tested.

[0033] At least two second movable contact components 3 are disposed on the test table 1. The second movable contact components 3 can clamp or move away from the enameled wire 4 to be tested, so as to fix them against or away from the enameled wire 4 to be tested.

[0034] In this embodiment, the withstand voltage test fixture for enameled wire includes a test platform 1, a first movable contact component 2, and a second movable contact component 3. The first movable contact component 2 and the second movable contact component 3 are both connected to the test platform 1 and are used to contact the enameled wire 4 to be tested on the test platform 1, so that the test position on the enameled wire 4 to be tested contacts the first movable contact component 2 and the second movable contact component 3, thereby enabling testing.

[0035] In this embodiment, the first movable contact component 2 can move closer to or further away from the enameled wire 4 to be tested, so that the first movable contact component 2 can contact the test position of the enameled wire 4 to be tested or move away from the enameled wire 4 to be tested.

[0036] In this embodiment, two second movable contact components 3 are provided. The two second movable contact components 3 are arranged opposite to each other, and each second movable contact component 3 can perform relative clamping or moving away from the enameled wire 4 to be tested, thereby fixing the position of clamping or moving away from the enameled wire 4 to be tested.

[0037] Furthermore, a base 11 is connected to one side of the testing station 1, and a first movable contact component 2 is connected to the side opposite to the base 11. A groove 111 for placing the enameled wire 4 to be tested is provided on the base 11. At least two second movable contact components 3 are connected to the side of the testing station 1 where the base 11 is provided, so as to clamp or move away from the enameled wire 4 to be tested in the groove 111.

[0038] In this embodiment, a base 11 is connected to one side of the testing platform 1, and a first movable contact component 2 is connected to the side opposite to the base 11. That is, the base 11 and the first movable contact component 2 are respectively connected to the two side plates opposite to the testing platform 1. The first movable contact component 2 is connected above the base 11, so that the first movable contact component 2 can move closer to or away from the base 11 to contact or move away from the enameled wire 4 to be tested arranged in the base 11. The position of the enameled wire 4 to be tested that is contacted by the first movable contact component 2 is the test position of the enameled wire 4 to be tested.

[0039] In this embodiment, a groove 111 is also provided on the base 11. The groove 111 is used to place the enameled wire 4 to be tested. The groove 111 is the junction position between the enameled wire 4 to be tested and the coating. At least two second movable contact components 3 are provided on one side of the test table 1 where the base 11 is provided, so that the two second movable contact components 3 respectively clamp or move away from the enameled wire 4 to be tested placed in the groove 111. The position of the enameled wire 4 to be tested that is clamped and contacted by the two second movable contact components 3 is the test position of the enameled wire 4 to be tested.

[0040] Furthermore, the first moving contact component 2 includes a driving element 21 and a plurality of detection elements 23. The driving element 21 can drive the plurality of detection elements 23 to approach or move away from the enameled wire 4 to be tested, so that the detection elements 23 can abut against the test position of the enameled wire 4 to be tested or move away from the enameled wire 4 to be tested.

[0041] In this embodiment, there are 12 detection elements 23. The number of detection elements 23 is not limited and is set according to the number of test positions of the enameled wire 4 to be tested. In this embodiment, the detection element 23 is specifically a probe, and the driving element 21 is specifically a cylinder.

[0042] Furthermore, the first moving contact assembly 2 also includes a connecting plate 22. One end of the driving member 21 is connected to the testing table 1, and the other end is connected to the connecting plate 22. Multiple testing members 23 are connected at intervals on the connecting plate 22. The multiple testing members 23 correspond to the test positions on the enameled wire 4 to be tested. The driving member 21 can drive the connecting plate 22 to move the testing members 23 to abut or move away from the enameled wire 4 to be tested, so that the multiple testing members 23 can contact the test positions on the enameled wire 4 to be tested.

[0043] Furthermore, at least two second moving contact components 3 are arranged opposite to each other, and each second moving contact component 3 includes a first contouring member 31, a second contouring member 32 and a positioning member 33. The first contouring member 31 and the second contouring member 32 are arranged opposite to each other. The positioning member 33 is connected to the side of the second contouring member 32 away from the first contouring member 31. The positioning member 33 can drive the second contouring member 32 to move closer to or away from the first contouring member 31 so that the second contouring member 32 and the first contouring member 31 clamp or release the enameled wire 4 to be tested.

[0044] In this embodiment, two second movable contact components 3 are provided, and the two second movable contact components 3 are arranged opposite to each other. The position of the two second movable contact components 3 is not limited here, and is set according to the test position of the enameled wire 4 to be tested.

[0045] Specifically, the second movable contact assembly 3 includes a first contouring member 31 and a second contouring member 32, which are arranged opposite to each other, with the enameled wire 4 to be tested positioned between the first contouring member 31 and the second contouring member 32. A positioning member 33 is fixedly connected to the side of the second contouring member 32 away from the first contouring member 31. The positioning member 33 can drive the second contouring member 32 to move closer to or away from the first contouring member 31, so that when the second contouring member 32 moves closer to the first contouring member 31, the two can clamp and contact the enameled wire 4 to be tested, thereby contacting the test position of the enameled wire 4. Both the first contouring member 31 and the second contouring member 32 are made of aluminum alloy.

[0046] Furthermore, each of the first and second contouring parts 31 and 32 has a limiting groove adapted to the enameled wire 4 to be tested on its opposite side. The first contouring part 31 is connected to the groove 111, and the groove 111 is also provided with a slot adapted to the second contouring part 32, so that the positioning part 33 can drive the second contouring part 32 to approach or move away from the first contouring part 31.

[0047] In this embodiment, the first contouring member 31 and the second contouring member 32 are provided with a limiting groove on their opposite sides that is adapted to the enameled wire 4 to be tested. Since the test position of the enameled wire 4 to be tested is irregular in shape, the first contouring member 31 and the second contouring member 32, which are provided with multiple limiting grooves, are used so that they can match the test position of the enameled wire 4 to be tested.

[0048] Specifically, the first contouring member 31 is fixedly disposed in the groove 111, while the second contouring member 32 is fixedly connected to the positioning member 33, so that the positioning member 33 can drive the second contouring member 32 to approach or move away from the first contouring member 31, and when the second contouring member 32 approaches the first contouring member 31, the two can clamp and contact the test position of the enameled wire 4 to be tested, so that the enameled wire 4 to be tested can be tested.

[0049] Specifically, the groove 111 is also provided with a slot that matches the second contouring part 32, so that the positioning part 33 can drive the second contouring part 32 to approach or move away from the first contouring part 31.

[0050] Furthermore, the positioning member 33 includes a rotating member 331, a pushing member 332, and a connecting seat 333. The rotating member 331 and the pushing member 332 are connected to the connecting seat 333. One end of the pushing member 332 is connected to the rotating member 331, and the other end is connected to the second contouring member 32. The rotating member 331 can drive the pushing member 332 to move the second contouring member 32 closer to or away from the first contouring member 31.

[0051] In this embodiment, the positioning member 33 includes a rotating member 331, a pushing member 332, and a connecting seat 333. The rotating member 331 and the pushing member 332 are movably connected to the connecting seat 333. One end of the pushing member 332 is fixedly connected to the second contouring member 32, and the other end is connected to the rotating member 331. This allows the rotating member 331 to drive the pushing member 332 to move the second contouring member 32 closer to or away from the first contouring member 31, so that when the second contouring member 32 is close to the first contouring member 31, it can clamp and contact the test position of the enameled wire 4 to be tested.

[0052] Specifically, when the rotating member 331 is rotated away from the second profiler 32, the pushing member 332 will drive the second profiler 32 to move away from the first profiler 31, so that the first profiler 31 and the second profiler 32 move away from each other; when the rotating member 331 is rotated towards the second profiler 32, the pushing member 332 will drive the second profiler 32 to move towards the first profiler 31, so that the first profiler 31 and the second profiler 32 move closer together, thereby clamping the test position of the enameled wire 4 to be tested.

[0053] The testing platform 1 is also equipped with a heightening component 12, which is connected to a connecting seat 333. The heightening component 12 increases the height of the positioning component 33 so that the height of the positioning component 33 matches the height of the second contouring component 32, allowing the rotating component 331 to better drive the pushing component 332 to pull or push the second contouring component 32.

[0054] Furthermore, the rotating component 331 also includes a first rotating part 3311 and a second rotating part 3312. One end of the first rotating part 3311 is movably connected to the pusher 332, and the other end is rotatably connected to the second rotating part 3312. The end of the second rotating part 3312 near the first rotating part 3311 is also rotatably connected to the connecting seat 333. When the end of the second rotating part 3312 is moved away from the connecting seat 333, the second rotating part 3312 can be driven to work in conjunction with the first rotating part 3312, and the pusher 332 can be driven to pull or push the second contouring component 32 away from or near the first contouring component 31.

[0055] Furthermore, the diameter of the second rotating part 3312 gradually increases from the end near the first rotating part 3311 to the end away from the first rotating part 3311, thereby increasing the contact surface of the second rotating part 3312. This makes it easier for the user to pry the second rotating part 3312, which in turn can drive the pusher 332 to pull or push the second contouring part 32 away from or near the first contouring part 31.

[0056] Furthermore, the specific implementation steps of the withstand voltage test fixture for enameled wire in the embodiments of this application are as follows:

[0057] The enameled wire 4 to be tested is placed in the groove 111 in the base 11. The driving component 21 in the first moving contact component 2 drives multiple detection components 23 to contact the test position of the enameled wire 4 to be tested. The first moving contact component 2 is connected to 3 test wires.

[0058] Then, the positioning member 33 in the second moving contact component 3 pulls the second contour member 32, so that it gets closer to the first contour member 31, thereby clamping and contacting the test position of the enameled wire 4 to be tested. A test wire is connected at the position of the contour member.

[0059] After the enameled wire 4 to be tested is clamped and contacted by the positioning component 33, the test position of the enameled wire 4 to be tested is completed by the first moving contact component 2 and the second moving contact component 3. The test lines on the first moving contact component 2 and the second moving contact component 3 are connected to the tester. Then, by opening the handle valve on the test stand 1, the withstand voltage test of the enameled wire 4 to be tested can be carried out.

[0060] This invention provides a withstand voltage testing fixture for enameled wire, comprising: a testing platform; a first movable contact component connected to the testing platform, capable of moving closer to or away from the enameled wire to be tested, thereby contacting or moving away from the wire; and at least two second movable contact components disposed on the testing platform, capable of clamping or moving away from the wire to be tested, thereby fixing them against or away from the wire. Using the withstand voltage testing fixture provided by this invention, the first and second movable contact components make contact with all the required testing positions of the enameled wire, allowing for the commencement of the withstand voltage test. This fixture offers high versatility, high testing efficiency, and high safety.

[0061] It should be noted that the various embodiments in this utility model are described in a progressive manner, with each embodiment focusing on the differences from other embodiments. The same or similar parts between the various embodiments can be referred to each other.

[0062] It should also be noted that, in the present invention, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0063] The above description of the disclosed embodiments enables those skilled in the art to implement or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined in the present invention may be implemented in other embodiments without departing from the spirit or scope of the present invention. Therefore, the present invention is not to be limited to the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A withstand voltage testing fixture for enameled wire, characterized in that, include: Testing station; A first movable contact component is connected to the testing stage. The first movable contact component can move closer to or further away from the enameled wire to be tested, so as to come into contact with or move away from the enameled wire to be tested. At least two second movable contact components are disposed on the testing stage. The second movable contact components can move relative to the enameled wire to be tested, clamping or moving away from it to fix them against or away from the enameled wire to be tested.

2. The withstand voltage test fixture for enameled wire according to claim 1, characterized in that, The testing station is connected to a base on one side, and the first movable contact component is connected to the side opposite the base. A groove for placing the enameled wire to be tested is provided on the base. At least two second movable contact components are connected to the side of the testing station where the base is located, so as to clamp or move away from the enameled wire to be tested in the groove.

3. The withstand voltage test fixture for enameled wire according to claim 1, characterized in that, The first movable contact component includes a driving element and a plurality of detection elements. The driving element can drive the detection elements to approach or move away from the enameled wire under test, so that the detection elements abut or move away from the enameled wire under test.

4. The withstand voltage test fixture for enameled wire according to claim 3, characterized in that, The first movable contact assembly further includes a connecting plate. One end of the driving member is connected to the detection stage, and the other end is connected to the connecting plate. A plurality of detection members are connected at intervals on the connecting plate. The driving member can drive the connecting plate to move the detection members to abut or move away from the enameled wire to be tested.

5. The withstand voltage test fixture for enameled wire according to claim 2, characterized in that, At least two second moving contact components are arranged opposite to each other, and each second moving contact component includes a first profiler, a second profiler, and a positioning member. The first profiler and the second profiler are arranged opposite to each other, and the positioning member is connected to the side of the second profiler away from the first profiler. The positioning member can drive the second profiler to move closer to or away from the first profiler, so that the second profiler and the first profiler clamp or release the enameled wire to be tested.

6. The withstand voltage test fixture for enameled wire according to claim 5, characterized in that, Both the first and second profilers have a limiting groove on their opposite sides that is adapted to the enameled wire to be tested. The first profiler is connected to the groove, and the groove is also provided with a slot adapted to the second profiler, so that the positioning member can drive the second profiler to move closer to or away from the first profiler.

7. The withstand voltage test fixture for enameled wire according to claim 5, characterized in that, The positioning component includes a rotating component, a pushing component, and a connecting seat. The rotating component and the pushing component are connected to the connecting seat. One end of the pushing component is connected to the rotating component, and the other end is connected to the second contouring component. The rotating component can drive the pushing component to move the second contouring component closer to or away from the first contouring component.

8. The withstand voltage test fixture for enameled wire according to claim 7, characterized in that, The rotating component further includes a first rotating part and a second rotating part. One end of the first rotating part is connected to the pusher, and the other end is rotatably connected to the second rotating part. The end of the second rotating part near the first rotating part is also rotatably connected to the connecting seat.

9. The withstand voltage test fixture for enameled wire according to claim 8, characterized in that, The diameter of the second rotating part gradually increases from the end closest to the first rotating part to the end furthest from the first rotating part.

10. The withstand voltage test fixture for enameled wire according to claim 7, characterized in that, The testing platform is also equipped with a heightening component, and the connecting seat is connected to the heightening component.

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