High-temperature chip test fixture based on high-temperature probe card

Abstract

The utility model provides a high-temperature chip test fixture based on a high-temperature probe card, which relates to the technical field of chip test fixtures and comprises a base, a slot is arranged at the top of the base, and a storage seat is slidably mounted in the slot. When the storage base is replaced, a worker pulls the two pulling plates, the clamping blocks leave the clamping grooves, the second springs are compressed, meanwhile, the pulling plates make contact with the inclined faces of the ejecting blocks, the pulling plates push the ejecting blocks to move, the ejecting blocks drive the connecting plates to move, the first springs are compressed, and when the pulling plates do not make contact with the inclined faces of the ejecting blocks any more, the ejecting blocks reset under the elastic force effect of the first springs; at the moment, a pulling plate is blocked by an ejector block, a clamping block is reserved in a limiting groove, then a worker can pull out the storage base and replace the storage base with a new storage base, finally, the worker pulls a connecting plate, the connecting plate drives the ejector block to move, and when the pulling plate does not make contact with the ejector block any more, the clamping block enters a clamping groove under the elastic force effect of a second spring, and the storage base is fixed.

Description

TECHNICAL FIELD

[0001] The utility model relates to chip test fixture technical field especially relates to a high temperature chip test fixture based on high temperature probe card. BACKGROUND

[0002] The probe card is a test interface instrument mainly for testing the bare chip and plays a vital role in the semiconductor chip manufacturing process. The main function of the probe card is to accurately transmit the electrical signal of the tester to the solder pad or bump of the chip during the chip testing process, and to return the signal feedback by the chip to the tester, so as to test and analyze the various parameters of the chip, and to determine whether the chip meets the design requirements and quality standards.

[0003] In the prior art, the chip needs to be placed in the fixture during testing. The traditional part of the fixture is provided with a groove matched with the size of the chip. The chip can be placed in the groove to prevent the chip from shaking and facilitate positioning. However, the shape and size of the groove are fixed. Therefore, it is difficult to place other specifications and shapes of chips, which affects the measurement. SUMMARY

[0004] The utility model aims at solving the problem that the shape and size of the groove of the fixture in the prior art are fixed, so it is difficult to place other specifications and shapes of chips, which affects the measurement. A high-temperature chip test fixture based on a high-temperature probe card is proposed.

[0005] In order to achieve the above-mentioned purpose, the utility model adopts the following technical scheme: a high-temperature chip test fixture based on a high-temperature probe card, comprising a base, a slot is formed in the top of the base, a storage seat is slidably installed in the slot, a clamping groove is formed in the outer two ends of the storage seat, a limiting groove is formed in the both sides of the slot, a second spring is fixedly installed on the inner wall of the limiting groove, a clamping block is fixedly installed at one end of the second spring, a connecting rod is fixedly installed at the end of the clamping block close to the second spring, a pull plate is fixedly installed at one end of the connecting rod penetrating through the base, an L-shaped plate is fixedly installed on the outer wall of the base, two first springs are fixedly installed on the inner wall of the L-shaped plate, a connecting plate is fixedly installed at one end of the two first springs, two top blocks are symmetrically installed on the outer wall of the connecting plate, a moving plate is fixedly installed at the end of the connecting plate close to the first spring, and the moving plate is slidably inserted into the L-shaped plate at one end.

[0006] Preferably, an L-shaped bracket is fixedly installed on the outer wall of the base, a threaded hole is formed in the top of the L-shaped bracket, a first threaded rod is threadedly connected in the threaded hole, a handle is fixedly installed on the top of the first threaded rod, and a lifting plate is movably connected to the bottom of the first threaded rod.

[0007] Preferably, the lifting plate top is fixedly provided with a limiting plate, and the limiting plate top is slidably connected with the L-shaped frame.

[0008] Preferably, the lifting plate top is provided with two openings, the openings are slidably provided with storage plates, the storage plate outer wall is provided with a through hole, and the two storage plate bottoms are fixedly provided with probe card bodies.

[0009] Preferably, the lifting plate top is fixedly provided with two fixed plates, the second threaded rod is rotatably arranged between the two fixed plates, one end of the second threaded rod penetrates through the fixed plate and is fixedly provided with a rotating shaft, the second threaded rod outer wall is threadedly connected with two sliding plates, and the opposite sides of the two sliding plates are fixedly provided with connecting blocks.

[0010] Preferably, the opposite sides of the two fixed plates are fixedly provided with limiting rods, and the limiting rods penetrate through the two sliding plates and are slidably connected with the two sliding plates.

[0011] Preferably, the second threaded rod is provided with two threads with opposite textures, and the second threaded rod is connected with the two sliding plates through the two threads with opposite textures.

[0012] Preferably, the base top is fixedly provided with a protective frame, and the protective frame inner wall is attached to the lifting plate outer wall.

[0013] Compared with the prior art, the utility model has the advantages and positive effects that,

[0014] 1、the utility model discloses, when replacing the storage seat, the staff pulls two pull plates, and the pull plate drives the clamping block to leave the clamping groove through the connecting rod, and the second spring is compressed, and at the same time, the pull plate contacts the inclined surface of the top block, and the pull plate drives the top block to move, and the top block drives the connecting plate to move, and the first spring is compressed, when the pull plate no longer contacts the inclined surface of the top block, the top block resets under the elastic force of the first spring, the pull plate is hindered by the top block at this time, and the clamping block remains in the limiting groove, then the staff can draw out the storage seat, replace the new storage seat, finally the staff pulls the connecting plate, and the connecting plate drives the top block to move, when the pull plate no longer contacts the top block, the clamping block enters the clamping groove under the elastic force of the second spring, and the storage seat is fixed, so that the efficiency of replacing the storage seat is improved.

[0015] 2、the utility model discloses, when replacing the probe card body, the staff rotates the rotating shaft, and the second threaded rod rotates, and the two sliding plates are away from each other, and the two connecting blocks respectively leave the two through holes, at this time, the storage plate can be drawn out, and the probe card body is removed, then the new probe card body is replaced, the storage plate is inserted into the opening, the connecting block is entered into the through hole by reversely rotating the rotating shaft, and the storage plate is fixed, so that different probe card bodies can be replaced according to different chips. DRAWINGS

[0016] Figure 1 Fig. 1 is a perspective view of the high-temperature chip test fixture based on the high-temperature probe card according to the present application;

[0017] Figure 2 Fig. 2 is another perspective view of the high-temperature chip test fixture based on the high-temperature probe card according to the present application;

[0018] Figure 3 Fig. 3 is a sectional view of the base of the high-temperature chip test fixture based on the high-temperature probe card according to the present application;

[0019] Figure 4 Fig. 4 is a sectional view of the lifting plate of the high-temperature chip test fixture based on the high-temperature probe card according to the present application.

[0020] Legend: 1, base; 2, protective frame; 3, L-shaped frame; 4, threaded hole; 5, first threaded rod; 6, handle; 7, lifting plate; 8, limiting plate; 9, L-shaped plate; 10, first spring; 11, connecting plate; 12, top block; 13, moving plate; 14, fixed plate; 15, second threaded rod; 16, sliding plate; 17, rotating shaft; 18, limiting rod; 19, slot; 20, storage seat; 21, clamping groove; 22, limiting groove; 23, second spring; 24, clamping block; 25, connecting rod; 26, pull plate; 27, opening; 28, storage plate; 29, through hole; 30, connecting block; 31, probe card body. DETAILED DESCRIPTION

[0021] In order to more clearly understand the above-mentioned purposes, features and advantages of the present application, the present application will be further described below in conjunction with the drawings and embodiments. It should be noted that the embodiments of the present application and the features in the embodiments can be combined with each other without conflict.

[0022] In the following description, many specific details are set forth in order to provide a thorough understanding of the present application, but the present application can also be implemented in other ways different from those described herein, therefore, the present application is not limited to the specific embodiments disclosed in the following description.

[0023] Embodiment 1, as Figures 1-4As shown, the utility model provides a kind of high temperature chip test fixture based on high temperature probe card, including base 1, base 1 top is equipped with slot 19, storage seat 20 is slidably installed in slot 19 inside, both ends of storage seat 20 outside are equipped with clamping groove 21, both sides of slot 19 inside are equipped with limiting slot 22, second spring 23 is fixedly installed in the inner wall of limiting slot 22, one end of second spring 23 is fixedly installed with clamping block 24, one end of clamping block 24 close to second spring 23 is fixedly installed with connecting rod 25, one end of connecting rod 25 penetrates base 1 and is fixedly installed with pull plate 26, L-shaped plate 9 is fixedly installed on the outer wall of base 1, two first springs 10 are fixedly installed on the inner wall of L-shaped plate 9, one end of two first springs 10 is fixedly installed with connecting plate 11, two top blocks 12 are symmetrically installed on the outer wall of connecting plate 11, one end of connecting plate 11 close to first spring 10 is fixedly installed with moving plate 13, one end of moving plate 13 is slidably inserted with L-shaped plate 9.

[0024] Its whole embodiment 1 reaches the effect that when replacing storage seat 20, staff pull two pull plates 26, pull plate 26 drives clamping block 24 to leave clamping groove 21 by connecting rod 25, second spring 23 is compressed, at the same time, pull plate 26 is contacted with the inclined surface of top block 12, pull plate 26 pushes top block 12 to move, top block 12 drives connecting plate 11 to move, first spring 10 is compressed, when pull plate 26 is no longer contacted with the inclined surface of top block 12, top block 12 is reset under the elastic force of first spring 10, at this time, pull plate 26 is hindered by top block 12, clamping block 24 remains in limiting slot 22, then staff can pull out storage seat 20, replace new storage seat 20, finally staff pull connecting plate 11, connecting plate 11 drives top block 12 to move, when pull plate 26 is no longer contacted with top block 12, clamping block 24 enters clamping groove 21 under the elastic force of second spring 23, storage seat 20 is fixed, improve the efficiency of replacing storage seat 20.

[0025] Embodiment 2, as Figures 1-4 Further, L-shaped frame 3 is fixedly installed on the outer wall of base 1, threaded hole 4 is penetrated on the top of L-shaped frame 3, first threaded rod 5 is screw-connected in threaded hole 4, handle 6 is fixedly installed on the top of first threaded rod 5, lifting plate 7 is movably connected to the bottom of first threaded rod 5.

[0026] Further, limiting plate 8 is fixedly installed on the top of lifting plate 7, limiting plate 8 is slidably inserted with L-shaped frame 3 on the top.

[0027] Further, two openings 27 are penetrated on the top of lifting plate 7, storage plate 28 is slidably installed in opening 27, through hole 29 is penetrated on the outer wall of storage plate 28, probe card body 31 is fixedly installed on the bottom of two storage plates 28.

[0028] Further, the top of the lifting plate 7 is fixedly provided with two fixed plates 14, the second threaded rod 15 is rotatably arranged between the two fixed plates 14, one end of the second threaded rod 15 penetrates through the fixed plate 14 and is fixedly provided with the rotating shaft 17, the outer wall of the second threaded rod 15 is threadedly connected with two sliding plates 16, and the opposite side of each of the two sliding plates 16 is fixedly provided with a connecting block 30.

[0029] Further, the opposite side of each of the two fixed plates 14 is fixedly provided with a limiting rod 18, the limiting rod 18 penetrates through the two sliding plates 16 and is slidably connected with the two sliding plates 16.

[0030] Further, the second threaded rod 15 is provided with two threads with opposite textures, and the second threaded rod 15 is connected with the two sliding plates 16 through the two threads with opposite textures.

[0031] Further, the top of the base 1 is fixedly provided with the protective frame 2, and the inner wall of the protective frame 2 is attached to the outer wall of the lifting plate 7. The sealing property is improved.

[0032] The effect achieved by the whole embodiment 2 is that when the probe card body 31 is replaced, the staff rotates the rotating shaft 17, the second threaded rod 15 rotates, the two sliding plates 16 move away from each other, the two connecting blocks 30 respectively leave the two penetration openings 29, at this time, the storage plate 28 can be taken out, the probe card body 31 is removed, then a new probe card body 31 is replaced, the storage plate 28 is inserted into the opening 27, the rotating shaft 17 is reversely rotated, the connecting block 30 enters the penetration opening 29, and the storage plate 28 is fixed. Thus, different probe card bodies 31 can be replaced according to different chips.

[0033] Working principle: when using, the worker puts the chip into the storage seat 20, then rotates the handle 6, the first threaded rod 5 descends along the threaded hole 4, and then drives the lifting plate 7 and the probe card body 31 to descend, the lifting plate 7 enters the protection frame 2, the probe of the probe card body 31 contacts the pin or test point of the chip closely, and then the test can be started. When replacing the storage seat 20, the worker pulls the two pull plates 26, the pull plate 26 drives the clamping block 24 to leave the clamping groove 21 through the connecting rod 25, the second spring 23 is compressed, at the same time, the pull plate 26 is in contact with the inclined surface of the top block 12, the pull plate 26 pushes the top block 12 to move, the top block 12 drives the connecting plate 11 to move, the first spring 10 is compressed, when the pull plate 26 is no longer in contact with the inclined surface of the top block 12, the top block 12 is reset under the elastic force of the first spring 10, at this time the pull plate 26 is hindered by the top block 12, the clamping block 24 is left in the limiting groove 22, then the worker can pull out the storage seat 20 and replace the new storage seat 20, finally the worker pulls the connecting plate 11, the connecting plate 11 drives the top block 12 to move, when the pull plate 26 is no longer in contact with the top block 12, the clamping block 24 enters the clamping groove 21 under the elastic force of the second spring 23, the storage seat 20 is fixed, the efficiency of replacing the storage seat 20 is improved. When replacing the probe card body 31, the worker rotates the rotating shaft 17, the second threaded rod 15 rotates, the two sliding plates 16 are away from each other, the two connecting blocks 30 leave the two through holes 29 respectively, at this time the storage plate 28 can be pulled out, the probe card body 31 is removed, then the new probe card body 31 is replaced, the storage plate 28 is inserted into the opening 27, the rotating shaft 17 is rotated in the opposite direction, the connecting block 30 enters the through hole 29, and the storage plate 28 is fixed, so different probe card bodies 31 can be replaced according to different chips.

[0034] The above is only a preferred embodiment of the present application, and does not limit the present application in other forms. Any skilled person in the art can modify or change the above disclosed technology content to equivalent embodiments applied to other fields, but any simple modification, equivalent change and modification of the above embodiments according to the technical essence of the present application still belongs to the protection scope of the technical scheme of the present application.

Claims

1. A high temperature probe card based high temperature chip test fixture comprising a base (1) characterised in that: The base (1) top is provided with a slot (19), the slot (19) inside sliding installation has a storage seat (20), the storage seat (20) outside both ends are provided with a clamping groove (21), the slot (19) inside both sides are provided with a limiting slot (22), the limiting slot (22) inner wall is fixedly installed with second spring (23), the second spring (23) one end is fixedly installed with a clamping block (24), the clamping block (24) is close to the one end of the second spring (23) and is fixedly installed with a connecting rod (25), the connecting rod (25) one end penetrates the base (1) and is fixedly installed with a pull plate (26), the base (1) outer wall is fixedly installed with L type board (9), the L type board (9) inner wall is fixedly installed with two first spring (10), two first spring (10) one end is fixedly installed with a connecting plate (11), the connecting plate (11) outer wall is symmetrically installed with two top block (12), the connecting plate (11) is close to the one end of the first spring (10) and is fixedly installed with a moving plate (13), the moving plate (13) one end and L type board (9) sliding insertion.

2. The high temperature probe card based high temperature chip test fixture of claim 1, wherein: The base (1) outer wall is fixedly installed with L type frame (3), the L type frame (3) top is provided with a threaded hole (4), the threaded hole (4) is internally and threadedly connected with a first threaded rod (5), the first threaded rod (5) top is fixedly installed with a handle (6), the first threaded rod (5) bottom is movably connected with a lifting plate (7).

3. A high temperature probe card based high temperature chip test fixture according to claim 2, wherein: The lifting plate (7) top is fixedly installed with a limiting plate (8), and the limiting plate (8) top is slidably inserted with the L type frame (3).

4. The high temperature probe card based high temperature chip test fixture of claim 2, wherein: The lifting plate (7) top is provided with two openings (27), and the opening (27) is internally and slidably installed with a storage plate (28), and the storage plate (28) outer wall is provided with a through hole (29), and the two storage plates (28) bottom is fixedly installed with a probe card body (31).

5. The high temperature probe card based high temperature chip test fixture of claim 2, wherein: The lifting plate (7) top is fixedly installed with two fixed plates (14), and the second threaded rod (15) is rotatably installed between the two fixed plates (14), and the second threaded rod (15) one end penetrates the fixed plate (14) and is fixedly installed with a rotating shaft (17), and the second threaded rod (15) outer wall is threadedly connected with two sliding plates (16), and the two sliding plates (16) opposite sides are fixedly installed with a connecting block (30).

6. A high temperature probe card based high temperature chip test fixture according to claim 5, wherein: The two fixed plates (14) opposite sides are fixedly installed with a limiting rod (18), and the limiting rod (18) penetrates the two sliding plates (16) and is slidably connected with the two sliding plates (16).

7. A high temperature probe card based high temperature chip test fixture as claimed in claim 5, wherein: The second threaded rod (15) is provided with two threads with opposite textures, and the second threaded rod (15) is connected with the two sliding plates (16) through the two threads with opposite textures.

8. The high temperature probe card based high temperature chip test fixture of claim 1, wherein: The base (1) top is fixedly installed with a protective frame (2), and the protective frame (2) inner wall is fitted with the lifting plate (7) outer wall.

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