Universal board infrared test fixture

Abstract

The utility model discloses a general board card infrared test frock is suitable for the power supply and signal introduction in the infrared scanning test process of board card using infrared scanning equipment, including respectively with infrared scanning equipment electricity connection's switching test platform, probe seat and micro video camera, the probe seat can be inserted with different model's probe, switching test platform is connected with probe seat electricity, wherein, switching test platform is used to the power supply, signal introduction of probe seat and board card, and can carry out switch control to signal introduction, power supply, one end of probe is contacted type connection with the circuit card point on board card, and the other end passes switching test platform and is connected with switching test platform electricity through cable, micro video camera can carry out infrared optical imaging to card board when infrared scanning equipment carries out infrared scanning to board card, can greatly reduce infrared scanning range, improves infrared scanning and fault location accuracy.

Description

TECHNICAL FIELD

[0001] The utility model belongs to the technical field of infrared test, especially relate to a general board card infrared test frock. BACKGROUND

[0002] As a common means of thermal signal collection, infrared scanning is widely used in various industries. During the power-on test of electronic board cards, the board card faults can be located by infrared scanning and abnormal hot spot analysis. Generally, the board card needs to be hard connected with the test frock for testing together. Since the infrared scanning equipment is generally limited in position and angle or even fixed, the placing angle of the board card is easily restricted by the hard connection, which leads to the fact that the infrared scanning equipment cannot perform complete infrared scanning or the scanning effect is affected. Meanwhile, there are various types of circuit board cards, and their power supply frocks are also various, which leads to the fact that a large amount of preparation work needs to be done before scanning, seriously affecting the use efficiency of the infrared scanning equipment. SUMMARY

[0003] Therefore, the utility model discloses a general board card infrared test frock, which solves the technical problem of low use efficiency of the existing infrared scanning equipment.

[0004] A general board card infrared test frock is suitable for power supply and signal introduction during the infrared scanning test of the board card using the infrared scanning equipment, comprising a switching test table, a probe seat and a miniature camera which are electrically connected with the infrared scanning equipment respectively, the probe seat can be plugged with probes of different types, the switching test table is electrically connected with the probe seat, wherein,

[0005] The switching test table is used for power supply and signal introduction to the probe seat and the board card, and can switch control the signal introduction and power supply;

[0006] One end of the probe is in contact with the circuit card point on the board card, and the other end passes through the probe seat and is electrically connected with the switching test table through a cable;

[0007] The miniature camera can perform infrared optical imaging on the board card when the infrared scanning equipment performs infrared scanning on the board card.

[0008] Preferably or optionally, the circuit of the board card is a digital card or a multi-analog card, the switching test table is provided with jacks, cylindrical terminals and toggle switches of different types, each type of jack or cylindrical terminal corresponds to a toggle switch, wherein,

[0009] When the circuit of the board card is a digital card, each type of the jack corresponds to a type of excitation signal, the probe is electrically connected with the jack through the cable, and different types of excitation sources can be provided to the board card, or each type of the cylindrical terminal corresponds to a type of excitation signal, the probe is electrically connected with the cylindrical terminal through the cable, and different types of excitation sources can be provided to the board card.

[0010] When the circuit of the board card is a multi-analog card, each type of the cylindrical terminal corresponds to a type of excitation signal or a power supply voltage, the probe is electrically connected with the cylindrical terminal through the cable, and different types of excitation sources or power supply sources can be provided to the board card.

[0011] Preferably or optionally, the board card is a self-connector type card, and the self-connector type board card is electrically connected with the corresponding jack or cylindrical terminal through the plug type cable.

[0012] Preferably or optionally, the plug type of the cable is 0.5 mm or 0.8 mm or 1.0 mm or 1.27 mm or 1.5 mm or 2.0 mm.

[0013] Preferably or optionally, the adapter test bench comprises 128 circuit channels, 12 power supply / analog circuit adapter channels are included, and 8 mil line width is used for the remaining circuit channels.

[0014] Preferably or optionally, the adapter test bench further comprises 232 2mm jacks used as interfaces for excitation signal input and output.

[0015] Preferably or optionally, the adapter test bench further comprises 24 cylindrical terminals used for power supply or analog quantity introduction and extraction.

[0016] Preferably or optionally, the miniature camera has a 70° wide-angle view, a searchlight brightness adjustable, 2-8cm automatic focusing and 5 million pixel resolution, and is connected with a PC through an HDMI data line.

[0017] The technical beneficial effects of the utility model are as follows:

[0018] The utility model discloses simple structure, reasonable in design realizes the general-purpose of circuit, and simple and reliable use operation. It has the ability of local circuit telecommunication signal introduction, can greatly reduce the infrared scanning range, improves infrared scanning and fault positioning precision, reduces the damage of current abnormality, thermal abnormality to electronic board card, thereby improve the maintenance efficiency. BRIEF DESCRIPTION OF DRAWINGS

[0019] In order to more clearly illustrate the technical solutions of the embodiments of the present disclosure, the following will briefly introduce the drawings needed to be used in the embodiments. Obviously, the drawings described below only illustrate some of the embodiments of the present disclosure, and for those skilled in the art, other drawings can also be obtained from these drawings without creative labor.

[0020] Figure 1 is a schematic view of the overall structure, wherein,

[0021] 1, switching test board; 2, jack; 3, cylindrical terminal; 4, toggle switch; 5, cable; 6, probe base; 7, miniature camera. DETAILED DESCRIPTION

[0022] The embodiments of the present disclosure will be described in detail below with reference to the drawings.

[0023] The embodiments of the present disclosure will be described in detail below with reference to the drawings.

[0024] It is to be understood that the following description is only some embodiments of the present disclosure and is not all the embodiments. The present disclosure can also be implemented or applied by other different specific embodiments, and the details in the specification can be modified or changed based on different views and applications without departing from the spirit of the present disclosure. It should be noted that the following embodiments and features in the embodiments can be combined with each other without conflict. Based on the embodiments in the present disclosure, all other embodiments obtained by those skilled in the art without creative labor are within the scope of protection of the present disclosure.

[0025] As Figure 1The general board card infrared test tool shown is suitable for power supply and signal introduction during an infrared scanning test process of a board card using an infrared scanning device, and comprises a switching test table 1, a probe seat 6 and a miniature camera 7 which are electrically connected with the infrared scanning device respectively, the probe seat 6 can be plugged with different types of probes, the switching test table 1 is electrically connected with the probe seat 6, wherein the switching test table 1 is used for power supply and signal introduction to the probe seat 6 and the board card, and can switch control the signal introduction and power supply. One end of the probe is in contact with a circuit card point on the board card (either insertion or contact is available), and the other end passes through the probe seat 6 and is electrically connected with the switching test table 1 through a cable 5.

[0026] Working principle: the miniature camera 7 can perform infrared optical imaging on the card board when the infrared scanning device performs infrared scanning on the board card. Image data is fed back to a controller, and a worker can obtain the difference between ordinary optical images and infrared images through analysis or comparison of the data. Since the infrared scanning device is generally limited in position angle or even fixed, the placing angle of the board card is easily limited by hard connection, which causes the infrared scanning device to be unable to perform complete infrared scanning or the scanning effect to be affected. The utility model avoids the occurrence of the situation that the infrared scanning device is unable to perform complete infrared scanning by introducing the switching test table 1 and the probe seat 6, so that the board card and the test tool can be separated or separated out to perform infrared scanning alone, thereby avoiding the occurrence of the situation that the infrared scanning device is unable to perform complete infrared scanning.

[0027] As the specific embodiment provided in the case, the circuit of the board card is a digital card or a multi-analog card, the switching test table 1 is provided with different types of jacks 2, cylindrical wiring terminals 3 and toggle switches 4, (the cylindrical wiring terminals 3 and the toggle switches 4 are multi-type electronic elements), each type of jack 2 or cylindrical wiring terminal 3 corresponds to a toggle switch 4, and the specific use is as follows:

[0028] When the circuit of the board card is a digital card, each type of jack 2 corresponds to a type of excitation signal, the probe is electrically connected with the jack 2 through the cable 5, and can provide different types of excitation sources to the board card, or each type of cylindrical wiring terminal 3 corresponds to a type of excitation signal, the probe is electrically connected with the cylindrical wiring terminal 3 through the cable 5, and can provide different types of excitation sources to the board card.

[0029] When the circuit of the board card is a multi-analog card, each type of cylindrical wiring terminal 3 corresponds to a type of excitation signal or power supply voltage, the probe is electrically connected with the cylindrical wiring terminal 3 through the cable 5, and can provide different types of excitation sources or power supply sources to the board card.

[0030] Further, when the card is not easy to use the probe for power supply and signal introduction, such as the card with connector, the self-connector type card is connected with the corresponding jack 2 or cylindrical terminal 3 through the cable 5 (the cable 5 connected with the small sun in the figure) with plug type, for example, the plug type of the cable 5 is 0.5mm or 0.8mm or 1.0mm or 1.27mm or 1.5mm or 2.0mm. The test cable 5 has a set of connection heads with one 2mm diameter pin and one horn plug at one end, which is used to connect to the test bench jack 2 or cylindrical terminal 3, and has a set of connection heads with one 0.5mm, 0.8mm, 1.0mm, 1.27mm, 1.5mm, 2.0mm diameter standard pin and jack 2 at the other end, according to the power supply and excitation signal of the electronic board to be tested, the corresponding test cable 5 is used at the same time, which can realize the introduction of power supply and excitation signal into the corresponding pin / jack 2 of the connector on the card. It has the ability of local circuit electrical signal introduction, which can greatly reduce the infrared scanning range, improve the infrared scanning and fault positioning accuracy, reduce the damage to the electronic board caused by current abnormality and thermal abnormality, and improve the maintenance efficiency.

[0031] As the specific embodiment provided in the case, the role of the adapter test bench 1 is to supply power and excitation signal, and the adapter test bench 1 includes 128 circuit channels, including 12 power supply / analog circuit adapter channels, using 12mil line width, and the remaining circuit channels using 8mil line width. The adapter test also includes 232 quantities of 2mm jacks 2, which are used as the interface for excitation signal input and output. It also includes 24 cylindrical terminal 3, which is used for power supply or analog quantity introduction and output. And it has 128-way dial switch 4, which is used for manual switching of channel opening / closing. The substrate uses FR-4 epoxy glass fiber plate, which still has good mechanical strength at room temperature 150℃, good electrical performance in dry state and wet state, flame retardant, high dielectric performance, good heat resistance and moisture resistance.

[0032] As the specific embodiment provided in the case, the miniature camera 7 has 70° wide angle view, adjustable intensity of searchlight, 2-8cm automatic focusing and 5 million pixel resolution, and is connected with PC through HDMI data line, which can realize real-time visualization.

[0033] Overall, the adapter test board has 128 circuit channels, including 12 power supply / analog circuit adapter channels, 12 mil line width, the remaining channels use 8 mil line width; It also has 232 2mm jacks for signal input and output interfaces, 24 cylindrical terminals for power supply or analog input and output, and 128 toggle switches for manual switching of channel open / close. The substrate uses FR-4 epoxy glass fiber board. One end of the test cable has a set of 2mm diameter pins and a set of horn connectors for connecting to the test board jack or cylindrical terminal, and the other end has a set of 0.5mm, 0.8mm, 1.0mm, 1.27mm, 1.5mm, 2.0mm diameter standard pins and jacks. The probe holder uses a manual adjustable probe holder with 2 joints and 2 coordinates, and a 0.8mm diameter high elastic probe. The miniature camera has a 70° wide angle view, adjustable spotlight brightness, 2-8cm automatic focus, 5 million pixel resolution, and real-time video connection to a PC through an HDMI data line.

[0034] The operator connects the external power supply and excitation signal to the corresponding channel on the test board through the test cable, then controls the toggle switch on the test board to open the channel output, and connects the other end of the channel to the corresponding connector pin / jack on the electronic board through the test cable, or connects the test cable to the probe tail, manually adjusts the needle and probes the circuit solder joints, realizes local and overall circuit power supply and excitation signal input, and guides the board to work. Next to the infrared camera in the infrared scanning device, a miniature camera with the same camera angle is fixed and connected to a PC. While the electronic board is working, the infrared scanning device is used to collect, the corresponding display software is used to display the thermodynamic image, the corresponding playback software is used to display the ordinary optical image, and when an abnormal hot spot is found in the thermodynamic image, the specific point or fault component model can be determined through the ordinary optical image comparison.

[0035] The above is only a specific embodiment of the present disclosure, but the protection scope of the present disclosure is not limited thereto, and any skilled person in the art can easily think of changes or replacements within the technical scope disclosed by the present disclosure. Therefore, the protection scope of the present disclosure should be subject to the protection scope of the claims.

Claims

1. A universal board card infrared test fixture, suitable for power supply and signal introduction during an infrared scan test process of a board card using an infrared scan device, characterized in that, Including respectively with infrared scanning device electric connection's adapter test platform, probe seat and micro camera, probe seat can be inserted with different models of probe, the adapter test platform is electrically connected with probe seat, wherein, The adapter test platform is used to power supply, signal introduction to the probe seat and board card, and can switch control signal introduction and power supply; One end of the probe is in contact with the circuit card point on the board card, the other end passes through the probe seat and is electrically connected with the adapter test platform through the cable; The micro camera can perform infrared optical imaging on the card when the infrared scanning device scans the board card.

2. The universal board infrared test fixture of claim 1, wherein, The circuit of the board card is digital card or multi-analog card, the adapter test platform is provided with different models of jack, cylindrical terminal and toggle switch, each model of jack or cylindrical terminal corresponds to a toggle switch, wherein, When the circuit of the board card is digital card, each model of jack corresponds to a type of excitation signal, the probe is electrically connected with the jack through the cable, which can provide different types of excitation source to the board card, or each model of the cylindrical terminal corresponds to a type of excitation signal, the probe is electrically connected with the cylindrical terminal through the cable, which can provide different types of excitation source to the board card; When the circuit of the board card is multi-analog card, each model of the cylindrical terminal corresponds to a type of excitation signal or power supply voltage, the probe is electrically connected with the cylindrical terminal through the cable, which can provide different types of excitation source or power supply voltage source to the board card.

3. The universal board infrared test fixture of claim 1, wherein, The board card is a self-connector type card, which is electrically connected with the corresponding jack or cylindrical terminal through the cable with plug type.

4. The universal board infrared test fixture of claim 3, wherein, The plug type of the cable is 0.5mm or 0.8mm or 1.0mm or 1.27mm or 1.5mm or 2.0mm.

5. The universal board infrared test fixture of claim 1, wherein, The adapter test platform includes 128 circuit channels, including 12 power supply / analog circuit adapter channels, using 12mil line width, and the remaining circuit channels using 8mil line width.

6. The universal board infrared test fixture of claim 5, wherein, The adapter test platform further includes 232 2mm jacks for excitation signal input and output interface.

7. The universal board infrared test fixture of claim 6, wherein, The adapter test platform further includes 24 cylindrical terminals for power supply or analog quantity introduction and output.

8. The universal board card infrared test fixture of claim 6, wherein, The micro camera has a 70° wide-angle visual angle, a spotlight brightness adjustable, a 2-8cm automatic focusing and a 5 million pixel resolution, and is connected with PC through HDMI data line.

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