Adapter and three-dimensional scanning system
By designing an adapter to combine with a 3D scanning system, the problems of low efficiency and insufficient accuracy of 3D scanning equipment when measuring workpieces are solved, realizing efficient and accurate geometric tolerance measurement, which is suitable for complex environments.
Patent Information
- Application Number
- CN202423321919.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-31
- Publication Date
- 2025-12-16
- Estimated Expiration
- 2034-12-31
AI Technical Summary
In existing technologies, 3D scanning equipment is inefficient and lacks accuracy when measuring the geometric tolerances of workpieces, especially in complex environments where it is difficult to meet accuracy requirements.
An adapter was designed, which includes an adapter body and a fixing component. The fixing component forms a preset angle with the contact surface of the object to be measured. The object to be measured is fixed by threaded connection and elastic component. The adapter simplifies the scanning steps and data processing when used with a 3D scanning system.
It improves the accuracy and efficiency of 3D scanning to acquire the features of the object under test, reduces dependence on the environment, and is suitable for efficient measurement in complex environments.
Smart Images
Figure CN223678454U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The present application relates to the technical field of three-dimensional scanning devices, in particular to an adapter and a three-dimensional scanning system. BACKGROUND
[0002] In the current technology, the thickness, flatness, cylindricity and other geometric tolerances of a workpiece need to be measured to check whether the workpiece is qualified. Before measurement, the geometric features of the workpiece need to be reconstructed. The current reconstruction methods include the following: scanning the point cloud data of the workpiece by a three-dimensional scanning device, and fitting through the point cloud data to output the required features; using a tracking type measurement light pen to detect a plurality of feature points on the surface of the workpiece, and fitting the features of the workpiece through the above feature points; using a contact type three-coordinate measuring instrument, contacting the measuring probe with the workpiece, and acquiring the feature points on the surface of the workpiece to fit the required features. However, the above reconstruction methods require specific measurement devices, and the operation of the above measurement devices is relatively complex, thus resulting in low efficiency of the above reconstruction methods. In addition, the above measurement devices have high requirements on the environment, and the environment has a great influence on the measurement accuracy of the measurement devices, thus if the environmental requirements cannot be met, the accuracy of the above reconstruction methods will be insufficient.
[0003] Therefore, how to improve the accuracy and efficiency of acquiring the features of the workpiece is a technical problem urgently to be solved in the field. CONTENT OF THE INVENTION
[0004] In order to solve the problems in the prior art, the purpose of the present application is to provide an adapter and a three-dimensional scanning system, which can improve the accuracy and efficiency of acquiring the first features of the object to be measured.
[0005] To achieve the above purpose, the technical solution adopted by the present application is as follows:
[0006] An adapter for measuring the parameters of a cylindrical object to be measured in three-dimensional scanning. The adapter comprises an adapter main body and a fixing member, the adapter main body comprises a first contact surface and a second contact surface both in contact with the object to be measured, and the included angle between the first contact surface and the second contact surface is a preset angle; the fixing member is movably connected with the adapter main body, the fixing member comprises a fixed position and a separation position separated from the object to be measured, and when the fixing member is in the fixed position, the fixing member, the first contact surface and the second contact surface cooperate to fix the object to be measured.
[0007] Further, an external thread is formed on the fixing member, and a threaded hole is formed on the adapter main body, and the fixing member is movably connected with the threaded hole through the external thread.
[0008] Further, the adapter body comprises a first body, a second body and a third body, the first contact surface is located on the first body, the second contact surface is located on the second body, and the fixing member is movably connected with the third body, and the first body, the second body and the third body surround a containing space for containing at least part of the object to be measured.
[0009] Further, the first body and the second body are fixedly connected or integrally formed, and the third body is fixedly connected with the first body or integrally formed.
[0010] Further, the second body and the third body form a gap therebetween for the object to be measured to pass through.
[0011] Further, the first body and the second body are fixedly connected or integrally formed, and the third body is fixedly connected with the first body or integrally formed, and the third body is fixedly connected with the second body or integrally formed.
[0012] Further, the fixing member comprises a fixing body movably connected with the adapter body, a fixing head located at least partially in the fixing body, and an elastic member located in the fixing body, the fixing head is movably connected with the fixing body, the two ends of the elastic member abut against the fixing body and the fixing head respectively, the elastic member has a pre-tightening force acting on the fixing head, and when the fixing member is in the fixed position, the pre-tightening force causes the fixing head to maintain the abutting position abutting against the object to be measured.
[0013] Further, the fixing member moves relative to the adapter body along a preset straight line direction, a preset plane perpendicular to the preset straight line is defined, and the preset plane, the first contact surface and the second contact surface are not parallel to each other.
[0014] Further, the adapter further comprises a mark point in the preset position relative to the adapter body, and the mark point is located on the adapter body or detachably connected with the adapter body.
[0015] To achieve the above object, the following technical solutions are adopted in the present application:
[0016] A three-dimensional scanning system comprises the above-mentioned adapter.
[0017] The above-mentioned adapter and three-dimensional scanning system can movably connect the fixing member with the adapter body, so that when the fixing member is in the fixed position, the fixing member, the first contact surface and the second contact surface cooperate to fix the object to be measured, thereby avoiding the object to be measured from deviating during the measurement process, and further improving the accuracy of obtaining the first feature of the object to be measured. In addition, the three-dimensional scanning system can simplify the scanning steps and scanning data through the adapter, thereby improving the efficiency of obtaining the first feature of the object to be measured. BRIEF DESCRIPTION OF DRAWINGS
[0018] Figure 1The hardware structure block diagram of the terminal of the three-dimensional scanning method provided by the embodiment of the present application.
[0019] Figure 2 The flow chart of the three-dimensional scanning method provided by the embodiment of the present application.
[0020] Figure 3 The specific flow chart of step S1 in the three-dimensional scanning method provided by the embodiment of the present application.
[0021] Figure 4 The first specific flow chart of the three-dimensional scanning method provided by the embodiment of the present application.
[0022] Figure 5 The second specific flow chart of the three-dimensional scanning method provided by the embodiment of the present application.
[0023] Figure 6 The specific flow chart of step S2 in the three-dimensional scanning method provided by the embodiment of the present application.
[0024] Figure 7 The specific flow chart of step S3 in the three-dimensional scanning method provided by the embodiment of the present application.
[0025] Figure 8 The first specific flow chart of step S33 in the three-dimensional scanning method provided by the embodiment of the present application.
[0026] Figure 9 The second specific flow chart of step S33 in the three-dimensional scanning method provided by the embodiment of the present application.
[0027] Figure 10 The structure schematic diagram of the adapter provided by the embodiment of the present application.
[0028] Figure 11 The sectional view of the adapter provided by the embodiment of the present application.
[0029] Figure 12 Another structure schematic diagram of the adapter provided by the embodiment of the present application.
[0030] Figure 13 The structure sectional view of the fixing member of the adapter provided by the embodiment of the present application.
[0031] Figure 14 The structure block diagram of the three-dimensional scanning device of the embodiment of the present application. DETAILED DESCRIPTION
[0032] In order to make the people in the art better understand the scheme of the present application, the technical scheme in the specific embodiment of the present application will be described clearly and completely by combining the drawings in the embodiment of the present application.
[0033] It should be noted that the terms "first", "second" and similar terms used in the specification and claims of the application do not denote any order, quantity or importance, but are used to distinguish different components. Similarly, the terms "one" or "a" or similar terms do not denote a quantity limitation, but mean that at least one exists. "Multiple" or "several" means at least two. Unless otherwise indicated, the terms "front", "back", "left", "right", "lower" and / or "upper" and similar terms are used for convenience and are not intended to be limiting as to a particular position or spatial orientation. The terms "comprise", "comprising", "include", "including" and / or "contain", "containing" and similar terms are intended to be open-ended and to mean that the elements listed thereafter are not exclusive, but are in addition to other elements that can be present.
[0034] The singular forms "a", "said", and "the" used in the specification and the appended claims are intended to encompass the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms "and / or", as used herein, refer to and encompass any or all possible combinations of one or more of the associated listed items.
[0035] The method embodiments provided in the present embodiment can be executed in a terminal 100, a computer or similar computing device. For example, the method embodiments are executed on the terminal 100, Figure 1 is a hardware structure block diagram of a terminal 100 for executing a three-dimensional scanning based measurement method according to the present embodiment. As shown in Figure 1 The terminal 100 can include one or more (only one is shown in Figure 1 The processor 11 can include, but is not limited to, a microcontroller unit (MCU) or a field programmable gate array (FPGA) and the like. The terminal 100 can further include a transmission device 13 for communication function and an input / output device 14. Those skilled in the art can understand that the structure shown is only schematic, and does not limit the structure of the terminal 100. For example, the terminal 100 can include more or less components than those shown in Figure 1 For example, the terminal 100 can include more or less components than those shown in Figure 1 or have a different configuration from that shown in Figure 1 .
[0036] The memory 12 can be used to store computer programs, such as software programs of application software and modules, for example, a computer program of a three-dimensional scanning based measurement method in the embodiment. The processor 11 performs various functional applications and data processing, i.e., implements the method described above, by running the computer program stored in the memory 12. The memory 12 can include a high-speed random access memory, and can further include a non-volatile memory, such as one or more magnetic storage devices, flash memories, or other non-volatile solid-state memories. In some examples, the memory 12 can further include memories 12 remotely arranged with respect to the processor 11, which can be connected to the terminal 100 through a network. Examples of the network include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network, and a combination thereof.
[0037] The transmission device 13 is used to receive or send data via a network. The network includes a wireless network provided by a communication provider of the terminal 100. In an example, the transmission device 13 includes a network interface controller (NIC) which can be connected to other network devices through a base station so as to communicate with the Internet. In an example, the transmission device 13 can be a radio frequency (RF) module which is used to communicate with the Internet in a wireless manner.
[0038] The embodiment provides a three-dimensional scanning based measurement method, Figure 2 is a flowchart of a three-dimensional scanning based measurement method of the embodiment, which is suitable for a three-dimensional scanning system and is used for scanning a to-be-measured feature which cannot be directly contacted, i.e., the three-dimensional scanning based measurement method is used for scanning a to-be-measured feature which can be indirectly contacted.
[0039] It should be noted that the three-dimensional scanning based measurement method of the embodiment can also be suitable for a to-be-measured feature which can be directly contacted.
[0040] It should be noted that the three-dimensional scanning based measurement method of the embodiment is described by taking a to-be-measured feature which can be indirectly contacted as an example.
[0041] As shown in Figure 2 the three-dimensional scanning based measurement method includes the following steps:
[0042] S1: Adapter making, which is used for binding marker point data of a plurality of marker points and a type of an adapter.
[0043] S2: Adapter defining, which is used for determining a feature type of a to-be-measured feature, and obtaining a first mapping relationship between a working surface of an adapter and a marker point.
[0044] Exemplarily, in step S1, the number of the marker points can be one, and the marker point is an encoding marker point. Alternatively, the number of the marker points is at least four, and the marker points are common circular marker points.
[0045] Exemplarily, the marker points can be reflective marker points, or the marker points can be self-luminous marker points. That is, the number and type of the marker points are not limited in the present application.
[0046] Exemplarily, in step S1, the marker point data of the marker points include but are not limited to the number of the marker points, the relative positions between the marker points, the sizes of the marker points, the shapes of the marker points, etc.
[0047] Exemplarily, in step S1, after the marker point data of the marker points are bound to the type of the adapter, the type of the adapter corresponding to the marker point data can be determined, so that the efficiency of identifying the type of the adapter can be improved by the marker point data. Specifically, after the marker point data are bound to the type of the adapter, the binding relationship between the marker point data and the type of the adapter can be stored in the storage 12, so as to facilitate the subsequent processor 11 to call or identify the binding relationship, etc.
[0048] Exemplarily, in step S2, the marker point data can be acquired by the input and output device 14, and the marker point data can be transmitted to the storage 12 by the transmission device 13, so that the processor 11 can call the data acquired by the input and output device 14. The transmission device 13 and the input and output device 14 can be components of the three-dimensional scanning system. Alternatively, the input and output device 14 can be the three-dimensional scanning system, and the transmission device 13 can be other wireless transmission device.
[0049] Exemplarily, in step S2, the adapter includes at least one working surface, and the working surface is used to contact the feature to be measured to form a contact position. In the present application, the first mapping relationship between the working surface of the adapter and the marker points can be acquired by the input and output device 14. Specifically, the first mapping relationship between the working surface of the adapter and the marker points can be acquired by the three-dimensional scanning system. Through the above setting, the relative relationship between the working surface of the adapter and the marker points can be converted by the first mapping relationship.
[0050] As an implementation manner, the three-dimensional scanning system includes a monocular camera or a multi-view camera, and the monocular camera or the multi-view camera is used to perform spatial three-dimensional reconstruction on the adapter to obtain the marker point data such as the marker point coordinates and the number of the marker points on the adapter.
[0051] Similarly, the monocular camera or the multi-view camera can also be used to acquire the first mapping relationship between the working surface of the adapter and the marker points.
[0052] In step S2, the feature type of the feature to be measured is input into the memory 12, so that the processor 11 can obtain the feature to be measured as a point, a line, a surface, a circle, a cylinder, a cone, a sphere, a threaded hole, a stud, etc. by the three-dimensional scanning based measurement method of the present application, to facilitate the subsequent feature acquisition of the feature to be measured. Specifically, after the processor 11 obtains the feature type of the feature to be measured and the adapter type in the memory 12, the processor 11 can obtain the feature type of the specific feature to be measured by the three-dimensional scanning based measurement method of the present application.
[0053] S3: Adapter measurement, placing the adapter on the carrier of the feature to be measured, determining the first feature of the feature to be measured according to the mark point data, the first mapping relationship and the feature type of the feature to be measured.
[0054] In step S3, since the feature to be measured can be a virtual body, such as a threaded hole, etc., the adapter needs to be placed on the carrier of the feature to be measured, so that the carrier can support the adapter, thereby facilitating the measurement of the feature to be measured.
[0055] It can be understood that when the feature to be measured is a real body, such as a cylinder, a cone, etc., the carrier of the feature to be measured is itself.
[0056] For example, since the memory 12 can record the mark point data, in step S3, the three-dimensional scanning system first identifies the mark point, and then registers the identified mark point data with the mark point data recorded in the memory 12 in step S1, so as to obtain a coordinate conversion matrix according to the mark point data and the first mapping relationship, to determine the mapping relationship between the working surface of the adapter and the mark point in the measurement process according to the coordinate conversion matrix, and to further determine the first feature of the feature to be measured according to the feature type of the feature to be measured. The coordinate conversion matrix includes a translation matrix and a rotation matrix.
[0057] Through the above arrangement, the three-dimensional scanning based measurement method of the present application can scan the feature to be measured which cannot be directly contacted, i.e. the three-dimensional scanning based measurement method of the present application can scan the feature to be measured which can only be indirectly contacted. Secondly, the three-dimensional scanning based measurement method of the present application has lower requirements for the environment, i.e. the three-dimensional scanning based measurement method of the present application can be applied to field measurement, so that the environment has lower influence on the three-dimensional scanning based measurement method of the present application, thereby making the three-dimensional scanning based measurement method of the present application have higher accuracy in obtaining the first feature of the feature to be measured. Finally, for the three-dimensional point cloud measurement system, the three-dimensional scanning based measurement method of the present application does not need to fit the point cloud into a feature and then measure the feature, especially for large features to be measured, the efficiency of obtaining the feature of the feature to be measured is higher, i.e. it is beneficial to improve the efficiency of obtaining the first feature of the feature to be measured.
[0058] As an implementation, the feature to be measured is a threaded hole, and the feature parameter to be measured is the central axis of the threaded hole, i.e., the first feature is the central axis of the threaded hole. At this time, the adapter can be a hemispherical structure, and the marker point is located at the center of the sphere of the adapter. Specifically, the adapter in the form of a hemispherical structure is placed on the carrier where the threaded hole is located, so that the spherical surface of the hemispherical structure is in contact with the threaded hole, where the spherical surface of the hemispherical structure is the working surface of the adapter. At this time, the center of the sphere of the hemispherical structure is always located on the central axis of the threaded hole regardless of the position of the hemispherical structure, and at this time, the first mapping relationship between the working surface of the adapter and the marker point, the feature type of the feature to be measured, and the marker point data are known, so that the position of the central axis of the threaded hole, i.e., the first feature, can be obtained by obtaining the position of the marker point.
[0059] As shown in Figure 3 , Figure 4 and Figure 5 , as an implementation, step S1 includes the following steps:
[0060] S11: Obtain the type of the adapter.
[0061] Wherein, the type of the adapter is not unique. For example, as shown in Figure 4 , step S11 includes:
[0062] S111: Scan the adapter to obtain the type of the adapter.
[0063] In step S111, the adapter can be spatially three-dimensionally reconstructed by using a monocular vision camera or a multi-view vision camera to obtain the type of the adapter.
[0064] Alternatively, as shown in Figure 5 , step S11 includes:
[0065] S112: Configure the adapter as a preset model with a known type to obtain the type of the adapter.
[0066] Wherein, the type of the adapter can be first stored in the memory 12, so that the processor 11 can obtain the type of the adapter through the preset model of the adapter in the memory 12.
[0067] It should be noted that the manner of obtaining the type of the adapter is not limited to the above-mentioned manner.
[0068] S12: Place a plurality of marker points on the adapter, and bind the marker point data of the plurality of marker points and the type of the adapter, wherein the marker point data includes positioning data and identification data bound with the type of the adapter.
[0069] In step S12, taking a common circular marker point as an example for illustration. At least four marker points are placed on the adapter, so that the three-dimensional scanning system can obtain marker point data of the marker points. In combination with the type of the adapter obtained in step S11, the identification data of the marker points and the type of the adapter can be bound, that is, the type of the adapter can be obtained through the identification data of the marker points.
[0070] More specifically, step S12 includes the following steps:
[0071] S121: scanning and obtaining identification data of the marker points;
[0072] S122: matching the obtained type of the adapter with the identification data of the marker points to bind the identification data of the marker points and the type of the adapter.
[0073] In step S121, the three-dimensional scanning system is used to scan and obtain the identification data of the marker points, wherein the identification data includes but is not limited to the distribution, shape, size, etc. of the marker points. Specifically, the monocular camera or the multi-view camera is used to obtain the identification data of the marker points.
[0074] In step S122, the identification data of the marker points and the type of the adapter can be stored in the memory 12 in one-to-one correspondence, so that the type of the adapter can be obtained through the identification data.
[0075] As shown in FIG. 2, as an implementation manner, step S2 includes the following steps: Figure 6
[0076] S21: determining the feature type of the feature to be measured. For step S21, it is basically the same as step S2, which will not be described here.
[0077] S22: selecting at least one working surface on the adapter to obtain a first mapping relationship between the working surface and the positioning data of the marker points.
[0078] In step S22, due to the different types of the feature to be measured, the number of working surfaces on the adapter in contact with the feature to be measured is different. For example, when the feature to be measured is a point, a line, an edge, etc., the feature to be measured is only in contact with one working surface. When the feature to be measured is a cylinder, etc., the feature to be measured is in contact with at least two working surfaces.
[0079] For example, in step S22, the three-dimensional scanning system can be used to obtain the first mapping relationship between the working surface and the positioning data of the marker points. Specifically, the monocular camera or the multi-view camera can be used to perform spatial three-dimensional reconstruction on the adapter to obtain marker point data such as marker point coordinates on the adapter.
[0080] As shown in FIG. 2, as an implementation manner, step S2 includes the following steps: Figure 7 As shown, as an implementation, step S3 includes the following steps:
[0081] S31: placing the adapter on the carrier of the feature to be measured, and acquiring the marker point data on the adapter;
[0082] S32: determining the position of the working surface in the three-dimensional scanning according to the marker point data and the first mapping relationship;
[0083] S33: determining the first feature of the feature to be measured based on the position of the working surface and the feature type of the feature to be measured.
[0084] In step S32, the position of the working surface in the three-dimensional scanning can be determined by the marker point data acquired by the three-dimensional scanning system in step S31 and the first mapping relationship acquired in step S1.
[0085] In step S33, since the position of the working surface has been acquired in step S32 and the feature type of the feature to be measured has been determined in step S2, the first feature of the feature to be measured can be determined according to the above data.
[0086] For example, the feature to be measured is a circle, the two working surfaces of the adapter in contact with the circle are perpendicular to each other, and the first feature is the center of the circle. First, the three-dimensional scanning system can recognize the marker point to acquire the recognition data and the positioning data of the marker point. Second, the type of the adapter can be confirmed by the recognition data of the marker point. Then, the adapter is placed on the feature to be measured, at this time, the feature to be measured is in contact with the two working surfaces of the adapter, thereby forming two contact positions. Since the two working surfaces are perpendicular to each other and the feature to be measured is a circle, the position of the center of the circle can be determined. Specifically, since the positioning data of the marker point is known, the positions of the two working surfaces can be obtained by the marker point data and the first mapping relationship, and the positions of the two contact positions of the circle can be obtained by the coordinate conversion matrix, and then the position of the center of the circle can be obtained.
[0087] It should be noted that since the two working surfaces in the above embodiment can not be perpendicular to each other, at this time, only the type of the feature to be measured is known, i.e., the type of the feature to be measured is a circle, the position of the center of the circle cannot be determined. Therefore, in order to obtain the position of the center of the circle in the above case, as shown in the following steps S2 and S3: Figure 6
[0088] S23: determining the second feature of the feature to be measured, the second feature being different from the first feature;
[0089] Exemplarily, the to-be-measured feature is a circle, and the first feature is the center of the circle. The second feature can be the diameter of the circle, and thus the first feature of the to-be-measured feature, i.e., the position of the center of the circle, can be determined based on the second feature (the diameter of the circle), the position of the working surface, and the feature type of the to-be-measured feature.
[0090] At this time, step S33 can be the following steps:
[0091] determining the first feature of the to-be-measured feature based on the position of the working surface, the second feature, and the feature type of the to-be-measured feature.
[0092] As shown in Figure 8 more specifically, step S33 includes the following steps:
[0093] S331: obtaining the contact position of the to-be-measured feature and the working surface;
[0094] S332: determining the second mapping relationship between the contact position and the marker point based on the position of the working surface, the second feature, and the first mapping relationship;
[0095] S333: determining the first feature of the to-be-measured feature based on the second mapping relationship and the feature type of the to-be-measured feature.
[0096] Alternatively, as shown in Figure 9 when step S2 does not include step S22, step S33 can include the following steps:
[0097] S331: obtaining the contact position of the to-be-measured feature and the working surface;
[0098] S332: determining the second mapping relationship between the contact position and the marker point based on the position of the working surface and the first mapping relationship;
[0099] S333: determining the first feature of the to-be-measured feature based on the second mapping relationship and the feature type of the to-be-measured feature.
[0100] That is, the present application does not limit whether the second feature is known or not, but only needs to enable the first feature to be obtained.
[0101] As shown in Figure 10 and Figure 11 as an implementation manner, the present application further provides an adapter 300 for measuring a parameter of a to-be-measured object in a three-dimensional scanning.
[0102] The adapter 300 includes an adapter body 31 and a fixing member 32.
[0103] The adapter 300 comprises a fixing member 32 and an adapting body 31. The adapting body 31 comprises a first contact surface 311 and a second contact surface 312, which are both in contact with the object to be measured. The angle between the first contact surface 311 and the second contact surface 312 is a preset angle, so as to facilitate obtaining the mapping relationship between the first contact surface 311 and the marker point 34 and obtaining the mapping relationship between the second contact surface 312 and the marker point 34 by the above-mentioned three-dimensional scanning measurement method.
[0104] The fixing member 32 is movably connected with the adapting body 31. The fixing member 32 comprises a fixed position and a separated position from the object to be measured. When the fixing member 32 is in the fixed position, the fixing member 32, the first contact surface 311 and the second contact surface 312 cooperate to fix the object to be measured. Through the above-mentioned arrangement, the object to be measured can be fixed, so as to avoid the object to be measured from being deviated in the measurement process, and thus the accuracy of obtaining the first feature of the object to be measured is improved. In addition, the three-dimensional scanning system can simplify the scanning steps and scanning data through the adapter 300, that is, the three-dimensional scanning system can realize the measurement of the first feature of the object to be measured without scanning the complete object to be measured, so as to improve the efficiency of obtaining the first feature of the object to be measured.
[0105] As an implementation manner, an external thread 33 is formed on the fixing member 32, and a threaded hole 313 is formed on the adapting body 31. The fixing member 32 is movably connected with the threaded hole 313 through the external thread 33. Through the above-mentioned arrangement, the adapter 300 can be applicable to objects to be measured with different diameters, so as to improve the versatility of the adapter 300. In addition, the threaded connection can improve the movement accuracy of the fixing member 32, so as to improve the accuracy of obtaining the first feature of the object to be measured.
[0106] It should be noted that the movable connection between the fixing member 32 and the adapting body 31 can also be:
[0107] The adapting body 31 is provided with a pneumatic cylinder, and the movable end of the pneumatic cylinder is fixedly connected with the fixing member 32, so as to realize the movement of the fixing member 32.
[0108] Alternatively, the fixing member 32 is a pin shaft, and a through hole is formed on the adapting body 31. The pin shaft and the through hole are in interference fit, so that the pin shaft can be fixed relative to the adapting body 31. The interference fit can cause the relative movement between the through hole and the pin shaft under the action of force, so as to realize the movement of the pin shaft.
[0109] It should be noted that the movable connection between the fixing member 32 and the adapting body 31 is not limited to the above-mentioned manner, and the present application is not limited thereto.
[0110] For example, Figure 10 and Figure 12As shown, as an implementation manner, the adapter main body 31 comprises a first main body 314, a second main body 315 and a third main body 316, the first contact surface 311 is located on the first main body 314, the second contact surface 312 is located on the second main body 315, the fixing member 32 is movably connected with the third main body 316, and the first main body 314, the second main body 315 and the third main body 316 surround a containing space 301 containing at least part of the object to be measured. Through the above arrangement, the object to be measured can be located in the containing space 301, so as to facilitate the fixing member 32, the first contact surface 311 and the second contact surface 312 to cooperate to fix the object to be measured.
[0111] As shown in the drawings, Figure 12 For example, the first main body 314 and the second main body 315 are fixedly connected or integrally formed, the third main body 316 is fixedly connected with the first main body 314 or integrally formed with the first main body 314, so that the third main body 316 can be fixed on the first main body 314, and the fixing member 32 is fixed on the first main body 314 through the third main body 316.
[0112] In this embodiment, since the second main body 315 and the third main body 316 are not connected, a gap 317 for the object to be measured to pass through is formed between the second main body 315 and the third main body 316, so that the object to be measured can enter the containing space 301 through the gap 317. It should be noted that in the case that the object to be measured is relatively long and it is not easy to put the adapter 300 on one end of the object to be measured, the gap 317 can facilitate the fixing between the adapter 300 and the object to be measured.
[0113] As shown in the drawings, Figure 10 For example, the first main body 314 and the second main body 315 are fixedly connected or integrally formed, the third main body 316 is fixedly connected with the first main body 314 or integrally formed with the first main body 314, and the third main body 316 is fixedly connected with the second main body 315 or integrally formed with the second main body 315. At this time, the third main body 316 and the second main body 315 do not have a gap 317. Through the above arrangement, the stability of the third main body 316 can be improved, so that the working stability of the fixing member 32 is higher, and the accuracy of obtaining the first feature of the object to be measured is further improved.
[0114] As shown in the drawings, Figure 13 As an implementation manner, the fixing member 32 comprises a fixing main body 321, a fixing head 322 and an elastic member 323, the fixing main body 321 is movably connected with the adapter main body 31, the fixing head 322 is at least partially located in the fixing main body 321, and the elastic member 323 is located in the fixing main body 321.
[0115] The fixing head 322 is movably connected with the fixing body 321, and the two ends of the elastic member 323 abut against the fixing body 321 and the fixing head 322 respectively. The elastic member 323 has a pre-tightening force acting on the fixing head 322. When the fixing member 32 is in the fixed position, the pre-tightening force causes the fixing head 322 to maintain the abutting position against the object to be measured. Through the above arrangement, the object to be measured can be kept in abutment with the first contact surface 311 and the second contact surface 312, thereby facilitating the improvement of the fixing stability between the object to be measured and the adapter 300, and further improving the working stability of the fixing member 32 to improve the accuracy of obtaining the first feature of the object to be measured.
[0116] As shown in Figure 11 As an alternative implementation, the fixing member 32 moves relative to the adapter body 31 along the preset straight line 303, and a preset plane 302 perpendicular to the preset straight line 303 is defined. The preset plane 302, the first contact surface 311 and the second contact surface 312 are not parallel to each other. Through the above arrangement, the directions of any two forces for fixing the object to be measured will not be parallel, thereby avoiding the movement of the object to be measured under the action of three forces, i.e. three fixing points can be achieved to fix the cylindrical object to be measured.
[0117] As shown in Figure 10 In the present application, the adapter 300 further comprises a marker point 34 in a preset position relative to the adapter body 31. The marker point 34 is located on the adapter body 31 or is detachably connected with the adapter body 31. Specifically, the marker point 34 can be bonded to the adapter body 31, or the marker point 34 can be fixed to the adapter body 31 by insertion or other means. The present application does not limit the manner in which the marker point 34 is fixed to the adapter body 31.
[0118] For example, the feature to be measured is a cylinder, the first contact surface 311 and the second contact surface 312 are perpendicular to each other, and the first feature is the center of the circle.
[0119] Firstly, the three-dimensional scanning system can recognize the marker point 34 on the adapter 300 to obtain recognition data and positioning data of the marker point 34.
[0120] Secondly, the recognition data of the marker point 34 can confirm the type of the adapter 300, i.e. it can be confirmed that the adapter 300 can measure a cylinder. It should be noted that the adapter 300 includes but is not limited to the one capable of measuring a cylinder.
[0121] Then, the adapter 300 is arranged on the cylinder to be measured, at this time, the cylinder is in contact with the first contact surface 311 and the second contact surface 312 respectively, thereby forming two contact positions. Since the first contact surface 311 and the second contact surface 312 are perpendicular to each other, and the feature to be measured is a cylinder, the position of the center of the cylinder can be determined. Specifically, since the positioning data of the marker point 34 is known, the positions of the first contact surface 311 and the second contact surface 312 can be obtained through the marker point data, the first mapping relationship and the coordinate conversion matrix, thereby the position of the contact position of the cylinder and the first contact surface 311 can be obtained, and the position of the contact position of the cylinder and the second contact surface 312 can be obtained, and then the position of the center of the cylinder can be obtained.
[0122] It should be noted that since the first contact surface 311 and the second contact surface 312 in the above embodiment can not be perpendicular to each other, at this time, only the type of the feature to be measured is known, that is, the type of the feature to be measured is a cylinder, the position of the center of the cylinder cannot be determined. Therefore, in order to obtain the position of the center of the cylinder in the above case, a second feature of the cylinder is also needed to be provided, for example, the diameter of the cylinder.
[0123] As an implementation manner, the application further provides a three-dimensional scanning system, which comprises the adapter 300.
[0124] As shown in Figure 14 As an implementation manner, the application further provides a three-dimensional scanning device 200, which is used to implement the above embodiments and preferred embodiments, and has been described above. The terms "module", "unit", "sub-unit" and the like used below can be a combination of software and / or hardware that can implement a predetermined function. Although the device described in the following embodiments is preferably implemented in software, the implementation of hardware, or a combination of software and hardware, is also possible and is conceived.
[0125] As shown in Figure 14 As shown in Figure 14 The three-dimensional scanning device 200 comprises an adapter manufacturing module 21, an adapter defining module 22 and an adapter measuring module 23.
[0126] The adapter manufacturing module 21 is used to bind the marker point data of a plurality of marker points and the type of the adapter. The adapter defining module 22 is used to determine the feature type of the feature to be measured, and obtain the first mapping relationship between the working surface of the adapter and the marker points. When the adapter is arranged on the carrier of the feature to be measured, the adapter measuring module 23 determines the first feature of the feature to be measured according to the marker point data, the first mapping relationship and the feature type of the feature to be measured.
[0127] It should be noted that the above modules can be functional modules or program modules, and can be implemented by software or hardware. For modules implemented by hardware, the above modules can be located in the same processor 11; or the above modules can be located in different processors 11 in any combination.
[0128] More specifically, the adapter creation module 21 can obtain the type of the adapter.
[0129] And / or, the adapter creation module 21 can bind the marker data of several marker points to the type of the adapter, wherein the marker data includes positioning data and identification data bound to the type of the adapter.
[0130] And / or, the adapter definition module 22 can select at least one working surface on the adapter and obtain a first mapping relationship between the working surface and the positioning data of the marker point.
[0131] And / or, the adapter definition module 22 can determine the feature type of the feature to be measured.
[0132] And / or, the adapter definition module 22 is able to determine a second feature of the feature to be tested, which is different from the first feature.
[0133] And / or, the adapter measurement module 23 is able to acquire marker point data on the adapter when the adapter is placed on the carrier of the feature to be measured.
[0134] And / or, the adapter measurement module 23 can determine the position of the working surface in the 3D scan based on the marker point data and the first mapping relationship.
[0135] And / or, the adapter measurement module 23 can determine the first feature of the feature to be measured based on the position of the working surface and the feature type of the feature to be measured.
[0136] And / or, the adapter measurement module 23 can determine the first feature of the feature to be measured based on the position of the working surface, the second feature, and the feature type of the feature to be measured.
[0137] like Figure 1 As shown, this embodiment also provides an electronic device, including a memory 12 and a processor 11. The memory 12 stores a computer program, and the processor 11 is configured to run the computer program to perform the steps in any of the above method embodiments.
[0138] Optionally, the electronic device may further include a transmission device 13 and an input / output device 14, wherein the transmission device 13 is connected to the processor 11 and the input / output device 14 is connected to the processor 11.
[0139] Optionally, in the embodiment, the processor 11 can be configured to execute the following steps by computer program:
[0140] S1: adapter making, for binding the mark point data of a plurality of mark points and the type of the adapter;
[0141] S2: adapter definition, for determining the feature type of the feature to be measured and obtaining the first mapping relationship between the working surface of the adapter and the mark points;
[0142] S3: adapter measurement, arranging the adapter on the carrier of the feature to be measured, and determining the first feature of the feature to be measured according to the mark point data, the first mapping relationship and the feature type of the feature to be measured.
[0143] Alternatively, in the embodiment, the processor 11 can be configured to execute the following steps by computer program:
[0144] S11: obtaining the type of the adapter;
[0145] S12: placing a plurality of mark points on the adapter, and binding the mark point data of the plurality of mark points and the type of the adapter, wherein the mark point data includes positioning data and identification data bound with the type of the adapter;
[0146] S21: determining the feature type of the feature to be measured;
[0147] S22: selecting at least one working surface on the adapter, and obtaining the first mapping relationship between the working surface and the positioning data of the mark points;
[0148] S31: arranging the adapter on the carrier of the feature to be measured, and obtaining the mark point data on the adapter;
[0149] S32: determining the position of the working surface in the three-dimensional scanning according to the mark point data and the first mapping relationship;
[0150] S33: determining the first feature of the feature to be measured based on the position of the working surface and the feature type of the feature to be measured.
[0151] Alternatively, in the embodiment, the processor 11 can be configured to execute the following steps by computer program:
[0152] S11: obtaining the type of the adapter;
[0153] S12: placing a plurality of mark points on the adapter, and binding the mark point data of the plurality of mark points and the type of the adapter, wherein the mark point data includes positioning data and identification data bound with the type of the adapter;
[0154] S21: determining the feature type of the feature to be measured;
[0155] S22: select at least one working surface on the adapter, and obtain a first mapping relationship between the working surface and the positioning data of the mark point;
[0156] S23: determine a second feature of the to-be-measured feature, the second feature being different from the first feature;
[0157] S31: arrange the adapter on a carrier of the to-be-measured feature, and obtain mark point data on the adapter;
[0158] S32: determine the position of the working surface in the three-dimensional scanning according to the mark point data and the first mapping relationship;
[0159] S33: determine the first feature of the to-be-measured feature based on the position of the working surface, the second feature, and the feature type of the to-be-measured feature.
[0160] It should be noted that the specific examples in this embodiment can refer to the examples described in the above embodiments and optional implementation manners, and will not be described herein again.
[0161] In addition, in combination with the measurement method based on three-dimensional scanning provided in the above embodiments, a storage medium can also be provided to implement the measurement method based on three-dimensional scanning in this embodiment. The storage medium has a computer program stored thereon; the computer program is executed by the processor 11 to implement any one of the measurement methods based on three-dimensional scanning in the above embodiments.
[0162] As an implementation manner, the present application further provides a three-dimensional scanning system, which comprises the three-dimensional scanning device 200 described above.
[0163] It should be understood that, for those skilled in the art, improvements or changes can be made according to the above description, and all these improvements and changes shall fall within the protection scope of the claims appended to the present application.
Claims
1. An adapter for measuring a parameter of a cylindrical object to be measured in a three-dimensional scanning system, the adapter comprising: an adapter body having a first contact surface and a second contact surface, both of which are in contact with the object to be measured, and an included angle between the first contact surface and the second contact surface being a preset angle; and a fixing member movably connected to the adapter body, the fixing member having a fixed position and a separated position from the object to be measured, and the fixing member, the first contact surface and the second contact surface cooperating to fix the object to be measured when the fixing member is in the fixed position.
2. The adapter according to claim 1, wherein: the fixing member is provided with an external thread, and the adapter body is provided with a threaded hole, and the fixing member is movably connected to the threaded hole through the external thread.
3. The adapter according to claim 1, wherein: the adapter body comprises a first body, a second body and a third body, the first contact surface is located on the first body, the second contact surface is located on the second body, and the fixing member is movably connected to the third body, and the first body, the second body and the third body surround a receiving space for receiving at least part of the object to be measured.
4. The adapter according to claim 3, wherein: the first body and the second body are fixedly connected or integrally formed, and the third body is fixedly connected or integrally formed with the first body.
5. The adapter according to claim 4, wherein: a gap is formed between the second body and the third body for the object to be measured to pass through.
6. The adapter according to claim 3, wherein: the first body and the second body are fixedly connected or integrally formed, the third body is fixedly connected or integrally formed with the first body, and the third body is fixedly connected or integrally formed with the second body.
7. The adapter according to claim 1, wherein: the fixing member comprises a fixing body movably connected to the adapter body, a fixing head located at least partially in the fixing body, and an elastic member located in the fixing body, the fixing head is movably connected to the fixing body, and two ends of the elastic member abut against the fixing body and the fixing head respectively, the elastic member has a pre-tightening force acting on the fixing head, and the pre-tightening force maintains the fixing head in an abutting position abutting against the object to be measured when the fixing member is in the fixed position.
8. The adapter according to claim 1, wherein: the fixing member moves along a preset straight line direction relative to the adapter body, a preset plane perpendicular to the preset straight line is defined, and the preset plane, the first contact surface and the second contact surface are not parallel to each other.
9. The adapter according to claim 1, further comprising: a mark point in a preset position relative to the adapter body, the mark point is located on the adapter body or detachably connected to the adapter body.
10. A three-dimensional scanning system, comprising: The three-dimensional scanning system comprises an adapter as claimed in any of claims 1 to 9. The three-dimensional scanning system comprises an adapter as claimed in any of claims 1 to 9.