Scanning electron microscope with protection structure

Abstract

The utility model discloses a scanning electron microscope with a protective structure, which relates to the technical field of scanning electron microscopes and comprises a supporting seat, a workbench, an anti-skid seat, a scanning electron microscope body, a lens cone, an imaging recording cylinder, a control panel and a sealing door. According to the scanning electron microscope with the protection structure, a pull ring is pulled, meanwhile, a limiting plate can be moved, then the position of an adjusting rod is fixed, and the pull ring is loosened, so that the limiting plate can limit the adjusting rod, displacement of the adjusting rod during analysis can be avoided, and a good protection effect is achieved; according to the scanning electron microscope, a driving motor can be started, so that a first bevel gear is rotated through a rotating rod, the first bevel gear can rotate a threaded rod through a second bevel gear, the threaded rod can move a protection plate through a displacement seat, and the protection plate can limit the scanning electron microscope body; therefore, the scanning electron microscope can have a better clamping and stabilizing effect when being placed.

Description

TECHNICAL FIELD

[0001] The utility model relates to scanning electron microscope technical field, concretely is a scanning electron microscope with protection structure. BACKGROUND

[0002] Scanning electron microscope as a kind of high-resolution microtopography analysis large precision instrument, can clearly observe the microtopography of sample surface, such as particle shape, size and distribution, it has important significance to study material microstructure change, surface roughness, the wide application of scanning electron microscope provides strong technical support for scientific research and industrial production.

[0003] But most scanning electron microscopes are used, because the adjusting rod of one side can be adjusted to move the placing seat, and no limiting mechanism is arranged, so that the adjusting rod moves after being touched or collided in the analysis process, so that the adjusting rod can move and contact the placing seat, so that the placing seat is easy to shake during analysis, thereby causing the analysis result to deviate, so that the scanning electron microscope is more inconvenient to use. UTILITY MODEL CONTENT

[0004] The utility model aims at providing a scanning electron microscope with protection structure to solve the poor protection of scanning electron microscope in use as proposed in the above background.

[0005] To achieve the above object, the utility model provides the following technical scheme: a scanning electron microscope with protection structure, including support seat, workstation, antiskid seat, scanning electron microscope body, lens barrel, imaging recording cylinder, control panel and sealing door, the top of support seat is provided with workstation, the bottom of support seat is provided with evenly distributed antiskid seat, the top of workstation is provided with scanning electron microscope body, the side of scanning electron microscope body is provided with lens barrel, the side, away from lens barrel of scanning electron microscope body is provided with imaging recording cylinder, the end of scanning electron microscope body, close to imaging recording cylinder is provided with control panel, the side of control panel is provided with sealing door.

[0006] Preferably, the side of the sealing door is provided with a slidingly connected adjusting rod, and the side of the adjusting rod is provided with an adjusting head.

[0007] Preferably, the side, close to the adjusting rod of the sealing door is provided with a weldedly connected horizontal plate, the side, top end of the horizontal plate is provided with a fixing seat, and the inside of the fixing seat is provided with a hollow slot.

[0008] Preferably, the inside of the hollow slot is provided with a slidingly connected displacement plate, and the two sides of the displacement plate are both provided with a guide column connected with the hollow slot.

[0009] Preferably, the displacement plate is provided with a welded pull ring on one side close to the guide column, both ends of the displacement plate are provided with limiting springs connected with the empty slot, and the bottom end of the displacement plate is provided with a welded limiting plate.

[0010] Preferably, the inside of the workbench is provided with a reserved slot, a driving motor is mounted in the reserved slot, and a rotating rod is connected to the output end of the driving motor through a shaft coupling.

[0011] Preferably, one end of the rotating rod is provided with a welded first bevel gear, and a second bevel gear is meshed and connected on one side of the first bevel gear.

[0012] Preferably, the second bevel gears are symmetrically distributed on both sides of the first bevel gear, and a threaded rod is connected in the second bevel gear through a bearing.

[0013] Preferably, the inside of the workbench is provided with symmetrically distributed sliding rods away from one end of the threaded rod, and displacement slots are formed in the inside of the workbench close to one side of the threaded rod and the sliding rods.

[0014] Preferably, the surfaces of the threaded rod and the sliding rods are provided with displacement seats, and the top end of the displacement seat is connected with a protective plate.

[0015] Compared with the prior art, the beneficial effects of the scanning electron microscope with the protective structure are: by pulling the pull ring, the limiting plate can be moved, then the position of the adjusting rod is fixed, the pull ring is loosened, the limiting plate can limit the adjusting rod, and displacement of the adjusting rod during analysis can be avoided, the protective effect is good, the driving motor can be started, the first bevel gear can be rotated through the rotating rod, the threaded rod can be rotated through the second bevel gear, the protective plate can be moved through the displacement seat, the protective plate can limit the scanning electron microscope body, and the scanning electron microscope can have good clamping stability when placed.

[0016] 1. The scanning electron microscope with the protection structure, when the scanning electron microscope is used, the adjusting rod is not easy to be limited, the adjusting rod is easy to move, the placement seat is deviated during analysis, the scanning electron microscope is inconvenient to use, the pull ring is pulled, the displacement plate connected with the pull ring is moved, the limiting spring is extruded when the displacement plate moves, the limiting plate connected with the displacement plate is moved, the adjusting rod is placed on one side of the limiting plate, the pull ring is loosened, the limiting spring is limited, the limiting spring is reset, the position of the displacement plate is reset, the limiting plate is moved when the displacement plate moves, the limiting plate limits the adjusting rod, the adjusting rod is prevented from moving during analysis, the scanning electron microscope has good limiting protection effect during use, and the placement seat is prevented from being deviated;

[0017] 2. The scanning electron microscope with the protection structure, when the scanning electron microscope is used, the scanning electron microscope is directly placed on the object table, the stability of the scanning electron microscope during placement is poor, the driving motor is started, the driving motor rotates the rotating rod connected with the output end, the first bevel gear connected with one end of the rotating rod is rotated when the rotating rod rotates, the second bevel gear meshed with the first bevel gear is rotated when the first bevel gear rotates, the threaded rod connected with the second bevel gear is rotated when the second bevel gear rotates, the displacement seat moves the protection plate through the threaded rod, the protection plate limits the scanning electron microscope body when the protection plate moves, and the scanning electron microscope has good clamping stability during placement. BRIEF DESCRIPTION OF DRAWINGS

[0018] Figure 1 It is a three-dimensional structure schematic view of the support seat of the utility model;

[0019] Figure 2 It is a three-dimensional structure schematic view of the adjusting head of the utility model;

[0020] Figure 3 It is a three-dimensional structure schematic view of the fixing seat of the utility model;

[0021] Figure 4 It is a three-dimensional structure schematic view of the workbench of the utility model.

[0022] In the figure: 1, support seat; 2, workbench; 3, anti-skid seat; 4, scanning electron microscope body; 5, lens barrel; 6, imaging recording barrel; 7, control panel; 8, sealing door; 9, adjusting rod; 10, adjusting head; 11, cross plate; 12, fixing seat; 13, empty groove; 14, displacement plate; 15, guide column; 16, pull ring; 17, limiting spring; 18, limiting plate; 19, reserved groove; 20, driving motor; 21, rotating rod; 22, first bevel gear; 23, second bevel gear; 24, threaded rod; 25, sliding rod; 26, displacement groove; 27, displacement seat; 28, protection plate. DETAILED DESCRIPTION

[0023] The technical solutions in the embodiments of the utility model will be clearly and completely described below with reference to the drawings in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, rather than all the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by those skilled in the art without creative labor fall within the protection scope of the utility model.

[0024] Please refer to Figures 1-3 The utility model provides a kind of technical scheme: a scanning electron microscope with protection structure, including support seat 1, workbench 2, anti-skid seat 3, scanning electron microscope body 4, lens barrel 5, imaging recording barrel 6, control panel 7 and sealing door 8, the top of support seat 1 is provided with workbench 2, the bottom of support seat 1 is provided with evenly distributed anti-skid seat 3, the top of workbench 2 is provided with scanning electron microscope body 4, one side of scanning electron microscope body 4 is provided with lens barrel 5, the side of scanning electron microscope body 4 away from lens barrel 5 is provided with imaging recording barrel 6, the end of scanning electron microscope body 4 close to imaging recording barrel 6 is provided with control panel 7, one side of control panel 7 is provided with sealing door 8, one side of sealing door 8 is provided with the adjusting rod 9 of sliding connection, one side of adjusting rod 9 is provided with adjusting head 10, one side of sealing door 8 close to adjusting rod 9 is provided with the cross plate 11 of welding connection, one side top of cross plate 11 is provided with fixing seat 12, the inside of fixing seat 12 is provided with empty groove 13, the inside of empty groove 13 is provided with the displacement plate 14 of sliding connection, the both sides of displacement plate 14 are all penetrated with the guide column 15 connected with empty groove 13, one side of displacement plate 14 close to guide column 15 is provided with the pull ring 16 of welding connection, the both ends of displacement plate 14 are all provided with the limiting spring 17 connected with empty groove 13, the bottom of displacement plate 14 is provided with the limiting plate 18 of welding connection.

[0025] In specific implementation,

[0026] Please refer to Figures 1-3It can be known that when the scanning electron microscope is in use, the adjusting rod 9 is usually not easy to limit, so that the adjusting rod 9 is easy to move, which causes the placement seat to deviate during analysis, so that the scanning electron microscope is more inconvenient to use. The pull ring 16 can be pulled to move the connected displacement plate 14, so that the displacement plate 14 can slide on the surface of the two side guide columns 15 during movement, so that the displacement plate 14 can be more stable during displacement. The displacement plate 14 can extrude the limiting spring 17 during movement, and the displacement plate 14 can move the connected limiting plate 18 during movement. Then place the adjusting rod 9 on one side of the limiting plate 18, then loosen the pull ring 16, so that the limiting spring 17 can lose the limit, so that the limiting spring 17 can reset, so that the position of the displacement plate 14 can reset, so that the displacement plate 14 can move the connected limiting plate 18 during movement, so that the limiting plate 18 can limit the adjusting rod 9, thereby avoiding the displacement of the adjusting rod 9 during analysis, so that the scanning electron microscope can have better limiting protection effect during use, and the placement seat is avoided to be deviated.

[0027] The workbench 2 is internally provided with a reserved groove 19, the reserved groove 19 is internally provided with a driving motor 20, the output end of the driving motor 20 is connected with a rotating rod 21 through a shaft coupling, one end of the rotating rod 21 is provided with a welded first bevel gear 22, one side of the first bevel gear 22 is meshed with a second bevel gear 23, the second bevel gear 23 is symmetrically distributed on both sides of the first bevel gear 22, the inside of the second bevel gear 23 is provided with a threaded rod 24 connected through a bearing, the workbench 2 is internally provided with symmetrically distributed slide rods 25 away from one end of the threaded rod 24, the workbench 2 is internally provided with displacement grooves 26 on one side close to the threaded rod 24 and the slide rods 25, the surfaces of the threaded rod 24 and the slide rods 25 are provided with displacement seats 27, the top end of the displacement seat 27 is connected with a protective plate 28.

[0028] In specific implementation,

[0029] Referring to Figure 1 , Figure 2 and Figure 4It can be known that when the scanning electron microscope is in use, the scanning electron microscope is usually directly placed on the objective table, so that the stability of the scanning electron microscope when being placed is poor, the driving motor 20 can be started, so that the driving motor 20 can rotate the rotating rod 21 connected to the output end, so that the rotating rod 21 can rotate the first bevel gear 22 connected to one end when rotating, so that the first bevel gear 22 can rotate the second bevel gear 23 connected in meshing when rotating, so that the second bevel gear 23 can rotate the threaded rod 24 connected when rotating, so that the threaded rod 24 can move the displacement seat 27 connected to the surface when rotating, so that the displacement seat 27 can move the protective plate 28 connected to the top end when moving, so that the protective plate 28 can limit the scanning electron microscope body 4 when moving, so that the scanning electron microscope can have better clamping stability effect when being placed.

[0030] In summary, the scanning electron microscope is a large precision instrument for high-resolution micro-area topography analysis, which can clearly observe the micro-topography of the sample surface, by pulling the pull ring 16, the displacement plate 14 can extrude the limiting spring 17, and the limiting plate 18 can be moved, then the position of the adjusting rod 9 is fixed, then the pull ring 16 is loosened, the limiting plate 18 can limit the adjusting rod 9, so that displacement of the adjusting rod 9 during analysis can be avoided, and better protection effect is obtained, and the contents not described in detail in the description belong to the existing technology known to those skilled in the art.

[0031] Although the utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions recorded in the foregoing embodiments or make equivalent replacement to part of the technical features, and any modification, equivalent replacement, improvement, etc. within the spirit and principles of the utility model should be included in the protection scope of the utility model.

Claims

1. A scanning electron microscope with a protective structure, comprising a support seat (1), a workbench (2), anti-skid seats (3), a scanning electron microscope body (4), a lens barrel (5), an imaging recording barrel (6), a control panel (7) and a sealing door (8), characterized in that: the top end of the support seat (1) is provided with a workbench (2), the bottom end of the support seat (1) is provided with evenly distributed anti-skid seats (3), the top end of the workbench (2) is provided with a scanning electron microscope body (4), one side of the scanning electron microscope body (4) is provided with a lens barrel (5), the side of the scanning electron microscope body (4) away from the lens barrel (5) is provided with an imaging recording barrel (6), one end of the scanning electron microscope body (4) close to the imaging recording barrel (6) is provided with a control panel (7), and one side of the control panel (7) is provided with a sealing door (8).

2. A scanning electron microscope with a protective structure according to claim 1, characterized in that: One side of the sealing door (8) is provided with a slidingly connected adjusting rod (9), and one side of the adjusting rod (9) is provided with an adjusting head (10).

3. A scanning electron microscope with a protective structure according to claim 2, characterized in that: One side of the sealing door (8) close to the adjusting rod (9) is provided with a transversely connected horizontal plate (11), one side top end of the horizontal plate (11) is provided with a fixing seat (12), and the inside of the fixing seat (12) is provided with a hollow groove (13).

4. A scanning electron microscope with a protective structure according to claim 3, characterized in that: The inside of the hollow groove (13) is provided with a slidingly connected displacement plate (14), and both sides of the displacement plate (14) are penetrated by guide columns (15) connected with the hollow groove (13).

5. A scanning electron microscope with a protective structure according to claim 4, characterized in that: One side of the displacement plate (14) close to the guide column (15) is provided with a weldedly connected pull ring (16), both ends of the displacement plate (14) are provided with limiting springs (17) connected with the hollow groove (13), and the bottom end of the displacement plate (14) is provided with a weldedly connected limiting plate (18).

6. A scanning electron microscope with a protective structure according to claim 1, characterized in that: The inside of the workbench (2) is provided with a reserved groove (19), the inside of the reserved groove (19) is provided with a driving motor (20), and the output end of the driving motor (20) is connected with a rotating rod (21) through a shaft coupling.

7. A scanning electron microscope with a protective structure according to claim 6, characterized in that: One end of the rotating rod (21) is provided with a weldedly connected first bevel gear (22), and one side of the first bevel gear (22) is engagedly connected with a second bevel gear (23).

8. A scanning electron microscope with a protective structure according to claim 7, characterized in that: The second bevel gears (23) are symmetrically distributed on both sides of the first bevel gear (22), and the inside of the second bevel gears (23) is provided with threaded rods (24) connected through bearings.

9. A scanning electron microscope with a protective structure according to claim 1, characterized in that: One end of the workbench (2) inside away from the threaded rods (24) is provided with symmetrically distributed sliding rods (25), and one side of the workbench (2) inside close to the threaded rods (24) and the sliding rods (25) is provided with displacement grooves (26).

10. A scanning electron microscope with a protective structure according to claim 9, characterized in that: The surfaces of the threaded rods (24) and the sliding rods (25) are both provided with displacement seats (27), and the top ends of the displacement seats (27) are connected with protective plates (28).

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