Power amplifier support test fixture

Abstract

The utility model relates to the technical field of test fixtures, and provides a power amplifier support test fixture, which comprises a substrate, a first probe, a probe frame, a second probe and a detection head, the surface of the substrate is provided with a strain gauge, the strain gauge is used for detecting the acting force at the joint of the power amplifier support and the substrate when the power amplifier support is placed on the substrate, and the first probe is telescopically installed on the substrate; the probe frame is mounted on the substrate in a lifting manner, and the second probe is fixed on the probe frame; the detection head is movably installed on the substrate, the detection head is provided with a first groove, and the first groove is used for being matched with a stud on the power amplifier support. According to the power amplifier support test fixture, the flatness of the power amplifier support and the position degrees of the vehicle body mounting holes, the wire harness holes and the studs can be detected, so that the power amplifier support test fixture has multiple purposes, and the application range is widened.

Description

Technical Field

[0001] This utility model relates to the field of testing fixture technology, and in particular to a power amplifier bracket testing fixture. Background Technology

[0002] The amplifier is an audio power amplifier. The main body of the amplifier is mounted on the vehicle body via an amplifier bracket, providing users with a comprehensive sound experience and offering intelligent luxury in-vehicle audio systems for both domestic and joint-venture models. In the development process of the amplifier bracket, its design and testing are crucial. The test fixture must not only ensure operability and practicality, but more importantly, it must be able to perform tests on critical dimensions, such as flatness, the position of mounting points and wiring harness holes on the vehicle body, and the position of studs on surrounding components. Existing amplifier bracket test fixtures can only test one critical dimension, resulting in a relatively limited functionality. Utility Model Content

[0003] This utility model provides a power amplifier bracket test fixture to solve the problem of the single function of existing power amplifier bracket test fixtures.

[0004] This utility model provides a power amplifier bracket testing fixture, comprising: a plate, a first probe, a probe holder, a second probe, and a detection head; strain gauges are mounted on the surface of the plate, and the strain gauges are used to detect the force at the contact point between the power amplifier bracket and the plate when the power amplifier bracket is placed on the plate; the first probe is telescopically mounted on the plate; the probe holder is vertically mounted on the plate, and the second probe is fixed to the probe holder; the detection head is movably mounted on the plate, and the detection head has a first groove for fitting with a stud on the power amplifier bracket.

[0005] According to the present invention, a power amplifier bracket test fixture further includes a first elastic element. The substrate has a mounting groove, the first elastic element is accommodated in the mounting groove, one end of the first elastic element is connected to the bottom of the mounting groove, and the other end is connected to the first probe. The strain gauge covers the opening of the mounting groove and has a through hole corresponding to the first probe.

[0006] According to the present invention, a power amplifier bracket test fixture is provided, wherein the slot of the mounting groove is provided with a touch switch and an indicator light connected in series with the touch switch, and the touch switch is used to conduct when the first probe is inserted into the mounting hole of the power amplifier bracket.

[0007] According to the present invention, a power amplifier bracket test fixture is provided, wherein there is one indicator light and multiple touch switches are connected in series.

[0008] According to the present invention, a power amplifier bracket test fixture further includes a guide rod and a second elastic element. The guide rod is fixed to the base plate, the probe holder is slidably sleeved on the guide rod, and the second elastic element is disposed between the base plate and the probe holder.

[0009] According to the present invention, a power amplifier bracket test fixture is provided, wherein the guide rod has a limiting protrusion, the second elastic element is sleeved on the guide rod, and the end of the second elastic element away from the probe holder abuts against the limiting protrusion.

[0010] According to the present invention, a power amplifier bracket test fixture is provided, wherein the top of the guide rod has a locking cap.

[0011] According to the present invention, a power amplifier bracket testing fixture is provided, wherein the detection head is rotatably mounted on the base plate so that the detection head can move between a detection position and a clearance position. When the detection head is rotated to the clearance position, the detection head can clear the power amplifier bracket. When the detection head is rotated to the detection position, the first groove can detect the position of the stud.

[0012] According to the present invention, a power amplifier bracket test fixture further includes a fixed base, a movable base, and a linkage mechanism. The fixed base is fixed to the base plate, the movable base is elliptical and rotatable on the base plate, and the linkage mechanism is hinged to the fixed base, the detection head, and the movable base respectively, so that the detection head moves between the detection position and the avoidance position during the lifting and lowering process of the movable base.

[0013] According to the present invention, a power amplifier bracket test fixture further includes at least three leveling components, each of which includes a base and a pin, the pin being threadedly connected to the base; the substrate is placed on the pin, wherein one of the pins contacts the surface of the substrate, and the other pins make point contact with the substrate.

[0014] The power amplifier bracket test fixture provided by this utility model can detect the flatness, mounting holes, wire harness holes and stud position of the power amplifier bracket, making the power amplifier bracket test fixture have multiple uses and expanding its applicability. Attached Figure Description

[0015] To more clearly illustrate the technical solutions in this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this utility model. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0016] Figure 1 This is a structural diagram of the power amplifier bracket.

[0017] Figure 2 This is a combination diagram of the power amplifier bracket test fixture and the power amplifier bracket provided by this utility model.

[0018] Figure 3 This is an exploded view of the power amplifier bracket test fixture provided by this utility model.

[0019] Figure 4 This is a schematic diagram of the power amplifier bracket test fixture provided in this embodiment of the utility model.

[0020] Figure 5 This is one of the cross-sectional views of the power amplifier bracket test fixture provided in this embodiment of the utility model.

[0021] Figure 6 yes Figure 5 The enlarged view of point A shown in the image.

[0022] Figure 7 This is the second cross-sectional view of the power amplifier bracket test fixture provided in this embodiment of the utility model.

[0023] Figure 8 yes Figure 3 The diagram shows the structure of the probe holder.

[0024] Figure 9 yes Figure 3 The diagram shows the structure of the detection head and leveling components.

[0025] Figure label:

[0026] 1. Amplifier bracket; 2. Base plate; 6. Leveling components;

[0027] 11. Mounting hole; 12. Wiring harness hole; 13. Stud; 21. Mounting groove; 31. Cover; 32. First elastic element; 33. Probe block; 34. Touch switch; 35. Strain gauge; 41. Guide rod; 42. Second elastic element; 43. Probe holder; 44. Locking cap; 51. Fixed base; 52. Moving base; 53. First connecting rod; 54. Second connecting rod; 55. Third connecting rod; 56. Detection head; 61. First leveling component; 62. Second leveling component;

[0028] 311, Second groove; 312, Through hole; 331, First probe; 411, Limiting protrusion; 431, Connecting seat; 432, Support rod; 433, Second probe; 621, Seat body; 622, Ejector pin. Detailed Implementation

[0029] To make the objectives, technical solutions, and advantages of this utility model clearer, the technical solutions of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this utility model, not all embodiments. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this utility model.

[0030] The following is combined Figures 1-9 This invention describes the power amplifier bracket test fixture.

[0031] like Figure 1 , Figure 2 and Figure 3 As shown, this utility model embodiment provides a power amplifier bracket test fixture, including: a base plate 2, a first probe 331, a probe holder 43, a second probe 433, and a test head 56.

[0032] A strain gauge 35 is mounted on the surface of substrate 2. The strain gauge 35 is used to detect the force between the power amplifier bracket 1 and substrate 2 when the power amplifier bracket 1 is placed on substrate 2 to determine the flatness of the power amplifier bracket 1. A first probe 331 is telescopically mounted on substrate 2. The first probe 331 is used to detect the position of the mounting hole 11 on the power amplifier bracket 1 when it is placed on substrate 2. A probe holder 43 is vertically mounted on substrate 2. A second probe 433 is fixed to probe holder 43. The second probe 433 is used to detect the position of the wire harness hole 12 on the power amplifier bracket 1 as probe holder 43 descends when the power amplifier bracket 1 is placed on substrate 2. A detection head 56 is movably mounted on substrate 2. The detection head 56 has a first groove. The first groove is used to detect the position of the peripheral stud 13 on the power amplifier bracket 1 when the detection head 56 moves relative to substrate 2 to the detection position.

[0033] Specifically, such as Figure 1As shown, the power amplifier bracket 1 is used for mounting on the vehicle body. The power amplifier bracket 1 is provided with mounting holes 11, wiring harness holes 12, and studs 13. When the power amplifier bracket 1 is placed on the substrate 2, the flatness of the power amplifier bracket 1 can be determined based on the force between the power amplifier bracket 1 and the substrate 2 detected by the strain gauge 35. If the first probe 331 can pass through the mounting hole 11, it indicates that the position of the mounting hole 11 is accurate. When the probe holder 43 is pressed down, if the second probe 433 can pass through the wiring harness hole 12, it indicates that the position of the wiring harness hole 12 is accurate. When the detection head 56 is moved, if the first groove on the detection head 56 can engage with the stud 13, it indicates that the position of the stud 13 is accurate. In this embodiment, the first probe 331 is telescopically mounted on the substrate 2. When the position of the mounting hole 11 is inaccurate, the power amplifier bracket 1 presses the first probe 331 into the substrate 2, and the strain gauge 35, the second probe 433, and the detection head 56 can continue to detect without affecting the detection process.

[0034] In this embodiment, there are three mounting holes 11, and correspondingly, three first probes 331 are provided on the substrate 2. Similarly, there are three wire harness holes 12, and correspondingly, there are three second probes 433. The number of first probes 331 and second probes 433 is set according to the number of mounting holes 11 and wire harness holes 12 on the power amplifier bracket 1.

[0035] Strain gauges 35 are at least positioned at the contact point between the power amplifier bracket 1 and the substrate 2, i.e., the location where the flatness of the power amplifier bracket 1 needs to be tested. For example, strain gauges 35 may cover the entire surface of the substrate 2. Alternatively, strain gauges 35 may be positioned only in a specific area on the substrate 2, which coincides with the area of ​​the power amplifier bracket 1 where the flatness needs to be tested. Using strain gauges 35 to test flatness is a simple and accurate method, avoiding the need for conventional feeler gauges.

[0036] The power amplifier bracket test fixture provided in this embodiment can detect the flatness, mounting holes, wire harness holes, and stud position of the power amplifier bracket, giving the power amplifier bracket test fixture multiple uses and expanding its application range.

[0037] like Figure 5 and Figure 6As shown, the power amplifier bracket test fixture also includes a first elastic element 32. The substrate 2 has a mounting groove 21, and the first elastic element 32 is housed within the mounting groove 21. One end of the first elastic element 32 is connected to the bottom of the mounting groove 21, and the other end of the first elastic element 32 is connected to a first probe 331. A strain gauge 35 covers the opening of the mounting groove 21 and has a through hole corresponding to the first probe 331. When the power amplifier bracket 1 is placed on the substrate 2, if the mounting hole 11 is aligned correctly, the first probe 331 passes through the through hole on the strain gauge 35 and inserts into the mounting hole 11; if the mounting hole 11 is not aligned correctly, the first elastic element 32 contracts under pressure, and the first probe 331 retracts into the mounting groove 21.

[0038] Furthermore, the power amplifier bracket test fixture also includes a cover 31 and a probe block 33. The cover 31 has a second groove 311 and a through hole 312. The through hole 312 is located at the bottom of the second groove 311 and communicates with the second groove 311 to form a stepped hole penetrating the cover 31. The through hole 312 is positioned opposite to the through hole on the strain gauge 35. The cover 31 is fixed to the base plate 2, so that the second groove 311, the through hole 312 and the mounting groove 21 communicate to form a receiving cavity with an outlet. The first elastic member 32, the probe block 33 and the first probe 331 are connected in sequence. The first elastic member 32 and the probe block 33 are disposed in the receiving cavity, and the first probe 331 passes through the through hole 312 and the through hole. Under the action of the first elastic member 32, the first probe 311 can extend and retract along the axial direction of the through hole 312 and the through hole.

[0039] When the amplifier bracket 1 is not in contact with the cover 31, the first probe 331 extends outward from the receiving cavity under the action of the first elastic member 32. When the amplifier bracket 1 is in contact with the cover 31, if the mounting hole 11 is in the correct position, the first probe 331 is smoothly inserted into the mounting hole 11; if the mounting hole 11 is not in the correct position, the amplifier bracket 1 presses down on the first probe 331, causing the first elastic member 32 to contract under pressure, and driving the first probe 331 to move into the mounting groove 21.

[0040] like Figure 6 As shown in the embodiment of this utility model, the groove opening of the mounting slot 21 is provided with a touch switch 34 and an indicator light connected in series with the touch switch 34. The touch switch 34 is used to conduct when the first probe 331 is inserted into the mounting hole 11 of the power amplifier bracket 1. Thus, according to the indication of the indicator light, it is possible to determine whether the position of the mounting hole 11 is accurate, without having to check whether the first probe 331 is inserted into the mounting hole 11 one by one.

[0041] Optionally, the touch switch 34 is disposed at the bottom of the second groove 311. When the power amplifier bracket 1 is not placed on the substrate 2, the probe block 33 abuts against the touch switch 34, causing the indicator light to illuminate. When the power amplifier bracket 1 is placed on the substrate 2, if the mounting hole 11 is aligned correctly, the indicator light remains illuminated; if the mounting hole 11 is not aligned correctly, under the pressing action of the power amplifier bracket 1, the first elastic element 32 drives the first probe 331 to move into the mounting groove 21, causing the probe block 33 to separate from the touch switch 34, and the indicator light to turn off. The operator can determine that the mounting hole 11 is not aligned correctly based on the indicator light turning off.

[0042] In one embodiment, each mounting hole 11 is provided with a touch switch 34 and an indicator light connected to it. For example, if there are three mounting holes 11, the corresponding power amplifier bracket test fixture has three touch switches 34 and three indicator lights. The touch switches 34 and indicator lights are set together, and each mounting hole 11 is provided with one set of touch switches 34 and indicator lights. When all indicator lights are lit, the hole positions of all mounting holes 11 are accurate. When one indicator light is not lit, the mounting hole position corresponding to that indicator light is inaccurate.

[0043] In another embodiment, there are multiple mounting holes 11 and multiple touch switches 34. These multiple touch switches 34 are connected in series and electrically connected to the same indicator light, reducing the number of indicator lights. The indicator light illuminates only when all multiple touch switches 34 are in the triggered state. If all mounting holes 11 are in the correct position, all multiple touch switches 34 are triggered. If one mounting hole 11 is in the incorrect position, the indicator light is off. In use, if the indicator light is on after the power amplifier bracket 1 is placed on the substrate 2, it can be determined that the position of each mounting hole 11 is correct; if the indicator light is off after the power amplifier bracket 1 is placed on the substrate 2, it can be determined that the position of each mounting hole 11 is incorrect.

[0044] In one embodiment, the probe holder 43 is mounted on a lifting cylinder or a linear motor, and the lifting cylinder or linear motor drives the probe holder 43 to automatically rise and fall. In another embodiment, such as Figure 4 and Figure 7 As shown, the power amplifier bracket test fixture also includes a guide rod 41 and a second elastic element 42. The guide rod 41 is fixed to the substrate 2, and the probe holder 43 is slidably sleeved on the outside of the guide rod 41. The second elastic element 42 is disposed between the substrate 2 and the probe holder 43.

[0045] Specifically, when detecting the position of the wire harness hole 12, the probe holder 43 is pressed down, causing the second probe 433 to move downwards. If the second probe 433 can be inserted into the wire harness hole 12, it indicates that the position of the wire harness hole 12 is accurate. In this embodiment, the second elastic element 42 is used to drive the probe holder 43 to reset when there is no external force. The second elastic element 42 can be sleeved on the outside of the guide rod 41, or it can be disposed on both sides or around the guide rod 41, as long as it can drive the probe holder 43 to reset.

[0046] Among them, the guide rod 41 is an irregularly shaped rod, and the probe holder 43 has an irregularly shaped hole and is sleeved on the guide rod 41, so that the probe holder 43 can only move up and down along the guide rod 41 and will not rotate.

[0047] In one embodiment, the two ends of the second elastic member 42 are directly connected to or directly abut against the substrate 2 and the probe holder 43, respectively. In another embodiment, the second elastic member 42 is indirectly mounted on the substrate 2 and the probe holder 43, as long as the distance between the probe holder 43 and the substrate 2 can be adjusted. For example, one end of the guide rod 41 is provided with a limiting protrusion 411, and the second elastic member 42 is sleeved on the outside of the guide rod 41. The end of the second elastic member 42 away from the probe holder 43 abuts against the limiting protrusion 411.

[0048] A locking cap 44 is provided at the top of the guide rod 41. The locking cap 44 is used to prevent the probe holder 43 from sliding out of the guide rod 41 and disengaging from the guide rod 41 when the probe holder 43 is reset. Optionally, the locking cap 44 and the guide rod 41 are integrally formed. Alternatively, the end of the guide rod 41 is threaded, and the locking cap 44 is a nut that is fastened to the end of the guide rod 41.

[0049] like Figure 8 As shown, in an embodiment of this utility model, the probe holder 43 includes a connecting seat 431 and multiple support rods 432. The connecting seat 431 is an annular component, sleeved on the outside of the guide rod 41, and can move up and down along the guide rod 41. The support rods 432 are strip-shaped components, with one end of each support rod 432 connected to the connecting seat 431 and at least one second probe 433 mounted on the other end. The total number of second probes 433 is the same as the number of wire harness holes 12. When the power amplifier bracket 1 is placed on the substrate 2, if the positions of multiple wire harness holes 12 are exactly opposite to the positions of multiple second probes 433, then when the support rod 432 is pressed, each second probe 433 is inserted into a wire harness hole 12. If some wire harness holes 12 are close together, multiple second probes 433 can be mounted on one support rod 432 to reduce the number of support rods 432 and simplify the structure of the probe holder 43. For example, as Figure 1 As shown, there are three wire harness holes 12, and correspondingly, three second probes 433 are provided. (As...) Figure 3 and Figure 4As shown, the probe holder 43 includes a connecting seat 431 and two support rods 432 disposed on the connecting seat 431. The connecting seat 431 is sleeved on the guide rod 41. A second probe 433 is installed on one of the support rods 432, and the other support rod 432 is provided with two branches, each of which is equipped with a second probe 433.

[0050] In one embodiment, the detection head 56 is horizontally movably mounted on the substrate 2. When the power amplifier bracket 1 is placed on the substrate 2, the detection head 56 approaches the power amplifier bracket 1 to detect the position of the surrounding studs. Before placing the power amplifier bracket 1, the detection head 56 is moved away from the placement area of ​​the power amplifier bracket 1 to avoid affecting the lowering of the power amplifier bracket 1. In another embodiment, as... Figure 4 As shown, the detection head 56 is rotatably mounted on the substrate 2, allowing it to move between a detection position and a clearance position. Before the power amplifier bracket 1 is placed on the substrate 2, the detection head 56 rotates to the clearance position to avoid interfering with the installation of the power amplifier bracket 1. After the power amplifier bracket 1 is placed on the substrate 2, the detection head 56 rotates to the detection position. If the first groove can engage with the stud 13, it indicates that the stud 13 is positioned accurately.

[0051] like Figure 9 As shown, the power amplifier bracket test fixture also includes a fixed base 51, a movable base 52, and a linkage mechanism. The fixed base 51 is disposed on the base plate 2 and is connected to the test head 56 via the linkage mechanism. The movable base 52 is hinged to the linkage mechanism. When the movable base 52 moves, it can drive the first groove of the test head 56 to engage with the stud 13.

[0052] Specifically, the movable base 52 can be connected to a pneumatic push rod or an electric motor, and can move up and down under the action of the pneumatic push rod or the electric motor. When the movable base 52 moves downward, it can drive the detection head 56 to rotate away from the stud 13; when the movable base 52 moves upward, it can drive the detection head 56 to move closer to the stud 13.

[0053] Before placing the power amplifier bracket 1 on the substrate 2, move the movable seat 52 downwards to move the detection head 56 away from the stud 13, making room for the installation of the power amplifier bracket 1. After placing the power amplifier bracket 1 on the substrate 2, move the movable seat 52 upwards to move the detection head 56 closer to the stud 13. If the stud 13 engages in the first groove, the position of the stud 13 is correct. If the stud 13 cannot engage in the first groove, the position of the stud 13 is incorrect. This allows for the detection of the position of the stud 13.

[0054] Furthermore, the linkage mechanism includes a first link 53, a second link 54, and a third link 55. The first link 53 and the second link 54 are arranged in parallel. The two ends of the first link 53 are hinged to the fixed base 51 and the detection head 56, respectively. The two ends of the second link 54 are hinged to the movable base 52 and the detection head 56, respectively. The two ends of the third link 55 are hinged to the first link 53 and the second link 54, respectively.

[0055] In this embodiment, the first link 53, the second link 54, the third link 55 and the detection head 56 are configured as a four-bar linkage so that the detection head 56 can be driven to move when the moving seat 52 moves.

[0056] like Figure 5 and Figure 9 As shown, the power amplifier bracket test fixture provided in this embodiment of the present invention also includes at least three leveling components 6. Each leveling component 6 includes a base 621 and a pin 622, with the pin 622 threadedly connected to the base 621. The tip of one of the pins 622 contacts the surface of the substrate 2, while the tips of the remaining pins 622 make point contact with the substrate 2.

[0057] Specifically, by rotating the ejector pin 622 and adjusting the screw connection position between the base 621 and the ejector pin 622, the height of the leveling component 6 can be finely adjusted. The substrate 2 is disposed on multiple leveling components 6, and by adjusting the leveling components 6, the substrate 2 can be made horizontal.

[0058] The leveling component 6 includes a first leveling component 61 and a second leveling component 62, with the first leveling component 61 and at least two second leveling components 62 arranged alternately. The top of the first leveling component 61 is flat, and the end face contacting the substrate 2 is planar. The top of the pin 622 in the second leveling component 62 is a pointed or curved surface, and the end face contacting the substrate 2 is a point contact. When the substrate 2 is placed on the first leveling component 61 and the second leveling component 62, the second leveling component 62 is adjusted with the first leveling component 61 as a reference to ensure the substrate 2 is level, thus enabling the detection of the flatness of the substrate 2.

[0059] Specifically, the first leveling component 61 and the second leveling component 62 are placed on the calibrated marble tabletop, with the two second leveling components 62 positioned on the left sides and the first leveling component 61 positioned in the middle on the right side. The substrate 2 is placed on the first leveling component 61 and the second leveling component 62. The pin 622 of the second leveling component 62 located in the upper left corner is measured and adjusted using a micrometer to ensure that the height of the second leveling component 62 is the same as the base point at the lower right corner of the substrate 2. Similarly, the pin 622 of the second leveling component 62 located in the lower left corner is measured and adjusted to ensure that the height of the second leveling component 62 is the same as the base point at the upper right corner of the substrate 2. At this point, the substrate 2 is leveled using the leveling components 61. Since the marble tabletop has been calibrated, the adjusted substrate 2 has good levelness. After placing the amplifier bracket 1 on the substrate 2, the flatness of each point on the amplifier bracket 1 can be determined based on the data collected by the strain gauge 35. The better the flatness of the power amplifier bracket 1 and the better the contact with the substrate 2, the smaller the value of the strain gauge 35. Based on this, the flatness of the power amplifier bracket 1 can be detected.

[0060] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this utility model, and not to limit it. Although this utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this utility model.

Claims

1. A power amplifier bracket test fixture, characterized in that, include: Substrate, first probe, probe holder, second probe, and detection head; Strain gauges are mounted on the surface of the substrate. The strain gauges are used to detect the force at the contact point between the power amplifier bracket and the substrate when the power amplifier bracket is placed on the substrate. The first probe is retractably mounted on the substrate; The probe holder can be lifted and lowered on the substrate, and the second probe is fixed to the probe holder; The detection head is movably mounted on the substrate, and the detection head has a first groove for fitting with a stud on the power amplifier bracket.

2. The power amplifier bracket test fixture according to claim 1, characterized in that, It also includes a first elastic element. The substrate has a mounting groove. The first elastic element is housed in the mounting groove. One end of the first elastic element is connected to the bottom of the mounting groove, and the other end is connected to the first probe. The strain gauge covers the opening of the mounting groove and has a through hole corresponding to the first probe.

3. The power amplifier bracket test fixture according to claim 2, characterized in that, The mounting slot is equipped with a touch switch and an indicator light connected in series with the touch switch. The touch switch is used to turn on when the first probe is inserted into the mounting hole of the power amplifier bracket.

4. The power amplifier bracket test fixture according to claim 3, characterized in that, There is one indicator light, and multiple touch switches are connected in series.

5. The power amplifier bracket test fixture according to claim 1, characterized in that, It also includes a guide rod and a second elastic element. The guide rod is fixed to the substrate, the probe holder is slidably sleeved on the guide rod, and the second elastic element is disposed between the substrate and the probe holder.

6. The power amplifier bracket test fixture according to claim 5, characterized in that, The guide rod has a limiting protrusion, and the second elastic element is sleeved on the guide rod. The end of the second elastic element away from the probe holder abuts against the limiting protrusion.

7. The power amplifier bracket test fixture according to claim 5, characterized in that, The top of the guide rod has a locking cap.

8. The power amplifier bracket test fixture according to claim 1, characterized in that, The detection head is rotatably mounted on the substrate so that the detection head can move between a detection position and a avoidance position. When the detection head is rotated to the avoidance position, the detection head can avoid the power amplifier bracket. When the detection head is rotated to the detection position, the first groove can detect the position of the stud.

9. The power amplifier bracket test fixture according to claim 8, characterized in that, It also includes a fixed base, a movable base, and a linkage mechanism. The fixed base is fixed to the base plate, the movable base is elliptical and rotatable on the base plate, and the linkage mechanism is hinged to the fixed base, the detection head, and the movable base respectively, so that the movable base drives the detection head to move between the detection position and the avoidance position during the lifting and lowering process.

10. The power amplifier bracket test fixture according to claim 1, characterized in that, It also includes at least three leveling components, each of which includes: a base and a pin, the pin being threadedly connected to the base; The substrate is placed on the ejector pin, wherein one of the ejector pins is in contact with the surface of the substrate, and the other ejector pins are in point contact with the substrate.

Images