Storage mechanism of semiconductor test sorting machine

Abstract

The utility model relates to the technical field of semiconductor testing, in particular to a material storage mechanism of a semiconductor testing sorting machine, which comprises a material storage box main body, a plurality of groups of guide rails are arranged in the material storage box main body, two groups of rotating rods are arranged between the two groups of guide rails and positioned in the material storage box main body, and guide plates are arranged on the outer sides of the rotating rods. Two groups of adjusting assemblies are arranged on the outer side of the storage box main body; the adjusting assembly is used for adjusting the position of the guide plate, the adjusting assembly is composed of a connecting frame, driving racks, a driving gear and a driving screw rod, the connecting frame is located on the outer side of the storage box body, and the two driving racks are both located in the connecting frame; the two sets of driving gears are rotationally connected to the outer side of the storage box body and located in the connecting frame, the driving screw is rotationally connected to the bottom of the connecting frame, and compared with an existing storage mechanism, the overall practicability of the storage mechanism can be improved through the design.

Description

Technical Field

[0001] This utility model relates to the field of semiconductor testing technology, and specifically to a material storage mechanism for a semiconductor testing and sorting machine. Background Technology

[0002] In semiconductor packaging companies, labor costs are rising, personnel management is becoming increasingly difficult, and customers are demanding higher quality standards. Automation equipment is an indispensable element of production, serving as the tool for transforming material inputs into finished product testing in chip manufacturing. Chip quality assurance largely depends on the support of the equipment system. The SKD semiconductor test and sorting machine is a high-speed IC test and sorting machine. This machine adopts a high-speed PLC control system, a multi-functional turret system, and features modular operation, simple maintenance, low maintenance costs, and a user-friendly design. It is applied to the final process of semiconductor device production, fully automatically completing chip-related tests. According to the customer's production process requirements, it performs electrical parameter testing, classification and screening, laser marking, surface inspection, marking inspection, five-sided inspection of product dimensions, and final packaging for market delivery.

[0003] A search revealed that CN213349787U discloses a storage mechanism for a semiconductor testing and sorting machine, belonging to the technical field of semiconductor testing and sorting machines. It includes a storage box and a base plate. A storage plate is fixedly installed inside the storage box. The top of the storage plate has a sliding groove A, and the top of the storage plate has a sliding groove B. Conveying channels are fixedly connected to both sides of the inner wall of the storage box. This invention facilitates the downward sliding of semiconductor components by using a downwardly inclined storage plate connected sequentially by the conveying channels, thus facilitating the storage of semiconductor components. The distance between sliding rails A and B is adjusted by a telescopic column, thereby adjusting the lateral distance between the fixed plates. Adjustment is achieved by adjusting the nuts. The longitudinal distance between the fixed plates is designed to facilitate the sequential conveying of semiconductor components of different specifications to the feeding mechanism, while ensuring a smooth descent of the semiconductor components during the conveying process to avoid damage. However, the drawback is that although the mechanism can guide semiconductor components with different pin distances through slides A and B, it can only guide two different sets of semiconductor components, which is not suitable for semiconductor components of different specifications, resulting in low practicality. Therefore, it is particularly important to improve the existing storage mechanism and design a new storage mechanism for a semiconductor testing and sorting machine to solve the above-mentioned technical defects and improve the overall practicality of the storage mechanism. Utility Model Content

[0004] The purpose of this invention is to provide a material storage mechanism for a semiconductor testing and sorting machine, which adjusts the spacing between two sets of guide plates to adapt to the specifications of semiconductor components, guides semiconductor components of different specifications, and increases practicality, thereby solving the problems mentioned in the background art.

[0005] To achieve the above objectives, this utility model provides the following technical solution:

[0006] A material storage mechanism for a semiconductor testing and sorting machine includes a material storage box body. The material storage box body has multiple sets of guide rails inside. Between two sets of guide rails, there are two sets of rotating rods located inside the material storage box body. A guide plate is provided on the outside of the rotating rods. Two sets of adjustment components are provided on the outside of the material storage box body.

[0007] The adjustment component is used to adjust the position of the guide plate, and the adjustment component consists of a connecting frame, a drive rack, a drive gear and a drive screw. The connecting frame is located on the outside of the storage box body, the two sets of drive racks are located inside the connecting frame, the two sets of drive gears are rotatably connected to the outside of the storage box body and located inside the connecting frame, and the drive screw is rotatably connected to the bottom of the connecting frame.

[0008] As a preferred embodiment of this utility model, the rotating rod extends to the outside of the storage box body and is fixedly connected to the drive gear, and the drive gear and the drive rack are meshed together.

[0009] As a preferred embodiment of this utility model, a fixing plate is provided on the outer side of the storage box body and on the outer side of the drive screw. The fixing plate has a threaded groove inside and is connected to the drive screw through the threaded groove.

[0010] As a preferred embodiment of this utility model, sliding rods are provided at both ends of the outer side of the storage box body and inside the connecting frame, and a sliding groove is provided inside the connecting frame and outside the sliding rods, and the connecting frame is connected to the sliding rods through the sliding groove.

[0011] As a preferred embodiment of this utility model, an indicator rod is provided at one end of the drive gear near the main body of the storage box, and a scale bar is provided on the outer side of the main body of the storage box near the end of the indicator rod.

[0012] As a preferred embodiment of this utility model, the distance between the two sets of rotating rods is smaller than the distance between the two sets of guide rails, and the multiple sets of guide rails are connected by a connecting box.

[0013] As a preferred embodiment of this utility model, the bottom of the storage box body is provided with a connecting frame, and a temporary storage box is provided at one end of the storage box body near the connecting frame. A first slide rail is provided at one end of the connecting frame near the temporary storage box, and a second slide rail is provided on the outer side of the first slide rail.

[0014] Compared with the prior art, the beneficial effects of this utility model are:

[0015] In this invention, the spacing between the two sets of guide plates is adjusted by the design of the adjustment component, so that it can be adjusted according to the specifications of the semiconductor element, adapt to semiconductor elements of different specifications, guide the semiconductor element, and increase its practicality. Attached Figure Description

[0016] Figure 1 This is a schematic diagram of the overall structure of this utility model;

[0017] Figure 2 This is a schematic diagram of the main structure of the storage box of this utility model;

[0018] Figure 3 This is a schematic diagram of the guide plate structure of this utility model;

[0019] Figure 4 This is a schematic diagram of the adjustment component structure of this utility model.

[0020] In the diagram: 1. Storage box body; 2. Guide rail; 3. Rotating rod; 4. Guide plate; 5. Adjustment component; 6. Connecting frame; 7. Drive rack; 8. Drive gear; 9. Drive screw; 10. Fixing plate; 11. Sliding rod; 12. Indicator rod; 13. Scale bar; 14. Connecting box; 15. Connecting frame; 16. Temporary storage box; 17. First slide rail; 18. Second slide rail. Detailed Implementation

[0021] The technical solutions of the present utility model will be clearly and completely described below with reference to the embodiments of the present utility model. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. All other embodiments obtained by those skilled in the art based on the embodiments of the present utility model without creative effort are within the protection scope of the present utility model.

[0022] Example:

[0023] Please see Figures 1-4 This utility model provides a technical solution:

[0024] A storage mechanism for a semiconductor testing and sorting machine includes a storage box body 1. Multiple sets of guide rails 2 are provided inside the storage box body 1. Two sets of rotating rods 3 are provided between two sets of guide rails 2 inside the storage box body 1. A guide plate 4 is provided on the outside of the rotating rods 3. Two sets of adjustment components 5 are provided on the outside of the storage box body 1.

[0025] The adjustment component 5 is used to adjust the position of the guide plate 4. The adjustment component 5 consists of a connecting frame 6, a drive rack 7, a drive gear 8 and a drive screw 9. The connecting frame 6 is located on the outside of the storage box body 1. Both sets of drive racks 7 are located inside the connecting frame 6. Both sets of drive gears 8 are rotatably connected to the outside of the storage box body 1 and located inside the connecting frame 6. The drive screw 9 is rotatably connected to the bottom of the connecting frame 6.

[0026] Furthermore, the rotating rod 3 extends to the outside of the storage box body 1 and is fixedly connected to the drive gear 8. The drive gear 8 and the drive rack 7 are meshed. When the connecting frame 6 is displaced, it drives the drive rack 7 to be displaced. The drive rack 7 causes the drive gear 8 to rotate, which in turn drives the rotating rod 3 to rotate, thereby causing the guide plate 4 to be displaced.

[0027] The storage box body 1 has a fixing plate 10 on the outside of the drive screw 9. The fixing plate 10 has a threaded groove inside and is connected to the drive screw 9 through the threaded groove. The drive screw 9 is connected to the threaded groove so that the drive screw 9 can be connected to the fixing plate 10. Rotating the drive screw 9 allows it to move through the fixing plate 10, which in turn moves the connecting frame 6.

[0028] Secondly, sliding rods 11 are provided at both ends of the outer side of the storage box body 1 and inside the connecting frame 6. A sliding groove is provided inside the connecting frame 6 and outside the sliding rod 11. The connecting frame 6 is connected to the sliding rod 11 through the sliding groove. The sliding groove is connected to the sliding rod 11 so that the connecting frame 6 can be connected to the sliding rod 11. When the connecting frame 6 is displaced, the sliding rod 11 can guide it to prevent displacement.

[0029] Furthermore, an indicator rod 12 is provided at one end of the drive gear 8 near the storage box body 1, and a scale bar 13 is provided on the outer side of the storage box body 1 near the indicator rod 12. When the drive gear 8 rotates, it drives the indicator rod 12 to rotate. Through the scale bar 13, the distance between the two sets of guide plates 4 can be observed more intuitively and accurately during the adjustment process, reducing the number of adjustments and improving the accuracy of the distance adjustment.

[0030] Furthermore, the distance between the two sets of rotating rods 3 is smaller than the distance between the two sets of guide rails 2. The multiple sets of guide rails 2 are connected by a connecting box 14. When the semiconductor element is placed on top of the guide plate 4, it can be guided by the connecting box 14 to be guided to the top of the other two sets of guide plates 4.

[0031] Furthermore, the bottom of the storage box body 1 is provided with a connecting frame 15, and a temporary storage box 16 is provided at one end of the storage box body 1 near the connecting frame 15. A first slide rail 17 is provided at one end of the connecting frame 15 near the temporary storage box 16, and a second slide rail 18 is provided on the outside of the first slide rail 17. The components can be temporarily stored through the temporary storage box 16, and the semiconductor components can be guided through the first slide rail 17 and the second slide rail 18.

[0032] In this embodiment, the specific implementation scenario is as follows: In actual use, rotating the drive screw 9 causes displacement through the fixed plate 10, which in turn causes displacement of the connecting frame 6. When the connecting frame 6 is displaced, it causes displacement of the drive rack 7. The drive rack 7 causes the drive gear 8 to rotate, which in turn causes the rotating rod 3 to rotate, thereby causing displacement of the guide plate 4. When the drive gear 8 rotates, it causes the indicator rod 12 to rotate. Through the scale bar 13, the distance between the two sets of guide plates 4 can be observed more intuitively and accurately during the adjustment process, reducing the number of adjustments and improving the accuracy of the distance adjustment. By adjusting the distance between the two sets of guide plates 4, it is possible to adjust according to the specifications of the semiconductor components, adapting to different specifications of semiconductor components and guiding them. Compared with the existing storage mechanism, this utility model improves the overall practicality of the storage mechanism through its design.

[0033] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A material storage mechanism for a semiconductor testing and sorting machine, comprising a material storage box body (1), characterized in that: The storage box body (1) is provided with multiple sets of guide rails (2) inside. Between the two sets of guide rails (2) and inside the storage box body (1), there are two sets of rotating rods (3). The outer side of the rotating rods (3) is provided with guide plates (4). The outer side of the storage box body (1) is provided with two sets of adjustment components (5). The adjustment component (5) is used to adjust the position of the guide plate (4), and the adjustment component (5) consists of a connecting frame (6), a drive rack (7), a drive gear (8) and a drive screw (9). The connecting frame (6) is located on the outside of the storage box body (1), the two sets of drive racks (7) are located inside the connecting frame (6), the two sets of drive gears (8) are rotatably connected to the outside of the storage box body (1) and located inside the connecting frame (6), and the drive screw (9) is rotatably connected to the bottom of the connecting frame (6).

2. The material storage mechanism of a semiconductor testing and sorting machine according to claim 1, characterized in that: The rotating rod (3) extends to the outside of the storage box body (1) and is fixedly connected to the drive gear (8). The drive gear (8) and the drive rack (7) are meshed together.

3. The material storage mechanism of a semiconductor testing and sorting machine according to claim 1, characterized in that: A fixing plate (10) is provided on the outside of the storage box body (1) and on the outside of the drive screw (9). The fixing plate (10) has a threaded groove inside and is connected to the drive screw (9) through the threaded groove.

4. The material storage mechanism of a semiconductor testing and sorting machine according to claim 1, characterized in that: The storage box body (1) has sliding rods (11) on both ends of the outer side and inside the connecting frame (6). The connecting frame (6) has a sliding groove on the outer side of the sliding rod (11), and the connecting frame (6) is connected to the sliding rod (11) through the sliding groove.

5. The material storage mechanism of a semiconductor testing and sorting machine according to claim 1, characterized in that: The drive gear (8) is provided with an indicator rod (12) at one end near the storage box body (1), and a scale bar (13) is provided on the outside of the storage box body (1) and at one end near the indicator rod (12).

6. The material storage mechanism of a semiconductor testing and sorting machine according to claim 1, characterized in that: The distance between the two sets of rotating rods (3) is less than the distance between the two sets of guide rails (2), and the multiple sets of guide rails (2) are connected by a connecting box (14).

7. The material storage mechanism of a semiconductor testing and sorting machine according to claim 1, characterized in that: The bottom of the storage box body (1) is provided with a connecting frame (15), and a temporary storage box (16) is provided at one end of the storage box body (1) near the connecting frame (15). A first slide rail (17) is provided at one end of the connecting frame (15) near the temporary storage box (16), and a second slide rail (18) is provided on the outside of the first slide rail (17).

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