Off-grid inverter aging test device
By designing a multi-stage and automatically controlled off-grid inverter aging test device, the problems of manpower waste and safety hazards in the photovoltaic product testing and aging process have been solved. It has achieved efficient unmanned handling and precise docking, improved production efficiency and testing accuracy, and reduced costs.
Patent Information
- Application Number
- CN202423212349.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-25
- Publication Date
- 2026-01-06
- Estimated Expiration
- 2034-12-25
AI Technical Summary
Existing photovoltaic product testing and aging processes suffer from problems such as wasted manpower, safety hazards, wasted space, wasted resources, high costs, heavy maintenance workload, and rapid terminal wear, especially in the handling and aging of high-power products where efficiency is low.
An off-grid inverter aging test device was designed, comprising a T1 test cabinet, an aging cabinet, and a T2 test cabinet connected in sequence, equipped with first and second elevators. It adopts a multi-level workstation design and an automatic control scheme. The device achieves unmanned handling through a fully automatic conveying system and elevators, reducing manual operation and improving handling efficiency. The device also ensures precise docking through roller drive components and small docking fixtures, and monitors environmental parameters through ventilation ducts to ensure the stability of the aging process.
It greatly saves space, reduces safety hazards and energy consumption from manual handling, improves production efficiency, extends terminal life, reduces labor costs and hardware expenses, and achieves efficient testing and aging management.
Smart Images

Figure CN223770301U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to an aging test device for off-grid inverters, belonging to the field of photovoltaic products. Background Technology
[0002] As photovoltaic products increase in power, their size and weight also increase. Testing, aging, handling, and turnover become time-consuming and labor-intensive, and storage requires significant space. Currently, there are two methods for testing and aging in the photovoltaic industry:
[0003] a. Fixed workstation testing: The product is moved to a fixed position for testing using a horizontal transfer method. After the test is OK, the product is sent to the aging chamber through a conveyor system or turnover tool. The product is then manually transported to the aging position or transferred to a designated position or a separate aging cabinet for aging.
[0004] b. The test bench is fixed, the connecting wires are extended, the product is placed on the external platform or assembly line, and the product is manually connected for testing; high-power products are manually moved and placed directly on the fixed workbench for wiring aging.
[0005] When aging low-power models, the time it takes for products to reach thermal equilibrium is slightly longer (this can be addressed by adding auxiliary heat sources). Removing defective products during aging is also cumbersome. Based on the location of the defective machine, manually remove products in front of or behind it in the same row to the buffer position, then transport the defective machine out via a hoist. After removal, the product is returned to its original position via another hoist. Alternatively, a separate NG (Not From an Aging Chamber) trolley can be used to lift the product individually in a small area from outside the aging chamber and then move it horizontally out of the aging position.
[0006] The current technical solution has the following drawbacks: 1. Waste of manpower; 2. Safety hazards; 3. Waste of space; 4. Waste of resources; 5. High cost; 6. The maintenance workload of the docking solution is large, and the terminals wear out quickly; on average, the docking terminals / terminal blocks need to be replaced every two to three months. Utility Model Content
[0007] The purpose of this invention is to overcome the shortcomings and deficiencies of the existing technology and to provide an aging test device for off-grid inverters.
[0008] The off-grid inverter aging test device includes a T1 test cabinet, an aging cabinet, and a T2 test cabinet connected sequentially. The T1 and T2 test cabinets are equipped with a first elevator and a second elevator for material handling, respectively. The aging cabinet includes an aging workstation on the lower level and a temporary storage workstation on the upper level. This design addresses the issue of large space occupation by centralizing the aging, pre-aging, and post-aging product buffer areas. The buffer area functions are not fixed; instead, a system management approach is used to manage and store products according to their different states, reducing the problem of prolonged buffer area idleness. The N+1 layer aging space design and automatic control scheme ensure system utilization of over 90%. Product docking is achieved by fixing the product and tooling plates, and using small, movable docking fixtures for adaptation, reducing damage to high-current terminals used for adaptation. The fully automated conveyor system and elevator mechanism enable unmanned handling of the entire product process from T1 to aging to T2.
[0009] Preferably, the aging test station has three layers, with 15 workstations per layer. By setting up multiple workstations, the number of workstations can be increased within the same floor area, thereby significantly improving the aging test capacity and enabling the equipment to process more inverters per unit time, thus accelerating production efficiency.
[0010] Preferably, the temporary storage station has four layers, with 15 workstation units in each layer. This four-layer structure effectively increases the number of storage stations within a relatively small footprint, significantly improving the material storage capacity of the temporary storage station and meeting the needs of mass production and testing.
[0011] Preferably, the first and second elevators are respectively located on both sides of the T1 and T2 test cabinets. By configuring the elevators on both sides of the test cabinets, the transfer of materials between the T1 and T2 test cabinets can be made smoother, reducing the time for material handling and improving overall handling efficiency.
[0012] Preferably, the T1 and T2 test cabinets are configured with a number of layers matching the aging cabinet. Matching the number of layers in the T1 and T2 test cabinets to the aging cabinet ensures consistency in height and structure across the entire device, simplifies the material transfer process, and improves operational convenience. This matched layer design ensures smooth material flow between different workstations and equipment, reduces additional distance and time spent on material handling, and improves overall logistics efficiency.
[0013] Furthermore, the T1 test cabinet, T2 test cabinet, and aging cabinet are all equipped with roller drive components and small docking fixtures for material transfer. The roller drive components enable smooth and rapid material transfer, reducing material handling time and labor intensity, and significantly improving the overall efficiency of the production process. The small docking fixtures help ensure precise docking of materials between different devices, reducing errors during the docking process and improving the accuracy and reliability of the overall operation.
[0014] Furthermore, the aging cabinet is connected to an aging chamber, and the top of the aging chamber is connected to a ventilation duct. This interconnected design allows the aging chamber to monitor and adjust environmental parameters such as temperature and humidity during the aging process, ensuring that the inverter undergoes aging testing under more stable conditions, thereby improving the accuracy and reliability of the test. The ventilation duct allows for air circulation within the aging chamber, eliminating harmful gases, humid or overheated air, maintaining fresh air and a suitable working environment, and ensuring the smooth progress of the aging process.
[0015] The beneficial effects of this utility model are as follows: 1. It greatly saves planar space, saving more than twice the space compared to using a buffer area alone;
[0016] 2. The use of a conveyor system and automatic docking solution completely eliminates the safety hazards and wasted time caused by manual handling;
[0017] 3. With a reduction in unit area, energy consumption is correspondingly reduced, saving electricity;
[0018] 4. Unmanned testing and aging processes save users approximately 600,000 RMB per year in labor costs (based on an average monthly expenditure of 8.5K RMB per employee).
[0019] 5. All testing, aging, and cache management are automatically scheduled through system management software, which is visualized and facilitates management.
[0020] 6. The product is easy to fit and adapt to, without any forced pushing, and the terminal life is relatively long; about 10 times longer than the original.
[0021] 7. Convenient capacity expansion without increasing hardware costs;
[0022] 8. Compared to configurations with the same functionality, this solution has the lowest cost;
[0023] 9. Reduces the need for professional personnel in enterprises, resulting in significant direct economic benefits and good visitability; requires minimal maintenance in the later stages of the system; visualizes information collection, thus contributing to enterprise informatization. Attached Figure Description
[0024] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, obtaining other drawings based on these drawings without creative effort still falls within the scope of this utility model.
[0025] Figure 1 This is a structural diagram of the main body of this utility model;
[0026] Figure 2 This is a rear view of the present invention;
[0027] Figure 3 for Figure 2 Enlarged detail view of point A in the middle;
[0028] Figure 4 This is a simplified diagram of the functional blocks of the system of this utility model;
[0029] Figure 5 This is a flowchart illustrating the present invention.
[0030] Figure 6 This is a schematic diagram of the timing control of this utility model;
[0031] Figure 7 This is a schematic diagram of the timing control at different times according to this utility model;
[0032] Figure 8 This is the system logic diagram of this utility model;
[0033] In the diagram, 1. T1 test cabinet; 11. First elevator; 2. Aging cabinet; 21. Aging station; 22. Temporary storage station; 23. Aging chamber; 24. Ventilation duct; 3. T2 test cabinet; 31. Second elevator; 32. Roller drive component; 33. Small docking fixture. Detailed Implementation
[0034] To make the objectives, technical solutions and advantages of this utility model clearer, the utility model will be described in further detail below with reference to the accompanying drawings.
[0035] It should be noted that all uses of "first" and "second" in the embodiments of this utility model are for the purpose of distinguishing two entities or parameters with the same name but different names. It is clear that "first" and "second" are only for the convenience of expression and should not be construed as limiting the embodiments of this utility model. Subsequent embodiments will not explain this in detail.
[0036] The directional and positional terms used in this utility model, such as "up," "down," "front," "back," "left," "right," "inner," "outer," "top," "bottom," and "side," are merely for reference to the accompanying drawings. Therefore, the directional and positional terms used are for the purpose of explaining and understanding this utility model, and not for limiting the scope of protection of this utility model.
[0037] like Figure 1-3 The diagram illustrates an embodiment of the off-grid inverter aging test device of this invention. The off-grid inverter aging test device includes a T1 test cabinet 1, an aging cabinet 2, and a T2 test cabinet 3 connected sequentially. The T1 test cabinet 1 and T2 test cabinet 3 are respectively equipped with a first elevator 11 and a second elevator 31 for material handling. The aging cabinet 2 includes an aging workstation 21 on the lower level and a temporary storage workstation 22 on the upper level. This device addresses the problem of large space occupation by centralizing the aging, pre-aging, and post-aging product buffer areas. The buffer area functions are not fixed; through system management, products are managed and stored differently according to their different states, reducing the problem of long-term idle buffer areas. The N+1 layer aging space design and automatic control scheme ensure system utilization of over 90%. Product docking is achieved by fixing the product and tooling plates, and using a small docking tool 33 for adaptation, reducing damage to high-current terminals used for adaptation. The fully automatic conveying system and elevator mechanism enable unmanned handling of the entire product transport process from T1 to aging to T2.
[0038] The aging test station 21 has three layers, with 15 workstations per layer. By setting up multiple workstations, the number of workstations can be increased within the same floor area, thereby significantly improving the aging test capacity and enabling the equipment to process more inverters per unit time, thus accelerating production efficiency.
[0039] The temporary storage station 22 has four layers, with 15 workstation units in each layer. This four-layer structure effectively increases the number of storage stations within a relatively small footprint, significantly improving the material storage capacity of the temporary storage station 22 and meeting the needs of mass production and testing.
[0040] The first elevator 11 and the second elevator 31 are respectively installed on both sides of the T1 test cabinet 1 and the T2 test cabinet 3. By configuring the elevators on both sides of the test cabinets, the transfer of materials between the T1 test cabinet 1 and the T2 test cabinet 3 can be made smoother, reducing the time for picking up and placing materials and improving the overall handling efficiency.
[0041] The T1 test cabinet 1 and T2 test cabinet 3 are configured with a number of layers matching that of the aging cabinet 2. Matching the number of layers in the T1 and T2 test cabinets to the aging cabinet 2 ensures consistency in height and structure across the entire setup, simplifies the material transfer process, and improves operational convenience. This matching layer design ensures smooth material flow between different workstations and equipment, reducing additional distance and time spent on material handling and improving overall logistics efficiency.
[0042] The T1 test cabinet 1, T2 test cabinet 3, and aging cabinet 2 are all equipped with roller drive components 32 and small docking fixtures 33 for material transfer. The roller drive components 32 enable smooth and rapid material transfer, reducing material handling time and labor intensity, and significantly improving the overall efficiency of the production process. The small docking fixtures 33 help ensure precise docking of materials between different devices, reducing errors during the docking process and improving the accuracy and reliability of the overall operation.
[0043] The aging cabinet 2 is connected to an aging chamber 23, and the top of the aging chamber 23 is connected to a ventilation duct 24. This interconnected design allows the aging chamber 23 to monitor and regulate environmental parameters such as temperature and humidity during the aging process, ensuring the inverter undergoes aging testing under more stable conditions, thereby improving the accuracy and reliability of the test. The ventilation duct 24 ensures air circulation within the aging chamber 23, eliminating harmful gases, humid or overheated air, maintaining fresh air and a suitable working environment, and ensuring the smooth progress of the aging process.
[0044] The working principle diagram of this device is shown in Figure 1-8.
[0045] 1. Production sequence description of mass-produced products (based on a cycle time of 15 PCS / H, ct=240s, T1=480s)
[0046] A. P2(T1) Test System Logic
[0047] T+ct time: The first product enters the system, working path P1L2—P2L2—P3L2…P18L2;
[0048] T+2ct: The second product enters the system, working path P1L2—P1L3—P2L3—P3L3—P3L2…P17L2;
[0049] At time T+3ct: The third product enters the system, with the working path P1L2—P1L4—P2L4—P3L4—P3L2…P16L2;
[0050] At time T+4ct: The 4th product enters the system, with the working path P1L2—P1L5—P2L5—P3L5—P3L2…P15L2;
[0051] This cycle continues until the F state at level L2 is reached at time T+16ct.
[0052] At T+45ct, in L2 / L3 / L4 F state, if P2 test is OK, the product enters L5. After L5 F, P18L2 will perform T2 test to determine the product status, see B2.
[0053] B. L2 / L3 / L4 Aging System Logic
[0054] B1: Product entry
[0055] At time T+16ct: The 16th product enters the system, working path P1L2—P1L2~5—P2L2~5—P3L5—P3L3…P18L3;
[0056] At time T+17ct: The 17th product enters the system, working path P1L2—P1L2~5—P3L2~5—P3L3…P17L3;
[0057] At time T+18ct: The 18th product enters the system, working path P1L2—P1L2~5—P2L2~5—P3L3—P3L3…P16L3;
[0058] At time T+19ct: The 19th product enters the system, with the working path P1L2—P1L2~5—P2L2~5—P3L4—P3L3…P15L3;
[0059] …
[0060] T+31-45ct: Products 31-45 enter the system, working path P1L2—P1L2~5—P2L2~5—P4L4—P18~4L4;
[0061] B2: Out
[0062] When ct N+T1=24 At 3600 (approximately 61 units in production status)
[0063] B2.1 During the day shift:
[0064] Product P18L2, first unit, working path: P18L2—P19L2—P20L2—P21L2—Packaging line—Panel—Packaging return system—P21L1—P1L1; P18L4 ON
[0065] Product P17L2, second unit, working path: P18L2—P19L2—P19L3—P20L3—P21L3—P20L2 packaging line—pallet—packaging return system—P21L1—P1L1; P17L4 ON
[0066] ...
[0067] If the cycle continues, the working mechanism is consistent with the T1 test; if the L2 layer is in all N states, then the L4 layer will work in the full aging state.
[0068] ...The three aging layers operate in a rotating mode, with one layer always in a state of waiting for aging, ensuring that the aging power supply can be turned on for aging as soon as it is powered off, achieving an equipment utilization rate of more than 95%.
[0069] B2.2 Night shift work:
[0070] Product P18L2, working path: P18L2—P19L2—P20L2—P19L2—P19L5~8—P4L5~8
[0071] Product P18L2, second unit, working path P17L2…—P19L3—P20L3—P19L3—P19L5~8—P5L5~8
[0072] Product P18L2, 3rd unit, working path P16L2…—P19L4—P20L4—P19L4—P19L5~8—P6L5~8
[0073] Product P18L2, 4th unit, working path: P15L2…—P19L5—P20L5—P19L5—P19L5~8—P7L5~8
[0074] ...
[0075] C.P20 (T2) Test System Logic
[0076] (Note: This is already related in B2)
[0077] 2. Working principles at each level
[0078] 2.1 P1 IN principle: First priority when working on the assembly line. If there is a product at IN, it is immediately conveyed. The conveyor is lifted to P2 for testing via P1. When all products at the T2 test position are in the F state, they are buffered to the Ln layer.
[0079] 2.2 The principle for P2 bit requirements: L2>L3>L4>L5, with priority given to satisfying lower-level test bits for newer products;
[0080] 2.3 L2 Layered Product Principle: P18 > P17… > P4
[0081] L3 Layered Product Principle: L2 F Status;
[0082] L4 Layered Product Principles: L2\L3 F Status;
[0083] 2.4 L2, L3, and L4 layer products must pass the P2 test before they can enter; in authorized intervention mode, they can be used for cache intervals;
[0084] 3. Working modes of L2 / L3 / L4 aging zones and power control layer:
[0085] 3.1 The three-layer aging zone has 45 locations and is equipped with 30 power supplies;
[0086] 3.2 The power supplies are S1-1 to S1-15 and S2-1 to S2-15 respectively;
[0087] 3.3 From T+ct to 15ct, S1-1 to S1-15 corresponds to P18~4L2; from T+16ct to 30ct, S2-1 to S2-15 corresponds to P18~4L3.
[0088] 3.4 At T+61ct, S1-1 switches to P18L4; at T+62ct, S2-2 switches to P17L4, and so on; For example... Figure 8 Control logic.
[0089] 3.5 Power switching software control switching.
[0090] The above-disclosed embodiments are merely preferred embodiments of the present utility model and should not be construed as limiting the scope of the present utility model. Therefore, any equivalent variations made in accordance with the claims of the present utility model shall still fall within the scope of the present utility model.
[0091] Although the present invention has been described with reference to several specific embodiments, it should be understood that the present invention is not limited to the specific embodiments disclosed. The present invention is intended to cover various modifications and equivalent arrangements included within the spirit and scope of the appended claims.
Claims
1. An off-grid inverter aging test device, characterized in that: The device comprises a T1 test cabinet, an aging cabinet and a T2 test cabinet which are connected in sequence, the T1 test cabinet and the T2 test cabinet are respectively provided with a first elevator and a second elevator for carrying materials, and the aging cabinet comprises aging stations in the lower layer and temporary storage stations in the upper layer.
2. The off-grid inverter burn-in test device of claim 1, wherein: The aging stations are provided with three layers, and each layer has 15 station units.
3. The off-grid inverter burn-in test device of claim 1, wherein: The temporary storage stations are provided with four layers, and each layer has 15 station units.
4. The off-grid inverter burn-in test device of claim 1, wherein: The first elevator and the second elevator are respectively arranged on the two sides of the T1 test cabinet and the T2 test cabinet.
5. The off-grid inverter burn-in test device of claim 1, wherein: The T1 test cabinet and the T2 test cabinet are arranged to match the corresponding number of layers of the aging cabinet.
6. The off-grid inverter burn-in test device of claim 5, wherein: Roller drive components and small docking tooling for transmitting materials are arranged on the T1 test cabinet, the T2 test cabinet and the aging cabinet.
7. The off-grid inverter burn-in test apparatus of claim 1 or 6, wherein: The aging cabinet is connected with an aging room, and the top of the aging room is connected with a ventilation pipeline.