Atomic force microscope scanning head fixing device
By designing a base, a fixed slot, a buffer layer, and buffer bolts to fix the scanning head of an atomic force microscope, the problems of jamming and damage to optical components have been solved. This improves the ease of operation and durability, making it suitable for beginners and reducing production costs.
Patent Information
- Application Number
- CN202423113372.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-17
- Publication Date
- 2025-11-28
- Estimated Expiration
- 2034-12-17
AI Technical Summary
Existing atomic force microscope scanning head fixing devices are prone to jamming, are inconvenient to operate, and have easily damaged optical components, affecting the durability of the instrument. They also require professional training, which limits their widespread use.
A fixing device is designed, which includes a base, a base fixing slot, a buffer layer, a scanning head fixing bracket, and buffer bolts. The buffer layer and buffer bolts reduce collisions. The right-angled trapezoidal insertion end and inclined surface design facilitate installation. The base fixing slot is located below the scanning head for easy operation.
It improves the durability and ease of operation of the device, reduces jamming and collisions, lowers the risk of damage to optical components and cables, and simplifies the need for operation training.
Smart Images
Figure CN223611542U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to the field of microscopy, especially to a scanning head fixing device of atomic force microscope. BACKGROUND
[0002] Since IBM's Binning and Stanford University's Quate developed the first atomic force microscope in 1986, the deficiencies of STM have been made up, and many different structures of atomic force microscopes have been optimized and improved, and the application field of atomic force microscope has been further expanded.
[0003] At present, the common atomic force microscope scanning head fixing device is prone to jamming problem during use, and the fixing device is located behind the scanning head, so that the operator's line of sight is easily blocked by the scanning head during operation, which is extremely inconvenient for the operator, especially beginners. On the one hand, the optical components contained in the scanning head are very easy to be damaged due to the jamming and bumping during the use of the fixing device, and the cable connecting the scanning head and the atomic force microscope main body is a brittle piezoelectric material, which is easy to damage the internal circuit of the cable due to the operator's unclear view of the fixing device excessively pulling the scanning head. On the other hand, all parts of the fixing device are in collision contact during use, so that the optical components in the scanning head are also easy to be damaged, which affects the durability of the instrument. Therefore, most atomic force microscopes need more rigorous professional training for operators during use, which is not conducive to the popularization and use of atomic force microscopes. UTILITY MODEL CONTENT
[0004] In view of the above problems, the utility model aims to provide a scanning head fixing device of atomic force microscope.
[0005] The technical scheme of the utility model is as follows:
[0006] A scanning head fixing device of atomic force microscope, comprising a base, a base fixing slot, a buffer layer, a scanning head fixing support and a buffer bolt.
[0007] The base is connected with the lifting device of the atomic force microscope; the base fixing slot is arranged at the front end of the base, and a threaded hole penetrating through the base fixing slot is arranged; the buffer layer is arranged at the inner bottom of the base fixing slot; one end of the scanning head fixing support is detachably connected with the scanning head, and the other end is inserted into the base fixing slot; the buffer bolt is arranged in the threaded hole and abuts against the scanning head fixing support inserted into the base fixing slot, and the tail of the buffer bolt is provided with a buffer material.
[0008] As a preferred, the base is connected with the lifting device of the atomic force microscope through a bolt, and the threaded hole is formed by lathe processing.
[0009] Preferably, the horizontal position of the top of the base fixing clamping groove is below the horizontal position of the bottom of the scanning head.
[0010] Preferably, the base is integrally formed with the base fixing clamping groove.
[0011] Preferably, the base is integrally formed with the base fixing clamping groove by casting.
[0012] Preferably, the scanning head fixing support comprises a backrest end and an insertion end connected to each other, the backrest end is detachably connected to the scanning head, and the insertion end is inserted into the base fixing clamping groove; the cross section of the insertion end is a right trapezoid, and the upper base is located at the bottom; the base fixing clamping groove is provided with an inclined surface matched with the insertion end.
[0013] Preferably, the backrest end is provided with two countersunk holes, the two countersunk holes are symmetrically distributed and penetrate through the backrest end, and the backrest end is detachably connected to the scanning head by arranging a hexagonal bolt in the countersunk hole.
[0014] Preferably, the threaded hole is arranged on the left side wall or the right side wall of the base fixing clamping groove.
[0015] Preferably, the inner bottom of the base fixing clamping groove is provided with a plurality of arc-shaped recesses, the buffer layer is composed of spherical particles with buffering capacity, and the spherical particles are arranged in the arc-shaped recesses and at least partially protrude from the arc-shaped recesses.
[0016] Preferably, the spherical particles are made of polyurethane.
[0017] The utility model discloses beneficial effect is:
[0018] The utility model discloses through setting up the buffer layer and the buffer bolt, can make the utility model discloses in the installation process and improve the durability of the utility model discloses the anti -collision, and further, the utility model discloses through setting up the horizontal position of the top of the base fixing clamping groove is below the horizontal position of the bottom of the scanning head, so can make the installation process of scanning head fixing support insertion into base fixing clamping groove clear visible, further, the utility model discloses through setting up the cross section right trapezoidal scanning head fixing support insertion end, can make scanning head fixing support in the process of inserting more smooth, not easy to collide and jam. BRIEF DESCRIPTION OF DRAWINGS
[0019] In order to more clearly illustrate the technical solutions of the embodiments of the present application or the prior art, the following will briefly introduce the drawings needed to be used in the embodiment or prior art description. Obviously, the drawings in the following description are only some embodiments of the present application, and for those skilled in the art, other drawings can also be obtained without creative labor.
[0020] Fig. 1 It is a structural schematic view of the atom force microscope scanning head fixing device of the present application;
[0021] Fig. 2 It is a structural schematic view of the base and the base fixing slot of the present application;
[0022] Fig. 3 It is a structural schematic view of the scanning head fixing support of the present application.
[0023] The figure mark: 1-base, 2-base fixing slot, 3-scanning head fixing support, 4-buffer bolt, 5-thread hole, 6-scanning head, 7-counter bore. DETAILED DESCRIPTION
[0024] The present application will be further described below in combination with the drawings and embodiments. It should be noted that the embodiments in the present application and the technical features in the embodiments can be combined with each other without conflict. It should be pointed out that, unless otherwise specified, all the technical and scientific terms used in the present application have the same meaning as that generally understood by the ordinary skilled in the art to which the present application belongs.
[0025] In the present application, unless otherwise stated, the terms "first", "second", etc. are used to distinguish similar objects, and are not used to describe a specific order or sequence. It should be understood that the terms used in this way; the terms used in the term "up", "down", "left", "right", etc. are generally directed to the direction shown in the drawings, or are directed to the vertical, vertical or gravity direction of the component itself; similarly, for the convenience of understanding and description, "inner", "outer", etc. are relative to the inner and outer contours of the components themselves. But the above orientation words are not used to limit the present application.
[0026] As Figs. 1-3 shown, an atom force microscope scanning head fixing device, comprising a base 1, a base fixing slot 2, a buffer layer, a scanning head fixing support 3 and a buffer bolt 4;
[0027] The base 1 is connected with the lifting device of the atomic force microscope; the base fixed clamping groove 2 is arranged at the front end of the base 1, and a threaded hole 5 is arranged on the base fixed clamping groove 2; the buffer layer is arranged on the inner bottom of the base fixed clamping groove 2; one end of the scanning head fixed support 3 is detachably connected with the scanning head 6, and the other end is inserted into the base fixed clamping groove 2; the buffer bolt 4 is arranged in the threaded hole 5 and abuts against the scanning head fixed support 3 inserted into the base fixed clamping groove 2, and the tail of the buffer bolt 4 is provided with a buffer material.
[0028] In the utility model, through setting the buffer layer and the buffer bolt 4, the utility model can prevent collision during installation and improve the durability of the utility model.
[0029] When the utility model is used, the scanning head fixed support 3 is connected with the scanning head 6 of the atomic force microscope, the buffer bolt 4 is screwed to the relaxed position, then the scanning head fixed support 3 is inserted into the base fixed clamping groove 2 after the insertion end is visually aligned with the base fixed clamping groove 2, the scanning head fixed support 3 with the atomic force microscope scanning head is inserted into the base fixed clamping groove 2, after confirming that the insertion end of the scanning head fixed support 3 completely enters the base fixed clamping groove 2, the atomic force microscope scanning head is slowly loosened, and the buffer bolt 4 is tightened to fix the insertion end of the scanning head fixed support 3, and then the atomic force microscope scanning head is fixed.
[0030] In a specific embodiment, the base 1 is connected with the lifting device of the atomic force microscope through a bolt, and the threaded hole is formed by a lathe.
[0031] In a specific embodiment, the horizontal position of the top of the base fixed clamping groove 2 is below the horizontal position of the bottom of the scanning head 6. In this embodiment, by arranging the horizontal position of the top of the base fixed clamping groove 2 below the horizontal position of the bottom of the scanning head 6, the installation process of inserting the scanning head fixed support 3 into the base fixed clamping groove 2 can be clearly seen and is easier to operate.
[0032] In a specific embodiment, the base 1 and the base fixed clamping groove 2 are integrally formed. Alternatively, the base 1 and the base fixed clamping groove 2 are integrally formed by casting. It should be noted that, in addition to integral forming, the base 1 and the base fixed clamping groove 2 can also be fixedly or detachably connected.
[0033] In a specific embodiment, the scanning head fixed support 3 comprises a backrest end and an insertion end connected with each other, the backrest end is detachably connected with the scanning head 6, and the insertion end is inserted into the base fixed clamping groove 2; the cross section of the insertion end is a right trapezoid, and the upper base is located at the bottom; the base fixed clamping groove 2 is provided with an inclined surface matched with the insertion end.
[0034] In the above embodiment, by setting the cross-section of the right-angled trapezoidal scanning head fixing support 3 insertion end, the base fixed slot 2 is provided with a matching inclined surface, so that the base fixed slot 2 opening interface is a trapezoidal cross-section with a large to small change, when the scanning head fixing support 3 insertion end starts to slide into the base fixed slot 2, the base fixed slot 2 opening cross-sectional area is larger than the scanning head fixing support 3 insertion end area, which can significantly improve the smoothness of the scanning head fixing support 3 sliding into the base fixed slot 2, so as to reduce the collision between each part of the fixing device.
[0035] In one specific embodiment, the backrest end is provided with two countersunk holes 7, and the two countersunk holes 7 are symmetrically distributed and penetrate the backrest end. By setting a hexagonal bolt in the countersunk hole 7, the backrest end and the scanning head 6 can be detachably connected.
[0036] In one specific embodiment, the threaded hole 5 is arranged on the left side wall or the right side wall of the base fixed slot 2.
[0037] In one specific embodiment, the inner bottom of the base fixed slot 2 is provided with a plurality of arc-shaped recesses, and the buffer layer is composed of spherical particles with buffering capacity. The spherical particles are arranged in the arc-shaped recesses and at least partially protrude from the arc-shaped recesses. Optionally, the spherical particles are made of polyurethane. It should be noted that in addition to the buffer layer setting mode adopted in this embodiment, a buffer pad made of a buffer material can also be directly laid on the inner bottom of the base fixed slot.
[0038] In one specific embodiment, the base 1, the base fixed slot 2 and the scanning head fixing support 3 are respectively made of any one or more of carbon structural steel, alloy structural steel, special performance steel, cast iron and alloy.
[0039] In one specific embodiment, the buffer layer and the buffer material of the tail portion of the buffer bolt are made of any one or more of polyurethane, rubber, polyester, polyethylene (PU), polyvinyl chloride (PVC), silica gel and fiber reinforced plastic.
[0040] In summary, the atomic force microscope scanning head fixing device can directly observe the fixing process of the fixing device, has the advantages of convenient operation, non-jamming during installation process, and anti-collision during installation process.
[0041] It is worth mentioning that, in the embodiment of the present application, the atomic force microscope scanning head fixing device is simple in structure, does not involve complex manufacturing process and expensive materials, and has good economy. At the same time, for the manufacturer, the atomic force microscope scanning head fixing device provided by the present application is easy to produce, and the cost is low, which is more conducive to controlling the production cost and further promoting and using the product.
[0042] The above is only a preferred embodiment of the present application, and does not limit the present application in any form. Although the present application has been disclosed as above with a preferred embodiment, it is not intended to limit the present application. Any person skilled in the art can make some changes or modifications to the above disclosed technical content without departing from the scope of the present application, and any simple modification, equivalent change and modification of the above embodiment according to the technical essence of the present application still belong to the scope of the present application.
Claims
1. A scanning head fixing device for an atomic force microscope, characterized in that, The base, the base fixed clamping groove, the buffer layer, the scanning head fixed support and the buffer bolt are included. The base is connected with the lifting device of the atomic force microscope; the base fixed clamping groove is arranged at the front end of the base, and a threaded hole penetrating through the base fixed clamping groove is arranged; the buffer layer is arranged at the inner bottom of the base fixed clamping groove; one end of the scanning head fixed support is detachably connected with the scanning head, and the other end is inserted into the base fixed clamping groove; the buffer bolt is arranged in the threaded hole and abuts against the scanning head fixed support inserted into the base fixed clamping groove, and the tail of the buffer bolt is provided with a buffer material.
2. The AFM scanner head fixture of claim 1, wherein, The base is connected with the lifting device of the atomic force microscope through a bolt, and the threaded hole is formed by a lathe.
3. The AFM scanner head fixture of claim 1, wherein, The horizontal position of the top of the base fixed clamping groove is below the horizontal position of the bottom of the scanning head.
4. The AFM scanner head fixture of claim 1, wherein, The base and the base fixed clamping groove are integrally formed.
5. The AFM scanner head fixture of claim 4, wherein, The base and the base fixed clamping groove are integrally formed by casting.
6. The AFM scanner head fixture of claim 1, wherein, The scanning head fixed support includes a backrest end and an insertion end connected with each other, the backrest end is detachably connected with the scanning head, and the insertion end is inserted into the base fixed clamping groove; the cross section of the insertion end is a right trapezoid, and the upper base is located at the bottom; the base fixed clamping groove is provided with an inclined surface matched with the insertion end.
7. The AFM scanner head fixture of claim 6, wherein, The backrest end is provided with two countersunk holes, the two countersunk holes are symmetrically distributed and penetrate through the backrest end, and the backrest end is detachably connected with the scanning head by arranging a hexagonal bolt in the countersunk hole.
8. The AFM scanner head fixture of claim 1, wherein, The threaded hole is arranged on the left side wall or the right side wall of the base fixed clamping groove.
9. The AFM scanner head fixture of claim 1, wherein, The inner bottom of the base fixed clamping groove is provided with a plurality of arc-shaped recesses, the buffer layer is composed of spherical particles with buffering capacity, and the spherical particles are arranged in the arc-shaped recesses and at least partially protrude from the arc-shaped recesses.
10. The AFM scanner head fixture of claim 9, wherein, The spherical particles are made of polyurethane.