Sample information inspection device

Abstract

The utility model relates to the technical field of sample information detection, and provides a sample information inspection device which comprises a light source module, a vortex light generation module and a beam expanding module, the vortex light generation module is suitable for performing polarization modulation and phase modulation on the laser beam so as to convert the laser beam into a vortex beam, and the vortex beam is suitable for irradiating a sample object; and the beam expanding module is suitable for collimating and expanding the laser beam and / or the vortex beam. According to the arrangement, the vortex light beam emitted by the sample information inspection device provided by the utility model is utilized to irradiate a preprocessed sample object, and the existence distribution condition of samples on the sample object can be determined according to fluorescence formed on the sample object. By using the vortex light beam, the polarization characteristics of different substances can be better utilized, the contrast ratio of the sample and the background is increased, the sample and the background are convenient to distinguish, the display effect of sample information is improved, and the display definition of the sample information is improved.

Description

TECHNICAL FIELD

[0001] The utility model relates to sample information detection technical field especially, relate to a sample information inspection device. BACKGROUND

[0002] In many fields, such as forensic science, biomedical, environmental monitoring and safety system, the collection and analysis of sample information are of great significance. Sample information can be, but not limited to, fingerprints, sweat, urine, blood, etc. The accurate collection and analysis of these sample information are of great importance to scientific research, disease diagnosis, environmental pollution monitoring and public security, etc.

[0003] Optical instruments such as lasers are widely used in sample information inspection as an effective illumination inspection tool. According to the principle of photoluminescence, when the laser beam emitted by the laser directly irradiates on the surface of the object which may leave sample information, the substances naturally existing or adhering on the sample will absorb the external excitation light and radiate longer wavelength fluorescence, forming a brightness contrast with the surface of the object, so as to show the trace. The above-mentioned fluorescence radiated by the sample is called the signal of sample light, and the irrelevant stray light from the illumination light source, environmental light, etc. is called noise. When the noise is greater than the signal, the sample information is not clear due to the interference of background light, and even the sample light will be annihilated in the background light, resulting in invisible sample information. The laser beam emitted by the laser used in the related technology is generally a Gaussian beam, and the beam intensity of the Gaussian beam presents Gaussian distribution in space, with high central light intensity, which gradually decreases along the Gaussian profile light intensity outward, resulting in unclear sample information at the edge position corresponding to the Gaussian beam. SUMMARY

[0004] The utility model provides a kind of sample information inspection device to at least solve the above-mentioned technical problem.

[0005] The utility model further provides a kind of sample information inspection device, comprising:

[0006] Light source module is suitable for emitting laser beam;

[0007] Vortex light generation module is suitable for polarized modulation and phase modulation to the laser beam, so that the laser beam is converted into vortex beam, and the vortex beam is suitable for irradiating sample object;

[0008] Beam expanding module is suitable for collimating and expanding the laser beam and / or the vortex beam.

[0009] According to the utility model provides a kind of sample information inspection device, the vortex light generation module includes:

[0010] Polarization device is suitable for polarized processing to the laser beam, to obtain linearly polarized beam;

[0011] a half-wave plate adapted to adjust a polarization direction of the linearly polarized light beam to obtain a modulated linearly polarized light beam;

[0012] a vortex wave plate adapted to phase modulate the modulated linearly polarized light beam to convert the modulated linearly polarized light beam into the vortex light beam.

[0013] According to the sample information inspection device provided by the utility model, the vortex wave plate includes a first-order vortex wave plate and a second-order vortex wave plate, and the topological charge number of the first-order vortex wave plate is different from that of the second-order vortex wave plate;

[0014] Any one of the first-order vortex wave plate and the second-order vortex wave plate is adapted to be detachably arranged on the side of the half-wave plate away from the polarization device.

[0015] According to the sample information inspection device provided by the utility model, the half-wave plate is rotatably arranged between the polarization device and the vortex wave plate.

[0016] According to the sample information inspection device provided by the utility model, the vortex light generating module further includes:

[0017] a quarter-wave plate arranged between the half-wave plate and the vortex wave plate, the quarter-wave plate being adapted to modulate the modulated linearly polarized light beam into a circularly polarized light beam, and the vortex wave plate being adapted to phase modulate the circularly polarized light beam to convert the circularly polarized light beam into the vortex light beam.

[0018] According to the sample information inspection device provided by the utility model, the quarter-wave plate is detachably arranged between the half-wave plate and the vortex wave plate.

[0019] According to the sample information inspection device provided by the utility model, the sample information inspection device further includes:

[0020] an image acquisition module adapted to acquire image information of the fluorescence on the sample object.

[0021] According to the sample information inspection device provided by the utility model, the image acquisition module includes:

[0022] a camera adapted to acquire image information of the fluorescence on the sample object;

[0023] a filter arranged on the side of the camera facing the sample object, the filter being adapted to filter out laser noise in the echo light.

[0024] According to the sample information inspection device provided by the utility model, the camera is a charge coupled device camera.

[0025] According to the sample information inspection device, the polarization device comprises a polarization beam splitter or a polarizer.

[0026] The sample information inspection device provided by the utility model, including light source module, vortex light generation module and expansion module, light source module is used for sending laser beam, vortex light generation module is used for polarization modulation and phase modulation to laser beam, to make laser beam convert into vortex light beam. Vortex light beam is used for irradiating sample object, to check sample information. Expansion module is used for collimating and expanding laser beam and / or vortex light beam, to increase the diameter of vortex light beam irradiated on sample object, increase the size of light spot formed on sample object, expand the irradiation area of sample information inspection device on sample object, to increase the inspection efficiency. In this way, when checking sample information on sample object, the sample on sample object is pretreated first, to form fluorescent complex on sample object. Then, the vortex light beam emitted by the sample information inspection device provided by the utility model embodiment is used for irradiating pretreated sample object, and the fluorescent complex on sample object will emit fluorescence under the excitation of vortex light beam. According to the fluorescence formed on sample object, the existence distribution of sample on sample object can be determined. The equal phase surface of vortex light beam is spiral phase wave front, the central light intensity is zero, and the light intensity is distributed in a ring shape. The use of vortex light beam introduces orbital angular momentum, which can better utilize the polarization characteristics of different substances, increase the contrast between the position of sample and the rest of sample object (referred to as background), facilitate the differentiation between sample and background, improve the display effect of sample information, and improve the display clarity of sample information. BRIEF DESCRIPTION OF DRAWINGS

[0027] In order to more clearly illustrate the technical scheme of the utility model or the prior art, the following will briefly introduce the drawings needed to be used in the embodiment or the prior art description, and obviously, the drawings in the following description are some embodiments of the utility model, and for those skilled in the art, other drawings can be obtained according to these drawings without creative labor.

[0028] Figure 1 It is the flow chart of the sample information inspection method provided by the utility model.

[0029] Figure 2 It is the principle diagram of the sample information inspection device provided by the utility model.

[0030] Figure 3 It is the structure schematic diagram of the sample information inspection device provided by the utility model.

[0031] Figure 4It is the polarization vortex beam formation process schematic diagram provided by the utility model.

[0032] Figure 5 It is the phase vortex beam formation process schematic diagram provided by the utility model.

[0033] Reference signs:

[0034] 1, light source module;2, vortex light generation module;3, sample object;4, polarization device;5, half wave plate;6, vortex wave plate;7, quarter wave plate;8, image acquisition module;9, optical filter;10, camera;11, first beam expander;12, second beam expander;13, first-order vortex wave plate;14, second-order vortex wave plate;15, horizontal linearly polarized light beam;16, vertical linearly polarized light beam;17, right circularly polarized light beam;18, left circularly polarized light beam;19, left phase vortex light beam;20, right phase vortex light beam;21, radial polarization vortex light beam;22, angular polarization vortex light beam;23, anisotropic high-order polarization vortex light beam;24, fluorescent complex;25, computer. DETAILED DESCRIPTION

[0035] In order to make the purpose, technical scheme and advantages of the utility model more clear, the technical scheme in the utility model will be described clearly and completely below in combination with the drawings in the utility model. Obviously, the described embodiments are part of the embodiments of the utility model, rather than all the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by those skilled in the art without creative labor fall within the protection scope of the utility model.

[0036] The sample information inspection method provided by the utility model will be described below in combination with the drawings. Figures 1 to 5 The sample information inspection method provided by the utility model will be described below in combination with the drawings.

[0037] As shown in Figure 1 And Figure 5 The sample information inspection method provided by the utility model mainly comprises the following steps.

[0038] Step 110, pretreat the sample object, so that the sample on the sample object forms a fluorescent complex.

[0039] Step 120, irradiate the sample object with a vortex light beam, so that the fluorescent complex emits fluorescence.

[0040] That is, when inspecting the sample information on the sample object 3, the sample object 3 that has been pretreated is irradiated with a vortex light beam, and the fluorescent complex 24 on the sample object 3 will emit fluorescence under the excitation of the vortex light beam. According to the fluorescence formed on the sample object 3, the distribution of the sample on the sample object 3 can be determined.

[0041] The equal phase surface of the vortex beam is a helical phase wave front, the central light intensity is zero, and the light intensity is distributed in a ring shape. The use of the vortex beam introduces orbital angular momentum, better utilizes the polarization characteristics of different substances, increases the contrast between the position of the sample and the rest of the positions on the sample object (referred to as the background), facilitates the differentiation between the sample and the background, improves the display effect of the sample information, and improves the display clarity of the sample information.

[0042] It should be noted that when the sample object 3 is preprocessed, a targeted biological trace reagent can be selected, such as an amino acid sensitive reagent. The biological trace includes fingerprint, sweat, urine, blood, and other sample information. For fingerprints, when a sweat latent fingerprint contacts the sample object 3, the amino acids carried by the fingerprint ridge line will penetrate into the interior of the sample object 3 along with the sweat. When the sample information is checked, the sample object 3 is sprayed with an amino acid sensitive reagent. The amino acid molecules from the human body react with the indanedione in the amino acid sensitive reagent to form a fluorescent complex 24.

[0043] When the sample object 3 is irradiated with the vortex beam, the fluorescent complex 24 will emit fluorescence. In some embodiments, the examiner can directly observe the fluorescence effect on the sample object 3 using a filter, which is beneficial for quickly locking the position of the sample information on the sample object 3. In other embodiments, the fluorescent position can also be photographed by a camera 10 with a filter element, the position of the sample information on the sample object 3 is locked, and the image information of the fluorescence on the sample object 3 is collected. After the image information of the fluorescence is collected by the camera 10, the camera 10 can be connected to a computer 25 to display, save, and process the image information of the fluorescence. The collected image information can be further edge enhanced by the computer 25, so that the clear original appearance of the sample is obtained.

[0044] The above filter and filter element can filter out laser noise in the echo light, eliminate background light and stray light, and improve the signal-to-noise ratio.

[0045] The vortex beam includes a polarization vortex beam and a phase vortex beam, and different types of vortex beams have different optical properties. When the type of the vortex beam is a polarization vortex beam, the polarization vortex beam contains rich polarization states, and each point in the cross section of the beam has a different azimuthal polarization state, which can better utilize the polarization characteristics of different substances, distinguish between the sample and the background, and expand the image information. When the type of the vortex beam is a phase vortex beam, the light introduces orbital angular momentum during transmission, which can resist the influence of the scattering medium, excite brighter fluorescent highlights, and improve the signal-to-noise ratio.

[0046] In the embodiment, when the sample object 3 is irradiated by the vortex beam, one of the polarization vortex beam and the phase vortex beam can be used to irradiate the sample object 3 first, and the fluorescent effect of the fluorescent complex 24 is observed. If the fluorescent effect of the fluorescent complex 24 is lower than the expected effect, the other of the polarization vortex beam and the phase vortex beam is used to irradiate the sample object 3.

[0047] The polarization vortex beam is divided into a radial polarization vortex beam 21, an angular polarization vortex beam 22, and an anisotropic high-order polarization vortex beam 23. Specifically, when the sample object 3 is irradiated by the polarization vortex beam, the sample object 3 can be irradiated by the radial polarization vortex beam 21, the angular polarization vortex beam 22, and the anisotropic high-order polarization vortex beam 23 respectively, and the corresponding fluorescent effects are observed respectively to obtain the best fluorescent effect.

[0048] In the embodiment, the polarization vortex beam is formed by the laser beam passing through the polarization device 4, the half-wave plate 5, and the vortex wave plate 6. When the sample object 3 is irradiated by the polarization vortex beam, the angle of the half-wave plate 5 and / or the type of the vortex wave plate 6 can be adjusted until the fluorescent effect of the fluorescent complex 24 is higher than the expected effect.

[0049] The types of the vortex wave plate 6 include a first-order vortex wave plate 13, a second-order vortex wave plate 14, and the like classified according to the topological charge number. The vortex beam generated by the vortex wave plate 6 is a Laguerre-Gaussian beam.

[0050] When the radial polarization vortex beam 21 whose polarization direction oscillates along the radial direction on the cross section of the light field is needed, the angle of the half-wave plate 5 can be adjusted so that the linearly polarized beam generated by the half-wave plate 5 is a horizontal linearly polarized beam 15. At this time, the first-order vortex wave plate 13 needs to be selected, and the included angle between the zero-degree fast axis of the first-order vortex wave plate 13 and the horizontal linearly polarized beam 15 is zero degrees.

[0051] When the angular polarization vortex beam 22 whose polarization direction oscillates perpendicularly to the radial direction on the cross section of the light field is needed, the angle of the half-wave plate 5 can be adjusted so that the linearly polarized beam generated by the half-wave plate 5 is a vertical linearly polarized beam 16. At this time, the first-order vortex wave plate 13 needs to be selected, and the included angle between the zero-degree fast axis of the first-order vortex wave plate 13 and the vertical linearly polarized beam 16 is 90 degrees.

[0052] When the anisotropic high-order polarization vortex beam 23 whose polarization direction is anisotropic on the cross section of the light field is needed, the angle of the half-wave plate 5 can be adjusted so that the linearly polarized beam generated by the half-wave plate 5 is a horizontal linearly polarized beam 15. At this time, the second-order vortex wave plate 14 needs to be selected, and the included angle between the zero-degree fast axis of the second-order vortex wave plate 14 and the horizontal linearly polarized beam 15 is any angle.

[0053] The phase vortex beam is divided into a left-handed phase vortex beam 19 and a right-handed phase vortex beam 20. Specifically, when the sample object 3 is irradiated by the phase vortex beam, the sample object 3 can be irradiated by the left-handed phase vortex beam 19 and the right-handed phase vortex beam 20 respectively, and the corresponding fluorescence effects are observed respectively to obtain the best fluorescence effect.

[0054] In the embodiment, the phase vortex beam is formed by the laser beam, the polarization device 4, the half-wave plate 5, the quarter-wave plate 7 and the vortex plate 6. When the sample object 3 is irradiated by the phase vortex beam, the angle of the half-wave plate 5 and / or the type of the vortex plate 6 can be adjusted until the fluorescence effect of the fluorescence complex 24 is higher than the expected effect.

[0055] When the left-handed phase vortex beam 19 is needed, the angle of the half-wave plate 5 can be adjusted so that the included angle between the linear polarized beam generated by the half-wave plate 5 and the fast axis of the quarter-wave plate 7 is negative 45 degrees, so that the circular polarized beam generated by the quarter-wave plate 7 is the right-handed circular polarized beam 17. At this time, the first-order vortex plate 13 can be selected, or the second-order vortex plate 14 can be selected.

[0056] When the right-handed phase vortex beam 20 is needed, the angle of the half-wave plate 5 can be adjusted so that the included angle between the linear polarized beam generated by the half-wave plate 5 and the fast axis of the quarter-wave plate 7 is positive 45 degrees, so that the circular polarized beam generated by the quarter-wave plate 7 is the left-handed circular polarized beam 18. At this time, the first-order vortex plate 13 can be selected, or the second-order vortex plate 14 can be selected.

[0057] In further embodiments, the optical elements needed to generate the polarization vortex beam and the optical elements needed to generate the phase vortex beam only differ in the quarter-wave plate 7. During the inspection process, the vortex beam can be flexibly switched between the polarization vortex beam and the phase vortex beam by increasing or decreasing the quarter-wave plate 7, and the phase distribution of the light field can be changed.

[0058] In specific implementation, for the sample information inspection device, the quarter-wave plate 7 can be arranged in the form of plug-in, and the switching between the polarization vortex beam and the phase vortex beam can be realized by simple plug-in operation, which is simple to operate and is conducive to improving the inspection efficiency of the sample information.

[0059] In summary, the sample information inspection method provided by the embodiments of the present application utilizes the response difference of the sample and the background to the incident light, improves the signal-to-noise ratio of the sample echo light signal, enhances the contrast of the sample and the background, improves the display effect of the sample information, and obtains rich sample information. Moreover, by using a plurality of different types of vortex beams to irradiate the sample object 3, the sample object 3 and the sample of different materials can obtain better fluorescence display effect, improve the display clarity of the sample information, and have strong versatility.

[0060] In another aspect, based on the same general inventive concept, the utility model embodiment further provides a sample information inspection device, the sample information inspection device described below can be correspondingly referred to with the sample information inspection method described above.

[0061] As shown in the figure, the utility model embodiment provides a sample information inspection device, which comprises a light source module 1, a vortex light generation module 2 and a beam expansion module. Figures 1 to 5

[0062] Specifically, the light source module 1 is used to emit a laser beam, and the selection of the wavelength of the laser beam needs to correspond to the fluorescence characteristics of the detected sample information.

[0063] The vortex light generation module 2 is used to polarize and phase modulate the laser beam, so as to convert the laser beam into a vortex beam. The vortex beam is used to irradiate the sample object 3, so as to inspect the sample information.

[0064] The beam expansion module can collimate and expand the laser beam and / or the vortex beam, so as to increase the diameter of the vortex beam irradiated on the sample object 3, increase the size of the light spot formed on the sample object 3, expand the irradiation area of the sample information inspection device on the sample object 3, and increase the inspection efficiency.

[0065] When inspecting the sample information on the sample object 3, the sample object 3 is pretreated first, so that the sample on the sample object 3 forms a fluorescent complex 24. Then, the vortex beam emitted by the sample information inspection device provided by the utility model embodiment is used to irradiate the pretreated sample object 3, and the fluorescent complex 24 on the sample object 3 will emit fluorescence under the excitation of the vortex beam. According to the fluorescence formed on the sample object 3, the existence distribution of the sample on the sample object 3 can be determined. The equal phase surface of the vortex beam is a spiral phase wave front, the central light intensity is zero, and the light intensity is distributed in a ring shape. The use of the vortex beam introduces the orbital angular momentum, which can better utilize the polarization characteristics of different substances, increase the contrast between the position of the sample and the rest of the sample object 3 (referred to as the background), facilitate the differentiation between the sample and the background, improve the display effect of the sample information, and improve the display clarity of the sample information.

[0066] When the sample object 3 is irradiated by the vortex beam, the fluorescent complex 24 will emit fluorescence. In some embodiments, the inspector can directly observe the fluorescence effect on the sample object 3 by using a filter, which is conducive to quickly locking the position of the sample information on the sample object 3.

[0067] ​In some embodiments, the sample information checking device further comprises an image acquisition module 8, which is configured to lock the position of the sample information on the sample object 3 and acquire image information of the fluorescence on the sample object 3. After the image acquisition module 8 acquires the image information of the fluorescence, the image acquisition module 8 can be connected to the computer 25 to display, save and process the image information of the fluorescence. The computer 25 can further perform edge enhancement processing on the acquired image information, so as to obtain a clear original appearance of the sample.

[0068] The image acquisition module 8 comprises a filter 9 and a camera 10, and the filter 9 is located between the camera 10 and the sample object 3. The filter 9 is configured to filter out laser noise in the echo light, eliminate background light and stray light, and improve the signal-to-noise ratio.

[0069] The camera 10 is configured to acquire the image of the fluorescence. The camera 10 can be a charge-coupled device (CCD) camera.

[0070] The light source module 1 is a laser, and the laser beam emitted by the light source module 1 is a Gaussian beam. The light source module 1 can be, but is not limited to, a semiconductor laser, a dye laser, a quantum cascade laser, a solid-state laser, a gas laser, etc. The laser can adjust the wavelength of the laser beam emitted by the laser, and the peak wavelength can be selected according to the formed fluorescence complex excitation spectrum, so as to determine the wavelength of the laser beam required to be emitted by the laser.

[0071] In some embodiments, the beam expansion module can only expand the vortex beam, or the beam expansion module can expand both the laser beam and the vortex beam.

[0072] In this embodiment, the beam expansion module comprises a first beam expansion mirror 11 and a second beam expansion mirror 12. The first beam expansion mirror 11 is arranged between the vortex light generation module 2 and the light source module 1, and the first beam expansion mirror 11 can be used to collimate and expand the laser beam emitted by the light source module 1. The second beam expansion mirror 12 is arranged on the exit side of the vortex light generation module 2, and the second beam expansion mirror 12 can be used to expand the vortex beam.

[0073] In the embodiment of the utility model, the vortex light generation module 2 comprises a polarization device 4, a half-wave plate 5 and a vortex wave plate 6.

[0074] The polarization device 4 is configured to polarize the laser beam to obtain a linearly polarized light beam. The polarization device 4 can be, but is not limited to, a polarization beam splitter or a polarizer.

[0075] The half-wave plate 5 is used to adjust the polarization direction of the linearly polarized light beam to obtain a modulated linearly polarized light beam. The vortex wave plate 6 is used to perform phase modulation on the modulated linearly polarized light beam to convert the modulated linearly polarized light beam into a vortex light beam.

[0076] By adjusting the angle of the half-wave plate 5 and / or replacing the type of the vortex wave plate 6, the vortex wave plate 6 can emit a radial polarization vortex light beam 21 with the polarization direction oscillating along the radial direction in the cross section of the light field, an angular polarization vortex light beam 22 with the polarization direction oscillating perpendicularly to the radial direction in the cross section of the light field, and a high-order polarization vortex light beam 23 with the polarization direction being anisotropic in the cross section of the light field.

[0077] When the sample object 3 is irradiated with the polarization vortex light beam, the sample object 3 can be irradiated with the radial polarization vortex light beam 21, the angular polarization vortex light beam 22, and the high-order polarization vortex light beam 23 respectively, and the corresponding fluorescence effects can be observed respectively to obtain the best fluorescence effect.

[0078] The types of the vortex wave plate 6 include a first-order vortex wave plate 13, a second-order vortex wave plate 14, and the like classified according to the topological charge number.

[0079] Specifically, when the radial polarization vortex light beam 21 with the polarization direction oscillating along the radial direction in the cross section of the light field is needed, the angle of the half-wave plate 5 can be adjusted so that the linearly polarized light beam generated by the half-wave plate 5 is a horizontal linearly polarized light beam 15. At this time, the first-order vortex wave plate 13 needs to be selected, and the included angle between the zero-degree fast axis of the first-order vortex wave plate 13 and the horizontal linearly polarized light beam 15 is zero degrees.

[0080] When the angular polarization vortex light beam 22 with the polarization direction oscillating perpendicularly to the radial direction in the cross section of the light field is needed, the angle of the half-wave plate 5 can be adjusted so that the linearly polarized light beam generated by the half-wave plate 5 is a vertical linearly polarized light beam 16. At this time, the first-order vortex wave plate 13 needs to be selected, and the included angle between the zero-degree fast axis of the first-order vortex wave plate 13 and the vertical linearly polarized light beam 16 is 90 degrees.

[0081] When the high-order polarization vortex light beam 23 with the polarization direction being anisotropic in the cross section of the light field is needed, the angle of the half-wave plate 5 can be adjusted so that the linearly polarized light beam generated by the half-wave plate 5 is a horizontal linearly polarized light beam 15. At this time, the second-order vortex wave plate 14 needs to be selected, and the included angle between the zero-degree fast axis of the second-order vortex wave plate 14 and the horizontal linearly polarized light beam 15 is any angle.

[0082] Specifically, the half-wave plate 5 can be rotatably arranged between the polarizing device 4 and the vortex wave plate 6. By rotating the half-wave plate 5, the angle of the half-wave plate 5 can be adjusted.

[0083] The vortex wave plate 6 includes a first-order vortex wave plate 13 and a second-order vortex wave plate 14, and the topological charge number of the first-order vortex wave plate 13 is different from that of the second-order vortex wave plate 14. At this time, either one of the first-order vortex wave plate 13 and the second-order vortex wave plate 14 can be detachably arranged on the side of the half wave plate 5 away from the polarization device 4. One of the first-order vortex wave plate 13 and the second-order vortex wave plate 14 is installed on the side of the half wave plate 5 away from the polarization device 4 as needed.

[0084] In the embodiment of the utility model, the vortex light generating module 2 further includes a quarter wave plate 7, and the quarter wave plate 7 is arranged between the half wave plate 5 and the vortex wave plate 6. The quarter wave plate 7 is used for modulating the linearly polarized light beam into a circularly polarized light beam, and the vortex wave plate 6 is used for phase modulation on the circularly polarized light beam to convert the circularly polarized light beam into a vortex light beam.

[0085] In the case that the quarter wave plate 7 is arranged between the half wave plate 5 and the vortex wave plate 6, by adjusting the angle of the half wave plate 5 and / or replacing the type of the vortex wave plate 6, the vortex wave plate 6 can emit a left-handed phase vortex light beam 19 and a right-handed phase vortex light beam 20.

[0086] When the sample object 3 is irradiated by the phase vortex light beam, the sample object 3 can be irradiated by the left-handed phase vortex light beam 19 and the right-handed phase vortex light beam 20 respectively, and the corresponding fluorescence effects are observed respectively to obtain the best fluorescence effect.

[0087] Specifically, when the left-handed phase vortex light beam 19 is needed, the angle of the half wave plate 5 can be adjusted so that the included angle between the linearly polarized light beam generated by the half wave plate 5 and the fast axis of the quarter wave plate 7 is negative 45 degrees, so that the circularly polarized light beam generated by the quarter wave plate 7 is a right-handed circularly polarized light beam 17. At this time, the first-order vortex wave plate 13 can be selected, or the second-order vortex wave plate 14 can be selected.

[0088] When the right-handed phase vortex light beam 20 is needed, the angle of the half wave plate 5 can be adjusted so that the included angle between the linearly polarized light beam generated by the half wave plate 5 and the fast axis of the quarter wave plate 7 is positive 45 degrees, so that the circularly polarized light beam generated by the quarter wave plate 7 is a left-handed circularly polarized light beam 18. At this time, the first-order vortex wave plate 13 can be selected, or the second-order vortex wave plate 14 can be selected.

[0089] The optical elements required for generating the polarized vortex light beam and the optical elements required for generating the phase vortex light beam only differ in the quarter wave plate 7. During the inspection process, the vortex light beam can be switched between the polarized vortex light beam and the phase vortex light beam by increasing or decreasing the quarter wave plate 7.

[0090] In the embodiment, the quarter-wave plate 7 is detachably arranged between the half-wave plate 5 and the vortex wave plate 6. Specifically, the quarter-wave plate 7 can be arranged in a plug-in structure, and the switching between the polar vortex light beam and the phase vortex light beam can be realized through a simple plug-in operation, which is simple to operate and is conducive to improving the inspection efficiency of sample information.

[0091] In summary, the sample information inspection device provided in the embodiments of the present application utilizes the response difference of samples and backgrounds to incident light, improves the signal-to-noise ratio of sample echo light signals, enhances the contrast of samples and backgrounds, improves the display effect of sample information, and obtains rich sample information. Moreover, the sample object 3 can be irradiated by various vortex light beams of different types through adjustment, and the sample object 3 and the sample of different materials can obtain a better fluorescence display effect, improve the display clarity of sample information, and have strong versatility.

[0092] Specifically, the use method of the sample information inspection method and the sample information inspection device is described by taking the collection of a sweat latent fingerprint image as an example.

[0093] When the sweat latent fingerprint contacts the surface of the object, the amino acid carried by the fingerprint ridge line penetrates into the object along with the sweat. The amino acid molecules derived from the human body and the indanedione in the reagent are chemically reacted to obtain a fluorescent complex 24 after the amino acid sensitive reagent is sprayed on the surface of the sample object 3. The peak wavelength is selected according to the excitation spectrum of the fluorescent complex 24, and the wavelength of the laser beam required to be emitted by the laser is determined. If the wavelength of the required laser beam is 532 nanometers, a 532 nanometer laser can be selected as the light source module 1. By rotating the half-wave plate 5, replacing the type of the vortex wave plate 6, and disassembling the quarter-wave plate 7, the modulation of vortex light beams of different modes can be realized, and the generated vortex light beam irradiates the surface of the sample object 3. The sample object 3 usually has permeability, such as various types of paper, wood, stone, and brick. The fluorescent complex 24 on the sample object 3 radiates fluorescence under the irradiation of the external excitation light. Due to the Stokes shift, the wavelength of the fluorescence is longer than that of the excitation light source. A long-wave pass filter 9 is arranged at the receiving end of the fluorescence image information, which can cut off the laser noise and pass the fluorescence signal to form a brightness contrast. The fingerprint fluorescence image can be recorded and saved by using a camera 10.

[0094] Finally, it should be noted that: the above embodiments are only used to illustrate the technical solutions of the present application, but not to limit them; although the present application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that: it can still modify the technical solutions recorded in the foregoing embodiments, or make equivalent replacement to part of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present application.

Claims

1. A sample information inspection apparatus characterized by comprising: Comprising: a light source module (1) adapted to emit a laser beam; a vortex light generating module (2) adapted to polarize and phase modulate the laser beam to convert the laser beam into a vortex beam, the vortex beam being adapted to irradiate a sample object (3); a beam expanding module adapted to collimate and expand the laser beam and / or the vortex beam.

2. The sample information inspection apparatus according to claim 1, characterized by, The vortex light generating module (2) comprises: a polarization device (4) adapted to polarize the laser beam to obtain a linearly polarized beam; a half wave plate (5) adapted to adjust the polarization direction of the linearly polarized beam to obtain a modulated linearly polarized beam; a vortex wave plate (6) adapted to phase modulate the modulated linearly polarized beam to convert the modulated linearly polarized beam into the vortex beam.

3. The sample information inspection apparatus according to claim 2, characterized by The vortex wave plate (6) comprises a first-order vortex wave plate (13) and a second-order vortex wave plate (14), the topological charge number of the first-order vortex wave plate (13) being different from that of the second-order vortex wave plate (14); Any one of the first-order vortex wave plate (13) and the second-order vortex wave plate (14) is adapted to be detachably arranged on a side of the half wave plate (5) away from the polarization device (4).

4. The sample information inspection apparatus according to claim 2, characterized by The half wave plate (5) is rotatably arranged between the polarization device (4) and the vortex wave plate (6).

5. The sample information checking apparatus according to any one of claims 2 to 4, characterized by, The vortex light generating module (2) further comprises: a quarter wave plate (7) arranged between the half wave plate (5) and the vortex wave plate (6), the quarter wave plate (7) being adapted to modulate the modulated linearly polarized beam into a circularly polarized beam, and the vortex wave plate (6) being adapted to phase modulate the circularly polarized beam to convert the circularly polarized beam into the vortex beam.

6. The sample information inspection apparatus according to claim 5, characterized by The quarter wave plate (7) is detachably arranged between the half wave plate (5) and the vortex wave plate (6).

7. The sample information inspection apparatus according to any one of claims 1 to 4, characterized by Further comprising: an image acquisition module (8) adapted to acquire image information of fluorescence on the sample object (3).

8. The sample information inspection apparatus according to claim 7, characterized by The image acquisition module (8) comprises: a camera (10) adapted to acquire image information of fluorescence on the sample object (3); a filter (9) arranged on a side of the camera (10) facing the sample object (3), the filter (9) being adapted to filter out laser noise in echo light.

9. The sample information inspection apparatus according to claim 8, characterized by The camera (10) is a charge coupled device camera.

10. The sample information inspection apparatus according to claim 2, characterized by The polarization device (4) comprises a polarization beam splitter or a polarizer.

Images