A repeatable read-write method based on two-dimensional material
By employing multi-mode manipulation of atomic force microscopy, information can be repeatedly read and written on two-dimensional materials, solving the problem of easy loss within the imprint, increasing storage density and reducing material loss.
Patent Information
- Application Number
- CN202310651543.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2023-06-02
- Publication Date
- 2026-01-02
- Estimated Expiration
- 2043-06-02
AI Technical Summary
Existing technologies make it difficult to achieve reusable reading and writing of information on two-dimensional materials, and the imprints are easily lost.
Using contact, tapping, and lateral force modes of atomic force microscopy, a flat two-dimensional material is prepared by mechanical peeling. The pattern is imprinted using the tapping mode, and the initial friction is restored using the lateral force mode to achieve reusable reading and writing.
It enables reusable reading and writing of two-dimensional materials, is simple to operate, has a high storage density, and reduces material loss.
Smart Images
Figure CN116482409B_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The application belongs to the technical field of information storage, and particularly relates to a repeatable read-write method based on two-dimensional materials. BACKGROUND
[0002] Compared with optical microscopes and electron microscopes, atomic force microscopes can scan the topography of a sample in a non-vacuum environment and measure the height and friction of micro materials. Therefore, the atomic force microscopes are widely used in the fields of aerospace, material science and microelectronics. As one of the main working modes of atomic force microscopes, the tapping mode greatly reduces the interaction force between the needle tip and the sample, compared with the contact mode, because the probe intermittently contacts the sample in the tapping mode.
[0003] The atomic force microscope can obtain the friction force map of the nanomaterial in the contact tapping mode, which is used as the main basis for nano imprinting. SUMMARY
[0004] In view of the above problems in the prior art, the present application provides a repeatable read-write method based on two-dimensional materials, which realizes repeatable read-write imprinting of two-dimensional materials.
[0005] To achieve the above-mentioned purposes, the technical scheme adopted by the present application is as follows: a repeatable read-write method based on two-dimensional materials, comprising the following steps:
[0006] S1. Preparing raw materials into microscopically flat two-dimensional materials;
[0007] S2. Scanning the two-dimensional materials by the contact mode of the atomic force microscope, characterizing the friction of the two-dimensional materials, obtaining the initial friction of the nanoblackboard and the scanning area;
[0008] S3. Scanning the nanoblackboard by the tapping mode of the atomic force microscope, changing the surface contact quality of the nanoblackboard without changing the topography of the two-dimensional materials, realizing pattern imprinting, and obtaining the imprinted nanoblackboard;
[0009] S4. Scanning the imprinted nanoblackboard by the contact mode of the atomic force microscope, obtaining the friction force map containing image information, and realizing pattern reading;
[0010] S5. Scanning the imprinted nanoblackboard by the lateral force mode of the atomic force microscope, restoring the friction of the scanning area to the initial friction, and realizing repeatable read-write.
[0011] The present application has the advantages that two-dimensional materials are used as storage materials, and the tapping mode, the contact mode and the lateral force mode of the atomic force microscope are used to realize information input, reading and erasing on the two-dimensional materials, and the present application has the advantages of repeatable read-write, simple operation and large storage density.
[0012] Further, the step S1 is specifically to attach the raw material on the silicon substrate by mechanical exfoliation method, and find out the regular thin layer by metallographic microscope to obtain the two-dimensional material with flat appearance.
[0013] The above further scheme has the beneficial effect that the regular thin surface in the two-dimensional material is selected by the metallographic microscope to avoid the loss of the engraved content due to the unevenness of the material.
[0014] Further, the nano blackboard in the step S2 is the scanning area of the contact mode of the atomic force microscope on the two-dimensional material.
[0015] The above further scheme has the beneficial effect that the knocking mode of the atomic force microscope changes the contact quality of the surface of the two-dimensional material, the friction force changes, and the pressed area and the unpressed area present different friction force sizes in the friction force diagram.
[0016] Further, the step S3 is specifically to use the knocking mode of the atomic force microscope, to perform multiple scans on the nano blackboard by setting different scanning sizes and proportions, to change the contact quality of different areas on the nano blackboard, to perform pattern engraving on the nano blackboard, and to obtain the engraved nano blackboard.
[0017] The above further scheme has the beneficial effect that the scanning size and proportion are adjusted to repeatedly scan the nano blackboard, so that the required pattern can be obtained, and the singularity of the engraved pattern is avoided.
[0018] Further, the step S5 is specifically to perform multiple horizontal scans on the engraved nano blackboard as a whole by the side force mode of the atomic force microscope, to change the surface contact quality of the scanning area, to restore the friction force of the scanning area to the initial friction force, so as to remove the engraved pattern and realize the repeatable reading and writing of the two-dimensional material.
[0019] The above further scheme has the beneficial effect that the engraved pattern nano blackboard is horizontally scanned as a whole by the knocking mode of the atomic force microscope, the friction force of the engraved pattern is restored, the engraved pattern on the nano blackboard is eliminated, the repeatable reading and writing of the two-dimensional material is realized, and the material loss is reduced. BRIEF DESCRIPTION OF DRAWINGS
[0020] Figure 1 The method flowchart of the present application.
[0021] Figure 2 The operation flowchart of the "knocking mode" in the embodiment of the present application.
[0022] Figure 3 The array height friction force diagram in the embodiment of the present application.
[0023] Figure 4 For the friction force comparison before and after scanning in the embodiment of the present application.
[0024] Figure 5 For the test schematic diagram of different scanning sizes in the embodiment of the present application.
[0025] Figure 6 For the "1+1" pattern in the friction force diagram in the embodiment of the present application.
[0026] Figure 7 For the 3D view of the "1+1" friction force diagram in the embodiment of the present application.
[0027] Figure 8 For the comparison of the storage density per inch of the nano blackboard in the embodiment of the present application. DETAILED DESCRIPTION
[0028] The specific embodiments of the present application are described below to facilitate the understanding of the present application by those skilled in the art, but it should be clear that the present application is not limited to the scope of the specific embodiments, and for those skilled in the art, it is obvious that various changes are within the spirit and scope of the present application defined and determined by the appended claims, and all the inventions utilizing the concept of the present application are within the scope of protection.
[0029] As shown in Figure 1 , in one embodiment of the present application, a repeatable read-write method based on two-dimensional material includes the following steps:
[0030] S1, preparing raw materials into micro-flat two-dimensional materials;
[0031] S2, scanning the two-dimensional material by the contact mode of the atomic force microscope, characterizing the friction force of the two-dimensional material, obtaining the initial friction force of the nano blackboard and the scanning area;
[0032] S3, scanning the nano blackboard by the tapping mode of the atomic force microscope, changing the surface contact quality of the nano blackboard without changing the topography of the two-dimensional material, realizing pattern printing, and obtaining the printed nano blackboard;
[0033] S4, scanning the printed nano blackboard using the contact mode of the atomic force microscope, obtaining the friction force diagram containing image information, realizing pattern reading;
[0034] S5, multiple transverse scanning of the printed nano blackboard as a whole by the lateral force mode of the atomic force microscope, restoring the friction force of the scanning area to the initial friction force, realizing repeatable read-write.
[0035] The step S1 is specifically to attach the raw material on the silicon substrate by mechanical exfoliation method, and find out the regular thin layer by metallographic microscope to obtain the two-dimensional material with flat appearance.
[0036] In this embodiment, the step S1 is to attach the raw material on the silicon substrate by mechanical exfoliation method, and find out the regular thin layer by metallographic microscope to obtain the thin layer sample with flat micro-appearance. The raw material can be graphene, molybdenum disulfide or hexagonal boron nitride.
[0037] The nano blackboard in the step S2 is the scanning area of the atomic force microscope in the contact mode on the two-dimensional material.
[0038] In this embodiment, the two-dimensional material is scanned by the contact mode of the atomic force microscope (AFM) to obtain the friction force map of the scanning area. Since the contact quality of the material surface is changed after the knock mode scanning, the friction is enhanced, and the pressed area and the unpressed area present different friction forces in the friction force map. This step can print the blackboard pattern on the two-dimensional material, which can be expressed as a binary pattern or a specific image. Figure 2 The operation flow chart of the knock mode is shown in FIG. 2. Figure 3 A simple array height friction force map is shown in FIG. 3. Figure 4 The variation curve of the friction in the array height friction force map is shown in FIG. 4.
[0039] The step S3 is specifically to use the knock mode of the atomic force microscope to scan the nano blackboard multiple times by setting different scanning sizes and proportions, change the contact quality of different areas on the nano blackboard, and perform pattern printing on the nano blackboard to obtain the printed nano blackboard.
[0040] In this embodiment, the step S3 is to change the scanning size and proportion multiple times, and the friction of the scanning area is increased after multiple scans, and a pattern is presented in the friction force map. Different patterns are spliced to realize a complex printing, so that the surface of the nano blackboard presents a specific pattern. The proportion of the nano blackboard is changed, as shown in FIG. 5. Figure 5 The pattern after the scanning size of 2.5 microns and the proportion of 1:10 is set is shown in FIG. 6. In this embodiment, the "1+1" pattern is presented on the nano blackboard. Figure 6 , Figure 7 The "1+1" friction force map and the 3D view of the "1+1" friction force map are shown in FIGS. 7 and 8, respectively.
[0041] The step S5 is specifically to perform multiple horizontal scans on the printed nano blackboard as a whole by the lateral force mode of the atomic force microscope, change the surface contact quality of the scanning area, restore the friction of the scanning area to the initial friction, and thus remove the printed pattern to realize the repeatable reading and writing of the two-dimensional material.
[0042] In the embodiment, the scanning area is restored to the friction force before the engraving by scanning the whole nano blackboard after the engraving for multiple times, the pattern on the nano blackboard is removed, and the pattern can be engraved again.
[0043] In the embodiment, as shown in Figure 8 The storage density per inch of the nano blackboard using different raw materials for the application is compared, and the storage density per inch of graphene is 1600 GB / m 2 , which is superior to other storage media.
Claims
1. A method of repeatable read-write based on two-dimensional material, characterized in that, The method comprises the following steps: S1, preparing raw materials into micro-flat two-dimensional materials; S2, scanning the two-dimensional materials by the contact mode of an atomic force microscope to characterize the friction of the two-dimensional materials, and obtaining the initial friction of the nano blackboard and the scanning area; S3, scanning the nano blackboard by the tapping mode of the atomic force microscope to change the surface contact quality of the nano blackboard without changing the morphology of the two-dimensional materials, realize pattern imprinting, and obtain the imprinted nano blackboard; S4, scanning the imprinted nano blackboard by the contact mode of the atomic force microscope to obtain a friction map containing image information, and realize pattern reading; S5, performing multiple transverse scans on the imprinted nano blackboard as a whole by the lateral force mode of the atomic force microscope to restore the friction of the scanning area to the initial friction, and realize repeatable reading and writing. 2.The method of claim 1, wherein, The step S1 is specifically to attach the raw materials to a silicon substrate by a mechanical exfoliation method, and find out regular thin layers by a metallographic microscope to obtain two-dimensional materials with flat morphology. 3.The method of claim 1, wherein, The nano blackboard in the step S2 is a scanning area of the contact mode of the atomic force microscope on the two-dimensional materials. 4.The method of claim 1, wherein, The step S3 is specifically to use the tapping mode of the atomic force microscope to perform multiple scans on the nano blackboard by setting different scanning sizes and proportions, change the contact quality of different areas on the nano blackboard, perform pattern imprinting on the nano blackboard, and obtain the imprinted nano blackboard. 5.The method of claim 1, wherein, The step S5 is specifically to perform multiple transverse scans on the imprinted nano blackboard as a whole by the lateral force mode of the atomic force microscope, change the surface contact quality of the scanning area, restore the friction of the scanning area to the initial friction, and thus remove the imprinted pattern, realize repeatable reading and writing of the two-dimensional materials.