Probe bending device

Abstract

The utility model discloses a probe bending device, which relates to the technical field of probe bending and comprises a support frame, a rotating mechanism, a probe base and a limiting plate. The supporting frame comprises a bottom plate and supporting plates arranged on the two sides of the bottom plate, the supporting plates are provided with circular holes penetrating through the supporting plates, and a supporting base is arranged at the top of the bottom plate. The limiting plate is arranged at the top of the supporting seat, a limiting groove is formed in the top of the limiting plate, the probe base is placed in the limiting groove, a row of inserting holes are formed in the top of the probe base in an array mode, and to-be-bent probes are placed in the inserting holes in advance; the rotating mechanism comprises a rotating assembly, two assembling rings and a bending plate, a circle of groove is formed in the arc-shaped outer wall of each assembling ring, the assembling rings are rotationally arranged in the corresponding circular holes, the rotating assembly is connected with one assembling ring and used for rotating the assembling ring, the end of the bending plate is connected to the inner side of the assembling ring, and the bending plate is located above the probe base and used for rotating the assembling ring. When the bending plate rotates along with the assembling ring, the bending plate is used for bending a row of probes. According to the scheme, the probe can be bent into various angles, and the applicability is wide.

Description

TECHNICAL FIELD

[0001] The utility model relates to probe bending technical field especially relates to a probe bending device. BACKGROUND

[0002] The probe is a kind of high-end electronic type precision hardware component, mainly as the contact medium of electric test. In order to better adapt to the test environment of different space restrictions, especially in narrow or complex space, the probe of bending can meet the test demand. The probe bending equipment in the prior art faces challenges in practical application, the main problem is: a device can usually only bend the probe into a specific angle, lack of flexibility, so that the versatility and adaptability of the device are restricted. Therefore, a bending device capable of supporting multiple bending angles needs to be developed. SUMMARY

[0003] To solve the technical problems of the prior art, the utility model provides a kind of probe bending device, can bend the probe into multiple angles.

[0004] In order to realize the purpose of the utility model, the following scheme is adopted:

[0005] A kind of probe bending device, including support frame, rotating mechanism, probe base and limit plate.

[0006] Support frame includes bottom plate and support plate arranged on both sides of bottom plate, support plate is provided with circular hole penetrating itself, bottom plate top is provided with support seat;

[0007] Limit plate is arranged on the top of support seat, limit slot is arranged on the top of limit plate, and the probe base is placed in the limit slot, the probe base top array has a row of jack, and the probe to be bent is placed in the jack in advance;

[0008] Rotating mechanism includes rotating assembly, two assembly rings and bending plate, the arc-shaped outer wall of assembly ring is provided with a circle of grooves, the assembly ring is rotatably arranged in the corresponding circular hole, the rotating assembly is connected with one of the assembly rings, for rotating the assembly ring, the bending plate is connected to the inner side of the assembly ring, and the bending plate is located above the probe base, when the bending plate rotates with the assembly ring, a row of probes are bent.

[0009] The utility model has the advantages that the bending device structure is ingenious, the rotating mechanism can rotate the bending plate by a certain angle, so that a row of probes can be bent by a certain angle at the same time, the bending efficiency is high, the size of the rotating angle of the bending plate determines the size of the probe bending angle, and the problem that the probe can only be bent into a specific angle in the existing device is solved. BRIEF DESCRIPTION OF DRAWINGS

[0010] Figure 1 The bending device structure diagram is shown;

[0011] Figure 2 A front view of the bending device is shown;

[0012] Figure 3 A structural view of the bending device with the clamping assembly is shown;

[0013] Figure 4 A top view of the inside of the housing is shown. DETAILED DESCRIPTION

[0014] As shown in Figure 1 , Figure 2 , the embodiment provides a probe bending device, which comprises a support frame 1, a rotating mechanism 2, a probe base 3 and a limiting plate 4.

[0015] Specifically, the support frame 1 comprises a bottom plate 11 and two support plates 12, which are respectively arranged on both sides of the bottom plate 11. The support plate 12 is provided with a circular hole penetrating through itself. The top of the bottom plate 11 is provided with a support seat 13. The limiting plate 4 is arranged on the top of the support seat 13. The top of the limiting plate 4 is provided with a limiting groove 41, which is used for placing the probe base 3. The probe base 3 is tightly attached to the inner wall of the limiting groove 41. The long axis of the limiting groove 41 is parallel to the central axis of the circular hole. The top of the probe base 3 is arrayed with a row of insertion holes, in which the probes to be bent are pre-inserted.

[0016] Specifically, the rotating mechanism 2 comprises a rotating assembly 21, two assembly rings 22 and a bending plate 23. The arc-shaped outer wall of the assembly ring 22 is provided with a ring of grooves. The assembly ring 22 is rotatably arranged in the corresponding circular hole, and the inner wall of the groove is tightly attached to the support plate 12. The rotating assembly 21 is arranged on one of the support plates 12 and connected to the assembly ring 22 on the support plate 12, for rotating the assembly ring 22 by a certain angle. The two ends of the bending plate 23 are respectively connected to the inner side of the corresponding assembly ring 22. The bending plate 23 is located above the probe base 3. When the bending plate 23 rotates with the assembly ring 22, it is used for bending a row of probes.

[0017] There are many implementation modes of the rotating assembly 21. The embodiment adopts the following mode: the rotating assembly 21 comprises a linear stroke component 211, a rack 212 and a gear ring 213. The gear ring 213 is coaxially arranged outside one of the assembly rings 22. The rack 212 is engaged with the bottom of the gear ring 213. The rack 212 is horizontally slidably arranged in the guide groove on the top of the guide plate 214. The guide plate 214 and the linear stroke component 211 are both connected to the support plate 12. The linear stroke component 211 is connected to the rack 212 through a vertical bar, for horizontally moving the rack 212. The linear stroke component 211 can be realized by a mode of a telescopic rod driven by a gas cylinder or an oil cylinder.

[0018] The using method is as follows: the probe base 3 with the inserted probe is placed in the limiting groove 41, after being placed, the bent plate 23 is located at the side of the probe, and the bottom surface of the bent plate 23, the top surface of the probe base 3 and the central axis of the assembling ring 22 are located on the same horizontal plane, the side wall of the bent plate 23 facing the probe is close to the probe, and the side wall and the central axis are located on the same vertical plane; then the linear stroke component 211 is used to horizontally move the rack 212, so as to drive the gear ring 213, the two assembling rings 22 and the bent plate 23 to rotate as a whole, and the rotating angle of the bent plate 23 determines the angle of the bent probe.

[0019] In order to place or take out the probe base 3 in the limiting groove 41 more conveniently, the embodiment takes the following measures: a plurality of pneumatic lifting rods are arranged in the support base 13, the top of the pneumatic lifting rod is connected with the limiting plate 4, and the height of the limiting plate 4 is adjusted, and the pneumatic lifting rod is a conventional technology, so the structure thereof is not shown in detail.

[0020] In use, the probe base 3 with the inserted probe is placed in the limiting groove 41, then the pneumatic lifting rod is used to move the limiting plate 4 upwards until the bottom surface of the bent plate 23 is close to the top surface of the probe base 3.

[0021] In order to ensure that the probe base 3 is in a stable state and cannot be moved randomly, the embodiment further adds a clamping assembly for clamping and fixing the probe base 3, and the specific implementation manner of the clamping assembly is as follows:

[0022] As shown in Figure 3 , Figure 4 , the clamping assembly comprises a hand wheel 51, an outer shell 52, a first bevel gear 53 and two symmetrically arranged clamping pieces, the outer shell 52 is fixedly arranged on one side wall of the limiting plate 4, the side wall of the limiting plate 4 is provided with two symmetric through grooves, each clamping piece comprises a second bevel gear 54, a lead screw 55 and a clamping plate 56, one end of the lead screw 55 is rotatably connected to the outer shell 52, the other end of the lead screw 55 is coaxially fixedly connected to the second bevel gear 54, the limiting groove 41 penetrates through the limiting plate 4 along the long axis direction, the two clamping plates 56 are respectively located at the two ends of the probe base 3, one end of the clamping plate 56 is matched in the limiting groove 41, the other end of the clamping plate 56 extends to the outer shell 52 through the corresponding through groove and is threadedly connected to the corresponding lead screw 55, the first bevel gear 53 is located in the outer shell 52 and meshes with the two second bevel gears 54, the first bevel gear 53 is located between the two second bevel gears 54, the hand wheel 51 is located outside the outer shell 52, the hand wheel 51 is connected to the first bevel gear 53 through a rotating shaft, and the rotating shaft is rotatably connected to the outer shell 52.

[0023] In use, the probe base 3 with the probe inserted in advance is placed in the limiting groove 41; then the staff rotates the hand wheel 51, so that the first bevel gear 53 rotates, and then the two second bevel gears 54 rotate, and under the action of the lead screw 55, the two clamping plates 56 are gathered to clamp and fix the probe base 3; then the pneumatic lifting rod is used to move the limiting plate 4 upwards until the bottom surface of the bending plate 23 tightly abuts against the top surface of the probe base 3.

[0024] The above examples are only used for illustrating the technical idea and characteristics of the utility model, and do not represent the only or limit the utility model. Those skilled in the art should understand that various changes or equivalent replacements made to the utility model without departing from the scope of the utility model all belong to the protection scope of the utility model.

Claims

1. A probe bending apparatus characterized by comprising: Support frame (1), rotating mechanism (2), probe base (3) and limiting plate (4) are included. The support frame (1) includes a bottom plate (11) and support plates (12) arranged on both sides of the bottom plate (11). The support plates (12) are provided with circular holes penetrating through the support plates (12) themselves. The top of the bottom plate (11) is provided with a support seat (13). The limiting plate (4) is arranged on the top of the support seat (13). The top of the limiting plate (4) is provided with a limiting groove (41) for placing the probe base (3). The top of the probe base (3) is arrayed with a row of insertion holes, in which the probes to be bent are placed in advance. The rotating mechanism (2) includes a rotating assembly (21), two assembly rings (22) and a bending plate (23). The arc-shaped outer wall of the assembly ring (22) is provided with a groove. The assembly ring (22) is rotatably arranged in the corresponding circular hole. The rotating assembly (21) is connected to one of the assembly rings (22) and is used to rotate the assembly ring (22). The bending plate (23) is connected to the inner side of the assembly ring (22) and is located above the probe base (3). When the bending plate (23) rotates with the assembly ring (22), it is used to bend a row of probes.

2. The probe bending apparatus according to claim 1, characterized by The rotating assembly (21) includes a linear motion component (211), a rack (212) and a gear ring (213). The gear ring (213) is arranged on the outer side of one of the assembly rings (22). The rack (212) is engaged with the gear ring (213). The rack (212) is slidably arranged in the guide groove on the top of the guide plate (214). The guide plate (214) and the linear motion component (211) are both connected to the support plate (12). The linear motion component (211) is used to move the rack (212).

3. The probe bending apparatus according to claim 1, wherein The bending plate (23) is located on one side of the probe. The bottom surface of the bending plate (23), the top surface of the probe base (3) and the central axis of the assembly ring (22) are located on the same horizontal plane. The side wall of the bending plate (23) facing the probe is in close contact with the probe. The side wall of the bending plate (23) and the central axis of the assembly ring (22) are located on the same vertical plane.

4. The probe bending apparatus according to claim 3, characterized by The support seat (13) is provided with a pneumatic lifting rod. The top of the pneumatic lifting rod is connected to the limiting plate (4) and is used to adjust the height of the limiting plate (4).

5. The probe bending apparatus according to claim 1, wherein The clamping assembly is also included and is used to clamp and fix the probe base (3).

6. The probe bending apparatus according to claim 5, wherein The limiting groove (41) penetrates the limiting plate (4) along the long axis direction, the clamping assembly comprises a hand wheel (51), a shell (52), a first bevel gear (53) and two symmetrically arranged clamping pieces, the shell (52) is fixedly arranged on one side wall of the limiting plate (4), the side wall of the limiting plate (4) is provided with two symmetric through grooves, each clamping piece comprises a second bevel gear (54), a lead screw (55) and a clamping plate (56), one end of the lead screw (55) is rotatably connected to the shell (52), the other end is coaxially connected to the second bevel gear (54), the two clamping plates (56) are respectively located at the two ends of the probe base (3), one end of the clamping plate (56) is located in the limiting groove (41), the other end extends into the shell (52) through the corresponding through groove and is threadedly connected to the corresponding lead screw (55), the first bevel gear (53) is located in the shell (52) and meshes with the two second bevel gears (54), and the hand wheel (51) is located outside the shell (52) and is connected to the first bevel gear (53) through a rotating shaft.

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