Scintillator afterglow testing device
By designing a scintillator afterglow testing device that integrates an operator unit, an X-ray source, and a shielding box, the problem of complex and inefficient testing in existing technologies is solved, achieving the effects of simplified operation, improved efficiency, and reduced costs.
Patent Information
- Application Number
- CN202423155533.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-20
- Publication Date
- 2025-12-23
- Estimated Expiration
- 2034-12-20
AI Technical Summary
Existing scintillator afterglow testing is complex and inefficient, increasing product production cycles and manufacturing costs for manufacturers.
A scintillator afterglow testing device was designed, including an integrated operator, an X-ray source, a shielding box, and a silicon photodiode. It integrates signal processing circuits, a computer, and software, and uses the shielding box to protect against X-rays, simplifying the testing operation and improving efficiency.
It achieves simple and efficient testing operations, reduces product production cycle and production costs, and improves testing security.
Smart Images
Figure CN223711837U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of scintillator testing technology, specifically to a scintillator afterglow testing device. Background Technology
[0002] The scintillator is the core component of the detector, and the scintillator afterglow is an important indicator for the scintillator's factory testing. Existing scintillator afterglow testing operations are complex and inefficient, increasing product production cycles and manufacturers' production costs. Utility Model Content
[0003] This invention addresses the problems of complex and inefficient scintillator afterglow testing, which increases product production cycle and manufacturer costs, by providing a scintillator afterglow testing device.
[0004] To solve the above-mentioned technical problems, the technical solution provided by this utility model is as follows: a scintillator afterglow testing device, including an integrated operator, an X-ray source, and a shielding box. The bottom of the shielding box is equipped with a movable base with casters. An operating platform with a keyboard and mouse is provided on the upper front side of the shielding box. The integrated operator is fixed to the shielding box by a mounting bracket. The X-ray source is located inside the shielding box. The upper panel of the X-ray source has an adjustment knob, which is exposed on the upper side of the shielding box. A test platform fixing plate is provided inside the shielding box. A scintillator placement plate is provided on the test platform fixing plate. A silicon photodiode and a scintillator for testing are provided on the scintillator placement plate. The scintillator is located above the silicon photodiode. A cutout is provided on the scintillator placement plate and directly above the scintillator. The silicon photodiode is electrically connected to the integrated operator through a wire. A movable guide rail is provided inside the shielding box, and the test platform is slidably connected to the movable guide rail.
[0005] As an improvement, a shielding door is provided in front of the shielding box, and the shielding door is located in front of the test platform fixing plate.
[0006] The integrated operating unit combines signal processing circuitry, a computer and software, and an X-ray controller to obtain scintillator afterglow test data.
[0007] The scintillator used for electrical connection testing of the silicon photodiode receives the afterglow generated by the scintillator and transmits the converted electrical signal to the signal processing circuit of the operating all-in-one machine.
[0008] The advantages of this invention are: simple and efficient testing operation, reducing product production cycle and manufacturer production costs; good safety, with shielding boxes and shielding doors shielding the X-rays generated during testing, preventing test personnel from receiving unnecessary radiation damage. Attached Figure Description
[0009] Figure 1This is an exploded structural diagram of the present invention.
[0010] Figure 2 This is a schematic diagram of the structure of this utility model.
[0011] Figure 3 This is a schematic diagram of the internal structure of this utility model.
[0012] Figure 4 This is a schematic diagram of the testing principle of this utility model.
[0013] As shown in the figure: 1.1, Operation integrated machine; 1.2, X-ray source; 1.3, shielding box; 1.3.1, test platform fixing plate; 1.3.2, shielding door; 1.3.3, moving guide rail; 1.3.4, scintillator placement plate; 2, silicon photodiode; 3, scintillator. Detailed Implementation
[0014] The present invention will now be described in further detail with reference to the accompanying drawings.
[0015] Combined with appendix Figure 1-4 A scintillator afterglow testing device includes an integrated operator unit 1.1, an X-ray source 1.2, and a shielding box 1.3. The shielding box 1.3 has a movable base with casters at its bottom and an operating platform with a keyboard and mouse on its upper front side. The shielding box 1.3 is used to shield the X-rays generated during testing, preventing unnecessary radiation damage to the testing personnel. The integrated operator unit 1.1 is fixed to the shielding box 1.3 by a mounting bracket. The X-ray source 1.2 is located inside the shielding box 1.3. The upper panel of the X-ray source 1.2 has an adjustment knob exposed on the upper side of the shielding box 1.3, used to adjust the output power of X-rays to meet the requirements of different types of scintillators 3. For afterglow testing, the shielding box 1.3 contains a test platform fixing plate 1.3.1. A scintillator placement plate 1.3.4 is mounted on the test platform fixing plate 1.3.1. A silicon photodiode 2 and a test scintillator 3 are mounted on the scintillator placement plate 1.3.4. The scintillator 3 is located above the silicon photodiode 2. The silicon photodiode 2 is electrically connected to the operating integrated machine 1.1 via wires. The shielding box 1.3 contains a movable guide rail 1.3.3. The test platform fixing plate 1.3.1 is slidably connected to the movable guide rail 1.3.3, allowing the test platform fixing plate 1.3.1 to slide up and down along the movable guide rail 1.3.3 to obtain the required test distance.
[0016] The shielding box 1.3 is equipped with a shielding door 1.3.2 in front of it. The shielding door 1.3.2 is located in front of the test platform fixing plate 1.3.1. The shielding door is used to close the shielding box 1.3 during the test to prevent radiation from spilling out.
[0017] The integrated operating unit 1.1 integrates signal processing circuitry, computer and software, and an X-ray controller to obtain afterglow test data of scintillator 3.
[0018] The silicon photodiode 2 is electrically connected to the scintillator 3 used for testing, receives the afterglow generated by the scintillator 3, and transmits the converted electrical signal to the signal processing circuit of the operating all-in-one machine 1.1.
[0019] In practical implementation, during testing, the shielding door is opened, the scintillator is placed on the test platform mounting plate and connected to the silicon photodiode, the shielding door is closed, and the position of the test platform mounting plate is adjusted by moving the guide rail to obtain the required test distance. The X-ray power is adjusted by the adjustment knob on the X-ray source, and the X-ray source acts on the scintillator through the scintillator placement plate. The silicon photodiode feeds the test results back to the operating all-in-one machine through the signal processing circuit, and the data is analyzed by the software.
[0020] The present invention and its embodiments have been described above. This description is not restrictive, and the accompanying drawings are only one embodiment of the present invention; the actual structure is not limited thereto. In conclusion, if those skilled in the art are inspired by this description and design similar structures and embodiments without departing from the inventive spirit of the present invention, such designs should fall within the protection scope of the present invention.
Claims
1. A scintillator afterglow testing device, characterized in that: The system includes an integrated operator unit (1.1), an X-ray source (1.2), and a shielding box (1.3). The integrated operator unit (1.1) is fixed to the shielding box (1.3) via a mounting bracket. The X-ray source (1.2) is located inside the shielding box (1.3). The upper panel of the X-ray source (1.2) has an adjustment knob, which is exposed on the upper side of the shielding box (1.3). The shielding box (1.3) contains a test platform fixing plate (1.3.1), and the test platform fixing plate (1.3)... .1) A scintillator placement plate (1.3.4) is provided on the top, and a silicon photodiode (2) and a scintillator (3) for testing are provided on the scintillator placement plate (1.3.4). The scintillator (3) is located above the silicon photodiode (2). The silicon photodiode (2) is electrically connected to the operating integrated machine (1.1) through a wire. A movable guide rail (1.3.3) is provided inside the shielding box (1.3). The test platform fixing plate (1.3.1) is slidably connected to the movable guide rail (1.3.3).
2. The scintillator afterglow testing device according to claim 1, characterized in that: The shielding box (1.3) is equipped with a shielding door (1.3.2) in front.
3. The scintillator afterglow testing device according to claim 1, characterized in that: The operating unit (1.1) integrates signal processing circuitry, computer and software, and X-ray controller.
4. The scintillator afterglow testing device according to claim 1, characterized in that: The silicon photodiode (2) is electrically connected to the scintillator (3) used for testing, receives the afterglow generated by the scintillator (3), and transmits the converted electrical signal to the signal processing circuit of the operating all-in-one machine (1.1).