Circuit board test frame

Abstract

The utility model relates to the technical field of test frames, and discloses a circuit board test frame, which comprises a test frame, a movable plate and a plurality of press rods arranged in the circumferential direction of the bottom end of the movable plate in an array, the test frame is of an L-shaped structure, the middle part of the test frame is connected with a hinge seat, the test frame is hinged with a connecting piece through the hinge seat, and the connecting piece is rotatably connected with the movable plate. An adjusting rod is hinged to the middle of the connecting piece, the moving plate is slidably connected with the testing frame, a driving rod is hinged to the top end of the moving plate, a buffering assembly is connected between the driving rod and the adjusting rod, and an adjusting assembly capable of adjusting the pressure application is connected to the adjusting rod. Compared with the prior art, the circuit board pressing rod has the advantages that the pressure applied to the pressing rod can be conveniently buffered, the pressure can be conveniently adjusted, and damage to a circuit board is avoided.

Description

TECHNICAL FIELD

[0001] The utility model relates to test stand technical field, specifically line board test stand. BACKGROUND

[0002] Line board test stand is a kind of equipment for testing circuit board line. It is usually used to detect the quality and performance of circuit board in manufacturing process;Mainly include test stand, drive assembly, moving plate and pressure bar, drive moving plate by drive assembly and drive pressure bar to down to circuit board positioning, and then can test the on-off of contact on line board.

[0003] And the existing line board test stand due to the fixed pressure that drive assembly exerts to pressure bar, i. e. when the connecting piece is collinear with the drive rod to form a dead point, so as to realize the positioning of pressure bar to circuit board, the pressure cannot be adjusted, and there is no buffer assembly, when the pressure is too large, it is likely to cause damage to circuit board. UTILITY MODEL CONTENT

[0004] I. Technical problem to be solved

[0005] The technical problem to be solved by the utility model is that the pressure exerted by the drive assembly to the pressure bar is fixed and cannot be adjusted, and there is no buffer assembly, which can easily cause damage to the circuit board.

[0006] II. Technical scheme

[0007] To solve the above technical problems, the utility model provides a technical scheme: a line board test stand, including test stand, moving plate and arraying a plurality of pressure bars at the bottom end of moving plate circumferentially, the test stand is L-shaped structure, the middle part of test stand is connected with a hinged seat, the test stand is hingedly connected with a rotating connection with a connecting piece through the hinged seat, the middle part of connecting piece is hingedly connected with an adjusting rod, the moving plate is slidingly connected with test stand, the top end of moving plate is hingedly connected with a drive rod, the drive rod and adjusting rod are connected with a buffer assembly, the adjusting rod is connected with an adjusting assembly capable of adjusting the size of pressure exertion.

[0008] Further, the buffer assembly includes a drive cylinder connected to the adjusting rod, sliding grooves are respectively connected on both sides of the drive cylinder, sliding blocks are oppositely connected on the drive rod, the sliding blocks are slidingly matched with the sliding grooves, a buffer spring is connected between the drive rod and the drive cylinder, the drive rod and the drive cylinder are slidingly matched by the sliding blocks and the sliding grooves, so as to avoid the drive rod from slipping out of the drive cylinder;The force exerted by the drive cylinder on the circuit board through the drive rod to drive the moving plate and the pressure bar is buffered by the buffer spring.

[0009] Further, the test frame is connected with guide rods on both sides of the moving plate, guide blocks are arranged on both sides of the moving plate, and the guide rods are arranged through the guide blocks in a sliding mode, so that the moving plate is guided to move up and down.

[0010] Further, the adjusting assembly comprises a connecting shaft rotatably connected with the connecting piece, a through hole is arranged on the connecting shaft, a driving ring is rotatably arranged at the through hole, the driving ring is screwed with the adjusting rod, the driving ring drives the adjusting rod to extend or retract along the axial direction of the through hole through the screwing with the adjusting rod by rotating the driving ring, and then the distance between the adjusting rod and the connecting shaft is controlled, so that the pressure applied to the pressing rod when the connecting piece and the adjusting rod are collinear can be adjusted.

[0011] Further, the driving ring is circumferentially connected with anti-skid lines, the anti-skid lines can increase the friction coefficient of the driving ring, and the stable driving of the driving ring is facilitated.

[0012] Further, the connecting piece comprises a V-shaped side plate, a hinge seat is hingedly connected to one end of the side plate, and a connecting plate is connected to the other end, a handle is arranged on the connecting plate, the handle facilitates driving of the connecting piece, and the V-shaped structure of the connecting piece forms a certain inclination angle between the handle driving end and the end collinear with the adjusting rod, so that interference with the adjusting rod is avoided.

[0013] III. Advantages

[0014] Compared with the prior art, the utility model has the advantages that:

[0015] The adjusting rod drives the driving rod to drive the moving plate downward until the adjusting rod is collinear with the connecting piece, at which time the moving plate drives the pressing rod to position the circuit board on the test frame, so that the contacts on the circuit board are in contact with the test contacts to detect whether the circuit board has an open or short circuit phenomenon; the buffer assembly is arranged to buffer the pressure of the pressing rod on the connecting piece, so that the circuit board is not damaged due to hard pressure of the pressing rod; and the adjusting assembly is arranged to further adjust the pressure. BRIEF DESCRIPTION OF DRAWINGS

[0016] Figure 1 is a structural schematic view of a circuit board test frame.

[0017] Figure 2 is a main sectional structural schematic view of a circuit board test frame.

[0018] Figure 3 is Figure 2 is an enlarged structural schematic view of A in the figure.

[0019] Figure 4 isFigure 2 Amplification structure of middle B.

[0020] As shown in the figure: 1, test frame, 2, pressure bar, 3, moving plate, 4, hinged seat, 5, adapter, 6, adjusting rod, 7, drive rod, 8, drive cylinder, 9, sliding groove, 10, sliding block, 11, buffer spring, 12, guide rod, 13, guide block, 14, connecting shaft, 15, drive ring, 16, side plate, 17, handle. DETAILED DESCRIPTION

[0021] The technical solutions in the embodiments of the utility model will be clearly and completely described below with reference to the drawings in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, rather than all the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by those skilled in the art without creative labor fall within the scope of protection of the utility model.

[0022] Embodiment one

[0023] Combined with the drawings Figure 1 A circuit board test frame, comprising a test frame 1, a moving plate 3 and a plurality of pressure bars 2 arranged in an array on the bottom end of the moving plate 3, the pressure bars 2 being made of rubber material to avoid damage caused by hard contact with the circuit board, the test frame 1 being of L-shaped structure, a hinged seat 4 being arranged in the middle of the test frame 1, the test frame 1 being hingedly connected to a rotating connection provided with an adapter 5 through the hinged seat 4, the adapter 5 comprising a V-shaped side plate 16, the hinged seat 4 being hingedly connected to one end of the side plate 16, and a connecting plate being arranged at the other end of the side plate 16, a handle 17 being arranged on the connecting plate, an adjusting rod 6 being hingedly arranged in the middle of the adapter 5, the moving plate 3 being slidingly connected to the test frame 1, guide rods 12 being arranged on the two sides of the moving plate 3, respectively, guide blocks 13 being arranged on the two sides of the moving plate 3, respectively, the guide rods 12 being slidingly arranged through the guide blocks 13, and a drive rod 7 being hingedly arranged at the top end of the moving plate 3.

[0024] Through the cooperation of the test frame 1, the moving plate 3, the pressure bar 2, the adapter 5, the adjusting rod 6 and the drive rod 7, the adapter 5 is driven to make one end of the adapter 5 collinear with the adjusting rod 6 to form a dead point, and then the adjusting rod 6 drives the drive rod 7 to make the moving plate 3 stably press the circuit board.

[0025] Combined with the drawings Figure 2 and Figure 4A buffer assembly is provided between the drive rod 7 and the adjusting rod 6. The buffer assembly includes a drive cylinder 8 connected to the adjusting rod 6. Slide grooves 9 are respectively connected to both sides of the drive cylinder 8. A slider 10 is connected to the drive rod 7. The slider 10 slides with the slide groove 9. A buffer spring 11 is provided between the drive rod 7 and the drive cylinder 8.

[0026] The buffer components in the above structure facilitate the relief of the pressure applied to the pressure bar 2 by the buffer spring 11 when the connector 5 is collinear with the adjusting rod 6, thus avoiding excessive pressure that could cause irreversible damage to the circuit board.

[0027] Example 2

[0028] Based on Example 1, combined with Appendix Figure 2 and Figure 3 The adjusting rod 6 is connected to an adjusting component that can adjust the applied pressure. The adjusting component includes a connecting shaft 14 on a rotating connecting connector 5. A through hole is connected to the connecting shaft 14. A driving ring 15 is rotatably connected to the connecting shaft 14 at the through hole. The driving ring 15 is circumferentially connected with anti-slip texture. The driving ring 15 is threadedly engaged with the adjusting rod 6.

[0029] The adjustment components in the above structure facilitate the control and adjustment of the length of the adjustment rod 6 extending through the through hole, thereby facilitating further adjustment of the pressure applied by the connecting piece 5 to the pressure rod 2.

[0030] The specific usage method is as follows:

[0031] The connecting member 5 drives the adjusting rod 6, and the handle 17 facilitates the driving of the connecting member 5. The V-shaped structure of the connecting member 5 causes the driving end of the handle 17 to form a certain angle with the end of the adjusting rod 6 that is collinear with it, avoiding interference when they are collinear. The adjusting rod 6 drives the driving rod 7 to move the moving plate 3 downward until the adjusting rod 6 is collinear with the connecting member 5. At this time, the moving plate 3 drives the pressure bar 2 to position the circuit board on the test frame 1, so that the contacts on the circuit board make contact with the test contacts to detect whether there is an open or short circuit on the circuit board; while the slow The punch assembly is designed to buffer the pressure applied to the pressure bar 2 by the connecting piece 5. The sliding engagement between the slider 10 and the slide groove 9 allows the drive rod 7 to slide with the drive cylinder 8, preventing the drive rod 7 from slipping out of the drive cylinder 8. The buffer spring 11 is designed to buffer the force applied to the circuit board by the drive cylinder 8 through the drive rod 7, the moving plate 3, and the pressure bar 2, preventing the pressure bar 2 from applying hard pressure to the circuit board and causing damage. The guide rod 12 slides through the guide block 13 to guide the moving plate 3 up and down.

[0032] The setting of the adjusting assembly facilitates further adjusting the pressure exertion size, the driving ring 15 is rotated, the friction coefficient of the driving ring 15 is facilitated to be increased through the anti-skid pattern, the stable driving of the driving ring 15 is facilitated, the driving ring 15 drives the adjusting rod 6 to stretch and contract in the axial direction of the through hole through the thread cooperation with the adjusting rod 6, and then the spacing between the adjusting rod 6 and the connecting shaft 14 is facilitated to be controlled, so that the pressure exerted on the pressure bar 2 by the connecting piece 5 when the connecting piece 5 is collinear with the adjusting rod 6 can be adjusted.

[0033] It is to be noted that the relative terms such as first and second and the like are used herein solely to distinguish one entity or action from another, without necessarily requiring or implying any such actual relationship or order between such entities or actions. Moreover, the terms "comprises", "comprising", or any other variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but can include other elements not expressly listed or inherent to such process, method, article, or apparatus.

[0034] Although the embodiments of the present application have been shown and described, it is to be understood that for the purpose of the present application, the changes, modifications, equivalents, substitutions and variations of the embodiments can be made by those skilled in the art without departing from the spirit and scope of the present application, and the scope of the present application is defined by the appended claims and their equivalents.

[0035] The above describes the present application and its embodiments, which is not restrictive, and the embodiments shown in the drawings are only one of the embodiments of the present application, and the actual structure is not limited thereto. In general, if a person skilled in the art is inspired by it, without departing from the creative purpose of the present application, without creative design, similar structure and embodiments of the technical solution can be designed, which should belong to the protection scope of the present application.

Claims

1. A circuit board test fixture comprising a test fixture (1), a moving plate (3) and a plurality of pressure bars (2) arranged in an array around the periphery of the bottom end of the moving plate (3), characterized in that: The test frame (1) is of L-shaped structure, a hinge seat (4) is arranged at the middle of the test frame (1), the test frame (1) is hingedly connected through the hinge seat (4), a connecting piece (5) is arranged at the hinge seat (4), the connecting piece (5) is hingedly connected with an adjusting rod (6) at the middle, a moving plate (3) is slidably connected with the test frame (1), the moving plate (3) is hingedly connected with a driving rod (7) at the top end, a buffer assembly is arranged between the driving rod (7) and the adjusting rod (6), and an adjusting assembly capable of adjusting the pressure exerting size is arranged on the adjusting rod (6).

2. The test fixture of claim 1, wherein: The buffer assembly comprises a driving cylinder (8) connected with the adjusting rod (6), a sliding groove (9) is arranged on each side of the driving cylinder (8), a sliding block (10) is oppositely arranged on the driving rod (7), the sliding block (10) is slidably connected with the sliding groove (9), and a buffer spring (11) is arranged between the driving rod (7) and the driving cylinder (8).

3. The test fixture of claim 1, wherein: The test frame (1) is slidably connected with a guide rod (12) at each side of the moving plate (3), and a guide block (13) is arranged at each side of the moving plate (3), the guide rod (12) is slidably arranged through the guide block (13).

4. The test fixture of claim 1, wherein: The adjusting assembly comprises a connecting shaft (14) rotatably connected with the connecting piece (5), a through hole is arranged on the connecting shaft (14), a driving ring (15) is rotatably arranged on the connecting shaft (14) at the through hole, and the driving ring (15) is threadedly connected with the adjusting rod (6) in the thread.

5. The test fixture of claim 4, wherein: The driving ring (15) is circumferentially connected with anti-skid lines.

6. The test fixture of claim 1, wherein: The connecting piece (5) comprises a side plate (16) of V-shaped structure, the hinge seat (4) is hingedly connected to one end of the side plate (16), and a connecting plate is arranged at the other end, a handle (17) is arranged on the connecting plate.

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