Equipment impedance testing device and system

Abstract

The utility model discloses an equipment impedance testing device and system, and relates to the field of impedance testing, a signal generation module is connected with a control module and a coupling module, and one path of output end of a power supply is connected with one path of power supply input end of equipment to be tested through the coupling module. The residual output end of the power supply is correspondingly connected with the residual power supply input end of the to-be-tested device, and the data acquisition module is connected with the control module and the to-be-tested device. The control module is used for controlling the signal generation module to output a plurality of electric signals with constant amplitude and variable frequency and obtaining the impedance of the to-be-tested equipment according to the power supply voltage and current sent by the data acquisition module, and the coupling module is used for coupling the electric signals; the data acquisition module is used for acquiring the current in the power supply circuit and the power supply voltage of the to-be-tested device under each electric signal. According to the scheme, the power supply ensures that the to-be-tested equipment is in a power-on state, so that the impedance of the to-be-tested equipment can be accurately and reliably obtained subsequently, the active working state of the to-be-tested equipment is truly reflected, and practical application is facilitated.

Description

TECHNICAL FIELD

[0001] The utility model relates to impedance test technical field especially, and it is a kind of device impedance testing device and system. BACKGROUND

[0002] The impedance of equipment determines the response of equipment to current at a specific frequency, and impedance will affect the performance of equipment in the electromagnetic environment. If the impedance of equipment changes with frequency, it may cause different electromagnetic interference at different frequencies. Electromagnetic interference refers to the electromagnetic energy generated by equipment during operation. If it exceeds the bearing range of the surrounding environment, it will interfere with other equipment. Correspondingly, electromagnetic immunity refers to the ability of equipment to maintain normal operation in an electromagnetic environment. This requires equipment to have certain anti-interference ability to maintain stable performance under electromagnetic interference. Therefore, when designing, it is necessary to try to keep the impedance of equipment stable within the required frequency range. For this reason, the test of equipment impedance is crucial.

[0003] Currently, the impedance of equipment is usually tested using an LCR tester or an impedance tester. During the test, the equipment is in a powered-off state, i.e., the equipment is not externally connected to a power supply and is in a powered-off state. The tester is directly connected to the equipment and outputs to achieve impedance testing. However, the test results obtained at this time only reflect the passive impedance characteristics of the equipment in the powered-off state. In actual application, the active impedance characteristics of the equipment can truly reflect the working characteristics of the equipment in the powered-on state during operation, which is the focus of designers. Therefore, the passive impedance characteristics obtained by the current related technology are not sufficient to evaluate the active impedance characteristics of the equipment in the powered-on state, and cannot effectively reflect the electromagnetic performance of the equipment in the powered-on state.

[0004] Therefore, how to provide an effective solution to realize impedance testing of equipment in the powered-on state is a current problem to be solved. INVENTION CONTENTS

[0005] Therefore, the utility model provides a kind of equipment impedance testing device and system, can accurately and reliably obtain the impedance of the equipment to be measured in the powered-on state, to truly reflect the active working state of the equipment to be measured, and facilitate practical application.

[0006] To solve the above technical problems, the present application provides a kind of equipment impedance testing device, including signal generation module, control module, coupling module and data acquisition module;The signal generation module is connected with the control module and the coupling module respectively, and one output end of power supply is connected with one power supply input end of equipment to be measured through the coupling module, and the remaining output end of the power supply is connected with the corresponding remaining power supply input end of the equipment to be measured;The data acquisition module is connected with the control module and the equipment to be measured respectively.

[0007] The power supply is configured to supply power to the device under test;

[0008] The control module is configured to control the signal generation module to output a plurality of electrical signals with constant amplitude and changing frequency, and obtain the impedance of the device under test according to the power supply voltage and current sent by the data acquisition module;

[0009] The coupling module is configured to couple the electrical signals into the power supply circuit of the device under test;

[0010] The data acquisition module is configured to acquire the current in the power supply circuit under each electrical signal, and the power supply voltage of the device under test.

[0011] Further, the power amplification module is further included;

[0012] The input end of the power amplification module is connected with the output end of the signal generation module, and the output end of the power amplification module is connected with the input end of the coupling module, so as to perform power amplification on the electrical signals.

[0013] Further, the power amplification module is a power amplifier.

[0014] Further, the coupling module is a coupling transformer.

[0015] Further, the signal generation module is a signal source.

[0016] Further, the power supply is a direct current power supply configured to supply power to the device under test;

[0017] The first output end of the direct current power supply is connected with the first power supply input end of the device under test through the coupling module, and the second output end of the direct current power supply is connected with the second power supply input end of the device under test.

[0018] Further, the power supply is an alternating current power supply configured to supply power to the device under test;

[0019] Any phase output end of the alternating current power supply is connected with the corresponding phase power supply input end of the device under test through the coupling module, and the remaining two phase output ends of the alternating current power supply are connected with the remaining two phase power supply input ends of the device under test one by one.

[0020] Further, the data acquisition module is an oscilloscope.

[0021] To solve the above technical problems, the utility model further provides a device impedance test system, including direct current power supply, switch module and for accessing first device under test's direct current device interface, still include as above described device impedance test device;

[0022] The output end of the direct current power supply is connected with the input end of the switch module, the first path output end of the switch module is connected with the first sub-interface of the direct current device interface through the coupling module in the device impedance test device, and the second path output end of the switch module is connected with the second sub-interface of the direct current device interface.

[0023] The switch module is used for being turned on to make the direct current power supply supply power for the first to-be-tested device at the beginning of the test, and being turned off at the end of the test.

[0024] Further, the device impedance test system further comprises a power supply interface and an alternating current device interface for accessing a second to-be-tested device.

[0025] The first sub-interface of the power supply interface is connected with the first sub-interface of the alternating current device interface through the coupling module in the device impedance test device, the second sub-interface of the power supply interface is connected with the second sub-interface of the alternating current device interface, and the third sub-interface of the power supply interface is connected with the third sub-interface of the alternating current device interface.

[0026] The power supply interface is used for accessing external input alternating current.

[0027] The application provides a device impedance test device and system, a signal generation module is connected with a control module and a coupling module, one output end of a power supply is connected with one power supply input end of a to-be-tested device through the coupling module, and the remaining output ends of the power supply are connected with the remaining power supply input ends of the to-be-tested device in correspondence, a data acquisition module is connected with the control module and the to-be-tested device, the control module is used for controlling the signal generation module to output a plurality of electrical signals with constant amplitude and changing frequency, and obtaining the impedance of the to-be-tested device according to the power supply voltage and current sent by the data acquisition module, the coupling module is used for coupling the electrical signals into the power supply circuit of the to-be-tested device, and the data acquisition module is used for acquiring the current in the power supply circuit and the power supply voltage of the to-be-tested device under each electrical signal. It can be seen that the power supply of the scheme ensures that the to-be-tested device is in a powered-on state, on this basis, the electrical signals output by the signal generation module are coupled into the power supply circuit through the coupling module, which is conducive to accurately and reliably obtaining the impedance of the to-be-tested device, to truly reflect the active working state of the to-be-tested device, and effectively reflect the electromagnetic performance of the device in the powered-on state, and the impedance of the to-be-tested device in the powered-on state is conducive to the subsequent targeted design of a corresponding filter, to improve the electromagnetic compatibility performance of the to-be-tested device, and is conducive to practical application.

[0028] The above description is only a summary of the technical scheme of the application, in order to more clearly understand the technical means of the application, which can be implemented according to the content of the specification, and in order to make the above and other purposes, features and advantages of the application more obvious and easy to understand, the following specific embodiments of the application are described. Attached Figure Description

[0029] The accompanying drawings, which are included to provide a further understanding of this application and form part of this application, illustrate exemplary embodiments and are used to explain this application, but do not constitute an undue limitation of this application. In the drawings:

[0030] Figure 1 A schematic diagram of the structure of an impedance testing device provided by this utility model;

[0031] Figure 2 A schematic diagram of another impedance testing device provided by this utility model;

[0032] Figure 3 A schematic diagram of another impedance testing device provided by this utility model;

[0033] Figure 4 This is a schematic diagram of the structure of an impedance testing system for a device provided by this utility model. Detailed Implementation

[0034] The core of this utility model is to provide a device and system for testing device impedance, which can accurately and reliably obtain the impedance of the device under test when it is powered on, so as to truly reflect the active working state of the device under test and facilitate practical applications.

[0035] The technical solutions of the embodiments of this application will be clearly described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this application. All other embodiments obtained by those skilled in the art based on the embodiments of this application are within the scope of protection of this application.

[0036] The terms "first," "second," etc., used in the specification and claims of this application are used to distinguish similar objects and not to describe a specific order or sequence. It should be understood that such use of data can be interchanged where appropriate so that embodiments of this application can be implemented in orders other than those illustrated or described herein, and the objects distinguished by "first," "second," etc., are generally of the same class and the number of objects is not limited; for example, a first object can be one or more. Furthermore, in the specification and claims, "and / or" indicates at least one of the connected objects, and the character " / " generally indicates that the preceding and following objects are in an "or" relationship.

[0037] Please refer to Figure 1 , Figure 1 This is a schematic diagram of the structure of an impedance testing device provided in this application.

[0038] The device impedance testing device comprises a signal generation module 2, a control module 1, a coupling module 3 and a data acquisition module; the signal generation module 2 is connected with the control module 1 and the coupling module 3 respectively, one output end of a power supply is connected with one power supply input end of the device to be tested through the coupling module 3, and the remaining output ends of the power supply are connected with the remaining power supply input ends of the device to be tested correspondingly; the data acquisition module is connected with the control module 1 and the device to be tested respectively;

[0039] The power supply is used for supplying power for the device to be tested;

[0040] The control module 1 is used for controlling the signal generation module 2 to output a plurality of electrical signals with constant amplitude and changing frequency, and obtaining the impedance of the device to be tested according to the power supply voltage and current sent by the data acquisition module;

[0041] The coupling module 3 is used for coupling the electrical signals into the power supply circuit of the device to be tested;

[0042] The data acquisition module is used for acquiring the current in the power supply circuit under each electrical signal and the power supply voltage of the device to be tested.

[0043] In the embodiment, it is considered that the scheme in the prior art can only obtain the passive impedance characteristics of the device by using the LCR impedance analyzer, and the LCR impedance analyzer can only work when the device is not powered on, while the active impedance characteristics of the device can truly reflect the working characteristics of the device in the powered-on state, which is the focus of the designers, that is, only when the impedance of the device in the powered-on state is reliably obtained, can the device be designed with a filter to improve its electromagnetic compatibility, which refers to the ability of the device to work normally in its electromagnetic environment and not to cause electromagnetic disturbance that cannot be tolerated by anything in the environment, and requires the device to have sufficient anti-interference ability and electromagnetic disturbance generated by itself within a certain level. Therefore, the device impedance testing device provided by the application can accurately and reliably obtain the impedance of the device to be tested.

[0044] Specifically, the control module 1 can be a host PC, from the implementation principle, the control module 1 controls the signal generation module 2 to output a plurality of electrical signals with constant amplitude and changing frequency, and specifically can control the signal generation module 2 to output the electrical signals in a certain scanning time step by step, then the data acquisition module can acquire the current in the power supply circuit under each electrical signal and the power supply voltage of the device to be tested, one electrical signal corresponds to one frequency, then the control module 1 obtains the current and the power supply voltage under the current frequency, and then obtains the impedance under the current frequency by dividing the power supply voltage by the current, and finally obtains the impedance under a plurality of frequencies. Exemplarily, the amplitude herein includes but is not limited to 1V.

[0045] It also needs to be explained that the communication between the control module 1 and the data acquisition module and the signal generation module 2 can be realized by means of a local area network, which has the advantages that the data transmission efficiency is fast, and the communication distance is not limited, and the whole test device is not easy to be affected by external electromagnetic interference; Specifically, the data acquisition module and the signal generation module 2 correspond to different IP addresses (Internet Protocol Address, Internet Protocol Address) respectively, so as to ensure the reliable communication between the networks.

[0046] In addition, the power supply of the power supply can ensure the normal power-on work of the device under test, and the output of the signal generation module 2 to the electric signal can start after the normal power-on work of the device under test; It also needs to be explained that for the frequency, the specific selection of which frequency value as the output reference of the electric signal is not particularly limited here, which can be determined according to the target frequency point in the whole frequency band that the device under test wants to measure at present.

[0047] In addition, as Figure 1 shown, in order to display and as a kind of connection diagram, Figure 1 The data acquisition module is an oscilloscope 4, and the power supply is a direct current power supply.

[0048] In summary, the present application provides a device impedance test device, the power supply of the power supply ensures that the device under test is in the power-on state, on this basis, the electric signal output by the signal generation module 2 is coupled to the power supply circuit through the coupling module 3, which is conducive to the subsequent accurate and reliable impedance of the device under test, to truly reflect the active working state of the device under test, and effectively reflect the electromagnetic performance of the device under the power-on state, and the impedance of the device under test under the power-on state is conducive to the subsequent targeted design of the corresponding power filter, to improve the electromagnetic compatibility performance of the device under test, the test principle is simple, and the test port can be expanded according to the actual situation, such as simultaneously realizing the power-on of multiple devices under test, and outputting multiple electric signals corresponding to each device under test through the signal generation module 2 to its power supply circuit, and collecting the circuit parameters (power supply voltage and current) in each power supply circuit by using the data acquisition module. It can be seen that the scheme is conducive to practical application.

[0049] On the basis of the above embodiment:

[0050] In some embodiments, it also includes a power amplification module 5;

[0051] The input end of the power amplification module 5 is connected with the output end of the signal generation module 2, and the output end of the power amplification module 5 is connected with the input end of the coupling module 3, for power amplification of the electric signal.

[0052] In this embodiment, please refer to Figure 2Wherein, for the convenience of display and as a kind of connection diagram, Figure 2 The data acquisition module is taken as an oscilloscope 4 and the power supply is taken as a direct current power supply for example in the diagram.

[0053] It can be seen that the power amplification output of the electric signal is realized through the above setting, which is beneficial to drive the subsequent connected coupling module 3.

[0054] In some embodiments, the power amplification module 5 is a power amplifier.

[0055] Specifically, the power amplifier here can be an audio power amplifier.

[0056] In some embodiments, the coupling module 3 is a coupling transformer 31.

[0057] In the embodiment, the electric signal can be simply and reliably coupled into the power supply loop of the device under test through the above setting. Specifically, as shown in Figure 2 The first output end of the power amplification module 5 is connected with the first input end of the coupling transformer 31, the second output end of the power amplification module 5 is connected with the second input end of the coupling transformer 31, the first output end of the coupling transformer 31 is connected with the first output end of the direct current power supply, and the second output end of the coupling transformer 31 is connected with the first power supply input end of the device under test.

[0058] In some embodiments, the signal generation module 2 is a signal source 21.

[0059] In the embodiment, the output of multiple electric signals can be simply and reliably realized through the above setting. Specifically, the signal source 21 here can be a 33500B series signal source 21; more specifically, as shown in Figure 2 The control end of the signal source 21 is connected with the first output end of the control module 1, and the output end of the signal source 21 is connected with the signal input end of the power amplification module 5, and the connection line between the two can be a radio frequency coaxial line.

[0060] In some embodiments, the power supply is a direct current power supply for supplying power to the device under test.

[0061] The first output end of the direct current power supply is connected with the first power supply input end of the device under test through the coupling module 3, and the second output end of the direct current power supply is connected with the second power supply input end of the device under test.

[0062] Specifically, considering that some to-be-tested devices are devices requiring direct current power supply, the power supply here can be a direct current power supply to ensure power supply reliability and ensure normal power-on work of the to-be-tested device; more specifically, when the first output end here is the positive pole of the direct current power supply, the second output end is the negative pole of the direct current power supply; when the first output end is the negative pole of the direct current power supply, the second output end is the positive pole of the direct current power supply, but it should be noted that the positive pole of the direct current power supply needs to be connected to the positive power supply pin of the to-be-tested device, and even if connected through the coupling module 3, the correspondence needs to be ensured, and similarly, the negative pole of the direct current power supply needs to be connected to the negative power supply pin of the to-be-tested device, and even if connected through the coupling module 3, the correspondence needs to be ensured.

[0063] In some embodiments, the power supply is an alternating current power supply for supplying power to the to-be-tested device.

[0064] Any phase output end of the alternating current power supply is connected to the corresponding phase power supply input end of the to-be-tested device through the coupling module 3, and the remaining two phase output ends of the alternating current power supply are connected to the remaining two phase power supply input ends of the to-be-tested device one by one.

[0065] Specifically, considering that some to-be-tested devices are devices requiring alternating current power supply, the to-be-tested device includes an A-phase power supply input end, a B-phase power supply input end, and a C-phase power supply input end, the power supply here can be an alternating current power supply such as a power grid to ensure power supply reliability and ensure normal power-on work of the to-be-tested device; specifically, the alternating current power supply is a three-phase power supply including an A-phase, a B-phase, and a C-phase, and here any one of the phases can be selected to be connected to the to-be-tested device through the coupling module 3, and there are three selection methods, and finally the impedance between the phases of the to-be-tested device is obtained; please refer to Figure 3 , Figure 3 for a description of selecting the A-phase of the alternating current power supply and testing the impedance between the A-phase power supply input end and the B-phase power supply input end of the to-be-tested device as an example for illustration, and for ease of display, Figure 3 in the number collection module as an oscilloscope 4, the signal generation module 2 as a signal source 21, and the coupling module 3 as a coupling transformer 31 as an example for description, the A-phase of the alternating current power supply is connected to the A-phase power supply input end of the to-be-tested device through the coupling transformer 31, the B-phase of the alternating current power supply is connected to the B-phase power supply input end of the to-be-tested device, and the C-phase of the alternating current power supply is connected to the C-phase power supply input end of the to-be-tested device.

[0066] In some embodiments, the data collection module is an oscilloscope 4.

[0067] In this embodiment, the oscilloscope 4 is selected as the data acquisition module, and the implementation is simple and reliable. Specifically, the oscilloscope 4 can include a voltage probe and a current probe. When the power supply is a direct current power supply, the data transmission end of the oscilloscope 4 is connected with the control module 1, the first voltage probe of the oscilloscope 4 is connected with the first power supply input end of the device under test, the second voltage probe of the oscilloscope 4 is connected with the second power supply input end of the device under test, and the current probe of the oscilloscope 4 is arranged on the connection cable directly connecting the power supply and the device under test. When the power supply is an alternating current power supply, the data transmission end of the oscilloscope 4 is connected with the control module 1. Assuming that the current test is the impedance between the A-phase power supply input end and the B-phase power supply input end of the device under test and the A-phase power supply input end is connected with the coupling module 3, the first voltage probe of the oscilloscope 4 is connected with the A-phase power supply input end of the device under test, the second voltage probe of the oscilloscope 4 is connected with the B-phase power supply input end of the device under test, and the current probe of the oscilloscope 4 is arranged on the connection cable between the B-phase output end of the alternating current power supply and the B-phase power supply input end of the device under test. If the current test is the impedance between the A-phase power supply input end and the C-phase power supply input end of the device under test and the impedance between the B-phase power supply input end and the C-phase power supply input end, the setting mode of the oscilloscope 4 is the same, and details are not described herein.

[0068] More specifically, the current probe herein can be a current loop, and as shown in Figure 1 , Figure 2 and Figure 3 , the circuit connection is realized.

[0069] In addition, the oscilloscope 4 has a root mean square calculation function, so that under the current frequency electrical signal, the oscilloscope 4 can collect the corresponding voltage waveform and current waveform, the corresponding voltage root mean square value Vrms can be obtained according to the voltage waveform and sent to the control module 1, the corresponding current root mean square value Irms can be obtained according to the current waveform and sent to the control module 1, and then the control module 1 determines the impedance Z=Vrms / Irms under the current frequency, which is ohm. It can be understood that the voltage root mean square value Vrms and the current root mean square value Irms can also be displayed on the oscilloscope 4 synchronously, so that the acquisition result can be more intuitively known by the technician; in addition, the oscilloscope 4 includes but is not limited to the MDO 2000 / 3000 / 4000 series oscilloscope.

[0070] Please refer to Figure 4 , Figure 4 for a structural schematic diagram of the device impedance test system provided by the utility model.

[0071] The device impedance test system comprises a direct current power supply 71, a switch module 72 and a direct current device interface 73 for connecting a first device under test, and further comprises the device impedance test device 6 as described above.

[0072] The output end of the direct current power supply 71 is connected with the input end of the switch module 72, the first path output end of the switch module 72 is connected with the first sub-interface of the direct current device interface 73 through the coupling module 3 in the device impedance test device 6, and the second path output end of the switch module 72 is connected with the second sub-interface of the direct current device interface 73.

[0073] The switch module 72 is used for being turned on to make the direct current power supply 71 supply power for the first to-be-tested device at the beginning of the test and being turned off at the end of the test.

[0074] For the introduction of the device impedance test system provided in the present application, please refer to the above-mentioned embodiments of the device impedance test device 6, which will not be repeated here.

[0075] In addition, the switch module 72 here can be a button, which is turned on when pressed and turned off when not pressed, or can be various controllable switches connected with the control module 1, which is not particularly limited here and can be selected according to actual needs.

[0076] In some embodiments, the device impedance test system further comprises a power supply interface 81 and an alternating current device interface 82 for accessing a second to-be-tested device;

[0077] The first sub-interface of the power supply interface 81 is connected with the first sub-interface of the alternating current device interface 82 through the coupling module 3 in the device impedance test device 6, the second sub-interface of the power supply interface 81 is connected with the second sub-interface of the alternating current device interface 82, and the third sub-interface of the power supply interface 81 is connected with the third sub-interface of the alternating current device interface 82.

[0078] The power supply interface 81 is used for accessing external input alternating current.

[0079] Specifically, through the above-mentioned arrangement, the device impedance test system can realize impedance test on devices powered by direct current and can also realize impedance test on devices powered by alternating current, which is beneficial to practical application, is beneficial to adaptation to various test occasions, and is good in flexibility.

[0080] The technical features of the above embodiments can be combined arbitrarily, and in order to make the description concise, all possible combinations of the technical features in the above embodiments are not described, however, as long as the combinations of the technical features do not exist contradictory, they should be considered as the scope of the present application.

[0081] The above embodiments only express several implementation manners of the present application, the description is more specific and detailed, but it should not be understood as a limitation on the scope of the patent of the present application. It should be pointed out that for ordinary skilled persons in the art, several modifications and improvements can be made without departing from the concept of the present application, which all belong to the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the appended claims.

[0082] It is also to be noted that, as used in this specification and the appended claims, the singular forms "a," "an," and "the" include plural referents unless the context clearly dictates otherwise. Furthermore, the terms "comprising," "containing," or any other variation thereof are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements is not necessarily limited to only those elements, but can include other elements not expressly listed or inherent to such process, method, article, or apparatus.

Claims

1. A device impedance testing apparatus, characterized by, The device impedance test device comprises a signal generating module, a control module, a coupling module and a data acquisition module; the signal generating module is connected with the control module and the coupling module; one output end of a power supply is connected with one power supply input end of a device under test through the coupling module; the remaining output ends of the power supply are connected with the remaining power supply input ends of the device under test correspondingly; the data acquisition module is connected with the control module and the device under test respectively; The power supply is used for supplying power for the device under test; The control module is used for controlling the signal generating module to output a plurality of electrical signals with constant amplitude and changing frequency, and obtaining the impedance of the device under test according to the power supply voltage and current sent by the data acquisition module; The coupling module is used for coupling the electrical signals into the power supply circuit of the device under test; The data acquisition module is used for acquiring the current in the power supply circuit under each electrical signal, and the power supply voltage of the device under test.

2. The device impedance test apparatus of claim 1, wherein, Further comprising a power amplification module; The input end of the power amplification module is connected with the output end of the signal generating module, and the output end of the power amplification module is connected with the input end of the coupling module, which is used for power amplifying the electrical signals.

3. The device impedance test apparatus of claim 2, wherein, The power amplification module is a power amplifier.

4. The device impedance test apparatus of claim 1, wherein, The coupling module is a coupling transformer.

5. The device impedance test apparatus of claim 1, wherein, The signal generating module is a signal source.

6. The device impedance test apparatus of claim 1, wherein, The power supply is a direct current power supply used for supplying power for the device under test; The first output end of the direct current power supply is connected with the first power supply input end of the device under test through the coupling module, and the second output end of the direct current power supply is connected with the second power supply input end of the device under test.

7. The device impedance testing apparatus of claim 1, wherein, The power supply is an alternating current power supply used for supplying power for the device under test; Any phase output end of the alternating current power supply is connected with the corresponding phase power supply input end of the device under test through the coupling module, and the remaining two phase output ends of the alternating current power supply are connected with the remaining two phase power supply input ends of the device under test correspondingly.

8. The device impedance test apparatus of any one of claims 1 to 7, wherein, The data acquisition module is an oscilloscope.

9. A device impedance test system, characterized by, The device impedance test system comprises a direct current power supply, a switch module, a direct current device interface for connecting a first device under test, and the device impedance test device according to any one of claims 1 to 8; The output end of the direct current power supply is connected with the input end of the switch module, the first output end of the switch module is connected with the first sub-interface of the direct current device interface through the coupling module in the device impedance test device, and the second output end of the switch module is connected with the second sub-interface of the direct current device interface; The switch module is used for being turned on to make the direct current power supply supply power for the first device under test at the beginning of the test, and being turned off at the end of the test.

10. The device impedance test system of claim 9, wherein, The device impedance test system further comprises a power supply interface and an alternating current device interface for connecting a second device under test; The first sub-interface of the power supply interface is connected with the first sub-interface of the alternating current device interface through the coupling module in the device impedance test device, the second sub-interface of the power supply interface is connected with the second sub-interface of the alternating current device interface, and the third sub-interface of the power supply interface is connected with the third sub-interface of the alternating current device interface. The power interface is used to access externally input alternating current.

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