Insulated gate bipolar transistor (IGBT) optocoupler noise testing mechanism

Abstract

The utility model discloses an IGBT optocoupler noise testing mechanism comprising a control unit, and a program control signal source, a program control SMU unit and a detection unit which are electrically connected with the control unit. The control unit is connected with the program control signal source through the first FPGA module, the control unit is connected with the program control SMU unit through the second FPGA module, excitation output of the program control signal source is connected with an optocoupler input end of a tested product, excitation output of the program control SMU unit is connected with a first optocoupler output end of the tested product, and excitation output of the program control SMU unit is connected with a second optocoupler output end of the tested product. The input end of the detection unit is connected with the second optocoupler output end of the tested product. The utility model discloses an IGBT optocoupler noise testing mechanism. The problems that a conventional noise platform in a laboratory uses numerous instruments and wiring is complex at present are solved, the efficiency of evaluating the stability of the IGBT optocoupler in the laboratory is improved to a great extent, the time cost and the equipment cost are saved, the test threshold is reduced, and the high-speed development of the optocoupler industry is promoted.

Description

Technical Field

[0001] This utility model relates to the field of semiconductor testing technology, and in particular to an IGBT optocoupler noise testing mechanism. Background Technology

[0002] In recent years, with the rapid development of the new energy vehicle industry, domestically produced IGBT optocouplers for automotive applications have gained market favor.

[0003] Noise testing is a crucial step in evaluating the stability of IGBT (Insulated Gate Bipolar Transistor) optocouplers. The platforms used in the original evaluation required numerous precision instruments and were complex to operate, which no longer meet the needs of packaging plant laboratories for evaluating the stability of IGBT optocouplers. While ensuring test stability, there is an urgent need to quickly deploy a more efficient, easy-to-use, and low-cost testing platform.

[0004] The core purpose of IGBT optocoupler noise testing is to detect the noise generated during the operation of the IGBT driving the optocoupler, ensuring its stability and reliability. Through testing, the performance of the optocoupler can be evaluated to determine if it meets design requirements, and potential noise problems can be identified, allowing for corresponding improvement measures. The principle of IGBT optocoupler noise testing is based on the working principle and characteristics of the optocoupler. An IGBT optocoupler consists of a light-emitting diode (LED) and a photosensitive insulated-gate bipolar transistor (IGBT). When the LED is powered on, the emitted light is transmitted to the IGBT through an optical path, causing it to conduct. The optocoupler achieves both electrical signal transmission and isolation, exhibiting excellent isolation performance, fast transmission speed, and good withstand voltage performance.

[0005] Therefore, there is an urgent need to develop a testing mechanism that is simple in structure, efficient and convenient for testing IGBT optocoupler noise. Utility Model Content

[0006] This invention overcomes the shortcomings of existing technologies and provides an IGBT optocoupler noise testing mechanism. It overcomes the problems of numerous instruments and complex wiring in current conventional laboratory noise platforms, greatly improving the efficiency of laboratory IGBT optocoupler stability assessment, saving time and equipment costs, lowering the testing threshold, and promoting the rapid development of the optocoupler industry.

[0007] In order to achieve the above object, the utility model adopts the technical scheme: a kind of IGBT photo-coupler noise test mechanism, comprising: control unit, and respectively with the electric connection of control unit program-controlled signal source, program-controlled SMU unit, the program-controlled SMU unit is also connected with detection unit;Control unit is connected with program-controlled signal source by FPGA module one, control unit is connected with program-controlled SMU unit by FPGA module two, the excitation output of program-controlled signal source is connected with the photo-coupler input end of product to be tested, the excitation output of program-controlled SMU unit is connected with the photo-coupler output end one of product to be tested, the input end of detection unit is connected with the photo-coupler output end two of product to be tested.

[0008] Specifically, the control unit can directly adopt a conventional industrial computer mainboard (integrated CPU), i.e., an industrial computer, which is used to send control instructions of each module in the structure.

[0009] In a preferred embodiment of the utility model, the control unit is connected with the FPGA module one and the FPGA module two through an ISA communication bus.

[0010] In a preferred embodiment of the utility model, the program-controlled signal source includes a noise source and a square wave source, and the noise source and the square wave source are connected with the positive input end of an adder respectively.

[0011] In a preferred embodiment of the utility model, the adder includes an operational amplifier OPA1, the inverting input end of the operational amplifier OPA1 is connected with the ground through a second resistor R2; the non-inverting input end of the operational amplifier OPA1 leads out two paths, one path is connected with the noise source through a third resistor R3, and the other path is connected with the square wave source through a fourth resistor R4; the output end of the operational amplifier OPA1 is connected with the photo-coupler input end of the product to be tested as the excitation output of the program-controlled signal source through a fifth resistor R5; and the inverting input end of the operational amplifier OPA1 and the output end of the operational amplifier OPA1 are connected through a first resistor R1.

[0012] In a preferred embodiment of the utility model, the product to be tested is an IGBT device, the anode of the photodiode of the IGBT device is the photo-coupler input end, the cathode of the photodiode is grounded, the collector of the transistor in the IGBT device is the photo-coupler output end one, and the emitter of the transistor in the IGBT device is the photo-coupler output end two.

[0013] The photo-coupler output end one of the IGBT device and the ground end of the output side are connected through an indirect capacitor C11.

[0014] In a preferred embodiment of the utility model, the detection unit is an oscilloscope, and the photo-coupler output end two is connected with the input end of the oscilloscope.

[0015] In a preferred scheme of the utility model, the program-controlled SMU unit comprises a digital-to-analog conversion module, the input end of the digital-to-analog conversion module is connected with the second FPGA module and then connected with the control unit through an ISA communication bus, the output end of the digital-to-analog conversion module is connected with the input end of a constant voltage source, and the output end of the constant voltage source is connected with the photocoupler output end of the product to be tested as the excitation output of the program-controlled SMU unit.

[0016] In a preferred scheme of the utility model, the digital-to-analog conversion module comprises a DAC chip, the model of which is DAC7744, and is used for converting a digital signal into an analog signal; and the constant voltage source comprises an operational amplifier chip, the model of which is OPA548T.

[0017] Specifically, the program-controlled SMU unit 3 is an SMU board card in the prior art, is an internal component of the tester, and comprises a digital-to-analog conversion module and a constant voltage source. In the utility model, the program-controlled SMU unit 3 is used for constant voltage power-on.

[0018] Compared with the prior art, the utility model has the beneficial effects that:

[0019] The utility model discloses an IGBT photocoupler noise test mechanism; overcome the current laboratory conventional noise platform uses many instruments, the problem of complex wiring, greatly improves the efficiency of the laboratory to the IGBT photocoupler stability evaluation, saves time cost and equipment cost, reduces the test threshold, promotes the high-speed development of photocoupler industry.

[0020] Save the instruments and reduce the procurement cost of precision instrument equipment in the laboratory.

[0021] Interactive operation is simple, and the test threshold is reduced. DRAWINGS

[0022] The utility model is further described below in combination with the drawings and embodiments.

[0023] Figure 1 It is the overall framework diagram of the IGBT photocoupler noise test mechanism provided by the embodiment of the utility model.

[0024] Figure 2 It is the signal source excitation superposition circuit principle diagram of the IGBT photocoupler noise test mechanism provided by the embodiment of the utility model.

[0025] Figure 3 It is the test circuit principle diagram of the IGBT photocoupler noise test mechanism provided by the embodiment of the utility model.

[0026] Figure 4 It is the description of the time measurement mode test waveform parameter of the IGBT photocoupler noise test mechanism provided by the embodiment of the utility model.

[0027] Figure 5 The anti-overshoot waveform test result of the IGBT optical coupling noise test mechanism is provided by the embodiment of the utility model;

[0028] Figure 6 The test IGBT optical coupling tR waveform screenshot of the IGBT optical coupling noise test mechanism is provided by the embodiment of the utility model, and the ∆x = 22nS in the figure is tR time;

[0029] Figure 7 The IGBT optical coupling tPHL waveform screenshot of the IGBT optical coupling noise test mechanism is provided by the embodiment of the utility model, and the ∆x = 197nS in the figure is tPHL time.

[0030] Wherein, 1 - program control signal source, 11 - noise source, 12 - square wave source, 13 - adder, 2 - program control SMU unit, 21 - digital-to-analog conversion module, 22 - constant voltage source, 3 - control unit, 4 - ISA communication bus, 5 - FPGA module one, 6 - FPGA module two, 7 - optical coupling input end, 8 - optical coupling output end one, 9 - detection unit, 10 - optical coupling output end two. DETAILED DESCRIPTION

[0031] The technical scheme of the utility model will be described in detail below by means of the drawings and specific embodiments, and it should be understood that the specific features in the embodiments and the specific features in the embodiments are detailed descriptions of the technical scheme of the utility model, rather than limitations of the technical scheme of the utility model, and the technical features in the embodiments and the embodiments can be combined with each other without conflict.

[0032] The term "and / or", only describes the association relationship of the associated objects, which means that there can be three relationships, for example, A and / or B, which means that there are three cases of A alone, A and B together, and B alone. In addition, the character " / ", generally represents that the associated objects before and after are in an "or" relationship. Embodiment one

[0033] As Figure 1 shown, the patent discloses an IGBT optical coupling noise test mechanism capable of testing the anti-noise, anti-overshoot performance and time parameters of IGBT optical coupling, comprising: a control unit 3, and a program control signal source 1, a program control SMU unit 2, and a detection unit 9 electrically connected with the control unit 3 through an ISA communication bus 4 and FPGA module one 5 and FPGA module two 6.

[0034] Specifically, as Figure 3As shown, the IGBT opto-coupler noise test circuit. Control unit 3 through the FPGA module 5 and program-controlled signal source 1 is connected, control unit 3 through the FPGA module 6 and program-controlled SMU unit 2 is connected, program-controlled signal source 1 of the excitation output and the opto-coupler input end 7 of the product under test is connected, program-controlled SMU unit 2 of the excitation output and the opto-coupler output end 8 of the product under test is connected, the input end of detection unit 9 and the opto-coupler output end 10 of the product under test is connected. Control unit 3 through the ISA communication bus 4 and FPGA module 5 and FPGA module 6 are connected respectively. Specifically, the detection unit 9 uses an oscilloscope, and the opto-coupler output end 10 is connected to the input end of the oscilloscope.

[0035] Specifically, as shown in Figure 2 The program-controlled signal source 1 includes a noise source 11, a square wave source 12, and an adder 13. The program-controlled signal source 1 includes a noise source 11 and a square wave source 12, and the noise source 11 and the square wave source 12 are connected to the positive input end of the adder 13, respectively. The output end of the adder 13 is connected to the opto-coupler input end 7 of the product under test. Specifically, the adder 13 includes a first resistor R1, a second resistor R2, a third resistor R3, a fourth resistor R4, a fifth resistor R5, and an operational amplifier OPA1. More specifically, the inverting input end of the operational amplifier OPA1 in the adder 13 is connected to the ground through the second resistor R2; the non-inverting input end of the operational amplifier OPA1 is connected to two paths, one of which is connected to the non-inverting input end of the operational amplifier OPA1 through the third resistor R3 and the noise source 11, and the other of which is connected to the square wave source 12 through the fourth resistor R4; the output end of the operational amplifier OPA1 is connected to the opto-coupler input end 7 of the product under test as the excitation output of the program-controlled signal source 1 through the fifth resistor R5. The first resistor R1 is connected between the inverting input end of the operational amplifier OPA1 and the output end of the operational amplifier OPA1 through the first resistor R1, and one end of the first resistor R1 and the second resistor R2 is connected to the inverting input end of the operational amplifier OPA1, and the other end of the first resistor R1 is connected to the output end of the operational amplifier OPA1. Further, the operational amplifier OPA1 is an integrated circuit semiconductor device.

[0036] More specifically, the program-controlled SMU unit 2 includes a digital-to-analog conversion module 21, the input end of the digital-to-analog conversion module 21 is connected with the control unit 3 through the ISA communication bus 4, the output end of the digital-to-analog conversion module 21 is connected with the input end of the constant voltage source 22, and the output end of the constant voltage source 22 is connected with the photocoupling output end one 8 of the tested product as the excitation output of the program-controlled SMU unit 2. Further, the digital-to-analog conversion module includes a DAC chip with a model of DAC7744 for converting digital signals into analog signals; and the constant voltage source includes an operational amplifier chip with a model of OPA548T. Specifically, the program-controlled SMU unit 3 is an SMU board card in the prior art and is an internal component of the tester, containing the digital-to-analog conversion module and the constant voltage source. In the utility model, the program-controlled SMU unit 3 is used as a constant voltage power-on.

[0037] More specifically, the tested product adopts an IGBT device, the anode of the photodiode of the IGBT device is the photocoupling input end 7, the cathode of the photodiode is grounded, the collector of the triode in the IGBT device is the photocoupling output end one 8, the emitter of the triode in the IGBT device is the photocoupling output end two 10; and the photocoupling output end one 8 of the IGBT device and the ground end of the output side are connected through an indirect capacitor C11. Embodiment two

[0038] On the basis of embodiment one, the control unit 3 is loaded with software in a graphical interface form to set the excitation parameters and test modes. The set parameter range has that the program-controlled signal source 1 outputs a voltage of 0~5V and a square wave frequency of 0~1MHz, the program-controlled SMU unit 2 outputs a voltage of 0~30V and an output precision of ±0.3% of range; and the optional mode has a noise resistance and overshoot resistance measurement mode and a time parameter measurement mode.

[0039] Generally, the control instructions of the excitation parameters and test modes set by the control unit 3 are sent to the FPGA module one 5 and the FPGA module two 6 through the ISA bus 4, and the FPGA module one 5 and the FPGA module two 6 control the program-controlled signal source 1 and the program-controlled SMU unit 2 to output respectively; more specifically, if the noise resistance and overshoot resistance measurement mode is selected, the program-controlled signal source 1 outputs a noise wave excitation or an optional noise wave and square wave superposition excitation to the photocoupling input end 7 of the tested IGBT device, the program-controlled SMU unit 2 outputs a 20V excitation to the photocoupling output end one 8 of the tested IGBT, and the probe of the oscilloscope adopted by the detection unit 9 is connected with the photocoupling output port 10 (photocoupling port Vo10) of the tested IGBT device to observe whether the oscilloscope IGBT photocoupling produces a response with the application of the noise excitation, if no response or less response waveforms are produced, it indicates that the IGBT photocoupling has a good noise resistance performance; if no overshoot response waveform is produced, it indicates that the IGBT photocoupling has a good overshoot resistance performance.

[0040] Test result example: anti-overshoot test, see Figure 5 The test data chart in the prior art and the data chart of the test of the embodiment are compared. As shown in Figure 5 , the "CH1" channel in the oscilloscope waveform is a noise source, and the "CH2" channel is the Vo port output waveform of the tested IGBT optocoupler. (The test conditions are: 1.2V noise is applied to the input end of the tested optocoupler, and VCC=20V DC voltage is applied to the output end one 8 (VCC port) of the tested optocoupler.) The left half is the test result of the conventional test structure, and the right half is the test result of the utility model. Figure 5 Only the anti-overshoot test of the IGBT optocoupler under the interference of noise is shown.

[0041] More specifically, as the time parameter measurement mode is selected, the program-controlled signal source 1 outputs a square wave excitation to the IGBT optocoupler input end 7 of the tested IGBT device, the program-controlled SMU unit 2 outputs 20V excitation to the output end one 8 of the tested IGBT optocoupler, and the probe of the oscilloscope is connected to the optocoupler output port 10 (optocoupler port Vo10) of the tested IGBT device. The response waveform generated by the oscilloscope IGBT optocoupler with the application of the square wave excitation is observed, as shown in Figure 4 , according to the instructions in the product manual of the tested IGBT optocoupler, the response waveform is pulled apart on the oscilloscope to test Tr, Tf, TPLH, and TPHL time parameters. Among them, Tr (Output Rise Time): rise time, which refers to the time required for the output signal to rise from low to high (10%~90%); Tf (Output Fall Time): fall time, which refers to the time required for the output signal to fall from high to low (90%~10%); TPLH (Propagation Delay Time to Logic High Output): high-level transmission delay, which is the time delay between the change of the input signal and the corresponding stabilization of the output signal to high level; TPHL (Propagation Delay Time to Logic Low Output): low-level transmission delay, which is the time delay between the change of the input signal and the corresponding stabilization of the output signal to low level. Further, as shown in Figure 6 , it is a Tr waveform screenshot of the utility model test of a certain IGBT optocoupler, and Δx=22nS is the Tr time. As shown in Figure 7 , it is a TPHL waveform screenshot of the utility model test of a certain IGBT optocoupler, and Δx=197nS is the tPHL time.

[0042] Working principle:

[0043] The utility model discloses a kind of IGBT photo-coupler noise test mechanism;Overcome the current laboratory conventional noise platform uses many instruments, the problem of complex wiring, improve the efficiency of laboratory to IGBT photo-coupler stability evaluation to a large extent, save time cost and equipment cost, reduce test threshold, promote the high-speed development of photo-coupler industry.

[0044] According to the ideal embodiment of the utility model, through the above description, relevant personnel can make various changes and modifications without deviating from the technical idea of the utility model. The technical scope of the utility model is not limited to the content of the specification, and the technical scope must be determined according to the scope of the claims.

Claims

1. An IGBT light coupling noise test mechanism, comprising: The control unit (3) is electrically connected with the program-controlled signal source (1) and the program-controlled SMU unit (2) respectively, and the program-controlled SMU unit (2) is further connected with a detection unit (9); characterized in that the control unit (3) is connected with the program-controlled signal source (1) through an FPGA module one (5), the control unit (3) is connected with the program-controlled SMU unit (2) through an FPGA module two (6), the excitation output of the program-controlled signal source (1) is connected with the opto-coupler input end (7) of the product to be tested, the excitation output of the program-controlled SMU unit (2) is connected with the opto-coupler output end one (8) of the product to be tested, and the input end of the detection unit (9) is connected with the opto-coupler output end two (10) of the product to be tested.

2. The IGBT light coupling noise test mechanism according to claim 1, characterized in that: The control unit (3) is connected with the FPGA module one (5) and the FPGA module two (6) through an ISA communication bus (4) respectively.

3. The IGBT light coupling noise test mechanism according to claim 2, characterized in that: The program-controlled signal source (1) comprises a noise source (11) and a square wave source (12), the noise source (11) and the square wave source (12) are connected with the positive input end of an adder (13) respectively, and the output end of the adder (13) is connected with the opto-coupler input end (7) of the product to be tested.

4. The IGBT light coupling noise test mechanism according to claim 3, characterized in that: The adder (13) comprises an operational amplifier OP A1, the inverting input end of the operational amplifier OP A1 is grounded through a second resistor R2, two paths are led out from the non-inverting input end of the operational amplifier OP A1, one path is connected with the noise source (11) through a third resistor R3, and the other path is connected with the square wave source (12) through a fourth resistor R4, the output end of the operational amplifier OP A1 is connected with the opto-coupler input end (7) of the product to be tested as the excitation output of the program-controlled signal source (1) through a fifth resistor R5, and the inverting input end of the operational amplifier OP A1 and the output end of the operational amplifier OP A1 are connected through a first resistor R1.

5. The IGBT light coupling noise test mechanism according to claim 4, characterized in that: The product to be tested adopts an IGBT device, the anode of the photodiode of the IGBT device is the opto-coupler input end (7), the cathode of the photodiode is grounded, the collector of the triode in the IGBT device is the opto-coupler output end one (8), and the emitter of the triode in the IGBT device is the opto-coupler output end two (10). The opto-coupler output end one (8) of the IGBT device and the ground end on the output side are connected through an indirect capacitor C11.

6. The IGBT light coupling noise test mechanism of claim 5, wherein: The detection unit (9) adopts an oscilloscope, and the opto-coupler output end two (10) is connected with the input end of the oscilloscope.

7. The IGBT light coupling noise test mechanism according to claim 6, characterized in that: The program-controlled SMU unit (2) comprises a digital-to-analog conversion module (21), the input end of the digital-to-analog conversion module (21) is connected with the FPGA module two (6), and then connected with the control unit (3) through the ISA communication bus (4), the output end of the digital-to-analog conversion module (21) is connected with the input end of a constant voltage source (22), the output end of the constant voltage source (22) is connected with the opto-coupler output end one (8) of the product to be tested as the excitation output of the program-controlled SMU unit (2).

8. The IGBT light coupling noise test mechanism of claim 7, wherein: The digital-to-analog conversion module (21) comprises a DAC chip, model number DAC7744, for converting digital signals into analog signals; the constant voltage source (22) comprises an operational amplifier chip, model number OPA548T.

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