High and low temperature detection device for electronic component

By setting a partition in the test chamber to separate the high-temperature and low-temperature detection chambers, and by using pre-cooling components and conveying components to achieve rapid temperature conversion of electronic components, the problem of low detection efficiency in the prior art is solved, the detection efficiency is improved and energy consumption is reduced.

CN223565801UActive Publication Date: 2025-11-18CHANGZHOU GUANGHE KERUI DETECTION TECHNOLOGY CO LTD
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Patent Information

Application Number
CN202422606502.0
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-10-28
Publication Date
2025-11-18
Estimated Expiration
2034-10-28

AI Technical Summary

Technical Problem

Existing integrated circuit chip performance testing equipment requires waiting for heat to dissipate before performing low-temperature testing after high-temperature testing, which prolongs the operation process, increases energy consumption, and reduces testing efficiency.

Method used

The test chamber is divided into a high-temperature test chamber and a low-temperature test chamber by a partition, and a pre-cooling component is set up. The electronic components are pre-cooled by a servo motor-driven fan and circulating condensate. The components are moved from the high-temperature chamber to the low-temperature chamber for testing by a conveyor component.

Benefits of technology

It achieves efficient high and low temperature detection, reduces waiting time, improves detection efficiency, and reduces energy consumption.

✦ Generated by Eureka AI based on patent content.

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    Figure CN223565801U_ABST
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Abstract

The utility model discloses an electronic component high and low temperature detection device, which relates to the technical field of electronic component detection devices and comprises a test box, a partition plate is fixedly mounted at the center of the vertical axis of the test box and divides the test box into a high temperature detection chamber and a low temperature detection chamber, and a pre-cooling assembly is further arranged in the test box. The pre-cooling assembly is arranged between the high-temperature detection chamber and the low-temperature detection chamber; comprising a servo motor, and a first mounting groove is formed in the side, opposite to the partition plate, of the test box; according to the utility model, high-temperature detection and low-temperature detection are separated by arranging the partition plate, the servo motor is driven to start the fan to rotate, and condensate water circularly flows in the water pipe, so that the electronic component is pre-cooled when being moved from the high-temperature detection chamber to the low-temperature detection chamber, and the temperature of the electronic component is conveniently reduced; detection is carried out after moving to the low-temperature detection chamber, and the detection efficiency is improved.
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Description

TECHNICAL FIELD

[0001] The utility model relates to electronic component detection device technical field, concretely is a kind of electronic component high-low temperature detection device. BACKGROUND

[0002] Electronic component is the basic element in electronic circuit, usually individual package, and has two or more than two lead or metal contact point. Electronic component must be connected to each other to constitute an electronic circuit with specific function, for example: amplifier, radio receiver, oscillator etc., one of the common ways of connecting electronic component is welded to printed circuit board. Electronic component can be individual package (resistor, capacitor, inductor, transistor, diode etc.), or group of various different complexity, for example: integrated circuit (operational amplifier, resistors, logic gate etc.).

[0003] The existing Chinese patent (announcement number CN221528819U) discloses a kind of integrated circuit chip performance testing device, by setting bearing assembly, temperature monitor, display controller, heating component and cold lead component, when the temperature performance of heat resistance and cold resistance of integrated circuit chip is detected, user opens the sealed door at the front side of test box, then pulls out the bearing assembly arranged in the inside of test box, then the integrated circuit chip needed to be detected is placed in the positive center of the top inside of bearing assembly, then bearing assembly is pushed back and sealed door is closed.

[0004] But the above-mentioned design of a kind of integrated circuit chip performance testing device still has some shortcomings in actual use: the integrated circuit chip performance testing device in use, after high-temperature test, when low-temperature test is carried out, heating component is closed, needs to start fan and expel heat, after test box temperature restores normal, integrated circuit chip temperature reduces, can start refrigeration component and carry out low-temperature test, operation process is lengthened, and energy consumption is more, lead to test efficiency is lower. UTILITY MODEL CONTENT

[0005] The utility model aims at providing a kind of electronic component high-low temperature detection device, to solve the problems raised in the above background.

[0006] To solve the above technical problems, the utility model provides and includes test box, the vertical axis center of the test box is fixedly installed with partition, and the test box is divided into high-temperature detection room and low-temperature detection room, precooling component is also provided in the test box, and the precooling component is arranged between high-temperature detection room and low-temperature detection room;

[0007] Including servo motor, the test box is opened with first installation groove on the side opposite to the partition, the first installation groove is fixedly installed with mounting plate, the servo motor is fixedly installed on the side away from the partition of mounting plate, the drive end of servo motor is fixedly connected with fan, the outside one side of first installation groove is fixedly installed with water pipe, one end of water pipe is fixedly connected with water tank, the side of water tank is fixedly connected with water pump, the other end of water pump is fixedly connected with water pipe,

[0008] The test box is provided with a conveying assembly for conveying electronic components from the high-temperature detection chamber to the low-temperature detection chamber.

[0009] Further, the conveying assembly includes a screw rod, the bottom of the test box is provided with an installation cavity, the screw rod is rotatably connected in the installation cavity, the bottom of the test box is fixedly provided with a drive motor, the drive end of the drive motor is fixedly connected with the screw rod, and the top of the screw rod is movably connected with a test table.

[0010] Further, the side of the partition is slidably connected with a push plate, the bottom of the test box is provided with a second installation groove, the second installation groove is fixedly provided with an electric push rod, and the drive end of the electric push rod is fixedly connected with the bottom of the push plate.

[0011] Further, the top of the push plate is fixedly provided with a fixed plate, the bottom of the fixed plate is fixedly provided with a push switch, and the push plate is matched and abutted with the push switch.

[0012] Further, the screw rod is threadedly connected with a sliding block, the top of the sliding block is fixedly connected with the test table, and the test table is slidably connected with the test box through the sliding block.

[0013] Further, the number of the push plates is two, and the two push plates are arranged on the two sides of the first installation groove.

[0014] Further, the test box is provided with a heating assembly and a refrigeration assembly, and the heating assembly and the refrigeration assembly are respectively arranged in the high-temperature detection chamber and the low-temperature detection chamber on the two sides of the partition.

[0015] Further, the number of the first installation grooves is two, the two first installation grooves are oppositely arranged on the two sides of the partition, and the side, close to the water pipe, of the first installation groove is provided with a filter screen.

[0016] Compared with the prior art, the test box has the advantages that: the high-temperature detection and the low-temperature detection are separated by the partition, the servo motor is driven to start the fan to rotate, and the condensed water is arranged to circulate in the water pipe, so that the electronic components are pre-cooled when moving from the high-temperature detection chamber to the low-temperature detection chamber, the temperature of the electronic components is reduced, the electronic components are detected after moving to the low-temperature detection chamber, and the detection efficiency is improved.BRIEF DESCRIPTION OF DRAWINGS BRIEF DESCRIPTION OF DRAWINGS

[0017] Figure 1 It is the schematic diagram of the three-dimensional structure of the inside of the utility model;

[0018] Figure 2 It is the schematic diagram of the three-dimensional structure of the inside of the utility model;

[0019] Figure 3 It is the schematic diagram of the three-dimensional structure of the inside of the utility model;

[0020] Figure 4 It is the schematic diagram of the three-dimensional structure of the inside of the utility model;

[0021] Figure 5 It is the schematic diagram of the three-dimensional structure of the inside of the utility model Figure 4 It is the schematic diagram of the three-dimensional structure of the inside of the utility model

[0022] In the drawing: 1, test box; 2, drive motor; 3, partition; 4, push plate; 5, electric push rod; 6, test table; 7, screw rod; 8, sliding block; 9, fixed plate; 10, press switch; 11, first installation slot; 12, installation plate; 13, servo motor; 14, fan; 15, water tank; 16, water pump; 17, water pipe. DETAILED DESCRIPTION

[0023] The technical solutions in the embodiments of the utility model will be clearly and completely described below with reference to the drawings in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, rather than all the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by those skilled in the art without creative labor fall within the scope of protection of the utility model.

[0024] Please refer to Figures 1-5 The utility model provides a technical scheme: including test box 1, the vertical axis center of test box 1 is fixedly installed with partition 3, and test box 1 is divided into high temperature detection room and low temperature detection room, and test box 1 is also provided with precooling assembly, and the precooling assembly is arranged between high temperature detection room and low temperature detection room;

[0025] Including servo motor 13, the side opposite to test box 1 and partition 3 is provided with first installation slot 11, and installation plate 12 is fixedly installed in first installation slot 11, and servo motor 13 is fixedly installed on the side of installation plate 12 away from partition 3, and the drive end of servo motor 13 is fixedly connected with fan 14, and the outside one side of first installation slot 11 is fixedly installed with water pipe 17, and one end of water pipe 17 is fixedly connected with water tank 15, and the side of water tank 15 is fixedly connected with water pump 16, and water pump 16 is fixedly connected with the other end of water pipe 17;

[0026] The test box 1 is provided with a conveying assembly for conveying the electronic components from the high-temperature detection chamber to the low-temperature detection chamber.

[0027] It should be noted that the test box 1 is provided with sealing doors on both sides, and the electronic components can be placed or taken out by opening or closing the sealing doors. Temperature monitors are arranged on both sides of the test box 1, and a display controller is arranged outside the test box 1 and electrically connected with the temperature monitors.

[0028] In specific implementation, when the electronic components are subjected to high-low temperature detection, the panel on one side of the test box 1 is opened, and the electronic components are placed on the test table 6. Two detection chambers are arranged in the test box 1 by the partition plate 3. When the electronic components are subjected to detection in the high-temperature detection chamber, the detection chamber is in a closed state. When the electronic components need to be moved from the high-temperature detection chamber to the low-temperature detection chamber for detection, the conveying assembly is started to move the electronic components from the high-temperature detection chamber to the low-temperature detection chamber. When the push plate 4 rises to abut against the push switch 10, the push switch 10 is pressed to start the servo motor 13, which drives the fan 14 to rotate. The two fans 14 on both sides of the test table 6 cool the electronic components on the test table 6, so that the test table 6 can quickly return to normal temperature for low-temperature detection. The water pump 16 outside the fan 14 is provided with condensate water, which is circulated in the water pipe 17 by the water pump 16 to cool the air blown by the fan 14, further improving the heat dissipation effect of the electronic components.

[0029] Referring to Figure 3 and Figure 4 , the conveying assembly comprises a screw rod 7. The bottom of the test box 1 is provided with a mounting cavity, and the screw rod 7 is rotatably connected in the mounting cavity. The bottom of the test box 1 is fixedly provided with a driving motor 2, and the driving end of the driving motor 2 is fixedly connected with the screw rod 7. The top of the screw rod 7 is movably connected with the test table 6.

[0030] By arranging the conveying assembly, the driving motor 2 can be started to drive the screw rod 7 to rotate. When the screw rod 7 rotates, the sliding block 8 slides on the bottom of the test box 1 along the screw rod 7, so that the electronic components can be moved from below the push plate 4 to the low-temperature detection chamber with the test table 6.

[0031] Referring to Figure 3 , the push plate 4 is slidably connected to one side of the partition plate 3. The bottom of the test box 1 is provided with a second mounting groove, and the second mounting groove is fixedly provided with an electric push rod 5. The driving end of the electric push rod 5 is fixedly connected with the bottom of the push plate 4.

[0032] By setting the electric push rod 5, the electric push rod 5 is installed in the second installation groove at the bottom of the test box 1, when the electric push rod 5 is not started, the push plate 4 is in contact with the bottom of the test box 1, and the two detection chambers are closed respectively to ensure the detection effect, when the electronic component moves, the electric push rod 5 drives the push plate 4 to move upwards, and the test bench 6 is convenient.

[0033] Referring to Figure 3 , the top of the push plate 4 is fixedly installed with a fixed plate 9, and the bottom of the fixed plate 9 is fixedly installed with a push switch 10. The push plate 4 is matched with the push switch 10.

[0034] By setting the push switch 10, when the push plate 4 rises to abut the push switch 10, the push switch 10 is extruded, the servo motor 13 is started, and the fan 14 is driven to rotate.

[0035] Referring to Figure 3 and Figure 4 , the screw rod 7 is threadedly connected with a sliding block 8, the top of the sliding block 8 is fixedly connected with the test bench 6, and the test bench 6 is slidably connected with the test box 1 through the sliding block 8.

[0036] By setting the test bench 6 and the sliding block 8, when the screw rod 7 rotates, the sliding block 8 slides along the screw rod 7 at the bottom of the test box 1, and the test bench 6 moves simultaneously with the sliding block 8.

[0037] Referring to Figure 2 and Figure 3 , the number of the push plate 4 is two, and the two push plates 4 are arranged on the two sides of the first installation groove 11.

[0038] By setting two push plates 4, the two push plates 4 are installed on the two sides of the second installation groove, so that when high-temperature or low-temperature detection is carried out in the test box 1, the two push plates 4 and the partition plate 3 ensure the sealing effect during detection.

[0039] Referring to Figure 2 , the test box 1 is provided with a heating assembly and a refrigerating assembly, and the heating assembly and the refrigerating assembly are respectively located in the high-temperature detection chamber and the low-temperature detection chamber on the two sides of the partition plate 3.

[0040] By setting the partition plate 3, the high-temperature detection chamber and the low-temperature detection chamber are arranged on the two sides of the partition plate 3, so as to improve the detection efficiency of the electronic component and reduce the waiting time for the high-temperature to drop to room temperature.

[0041] Referring to Figure 1 and Figure 2 , the number of the first installation groove 11 is two, and the two first installation grooves 11 are oppositely arranged on the two sides of the partition plate 3. The first installation groove 11 is provided with a filter screen on the side close to the water pipe 17.

[0042] By setting two opposite first installation grooves 11, air convection is formed by two fans 14, heat is dissipated, and the electronic components between the two fans 14 are pre-cooled.

[0043] Working principle: when the staff detects the electronic components at high and low temperatures, open the panel on one side of the test box 1, place the electronic components on the test table 6, and set two detection rooms in the test box 1 with the partition 3 as the partition. When the electronic components are detected in the high-temperature detection room, the detection room is in a closed state. When the electronic components need to be moved from the high-temperature detection room to the low-temperature detection room for detection, the staff starts the conveying assembly to move the electronic components from the high-temperature detection room to the low-temperature detection room. When the push plate 4 rises to abut against the push switch 10, the push switch 10 is pressed, the servo motor 13 is started, the fan 14 is driven to rotate, and the two fans 14 on both sides of the test table 6 cool the electronic components on the test table 6. The test table 6 is cooled to normal temperature as soon as possible to perform low-temperature detection. The water pump 16 outside the fan 14 is provided with condensate water, the condensate water is circulated in the water pipe 17 by the water pump 16, the wind blown by the fan 14 is cooled, and the heat dissipation effect of the electronic components is further improved.

[0044] The staff can start the drive motor 2 and the electric push rod 5, the drive motor 2 drives the screw rod 7 to rotate, the slide block 8 slides along the screw rod 7 at the bottom of the test box 1, the push plate 4 at the top of the electric push rod 5 moves vertically upward along the partition 3, the electronic components are moved from below the push plate 4 to the low-temperature detection room.

Claims

1. A high and low temperature testing device for electronic components, comprising a test chamber (1), characterized in that: A partition (3) is fixedly installed at the center of the vertical axis of the test chamber (1), dividing the test chamber (1) into a high-temperature test chamber and a low-temperature test chamber. The test chamber (1) is also equipped with a pre-cooling component, which is located between the high-temperature test chamber and the low-temperature test chamber. The test box (1) includes a servo motor (13). A first mounting slot (11) is provided on the side opposite to the partition (3). A mounting plate (12) is fixedly installed in the first mounting slot (11). The servo motor (13) is fixedly installed on the side of the mounting plate (12) away from the partition (3). A fan (14) is fixedly connected to the drive end of the servo motor (13). A water pipe (17) is fixedly installed on the outer side of the first mounting slot (11). A water tank (15) is fixedly connected to one end of the water pipe (17). A water pump (16) is fixedly connected to one side of the water tank (15). The water pump (16) is fixedly connected to the other end of the water pipe (17). The test chamber (1) is equipped with a conveying assembly, which is used to convey electronic components from the high-temperature test chamber to the low-temperature test chamber.

2. The high and low temperature detection device for electronic components as described in claim 1, characterized in that: The conveying assembly includes a screw (7), and the bottom of the test box (1) is provided with an installation cavity. The screw (7) is rotatably connected inside the installation cavity. A drive motor (2) is fixedly installed on one side of the bottom of the test box (1). The drive end of the drive motor (2) is fixedly connected to the screw (7). A test platform (6) is movably connected to the top of the screw (7).

3. The high and low temperature detection device for electronic components as described in claim 2, characterized in that: A push plate (4) is slidably connected to one side of the partition (3). A second mounting groove is provided at the bottom of the test box (1). An electric push rod (5) is fixedly installed in the second mounting groove. The driving end of the electric push rod (5) is fixedly connected to the bottom of the push plate (4).

4. The high and low temperature detection device for electronic components as described in claim 3, characterized in that: A fixing plate (9) is fixedly installed on the top of the push plate (4), and a push switch (10) is fixedly installed on the bottom of the fixing plate (9). The push plate (4) and the push switch (10) cooperate to resist each other.

5. The high and low temperature detection device for electronic components as described in claim 4, characterized in that: The screw (7) is threaded with a slider (8), the top of the slider (8) is fixedly connected to the test bench (6), and the test bench (6) is slidably connected to the test box (1) through the slider (8).

6. The high and low temperature detection device for electronic components as described in claim 5, characterized in that: The number of push plates (4) is set to two, and the two push plates (4) are respectively set on both sides of the first mounting groove (11).

7. The high and low temperature detection device for electronic components as described in claim 6, characterized in that: The test chamber (1) is equipped with a heating component and a cooling component, which are located in the high-temperature test chamber and the low-temperature test chamber on both sides of the partition (3), respectively.

8. The high and low temperature detection device for electronic components as described in claim 7, characterized in that: There are two first mounting slots (11), which are arranged opposite each other on both sides of the partition (3). A filter screen is provided on the side of the first mounting slot (11) near the water pipe (17).

Citation Information

Patent Citations

  • Integrated circuit chip performance testing device

    CN221528819U