Aging test board with double rows of contacts

Abstract

The utility model discloses an aging test board with double rows of contacts. The aging test board comprises a test board body; a plurality of contact groups are arranged on the test board body; and each contact group comprises a plurality of contacts which are arranged on the front surface and the back surface of the test board body in double rows, and the plurality of contacts are arranged in a staggered manner. According to the utility model, the double-row staggered contacts are designed, so that the single-row golden finger contact design of the general aging test board is changed, and the current-carrying capacity of a single contact is not reduced while the number of electrical channels is multiplied within the same width of a PCB (Printed Circuit Board) connector; under the condition that the width of the whole burn-in board is not changed, the number of contact channels is increased, and the test efficiency is improved.

Description

TECHNICAL FIELD

[0001] The utility model relates to the test field, concretely is a kind of aging test board with double-row contact. BACKGROUND

[0002] High-density memory (3DNAND FLASH, NOR flash, DDR LPDDR, SRAM, etc.) due to its ultra-large capacity, in electrical performance test, especially in aging test, usually needs very long test time, the general solution in the industry is to try to improve the same test density of aging test, and use high-density multi-channel aging test mode to share the test cost of each chip.

[0003] The aging test board of general design is limited by the structure design of aging furnace body, so the design width of BIB is generally a fixed value of 450MM.

[0004] The width of this limitation leads to the maximum width of "Size A" single connector being also limited. Because the width of contact is ensured to ensure the contact current-carrying capacity, the best golden finger contact spacing obtained by practice optimization in the industry is 2.54mm.

[0005] Obviously, designing 2.54mm spaced contacts within a certain width range results in a limited number of contacts for the maximum golden finger interface. Generally, the golden finger interface contact design of the 450mm wide aging test board is up to 300 channels of connection, and the number of channel connections determines the test efficiency. UTILITY MODEL CONTENT

[0006] The utility model aims to provide an aging test board with double-row contacts to solve the above problems existing in the prior art.

[0007] Technical scheme: an aging test board with double-row contacts, comprising:

[0008] A test board body is provided.

[0009] A plurality of contact groups are provided on the test board body.

[0010] Each contact group includes a plurality of contacts arranged in double rows on the front and back surfaces of the test board body, and the plurality of contacts are arranged alternately.

[0011] The utility model changes the single-row golden finger contact design of the general aging test board by designing double-row alternately designed contacts, and realizes the multiplication of the number of electrical channels while not reducing the current-carrying capacity of a single contact within the same PCB connector width.

[0012] Under the condition that the overall aging board width remains unchanged, the number of contact channels is increased, and the test efficiency is improved.

[0013] In further embodiments, the contact groups are designed in three groups, respectively GF1-GF3;

[0014] The contacts of each contact group arranged on the front face of the test board body are 90, including contacts A1-A90;

[0015] The contacts of each contact group arranged on the back face of the test board body are 90, including contacts B1-B90.

[0016] In further embodiments, the contacts A1, B1, A10-A11, B10-B11, A16-A17, B16-B17, A39-A46, B40-B46, A55-A56, B55-B56, A71-A76, B71-B77 of the contact group GF1 are GND contacts;

[0017] The contacts A2-A9, B2-B9, A18-A25, B18-B25 of the contact group GF1 are DR1-DR32 contacts in turn, the contacts A47-A50, B47-B50, A61-A66, B61-B67 are DR65-DR85 contacts in turn, and the contacts A67, B68 are DR129, DR130 contacts in turn;

[0018] The contacts A12-A15, B12-B15, A51-A54, B51-B54, A57-A60, B57 of the contact group GF1 are IO1-IO21 in turn, and the contacts B58-B60, A69 are IO65-IO68 contacts in turn;

[0019] The contacts A27-A37, B27-B36 of the contact group GF1 are DPS1 contacts;

[0020] The contacts A80-A90, B79-B90 of the contact group GF1 are DPS2 contacts;

[0021] The contacts B37, B39 of the contact group GF1 are DPS1S_P and DPS1S_N contacts in turn;

[0022] The contacts A77, A79 of the contact group GF1 are DPS2S_N and DPS2S_P contacts in turn;

[0023] The contacts A68, A70 of the contact group GF1 are HV1F contacts;

[0024] The contacts B69, B70 of the contact group GF1 are HV1S_N and HV1S_P contacts in turn.

[0025] In further embodiments, the contacts A1-A11, B1-B10 of the contact group GF2 are DPS3 contacts;

[0026] Contacts A13-A20, B14-B19, A24-A25, B24-B25, A38-A39, B38-B39, A44-A45, B44-B45, A50-A51, B50-B51, B54, A64-A65, B64-B65, A72-A76, B72-B77 of the contact group GF2 are GND contacts;

[0027] Contacts A21-A23, B21-B23, A26-A29, B26-B29, B68-B71, A67, A69-71 of the contact group GF2 are DR86-DR107 contacts in this order, contacts A30-A37, B30-B37, A56-A63, B56-B63 are DR33-DR64 contacts in this order, and contact B20 is a DR131 contact;

[0028] Contacts A40-A43, B40-B43, A46-A49, B46-B49, A52-A55, B52-B53, B55 of the contact group GF2 are IO22-IO44 contacts in this order;

[0029] Contacts A80-A90, B79-B90 of the contact group GF2 are DPS4 contacts;

[0030] Contacts B11, B13 of the contact group GF2 are DPS3S_P, DPS3S_N contacts in this order;

[0031] Contacts A66, A68 of the contact group GF2 are HV2F contacts;

[0032] Contacts B66, B67 of the contact group GF2 are HV2S_P, HV2S_N contacts in this order;

[0033] Contacts A77, A79 of the contact group GF2 are DPS4S_N, DPS4S_P contacts in this order.

[0034] In a further embodiment, contacts A1-A11, B1-B10 of the contact group GF3 are DPS5 contacts;

[0035] Contacts A13-A20, B14-B20, A29-A30, B29-B30, A35-A36, B35-B36, A41-A42, B41-B42, A50-A51, B50-B51, A83-A89, B84-B90 of the contact group GF3 are GND contacts;

[0036] Contacts A21-A25, B21-B25, A26-A28, B26-B28, A47-A49, B47-B49 of the contact group GF3 are DR108-DR132 contacts in this order;

[0037] Contacts A31-A34, B31-B34, A37-A40, B37-B40, A43-A46, B43-B46 of the contact group GF3 are IO45-IO72 contacts in turn;

[0038] Contacts A52-A56, B52-B57 of the contact group GF3 are UIO1-UIO11 contacts in turn;

[0039] Contacts A58-A69, B58-B69 of the contact group GF3 are BID1-BID24 contacts in turn;

[0040] Contacts A71-A81, B71-B80 of the contact group GF3 are DPS6 contacts;

[0041] Contacts B11, B13 of the contact group GF3 are DPS5S_P, DPS5S_N contacts in turn;

[0042] Contact A57 of the contact group GF3 is a BID_COM contact;

[0043] Contacts B81, B83 of the contact group GF3 are DPS6S_P, DPS6S_N contacts in turn;

[0044] Contact A90 of the contact group GF3 is a GNDINSERT contact.

[0045] Beneficial effects: the utility model discloses a kind of with double-row contact of aging test board, the utility model discloses a contact of double-row interlaced design is designed, change the single-row gold finger contact design of general aging test board, in the same PCB connector width, realize the electrical channel number multiplication while still can not reduce the current-carrying capacity of single contact;

[0046] Under the condition that overall aging board width is invariable, increase contact channel number, improve test efficiency. BRIEF DESCRIPTION OF DRAWINGS

[0047] Figure 1 It is the structural schematic diagram of the utility model.

[0048] Figure 2 It is the contact group GF1 contact electrical signal schematic diagram of the utility model.

[0049] Figure 3 It is the contact group GF2 contact electrical signal schematic diagram of the utility model.

[0050] Figure 4 It is the contact group GF3 contact electrical signal schematic diagram of the utility model.

[0051] Figure 5 It is the size schematic diagram of each contact group and test board body of the utility model.

[0052] Reference signs are:

[0053] 1, test board body; 2, contact group GF1; 3, contact group GF2; 4, contact group GF3; DETAILED DESCRIPTION

[0054] The application relates to an aging test board with double-row contacts, which is explained in detail through specific embodiments.

[0055] An aging test board with double-row contacts, as shown in the accompanying drawings, comprises: Figure 1

[0056] Test board body 1;

[0057] A plurality of contact groups are arranged on the test board body 1.

[0058] Each contact group comprises a plurality of contacts arranged in double rows on the front and back surfaces of the test board body 1, and the plurality of contacts are arranged alternately.

[0059] The "double-row double-sided gold finger" design of the application utilizes the 1.27mm staggered design of the upper and lower double-row contacts, so that each row of gold fingers has the original 2.54mm spacing and the corresponding copper foil width, which is the basis for ensuring that the current-carrying capacity and contact characteristics of a single contact remain unchanged.

[0060] After the overall PCB is inserted into the connector, each row of gold fingers will be in contact with the corresponding contact to realize electrical connection. In this way, in the same PCB connector width, the number of electrical channels is multiplied while the current-carrying capacity of a single contact is not reduced.

[0061] The application changes the single-row gold finger contact design of the general aging test board by designing the double-row staggered contacts, and in the same PCB connector width, the number of electrical channels is multiplied while the current-carrying capacity of a single contact is not reduced.

[0062] In the case of unchanged overall aging board width, the number of contact channels is increased, and the number of test interface contacts is multiplied by 600 channels at most, improving the test efficiency.

[0063] The application sets the gold fingers in double-row staggered contact, inserts the overall PCB into the connector, and makes each row of gold finger contacts in contact with the corresponding contact, thereby obtaining electrical connection.

[0064] The application matches the electrical signal contact pins with the mechanical positions, optimizes the matching of the electrical signal definition and the mechanical positions of the high-density memory, and obtains the double-row double-sided gold finger test connection.

[0065] ​The mechanical structure design of the gold finger contact of the application can meet the general requirements, is suitable for the aging test of memory products, including but not limited to 3D NAND FLASH, NOR flash, DDR LPDDR, SRAM and the like, and can realize the optimized matching of electrical signal definition and mechanical position, isolate power supply and signal, reduce the interference between signals and enhance the system safety.

[0066] The application takes 540 contacts as an example, and the contact groups are designed into three groups, which are contact groups GF12-GF3 respectively.

[0067] The contacts arranged on the front of the test board body 1 are 90, including contacts A1-A90.

[0068] The contacts arranged on the back of the test board body 1 are 90, including contacts B1-B90.

[0069] The lower row of contacts is single, and the upper row of contacts is double.

[0070] Taking the front contacts as an example, A1 is the first contact in the lower row, A2 is the first contact in the upper row, A3 is the second contact in the lower row, A3 is the second contact in the upper row, and so on, to obtain all the contacts.

[0071] As shown in the accompanying Figure 2 The contacts A1, B1, A10-A11, B10-B11, A16-A17, B16-B17, A39-A46, B40-B46, A55-A56, B55-B56, A71-A76, B71-B77 of the contact group GF12 are GND contacts.

[0072] The contacts A2-A9, B2-B9, A18-A25, B18-B25 of the contact group GF12 are DR1-DR32 contacts in turn, the contacts A47-A50, B47-B50, A61-A66, B61-B67 are DR65-DR85 contacts in turn, and the contacts A67, B68 are DR129, DR130 contacts in turn.

[0073] The contacts A12-A15, B12-B15, A51-A54, B51-B54, A57-A60, B57 of the contact group GF12 are IO1-IO21 in turn, and the contacts B58-B60, A69 are IO65-IO68 contacts in turn.

[0074] The contacts A27-A37, B27-B36 of the contact group GF12 are DPS1 contacts.

[0075] The contacts A80-A90, B79-B90 of the contact group GF12 are DPS2 contacts.

[0076] Contacts B37, B39 of the contact group GF12 are in turn DPS1S_P and DPS1S_N contacts;

[0077] Contacts A77, A79 of the contact group GF12 are in turn DPS2S_N and DPS2S_P contacts;

[0078] Contacts A68, A70 of the contact group GF12 are HV1F contacts;

[0079] Contacts B69, B70 of the contact group GF12 are in turn HV1S_N and HV1S_P contacts.

[0080] As shown in the attached Figure 3 diagram, contacts A1-A11, B1-B10 of the contact group GF23 are DPS3 contacts;

[0081] Contacts A13-A20, B14-B19, A24-A25, B24-B25, A38-A39, B38-B39, A44-A45, B44-B45, A50-A51, B50-B51, B54, A64-A65, B64-B65, A72-A76, B72-B77 of the contact group GF23 are GND contacts;

[0082] Contacts A21-A23, B21-B23, A26-A29, B26-B29, B68-B71, A67, A69-71 of the contact group GF23 are in turn DR86-DR107 contacts, contacts A30-A37, B30-B37, A56-A63, B56-B63 are in turn DR33-DR64 contacts, contact B20 is DR131 contact;

[0083] Contacts A40-A43, B40-B43, A46-A49, B46-B49, A52-A55, B52-B53, B55 of the contact group GF23 are in turn IO22-IO44 contacts;

[0084] Contacts A80-A90, B79-B90 of the contact group GF23 are DPS4 contacts;

[0085] Contacts B11, B13 of the contact group GF23 are in turn DPS3S_P, DPS3S_N contacts;

[0086] Contacts A66, A68 of the contact group GF23 are HV2F contacts;

[0087] Contacts B66, B67 of the contact group GF23 are in turn HV2S_P, HV2S_N contacts;

[0088] Contacts A77 and A79 of contact group GF23 are DPS4S_N and DPS4S_P contacts, respectively.

[0089] As attached Figure 4 As shown, contacts A1-A11 and B1-B10 of the contact group GF34 are DPS5 contacts;

[0090] Contacts A13-A20, B14-B20, A29-A30, B29-B30, A35-A36, B35-B36, A41-A42, B41-B42, A50-A51, B50-B51, A83-A89, and B84-B90 of contact group GF34 are GND contacts;

[0091] The contacts A21-A25, B21-B25, A26-A28, B26-B28, A47-A49, and B47-B49 of the GF34 contact group are DR108-DR132 contacts respectively;

[0092] The contacts of the GF34 contact group A31-A34, B31-B34, A37-A40, B37-B40, A43-A46, and B43-B46 are IO45-IO72 contacts respectively;

[0093] The contacts A52-A56 and B52-B57 of the GF34 contact group are UIO1-UIO11 contacts respectively;

[0094] Contacts A58-A69 and B58-B69 of contact group GF34 are BID1-BID24 contacts respectively;

[0095] Contacts A71-A81 and B71-B80 of contact group GF34 are DPS6 contacts;

[0096] Contacts B11 and B13 of the GF34 contact group are DPS5S_P and DPS5S_N contacts, respectively.

[0097] Contact A57 of contact group GF34 is a BID_COM contact;

[0098] Contacts B81 and B83 of the GF34 contact group are DPS6S_P and DPS6S_N contacts, respectively.

[0099] Contact A90 of contact group GF34 is a GNDINSERT contact.

[0100] As attached Figure 5 As shown, the length of contact group GF12-GF3 is 117.88mm, the width is 17.00mm, and the spacing between each pair of adjacent contact groups is 20.12mm;

[0101] The total length of the test board body 1 is 440mm, and the distance between the contact groups GF12, GF3 close to the two ends of the test board body 1 and the two ends of the test board body 1 is 23.06mm.

[0102] Working principle: during testing, the aging test board is inserted into the connector, each row of gold finger contacts is in contact with the corresponding contact, thereby obtaining electrical connection, and the test efficiency is higher through the design of more contacts.

[0103] The preferred embodiments of the utility model are described in detail above in combination with the drawings, but the utility model is not limited to the specific details in the above embodiments, and various equivalent transformations can be made to the technical solutions of the utility model within the technical concept range of the utility model, and these equivalent transformations all belong to the protection range of the utility model.

Claims

1. An aging test board with dual rows of contacts, comprising: Test board (1); The test board (1) is characterized by having multiple sets of contact groups on it; Each contact group includes multiple contacts arranged in two rows on the front and back of the test board (1), and the multiple contacts are arranged alternately.

2. An aging test board with double rows of contacts according to claim 1, characterized in that: The contact group is designed in three groups, namely contact group GF1(2)-GF3; Each group of contacts has 90 contacts on the front of the test board (1), including contacts A1-A90; Each set of contacts has 90 contacts on the reverse side of the test board (1), including contacts B1-B90.

3. An aging test board with double rows of contacts according to claim 2, characterized in that: The contacts A1, B1, A10-A11, B10-B11, A16-A17, B16-B17, A39-A46, B40-B46, A55-A56, B55-B56, A71-A76, and B71-B77 of the contact group GF1(2) are GND contacts; The contacts A2-A9, B2-B9, A18-A25, and B18-B25 of the contact group GF1(2) are DR1-DR32 contacts in sequence; the contacts A47-A50, B47-B50, A61-A66, and B61-B67 are DR65-DR85 contacts in sequence; and the contacts A67 and B68 are DR129 and DR130 contacts in sequence. The contacts A12-A15, B12-B15, A51-A54, B51-B54, A57-A60, and B57 of the contact group GF1(2) are IO1-IO21 in sequence, and the contacts B58-B60 and A69 are IO65-IO68 in sequence. Contacts A27-A37 and B27-B36 of contact group GF1(2) are DPS1 contacts; Contacts A80-A90 and B79-B90 of contact group GF1(2) are DPS2 contacts; Contacts B37 and B39 of contact group GF1(2) are DPS1S_P and DPS1S_N contacts respectively; Contacts A77 and A79 of contact group GF1(2) are DPS2S_N and DPS2S_P contacts respectively; Contacts A68 and A70 of contact group GF1(2) are HV1F contacts; Contacts B69 and B70 of contact group GF1(2) are HV1S_N and HV1S_P contacts, respectively.

4. An aging test board with double rows of contacts according to claim 2, characterized in that: The contacts A1-A11 and B1-B10 of the contact group GF2(3) are DPS3 contacts; The contacts A13-A20, B14-B19, A24-A25, B24-B25, A38-A39, B38-B39, A44-A45, B44-B45, A50-A51, B50-B51, B54, A64-A65, B64-B65, A72-A76, and B72-B77 of contact group GF2(3) are GND contacts; The contacts A21-A23, B21-B23, A26-A29, B26-B29, B68-B71, A67, and A69-71 of contact group GF2(3) are DR86-DR107 contacts in sequence; the contacts A30-A37, B30-B37, A56-A63, and B56-B63 are DR33-DR64 contacts in sequence; and the contact B20 is DR131 contact. The contacts A40-A43, B40-B43, A46-A49, B46-B49, A52-A55, B52-B53, and B55 of the contact group GF2(3) are IO22-IO44 contacts respectively; Contacts A80-A90 and B79-B90 of contact group GF2(3) are DPS4 contacts; Contacts B11 and B13 of contact group GF2(3) are DPS3S_P and DPS3S_N contacts respectively; Contacts A66 and A68 of contact group GF2(3) are HV2F contacts; Contacts B66 and B67 of contact group GF2(3) are HV2S_P and HV2S_N contacts, respectively; Contacts A77 and A79 of contact group GF2(3) are DPS4S_N and DPS4S_P contacts, respectively.

5. An aging test board with double rows of contacts according to claim 2, characterized in that: The contacts A1-A11 and B1-B10 of the contact group GF3(4) are DPS5 contacts; The contacts A13-A20, B14-B20, A29-A30, B29-B30, A35-A36, B35-B36, A41-A42, B41-B42, A50-A51, B50-B51, A83-A89, and B84-B90 of contact group GF3(4) are GND contacts; The contacts A21-A25, B21-B25, A26-A28, B26-B28, A47-A49, and B47-B49 of the contact group GF3(4) are DR108-DR132 contacts in sequence; The contacts A31-A34, B31-B34, A37-A40, B37-B40, A43-A46, and B43-B46 of the contact group GF3(4) are IO45-IO72 contacts respectively; The contacts A52-A56 and B52-B57 of the contact group GF3(4) are UIO1-UIO11 contacts respectively; The contacts A58-A69 and B58-B69 of the contact group GF3(4) are BID1-BID24 contacts respectively; Contacts A71-A81 and B71-B80 of contact group GF3(4) are DPS6 contacts; Contacts B11 and B13 of contact group GF3(4) are DPS5S_P and DPS5S_N contacts respectively; Contact A57 of contact group GF3(4) is a BID_COM contact; Contacts B81 and B83 of contact group GF3(4) are DPS6S_P and DPS6S_N contacts respectively; The contact A90 of contact group GF3(4) is a GNDINSERT contact.

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