Memory chip test assembly

Abstract

The utility model belongs to the technical field of chip testing, and particularly discloses a memory chip testing assembly which comprises a base, the top surface of the base is provided with a testing plate used for placing a memory chip and testing the memory chip, two ends of one side of the testing plate are provided with hinge seats, the hinge seats are hinged with a protective frame through connecting pieces, and the protective frame is provided with a protective cover. A fixing assembly used for fixing a memory chip is installed in the groove of the test plate, the fixing assembly comprises a direction lever fixedly connected with the test plate, the top surface of the direction lever is rotatably connected with a rotating block, the middle part of the top surface of the rotating block is hinged with an installation block through a hinge, the inner wall of the installation block is slidably connected with a limiting block, and the limiting block is connected with the limiting block. And a test assembly for testing the memory chip is mounted at one end, far away from the hinge seat, of the test plate. According to the utility model, the test plate is hinged to the protection frame and the L-shaped plate, so that the surface of the test plate and the groove can be cleaned before and after the chip test is completed, and the time is saved.

Description

TECHNICAL FIELD

[0001] The utility model relates to chip test technical field, concretely, relates to memory chip test subassembly. BACKGROUND

[0002] Chip test refers to the function, performance, reliability and so on of chip testing, to ensure that the chip can work normally and meet the design requirements. Chip test usually includes logic test, analog test, power consumption test, temperature test, etc. In the process of chip test, the fixture of chip test is used to fix the chip, and then the test machine is used for testing.

[0003] There are many chip test subassemblies on the market, for example, a chip test subassembly and chip test equipment with the publication number CN219245715U, the chip test subassembly includes a chuck; the chuck is provided with a first vacuum adsorption hole for providing negative pressure; a test main body, the test main body is provided as a hollow structure, and the bottom surface of the test main body is provided with a first opening, the top surface of the test main body is provided with a plurality of spaced second openings, the first opening and each second opening are communicated with the hollow structure, and the number of second openings is greater than the number of first openings.

[0004] The utility model discloses a plurality of second openings for placing the chip to be tested, which realizes the function of detecting a plurality of chips at a time and improves the chip test efficiency. However, the adsorption hole needs to be replaced regularly, and the second opening may accumulate dirt or be blocked, which needs to be cleaned or maintained regularly, consuming time and cost. In view of this, we propose a memory chip test subassembly. UTILITY MODEL CONTENTS

[0005] In view of the above defects or deficiencies in the prior art, it is desirable to provide a memory chip test subassembly.

[0006] In the first aspect, the application provides a memory chip test subassembly, which comprises a base, a test plate for placing and testing memory chips is installed on the top surface of the base, a hinge seat is installed at both ends of one side of the test plate, a protective frame is hinged to the hinge seat through a connecting piece, a plurality of fixing assemblies for fixing memory chips are installed in the grooves of the test plate, the fixing assembly comprises a direction rod fixedly connected with the test plate, a rotating block is rotatably connected to the top surface of the direction rod, an installation block is hingedly connected to the top surface of the rotating block through a hinge, a limiting block is slidably connected to the inner wall of the installation block, and a test assembly for testing memory chips is installed at one end of the test plate away from the hinge seat.

[0007] According to the technical scheme provided by the embodiment of the application, the test assembly comprises an L-shaped plate rotatably connected with the test plate through an adjusting rod, and both ends of the adjusting rod are fixedly connected with the test plate.

[0008] According to the technical scheme provided in the embodiment of the application, the L-shaped plate is integrally formed with a connecting block at one end away from the adjusting rod, and a screw rod is threadedly connected to the middle part of the connecting block.

[0009] According to the technical scheme provided in the embodiment of the application, a chip tester for storing chip testing is installed at one end of the screw rod close to the hinged seat, and a rotating handle is coaxially connected to one end of the screw rod away from the chip tester.

[0010] According to the technical scheme provided in the embodiment of the application, a rotating rod is fixedly connected between the two hinged seats, and the two connecting pieces are hinged to the rotating rod.

[0011] According to the technical scheme provided in the embodiment of the application, a female buckle is installed at one end of the protective frame away from the hinged seat, and a male buckle matched with the female buckle is installed on the top surface of one side of the test plate away from the hinged seat.

[0012] According to the technical scheme provided in the embodiment of the application, the direction rod is fastened to the rotating block through the first bolt, the limiting block is fastened to the mounting block through the second bolt, and the rotating block is symmetrically provided with elastic rods at one end.

[0013] In summary, the technical scheme specifically discloses a storage chip testing assembly, which comprises a test plate, a protective frame, a fixing assembly and a testing assembly. The length and angle of the limiting block extending into the groove in the test plate are adjusted through the rotating connection of the direction rod and the rotating block and the sliding connection of the mounting block and the limiting block, so that the chip is fixed, and the stability of chip testing is improved. The test plate surface and the groove are cleaned before and after chip testing through the hinged connection of the test plate and the protective frame and the hinged connection of the test plate and the L-shaped plate, so that time is saved. BRIEF DESCRIPTION OF DRAWINGS

[0014] Other features, objects and advantages of the application will become more apparent from the following detailed description of non-limiting embodiments, made with reference to the accompanying drawings:

[0015] Fig. 1 Fig. 1 is a schematic view of the overall structure of the utility model;

[0016] Fig. 2 Fig. 2 is another schematic view of the overall structure of the utility model;

[0017] Fig. 3 Fig. 3 is a schematic view of the fixing assembly in the utility model.

[0018] In the figure: 1, base; 2, test plate; 21, male buckle; 22, adjusting rod; 3, hinged seat; 4, rotating rod; 5, protective frame; 51, connecting piece; 52, female buckle; 6, fixing assembly; 61, direction rod; 62, rotating block; 63, first bolt; 64, mounting block; 65, elastic rod; 66, limiting block; 67, second bolt; 7, test assembly; 71, L-shaped plate; 72, connecting block; 73, lead screw; 74, handle; 75, chip tester. DETAILED DESCRIPTION

[0019] The application will be further described below in detail with reference to the drawings and embodiments. It can be understood that the specific embodiments described herein are only used to explain the related utility model, and are not limited to the utility model. In addition, it should be noted that only the parts related to the utility model are shown in the drawings for ease of description.

[0020] It should be noted that the embodiments in the present application and the features in the embodiments can be combined with each other without conflict. The present application will be described in detail below with reference to the drawings and embodiments.

[0021] Please refer to Figs. 1-3 , the storage chip test assembly comprises a base 1, the top surface of the base 1 is provided with a test plate 2 for placing and testing the storage chip, both ends of one side of the test plate 2 are provided with a hinged seat 3, the hinged seat 3 is hinged with a protective frame 5 through a connecting piece 51, a plurality of fixing assemblies 6 for fixing the storage chip are installed in the recess of the test plate 2, the fixing assembly 6 comprises a direction rod 61 fixedly connected with the test plate 2, the top surface of the direction rod 61 is rotatably connected with a rotating block 62, the top surface of the rotating block 62 is hingedly connected with a mounting block 64 in the middle, the inner wall of the mounting block 64 is slidably connected with a limiting block 66, the end of the test plate 2 away from the hinged seat 3 is provided with a test assembly 7 for testing the storage chip, the test plate 2 is hingedly connected with the protective frame 5 and the L-shaped plate 71, which facilitates the cleaning of the plate surface and the recess of the test plate 2 before and after the chip test, and the adsorption holes need to be cleaned and maintained regularly, which saves time and cost.

[0022] In the embodiment, the test assembly 7 comprises an L-shaped plate 71 rotatably connected with the test plate 2 through an adjusting rod 22, both ends of the adjusting rod 22 are fixedly connected with the test plate 2, which facilitates the normal use of the structure.

[0023] Further, the end of the L-shaped plate 71 away from the adjusting rod 22 is integrally formed with a connecting block 72, the middle of the connecting block 72 is threadedly connected with a lead screw 73, the lead screw 71 can drive the chip tester 75 to adjust the position, which facilitates the flexible use of the whole structure.

[0024] In this embodiment, the screw rod 73 is installed with a chip tester 75 for storing chip test near one end of the articulated seat 3, the chip tester 75 is a general standard part or a part known to those skilled in the art, the structure and principle of which are known to those skilled in the art through technical manual or through conventional experimental method, the end of the screw rod 73 away from the chip tester 75 is coaxially connected with the handle 74, which is convenient for normal use of the structure.

[0025] It should be noted that the two articulated seats 3 are fixedly connected with the rotating rod 4, and the two connecting pieces 51 are hinged with the rotating rod 4, which is convenient for the connection between the articulated seat and the protective frame 5.

[0026] It is worth noting that the female buckle 52 is installed on the end of the protective frame 5 away from the articulated seat 3, and the male buckle 21 matched with the female buckle is installed on the top surface of the test board 2 away from the articulated seat 3, before the storage chip is tested, the protective frame 5 and the test board 2 are fixed to prevent affecting the normal test process of the chip.

[0027] It should be added that the direction rod 61 is fastened with the rotating block 62 through the first bolt 63, and the limiting block 66 is fastened with the mounting block 64 through the second bolt 67, one end of the rotating block 62 is symmetrically provided with the elastic rod 65, and the impact force between the mounting block 64 and the rotating block 62 can be relieved through the elastic rod 65, which is convenient for restoring the normal placing state.

[0028] Working principle: when the staff uses the storage chip test assembly, first, the storage chip to be tested is fixed in the groove of the test board 2 through the cooperation of the mounting block 64 and the limiting block 66, then the protective frame 5 is turned over and the female buckle 52 is buckled to the male buckle 21, and then the L-shaped plate 71 is turned over, the screw rod 73 is adjusted through the handle 74, so that the chip tester 75 and the chip to be tested can keep appropriate distance.

[0029] The above description is only the preferred embodiment of the present application and the explanation of the applied technical principles. Those skilled in the art should understand that the utility model range involved in the present application is not limited to the technical solutions formed by the specific combination of the above technical features, and also covers other technical solutions formed by any combination of the above technical features or equivalent features without departing from the utility model concept. For example, the above features are replaced with the technical features disclosed in the present application (but not limited to) having similar functions to form technical solutions.

Claims

1. A memory chip testing assembly comprising a base (1) and a first bolt (63), characterized in that: The top surface of the base (1) is provided with a test board (2) for placing and testing storage chips, both ends of one side of the test board (2) are provided with a hinged seat (3), the hinged seat (3) is hinged with a protective frame (5) through a connecting piece (51), a plurality of fixing assemblies (6) for fixing storage chips are installed in the recess of the test board (2), the fixing assembly (6) comprises a direction rod (61) fixedly connected with the test board (2), the top surface of the direction rod (61) is rotatably connected with a rotating block (62), the top surface of the rotating block (62) is hingedly connected with a mounting block (64) in the middle, the inner wall of the mounting block (64) is slidably connected with a limiting block (66), and the end of the test board (2) away from the hinged seat (3) is provided with a test assembly (7) for testing storage chips.

2. The memory chip test assembly of claim 1, wherein: The test assembly (7) comprises an L-shaped plate (71) rotatably connected with the test board (2) through an adjusting rod (22), and both ends of the adjusting rod (22) are fixedly connected with the test board (2).

3. The memory chip test assembly of claim 2, wherein: The L-shaped plate (71) is integrally formed with a connecting block (72) at the end away from the adjusting rod (22), and the middle of the connecting block (72) is threadedly connected with a lead screw (73).

4. The memory chip test assembly of claim 3, wherein: The end of the lead screw (73) close to the hinged seat (3) is provided with a chip tester (75) for testing storage chips, and the end of the lead screw (73) away from the chip tester (75) is coaxially connected with a handle (74).

5. The memory chip testing assembly of claim 1, wherein: Two hinged seats (3) are fixedly connected with a rotating rod (4), and two connecting pieces (51) are hingedly connected with the rotating rod (4).

6. The memory chip testing assembly of claim 1, wherein: The end of the protective frame (5) away from the hinged seat (3) is provided with a female buckle (52), and the top surface of one side of the test board (2) away from the hinged seat (3) is provided with a male buckle (21) matched with the female buckle.

7. The memory chip testing assembly of claim 1, wherein: The direction rod (61) is fastened with the rotating block (62) through the first bolt (63), the limiting block (66) is fastened with the mounting block (64) through the second bolt (67), and one end of the rotating block (62) is provided with elastic rods (65) in a symmetrical manner.

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