Integrated busbar electrical test equipment
By integrating the automated design of busbar electrical testing equipment, the problem of low automation in existing equipment has been solved, realizing automated production and quality management, reducing labor intensity and maintenance costs, and making it suitable for high-voltage and high-current applications such as substations and data centers.
Patent Information
- Application Number
- CN202422783013.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-14
- Publication Date
- 2025-12-16
- Estimated Expiration
- 2034-11-14
AI Technical Summary
Existing electrical testing equipment has a low degree of automation, manual operation increases labor intensity, product quality consistency is difficult to guarantee, data recording and traceability mechanisms are lacking, the equipment is difficult to use, maintenance costs are high, and test fixtures need to be replaced or parameters need to be reset for integrated busbars of different specifications and configurations.
An integrated busbar electrical testing device was designed, including a carrier conveying mechanism, a carrier lifting mechanism, a barcode scanning mechanism, a first probe connection mechanism, and a second probe connection mechanism. This device enables electrical testing on an automated production line. The carrier conveying and lifting mechanisms automatically transport the workpiece, the barcode scanning mechanism uploads the information code, and the probe connection mechanism achieves comprehensive electrical connection and testing.
It has enabled automated production of integrated busbars, simplified the equipment changeover process, improved the automation level of testing, ensured product quality tracking and management, and reduced labor intensity and maintenance costs.
Smart Images
Figure CN223680345U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to new energy technology field especially, and it is a kind of integrated busbar electric property testing equipment. BACKGROUND
[0002] Integrated busbar electric property testing equipment is mainly used to detect and evaluate the electrical performance of busbar (i.e. power busbar) in power transmission system. Busbar is an important component for concentrating and distributing current, usually used in substation, data center, industrial manufacturing and other high-voltage and high-current application occasions. Therefore, it is very important to test its electrical property to ensure its safety and reliability.
[0003] Existing electric property testing equipment mostly relies on manual operation, and the degree of automation is low. In large-scale production, manual operation not only increases labor intensity, but also may lead to difficulty in guaranteeing the consistency of product quality. Traditional testing equipment lacks effective data recording and traceability mechanism, and it is difficult to realize the whole-process tracking and management of product quality. Once quality problems occur, it is difficult to quickly locate and solve. Existing testing equipment is often designed for specific types of integrated busbar, and for integrated busbars of different specifications and configurations, different testing fixtures need to be replaced or testing parameters need to be re-set, which increases the difficulty of using the equipment and maintenance cost. SUMMARY
[0004] The utility model aims at providing a kind of integrated busbar electric property testing equipment to solve the technical problem of low degree of automation of integrated busbar electric property testing in prior art.
[0005] In the first aspect, the utility model provides a kind of integrated busbar electric property testing equipment, comprising:
[0006] Carrier conveying mechanism, carrier conveying mechanism connects other equipment, for receiving the carrier from other equipment and conveying the carrier to other equipment, and the workpiece to be tested is loaded on the carrier;
[0007] Carrier lifting mechanism, carrier lifting mechanism lifts carrier between carrier conveying mechanism and test station;
[0008] Code scanning mechanism, information code is provided on the workpiece to be tested, and code scanning mechanism is used to scan information code and upload to management system;
[0009] First probe connecting mechanism, first probe connecting mechanism includes probe fixture plate, at least two first probes are fixedly provided on probe fixture plate, and first probe is electrically connected with the workpiece to be tested;
[0010] The second probe connecting mechanism comprises a first driving mechanism, which drives the at least two second probes to move along a direction parallel to the surface of the workpiece to be tested, so that the at least two second probes are electrically connected with the connector of the workpiece to be tested.
[0011] In an optional embodiment, the first probe connecting mechanism further comprises a probe mounting plate, the probe mounting plate is mounted to the probe jig plate, and the first probe is mounted to the probe mounting plate.
[0012] In an optional embodiment, the first probe connecting mechanism further comprises a mounting bracket, the probe jig plate is detachably mounted to the mounting bracket, and the mounting bracket is fixedly mounted to the equipment base.
[0013] In an optional embodiment, the first probe connecting mechanism further comprises at least two quick-change tool plates, the quick-change tool plates are detachably connected to the probe jig plate, and each quick-change tool plate is provided with at least two probe mounting plates.
[0014] In an optional embodiment, the second probe connecting mechanism further comprises an X-axis adjusting mechanism and a Y-axis adjusting mechanism, and the first driving mechanism is connected to the X-axis adjusting mechanism and the Y-axis adjusting mechanism.
[0015] In an optional embodiment, the second probe connecting mechanism further comprises a second driving mechanism, which drives the first driving mechanism to move along a direction perpendicular to the surface of the workpiece to be tested.
[0016] In an optional embodiment, the second probe connecting mechanism further comprises a guide mechanism, the guide mechanism comprises at least two guide plates, and the second probe is arranged between the at least two guide plates.
[0017] In an optional embodiment, the second probe connecting mechanism further comprises a floating mechanism, the floating mechanism comprises a fixed plate and a floating plate, the fixed plate is connected to the first driving mechanism, the second probe is arranged on the floating plate, and an elastic element is arranged between the fixed plate and the floating plate.
[0018] In an optional embodiment, the second driving mechanism comprises a driving stroke adjusting mechanism.
[0019] In an optional embodiment, in a state where the carrier lifting mechanism lifts the carrier to the test station, the first probe is electrically connected with the workpiece to be tested, and the first driving mechanism drives the at least two second probes to move along a direction parallel to the surface of the workpiece to be tested.
[0020] The integrated busbar electrical property testing equipment has the following beneficial effects:
[0021] 1. The carrier conveying mechanism and the carrier lifting mechanism cooperate to automatically receive the carrier loaded with the workpiece to be tested from other equipment, transport the carrier to the test station for testing, and automatically transport the carrier from the test station to other equipment after the testing is completed, which is suitable for an automatic production line and facilitates the automatic production of display integrated busbars.
[0022] 2. The code scanning mechanism can scan the information code of the workpiece to be tested and upload it to the management system, facilitating the tracking and management of the electrical testing of the workpiece.
[0023] 3. The first probe connecting mechanism can be directly electrically connected with the conductive row of the integrated busbar, and the second probe connecting mechanism can drive the second probe to be electrically connected with the plug of the workpiece to be tested through the first driving mechanism, so that the integrated busbar can be comprehensively electrically connected and electrically tested. BRIEF DESCRIPTION OF DRAWINGS
[0024] In order to more clearly illustrate the specific embodiments of the present application or the technical solutions in the prior art, the drawings needed in the following specific embodiments or prior art description will be briefly introduced. Obviously, the drawings in the following description are some embodiments of the present application, and other drawings can also be obtained by those skilled in the art without creative labor.
[0025] Figure 1 The structure schematic view of the carrier conveying mechanism and the carrier lifting mechanism of the integrated busbar electrical testing equipment provided by the embodiments of the present application is shown.
[0026] Figure 2 The structure schematic view of the first probe connecting mechanism and the second probe connecting mechanism of the integrated busbar electrical testing equipment provided by the embodiments of the present application is shown.
[0027] Figure 3 The structure schematic view of the first probe connecting mechanism and the second probe connecting mechanism of the integrated busbar electrical testing equipment provided by the embodiments of the present application is shown.
[0028] Figure 4 The structure schematic view of the probe mounting plate of the first probe connecting mechanism of the integrated busbar electrical testing equipment provided by the embodiments of the present application is shown.
[0029] Figure 5 The structure schematic view of the first driving mechanism of the second probe connecting mechanism of the integrated busbar electrical testing equipment provided by the embodiments of the present application is shown.
[0030] Figure 6 The structure schematic view of the first driving mechanism of the second probe connecting mechanism of the integrated busbar electrical testing equipment provided by the embodiments of the present application is shown. Figure 5 The local enlarged schematic view of A in FIG.
[0031] Icon: 100 - carrier transfer mechanism; 200 - carrier lifting mechanism; 310 - probe jig plate; 320 - first probe; 330 - probe mounting plate; 340 - mounting bracket; 400 - second probe connecting mechanism; 410 - first driving mechanism; 420 - second probe; 440 - Y-axis adjusting mechanism; 450 - second driving mechanism; 461 - fixed plate; 462 - floating plate; 463 - elastic element; 500 - carrier; 600 - workpiece. DETAILED DESCRIPTION
[0032] In order to make the purpose, technical scheme and advantages of the embodiments of the present application clearer, the technical scheme in the embodiments of the present application will be described clearly and completely below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, rather than all the embodiments. The components of the embodiments of the present application described and shown in the drawings can be arranged and designed in various different configurations.
[0033] Therefore, the following detailed description of the embodiments of the present application provided in the drawings is not intended to limit the scope of the claimed present application, but only represents selected embodiments of the present application. All other embodiments obtained by those of ordinary skill in the art based on the embodiments in the present application without creative labor are within the scope of protection of the present application.
[0034] It should be noted that: similar reference numbers and letters represent similar items in the following drawings, therefore, once an item is defined in one drawing, it does not need to be further defined and explained in subsequent drawings.
[0035] In the description of the present application, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer" and the like indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, or the orientation or positional relationship commonly placed when the product of the present application is used, and are only for the convenience of describing the present application and simplifying the description, and therefore cannot be understood as indicating or implying that the indicated device or element must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as limiting the present application. In addition, the terms "first", "second", "third" and the like are only used for differentiation in description, and cannot be understood as indicating or implying relative importance.
[0036] In addition, the terms "horizontal", "vertical", "overhanging" and the like do not mean that the components must be absolutely horizontal or overhanging, but can be slightly inclined. For example, "horizontal" only means that its direction is relatively more horizontal than "vertical", and does not mean that the structure must be completely horizontal, but can be slightly inclined.
[0037] In the description of the utility model, still need to explain, unless another explicit provision and limitation, term "arrangement", "installation", "link", "connection" should do broad sense understanding, for example, can be fixed connection, also can be detachable connection, or integrally connected;Can be mechanical connection, also can be electrical connection;Can be directly connected, also can be indirectly connected through intermediate medium, can be two elements inside the communication.For ordinary skilled in the art, can understand the specific meaning of the above terms in the utility model according to specific circumstances.
[0038] Some embodiments of the utility model will be described in detail below with reference to the drawings.In the case of no conflict, the following examples and features in examples can be combined with each other.
[0039] The utility model embodiment provides a kind of integrated busbar electrical testing equipment, as shown in Figures 1 to 6 As shown, comprising:
[0040] Carrier conveying mechanism 100, carrier conveying mechanism 100 connects other equipment, for receiving carrier 500 from other equipment and conveying carrier 500 to other equipment, and the workpiece 600 to be tested is loaded on carrier 500;
[0041] Carrier lifting mechanism 200, carrier lifting mechanism 200 is lifted to carrier 500 between carrier conveying mechanism 100 and test station;
[0042] Code scanning mechanism, information code is provided on the workpiece 600 to be tested, and code scanning mechanism is used to scan information code and upload to management system;
[0043] First probe connecting mechanism, first probe connecting mechanism includes probe fixture plate 310, at least two first probes 320 are fixedly provided on probe fixture plate 310, and first probe 320 is electrically connected with the workpiece 600 to be tested;
[0044] Second probe connecting mechanism 400, second probe connecting mechanism 400 includes first driving mechanism 410, and first driving mechanism 410 drives at least two second probes 420 to move along the direction parallel to the surface of the workpiece 600 to be tested, so that at least two second probes 420 are electrically connected with the plug-in component of the workpiece 600 to be tested.
[0045] Figure 1 The structure diagram of carrier conveying mechanism 100 and carrier lifting mechanism 200 of integrated busbar electrical testing equipment provided by the utility model embodiment is as shown in Figure 1 As shown, carrier 500 is located on carrier conveying mechanism 100, and the workpiece 600 to be tested is loaded on carrier 500, and in Figure 1In the state shown in FIG. 1, the carrier lifting mechanism 200 is in a lowered state, and after the carrier lifting mechanism 200 is lifted, the carrier 500 will be lifted to a test station.
[0046] Figure 2 FIG. 1 is a structural schematic diagram of a first probe connecting mechanism and a second probe connecting mechanism 400 of an integrated busbar electrical property testing device according to an embodiment of the present application, Figure 2 FIG. 2 is a top perspective schematic diagram of the first probe connecting mechanism and the second probe connecting mechanism 400. Figure 3 FIG. 3 is another structural schematic diagram of the first probe connecting mechanism and the second probe connecting mechanism 400 of the integrated busbar electrical property testing device according to an embodiment of the present application, Figure 3 FIG. 4 is a bottom perspective schematic diagram of the first probe connecting mechanism and the second probe connecting mechanism 400. Figure 2 and Figure 3 In the state shown in FIG. 1, the carrier lifting mechanism 200 is in a lowered state, and after the carrier lifting mechanism 200 is lifted, the carrier 500 will be lifted to a test station.
[0047] The first probe 320 of the first probe connecting mechanism is used to be directly electrically connected with a conductive row of the integrated busbar. In the integrated busbar electrical property testing device, the workpiece 600 to be tested is a semi-finished product or a finished product of the integrated busbar. On the integrated busbar, the conductive row can be an aluminum bar made of aluminum or a copper bar made of copper, and the conductive row is generally provided with multiple groups and is arranged on the front surface of the conductive row and used to be connected with a positive electrode or a negative electrode of an electric core or a battery. The first probe 320 is arranged below the probe jig plate 310 and can be directly electrically connected with the conductive row when the workpiece 600 to be tested is lifted to the test station along with the carrier 500.
[0048] The first probe 320 is mainly used to detect the continuity and resistance value of the conductive row. Through this method, whether the conductive row is disconnected, short-circuited or has poor contact and the like can be checked. If there is any crack or damage on the conductive row, the overall circuit performance can be reduced or even completely disabled.
[0049] The second probe connecting mechanism 400 is electrically connected with a plug-in piece on the workpiece 600 to be tested. On the integrated busbar, the plug-in piece is generally arranged on the side surface, and a plug-in interface of the plug-in piece is also located on the side surface, and the second probe 420 needs to be electrically connected with the plug-in piece from the side surface. The first driving mechanism 410 is arranged to drive the at least two second probes 420 to move along a direction parallel to the surface of the workpiece 600 to be tested, so that the second probe 420 is electrically connected with the plug-in piece and relevant electrical property testing is performed. Figure 5 FIG. 5 is a structural schematic diagram of the first driving mechanism 410 of the second probe connecting mechanism 400 of the integrated busbar electrical property testing device according to an embodiment of the present application. Figure 5 As shown in FIG. 5, the first driving mechanism 410 can drive the second probe 420 to move along a direction parallel to the surface of the workpiece 600 to be tested.
[0050] The second probe 420 is used to evaluate the quality of the connection between the plug-in connector and the conductive bar, including but not limited to contact resistance and insulation performance. Detecting the contact resistance can ensure that a good and reliable electrical connection is formed between the plug-in connector and the aluminum bar. Detecting the insulation performance can check whether there is a risk of accidental short circuit in the plug-in connector and its surrounding area.
[0051] The integrated busbar electrical property testing device provided by the embodiment of the utility model has the following beneficial effects:
[0052] 1. The carrier conveying mechanism 100 and the carrier lifting mechanism 200 cooperate, so that the carrier 500 loaded with the workpiece 600 to be tested can be automatically received from other equipment, transported to the test station for testing, and then automatically transported from the test station to other equipment after the testing is completed, which is suitable for an automatic production line and facilitates the automatic production of integrated busbars;
[0053] 2. The code scanning mechanism can scan the information code of the workpiece 600 to be electrically tested and upload it to the management system, so as to facilitate the tracking and management of the electrical property testing of the workpiece 600;
[0054] 3. The first probe connecting mechanism can be directly electrically connected with the conductive bar of the integrated busbar, and the second probe connecting mechanism 400 can drive the second probe 420 to electrically connect with the plug-in connector of the workpiece 600 to be tested through the first driving mechanism 410, so that the integrated busbar can be comprehensively electrically connected and electrically tested.
[0055] In an optional embodiment, as shown in Figure 4 The first probe connecting mechanism further includes a probe mounting plate 330, the probe mounting plate 330 is mounted to the probe jig plate 310, and the first probe 320 is mounted to the probe mounting plate 330. Figure 4 The structure diagram of the probe mounting plate 330 of the first probe connecting mechanism of the integrated busbar electrical property testing device provided by the embodiment of the utility model. The first probe 320 has a small volume, the first probe 320 is mounted on the probe mounting plate 330, and then the probe mounting plate 330 is mounted on the probe jig plate 310, so that the mounting process is easier. In addition, the distribution of the conductive bar on the integrated busbar of different specifications is different, and different positions of the first probe 320 need to be correspondingly set, and the first probe 320 is mounted to the probe mounting plate 330, so that the mounting position of the first probe 320 is also more convenient to adjust.
[0056] In an optional embodiment, as shown in Figure 2As shown, the first probe connecting mechanism further comprises a mounting bracket 340, the probe jig plate 310 is detachably mounted to the mounting bracket 340, and the mounting bracket 340 is fixedly mounted to the equipment base. The mounting bracket 340 is fixedly connected with the equipment base, and the probe jig plate 310 is detachably connected with the mounting bracket 340, which can facilitate the replacement of the probe jig plate 310. When testing workpieces 600 of different models, the conductive row positions of the workpieces 600 to be tested of different signals can be matched by directly replacing the entire probe jig plate 310, and the integrated busbar electrical testing equipment is more convenient and fast to change.
[0057] In an optional embodiment, the first probe connecting mechanism further comprises at least two quick-change tooling plates, and the quick-change tooling plates are detachably connected to the probe jig plate 310. Each quick-change tooling plate is provided with at least two probe mounting plates 330. In this embodiment, when the integrated busbar electrical testing equipment needs to be changed, the position adjustment of the first probe 320 can be realized by replacing the quick-change tooling plate. Especially when the positions of the conductive rows on the integrated busbar change slightly and only need to be adjusted appropriately, only the quick-change tooling plate needs to be adjusted instead of the entire probe jig plate 310, so the workload is smaller and it is easier to realize the quick change of the integrated busbar electrical testing equipment.
[0058] In an optional embodiment, as shown in Figure 2 The second probe connecting mechanism 400 further comprises an X-axis adjusting mechanism and a Y-axis adjusting mechanism 440, the first driving mechanism 410 is connected to the X-axis adjusting mechanism and the Y-axis adjusting mechanism 440, Figure 2 The X-axis adjusting mechanism is not shown in the Y-axis adjusting mechanism. Both the X-axis direction and the Y-axis direction are parallel to the direction of the workpiece 600 to be tested. The positions of the first driving mechanism 410 and the second probe 420 are adjusted through the X-axis adjusting mechanism and the Y-axis adjusting mechanism 440. Different models of integrated busbars have different external dimensions, which may result in different positions of the X-axis direction and the Y-axis direction of the plug-in connector of the workpiece 600 to be tested of different models. However, the number of plug-in connectors is generally small, and the amount of adjustment of the position of the second probe 420 through the X-axis adjusting mechanism and the Y-axis adjusting mechanism 440 is not large when the integrated busbar electrical testing equipment is changed, so it is easy to operate.
[0059] In an optional embodiment, as shown in Figure 1 and Figure 5As shown, the second probe connecting mechanism 400 further comprises a second driving mechanism 450, which drives the first driving mechanism 410 to move in a direction perpendicular to the surface of the workpiece 600 to be tested. The second driving mechanism 450 can adjust the relative height between the second probe 420 and the workpiece 600 to be tested. Before testing, the second driving mechanism 450 can raise the second probe 420 to a higher height, and during testing, the second driving mechanism 450 drives the second probe 420 to a position horizontally aligned with the plug of the workpiece 600 to be tested.
[0060] In an optional embodiment, the second driving mechanism 450 comprises a driving stroke adjustment mechanism. Different models of integrated busbars have different external dimensions, which may result in different heights of the plug of the workpiece 600 to be tested in the vertical direction. By means of the driving stroke adjustment mechanism, the position to which the second driving mechanism 450 can drive the second probe 420 can be quickly adjusted, which makes it easier to realize quick model change of the integrated busbar electrical testing device. The second driving mechanism 450 can adopt a stroke-adjustable air cylinder, or a linear motor, a servo motor, or other semi-closed loop or closed loop control devices. The present application does not make specific limitations in this regard.
[0061] In an optional embodiment, as shown in Figure 6 The second probe connecting mechanism 400 further comprises a floating mechanism, which comprises a fixed plate 461 and a floating plate 462. The fixed plate 461 is connected to the first driving mechanism 410, and the second probe 420 is arranged on the floating plate 462. An elastic element 463 is arranged between the fixed plate 461 and the floating plate 462. Figure 6 To Figure 5 The specific structure of the floating mechanism is shown in the enlarged view of part A in FIG. 4. The floating mechanism allows the second probe 420 to provide a certain buffering effect after contacting the plug, so as to avoid the second probe 420 and the plug from being in hard contact and being damaged. The elastic element 463 can be, for example, a spring, a rubber pad, or the like. The present application does not make specific limitations in this regard.
[0062] In an optional embodiment, the second probe connecting mechanism 400 further comprises a guide mechanism, which comprises at least two guide plates, and the second probe 420 is arranged between the at least two guide plates. The plug of the integrated busbar comprises an external structural member. The guide mechanism can cooperate with the external structural member of the plug, and after the guide mechanism contacts the external structural member of the plug, it can play a guiding role, so that the second probe 420 can more accurately contact the plug, and avoid physical damage of the second probe 420 and the plug due to incomplete alignment.
[0063] In the optional embodiment, the first probe 320 is electrically connected with the workpiece 600 to be tested in the state that the carrier lifting mechanism 200 lifts the carrier 500 to the test station, and the first driving mechanism 410 drives the at least two second probes 420 to move along the direction parallel to the surface of the workpiece 600 to be tested.
[0064] Finally, it should be noted that: the above embodiments are only used to illustrate the technical solutions of the present application, but not limited to them; although the present application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that: it can still modify the technical solutions recorded in the foregoing embodiments, or make equivalent replacement to part or all of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the scope of the technical solutions of the embodiments of the present application.
Claims
1. An integrated busbar electrical testing apparatus, comprising: The utility model relates to a test device for testing the electrical performance of a workpiece, comprising: a carrier conveying mechanism (100) connected to other devices for receiving a carrier (500) from other devices and conveying the carrier (500) to other devices, the carrier (500) being loaded with a workpiece (600) to be tested; a carrier lifting mechanism (200) for lifting the carrier (500) between the carrier conveying mechanism (100) and a test station; a code scanning mechanism for scanning an information code on the workpiece (600) to be tested and uploading the information code to a management system; a first probe connecting mechanism comprising a probe jig plate (310) on which at least two first probes (320) are fixedly arranged, the first probes (320) being electrically connected to the workpiece (600) to be tested; a second probe connecting mechanism (400) comprising a first driving mechanism (410) for driving at least two second probes (420) to move along a direction parallel to the surface of the workpiece (600) to be tested, so that the at least two second probes (420) are electrically connected to the connector of the workpiece (600) to be tested.
2. The integrated busbar electrical testing apparatus of claim 1, wherein, The first probe connecting mechanism further comprises a probe mounting plate (330) mounted to the probe jig plate (310), and the first probes (320) are mounted to the probe mounting plate (330).
3. The integrated busbar electrical testing apparatus of claim 2, wherein, The first probe connecting mechanism further comprises a mounting bracket (340) to which the probe jig plate (310) is detachably mounted, and the mounting bracket (340) is fixedly mounted to a device base.
4. The integrated busbar electrical testing apparatus of claim 2, wherein, The first probe connecting mechanism further comprises at least two quick-change tooling plates, and each of the quick-change tooling plates is detachably connected to the probe jig plate (310) and has at least two probe mounting plates (330) mounted thereto.
5. The integrated busbar electrical testing apparatus of claim 1, wherein, The second probe connecting mechanism (400) further comprises an X-axis adjusting mechanism and a Y-axis adjusting mechanism (440), and the first driving mechanism (410) is connected to the X-axis adjusting mechanism and the Y-axis adjusting mechanism (440).
6. The integrated busbar electrical testing apparatus of claim 1, wherein, The second probe connecting mechanism (400) further comprises a second driving mechanism (450) for driving the first driving mechanism (410) to move along a direction perpendicular to the surface of the workpiece (600) to be tested.
7. The integrated busbar electrical testing apparatus of claim 6, wherein, The second driving mechanism (450) comprises a driving stroke adjusting mechanism.
8. The integrated busbar electrical testing apparatus of claim 1, wherein, The second probe connecting mechanism (400) further comprises a floating mechanism comprising a fixed plate (461) connected to the first driving mechanism (410) and a floating plate (462) on which the second probes (420) are arranged, and an elastic element (463) is arranged between the fixed plate (461) and the floating plate (462).
9. The integrated busbar electrical testing apparatus of claim 1, wherein, The second probe connecting mechanism (400) further comprises a guiding mechanism, the guiding mechanism comprises at least two guiding plates, and the second probe (420) is arranged between the at least two guiding plates.
10. The integrated busbar electrical testing apparatus of claim 1, wherein, In a state where the carrier lifting mechanism (200) lifts the carrier (500) to the test station, the first probe (320) is electrically connected with the workpiece (600) to be tested, and the first driving mechanism (410) drives the at least two second probes (420) to move along a direction parallel to the surface of the workpiece (600) to be tested.