Perovskite testing device and battery production system

Abstract

The utility model relates to a perovskite testing device and a battery production system, the perovskite testing device comprises a box body, an object placing table, a first testing mechanism and a second testing mechanism, the object placing table is arranged in the box body and is used for placing a sample, the first testing mechanism is used for emitting first testing light and obtaining a fluorescence spectrum of the first testing light penetrating through the sample, and the second testing mechanism is used for detecting the fluorescence spectrum of the first testing light penetrating through the sample. The second testing mechanism is used for emitting second testing light and acquiring an absorption scattering spectrum of the second testing light penetrating through the sample; wherein the first testing mechanism and the second testing mechanism are detachably mounted on the box body and are distributed at an interval. The battery production system comprises the perovskite testing device. According to the perovskite testing device and the battery production system, the testing device can meet different spectrum testing requirements, the design of the whole structure of the testing device is simplified, and the space utilization rate of the testing device is optimized.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of perovskite testing, in particular to a perovskite testing device and a battery production system. BACKGROUND

[0002] With the popularization and promotion of new energy vehicles, the charging and discharging performance, endurance and other performance of new energy vehicles are increasingly attracting people's attention and attention. Batteries, as the power source of new energy vehicles, are widely used.

[0003] Solar cells usually include a perovskite active layer, which is usually a perovskite thin film formed by evaporating most of the solvent from a perovskite wet film and then annealing. The existing perovskite testing device can only realize one type of spectral testing, and needs to be switched to other devices when other types of spectral testing are performed. The perovskite testing device has poor applicability and cannot simultaneously meet different spectral testing requirements. UTILITY MODEL CONTENT

[0004] Therefore, it is necessary to provide a perovskite testing device and a battery production system to solve the problem that the existing perovskite testing device cannot simultaneously meet different spectral testing requirements.

[0005] A perovskite testing device includes a box body, a storage table, a first testing mechanism, and a second testing mechanism. The storage table is arranged in the box body and is used to place a sample. The first testing mechanism is used to emit first testing light and obtain a fluorescence spectrum of the first testing light passing through the sample. The second testing mechanism is used to emit second testing light and obtain an absorption scattering spectrum of the second testing light passing through the sample. The first testing mechanism and the second testing mechanism are detachably mounted on the box body and are spaced apart. The perovskite testing device can simultaneously perform fluorescence spectrum testing and absorption scattering spectrum testing on the sample. The same testing device can integrate at least two different spectral testing methods, so that the testing device can meet different spectral testing requirements, and the overall structure of the testing device can be simplified and designed, and the space utilization of the testing device can be optimized.

[0006] In some embodiments, the first testing mechanism includes a first spectrometer, a first optical fiber, and a first emitter electrically connected to each other. The first emitter is used to emit the first testing light, and the first spectrometer is used to obtain the fluorescence spectrum of the first testing light passing through the sample. The first emitter is detachably arranged in the box body, the first spectrometer is arranged outside the box body, and the first optical fiber is arranged through the box body and connected to the first emitter and the first spectrometer. In this way, the first emitter is detachably arranged in the box body, which facilitates the simplification and design of the overall structure of the testing device and optimizes the space utilization of the testing device.

[0007] In some embodiments, the first testing mechanism further comprises an optical assembly which is detachably arranged at the exit end of the first emitter and used for adjusting the light path and the light spot of the first testing light. In this way, the light path and the light spot of the first testing light can be adjusted by the optical assembly according to actual needs, thereby enhancing the practicability and applicability of the first testing mechanism.

[0008] In some embodiments, the optical assembly comprises a first filter, a diaphragm, a second filter and a condenser lens, which are arranged in sequence along the exit path of the first testing light, the first filter is used for filtering out excessive long-wave light in the first testing light, the diaphragm is used for adjusting the spatial uniformity of the first testing light, the second filter is used for filtering out excessive short-wave light in the first testing light, and the condenser lens is used for focusing the first testing light. In this way, the light path and the light spot of the first testing light can be adjusted, and the fluorescence spectrum test on the sample can be successfully performed, and the structure design is reasonable and simple.

[0009] In some embodiments, the second filter is a half lens, and the second filter is arranged obliquely; the first testing light is reflected by the second filter and passes through the sample, and the first testing light passing through the sample is received by the first spectrometer through the first optical fiber. In this way, after the first testing light is reflected by the second filter to the sample, it is reflected through the second filter and the condenser lens, and then it is incident to the first optical fiber and the first spectrometer, so as to obtain the fluorescence spectrum of the first testing light passing through the sample, and the overall structure of the testing device is simplified.

[0010] In some embodiments, the perovskite testing device further comprises a first support which is detachably arranged in the box and can be translated and / or lifted, and the optical assembly can be detachably arranged on the first support. In this way, when it is necessary to perform the fluorescence spectrum test on the sample, the optical assembly can be arranged on the first support, and the position of the optical assembly can be changed by translation or lifting of the first support, so as to change the light spot size of the first testing light, thereby enhancing the practicability and applicability of the first testing mechanism.

[0011] In some embodiments, the perovskite testing device further comprises a second support which is detachably arranged in the box and can be flipped, and the optical assembly can be detachably arranged on the second support. In this way, when it is necessary to perform the fluorescence spectrum test on the sample, the optical assembly can be arranged on the second support, and the angle of the optical assembly can be changed by flipping of the second support, so as to change the irradiation angle of the first testing light, thereby enhancing the practicability and applicability of the first testing mechanism.

[0012] In some embodiments, the first testing mechanism further comprises a halogen lamp which is connected with the first optical fiber. In this way, the spectral test coverage of the first testing mechanism can be wide, thereby enhancing the practicability and applicability of the first testing mechanism.

[0013] In some embodiments, the second testing mechanism comprises a second spectrometer, a second optical fiber and a second emitter electrically connected, the second emitter is configured to emit the second testing light, and the second spectrometer is configured to acquire the absorption scattering spectrum of the second testing light passing through the sample; wherein the second emitter is detachably arranged in the box, the second spectrometer is arranged outside the box, and the second optical fiber passes through the box and connects the second emitter and the second spectrometer. In this way, the second emitter is detachably arranged in the box, so that the test device meets different spectral testing requirements, and the overall structure of the test device is simplified and designed, and the space utilization of the test device is optimized.

[0014] In some embodiments, the perovskite testing device further comprises a third support which is detachably arranged in the box and can be flipped, and the second emitter can be detachably arranged on the third support. In this way, when the absorption scattering spectrum test of the sample is needed, the second emitter can be arranged on the third support, and the angle of the second emitter can be changed by flipping the third support, so as to change the irradiation angle of the second testing light, thereby enhancing the practicability and applicability of the second testing mechanism.

[0015] In some embodiments, the perovskite testing device further comprises a vacuum flash chamber which is detachably arranged in the box, and the object table can be removably arranged in the vacuum flash chamber. In this way, after the vacuum flash operation is performed to form the perovskite thin film, the sample on the object table does not need to be moved, and subsequent fluorescence spectrum test and absorption scattering spectrum test can be continued, which is convenient and time-saving, and helps to improve the operation efficiency.

[0016] In some embodiments, the top side of the vacuum flash chamber is provided with a first window and a second window, the first window is configured to pass through the first testing light, and the second window is configured to pass through the second testing light. In this way, the first testing light can irradiate the sample in the vacuum flash chamber through the first window, and the second testing light can irradiate the sample in the vacuum flash chamber through the second window, thereby avoiding the light passing through the vacuum flash chamber.

[0017] In some embodiments, the perovskite testing device further comprises a spin coater which is detachably arranged in the box, and the object table can be removably arranged on the spin coater. In this way, the perovskite solution can be coated by using the spin coater, which can effectively improve the operation efficiency.

[0018] The battery production system comprises the perovskite testing device. BRIEF DESCRIPTION OF DRAWINGS

[0019] Figure 1 The combination schematic diagram of the perovskite testing device in some embodiments of the present application.

[0020] Figure 2 The optical path schematic diagram of the perovskite testing device in the spin-on annealing stage in some embodiments of the present application.

[0021] Figure 3 The optical path schematic diagram of the perovskite testing device in the vacuum flash stage in some embodiments of the present application.

[0022] LIST OF REFERENCES

[0023] 100, box; 200, object table; 300, first testing mechanism; 310, first spectrometer; 320, first optical fiber; 330, first emitter; 400, second testing mechanism; 410, second spectrometer; 420, second optical fiber; 430, second emitter; 500, optical assembly; 510, first filter; 520, diaphragm; 530, second filter; 540, condenser lens; 610, first support; 620, second support; 630, third support; 700, halogen lamp; 800, vacuum flash cavity; 801, first window; 802, second window; 900, spin coater. DETAILED DESCRIPTION

[0024] The embodiments of the technical solutions of the present application will be described in detail below with reference to the drawings. The following embodiments are only used to more clearly illustrate the technical solutions of the present application, and therefore only serve as examples, and cannot limit the protection scope of the present application.

[0025] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs; the terms used herein are only for the purpose of describing specific embodiments of the present application, and are not intended to limit the present application; the terms "include" and "have" and any variations thereof in the specification and claims of the present application and the above description of drawings are intended to cover non-exclusive inclusion.

[0026] In the description of the embodiments of the present application, the technical terms "first", "second", etc. are only used to distinguish different objects, and cannot be understood as indicating or implying relative importance or implicitly indicating the number, specific order or primary and secondary relationship of the indicated technical features. In the description of the embodiments of the present application, the meaning of "multiple" is more than two, unless otherwise explicitly specified and limited.

[0027] Reference herein to "embodiments" means that the particular features, structures, or characteristics described in connection with the embodiments can be included in at least one embodiment of the present application. The appearance of this phrase in various places in the specification does not necessarily all refer to the same embodiment, nor is it necessarily a separate or alternative embodiment to other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0028] In the description of the embodiments of the present application, the term "and / or" is only a description of the association relationship of the associated objects, which means that there can be three relationships, for example, A and / or B, which can represent the three cases of A alone, A and B together, and B alone. In addition, the character " / " herein generally represents an "or" relationship between the associated objects before and after it.

[0029] In the description of the embodiments of the present application, the term "multiple" refers to more than two (including two), and similarly, "multiple groups" refers to more than two groups (including two groups), and "multiple pieces" refers to more than two pieces (including two pieces).

[0030] In the description of the embodiments of the present application, the technical terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the embodiments of the present application and simplifying the description, and therefore cannot be understood as indicating or implying that the devices or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as limiting the embodiments of the present application.

[0031] In the description of the embodiments of the present application, unless otherwise explicitly specified and limited, the technical terms "mounting", "connection", "connection", "fixing" and the like should be understood in a broad sense, for example, it can be fixedly connected, or it can be detachably connected, or it can be integrated; it can be mechanically connected, or it can be electrically connected; it can be directly connected, or it can be indirectly connected through an intermediate medium; it can be the internal communication of two elements or the interaction relationship between two elements. For those skilled in the art, the specific meaning of the above terms in the embodiments of the present application can be understood according to the specific circumstances.

[0032] With the popularization and promotion of new energy vehicles, the charging and discharging performance, endurance capability and the like of new energy vehicles are increasingly attracting people's attention and attention. As the power energy of new energy vehicles, batteries are widely used.

[0033] The solar cell generally includes a perovskite active layer, which is generally prepared by annealing a perovskite thin film formed by preliminary crystallization of a perovskite wet film after most of the solvent is volatilized. The existing perovskite testing device can only realize one type of spectral testing, and needs to be switched to other devices when other types of spectral testing are performed. The perovskite testing device has poor applicability and cannot simultaneously meet different spectral testing requirements.

[0034] Based on the above considerations, after in-depth research, the present application designs a perovskite testing device. The first testing mechanism and the second testing mechanism are detachably installed in the box, which can simultaneously accommodate fluorescence spectral testing and absorption scattering spectral testing of the sample. The same testing device can integrate at least two different spectral testing, so that the testing device meets different spectral testing requirements, and is beneficial to the overall structure simplification design of the testing device and the optimization of the space utilization of the testing device.

[0035] Please refer to Figure 1 In an embodiment, the perovskite testing device includes a box 100, a storage table 200, a first testing mechanism 300 and a second testing mechanism 400. The storage table 200 is arranged in the box 100 and used for placing a sample. The first testing mechanism 300 is used for emitting first testing light and obtaining a fluorescence spectrum of the first testing light passing through the sample. The second testing mechanism 400 is used for emitting second testing light and obtaining an absorption scattering spectrum of the second testing light passing through the sample. The first testing mechanism 300 and the second testing mechanism 400 are detachably installed in the box 100 and spaced apart.

[0036] It should be noted that the first testing mechanism 300 can emit the first testing light, and after the first testing light irradiates the sample, the fluorescence spectrum of the first testing light passing through the sample is obtained. The second testing mechanism 400 can emit the second testing light, and after the second testing light irradiates the sample, the absorption scattering spectrum of the second testing light passing through the sample is obtained.

[0037] In the embodiments of the present application, the box 100 is a component having a containing space and used for placing the storage table 200, the first testing mechanism 300, the second testing mechanism 400 and the like. The box 100 can have various structural forms, such as a cuboid, a cylinder or other shapes, and the specific structural form of the box 100 is not limited herein.

[0038] In the embodiments of the present application, the sample placing table 200 is a component for placing a sample. The sample placing table 200 can have various structural forms, for example, the sample placing table 200 has a plate-like structure or a block-like structure, and the outer contour of the sample placing table 200 can be circular, square or other shapes.

[0039] In the embodiments of the present application, the first testing mechanism 300 is a component for performing fluorescence spectrum testing on a sample. The first testing mechanism 300 can have various structural forms, for example, the first testing mechanism 300 includes a fluorescence spectrometer, and the fluorescence spectrum testing on the sample is performed by the fluorescence spectrometer.

[0040] In the embodiments of the present application, the second testing mechanism 400 is a component for performing absorption scattering spectrum testing on a sample. The second testing mechanism 400 can have various structural forms, for example, the second testing mechanism 400 includes an absorption scattering spectrometer, and the absorption scattering spectrum testing on the sample is performed by the absorption scattering spectrometer.

[0041] The above-mentioned perovskite testing device, the first testing mechanism 300 and the second testing mechanism 400 are detachably installed in the box 100, and can simultaneously compatible with fluorescence spectrum testing and absorption scattering spectrum testing on a sample. The same testing device can integrate at least two different spectrum tests, so that the testing device meets different spectrum testing requirements, and is beneficial to the overall structural simplification design of the testing device and the optimization of the space utilization of the testing device.

[0042] According to some embodiments of the present application, please refer to Figure 1 The first testing mechanism 300 includes a first spectrometer 310, a first optical fiber 320 and a first emitter 330 electrically connected, the first emitter 330 is used for emitting first testing light, and the first spectrometer 310 is used for acquiring the fluorescence spectrum of the first testing light passing through the sample; wherein the first emitter 330 is detachably arranged in the box 100, the first spectrometer 310 is arranged outside the box 100, and the first optical fiber 320 is arranged through the box 100 and connected with the first emitter 330 and the first spectrometer 310.

[0043] It can be understood that the first emitter 330 is used for emitting first testing light, and after the first testing light irradiates the sample, it is incident to the first optical fiber 320 and the first spectrometer 310 to acquire the fluorescence spectrum of the first testing light passing through the sample.

[0044] In the embodiments of the present application, the box 100 is provided with a first avoiding hole, the first emitter 330 is located in the box 100, the first spectrometer 310 is located outside the box 100, one end of the first optical fiber 320 is located in the box 100, and the other end of the first optical fiber 320 is connected with the first spectrometer 310 after passing through the first avoiding hole. Wherein, the first avoiding hole can be a round hole, a square hole or a hole with other shapes.

[0045] In some embodiments of the present application, the first spectrometer 310 is a fluorescence spectrometer, which analyzes the composition and properties of the sample by measuring the intensity and wavelength distribution of the fluorescence emitted by the sample.

[0046] Through the above arrangement, the first emitter 330 is detachably arranged in the box body 100, so that the test device meets different spectral test requirements, and facilitates the overall structural design of the test device and optimizes the space utilization of the test device.

[0047] According to some embodiments of the present application, please refer to Figure 1 The first test mechanism 300 further comprises an optical assembly 500, which is detachably arranged at the exit end of the first emitter 330 and is used to adjust the optical path and spot of the first test light.

[0048] It should be noted that the optical assembly 500 is arranged at the exit end of the first emitter 330, and the first test light emitted by the first emitter 330 is incident to the optical assembly 500, and after being reflected by the optical assembly 500 to the sample, it is incident to the first optical fiber 320 and the first spectrometer 310 to obtain the fluorescence spectrum of the first test light passing through the sample.

[0049] In some embodiments of the present application, the optical assembly 500 is a component for adjusting the optical path and spot of the first test light. The optical assembly 500 can be a combination of multiple different types of lenses to meet different optical path and spot requirements. For example, the optical assembly 500 includes half lenses, focusing lenses, and other lenses to adjust the optical path and spot size.

[0050] In some embodiments of the present application, the optical assembly 500 is detachably arranged at the exit end of the first emitter 330, and the optical assembly 500 and the first emitter 330 can be detachably connected in multiple ways, such as screwing, clamping or inserting the exit end of the optical assembly 500 and the first emitter 330.

[0051] In some embodiments of the present application, the number of optical assemblies 500 is not limited to one, that is, the number of optical assemblies 500 can be at least two. When the number of optical assemblies 500 is at least two, each optical assembly 500 can be arranged side by side in the same direction or in other arrangement modes.

[0052] Through the above arrangement, the optical assembly 500 can adjust the optical path and spot of the first test light according to actual needs, thereby enhancing the practicability and applicability of the first test mechanism 300.

[0053] According to some embodiments of the present application, please refer to Figure 1The optical assembly 500 comprises a first filter 510, a diaphragm 520, a second filter 530 and a condenser lens 540, which are arranged in the order of the outgoing path of the first test light. The first filter 510 is configured to filter out excessive long-wave light in the first test light. The diaphragm 520 is configured to adjust the spatial uniformity of the first test light. The second filter 530 is configured to filter out excessive short-wave light in the first test light. The condenser lens 540 is configured to focus the first test light.

[0054] It can be understood that the first test light emitted by the first emitter 330 is sequentially incident on the first filter 510 and the diaphragm 520, reflected to the sample through the second filter 530, reflected through the second filter 530 and the condenser lens 540, and then incident on the first optical fiber 320 and the first spectrometer 310 to obtain the fluorescence spectrum of the first test light passing through the sample.

[0055] In the embodiment of the present application, the first filter 510 is a component for filtering out excessive long-wave light in the first test light. Optionally, the first filter 510 is a long-pass filter, the main material of which is optical glass or optical plastic, and the surface of the long-pass filter is coated with special interference films. These interference films produce different phase differences for light of different wavelengths. The light waves in a specific wavelength range interfere with each other in the film layer, thereby being strengthened and passing through the filter smoothly. The light waves of other wavelengths interfere with each other in the film layer, thereby being cancelled and blocked by the filter. According to the difference in materials and manufacturing processes, the long-pass filter can also be divided into various types, such as glass substrate long-pass filter, plastic substrate long-pass filter, hard film long-pass filter and soft film long-pass filter.

[0056] In the embodiment of the present application, the diaphragm 520 is a component for adjusting the spatial uniformity of the first test light. By reasonably setting the diaphragm 520, the number and direction of light entering the optical system can be controlled, thereby improving the imaging quality. There are many types of diaphragms 520, and common ones include field diaphragm 520, aperture diaphragm 520, vignetting diaphragm 520 and stray light elimination diaphragm 520.

[0057] In the embodiment of the present application, the second filter 530 is a component for filtering out excessive short-wave light in the first test light. Optionally, the second filter 530 is a short-pass filter, the main material of which is optical glass or optical plastic, and which is mainly used to block the passage of interference wavelengths above a certain specific wavelength band and allow the passage of light in the specific specified wavelength band.

[0058] In the embodiment of the present application, the condenser lens 540 is a component for focusing the first test light. When light passes through the condenser lens 540, the refractive index of the lens material is different from that of the surrounding environment, and the light is refracted, so that the originally dispersed light can be concentrated.

[0059] Through the above arrangement, the light path and the light spot of the first test light can be adjusted, the fluorescence spectrum test on the sample can be smoothly performed, and the structural design is reasonable and simple.

[0060] According to some embodiments of the present application, refer to Figure 1 The second filter 530 is a semi-transmissive lens, and the second filter 530 is arranged obliquely; the first test light is reflected by the second filter 530 and passes through the sample, and the first test light passing through the sample is received by the first optical fiber 320 and the first spectrometer 310.

[0061] In the embodiments of the present application, the second filter 530 is arranged obliquely, and the oblique angle of the second filter 530 is such that the first test light is reflected by the second filter 530 and passes through the sample. Alternatively, the oblique angle of the second filter 530 can be 30 degrees, 60 degrees or 90 degrees or the like.

[0062] In the embodiments of the present application, the second filter 530 is a semi-transmissive lens, which is a filter that can divide the intensity of an incident light beam into two parts, one part of light is transmitted, and the other part of light is reflected. The intensity of the light actually transmitted and the intensity of the light actually reflected by the semi-transmissive lens can be made according to needs, such as transmitting 50% and reflecting 50%, transmitting 60% and reflecting 40%, transmitting 70% and reflecting 30%, etc.

[0063] Through the above arrangement, after the first test light is reflected by the second filter 530 to the sample, the first test light is reflected through the second filter 530 and the condenser lens 540, and then is incident to the first optical fiber 320 and the first spectrometer 310 to obtain the fluorescence spectrum of the first test light passing through the sample, and the overall structure of the test device is simplified.

[0064] According to some embodiments of the present application, refer to Figure 1 The perovskite test device further comprises a first support 610, which is detachably arranged in the box 100 and can be translated and / or lifted, and the optical assembly 500 can be detachably arranged on the first support 610.

[0065] It should be noted that when the fluorescence spectrum test on the sample is needed, the optical assembly 500 can be arranged on the first support 610, and the position of the optical assembly 500 can be changed by translation or lifting of the first support 610, so as to change the light spot size of the first test light; when the fluorescence spectrum test on the sample is not needed, the optical assembly 500 can be removed from the first support 610.

[0066] In the embodiments of the present application, the optical assembly 500 can be detachably arranged on the first support 610, and the detachable connection between the optical assembly 500 and the first support 610 can be achieved in various ways, for example, the optical assembly 500 is screwed, clamped or inserted with the first support 610.

[0067] In the embodiments of the present application, the first support 610 is detachably arranged in the box body 100 and can be translated and / or lifted, and the first support 610 can be detachably arranged in the box body 100 in various ways, for example, the first support 610 is screwed, clamped or inserted in the box body 100, and the first support 610 can be translated in the horizontal direction and / or lifted in the vertical direction.

[0068] Through the above arrangement, when the fluorescence spectrum test on the sample needs to be performed, the optical assembly 500 can be arranged on the first support 610, and the position of the optical assembly 500 is changed by the translation or lifting of the first support 610, so as to change the spot size of the first test light, thereby enhancing the practicability and applicability of the first test mechanism 300.

[0069] According to some embodiments of the present application, please refer to Figure 1 , the perovskite testing device further comprises a second support 620, the second support 620 is detachably arranged in the box body 100 and can be flipped, and the optical assembly 500 can be detachably arranged on the second support 620.

[0070] It should be noted that when the fluorescence spectrum test on the sample needs to be performed, the optical assembly 500 can be arranged on the second support 620, and the angle of the optical assembly 500 is changed by the flipping of the second support 620, so as to change the irradiation angle of the first test light; when the fluorescence spectrum test on the sample is not needed, the optical assembly 500 can be removed from the second support 620.

[0071] In the embodiments of the present application, the optical assembly 500 can be detachably arranged on the second support 620, and the detachable connection between the optical assembly 500 and the second support 620 can be achieved in various ways, for example, the optical assembly 500 is screwed, clamped or inserted with the second support 620.

[0072] In the embodiments of the present application, the second support 620 is detachably arranged in the box body 100 and can be translated and / or lifted, and the second support 620 can be detachably arranged in the box body 100 in various ways, for example, the second support 620 is screwed, clamped or inserted in the box body 100, and the second support 620 can be flipped in the horizontal direction and / or flipped in the vertical direction.

[0073] Through the above arrangement, when the fluorescence spectrum test on the sample needs to be performed, the optical assembly 500 can be arranged on the second support 620, and the angle of the optical assembly 500 can be changed by overturning the second support 620, so that the irradiation angle of the first test light is changed, and the practicability and applicability of the first test mechanism 300 are enhanced.

[0074] According to some embodiments of the present application, please refer to Figure 1 The first test mechanism 300 further comprises a halogen lamp 700 connected with the first optical fiber 320.

[0075] In the embodiments of the present application, the halogen lamp 700 is used for absorption scattering spectrum test, and the halogen lamp 700 is one of the light sources for spectrum measurement, has high brightness and wide spectrum coverage range, and can meet some measurement occasions requiring high brightness, such as spectrum measurement in very bright environment or large range scanning.

[0076] Through the above arrangement, the spectrum test coverage range of the first test mechanism 300 is wide, and the practicability and applicability of the first test mechanism 300 are enhanced.

[0077] According to some embodiments of the present application, please refer to Figure 1 The second test mechanism 400 comprises a second spectrometer 410, a second optical fiber 420 and a second emitter 430 electrically connected, the second emitter 430 is used for emitting second test light, and the second spectrometer 410 is used for acquiring absorption scattering spectrum of the second test light passing through the sample; wherein the second emitter 430 is detachably arranged in the box 100, the second spectrometer 410 is arranged outside the box 100, and the second optical fiber 420 passes through the box 100 and connects the second emitter 430 and the second spectrometer 410.

[0078] It can be understood that the second emitter 430 is used for emitting second test light, and after the second test light irradiates to the sample, it is incident to the second optical fiber 420 and the second spectrometer 410, so as to acquire absorption scattering spectrum of the second test light passing through the sample.

[0079] In the embodiments of the present application, the box 100 is provided with a second avoiding hole, the second emitter 430 is located in the box 100, the second spectrometer 410 is located outside the box 100, one end of the second optical fiber 420 is located in the box 100, and the other end of the second optical fiber 420 is connected with the second spectrometer 410 after passing through the second avoiding hole. Wherein, the second avoiding hole can be a round hole, a square hole or a hole with other shapes.

[0080] In the embodiments of the present application, the second spectrometer 410 is an absorption scattering spectrometer, which measures and analyzes the differences in the absorption, scattering and emission properties of the sample to light.

[0081] Through the above arrangement, the first emitter 330 and the second emitter 430 are detachably arranged in the box body 100, so that the test device meets different spectral test requirements, and the overall structure of the test device is simplified and designed, and the space utilization of the test device is optimized.

[0082] According to some embodiments of the present application, referring to Figure 1 , the perovskite test device further comprises a third support 630, the third support 630 is detachably arranged in the box body 100 and can be flipped, and the second emitter 430 can be detachably arranged on the third support 630.

[0083] It should be noted that when the sample needs to be tested by the absorption scattering spectrum, the second emitter 430 can be arranged on the third support 630, and the angle of the second emitter 430 can be changed by flipping the third support 630, so as to change the irradiation angle of the second test light; when the sample does not need to be tested by the absorption scattering spectrum, the second emitter 430 can be removed from the third support 630.

[0084] In the embodiments of the present application, the second emitter 430 can be detachably arranged on the third support 630, and the detachable connection between the second emitter 430 and the third support 630 can be achieved in various ways, such as screwing, clamping or inserting the second emitter 430 and the third support 630.

[0085] In the embodiments of the present application, the third support 630 is detachably arranged in the box body 100 and can be translated and / or lifted, and the third support 630 can be detachably arranged in the box body 100 in various ways, such as screwing, clamping or inserting the third support 630 in the box body 100, and the third support 630 can be flipped in the horizontal direction and / or flipped in the vertical direction.

[0086] Through the above arrangement, when the sample needs to be tested by the absorption scattering spectrum, the second emitter 430 can be arranged on the third support 630, and the angle of the second emitter 430 can be changed by flipping the third support 630, so as to change the irradiation angle of the second test light, thereby enhancing the practicability and applicability of the second test mechanism 400.

[0087] According to some embodiments of the present application, referring to Figure 1 , the perovskite test device further comprises a vacuum flash chamber 800, the vacuum flash chamber 800 is detachably arranged in the box body 100, and the placement table 200 can be removably arranged in the vacuum flash chamber 800.

[0088] It should be noted that the sample is a perovskite film. Before performing various spectral tests, the sample coated with the perovskite solution is placed on the sample holder 200 in the vacuum flash evaporation cavity 800, and the perovskite film is formed after the vacuum flash evaporation operation. Then, the sample on the sample holder 200 is not moved, and the first test mechanism 300 and the second test mechanism 400 are assembled, and then the sample is subjected to fluorescence spectrum test and absorption scattering spectrum test. When the sample does not need to be subjected to fluorescence spectrum test and absorption scattering spectrum test, the vacuum flash evaporation cavity 800 and the sample holder 200 can be removed.

[0089] In the embodiments of the present application, the vacuum flash evaporation cavity 800 is detachably arranged in the box body 100. The vacuum flash evaporation cavity 800 and the box body 100 can be detachably connected in various ways, such as screwing, clamping or inserting.

[0090] In the embodiments of the present application, the vacuum flash evaporation cavity 800 is a component having an inner cavity and used for placing the sample holder 200 and other components. The vacuum flash evaporation cavity 800 can have various structural forms, such as a cuboid, a cylinder or other shapes, and the specific structural form of the vacuum flash evaporation cavity 800 is not limited herein.

[0091] Through the above arrangement, after the perovskite film is formed by the vacuum flash evaporation operation, the sample on the sample holder 200 does not need to be moved, and subsequent fluorescence spectrum test and absorption scattering spectrum test can be continued. The operation is convenient and time-saving, and is beneficial to improve the operation efficiency.

[0092] According to some embodiments of the present application, please refer to Figure 1 The top side of the vacuum flash evaporation cavity 800 is provided with a first window 801 and a second window 802. The first window 801 is used for the first test light to pass through, and the second window 802 is used for the second test light to pass through.

[0093] It can be understood that the first test light can pass through the first window 801 and irradiate onto the sample in the vacuum flash evaporation cavity 800, and the second test light can pass through the second window 802 and irradiate onto the sample in the vacuum flash evaporation cavity 800.

[0094] In the embodiments of the present application, the first window 801 is provided with a transparent glass to enable the first window 801 to be closed while not hindering the passage of light. The shape of the first window 801 can be circular, square or other shapes, and the shape of the first window 801 is not limited herein.

[0095] In the embodiments of the present application, the second window 802 is provided with transparent glass, so that the second window 802 is closed while not hindering the penetration of light. The shape of the second window 802 can be circular, square or other shapes, and the shape of the second window 802 is not specifically limited herein.

[0096] Through the above arrangement, the first test light can irradiate on the sample in the vacuum flash evaporation cavity 800 after penetrating through the first window 801, and the second test light can irradiate on the sample in the vacuum flash evaporation cavity 800 after penetrating through the second window 802, avoiding the penetration of light in the vacuum flash evaporation cavity 800.

[0097] According to some embodiments of the present application, please refer to Figure 1 The perovskite testing device further comprises a spin coater 900, which is detachably arranged in the box 100, and the sample stage 200 is removably arranged on the spin coater 900.

[0098] It should be noted that the sample is a perovskite film. Before various spectral tests are performed, the sample stage 200 is arranged in the vacuum flash evaporation cavity 800, the perovskite solution is coated by using the spin coater 900, the sample coated with the perovskite solution is placed on the sample stage 200, and the perovskite film is formed after vacuum flash evaporation operation.

[0099] In the embodiments of the present application, the sample stage 200 is removably arranged on the spin coater 900, and the sample stage 200 and the spin coater 900 can be removably arranged on the spin coater 900 in various ways, for example, the sample stage 200 is screwed, clamped or inserted on the spin coater 900.

[0100] Through the above arrangement, the perovskite solution is coated by using the spin coater 900, which can effectively improve the operation efficiency.

[0101] Please refer to Figure 1 The battery production system in an embodiment comprises the above-mentioned perovskite testing device.

[0102] It should be noted that the battery production system is used for the production of perovskite solar cells, but is not limited to perovskite solar cells, and can also be used for the production of other types of batteries. Among them, the perovskite solar cell usually comprises the following structure: a transparent conductive oxide layer, an electron transport layer, a perovskite active layer, a hole transport layer and a metal back electrode are sequentially stacked along the thickness direction of the perovskite solar cell. Of course, the perovskite solar cell can also not contain an electron transport layer or a hole transport layer. Among them, the perovskite active layer is usually a perovskite film formed by evaporating most of the solvent from a perovskite wet film and then annealing.

[0103] The battery production system, the first testing mechanism 300 and the second testing mechanism 400 are detachably installed on the box body 100, and the fluorescence spectrum test and the absorption scattering spectrum test on the sample can be simultaneously compatible, the same testing device can integrate at least two different spectrum tests, the testing device meets different spectrum test requirements, and the overall structure of the testing device is simplified and designed, and the space utilization of the testing device is optimized.

[0104] According to some embodiments of the present application, referring to Figure 1 The present application provides a perovskite testing device, comprising a box body 100, a placement table 200, a first testing mechanism 300 and a second testing mechanism 400, the placement table 200 is arranged in the box body 100 and used for placing a sample, the first testing mechanism 300 and the second testing mechanism 400 are detachably installed on the box body 100 and spaced apart from each other, the first testing mechanism 300 comprises a first spectrometer 310, a first optical fiber 320, a first emitter 330 and an optical assembly 500, the first emitter 330 is used for emitting first test light, the first spectrometer 310 is used for acquiring a fluorescence spectrum of the first test light passing through the sample, and the optical assembly 500 is detachably arranged at an exit end of the first emitter 330 and used for adjusting an optical path and a light spot of the first test light; the second testing mechanism 400 comprises a second spectrometer 410, a second optical fiber 420 and a second emitter 430, the second emitter 430 is used for emitting second test light, and the second spectrometer 410 is used for acquiring an absorption scattering spectrum of the second test light passing through the sample; wherein the first emitter 330 and the second emitter 430 are detachably arranged in the box body 100, the first spectrometer 310 and the second spectrometer 410 are arranged outside the box body 100, the first optical fiber 320 passes through the box body 100 and connects the first emitter 330 and the first spectrometer 310, and the second optical fiber 420 passes through the box body 100 and connects the second emitter 430 and the second spectrometer 410.

[0105] The perovskite testing device further comprises a first support 610, a second support 620, a third support 630, a vacuum flash evaporation cavity 800 and a spin coater 900, the first support 610 is detachably arranged in the box body 100 and can be translated and / or lifted, and the optical assembly 500 can be detachably arranged on the first support 610; the second support 620 is detachably arranged in the box body 100 and can be flipped, and the optical assembly 500 can be detachably arranged on the second support 620; the third support 630 is detachably arranged in the box body 100 and can be flipped, and the second emitter 430 can be detachably arranged on the third support 630; the vacuum flash evaporation cavity 800 is detachably arranged in the box body 100, and the placement table 200 can be removably arranged in the vacuum flash evaporation cavity 800; and the spin coater 900 is detachably arranged in the box body 100, and the placement table 200 can be removably arranged on the spin coater 900.

[0106] According to some embodiments of the present application, referring to ​ The present application provides a battery production system comprising the perovskite testing device described above.

[0107] Finally, it should be noted that: the above embodiments are only used to illustrate the technical solutions of the present application, but not to limit them; although the present application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand: it can still modify the technical solutions recorded in the foregoing embodiments, or make equivalent replacement for part or all of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the scope of the technical solutions of the embodiments of the present application, and they should be covered in the scope of the claims and the description of the present application. In particular, as long as there is no structural conflict, each technical feature mentioned in each embodiment can be combined in any way. The present application is not limited to the specific embodiments disclosed herein, but includes all technical solutions falling within the scope of the claims.

Claims

1. A perovskite testing device, characterized by, The device comprises: a box (100); a sample placing table (200) arranged in the box (100) and used for placing a sample; a first testing mechanism (300) used for emitting first testing light and acquiring a fluorescence spectrum of the first testing light passing through the sample; a second testing mechanism (400) used for emitting second testing light and acquiring an absorption scattering spectrum of the second testing light passing through the sample; wherein the first testing mechanism (300) and the second testing mechanism (400) are both detachably arranged in the box (100) and are spaced apart.

2. The perovskite testing device of claim 1, wherein, The first testing mechanism (300) comprises a first spectrometer (310), a first optical fiber (320) and a first emitter (330) electrically connected, the first emitter (330) is used for emitting the first testing light, and the first spectrometer (310) is used for acquiring the fluorescence spectrum of the first testing light passing through the sample. Wherein, the first emitter (330) is detachably arranged in the box (100), the first spectrometer (310) is arranged outside the box (100), and the first optical fiber (320) passes through the box (100) and connects the first emitter (330) and the first spectrometer (310).

3. The perovskite testing device of claim 2, wherein, The first testing mechanism (300) further comprises an optical assembly (500) which is detachably arranged at an exit end of the first emitter (330) and used for adjusting a light path and a light spot of the first testing light.

4. The perovskite testing device of claim 3, wherein, The optical assembly (500) comprises a first filter (510), a diaphragm (520), a second filter (530) and a condenser lens (540), the first filter (510), the diaphragm (520), the second filter (530) and the condenser lens (540) are arranged in sequence along an exit path of the first testing light, the first filter (510) is used for filtering out redundant long-wave light in the first testing light, the diaphragm (520) is used for adjusting spatial uniformity of the first testing light, the second filter (530) is used for filtering out redundant short-wave light in the first testing light, and the condenser lens (540) is used for focusing the first testing light.

5. The perovskite testing device of claim 4, wherein, The second filter (530) is a half lens, and the second filter (530) is arranged obliquely. The first testing light is reflected by the second filter (530) and passes through the sample, and the first testing light passing through the sample is received by the first spectrometer (310) through the first optical fiber (320).

6. The perovskite testing device of claim 3, wherein, The perovskite testing device further comprises a first support (610) which is detachably arranged in the box (100) and can be translated and / or lifted, and the optical assembly (500) can be detachably arranged on the first support (610).

7. The perovskite testing device of claim 3, wherein, The perovskite testing device further comprises a second support (620) which is detachably arranged in the box (100) and can be flipped, and the optical assembly (500) can be detachably arranged on the second support (620).

8. The perovskite testing device of claim 2, wherein, The first testing mechanism (300) further comprises a halogen lamp (700) connected with the first optical fiber (320).

9. The perovskite testing device of claim 1, wherein, The second testing mechanism (400) comprises a second spectrometer (410), a second optical fiber (420) and a second emitter (430) electrically connected, the second emitter (430) is used for emitting second testing light, and the second spectrometer (410) is used for acquiring an absorption scattering spectrum of the second testing light passing through the sample. The second emitter (430) is detachably arranged in the box (100), the second spectrometer (410) is arranged outside the box (100), and the second optical fiber (420) passes through the box (100) and is connected with the second emitter (430) and the second spectrometer (410).

10. The perovskite testing device of claim 9, wherein, The perovskite testing device further comprises a third support (630) which is detachably arranged in the box (100) and can be flipped, and the second emitter (430) can be detachably arranged on the third support (630).

11. The perovskite testing device of claim 1, wherein, The perovskite testing device further comprises a vacuum flash chamber (800) which is detachably arranged in the box (100), and the object table (200) can be removably arranged in the vacuum flash chamber (800).

12. The perovskite testing device of claim 11, wherein, A top side of the vacuum flash chamber (800) is provided with a first window (801) and a second window (802), the first window (801) is used for allowing the first testing light to pass through, and the second window (802) is used for allowing the second testing light to pass through.

13. The perovskite testing device of claim 1, wherein, The perovskite testing device further comprises a spin coater (900) which is detachably arranged in the box (100), and the object table (200) can be removably arranged on the spin coater (900).

14. A battery production system characterized by comprising: The perovskite testing device comprises the perovskite testing device according to any one of claims 1-13.

Images