Split type chip test frame
The modular chip test fixture solves the problems of large space occupation and high maintenance costs of traditional chip testing equipment, enabling flexible chip testing and efficient equipment maintenance, and improving testing accuracy and equipment lifespan.
Patent Information
- Application Number
- CN202520044857.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-01-09
- Publication Date
- 2026-01-13
- Estimated Expiration
- 2035-01-09
AI Technical Summary
Traditional chip testing equipment features an integrated design that results in excessive space occupation, inconvenient maintenance, and high costs, making it difficult to flexibly meet the testing needs of different chip models.
It adopts a split design, separating the main control unit and the power module. The plug-in block and the insertion contact plate enable quick connection. The limit block is detachable to adapt to different chip models. The cover plate and the buckle plate achieve automatic closure through torsion springs, and the rubber gasket improves the sealing performance.
It saves space, reduces maintenance costs, improves testing flexibility and accuracy, extends equipment lifespan, and reduces the impact of failures.
Smart Images
Figure CN223796649U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of hardware testing equipment, and in particular to a split-type chip testing rack. Background Technology
[0002] In modern electronics manufacturing, integrated circuits (ICs) are core components, and their performance and reliability directly determine the quality of the final product. With the rapid development of semiconductor technology, chip functions are becoming increasingly complex, and integration levels are constantly improving. This not only places higher demands on chip design but also makes chip testing increasingly important. Chip testing is the last line of defense in ensuring product quality; it verifies whether the chip's functions, performance, and reliability meet design specifications.
[0003] Traditional chip testing equipment typically integrates the main control unit and power supply unit into a single unit. While this integrated design simplifies the initial installation process, it presents several challenges in practical applications, such as occupying too much space, inconvenient maintenance, and the need to replace the entire device in case of failure. These issues limit the application scenarios of the equipment and increase maintenance costs. Therefore, it is necessary to design a separate chip testing rack to address the shortcomings of existing technologies. Utility Model Content
[0004] To overcome the shortcomings of the prior art, this utility model provides a split chip test fixture, which separates the main control part and the power supply part in the test fixture, thereby saving space and reducing maintenance costs when upgrading faults.
[0005] The technical solution is as follows: A split-type chip test fixture includes a power module and plug-in blocks. The power module provides power for the test fixture. Two rows of parallel plug-in blocks are provided on the top surface of the power module. Each plug-in block has an interface. Assembly holes are provided at the four corners of the power module for stable mounting onto a platform or placement plate. The fixture also includes a main control test module, a cover plate, insertion contact plates, limiting blocks, snap-fit plates, and a rotating shaft. Two rows of protruding insertion contact plates are provided at the bottom of the main control test module. The main control test module inserts and snaps into the corresponding plug-in block's interface via the insertion contact plates, enabling subsequent testing after power-on. A cover plate is hinged to the rear of the main control test module. A limiting block for positioning the chip under test is provided inside the main control test module. A snap-fit plate is rotatably mounted on the end of the cover plate away from the hinge via a rotating shaft. The end of the snap-fit plate closest to the main control test module has a hook.
[0006] Furthermore, the limiting block is detachably installed on the main control test module. The limiting block is available in models that can be used with different types and sizes of chips to be tested. Different models of limiting blocks have limiting grooves of different sizes inside, which increases the testing range of the main control test module for the chips to be tested.
[0007] Furthermore, the limiting groove inside the limiting block has outwardly extending notches on both sides. The notches in the limiting groove are used for the insertion of a person's finger or a tool, so as to facilitate the placement of the chip to be tested into the limiting groove of the limiting block for limiting.
[0008] Furthermore, the main control test module and the front housing of the cover plate are provided with corresponding slots. The rotation axis of the buckle plate is located in the slot of the cover plate. The buckle plate can be vertically inserted into the slot of the main control test module, so that the main control test module and the cover plate can be stably closed.
[0009] Furthermore, a torsion spring is sleeved on the rotating shaft between the cover plate and the snap-on plate. The torsion spring is used to provide elastic force for the snap-on plate to snap onto the housing of the main control test module. Pressing the cover plate causes the snap-on plate hook to press against the housing of the main control test module. The snap-on plate rotates against the elastic force of the torsion spring until the snap-on plate hook is snapped into the slot on the front side of the housing of the main control test module under the action of the torsion spring, saving the need for manual rotation of the snap-on plate to snap on.
[0010] Furthermore, the housing surface of the main control test module is provided with a rubber gasket, and the mating surface of the cover plate is provided with a mating groove for the rubber gasket. When the cover plate is closed onto the main control test module, the rubber gasket is sealed and embedded in the mating groove of the cover plate, thereby improving the sealing between the cover plate and the main control test module and reducing the occurrence of dust on the main control test module.
[0011] Beneficial effects: 1. By separating the power supply module and the main control test module, this utility model enables flexible disassembly and assembly configuration. This design not only saves space in the overall equipment, but also ensures that if one module fails or needs to be upgraded, it will not affect the normal use of the other module, thereby extending the service life of the equipment and reducing maintenance costs.
[0012] 2. The insertion contact plate on the main control test module of this utility model is used in conjunction with the plug block of the power module, which allows for quick connection and disconnection and is easy to adjust according to different test requirements. The detachable limit block has a limit slot suitable for chips of different models and sizes, increasing the test range and flexibility.
[0013] 3. This utility model can also provide an automatic latching function through a torsion spring between the cover plate and the latching plate, ensuring stable closure between the cover plate and the main control test module. In addition, the design of the rubber gasket and the fitting groove enhances the sealing performance, effectively preventing dust from entering and improving the reliability and testing accuracy of the equipment. Attached Figure Description
[0014] Figure 1 This is a three-dimensional structural diagram of the present invention.
[0015] Figure 2 This is a schematic diagram of the cover plate of this utility model in its unfolded state on the main control test module.
[0016] Figure 3 This is a three-dimensional structural diagram of the power module and connector of this utility model.
[0017] Figure 4 This is a three-dimensional structural diagram of the present invention.
[0018] Reference numerals: 1-Power module, 2-Plug-in block, 21-Plug-in interface, 3-Main control test module, 4-Cover plate, 5-Insert contact plate, 6-Chip to be tested, 7-Limit block, 71-Limit groove, 8-Snap plate, 9-Rotating shaft, 10-Torsion spring, 11-Slot, 12-Assembly hole, 13-Rubber gasket, 14-Fitting groove. Detailed Implementation
[0019] The present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments, but this does not limit the scope of protection and application of the present invention.
[0020] A split-type chip test fixture, such as Figures 1-4As shown, the test fixture includes a power module 1 and plug-in blocks 2. The power module 1 provides the power for testing. Two rows of parallel plug-in blocks 2 are arranged on the top surface of the power module 1. Each plug-in block 2 has a plug-in interface 21. Assembly holes 12 are located at the four corners of the power module 1, allowing for stable mounting of the power module 1 onto the platform or placement plate. The fixture also includes a main control test module 3, a cover plate 4, insertion contact plates 5, a limit block 7, a snap-fit plate 8, and a rotating shaft 9. The bottom of the main control test module 3 has two rows of protruding insertion contact plates 5. The main control test module 3 is inserted into and snapped into the corresponding plug-in interface 21 of the plug-in block 2 via the insertion contact plates 5, enabling… After the main control test module 3 is powered on, subsequent tests are performed. The main control test module 3 has a cover plate 4 hinged to its rear side. The main control test module 3 has a limiting block 7 inside that limits the chip 6 to be tested. A buckle plate 8 is mounted on the end of the cover plate 4 away from the hinge by rotating through a pivot. The end of the buckle plate 8 near the main control test module 3 is a hook. The main control test module 3 and the power module 1 are designed as separate units, which allows the main control test module 3 to be flexibly disassembled and assembled according to the testing requirements of the chip 6 to be tested, saving the volume of the entire test rack. Moreover, the failure or obsolescence of one module will not affect the normal use of the other module. It has a long service life and low maintenance cost.
[0021] like Figure 2 As shown, the limiting block 7 is detachably installed on the main control test module 3. The limiting block 7 is available in models that can be used with different types and sizes of chips 6 to be tested. Different models of the limiting block 7 have limiting grooves 71 of different sizes inside, which increases the testing range of the main control test module 3 for the chips 6 to be tested.
[0022] like Figure 2 As shown, the limiting groove 71 inside the limiting block 7 has outwardly extending notches on both sides. The notches in the limiting groove 71 are for the finger of the testing personnel or the tool to be inserted, so as to conveniently put the chip 6 to be tested into the limiting groove 71 of the limiting block 7 for limiting.
[0023] like Figure 2 and Figure 4 As shown, slots 11 are provided at corresponding positions on the front housing of the main control test module 3 and the cover plate 4. The rotation shaft 9 of the buckle plate 8 is located in the slot 11 of the cover plate 4. The buckle plate 8 can be vertically inserted into the slot 11 of the main control test module 3, so that the main control test module 3 and the cover plate 4 can be stably closed.
[0024] like Figure 1 and Figure 4As shown, a torsion spring 10 is sleeved on the rotating shaft 9 between the cover plate 4 and the snap plate 8. The torsion spring 10 is used to provide the elastic force for the snap plate 8 to snap onto the housing of the main control test module 3. Pressing the cover plate 4 causes the snap plate 8 to press against the housing of the main control test module 3. The snap plate 8 rotates against the elastic force of the torsion spring 10 until the snap plate 8 snaps into the slot 11 on the front side of the housing of the main control test module 3 under the action of the torsion spring 10, saving the need for manual rotation of the snap plate 8 to snap.
[0025] like Figure 2 As shown, the housing surface of the main control test module 3 is provided with a rubber gasket 13, and the cover plate 4 is provided with a fitting groove 14 that fits the rubber gasket 13. The cover plate 4 is closed onto the main control test module 3, so that the rubber gasket 13 is sealed and embedded in the fitting groove 14 of the cover plate 4, thereby improving the sealing between the cover plate 4 and the main control test module 3 and reducing the occurrence of dust on the main control test module 3.
[0026] When using this test fixture to perform data or functional testing and quality inspection on chips, the operator aligns the insertion contact plate 5 at the bottom of the main control test module 3 and inserts it into the corresponding connector 2, establishing an electrical connection between the main control test module 3 and the power module 1. This allows the main control test module 3 to be powered on and ready to begin the test program. The hinged cover 4 on the rear side of the main control test module 3 can be opened or closed during the test to facilitate the placement of the chip under test. To accommodate different models and sizes of chips under test, the limiting block 7 is designed to be detachable and has various sizes of limiting slots 71 inside. The limiting slots 71 not only fix various types of chips but also have outward extending notches, allowing testers to quickly pick up and place chips using their fingers or tools. The presence of the limiting block 7 ensures that the chip maintains the correct position during testing, thereby improving the accuracy of the test results. After the chip is placed... The operator closes the cover plate 4. At this time, the latch plate 8 located at the end of the cover plate 4 will automatically rotate under the action of the torsion spring 10 until the latch on it is engaged in the slot 11 on the front side of the main control test module 3, simplifying the manual locking operation process. At the same time, a rubber gasket 13 on the contact surface of the main control test module 3 is embedded in the fitting groove 14 of the cover plate 4, enhancing the sealing between the two and preventing dust from entering and affecting the test accuracy. After the test is completed, if it is necessary to replace or maintain a certain part, such as if the main control test module 3 malfunctions or needs to be upgraded, the user only needs to disconnect the power connection and then easily disassemble the relevant components. This split design can reduce maintenance costs and extend the overall service life of the test rack. Since each module can operate independently, even if one module is eliminated or damaged, the other parts can still be used, further improving the return on investment of the equipment.
[0027] The above description is merely an embodiment of this utility model and is not intended to limit the scope of this utility model. All equivalent substitutions made within the principles of this utility model should be included within the protection scope of this utility model. Contents not described in detail in this utility model are existing technologies known to those skilled in the art.
Claims
1. A split-type chip test fixture, comprising a power module (1) and plug-in blocks (2), wherein the top surface of the power module (1) is provided with two rows of parallel plug-in blocks (2), the plug-in blocks (2) are provided with plug-in interfaces (21), and the four corners of the power module (1) are provided with assembly holes (12). Its features are, It also includes a main control test module (3), a cover plate (4), an insertion contact plate (5), a limiting block (7), a buckle plate (8), and a rotating shaft (9). The bottom of the main control test module (3) is provided with two rows of protruding insertion contact plates (5). The main control test module (3) is inserted and snapped into the corresponding plug interface (21) of the plug block (2) through the insertion contact plate (5). The rear side of the main control test module (3) is hinged with a cover plate (4). The main control test module (3) is provided with a limiting block (7) inside to limit the chip to be tested (6). The end of the cover plate (4) away from the hinge is rotatably mounted with a buckle plate (8) through a rotating shaft. The end of the buckle plate (8) near the main control test module (3) is a hook.
2. The split-type chip test fixture according to claim 1, characterized in that, The limiting block (7) is detachably installed on the main control test module (3), and the limiting block (7) is available in models that can be used with different types and sizes of chips (6) to be tested.
3. A split-type chip test fixture according to claim 2, characterized in that, The limiting block (7) has outwardly extending notches on both sides of the internal limiting groove (71).
4. A split-type chip test fixture according to claim 3, characterized in that, The main control test module (3) and the front shell of the cover plate (4) are provided with corresponding slots (11), and the rotation shaft (9) of the buckle plate (8) is located in the slot (11) of the cover plate (4).
5. A split-type chip test fixture according to claim 4, characterized in that, A torsion spring (10) is sleeved on the rotating shaft (9) between the cover plate (4) and the buckle plate (8). The torsion spring (10) is used to provide elastic force for the buckle plate (8) to buckle the housing of the main control test module (3).
6. A split-type chip test fixture according to claim 5, characterized in that, The main control test module (3) has a rubber gasket (13) on its housing surface, and the cover plate (4) has a fitting groove (14) with a rubber gasket (13) on its covering surface.