Probe clamping mechanism of atomic force microscope

Abstract

The utility model discloses a probe clamping mechanism of an atomic force microscope, relates to the technical field of microwave detection, and aims to solve the problems that in the prior art, a probe of a current atomic force microscope is not firm enough in clamping, mostly fixed by friction force, easy to displace when stressed and not reliable enough in use. A probe clamp circuit mainboard is mounted on the mounting plate, a piezoelectric ceramic piece is mounted on the probe clamp circuit mainboard, a probe clamp is mounted on the piezoelectric ceramic piece, a probe is arranged in the probe clamp, one end of the probe is connected with a connecting seat, an occlusion groove is formed in the connecting seat, and the other end of the probe is connected with a clamping groove. A locking head meshed with the meshing groove is arranged in the probe clamp, a first spring is connected to the locking head, an unlocking pressure head is slidably connected to the probe clamp, a connecting leg is arranged below the unlocking pressure head, a connecting rod is rotatably connected to the lower portion of the connecting leg, a support is installed in the probe clamp, and a connecting cylinder is rotatably connected to the lower end of the support.

Description

Technical Field

[0001] This utility model relates to the field of microwave detection technology, specifically to a probe clamping mechanism for an atomic force microscope. Background Technology

[0002] Currently, atomic force microscopy (AFM) is an important research tool in materials science, life sciences, nanotechnology, and other scientific fields. AFM can not only observe the nanoscale morphology of sample surfaces but also detect the three-dimensional nanostructural parameters of sample surfaces. There are currently two main structures for AFM: the upright type, where the sample is placed on a piezoelectric ceramic actuator, which moves the sample in three dimensions, allowing the probe to scan the sample surface in three dimensions. In this structure, the probe holder is fixed, making it relatively simple and easy to implement, but it can only support small sample sizes; the inverted type, where the probe and piezoelectric ceramic actuator are fixed together, and the probe moves one or three dimensions with the piezoelectric ceramic actuator. Since the probe is a consumable and needs frequent replacement, a probe holder that is easy to install and remove is required.

[0003] For example, CN105092900B discloses a scanning probe clamping device for an atomic force microscope, which includes a fixing fixture, a probe clamp connector, and a probe clamp; the probe clamp connector is fixed to the fixing fixture and connected to the probe clamp.

[0004] The probe clip described in the above application is small in size and lightweight, and can be fixed to a piezoelectric ceramic actuator. It can be applied to the structural design of the scanning head of an inverted atomic force microscope. It can realize the rapid loading and unloading of the probe clip, the rapid installation and fixation of the probe, and provide nanometer-level displacement vibration for the probe. Currently, the probes of atomic force microscopes are not secure enough when clamped. Most of them are fixed by friction, which is prone to displacement when subjected to force, making them unreliable. Therefore, there is an urgent need in the market to develop a probe clamping mechanism for atomic force microscopes to help people solve the existing problems. Utility Model Content

[0005] The purpose of this invention is to provide a probe clamping mechanism for an atomic force microscope, so as to solve the problems mentioned in the background art that the probes of current atomic force microscopes are not secure enough when clamped, are mostly fixed by friction, and are prone to displacement when subjected to force, making them unreliable in use.

[0006] To achieve the above objectives, this utility model provides the following technical solution: a probe clamping mechanism for an atomic force microscope, comprising a mounting plate, a probe clamp circuit board mounted on the mounting plate, a piezoelectric ceramic sheet mounted on the probe clamp circuit board, a probe clamp mounted on the piezoelectric ceramic sheet, a probe disposed within the probe clamp, a connecting seat connected to one end of the probe, a meshing groove disposed on the connecting seat, a locking head disposed within the probe clamp that meshes with the meshing groove, and a first spring connected to the locking head.

[0007] The above technical solution involves adding a connecting seat to the end of the probe and adding a locking head inside the probe clamp. When installing the probe, the locking head engages with the engagement groove of the connecting seat. A spring is installed above the locking head to apply pressure, preventing the probe from moving. Thus, the probe can remain fixed during use, avoiding displacement and improving reliability.

[0008] In a preferred embodiment, the present invention can be further configured as follows: an unlocking pressure head is slidably connected to the probe clamp, a connecting leg is provided below the unlocking pressure head, a connecting rod is rotatably connected below the connecting leg, a bracket is installed inside the probe clamp, a connecting cylinder is rotatably connected to the lower end of the bracket, the connecting rod is embedded in the interior of the connecting cylinder and slidably connected to the connecting cylinder, and one end of the connecting cylinder is rotatably connected to the lock head.

[0009] Through the above technical solution, the unlocking head can press the connecting rod and connecting cylinder to rotate around the bracket axis. Through the lever principle, the lock head can be knocked out of the engagement groove, thereby realizing a quick unlocking action, forming a complete quick-release structure, which facilitates the clamping and unlocking of the probe.

[0010] In a preferred embodiment, the present invention can be further configured such that: a top plate is slidably connected inside the probe clamp, one side of the top plate is in contact with the connecting seat, and a second spring is connected to the other side of the top plate.

[0011] By using the above technical solution, the probe can be subjected to longitudinal pressure through the top plate and spring, thereby making the connecting seat and the lock head fit tightly, improving the firmness of the fixation and further improving the reliability.

[0012] In a preferred embodiment, the present invention can be further configured such that: a longitudinal guide roller and a transverse guide roller are rotatably connected inside the probe clamp, and both the longitudinal guide roller and the transverse guide roller are in contact with the probe.

[0013] With the above technical solution, the horizontal guide roller and the vertical guide roller are respectively set on the side and directly above the probe, which helps to guide the probe into the probe holder and improves the convenience of use.

[0014] In a preferred embodiment, the present invention can be further configured such that: a spring sheet is connected to one side of the probe clip, and mounting screws for fixing the spring sheet are provided on the mounting plate.

[0015] In a preferred embodiment, this utility model can be further configured as follows:

[0016] Compared with the prior art, the beneficial effects of this utility model are:

[0017] 1. This utility model adds a connecting seat to the end of the probe and adds a locking head inside the probe clamp. When the probe is installed, the locking head will engage with the engagement groove of the connecting seat. A spring is set above the locking head to apply pressure so that the probe cannot move. Thus, the probe can remain fixed during use, avoid displacement, and improve the reliability of use.

[0018] 2. This utility model utilizes an unlocking pressure head to press the connecting rod and connecting cylinder to rotate around the support shaft axis. Through the lever principle, the lock head can be knocked out of the engagement groove, thereby achieving a quick unlocking action, forming a complete quick-release structure, which facilitates the clamping and unlocking of the probe.

[0019] 3. This utility model utilizes a top plate and a spring to apply longitudinal pressure to the probe, thereby ensuring a tight fit between the connecting seat and the locking head, improving the firmness of the fixation and further enhancing reliability.

[0020] 4. The horizontal guide roller and the vertical guide roller of this utility model are respectively set on the side and directly above the probe, which helps to guide the probe into the probe holder and improves the convenience of use. Attached Figure Description

[0021] Figure 1 This is a front view of a probe clamping mechanism for an atomic force microscope according to the present invention.

[0022] Figure 2 This is a side view of a probe clamping mechanism for an atomic force microscope according to the present invention.

[0023] Figure 3 This is a schematic diagram of the internal structure of the probe clip of this utility model.

[0024] In the diagram: 1. Mounting plate; 2. Probe clamp circuit main board; 3. Piezoelectric ceramic sheet; 4. Probe clamp; 5. Spring sheet; 6. Mounting screw; 7. Unlocking pressure head; 8. Connecting leg; 9. Connecting rod; 10. Connecting cylinder; 11. Bracket; 12. Lock head; 13. First spring; 14. Connecting seat; 15. Top plate; 16. Second spring; 17. Longitudinal guide roller; 18. Transverse guide roller; 19. Probe. Detailed Implementation

[0025] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present utility model. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments.

[0026] In the description of this application, it should be noted that the terms "upper," "lower," "inner," "outer," "top / bottom," etc., indicating the orientation or positional relationship are based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application. Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0027] In the description of this application, it should be noted that, unless otherwise expressly specified and limited, the terms "installed," "equipped with," "sleeved / connected," "connected," etc., should be interpreted broadly. For example, "connection" can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium; it can be a connection within two components. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.

[0028] Please see Figure 1 and Figure 3 An embodiment of this utility model provides a probe clamping mechanism for an atomic force microscope, comprising a mounting plate 1, a probe clamp circuit board 2 mounted on the mounting plate 1, a piezoelectric ceramic sheet 3 mounted on the probe clamp circuit board 2, a probe clamp 4 mounted on the piezoelectric ceramic sheet 3, a probe 19 disposed inside the probe clamp 4, one end of the probe 19 being connected to a connecting seat 14, the connecting seat 14 being provided with an engagement groove, a locking head 12 being provided inside the probe clamp 4 and engaging with the engagement groove, a first spring 13 being connected to the locking head 12, and the two ends of the first spring 13 being fixed to the locking head 12 and the probe clamp 4 respectively.

[0029] Please see Figure 3 An unlocking pressure head 7 is slidably connected to the probe clamp 4. A connecting leg 8 is provided below the unlocking pressure head 7, and a connecting rod 9 is rotatably connected below the connecting leg 8.

[0030] Please see Figure 3 A bracket 11 is installed inside the probe clamp 4. A connecting tube 10 is rotatably connected to the lower end of the bracket 11. A connecting rod 9 is embedded inside the connecting tube 10 and is slidably connected to the connecting tube 10. One end of the connecting tube 10 is rotatably connected to the lock head 12. The bracket 11 is fixed to the probe clamp 4.

[0031] Please see Figure 3A top plate 15 is slidably connected inside the probe clamp 4. One side of the top plate 15 is in contact with the connecting seat 14, and a second spring 16 is connected to the other side of the top plate 15. The two ends of the second spring 16 are fixed to the top plate 15 and the probe clamp 4, respectively.

[0032] Please see Figure 3 The probe clamp 4 is rotatably connected to a longitudinal guide roller 17 and a transverse guide roller 18, both of which are in contact with the probe 19.

[0033] Please see Figure 2 A spring sheet 5 is connected to one side of the probe clip 4. The mounting plate 1 is provided with a mounting screw 6 for fixing the spring sheet 5. The mounting screw 6 passes through the probe clip circuit board 2 and is threadedly connected to the mounting plate 1. The upper end of the mounting screw 6 presses down on the spring sheet 5.

[0034] Working principle: When in use, insert probe 19 into probe clamp 4. The longitudinal guide roller 17 and the transverse guide roller 18 guide probe 19. The connecting seat 14 of probe 19 will contact the locking head 12. The engagement groove of the connecting seat 14 will engage with the locking head 12. The top plate 15 is compressed, and the second spring 16 applies longitudinal pressure, thereby firmly fixing probe 19 inside probe clamp 4. When probe 19 needs to be replaced, press the unlocking head 7 to drive the connecting rod 9 and connecting cylinder 10 to rotate around the bracket 11 as the axis, thereby knocking the locking head 12 out of the engagement groove, completing the unlocking action, so that probe 19 can be replaced.

[0035] It will be apparent to those skilled in the art that this invention is not limited to the details of the exemplary embodiments described above, and that it can be implemented in other specific forms without departing from the spirit or essential characteristics of this invention. Therefore, the embodiments should be considered illustrative and non-limiting in all respects, and the scope of this invention is defined by the appended claims rather than the foregoing description. Thus, it is intended that all variations falling within the meaning and scope of equivalents of the claims be included within this invention. No reference numerals in the claims should be construed as limiting the scope of the claims.

Claims

1. A probe clamping mechanism for an atomic force microscope, comprising a mounting plate (1), characterized in that: The mounting plate (1) is equipped with a probe clip circuit main board (2), the probe clip circuit main board (2) is equipped with a piezoelectric ceramic sheet (3), the piezoelectric ceramic sheet (3) is equipped with a probe clip (4), the probe clip (4) is equipped with a probe (19), one end of the probe (19) is connected to a connecting seat (14), the connecting seat (14) is equipped with a meshing groove, the probe clip (4) is equipped with a locking head (12) that meshes with the meshing groove, and a first spring (13) is connected to the locking head (12).

2. The probe clamping mechanism for an atomic force microscope according to claim 1, characterized in that: An unlocking pressure head (7) is slidably connected to the probe clamp (4), and a connecting leg (8) is provided below the unlocking pressure head (7). A connecting rod (9) is rotatably connected below the connecting leg (8).

3. The probe clamping mechanism for an atomic force microscope according to claim 2, characterized in that: The probe clip (4) is equipped with a bracket (11), and the lower end of the bracket (11) is rotatably connected to a connecting cylinder (10). The connecting rod (9) is embedded in the interior of the connecting cylinder (10) and is slidably connected to the connecting cylinder (10). One end of the connecting cylinder (10) is rotatably connected to the lock head (12).

4. The probe clamping mechanism for an atomic force microscope according to claim 1, characterized in that: The probe clamp (4) is slidably connected to a top plate (15), one side of the top plate (15) is in contact with the connecting seat (14), and the other side of the top plate (15) is connected to a second spring (16).

5. The probe clamping mechanism for an atomic force microscope according to claim 1, characterized in that: The probe clamp (4) is rotatably connected to a longitudinal guide roller (17) and a transverse guide roller (18), both of which are in contact with the probe (19).

6. The probe clamping mechanism for an atomic force microscope according to claim 1, characterized in that: A spring sheet (5) is connected to one side of the probe clip (4), and mounting screws (6) for fixing the spring sheet (5) are provided on the mounting plate (1).

Images