Microneedle module and probe

Abstract

A microneedle module comprises a test seat and probes arranged in the test seat. The probe comprises an elastic connecting section, and a first contact part and a second contact part which are respectively positioned at two ends of the elastic connecting section; the first contact part is used for being in contact with a test circuit board, the second contact part is used for being in contact with a to-be-tested piece, and the elastic connection section comprises a first multi-line elastic part, a second multi-line elastic part and a single-line elastic part; the single-line elastic part is located between the first multi-line elastic part and the second multi-line elastic part, and the two ends of the single-line elastic part are smoothly connected with the first multi-line elastic part and the second multi-line elastic part into a whole respectively; the first contact part is connected with the first multi-wire elastic part, and the second multi-wire elastic part is connected with the second contact part. According to the utility model, the stress resistance of the probe of the microneedle module is improved, and the service life of the probe is prolonged.

Description

TECHNICAL FIELD

[0001] The utility model relates to a circuit board testing device, especially relate to the board to board connection testing device of contact conduction with probe structure. BACKGROUND

[0002] In the manufacturing process or maintenance of mobile phones and other electronic products, when the mainboard and other electronic components need to be tested for conduction or electrical performance, a micro-needle testing module (or socket) composed of multiple elastic probes (also known as spring sheets) is generally used to form a testing device with other components for corresponding testing. CN205941605U discloses a contact conduction structure, in which the conductive part 12 is an elastic probe Figure 1 , including multiple bent connection segments 123 in the middle with elasticity and first and second contact parts 121 and 122 respectively located at both ends of the connection segments. The connection segments are two parallel springs in a meandering shape with straight and curved sections connected alternately along the length direction (Z direction), which can stretch and contract along the Z direction. This type of elastic connection segment is composed of two or more springs (also known as multi-line elastic probes), which are designed to have a narrower width and longer elastic connection segment to achieve low stress value and high total elastic force. When the probe is pressed under stress, the compression of the connection segment will cause the springs to swing and collide with each other, increasing the stress value of one of the lines and thus reducing the service life of the probe. SUMMARY

[0003] The utility model wants to solve the problem of the multi-line elastic probe of the micro-needle module in the prior art, and proposes a micro-needle module, which includes a test seat and probes arranged in the test seat. The probe includes an elastic connection segment and first and second contact parts located at both ends of the elastic connection segment. The first contact part is used to contact a test circuit board, and the second contact part is used to contact a test piece. The elastic connection segment includes a first multi-line elastic part, a second multi-line elastic part, and a single-line elastic part. The single-line elastic part is located between the first and second multi-line elastic parts and is smoothly connected to them at both ends. The first contact part is connected to the first multi-line elastic part, and the second multi-line elastic part is connected to the second contact part.

[0004] Furthermore,

[0005] The single-line elastic part includes straight and curved sections connected alternately along the length direction of the elastic connection segment. The width of the curved section is greater than that of the straight section, and the width of the section of the curved section close to the straight section gradually decreases to smoothly connect to the straight section.

[0006] The curved section connecting the adjacent two straight sections is arc-shaped, and the distance between the two ends of the arc-shaped section is greater than the distance between the two straight sections connected by the curved section.

[0007] The multi-wire elastic part comprises two or more parallel multiple springs, and each of the springs comprises a straight part and a curved part alternately connected along the length direction of the elastic connecting section.

[0008] The probe is provided with at least one anti-overpressure limiting point, which is arranged on the outer edge surface of the spring of the elastic connecting section and is a protrusion higher than the outer edge surface.

[0009] The utility model discloses a probe, the probe includes the elastic connecting section and the first contact part and the second contact part respectively located at the both ends of the connecting section, the first contact part is used for contacting test circuit board, and the second contact part is used for contacting the circuit board of measuring, the elastic connecting section includes first multi-wire elastic part, second multi-wire elastic part and single wire elastic part, the single wire elastic part is located between first multi-wire elastic part and second multi-wire elastic part, and the both ends of single wire elastic part are connected with first multi-wire elastic part and second multi-wire elastic part as an organic whole smoothly, and first multi-wire elastic part is connected with the first contact part, and second multi-wire elastic part is connected with the second contact part.

[0010] Further,

[0011] The single wire elastic part comprises a straight part and a curved part alternately connected along the length direction of the elastic connecting section; the width of the curved part is greater than the width of the straight part, and the width of a section of the curved part close to the straight part gradually decreases to smoothly connect with the straight part.

[0012] The curved part connected with the adjacent two straight parts is arc-shaped, and the distance between the two ends of the arc-shaped part is greater than the distance between the two straight parts connected by the curved part.

[0013] The probe is provided with at least one anti-overpressure limiting point, which is arranged on the outer edge surface of the spring of the elastic connecting section and is a protrusion higher than the outer edge surface.

[0014] The multi-wire elastic part comprises two or more parallel multiple springs, and each of the springs comprises a straight part and a curved part alternately connected along the length direction of the elastic connecting section.

[0015] Compared with the prior art, the utility model has the beneficial effects that: the elastic force of the multi-wire spring and the stronger stress resistance of the single wire spring are utilized, the problem of fracture caused by the larger stress concentration due to the swing of the multi-wire spring when the connecting section is pressed is effectively solved.

[0016] Meanwhile, the width of the curved part of the single wire spring part is widened, and the width of the curved part gradually changes to smoothly connect with the straight part, so that stress concentration can be avoided, the stress resistance of the probe of the micro-needle module is improved, and the service life of the probe is improved.

[0017] The bending part of the elastic connecting part is arc-shaped, which can effectively reduce the generation of fatigue cracks. BRIEF DESCRIPTION OF DRAWINGS

[0018] Figure 1 Structure diagram of the probe 12 of the prior art contact conductive structure;

[0019] Figure 2 The sectional view schematic diagram of the microneedle module in the preferred embodiment;

[0020] Figure 3 The axonometric projection schematic diagram of the microneedle module in the preferred embodiment in a separated state of each component;

[0021] Figure 4 The axonometric projection sectional view schematic diagram of the microneedle module in the preferred embodiment;

[0022] Figure 5 The structure schematic diagram of a probe in the preferred embodiment;

[0023] Figure 6 The structure schematic diagram of another two kinds of probes which can be optionally used in the preferred embodiment.

[0024] Labeling description: 1 probe, 11 first contact part, 13 second contact part, 14 elastic connecting section, 141 first multi-wire elastic part, 142 single-wire elastic part, 143 second multi-wire elastic part, 1414 single spring of the first multi-wire elastic part, 1431 single spring of the second multi-wire elastic part; 2 test seat, 21 pressing plate, 22 glue core, 23 base, floating plate 24; 5 anti-overpressure limiting point; 91 straight part of the single-wire elastic part spring, 92 bending part of the single-wire elastic part spring; 7 to-be-measured piece. DETAILED DESCRIPTION

[0025] The preferred embodiment of the utility model will be described in detail in combination with the drawings.

[0026] Referring to Figures 2 to 5 A microneedle module, comprising a test seat 2 and probes 1 arranged in the test seat; the test seat 2 comprises a glue core 22, a base 23, a floating plate 24 and a pressing plate 21; the probes 1 are orderly arranged in the glue core 22, the glue core 22 is installed in the cavity of the base 23, the floating plate 24 is arranged on the upper part of the base, and the pressing plate 21 is located above the floating plate 24; the first contact part 11 and the second contact part 13 of the probe can respectively extend out of the base 23 and the floating plate 24, and are used for being electrically connected with a measuring device and a to-be-measured piece 7 respectively. When the microneedle module performs a test work, the first contact part 11 is pre-pressed and fixed to the PCB board of the measuring device, the to-be-measured piece 7 is pressed and covered on the floating plate 24 through the pressing plate 21, is in close contact with the second contact part 13, and extrudes the probe in the direction of the bottom of the test seat.

[0027] Referring toFigure 5 The width direction of the probe is X axis and the length direction is Y axis. The first contact part 11 and the second contact part 13 of the probe 1 are respectively located at the two ends of the elastic connection section 14 in the length direction (Y direction); the elastic connection section 14 can be stretched and contracted along the Y direction; the elastic connection section 14 comprises a first multi-wire elastic part 141, a second multi-wire elastic part 143 and a single-wire elastic part 142, the single-wire elastic part 142 is located between the first multi-wire elastic part and the second multi-wire elastic part and is smoothly connected with the two parts as a whole; the first contact part 11 is connected with the first multi-wire elastic part 141 and the second multi-wire elastic part 143 is connected with the second contact part 13.

[0028] The first multi-wire elastic part 141 and the second multi-wire elastic part 143 are similar in structure and each comprises two or more parallel springs 1414, 1431, each spring 1414, 1431 is alternately connected by a straight part and a curved part along the length direction of the connection section and has a meandering shape. The number of springs of the first multi-wire elastic part and the second multi-wire elastic part can be the same or different and the length of the springs can be the same or different.

[0029] Referring to Figure 5 The single-wire elastic part 142 is composed of a single spring alternately connected by a straight part 91 and a curved part 92 along the length direction of the connection section; and the straight part 91 and the curved part 92 of the single-wire elastic part 141 are designed with different widths: at the position with large stress, the width of the spring is widened, that is, the width W2 of the curved part 92 which bears larger stress is larger than the width W1 of the straight part 91 which bears smaller stress and the width of the section of the curved part close to the straight part gradually decreases to smoothly connect with the straight part. This structure effectively solves the problem of fracture caused by stress concentration at the curved part when the connection part is pressed, thereby improving the service life of the probe.

[0030] Referring to Figure 5 The curved part 92 of the single-wire elastic part 141 is arc-shaped and the distance D1 between the two ends of the arc-shaped curved part 92 is larger than the distance D2 between the two straight parts connected by the curved part 92; this structure design makes the width of the connection part not widen under the condition that the length of the connection part is shortened when the probe is compressed under stress, thereby reducing the generation and expansion of fatigue cracks and improving the durability and service life of the probe. At the same time, the curved part 92 is arc-shaped, which can effectively reduce the generation of fatigue cracks at the curved part.

[0031] As Figure 5As shown, the outer edge surface at the intersection of the bending part and the straight part of the single-wire elastic part is provided with a raised anti-overpressure limiting point 5 higher than the outer edge surface, which can be provided at one or more parts of the single-wire elastic part under greater stress; the anti-overpressure limiting point 5 can also be provided on the outer edge surface of the outermost spring of the first multi-wire elastic part and the second multi-wire elastic part. When the microneedle module is in testing work, the first contact part 10 of the probe 1 protruding from the bottom of the test seat is pre-pressed and fixed to the PCB board, the test piece 7 is sequentially pressed and covered on the second contact part 13 at the top of the test seat, and the probe is extruded towards the bottom of the test seat. When the test piece is pressed and covered on the second contact part 13, the connecting part 14 is extruded to the first contact part 11 to apply force, the anti-overpressure limiting point 5 applies force in the opposite direction, blocks the deformation of the connecting part, and avoids stress concentration and probe breakage.

[0032] In order to prevent the springs of the first and second multi-wire elastic parts from swinging when the probe is extruded, a connecting point can be provided on the first and second multi-wire elastic parts to connect the parallel springs of each part into one.

[0033] According to the needs of the test piece and the measurement setting, such as Figure 6 As shown in a, the first contact part 11 of the probe can be provided at the middle position in the width direction of the probe, and the second contact part and the contact end of the test piece are provided in a toothed shape; or as shown in b, the first contact part 11 of the probe is provided to be as wide as the probe, and the second contact part and the contact end of the test piece are provided with a chamfer. Figure 6

[0034] Each probe in the above embodiments is an integrally formed structure, which can be processed and formed on a metal sheet by etching, laser, lithography, stamping, etc.

[0035] It should be understood that the above embodiments are only used to illustrate the technical solutions of the present application, and are not limited thereto. Those skilled in the art can modify the technical solutions described in the above embodiments, or make equivalent replacement to some technical features; and these modifications and replacements should all belong to the scope of protection claimed by the present application.​

Claims

1. A micro-needle module, comprising a test seat and a probe arranged in the test seat; the probe comprises a elastic connecting section and a first contact section and a second contact section respectively located at two ends of the elastic connecting section; the first contact section is used for contacting a test circuit board, and the second contact section is used for contacting a to-be-tested member, and the micro-needle module is characterized in that: the elastic connecting section comprises a first multi-wire elastic section, a second multi-wire elastic section and a single-wire elastic section; the single-wire elastic section is located between the first multi-wire elastic section and the second multi-wire elastic section, and the single-wire elastic section is smoothly connected with the first multi-wire elastic section and the second multi-wire elastic section at two ends respectively; the first contact section is connected with the first multi-wire elastic section, and the second multi-wire elastic section is connected with the second contact section. 2.The micro-needle module according to claim 1, characterized in that: the single-wire elastic section comprises straight sections and curved sections which are alternately connected along the length direction of the elastic connecting section; the width of the curved section is greater than the width of the straight section, and the width of a section of the curved section close to the straight section gradually decreases to smoothly connect with the straight section. 3.The micro-needle module according to claim 2, characterized in that: the curved section connected with two adjacent straight sections is in an arc shape, and the distance between two ends of the arc shape is greater than the distance between the two straight sections connected by the curved section. 4.The micro-needle module according to claim 1, characterized in that: the multi-wire elastic section comprises two or more parallel springs, and each spring comprises straight sections and curved sections which are alternately connected along the length direction of the elastic connecting section. 5.The micro-needle module according to claim 1, characterized in that: at least one anti-overvoltage limiting point is arranged on the probe, and the anti-overvoltage limiting point is arranged on the outer edge surface of the spring of the elastic connecting section and is a protrusion higher than the outer edge surface. 6.A probe, comprising a elastic connecting section and a first contact section and a second contact section respectively located at two ends of the connecting section; the first contact section is used for contacting a test circuit board, and the second contact section is used for contacting a to-be-tested circuit board, and the probe is characterized in that: the elastic connecting section comprises a first multi-wire elastic section, a second multi-wire elastic section and a single-wire elastic section; the single-wire elastic section is located between the first multi-wire elastic section and the second multi-wire elastic section, and the single-wire elastic section is smoothly connected with the first multi-wire elastic section and the second multi-wire elastic section at two ends respectively; the first contact section is connected with the first multi-wire elastic section, and the second multi-wire elastic section is connected with the second contact section. 7.The probe according to claim 6, characterized in that: the single-wire elastic section comprises straight sections and curved sections which are alternately connected along the length direction of the elastic connecting section; the width of the curved section is greater than the width of the straight section, and the width of a section of the curved section close to the straight section gradually decreases to smoothly connect with the straight section. 8.The probe according to claim 7, characterized in that: the curved section connected with two adjacent straight sections is in an arc shape, and the distance between two ends of the arc shape is greater than the distance between the two straight sections connected by the curved section. 9.The probe according to claim 6, characterized in that: ​ ​ ​ ​ ​ ​ ​ ​ The probe is provided with at least one anti-overpressure limiting point, which is arranged on the outer edge surface of the spring of the elastic connecting section and is a protrusion higher than the outer edge surface.

10. The probe according to claim 6, characterized in that: The multi-wire elastic part comprises two or more parallel springs, and each of the springs comprises a straight section and a curved section which are alternately connected along the length direction of the elastic connecting section.

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