High-frequency nondestructive test fixture for temperature compensation attenuator

Abstract

The utility model discloses a high-frequency nondestructive test fixture for a temperature compensation attenuator. Comprising a test base, a fixed clamping block arranged at one end of the test base, a movable clamping block capable of moving relative to the fixed clamping block, a test block which can be fixed between the fixed clamping block and the movable clamping block and is used for clamping a product, and a positioning mechanism which is arranged on the fixed clamping block and the movable clamping block and is used for positioning the test block, the fixing mechanism is arranged on the fixed clamping block and the movable clamping block and used for fixing the testing block, the two testing probes are oppositely arranged on the fixed clamping block and the movable clamping block, the moving mechanism is arranged on the testing base, connected with the movable clamping block and used for driving the movable clamping block to move, and a product groove which extends downwards from the top face of the testing block and used for installing a product is formed in the testing block. By limiting the structure of the test fixture, the product is placed on the test block, and then the moving mechanism is matched with the moving clamping block and the fixed clamping block to fix the test block, so that the test probe is just in butt joint with the leading-out end of the product, the overall operation is simple, and the test process is concise and efficient.

Description

TECHNICAL FIELD

[0001] The utility model belongs to temperature compensation attenuator test technical field, specifically related to a high frequency nondestructive test fixture for temperature compensation attenuator. BACKGROUND

[0002] The conventional test mode of temperature compensation attenuator is as follows: gold wire with diameter of 0.025mm is used as lead, the outgoing end of component is connected with microstrip line by hot pressing or ultrasonic welding, and vector network analyzer is connected to microstrip line for testing.Gold wire bonding technology is widely used in component field, and this technology has some shortcomings and limitations in many aspects, for example: the test method of gold wire bonding often causes damage to the surface of temperature compensation attenuator during welding, and the bonding site is easy to produce kirkendall cavity, which leads to the increase of resistance value of the product, and affects the accuracy and reliability of the test; during the bonding process and the testing process, the gold wire may be broken due to improper operation, which affects the product testing; gold wire bonding technology has high requirements for equipment and operators, and the operation difficulty is large, and the bonding quality has great influence on the test result; gold wire is easy to crystallize under high temperature condition, and has poor corrosion resistance; since microstrip line is used, the test precision cannot be ensured under high frequency test condition due to the impedance matching problem of microstrip line.The above problems greatly affect the precision of temperature compensation attenuator test, and further improvement is needed. UTILITY MODEL CONTENTS

[0003] The utility model aims at overcoming the shortcomings of prior art, and provides a high frequency nondestructive test fixture for temperature compensation attenuator.

[0004] The utility model adopts the following technical scheme:

[0005] A high frequency nondestructive test fixture for temperature compensation attenuator, comprising a test base, a fixed clamp block arranged at one end of the test base, a movable clamp block movable relative to the fixed clamp block, a test block for clamping products and arranged between the fixed clamp block and the movable clamp block, a positioning mechanism arranged on the fixed clamp block and the movable clamp block for positioning the test block, a fixing mechanism arranged on the fixed clamp block and the movable clamp block for fixing the test block, two test probes arranged opposite to each other on the fixed clamp block and the movable clamp block, and a moving mechanism arranged on the test base and connected to drive the movable clamp block to move, wherein the test block is formed with a product groove extending downward from the top surface of the test block for mounting products, and the two test probes are respectively opposite to the two ends of the product groove.

[0006] Further, the positioning mechanism comprises a plurality of first positioning columns arranged on the opposite surface of the fixed clamp block and the movable clamp block and a plurality of second positioning columns arranged on the opposite surface of the movable clamp block and the fixed clamp block, the first positioning columns and the second positioning columns are arranged one by one in opposition, and the test block is provided with a positioning groove extending upward from the bottom surface for embedding the first positioning columns and the second positioning columns.

[0007] Further, the fixing mechanism comprises a plurality of first fixing needles arranged on the opposite surface of the fixed clamp block and the movable clamp block and a plurality of second fixing needles arranged on the opposite surface of the movable clamp block and the fixed clamp block, the first fixing needles and the second fixing needles are arranged one by one in opposition, and the test block is provided with a fixing hole for embedding the first fixing needles and the second fixing needles.

[0008] Further, the fixing hole comprises two fixing segments extending inward from the two side surfaces of the test block and a transition segment connected between the two fixing segments, and the first fixing needle or the second fixing needle can be embedded in the opposite fixing segment.

[0009] Further, the diameter of the fixing segment gradually decreases inward, and the front end of the first fixing needle or the second fixing needle is conically arranged.

[0010] Further, the first fixing needle is located on the upper end of the first fixing column, and the length of the first fixing column is longer than the length of the first fixing needle.

[0011] Further, the moving mechanism comprises a support block arranged on the test base, a moving screw hole arranged in the support block, a moving screw rod arranged in the moving screw hole and connected with the movable clamp block, and an operation knob arranged on the front end of the moving screw rod.

[0012] Further, the test base is formed with a moving cavity for moving the movable clamp block, and the support block and the fixed clamp block are arranged at the two ends of the moving cavity in opposition.

[0013] Further, the side surface of the test base is provided with a plurality of accommodation holes in communication with the moving cavity.

[0014] Further, the fixed clamp block or the movable clamp block is provided with a mounting block for mounting the test probe, and the mounting block is locked on the fixed clamp block or the movable clamp block by a locking bolt.

[0015] From the above description of the utility model, compared with the prior art, the utility model has the beneficial effects that: the utility model limits the structure of the test fixture, places the product on the test block, and then fixes the test block through the moving mechanism and the movable clamp block and the fixed clamp block, so that the test probe is just connected with the lead-out end of the product, the overall operation is simple, the product test installation can be quickly completed, the test process is simple and efficient, during the test, the test probe is overlapped on the lead-out end of the product to test, the test process will not cause destructive damage to the product, and the product can be reused after the test; the overall process is simple, the test can be quickly performed, and is suitable for rapid detection in mass production; compared with the microstrip line test, the test method limited by the utility model has better impedance matching performance, and can realize more accurate test results in the high frequency band. BRIEF DESCRIPTION OF DRAWINGS

[0016] Figure 1 It is a structure diagram of the test fixture Figure One

[0017] Figure 2 It is a structure diagram of the test fixture Figure Two

[0018] Figure 3 It is an enlarged view of part of the structure of the test fixture

[0019] Figure 4 It is a front view of the structure of the test block

[0020] Figure 5 It is a side view of the test block

[0021] Figure 6 It is a top view of the structure of the test block

[0022] In the drawings, 1 is a test base, 2 is a fixed clamp block, 3 is a movable clamp block, 4 is a test block, 5 is a positioning mechanism, 6 is a fixing mechanism, 7 is a test probe, 8 is a moving mechanism, 9 is an installation block, 11 is a moving cavity, 12 is a gap hole, 41 is a product slot, 42 is a positioning slot, 43 is a fixing hole, 44 is a fixed section, 45 is a transition section, 51 is a first positioning column, 52 is a second positioning column, 61 is a first fixing needle, 62 is a second fixing needle, 81 is a support block, 82 is a moving screw hole, 83 is a moving screw rod, 84 is an operation knob, 91 is a radio frequency connector, and 92 is a locking bolt. DETAILED DESCRIPTION

[0023] The utility model will be further described through the specific implementation.

[0024] REFERENCE Figures 1 to 6 ​​As shown, a high-frequency non-destructive test fixture for temperature compensation attenuator, comprising a test base 1, a fixed clamp block 2 arranged at one end of the test base 1, a movable clamp block 3 movable relative to the fixed clamp block 2, a test block 4 arranged between the fixed clamp block 2 and the movable clamp block 3 for clamping the product, a positioning mechanism 5 arranged on the fixed clamp block 2 and the movable clamp block 3 for positioning the test block 4, a fixing mechanism 6 arranged on the fixed clamp block 2 and the movable clamp block 3 for fixing the test block 4, two test probes 7 arranged opposite to each other on the fixed clamp block 2 and the movable clamp block 3, and a moving mechanism 8 arranged on the test base 1 and connected to drive the movable clamp block 3 to move.

[0025] The test base 1 comprises a moving cavity 11 formed in the inside thereof for the movable clamp block 3 to move, and a plurality of accommodation holes 12 arranged on the side surface thereof and communicated with the moving cavity 11, wherein the fixed clamp block 2 is arranged at one end of the moving cavity 11, and the accommodation holes 12 are arranged in strip shape on the side surface of the test base 1.

[0026] The test block 4 is formed with a product slot 41 extending downward from the top surface thereof for mounting the product, wherein the two test probes 7 are respectively opposite to the two ends of the product slot 41 and can be accurately butted with the lead-out end of the product after the test block 4 is fixed in place; specifically, the product slot 41 can be specially customized according to the size of the product to be tested, and during testing, only different test blocks 4 need to be replaced according to the size of the test product, without replacing the entire test fixture.

[0027] The positioning mechanism 5 comprises a plurality of first positioning columns 51 arranged on the opposite surfaces of the fixed clamp block 2 and the movable clamp block 3, and a plurality of second positioning columns 52 arranged on the opposite surfaces of the movable clamp block 3 and the fixed clamp block 2, wherein the test block 4 is provided with a positioning slot 42 extending upward from the bottom surface thereof for embedding the first positioning column 51 and the second positioning column 52, and when the test block 4 is fixed, the first positioning column 51 and the second positioning column 52 are first matched with the opposite positioning slot 42 to preliminarily position the test block 4, which is beneficial to the subsequent fixation of the fixing mechanism 6.

[0028] The fixing mechanism 6 is arranged above the positioning mechanism 5 and comprises a plurality of first fixing needles 61 arranged on the opposite surface of the fixed clamp block 2 and the moving clamp block 3 and a plurality of second fixing needles 62 arranged on the opposite surface of the moving clamp block 3 and the fixed clamp block 2, the first fixing needles 61 and the second fixing needles 62 are arranged opposite to each other in one-to-one correspondence, wherein the test block 4 is provided with fixing holes 43 for embedding the first fixing needles 61 and the second fixing needles 62; specifically, the fixing holes 43 comprise two fixing segments 44 extending inward from the two side surfaces of the test block 4 and a transition segment 45 connected between the two fixing segments 44, the first fixing needles 61 or the second fixing needles 62 can be embedded in the opposite fixing segments 44; further, the diameter of the fixing segment 44 gradually decreases inward, and the front end of the first fixing needle 61 or the second fixing needle 62 is conically arranged; further, the first fixing needle 61 is located on the upper end of the first fixing column 51, and the length of the first fixing column 51 is longer than the length of the first fixing needle 61.

[0029] The test probe 7 is protected by an insulating circular sleeve at the outer end, wherein the fixed clamp block 2 or the moving clamp block 3 is provided with a mounting block 9 for mounting the test probe, and the mounting block 9 is provided with a radio frequency connector 91 for fixing the test probe 7, so that the test probe 7 has a detachable function to facilitate disassembly and maintenance; specifically, the mounting block 9 is locked on the fixed clamp block 2 or the moving clamp block 3 by a locking bolt 92; further, the length of the test probe 7 exposed from the mounting block is controlled within 0.5mm±0.1mm, which can ensure good impedance matching, thereby reducing the standing wave ratio of the test and achieving high-quality test results.

[0030] The moving mechanism 8 comprises a support block 81 arranged on the test base 1, a moving screw hole 82 arranged in the support block 81, a moving screw rod 83 connected with the moving clamp block 3 arranged in the moving screw hole 82, and an operation knob 84 arranged at the front end of the moving screw rod 83, wherein the support block 81 is arranged opposite to the fixed clamp block 2 at both ends of the moving cavity 11.

[0031] The test process is as follows:

[0032] Step one, select the appropriate test block 4 according to the size of the product to be tested, install the product to be tested in the product groove 41, then arrange a plurality of positioning grooves 42 opposite to a plurality of first positioning columns 51 up and down, and move the test block 4 downward to make a plurality of first positioning columns 51 respectively embedded in the opposite positioning grooves 42, at this time, the first fixing needles 61 are not embedded in the opposite fixing holes 43;

[0033] Step two, drive the moving screw 83 to rotate by operating the knob 84, drive the moving clamp block 3 to move close to the fixed clamp block 2, so that the second fixed column 52 is embedded in the opposite positioning groove 42, and continue to move to the second fixed needle 62 inserted into the fixed hole 43, and continue to move to drive the test block 4 to move close to the fixed clamp block 2, so that the first fixed needle 61 is inserted into the fixed hole 43, and the test block 4 is fixed between the fixed clamp block 2 and the moving clamp block 3, at this time, the two test probes 7 are just connected to the lead-out end of the product to be tested;

[0034] Step three, connect the test probe 7 with the vector network analyzer, and test the product.

[0035] The application defines the structure of the test fixture, places the product on the test block 4, and then fixes the test block 4 through the moving mechanism 8 cooperating with the moving clamp block 3 and the fixed clamp block 2, so that the test probe 7 is just connected to the lead-out end of the product. The whole operation is simple, the test installation of the product can be quickly completed, the test process is simple and efficient, and the test probe can be overlapped on the lead-out end of the product for testing during the test, so that the test process will not cause destructive damage to the product, and the product can be reused after the test. The whole process is simple, the test can be quickly carried out, and is suitable for rapid detection in mass production. Compared with the microstrip line test, the test method defined by the application has better impedance matching performance, and can realize more accurate test results in the high frequency band.

[0036] The above is only a preferred embodiment of the application, and therefore cannot limit the scope of the application, that is, equivalent changes and modifications made according to the application range and content of the specification should still be within the scope of the application.

Claims

1. A high-frequency non-destructive testing fixture for temperature-compensated attenuators, characterized in that: The device includes a test base, a fixed clamping block disposed at one end of the test base, a movable clamping block movable relative to the fixed clamping block, a test block fixed between the fixed clamping block and the movable clamping block for clamping a product, a positioning mechanism disposed on the fixed clamping block and the movable clamping block for positioning the test block, a fixing mechanism disposed on the fixed clamping block and the movable clamping block for fixing the test block, two test probes disposed opposite to each other on the fixed clamping block and the movable clamping block, and a movable mechanism disposed on the test base and connected to and driving the movable clamping block to move. The test block has a product groove extending downward from its top surface for mounting the product, and the two test probes are respectively opposite to the two ends of the product groove.

2. The high-frequency non-destructive testing fixture for a temperature-compensated attenuator according to claim 1, characterized in that: The positioning mechanism includes a plurality of first positioning posts disposed on the opposite surfaces of the fixed clamping block and the movable clamping block, and a plurality of second positioning posts disposed on the opposite surfaces of the movable clamping block and the fixed clamping block. The plurality of first positioning posts and the plurality of second positioning posts are disposed one-to-one with each other. The test block is provided with positioning grooves extending upward from its bottom surface for embedding relative to the first positioning posts and the second positioning posts.

3. A high-frequency non-destructive testing fixture for a temperature-compensated attenuator according to claim 2, characterized in that: The fixing mechanism includes a plurality of first fixing pins disposed on the opposite surfaces of the fixed clamping block and the movable clamping block, and a plurality of second fixing pins disposed on the opposite surfaces of the movable clamping block and the fixed clamping block. The plurality of first fixing pins and the plurality of second fixing pins are disposed one-to-one with each other. The test block is provided with fixing holes into which the relative first fixing pins and second fixing pins can be inserted.

4. A high-frequency non-destructive testing fixture for a temperature-compensated attenuator according to claim 3, characterized in that: The fixing hole includes two fixing sections extending inward from both sides of the test block and a transition section connecting the two fixing sections. The first fixing pin or the second fixing pin can be embedded in the opposite fixing section.

5. A high-frequency non-destructive testing fixture for a temperature-compensated attenuator according to claim 4, characterized in that: The diameter of the fixing section gradually decreases inward, and the front end of the first fixing pin or the second fixing pin is tapered.

6. A high-frequency non-destructive testing fixture for a temperature-compensated attenuator according to claim 3, characterized in that: The first fixing pin is located at the upper end of the first positioning post, and the length of the first positioning post is longer than the length of the first fixing pin.

7. A high-frequency non-destructive testing fixture for a temperature-compensated attenuator according to claim 1, characterized in that: The moving mechanism includes a support block mounted on the test base, a moving screw hole in the support block, a moving screw rod connected to the moving clamp block in the moving screw hole, and an operating knob at the front end of the moving screw rod.

8. A high-frequency non-destructive testing fixture for a temperature-compensated attenuator according to claim 7, characterized in that: The test base has a movable cavity for the movable clamping block to move, and the support block and the fixed clamping block are disposed opposite each other at both ends of the movable cavity.

9. A high-frequency non-destructive testing fixture for a temperature-compensated attenuator according to claim 8, characterized in that: The test base has multiple clearance holes on its side that communicate with the moving cavity.

10. A high-frequency non-destructive testing fixture for a temperature-compensated attenuator according to claim 1, characterized in that: The fixed clamp or the movable clamp is provided with a mounting block for mounting the test probe, and the mounting block is locked to the fixed clamp or the movable clamp by a locking bolt.

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