Resistance selection test circuit

Abstract

The utility model relates to a resistance selection test circuit, which comprises relays K1-K14 and a common relay K15, the common relay K15 and the relays K1-K14 are in a parallel connection state and are both arranged between RES-IN and RES-OUT, each relay is provided with a corresponding switch, before equipment works, the common relay K15 is in a pull-in state, the other relays K1-K14 are in a disconnected state, and the other relays K1-K14 are in a closed state. A fixed common resistance value is output between the RES-IN and the RES-OUT, the R1 is connected with the 4-16 decoders, the U1 is connected with the single-chip microcomputer U2, and the RES-IN and the RES-OUT are respectively connected with equipment output binding posts. In a word, the circuit has the technical advantages of being easy to operate, low in cost, high in measuring and calculating speed and accurate in measuring and calculating result.

Description

TECHNICAL FIELD

[0001] The utility model belongs to temperature simulation test technical field, specifically relates to a resistance selection test circuit. BACKGROUND

[0002] Resistance selector is often used in display and controller in aviation field, mainly resistance value change is used to simulate sensor to test temperature, and the original method mainly relies on resistance box to complete, but in the testing process, when different temperatures need to be tested, resistance box needs to be operated repeatedly for many times, which is not only inconvenient, but also has high cost, and when calculating, the speed is slow, especially when high and low temperature, due to the change of ambient temperature, the accurate parameters of the product under the current ambient temperature cannot be measured quickly. UTILITY MODEL CONTENTS

[0003] The utility model provides a resistance selection test circuit, applied to temperature simulation test field, solves the technical problem of the present operation complex, high cost and inaccurate calculation result.

[0004] In order to achieve the above technical purpose, the specific technical scheme adopted by the utility model is:

[0005] A resistance selection test circuit, including K1~K14 relay and common relay K15, common relay K15 is in parallel with K1~K14 relay, and is arranged between RES-IN and RES-OUT, each relay is provided with corresponding switch, before equipment works, common relay K15 is in the attraction state, and the rest K1~K14 relay is disconnected, and RES-IN and RES-OUT output fixed common resistance value between, R1 is connected with 4-16 decoder, U1 is connected with single-chip microcomputer U2, RES-IN, RES-OUT are respectively connected with equipment output terminal post, when R1 receives single-chip microcomputer control signal, makes light MOS open, thereby controlling relay K1 attraction, K2~K14 relay is disconnected when not receiving control signal, makes RES-IN and R-XZ1 conduction, at this moment, this group of resistance value is selected as output, and the equipment outputs the parallel value of R-XZ1 and common resistance value at this time, after a certain time, K15 receives single-chip microcomputer control signal, and K15 is disconnected, and only the resistance value of R-XZ1 is kept in the circuit, and the resistance value can normally test at this time, when R2~R14 receives single-chip microcomputer control signal, repeats the similar operation.

[0006] Further, the common relay K15 is internally provided with a control coil, and the circuit between the two ends of the control coil is VCC-F1 to GND-F1, and the current between VCC-F1 and GND-F1 is changed, so that the current in the control coil changes, and the opening and closing of the switch of the common relay K15 are promoted under the action of the internal components of the common relay K15.

[0007] Further, the single-chip microcomputer U2 is provided with a single-chip microcomputer circuit VCC-F to P3.7, and the circuit of VCC-F to P3.7 is connected in parallel with a part of the circuit of VCC-F1 to GND-F1 through the light MOS, so that the circuit between VCC-F1 and GND-F1 is controlled through the single-chip microcomputer circuit VCC-F to P3.7 under the action of the light MOS, and the circuit between the single-chip microcomputer circuit VCC-F to P3.7 and VCC-F1 to GND-F1 does not interfere with each other.

[0008] Further, the circuit of VCC-F to R1 controls the circuit between VCC-F1 and GND-F1 in the same way, so that the attraction of the relay K1 is affected through the coil in the relay K1, and the 4-16 decoder is further connected with R2-R14, and the other end of the 4-16 decoder is connected with the single-chip microcomputer U2, so that the relays K1-K14 are controlled through the single-chip microcomputer U2 under the condition of saving lines.

[0009] Further, the protection resistor connected in parallel with the control coil is arranged between VCC-F1 and GND-F1, and the protection resistor corresponds to D1-D15 corresponding to the relays K1-K14 and the common relay K15.

[0010] Further, the resistance selection test circuit is arranged in the circuit box, the circuit box is provided with a number tube, the resistance value is displayed through the number tube, the RES-IN equipment output terminal and the RES-OUT equipment output terminal are both connected with corresponding resistance output terminals, and the two resistance output terminals are arranged on the upper end face of the circuit box.

[0011] Further, the circuit box is further provided with a power switch, a switch key, a serial port and a power supply interface, the switch key is sixteen, and controls the common relay K15 and the relays K1-K14, and the switch key further includes a spare button, so that the relays K1-K14 can be manually selected in addition to automatic testing, and different resistance values are displayed.

[0012] By adopting the above technical scheme, the following beneficial effects can be brought by the utility model:

[0013] 1. The utility model discloses a resistance selection test circuit, through using K1~K14 relay and public relay K15, effectively reduce personnel operation, improve the degree of automation of test, thereby convenient collection a large amount of experimental data, promote product data's precision, adopt public resistance value is to guarantee that the circuit is in the intercommunication state all the time, solve the relay when switching resistance, bring similar switch noise interference, prevent the damage of peak voltage to the product of being measured, have the advantages such as fast and accurate.

[0014] The utility model discloses a resistance selection test circuit, through the current resistance value of nixie tube display, more intuitive, and in order to avoid the interference of invalid resistance value, after a certain time of the parallel value of output R-XZ1 and public resistance value, K15 receives the singlechip control signal, then K15 disconnects, at this moment, the resistance value of R-XZ1 is kept in the circuit, thereby after the resistance value stabilizes, the current resistance value is sent to the computer, and the test software on the test computer will output the received resistance value and the current data of the product collected into the table, which is convenient for personnel to check. BRIEF DESCRIPTION OF DRAWINGS

[0015] In order to more clearly illustrate the technical scheme of the embodiment of the utility model, the following will be briefly introduced the drawing needed to be used in the embodiment, obviously, the drawing in the following description only some embodiments of the utility model, for those skilled in the art, under the premise of not paying creative labor, still can obtain other drawings according to these drawings.

[0016] Fig. 1 For the circuit schematic diagram of the public relay K15 part in the resistance selection test circuit of the utility model,

[0017] Fig. 2 For the circuit schematic diagram of the public relay K1 part in the resistance selection test circuit of the utility model,

[0018] Fig. 3 For the structure schematic diagram of the circuit box in the embodiment of the utility model,

[0019] Fig. 4 For the connection structure schematic diagram of the power interface and the circuit box in the embodiment of the utility model,

[0020] Among them: 1, power switch, 2, resistance output terminal post, 3, switch button, 4, nixie tube, 5, serial port, 6, power interface. DETAILED DESCRIPTION

[0021] The embodiments of the utility model will be described in detail below with reference to the drawings.

[0022] Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. The present application can also be implemented or applied through other different specific embodiments, and each detail in the specification can be modified or changed based on different views and applications without departing from the spirit of the present application. It should be noted that the following embodiments and features in the embodiments can be combined with each other without conflict. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor are within the scope of protection of the present application.

[0023] It should be noted that various aspects of the embodiments described below are within the scope of the appended claims. It should be apparent that the aspects described herein can be embodied in a wide variety of forms and that any specific structure and / or function described herein is merely illustrative. Based on the present application, those skilled in the art will appreciate that one aspect described herein can be implemented independently of any other aspects, and that the various aspects can be combined in various ways. For example, an apparatus can be implemented or a method can be practiced using any number of the aspects described herein. In addition, such an apparatus can be implemented or such a method can be practiced using other structure and / or functionality in addition to or other than one or more of the aspects described herein.

[0024] It should also be noted that the drawings provided in the following embodiments only schematically illustrate the basic concept of the present application, and only the components related to the present application are shown in the drawings, not the number, shape and size of the components when actually implemented. The actual implementation of each component can be a random change in shape, number and proportion, and the layout of the components can also be more complex.

[0025] In addition, in the following description, specific details are provided to facilitate a thorough understanding of the examples. However, one skilled in the art will understand that the described aspects can be practiced without these specific details.

[0026] Embodiment 1

[0027] In an embodiment of the present application, referring to Figs. 1 to 4A resistance selection test circuit, comprising K1-K14 relays and a common relay K15, the common relay K15 is in parallel with the K1-K14 relays and is arranged between RES-IN and RES-OUT, and each relay is provided with a corresponding switch. Before the device is in operation, the common relay K15 is in the attracted state, and the remaining K1-K14 relays are in the open state, and a fixed common resistance is output between RES-IN and RES-OUT, R1 is connected with a 4-16 decoder, U1 is connected with a single-chip microcomputer U2, and RES-IN and RES-OUT are respectively connected with the device output terminal.

[0028] The common relay K15 is internally provided with a control coil, and the circuit between the two ends of the control coil is VCC-F1 to GND-F1, and the current between VCC-F1 and GND-F1 is changed, so that the current in the control coil changes, and under the action of the internal structure of the common relay K15, the switch of the common relay K15 is opened and closed.

[0029] The single-chip microcomputer U2 is provided with a single-chip microcomputer circuit VCC-F to P3.7, and the circuit of VCC-F to P3.7 is connected in parallel with a section of circuit of VCC-F1 to GND-F1 through a light MOS, so that the circuit between VCC-F1 and GND-F1 is controlled by the single-chip microcomputer circuit VCC-F to P3.7 through the light MOS, and the circuit between the single-chip microcomputer circuit VCC-F to P3.7 and VCC-F1 to GND-F1 does not interfere with each other.

[0030] The circuit of VCC-F to R1 controls the circuit between VCC-F1 and GND-F1 in the same way, so that the attraction of the relay K1 is affected by the coil in the relay K1, and the 4-16 decoder is also connected with R2-R14, and the other end of the 4-16 decoder is connected with the single-chip microcomputer U2, so that the K1-K14 relays are controlled by the single-chip microcomputer U2 under the condition of saving the circuit. A protection resistor is arranged in parallel with the control coil between VCC-F1 and GND-F1, and D1-D15 are respectively corresponding to the K1-K14 relays and the common relay K15.

[0031] The resistance selection test circuit is arranged in the circuit box body, a digital tube 4 is arranged on the circuit box body, resistance values are displayed through the digital tube 4, the RES-IN equipment output terminal and the RES-OUT equipment output terminal are both connected with corresponding resistance output terminals 2, and the two resistance output terminals 2 are arranged on the upper end face of the circuit box body. A power switch 1, switch keys 3, a serial port 5 and a power interface 6 are further arranged on the circuit box body, the sixteen switch keys 3 control the common relay K15 and the K1-K14 relays respectively, and the switch keys 3 further include one idle standby button, which can manually select the K1-K14 relays in addition to automatic testing, so that different resistance values are displayed.

[0032] In the use process, when R1 receives the single-chip microcomputer control signal, the light MOS is opened, thereby controlling the relay K1 to be attracted, the K2-K14 relays are in the off state when no control signal is received, and RES-IN and R-XZ1 are turned on, at this time, this group of resistance values is selected as the output, the equipment outputs the parallel value of R-XZ1 and the common resistance value at this time, after a certain time, K15 receives the single-chip microcomputer control signal, K15 is disconnected, and only the resistance value of R-XZ1 is kept in the circuit, at this time, the resistance value can be normally tested, when R2-R14 receives the single-chip microcomputer control signal, the above similar operation is repeated, in summary, the utility model has the advantages of simple operation, low cost, fast measurement speed and accurate measurement result.

[0033] The above is only a specific embodiment of the utility model, but the protection scope of the utility model is not limited to this, any skilled person in the art can easily think of changes or replacements within the technical range disclosed by the utility model, which should be covered in the protection scope of the utility model. Therefore, the protection scope of the utility model should be subject to the protection scope of the claims.

Claims

1. A resistance selection test circuit, characterized by: The utility model relates to a relay control circuit, including K1~K14 relay and common relay K15, R1 with 4-16 decoder, U1 with singlechip U2, light MOS, equipment, common relay K15 is in parallel with K1~K14 relay state, and all are arranged between RES-IN and RES-OUT, and each relay is provided with corresponding switch, the equipment work, common relay K15 is in the state of attraction, and the rest K1~K14 relay is off state, and the fixed common resistance between RES-IN and RES-OUT is exported, R1 is connected with 4-16 decoder, U1 is connected with singlechip U2, and RES-IN, RES-OUT are connected with the equipment output terminal respectively, when R1 receives singlechip control signal, makes light MOS open, thereby control relay K1 attraction, K2~K14 relay is off state when not receiving control signal, makes RES-IN and R-XZ1 conduction, at this moment, this group resistance value is selected as output, and the equipment is exported as the parallel value of R-XZ1 and common resistance value at this time, after a certain time, K15 receives singlechip control signal, and K15 is disconnected, and only the resistance value of R-XZ1 is kept in the circuit, and the resistance value can be tested normally at this time, when R2~R14 receives singlechip control signal, repeat the above operation.

2. The resistance selection test circuit of claim 1, wherein: The common relay K15 is internally provided with a control coil, and the circuit between the two ends of the control coil is VCC-F1 to GND-F1. The current change between VCC-F1 and GND-F1 causes a current change in the control coil, which promotes the opening and closing of the switch of the common relay K15 under the action of the internal components of the common relay K15.

3. The resistance selection test circuit of claim 2, wherein: The singlechip U2 is provided with a singlechip circuit VCC-F to P3.

7. The circuit of VCC-F to P3.7 is connected in parallel with a section of circuit on VCC-F1 to GND-F1 through light MOS, so as to control the circuit between VCC-F1 and GND-F1 through the singlechip circuit VCC-F to P3.7 under the action of light MOS. Moreover, the circuit between the singlechip circuit VCC-F to P3.7 and VCC-F1 to GND-F1 does not interfere with each other.

4. The resistance selection test circuit of claim 3, wherein: The circuit of VCC-F to R1 controls the circuit between VCC-F1 and GND-F1 in the same way, so as to affect the attraction of relay K1 through the coil in the relay K1. The 4-16 decoder is also connected with R2 to R14. The other end of the 4-16 decoder is connected with the singlechip U2, so as to control K1 to K14 relay through the singlechip U2 under the condition of saving lines.

5. The resistance selection test circuit of claim 4, wherein: A protection resistor is arranged in parallel with the control coil between VCC-F1 and GND-F1. D1 to D15 correspond to K1 to K14 relay and common relay K15 respectively.

6. The resistance selection test circuit of claim 5, wherein: The resistance selection test circuit is arranged in the circuit box body, a number tube (4) is arranged on the circuit box body, resistance values are displayed through the number tube (4), the RES-IN output terminal and the RES-OUT output terminal are both connected with corresponding resistance output terminals (2), and the two resistance output terminals (2) are arranged on the upper end face of the circuit box body.

7. The resistance selection test circuit of claim 6, wherein: A power switch (1), switch buttons (3), a serial port (5) and a power interface (6) are further arranged on the circuit box body, the sixteen switch buttons (3) control the common relay K15 and the relays K1-K14 respectively, and the switch buttons (3) further include one idle standby button.

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