Atomic force microscope positioning device

Abstract

The utility model relates to the technical field of atomic force microscopes, and discloses an atomic force microscope positioning device which comprises a mounting rack, a second threaded rod is movably arranged at the bottom end in the mounting rack, a rotating wheel is mounted at the bottom end of the second threaded rod, and a locking block is mounted at the top end of the second threaded rod. A supporting plate is arranged at the top end of the mounting frame, a guide seat is mounted at the bottom end of one side of the supporting plate, and a positioning plate is movably arranged on one side of the supporting plate. When the positioning device is used, the positioning device and the atomic force microscope need to be assembled together to form a whole for use, and the positioning device can be conveniently and quickly mounted on the atomic force microscope for use through the arrangement of the mounting frame, the locking block, the second threaded rod, the rotating wheel and other components which are matched with one another; and when the positioning device is not needed subsequently, disassembly and assembly are convenient, and use is more convenient.

Description

TECHNICAL FIELD

[0001] The utility model relates to atomic force microscope technical field, concretely is a kind of atomic force microscope positioning device. BACKGROUND

[0002] Atomic force microscope is a kind of instrument and equipment for researching the structure and property of matter surface, commonly used in nanomaterial, semiconductor and biological chemical industry etc., atomic force microscope needs to use positioning device to clamp and position sample when detecting sample, guarantee the stability when detecting sample subsequently, to guarantee the accuracy of the data detected.

[0003] Traditional atomic force microscope positioning device, when using, it is inconvenient to assemble with atomic force microscope to form a whole for positioning sample, and it is also inconvenient to disassemble when not needing positioning subsequently. Therefore, we propose an atomic force microscope positioning device to improve the above problems. UTILITY MODEL CONTENT

[0004] The utility model aims at providing an atomic force microscope positioning device to solve the problems in the above background.

[0005] To achieve the above object, the utility model provides the following technical scheme: an atomic force microscope positioning device, including mounting frame, the bottom end of the inside of mounting frame movably provided with second threaded rod, the bottom end of second threaded rod is installed with steering wheel, the top of second threaded rod is installed with locking block, the top of mounting frame is provided with support plate, the bottom end of support plate one side is all installed with guide seat, the one side of support plate is movably provided with positioning plate.

[0006] Preferably, the mounting frame is provided with two groups, and the two groups of mounting frames are the same size.

[0007] Preferably, the inside bottom end of the mounting frame is uniformly provided with internal threads at the middle position, and the mounting frame and the second threaded rod are connected by screw threads.

[0008] Preferably, the top of the mounting frame is provided with a connecting seat on one side, the inside of the connecting seat is movably provided with an adjusting plate, and the top of the adjusting plate is fixed to the bottom end of the guide seat, a third threaded rod is movably arranged at the top of one side of the connecting seat, a fixed block is arranged on one side of the third threaded rod, and a rotating ball is arranged on the other side of the third threaded rod.

[0009] Preferably, the cross section of the adjusting plate is smaller than the cross section of the connecting seat, and the adjusting plate and the connecting seat form a sliding structure.

[0010] Preferably, the inside of the support plate is movably provided with a first threaded rod, one side of the first threaded rod is provided with a handle, and the other side of the first threaded rod is movably provided with a positioning plate, the bottom of one side of the positioning plate is provided with a connecting rod, and one side of the connecting rod is provided with a guide rod.

[0011] Preferably, the cross section of the guide rod is larger than the cross section of the guide seat, and the guide rod and the guide seat form a sliding structure.

[0012] Preferably, the surface of the positioning plate is provided with a plurality of rubber protrusions, and the plurality of rubber protrusions are distributed at equal intervals on the surface of the positioning plate.

[0013] Compared with the prior art, the positioning device of the atomic force microscope has the advantages that: the positioning device is convenient for assembling the atomic force microscope, use is more convenient, positioning of samples of different sizes is facilitated, and the height of positioning can be adjusted according to the height of the sample.

[0014] (1) The positioning device is assembled with the atomic force microscope to form an integral whole for use, the installation frame, the locking block, the second threaded rod and the rotating wheel and other components are arranged, the components are matched with each other, the positioning device can be conveniently and quickly installed on the atomic force microscope for use, and the positioning device can be conveniently disassembled when not needed, and use is more convenient.

[0015] (2) When the positioning device is installed on the atomic force microscope to position the sample, the positioning plate can be moved left and right according to actual needs, the distance between the positioning plates is changed, different lengths of samples can be positioned, and the positioning adaptability is greatly increased.

[0016] (3) During positioning of the sample, the positioning position required by the sample height is different, different positioning positions can stably position samples of different heights, the connecting seat, the fixing block and the adjusting plate and other components are arranged, the height of the positioning plate can be adjusted according to actual needs during positioning of the sample, and the use effect is better. BRIEF DESCRIPTION OF DRAWINGS

[0017] Figure 1 It is a front view of the partial cross-sectional structure of the utility model;

[0018] Figure 2 It is a front view of the partial cross-sectional structure of the utility model; Figure 1 It is an enlarged structure schematic view of the section A of the utility model;

[0019] Figure 3The utility model discloses a top view structure schematic diagram.

[0020] Figure 4 It is the connecting seat front view section structure schematic diagram of the utility model.

[0021] In the drawing: 1, mounting frame, 2, support plate, 3, handle, 4, positioning plate, 5, first threaded rod, 6, connecting rod, 7, guide rod, 8, connecting seat, 9, locking block, 10, second threaded rod, 11, runner, 12, rotating ball, 13, third threaded rod, 14, fixed block, 15, adjusting plate, 16, guide seat. Specific implementation

[0022] The technical scheme in the embodiments of the utility model will be clearly and completely described below with reference to the drawings in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model and not all the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by those skilled in the art without creative labor fall within the scope of the utility model.

[0023] Please refer to Figures 1-4 The utility model provides an embodiment: an atomic force microscope positioning device, including mounting frame 1, the bottom movable setting of inside mounting frame 1 has second threaded rod 10, the bottom of second threaded rod 10 is installed with runner 11, the top of second threaded rod 10 is installed with locking block 9, the inside bottom of mounting frame 1 is evenly provided with internal thread at the middle position, mounting frame 1 and second threaded rod 10 between constitute threaded connection, it is convenient to stably push locking block 9 and move up and down, the top of mounting frame 1 is provided with support plate 2, the bottom of the one side of support plate 2 is installed with guide seat 16, the one side of support plate 2 is movably provided with positioning plate 4, mounting frame 1 is provided with two groups, two groups mounting frame 1 are same in size, and it is convenient to install respectively on the both sides of sample placing table and carry out positioning work to sample;

[0024] Specifically, as Figure 1 And Figure 3 Shown, take two groups mounting frame 1 and install it to the both sides of atomic force microscope sample placing table in turn, after mounting frame 1 is clamped well, runner 11 is rotated to make second threaded rod 10 rotate and push locking block 9 and move up and lock mounting frame 1 that is clamped well, make mounting frame 1 stably install on the both sides of sample placing table, reverse rotation runner 11 when subsequent dismounting makes second threaded rod 10 move down and then can pull locking block 9 and move down and open the locking of mounting frame 1, so that mounting frame 1 is dismounted from sample placing table.

[0025] The side of the top end of the mounting frame 1 is provided with a connecting seat 8, the inner part of the connecting seat 8 is movably provided with an adjusting plate 15, the top end of the adjusting plate 15 is fixed with the bottom end of a guide seat 16, the top end of the inner side of the connecting seat 8 is movably provided with a third threaded rod 13, the side of the third threaded rod 13 is provided with a fixed block 14, the other side of the third threaded rod 13 is provided with a rotating ball 12, the cross section of the adjusting plate 15 is smaller than the cross section of the connecting seat 8, the adjusting plate 15 and the connecting seat 8 form a sliding structure, the adjusting plate 15 is stably pushed to move upwards to push the positioning plate 4 to stably move upwards and downwards.

[0026] Specifically, as shown in Figure 1 and Figure 3 , after the sample is placed on the sample placing table above the atomic force microscope, the rotating knob 3 is rotated to rotate the first threaded rod 5, the positioning plate 4 is pushed to move towards the two sides of the sample and is attached to the two sides of the sample to position the sample through the sliding of the guide rod 7 outside the sidewall of the guide seat 16.

[0027] The inner part of the supporting plate 2 is movably provided with a first threaded rod 5, the side of the first threaded rod 5 is provided with a rotating knob 3, the other side of the first threaded rod 5 is movably provided with a positioning plate 4, the bottom end of the side of the positioning plate 4 is provided with a connecting rod 6, the side of the connecting rod 6 is provided with a guide rod 7, the cross section of the guide rod 7 is larger than the cross section of the guide seat 16, the guide rod 7 and the guide seat 16 form a sliding structure, the sliding structure can stably push the positioning plate 4 to move left and right, the surface of the positioning plate 4 is provided with a plurality of rubber protrusions, the plurality of rubber protrusions are distributed at equal intervals on the surface of the positioning plate 4, the friction between the positioning plate 4 and the sample is increased, and the stability of the positioning plate 4 to the sample is greatly increased.

[0028] Specifically, as shown in Figure 1 , Figure 2 , and Figure 4 , when the positioning height of the positioning plate 4 is adjusted, the rotating knob 3 is rotated to rotate the third threaded rod 13 to pull the fixed block 14 to move to one side to open the limiting of the adjusting plate 15, then the adjusting plate 15 is pulled upwards or is pushed downwards to adjust the height of the positioning plate 4, and then the rotating knob 3 is rotated to rotate the third threaded rod 13 to push the fixed block 14 to lock the adjusting plate 15.

[0029] Working principle: the utility model discloses when using, take two groups of mounting frame 1 and install it to the sample placing table of atomic force microscope, when installing, after the good clamping of mounting frame 1, rotate the rotating wheel 11 to make the second threaded rod 10 rotate and push the locking block 9 to move upwards to lock the clamped mounting frame 1, after the installation of mounting frame 1, take the sample to be detected and place it to the middle position above the sample placing table, and rotate the handle 3 to make the first threaded rod 5 rotate and can be through the sliding of guiding rod 7 outside the sliding of guiding seat 16 lateral wall and push the positioning plate 4 to move towards the two sides of sample and stick to the two sides of sample to position the sample, and when positioning the sample, according to actual demand, rotate the rotating ball 12 to make the third threaded rod 13 rotate and pull the fixed block 14 to move to one side and open the limiting of adjusting plate 15, then can pull adjusting plate 15 upwards or push adjusting plate 15 downwards to adjust the height of positioning plate 4 and position the sample of different height.

[0030] It is obvious for those skilled in the art that the utility model is not limited to the details of the above exemplary embodiments, and the utility model can be realized in other specific forms without departing from the spirit or basic features of the utility model. Therefore, no matter from which point, the embodiments should be regarded as exemplary and non-restrictive, the scope of the utility model is defined by the appended claims instead of the above description, and all changes falling within the meaning and scope of the equivalent elements of the claims should be included in the utility model. Any reference signs in the claims should not be regarded as limiting the involved claims.

Claims

1. An atomic force microscope positioning device comprising a mounting frame (1), characterised in that: The bottom end of the inside of the mounting frame (1) is movably provided with a second threaded rod (10), the bottom end of the second threaded rod (10) is provided with a rotating wheel (11), the top end of the second threaded rod (10) is provided with a locking block (9), the top end of the mounting frame (1) is provided with a supporting plate (2), the bottom end of one side of the supporting plate (2) is provided with a guide seat (16), and the one side of the supporting plate (2) is movably provided with a positioning plate (4).

2. An atomic force microscope positioning device according to claim 1, wherein: The mounting frame (1) is provided with two groups, and the two groups of mounting frames (1) are the same size.

3. The atomic force microscope positioning apparatus of claim 1, wherein: The inside of the bottom end of the mounting frame (1) is uniformly provided with an internal thread, and the mounting frame (1) and the second threaded rod (10) are threadedly connected.

4. The atomic force microscope positioning apparatus of claim 1, wherein: The top end of the mounting frame (1) is provided with a connecting seat (8), the inside of the connecting seat (8) is movably provided with an adjusting plate (15), the top end of the adjusting plate (15) is fixedly connected with the bottom end of the guide seat (16), the top end of one side of the inside of the connecting seat (8) is movably provided with a third threaded rod (13), one side of the third threaded rod (13) is provided with a fixed block (14), and the other side of the third threaded rod (13) is provided with a rotating ball (12).

5. An atomic force microscope positioning device according to claim 4, wherein: The cross section of the adjusting plate (15) is smaller than that of the connecting seat (8), and the adjusting plate (15) and the connecting seat (8) form a sliding structure.

6. The atomic force microscope positioning apparatus of claim 1, wherein: The inside of the supporting plate (2) is movably provided with a first threaded rod (5), one side of the first threaded rod (5) is provided with a rotating handle (3), the other side of the first threaded rod (5) is movably provided with a positioning plate (4), the bottom end of one side of the positioning plate (4) is provided with a connecting rod (6), and one side of the connecting rod (6) is provided with a guide rod (7).

7. An atomic force microscope positioning device according to claim 6, wherein: The cross section of the guide rod (7) is larger than that of the guide seat (16), and the guide rod (7) and the guide seat (16) form a sliding structure.

8. An atomic force microscope positioning device according to claim 6, wherein: The surface of the positioning plate (4) is provided with a plurality of rubber protrusions, and the plurality of rubber protrusions are distributed at equal intervals on the surface of the positioning plate (4).

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