Anti-swing microneedle module and probe

Abstract

A microneedle module comprises a test seat and probes arranged in the test seat. The probe comprises an elastic connecting section, and a first contact part and a second contact part which are respectively positioned at two ends of the connecting section; the first contact part is used for being in contact with a test circuit board, the second contact part is used for being in contact with a to-be-tested piece, the connecting section comprises a multi-line elastic part and a single-line elastic part, and the multi-line elastic part and the single-line elastic part are smoothly connected into a whole; the second contact part is connected with the multi-wire elastic part, and the single-wire elastic part is connected with the first contact part. According to the utility model, the stress resistance of the probe of the microneedle module is improved, and the service life of the probe is prolonged.

Description

Technical Field

[0001] This utility model relates to circuit board testing devices, and more particularly to board-to-board connection testing devices that use a probe structure for contact conduction. Background Technology

[0002] In the manufacturing or repair of electronic products such as mobile phones, when it is necessary to test the conductivity or electrical performance of electronic components such as the motherboard, a micro-needle test module (or socket) composed of multiple elastic probes (also called springs) is generally used in conjunction with other components to form a test device for the corresponding tests. CN205941605U discloses a contact conductive structure, in which the conductive element 12 is an elastic probe. Figure 1 It includes a central, elastically bent connecting segment 123 and a first contact portion 121 and a second contact portion 122 located at both ends of the connecting segment. The connecting segment is composed of two parallel, meandering springs with alternating straight and curved sections along the length direction (Z direction), capable of expansion and contraction along the Z direction. This type of elastic probe (also known as a multi-wire elastic probe) consists of two or more springs. To achieve low stress and high total elastic force, the probe width is narrowed and the elastic connecting segment is lengthened. When the probe is compressed or the connecting segment is pressed, the springs oscillate and collide, increasing the stress of one of the springs and thus shortening the probe's lifespan. Summary of the Invention

[0003] This invention addresses the problem of wobbling multi-line elastic probes in existing microneedle modules by proposing a microneedle module comprising a test base and probes arranged within the test base. Each probe includes an elastic connecting section and a first contact portion and a second contact portion located at opposite ends of the connecting section. The first contact portion contacts a test circuit board, and the second contact portion contacts a device under test. Specifically, the connecting section comprises a multi-line elastic portion and a single-line elastic portion, which are smoothly connected as a single unit. The second contact portion is connected to the multi-line elastic portion, and the single-line elastic portion is connected to the first contact portion.

[0004] Furthermore,

[0005] The length of the multi-line elastic section is greater than the length of the single-line elastic section.

[0006] The multi-line elastic section includes two or more parallel springs, each spring including straight sections and curved sections alternately connected along the length of the connecting section; at least one connection point is provided between the springs to connect the parallel springs into one unit.

[0007] The probe is provided with at least one overpressure protection limiting point, which is located on the outer edge of the spring of the connecting section and is a protrusion that extends above its outer edge.

[0008] The single-line elastic section includes straight sections and curved sections that are alternately connected along the length of the connecting section; the width of the curved section is greater than the width of the straight section, and the width of the curved section gradually decreases until it smoothly connects with the straight section.

[0009] This invention also proposes a probe, which includes an elastic connecting segment and a first contact portion and a second contact portion located at both ends of the connecting segment. The first contact portion is used to contact a test circuit board, and the second contact portion is used to contact a circuit board under test. The connecting segment includes a multi-line elastic portion and a single-line elastic portion, which are smoothly connected as a whole. The second contact portion is connected to the multi-line elastic portion, and the single-line elastic portion is connected to the first contact portion.

[0010] Furthermore,

[0011] The multi-line elastic section includes two or more parallel springs, each spring including straight sections and curved sections alternately connected along the length of the connecting section; at least one connection point is provided between each spring to connect the parallel springs into one unit.

[0012] The single-line elastic section includes straight sections and curved sections that are alternately connected along the length of the connecting section; the width of the curved section is greater than the width of the straight section, and the width of the curved section gradually decreases until it smoothly connects with the straight section.

[0013] The probe is provided with at least one overpressure protection limiting point, which is located on the outer edge surface of the connecting section and is a protrusion that extends above its outer edge surface.

[0014] The length of the multi-line elastic section is greater than the length of the single-line elastic section.

[0015] Compared with the prior art, the beneficial effects of this utility model are: by utilizing the elasticity of multi-line springs and the stronger stress resistance of single-line springs, the problem of fracture caused by greater stress concentration at the bending point of the first contact part when the connecting section is squeezed is effectively solved.

[0016] Meanwhile, the width of the probe bend is widened by increasing the width of the single-wire spring section, and the width of the bend gradually changes to smoothly connect with the straight section, which can avoid stress concentration, improve the stress resistance of the probe of the microneedle module, and increase the service life of the probe. The connection point of the multi-wire spring of the probe connects the multi-wire spring into one unit to prevent the multi-wire spring from swinging when the probe is compressed. Attached Figure Description

[0017] Figure 1 A schematic diagram of the structure of the probe 12 that contacts a conductive structure in the prior art;

[0018] Figure 2 A cross-sectional view of the microneedle module in this preferred embodiment;

[0019] Figure 3 Axonometric projection schematic diagram of the separated components of the microneedle module in this preferred embodiment;

[0020] Figure 4 A cross-sectional view of the microneedle module in this preferred embodiment;

[0021] Figure 5 This preferred embodiment is a schematic diagram of the structure of a pair of probes.

[0022] Labeling instructions: 1. Probe, 11. First contact part, 13. Second contact part, 14. Elastic connecting section, 141. Single-line elastic part, 142. Multi-line elastic part, 142.4. Single spring constituting the multi-line elastic part; 2. Test seat, 21. Glue core seat, 22. Glue core, 23. Base, 24. Floating plate, 5. Overpressure protection limit point, 8. Connection point, 81. Straight part of the multi-line elastic part spring, 82. Bending part of the multi-line elastic part spring, 91. Straight part of the single-line elastic part spring, 92. Bending part of the single-line elastic part spring, 7. Test piece. Detailed Implementation

[0023] The preferred embodiments of this utility model will now be described in detail with reference to the accompanying drawings.

[0024] See Figures 2 to 5 A microneedle module includes a test socket 2 and probes 1 arranged within the test socket. The test socket 2 includes a core 22, a base 23, and a floating plate 24. The probes 1 are arranged in an orderly manner within the core 22, which is installed within a core seat 21 protruding upward from the base 23. The floating plate 24 is located on the upper part of the base. The first contact portion 11 of the probe extends out of the base 23 and is electrically connected to a measuring device. The second contact portion 13 of the probe extends out of the floating plate 24 for electrical connection with a device under test (DUT) 7. When the microneedle module is being tested, the first contact portion 11 of the probe 1 extending from the bottom of the test socket is generally pre-pressed and fixed to the PCB board of the measuring device. The DUT 7 is pressed onto the floating plate in sequence, making close contact with the second contact portion 13, and the probe is squeezed towards the bottom of the test socket.

[0025] See Figure 5With the width W of the probe as the X-axis and its length L as the Y-axis, the first contact portion 11 and the second contact portion 13 of the probe 1 are located at opposite ends of the elastic connecting segment 14 along its length (Y-direction). The elastic connecting segment 14 is capable of extending and retracting along the Y-direction and includes a multi-line elastic portion 1424 and a single-line elastic portion 141 smoothly integrated therewith. The second contact portion 13 is connected to the multi-line elastic portion 1424, and the single-line elastic portion 141 is connected to the first contact portion 11; the length L1 of the multi-line elastic portion is greater than the length L2 of the single-line elastic portion 141.

[0026] The multi-line elastic section 142 is composed of two or more parallel springs 1424, each spring 1424 consisting of a straight section 81 and a curved section 82 alternately connected along the Y direction in a meandering shape. At least one connection point 8 is provided between the springs 1424 of the multi-line elastic section 142, which are prone to oscillation, to connect the parallel springs into a single unit. The connection point 8 can be one or more depending on the length of the multi-line elastic section, and can be located at the center of the length direction of the multi-line springs. This effectively prevents the springs from oscillating and colliding with each other when the probe is under force, thus preventing the stress of one spring from increasing and causing it to break.

[0027] See Figure 5 The single-line elastic section 141 is a single spring consisting of a straight section 91 and a curved section 92 alternately connected along the Y direction. Furthermore, the straight section 91 and the curved section 92 of the single-line elastic section 141 are designed with unequal widths: where the stress is high, the spring width is increased; that is, the width W0 of the curved section 92, which bears greater stress, is greater than the width W1 of the straight section 91, which bears less stress. The width of the curved section gradually decreases towards the straight section until it smoothly connects with the straight section. This better solves the problem of fracture caused by greater stress concentration at the curved section during compression of the connecting segment.

[0028] like Figure 5 As shown, at the intersection of the curved portion and the straight portion of the multi-line elastic portion 142 and the single-line elastic portion 141 of the probe, a raised overpressure limiting point 5 is provided on the outer edge surface, protruding above its outer edge surface. This overpressure limiting point 5 can be set at one or more locations where the connecting section is subjected to greater stress when compressed. When the microneedle module is performing testing, the first contact portion 11 of the probe 1 extending from the bottom of the test base is pre-pressed and fixed to the PCB board. The test piece is pressed onto the second contact portion 13 at the top of the test base, and the probe is squeezed towards the bottom of the test base. Therefore, the connecting section closer to the pre-pressed first contact portion 11 will bear greater pressure. When the test piece is pressed onto the second contact portion 13 and the connecting section 14 is squeezed against the first contact portion 11, the overpressure limiting point 5 applies force in the opposite direction, preventing excessive deformation of the connecting portion and preventing probe breakage due to stress concentration.

[0029] See Figure 5 The curved portions of the multi-line elastic portion 142 and the single-line elastic portion 141 of the probe are arc-shaped, and the distance between the two ends of each arc is greater than the distance between the two straight portions connected by each curved portion. This structural design can solve the problem that when the probe is squeezed, the connecting section is compressed and the length of the connecting section becomes shorter, but the width of the connecting section does not become wider. This can reduce the generation and propagation of fatigue cracks and improve the durability and service life of the probe.

[0030] The probe is a one-piece molded structure, which is formed by etching, laser, photolithography, stamping and other methods on a thin metal plate.

[0031] It should be understood that the above embodiments are only used to illustrate the technical solutions of this utility model, and are not intended to limit it. Those skilled in the art can modify the technical solutions described in the above embodiments, or make equivalent substitutions for some of the technical features; and these modifications and substitutions should all fall within the scope of protection of the claims of this utility model.

Claims

1. A microneedle module, comprising a test socket and probes arranged within the test socket; the probes include a flexible connecting section and a first contact portion and a second contact portion located at both ends of the connecting section; the first contact portion is used to contact a test circuit board, and the second contact portion is used to contact a device under test, characterized in that: The connecting segment includes a multi-line elastic part and a single-line elastic part, which are smoothly connected as a whole; the second contact part is connected to the multi-line elastic part, and the single-line elastic part is connected to the first contact part.

2. The microneedle module according to claim 1, characterized in that: The length of the multi-line elastic section is greater than the length of the single-line elastic section.

3. The microneedle module according to claim 1, characterized in that: The multi-line elastic section includes two or more parallel springs, each spring including straight sections and curved sections alternately connected along the length of the connecting section; at least one connection point is provided between the springs to connect the parallel springs into one unit.

4. The microneedle module according to claim 1, characterized in that: The probe is provided with at least one overpressure protection limiting point; the overpressure protection limiting point is located on the outer edge surface of the spring of the connecting section and is a protrusion that protrudes above its outer edge surface.

5. The microneedle module according to claim 1, characterized in that: The single-line elastic section includes straight sections and curved sections that are alternately connected along the length of the connecting section; the width of the curved section is greater than the width of the straight section, and the width of the curved section gradually decreases until it smoothly connects with the straight section.

6. A probe, the probe comprising a resilient connecting segment and a first contact portion and a second contact portion located at both ends of the connecting segment, the first contact portion being used to contact a test circuit board, and the second contact portion being used to contact a circuit board under test, characterized in that: The connecting segment includes a multi-line elastic part and a single-line elastic part, which are smoothly connected as a whole; the second contact part is connected to the multi-line elastic part, and the single-line elastic part is connected to the first contact part.

7. The probe according to claim 6, characterized in that: The multi-line elastic section includes two or more parallel springs, each spring including straight sections and curved sections alternately connected along the length of the connecting section; at least one connection point is provided between each spring to connect the parallel springs into one unit.

8. The probe according to claim 6, characterized in that: The single-line elastic section includes straight sections and curved sections that are alternately connected along the length of the connecting section; the width of the curved section is greater than the width of the straight section, and the width of the curved section gradually decreases until it smoothly connects with the straight section.

9. The probe according to claim 6, characterized in that: The probe is provided with at least one overpressure protection limiting point; the overpressure protection limiting point is located on the outer edge surface of the connecting section and is a protrusion that extends above its outer edge surface.

10. The probe according to claim 6, characterized in that: The length of the multi-line elastic section is greater than the length of the single-line elastic section.

Images