Probe equipment positioning cover plate structure

Abstract

The utility model relates to the related technical field of probe equipment, in particular to a probe equipment positioning cover plate structure which comprises a cabinet body, and a positioning mechanism is arranged above a workbench. According to the probe equipment positioning cover plate structure, during testing, a hydraulic cylinder is started to enable a hydraulic rod to push a connecting plate, a rack plate in a limiting seat on one side of the connecting plate is driven to horizontally move, a meshed gear and a connected threaded rod are made to rotate, a sliding block in threaded connection linearly moves due to the fact that a bottom limiting block is clamped in a base limiting groove, and the sliding rod slides in a positioning table sliding groove; the clamping head is driven to accurately and stably clamp the first cover plate and the second cover plate, a microchip and other elements are placed in the cover plate clamping grooves, at the moment, the telescopic component above the clamping grooves is in an initial state, during detection, a probe firstly touches the positioning plate and is pressed downwards to drive the telescopic rod to slide in the telescopic pipe, the telescopic spring is compressed to buffer impact force, and the elements and the probe are prevented from being damaged; and the probe can accurately pass through and contact with a component pin or a test point, so that the position deviation is avoided.

Description

Technical Field

[0001] This utility model relates to the field of probe equipment technology, and in particular to a positioning cover structure for a probe equipment. Background Technology

[0002] A probe device is a tool used to detect, measure, or contact a target object to obtain relevant information. Structurally, it typically contains a slender probe section, usually made of conductive materials such as metals, possessing good conductivity and mechanical strength, such as tungsten needles or gold needles. Its tip is often very fine, allowing precise contact with tiny target areas, such as tiny pins on a chip or intricate lines on a circuit board. In some complex probe devices, the probe may be mounted on a high-precision mechanical device that can precisely control the probe's position, direction of movement, and distance of movement, ensuring accurate contact between the probe and the target object. Functionally, probe devices are primarily used for electrical testing. In the electronics industry, they can be used to test electronic components, integrated circuits, etc. The electrical performance of devices, such as during chip testing, involves probes contacting chip pins to input electrical signals and simultaneously measuring the chip's output signals, thereby determining whether the chip is functioning correctly and whether its performance indicators meet requirements. Furthermore, probe devices can be used in materials science research. For example, when studying the electrical properties of materials, probes can contact the material surface to measure electrical parameters such as resistance and capacitance to understand the material's conductivity and dielectric properties. Besides electrical detection, probe devices are also used in high-precision machining or medical testing. However, in these cases, probes may be used to detect non-electrical properties such as the shape, size, or tissue structure of objects. Therefore, a probe device positioning cover structure is particularly needed for accurate detection results.

[0003] However, existing probe devices, especially when testing microchips, require precise contact between the probe and the chip's pins or specific test points. Some probe devices lack a positioning cover structure, which may cause the probe to fail to accurately contact the target point due to slight positional deviations, thus affecting the test results. Utility Model Content

[0004] The purpose of this utility model is to provide a positioning cover structure for a probe device, in order to solve the problem mentioned in the background art of the existing positioning cover structure for a probe device. However, in the process of testing electronic components, especially when testing microchips, existing probe devices need to accurately contact the probe with the chip pins or specific test points. Some probe devices do not have a positioning cover structure, which may cause the probe to fail to accurately contact the target point due to slight positional deviations, thus affecting the test results.

[0005] To achieve the above objectives, this utility model provides the following technical solution: a positioning cover structure for a probe device, comprising a cabinet, a storage slot on one side of the cabinet, casters installed at the bottom of the cabinet, a workbench fixedly connected to the upper surface of the cabinet, a positioning mechanism above the workbench, and a detection mechanism above the workbench.

[0006] The positioning mechanism includes a hydraulic cylinder, a hydraulic rod, a connecting plate, a limit seat, a rack plate, a slide rail, a gear, a threaded rod, a stop, a slider, a limit block, a base, a limit groove, a positioning table, a slide groove, a slide rod, a chuck, a first cover plate, a second cover plate, a slot, a telescopic tube, a telescopic rod, a telescopic spring, a positioning plate, and a probe positioning hole. A hydraulic cylinder is fixedly connected above the worktable. A hydraulic rod is slidably connected inside the hydraulic cylinder. One end of the hydraulic rod is fixedly connected to a connecting plate. A limit seat is fixedly connected to one side of the connecting plate. A rack plate is fixedly connected inside the limit seat. A slide rail is installed above the worktable. A gear meshes above the rack plate. A threaded rod is fixedly connected to one end of the gear. A stop is fixedly connected to the middle part of the threaded rod. A slider is threadedly connected to the outer surface of the threaded rod. A limit block is fixedly connected to the bottom of the slider, a base is fixedly connected to the top of the worktable, a limit groove is formed on the surface of the base, a positioning platform is fixedly connected to the top of the base, a sliding groove is formed on the surface of the positioning platform, a sliding rod is fixedly connected to the top of the slider, the sliding rod slides inside the sliding groove, a clamp is fixedly connected to the top of the sliding rod, a first cover plate is placed on the top of the positioning platform, a second cover plate corresponding to the first cover plate is placed on the positioning platform, a slot is formed on the upper surface of both the first and second cover plates, a telescopic tube is fixedly connected to the top of both the first and second cover plates, a telescopic rod is slidably connected inside the telescopic tube, a telescopic spring is wound around the outside of the telescopic rod, a positioning plate is fixedly connected to the top of the telescopic rod, and a probe positioning hole is formed on the surface of the positioning plate.

[0007] Preferably, multiple sets of the casters are provided at the bottom of the cabinet and are symmetrically distributed at the four corners of the bottom of the cabinet with respect to the central axis of the cabinet.

[0008] Preferably, the bottom of the rack plate corresponds to the inner side of the slide rail, and the outer wall dimension of the bottom of the rack plate matches the inner wall dimension of the slide rail.

[0009] Preferably, the threaded rod has a thread shape that is symmetrically distributed around the central axis of the stop block, and the slider is provided in two sets on the surface of the threaded rod, and is symmetrically arranged on both sides of the stop block around the central axis of the stop block.

[0010] Preferably, the position of the limiting block corresponds to the position of the limiting groove, and the outer wall dimension of the limiting block matches the inner wall dimension of the limiting groove.

[0011] Preferably, the detection mechanism includes a bracket, an adjustment groove, a motor, a lead screw, a lifting block, a connecting rod, a cylinder, a push rod, and a probe head. The bracket is fixedly connected above the worktable. An adjustment groove is formed on the surface of the bracket. A motor is fixedly connected to the bottom of the adjustment groove. A lead screw is fixedly connected to the output end of the motor. A lifting block is slidably connected to the surface of the lead screw. A connecting rod is fixedly connected to the outer end of the lifting block. A cylinder is fixedly connected above the connecting rod. A push rod is slidably connected inside the cylinder. A probe head is fixedly connected to the bottom of the push rod.

[0012] Preferably, the position of the lifting block corresponds to the position of the adjusting groove, and the outer wall size of the lifting block matches the inner wall size of the adjusting groove.

[0013] Compared with the prior art, the beneficial effects of this utility model are as follows: This probe device positioning cover structure, through the setting of the positioning mechanism, when the electronic component testing operation begins, firstly, the hydraulic cylinder is activated, the hydraulic rod extends outward, pushing the connected plate forward. Since the limiting seat is fixed to one side of the connecting plate and contains a rack plate, as the connecting plate moves, the rack plate also moves horizontally. At this time, the gear installed on the slide rail and meshing with the rack plate rotates due to the linear motion of the rack plate. The threaded rod fixedly connected to the gear also rotates accordingly. During the rotation of the threaded rod, the slider threadedly connected to its outer wall cannot rotate because the bottom limiting block is stuck in the limiting groove of the base. It can only move linearly along the threaded rod. The slide rod above the slider slides stably in the slide groove of the positioning table, thereby driving the chuck at the top of the slide rod to approach the first and second cover plates placed on the positioning table. Finally, the two sets of cover plates are precisely and stably clamped and positioned, ensuring that the two sets of cover plates will not shift. Next, the electronic components, such as the tiny chips to be tested, are placed inside the slots on the upper surfaces of the first and second cover plates. At this time, the telescopic tube, telescopic rod, and telescopic spring connected above the first and second cover plates are in their initial state. When the probe in the detection mechanism begins to press down to detect, the probe first contacts the positioning plate. As the probe continues to press down, the positioning plate is pressured and begins to move downward, causing the telescopic rod to slide inside the telescopic tube. At the same time, the telescopic spring is compressed. The compression process of the telescopic spring effectively buffers the impact force of the probe pressing down, preventing damage to the electronic components or the probe itself due to excessive probe pressure. During this process, because the positioning plate surface has probe positioning holes, the probe, under the precise guidance of the positioning holes, can accurately pass through the positioning plate and contact the pins or specific test points of the electronic components placed in the slots. This avoids the probe position deviation problem caused by the lack of a positioning cover plate structure, thereby ensuring the accuracy and reliability of the test results and enabling efficient and accurate testing of electronic components. Attached Figure Description

[0014] Figure 1 This is a schematic diagram of the left side view of the appearance of this utility model;

[0015] Figure 2 This is a schematic diagram of the right side view of the appearance of this utility model;

[0016] Figure 3 This is a schematic diagram of the positioning mechanism of this utility model;

[0017] Figure 4 This is a schematic diagram of the structure of the first cover plate and the second cover plate of this utility model in mutual cooperation;

[0018] Figure 5 This is a schematic diagram of the detection mechanism of this utility model.

[0019] In the diagram: 1. Cabinet; 2. Storage compartment; 3. Casters; 4. Workbench; 5. Positioning mechanism; 501. Hydraulic cylinder; 502. Hydraulic rod; 503. Connecting plate; 504. Limit seat; 505. Rack plate; 506. Slide rail; 507. Gear; 508. Threaded rod; 509. Stop block; 510. Slider; 511. Limit block; 512. Base; 513. Limit groove; 514. Positioning platform; 515. Slide groove; 516. 517. Slide rod; 518. Clamp; 519. First cover plate; 520. Second cover plate; 521. Slot; 522. Telescopic tube; 523. Telescopic rod; 524. Telescopic spring; 525. Positioning plate; 526. Probe positioning hole; 6. Detection mechanism; 601. Bracket; 602. Adjustment groove; 603. Motor; 604. Lead screw; 605. Lifting block; 606. Connecting rod; 607. Cylinder; 608. Push rod; 609. Probe head. Detailed Implementation

[0020] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0021] Please see Figure 1-5 This utility model provides a technical solution: a positioning cover structure for a probe device, including a cabinet 1, a storage slot 2 on one side of the cabinet 1, casters 3 installed at the bottom of the cabinet 1, a workbench 4 fixedly connected to the upper surface of the cabinet 1, a positioning mechanism 5 above the workbench 4, and a detection mechanism 6 above the workbench 4.

[0022] The positioning mechanism 5 includes a hydraulic cylinder 501, a hydraulic rod 502, a connecting plate 503, a limit seat 504, a rack plate 505, a slide rail 506, a gear 507, a threaded rod 508, a stop block 509, a slider 510, a limit block 511, a base 512, a limit groove 513, a positioning table 514, a slide groove 515, a slide rod 516, a chuck 517, a first cover plate 518, a second cover plate 519, a slot 520, a telescopic tube 521, a telescopic rod 522, a telescopic spring 523, a positioning plate 524, and a probe positioning hole 525. A hydraulic cylinder 501 is fixedly connected above the worktable 4. A hydraulic rod 502 is slidably connected inside the hydraulic cylinder 501. One end of the hydraulic rod 502 is fixedly connected to a connecting plate 503. One side of the connecting plate 503... A limiting seat 504 is fixedly connected, and a rack plate 505 is fixedly connected inside the limiting seat 504. A slide rail 506 is installed above the worktable 4. A gear 507 meshes above the rack plate 505. A threaded rod 508 is fixedly connected to one end of the gear 507. A stop block 509 is fixedly connected to the middle part of the threaded rod 508. A slider 510 is threadedly connected to the outer wall surface of the threaded rod 508. A limiting block 511 is fixedly connected to the bottom of the slider 510. A base 512 is fixedly connected above the worktable 4. A limiting groove 513 is formed on the surface of the base 512. A positioning table 514 is fixedly connected above the base 512. A sliding groove 515 is formed on the surface of the positioning table 514. A sliding rod 516 is fixedly connected above the slider 510. The slide bar 516 slides inside the slide groove 515. A clamp 517 is fixedly connected above the slide bar 516. A first cover plate 518 is placed above the positioning platform 514. A second cover plate 519 corresponding to the first cover plate 518 is placed on the positioning platform 514. The upper surfaces of both the first cover plate 518 and the second cover plate 519 are provided with slots 520. Telescopic tubes 521 are fixedly connected above both the first cover plate 518 and the second cover plate 519. A telescopic rod 522 is slidably connected inside the telescopic tube 521. A telescopic spring 523 is wound around the outside of the telescopic rod 522. A positioning plate 524 is fixedly connected to the top of the telescopic rod 522. A probe positioning hole 525 is provided on the surface of the positioning plate 524. Through the setting of the positioning mechanism 5, when the electronic component testing operation begins, First, the hydraulic cylinder 501 is activated, and the hydraulic rod 502 extends outward, pushing the connecting plate 503 connected to it forward. Since the limiting seat 504 is fixed to one side of the connecting plate 503 and has a rack plate 505 inside, the rack plate 505 also moves horizontally along with the connecting plate 503. At this time, the gear 507, which is mounted on the slide rail 506 and meshes with the rack plate 505, rotates due to the linear motion of the rack plate 505. The threaded rod 508, which is fixedly connected to the gear 507, also rotates accordingly. During the rotation of the threaded rod 508, the slider 510, which is threadedly connected to its outer wall, cannot rotate because the bottom limiting block 511 is stuck in the limiting groove 13 of the base 512. It can only move linearly along the threaded rod 508.The slide bar 516 above the slider 510 slides stably within the groove 515 of the positioning table 514, thereby driving the clamp 517 at the top of the slide bar 516 to move closer to the first cover plate 518 and the second cover plate 519 placed on the positioning table 514. This ensures precise and stable clamping and positioning of the two sets of cover plates, preventing displacement deviation. Next, the microchip or other electronic components to be tested are placed inside the slots 520 on the upper surfaces of the first cover plate 518 and the second cover plate 519. At this time, the telescopic tube 521, telescopic rod 522, and telescopic spring 523 connected above the first cover plate 518 and the second cover plate 519 are in their initial state. When the probe in the detection mechanism 6 begins to press down for detection, the probe first contacts the positioning plate 524, and as the probe... As the probe continues to press down, the positioning plate 524 moves downward under pressure, causing the telescopic rod 522 to slide within the telescopic tube 521. Simultaneously, the telescopic spring 523 is compressed. This compression effectively buffers the impact force of the probe's downward pressure, preventing damage to electronic components or the probe itself due to excessive pressure. During this process, because the positioning plate 524 has a probe positioning hole 525 on its surface, the probe, precisely guided by the hole, can accurately pass through the positioning plate 524 and contact the pins or specific test points of the electronic component placed in the slot 520. This avoids probe position deviation problems caused by the lack of a positioning cover structure, thus ensuring the accuracy and reliability of the test results and enabling efficient and precise electronic component testing.

[0023] Furthermore, multiple sets of casters 3 are installed at the bottom of the cabinet 1, symmetrically distributed at the four corners of the bottom of the cabinet 1 along the central axis of the cabinet 1. The casters 3 enable the cabinet 1 to move more smoothly and conveniently. The multiple sets of symmetrically distributed casters 3 evenly bear the weight of the cabinet 1, ensuring that the cabinet 1 will not tilt or shake due to uneven force when pushed or pulled. Whether on a flat laboratory floor or a slightly undulating production workshop floor, the cabinet 1 can be easily moved flexibly, making it convenient to quickly transfer the probe equipment to different working positions, improving the flexibility and efficiency of the equipment.

[0024] Furthermore, the bottom of the rack plate 505 corresponds to the inner side of the slide rail 506, and the outer wall dimension of the bottom of the rack plate 505 matches the inner wall dimension of the slide rail 506. Through the arrangement of the rack plate 505 and the slide rail 506, the stability and accuracy of the rack plate 505 during movement are ensured. During the process of the hydraulic cylinder 501 driving the hydraulic rod 502 to move the connecting plate 503, the rack plate 505 slides smoothly along the slide rail 506 without any left or right deviation or up and down jumping. This ensures that the meshing between the rack plate 505 and the gear 507 remains accurate and reliable, ensuring that the gear 507 can rotate stably according to the expected transmission ratio. This, in turn, precisely controls the rotation angle and speed of the threaded rod 508 connected to the gear 507, providing a basis for the precise positioning of the subsequent slider 510 and ensuring that the clamping action of the chuck 517 on the cover plate is accurate and error-free.

[0025] Furthermore, the threaded rod 508 has a threaded shape that is symmetrically distributed around the central axis of the stop block 509. Two sets of sliders 510 are provided on the surface of the threaded rod 508 and are symmetrically arranged on both sides of the stop block 509 around the central axis of the stop block 509. Through the arrangement of the threaded rod 508 and the sliders 510, synchronous and symmetrical drive control of the two sets of chucks 517 is achieved. When the threaded rod 508 rotates, the two sets of sliders 510 can move synchronously in opposite or the same direction around the stop block 509 under the action of the symmetrically distributed threads, driving the corresponding sliders 516 and chucks 517 to move. This ensures that the clamping force on the first cover plate 518 and the second cover plate 519 is evenly and symmetrically distributed, effectively preventing the cover plates from tilting or shifting during clamping. This allows the cover plates to be accurately fixed on the positioning stage 514, providing a stable and reliable placement platform for the tested component, which is beneficial for the precise docking of the probe and the tested component.

[0026] Furthermore, the position of the limiting block 511 corresponds to the position of the limiting groove 513, and the outer wall size of the limiting block 511 matches the inner wall size of the limiting groove 513. Through the setting of the limiting block 511 and the limiting groove 513, the movement trajectory of the slider 510 is further restricted. When the threaded rod 508 rotates to drive the slider 510 to move, the limiting block 511 slides stably in the limiting groove 13, so that the slider 510 can only move in a straight line along the direction defined by the limiting groove 13, and will not deviate from the predetermined movement path due to other external force interference or its own rotation. This ensures the accuracy and reliability of the positioning of the chuck 517, and ensures that each clamping operation of the cover plate can be accurately repeated, thereby improving the stability and working accuracy of the entire probe equipment positioning cover plate structure.

[0027] Furthermore, the detection mechanism 6 includes a bracket 601, an adjustment groove 602, a motor 603, a lead screw 604, a lifting block 605, a connecting rod 606, a cylinder 607, a push rod 608, and a probe head 609. The bracket 601 is fixedly connected above the worktable 4. An adjustment groove 602 is formed on the surface of the bracket 601. The motor 603 is fixedly connected to the bottom of the adjustment groove 602. A lead screw 604 is fixedly connected to the output end of the motor 603. A lifting block 605 is slidably connected to the surface of the lead screw 604. A connecting rod 606 is fixedly connected to the outer end of the lifting block 605. A cylinder 607 is fixedly connected to the top of the rod 606. A push rod 608 is slidably connected inside the cylinder 607. A probe head 609 is fixedly connected to the bottom of the push rod 608. Through the setup of the detection mechanism 6, when a detection operation is required, the motor 603 is first started, and its output drives the lead screw 604 to rotate. Since the lead screw 604 and the lifting block 605 are slidably connected, and the lifting block 605 is restricted by the adjustment groove 602 on the bracket 601 and cannot rotate with the lead screw 604, when the lead screw 604 rotates, the lifting block 605 will move along the adjustment groove 602. The probe head 609 moves vertically up and down, allowing for precise adjustment of its height. This ensures it aligns with the slot 520 in the positioning cover structure where the component under test is located. Once the lifting block 605 moves the probe head 609 to the appropriate height, the cylinder 607 activates, extending its internal push rod 608 downwards. Since the probe head 609 is fixed to the bottom of the push rod 608, it moves downwards along with the push rod, passing through the probe positioning hole 525 on the positioning plate 524, and finally aligning with the component under test placed in the slot 520. When the pins or specific test points of an electronic component make contact, the positioning plate 524 and its connected telescopic tube 521, telescopic rod 522, and telescopic spring 523 buffer and protect the downward pressing action of the probe head 609 during the contact process. This ensures that the probe head 609 can stably contact the component under test for the transmission and acquisition of test signals, without damaging the component under test or the probe head 609 itself due to excessive pressure. This enables accurate detection and analysis of parameters such as the electrical performance of electronic components, providing reliable data for subsequent quality judgment and performance evaluation of electronic components.

[0028] Furthermore, the position of the lifting block 605 corresponds to the position of the adjusting groove 602, and the outer wall size of the lifting block 605 matches the inner wall size of the adjusting groove 602. Through the setting of the adjusting groove 602 and the lifting block 605, it is ensured that the lifting block 605 can only make a smooth linear lifting and lowering motion along the adjusting groove 602 when the lead screw 604 rotates. The adjusting groove 602 provides a precise guide path for the lifting block 605, so that it will not have unstable phenomena such as deviation, shaking or self-rotation during the lifting and lowering process. This ensures the accuracy and stability of the probe head 609 when adjusting the height, and can accurately position it to a suitable position above the measured component. This is conducive to the smooth progress of subsequent detection work, improves the positioning accuracy and working reliability of the entire detection mechanism 6, and reduces the risk of test errors or equipment damage caused by positioning errors.

[0029] Working principle: When using this probe device to position the cover structure, firstly, with the help of multiple sets of omnidirectional wheels 3 symmetrically distributed at the four corners of the bottom of the cabinet 1, the device is moved smoothly and conveniently to the designated working position. Then, the hydraulic cylinder 501 in the positioning mechanism 5 is activated, and the hydraulic rod 502 pushes the connecting plate 503 to move horizontally, so that the rack plate 505 connected to it slides stably and accurately in the slide rail 506, thereby driving the gear 507 to rotate. The threaded rod 508 connected to the gear 507 also rotates accordingly. Due to the symmetrically distributed threads on the threaded rod 508 and the two sets of sliding... The symmetrical arrangement of block 510, under the synergistic action of limiting block 511 and limiting groove 513, causes slider 510 to move linearly along threaded rod 508. Through sliding rod 516, it drives chuck 517 to precisely and symmetrically clamp and position the first cover plate 518 and second cover plate 519 on positioning stage 514, providing a stable platform for subsequent placement of the tested component. After placing the microchip or other electronic component into the slot 520 of the cover plate, the detection mechanism 6 is activated. Motor 603 drives lead screw 604 to rotate, causing lifting block 605 to move under the guidance of adjustment groove 602. The probe head 609 is smoothly and linearly raised and lowered to a suitable height, aligning with the area of ​​the component under test. Then, cylinder 607 operates, and push rod 608 pushes probe head 609 downward, passing through probe positioning hole 525 of positioning plate 524 to contact the component under test. During this process, positioning plate 524 and its connected telescopic tube 521, telescopic rod 522, and telescopic spring 523 effectively buffer the downward impact force of probe head 609, ensuring stable contact between the probe and the component under test, and achieving accurate detection and acquisition of electrical performance parameters of electronic components. After the detection is completed, the motor 603 and the cylinder 607 work in opposite directions to return the probe head 609 to its original position, allowing the tested component to be removed. The equipment is then ready for the next test cycle. The entire process is efficient, accurate, and stable, effectively improving the working quality and efficiency of the probe equipment and meeting the requirements for precise testing of electronic components. The hydraulic cylinder 501 is model CDM2B25, the motor 603 is model Y315S-2, and the cylinder 607 is model SU63-100. This completes the usage process of a probe equipment positioning cover structure.

[0030] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A probe apparatus positioning cover plate structure comprising a cabinet (1), characterized in that: The cabinet body (1) is provided with a storage groove (2) on one side, the bottom of the cabinet body (1) is provided with universal wheels (3), the upper surface of the cabinet body (1) is fixedly connected with a workbench (4), the upper surface of the workbench (4) is provided with a positioning mechanism (5), and the upper surface of the workbench (4) is provided with a detection mechanism (6). The positioning mechanism (5) comprises a hydraulic cylinder (501), a hydraulic rod (502), a connecting plate (503), a limiting seat (504), a rack plate (505), a sliding rail (506), a gear (507), a threaded rod (508), a stop block (509), a sliding block (510), a limiting block (511), a base (512), a limiting groove (513), a positioning table (514), a sliding groove (515), a sliding rod (516), a chuck (517), a first cover plate (518), a second cover plate (519), a clamping groove (520), a telescopic pipe (521), a telescopic rod (522), a telescopic spring (523), a positioning plate (524) and a probe positioning hole (525), the top of the workbench (4) is fixedly connected with the hydraulic cylinder (501), the inside of the hydraulic cylinder (501) is slidably connected with the hydraulic rod (502), one end of the hydraulic rod (502) is fixedly connected with the connecting plate (503), one side of the connecting plate (503) is fixedly connected with the limiting seat (504), the inside of the limiting seat (504) is fixedly connected with the rack plate (505), the top of the workbench (4) is provided with the sliding rail (506), the top of the rack plate (505) is engaged with the gear (507), one end of the gear (507) is fixedly connected with the threaded rod (508), the middle part of the threaded rod (508) is fixedly connected with the stop block (509), the outer wall surface of the threaded rod (508) is threadedly connected with the sliding block (510), the bottom of the sliding block (510) is fixedly connected with the limiting block (511), the top of the workbench (4) is fixedly connected with the base (512), the surface of the base (512) is provided with the limiting groove (513), the top of the base (512) is fixedly connected with the positioning table (514), the surface of the positioning table (514) is provided with the sliding groove (515), the top of the sliding block (510) is fixedly connected with the sliding rod (516), the sliding rod (516) slides in the sliding groove (515), the top of the sliding rod (516) is fixedly connected with the chuck (517), the top of the positioning table (514) is provided with the first cover plate (518), the top of the positioning table (514) is provided with the second cover plate (519) corresponding to the first cover plate (518), the top surfaces of the first cover plate (518) and the second cover plate (519) are provided with the clamping groove (520), the tops of the first cover plate (518) and the second cover plate (519) are fixedly connected with the telescopic pipe (521), the inside of the telescopic pipe (521) is slidably connected with the telescopic rod (522), the outer side of the telescopic rod (522) is wound with the telescopic spring (523), the top of the telescopic rod (522) is fixedly connected with the positioning plate (524), and the surface of the positioning plate (524) is provided with the probe positioning hole (525).

2. A probe apparatus positioning cover plate structure according to claim 1, characterized in that: The universal wheels (3) are arranged in multiple groups at the bottom of the cabinet body (1) and are symmetrically distributed at the four corners of the bottom of the cabinet body (1) with the central axis of the cabinet body (1) as the center.

3. A probe apparatus positioning cover plate structure according to claim 1, characterized by: The bottom of the rack plate (505) corresponds to the inner side of the slide rail (506), and the size of the outer wall of the bottom of the rack plate (505) is consistent with the size of the inner wall of the slide rail (506).

4. The probe apparatus positioning cover plate structure according to claim 1, characterized by: The screw rod (508) is symmetrically distributed with the central axis of the block (509), the slider (510) is provided with two groups on the surface of the screw rod (508), and is symmetrically arranged on both sides of the block (509) with the central axis of the block (509).

5. The probe apparatus positioning cover plate structure according to claim 1, characterized by: The position of the limiting block (511) corresponds to the position of the limiting groove (513), and the size of the outer wall of the limiting block (511) is consistent with the size of the inner wall of the limiting groove (513).

6. A probe apparatus positioning cover plate structure according to claim 1, characterized by: The detection mechanism (6) comprises a support (601), an adjusting groove (602), a motor (603), a lead screw (604), a lifting block (605), a connecting rod (606), a gas cylinder (607), a push rod (608) and a probe head (609), the top of the workbench (4) is fixedly connected with the support (601), the surface of the support (601) is provided with the adjusting groove (602), the inner bottom of the adjusting groove (602) is fixedly connected with the motor (603), the output end of the motor (603) is fixedly connected with the lead screw (604), the surface of the lead screw (604) is slidably connected with the lifting block (605), the outer end of the lifting block (605) is fixedly connected with the connecting rod (606), the top of the connecting rod (606) is fixedly connected with the gas cylinder (607), the inside of the gas cylinder (607) is slidably connected with the push rod (608), and the bottom of the push rod (608) is fixedly connected with the probe head (609).

7. A probe apparatus positioning cover plate structure according to claim 6, characterized in that: The position of the lifting block (605) corresponds to the position of the adjusting groove (602), and the size of the outer wall of the lifting block (605) is consistent with the size of the inner wall of the adjusting groove (602).

Images