Reliability experiment clamp for GaN power device
By designing an experimental fixture composed of a metal substrate and a PCB circuit board, the problems of large space occupation and inaccurate testing of GaN power devices were solved, realizing large-scale and efficient reliability testing, which is suitable for reliability experiments of GaN power devices.
Patent Information
- Application Number
- CN202422930249.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-29
- Publication Date
- 2026-01-16
- Estimated Expiration
- 2034-11-29
AI Technical Summary
In existing technologies, the fixtures for GaN power devices occupy a large space, making it impossible to achieve large-scale integrated testing, and the testing accuracy is not high, resulting in resource waste and inconsistent testing conditions.
A reliability test fixture comprising a metal substrate, a PCB circuit board, and a pressure block assembly was designed. The power device under test is fixed by the large-area PCB circuit board and the pressure block assembly, enabling multiple devices to be tested simultaneously on the same fixture. The test efficiency is improved by stacking partitions.
It enables simultaneous testing of large batches of power devices, improves testing accuracy, saves testing resources, meets reliability testing requirements before delivery, and facilitates large-scale production.
Smart Images
Figure CN223808476U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to the field of power device reliability detection, especially to a reliability experiment fixture of GaN power device. BACKGROUND
[0002] GaN power device is a kind of high electron mobility transistor based on wide band gap semiconductor material, and its advantages in high frequency, high efficiency, low loss etc. show strong competitiveness and extensive application prospect in multiple fields. The reliability test of GaN power device includes HTGB (high temperature gate bias test), HTOL (high temperature working life test), HAST (high acceleration stress test), UHAST (unbiased high acceleration stress test) and THB (high temperature and humidity experiment) etc. Test projects.
[0003] At present, the reliability test of power device usually adopts the following mode: each to-be-tested power device is matched with a set of fixture, including an independent test base plate and a compression block for fixing the to-be-tested power device on the test base plate, and the fixture with connected wire is placed into the test box to carry out reliability test. However, the reliability test requires a large number of to-be-tested power devices, and the internal space of the test box is limited, and the space occupied by each to-be-tested power device fixture is large, so the test of a batch of power devices needs to be carried out in the test box for multiple times, and each set of fixture needs a set of independent power supply connection, which wastes a lot of test resources. In addition, the to-be-tested devices of the same batch are entered into the test box in batches, which inevitably causes the test conditions to be inconsistent every time due to the large number of times of adjusting the test box connection, which affects the accuracy of the test to some extent. UTILITY MODEL CONTENTS
[0004] In view of the problems of large space occupied by the fixture of to-be-tested power device in the prior art, non-integrated mass testing and insufficient test accuracy, the utility model provides a reliability experiment fixture of GaN power device, which comprises a metal substrate, a PCB circuit board and a compression block assembly.
[0005] The PCB circuit board is fixed on the metal substrate by screws;
[0006] The PCB circuit board comprises n test groups, the test group comprises a gate circuit, a drain circuit, a gate PAD, a drain PAD, a test unit and a test slot;The test slot is arranged between the gate circuit and the drain circuit and penetrates through the PCB circuit board;The gate circuit is connected with the gate PAD, and the drain circuit is connected with the drain PAD;
[0007] The test units symmetrically arranged relative to the test slots are arranged on the gate circuit and the drain circuit, the test unit comprises a test PAD and a resistor, the test PAD is arranged at the edge of the test slot, and a pair of symmetric test PADs are in contact with a pair of pins of the power device to be tested; the test PAD on one side of the gate circuit is connected to the gate circuit in series with the resistor; the test PAD on one side of the drain circuit is connected to the drain circuit in series with the resistor;
[0008] Each of the power devices to be tested is matched with a set of the compression block assembly; the compression block assembly comprises two first compression blocks and a second compression block arranged on the upper part of the two first compression blocks; the first compression block is a cuboid with a protruding part, the position of the protruding part corresponds to the pin on the side of the gate circuit or the side of the drain circuit; the second compression block is a rectangular plate with two notches, and the two notches are clamped with the two first compression blocks; a screw hole is formed in the second compression block, and the second compression block can be fixed to the metal base plate through a screw.
[0009] Further, n gate PADs are connected to an external power supply in parallel, and n drain PADs are connected to an external power supply in parallel.
[0010] Further, a heat dissipation through hole and a standby input capacitor circuit are arranged near the test PAD.
[0011] Further, the material of the first compression block is polytetrafluoroethylene, and the material of the second compression block is wood.
[0012] Further, the resistance value of the resistor is generally 10Ω.
[0013] Further, a plurality of sets of the clamp can be stacked through a shelf containing a partition, and a third screw hole for fixing the partition is arranged on the metal base plate and the PCB circuit board.
[0014] Compared with the prior art, the utility model has the following beneficial effects:
[0015] By using a large-area PCB circuit board and a compression block assembly to fix the power device to be tested, a large number of power devices can be simultaneously subjected to reliability tests on the same set of experimental clamps, thereby further improving the accuracy of the power device reliability test, and meanwhile, only one set of power supply is required for each set of experimental clamp, so that higher test efficiency can be achieved compared with the traditional separate test device, and more test resources can be saved. The power device reliability test before delivery is efficiently met, the acceptance time is reduced, and the large-scale production and use of the power device manufacturer are facilitated.
[0016] Meanwhile, the experimental fixture can be used for different sizes of ceramic tube shell power devices, and the combination of the circuit board and the compression block assembly can meet the test requirements of different batches of power devices, and the experimental fixture has good universality. BRIEF DESCRIPTION OF DRAWINGS
[0017] Figure 1 It is a schematic diagram of a to-be-tested power device in the embodiment of the utility model;
[0018] Figure 2 It is a schematic diagram of a metal substrate in the embodiment of the utility model;
[0019] Figure 3 It is a schematic diagram of a PCB circuit board in the embodiment of the utility model;
[0020] Figure 4 It is a schematic diagram of a single test unit in the embodiment of the utility model;
[0021] Figure 5 It is a front view of a first compression block in the embodiment of the utility model;
[0022] Figure 6 It is a side view of a first compression block in the embodiment of the utility model;
[0023] Figure 7 It is a front view of a second compression block in the embodiment of the utility model;
[0024] Figure 8 It is a top view of a second compression block in the embodiment of the utility model;
[0025] Figure 9 It is a schematic diagram of a combination of a single to-be-tested power device and an experimental fixture in the embodiment of the utility model;
[0026] In the drawing: 1, metal substrate; 2, PBC circuit board; 3, test group; 4, gate circuit; 5, drain circuit; 6, gate PAD; 7, drain PAD; 8, test unit; 9, test slot; 10, test PAD; 11, resistor; 12, first compression block; 13, second compression block; 14, protruding part; 15, notch; 16, heat dissipation through hole; 17, standby input capacitor circuit; 18, to-be-tested power device; 19, pin; 20, ceramic tube shell; 21, first screw hole; 22, second screw hole; 23, third screw hole. DETAILED DESCRIPTION
[0027] In order to make the person skilled in the art better understand the technical scheme of the present application, the technical scheme in the embodiments of the present application will be described clearly and completely below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by the person skilled in the art without creative labor should belong to the protection scope of the present application.
[0028] It should be noted that the terms "first", "second" and the like in the description and claims of the present application and the above drawings are used to distinguish similar objects, and do not necessarily have to describe a specific order or sequence. The terms "up", "down", "front", "back", "top", "bottom" and the like indicate the orientation or positional relationship shown in the drawings, and are only used to facilitate the description of the present application and simplify the description, and do not indicate or imply that the device or part referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as a limitation on the present application. It should be understood that the data thus used can be interchanged under appropriate circumstances, so that the embodiments of the present application described herein can be implemented. In addition, the terms "include" and "have" and any variations thereof are intended to cover non-exclusive inclusion.
[0029] The middle region of the power device 18 is a GaN HEMT die, an input-output matching circuit, and a harmonic impedance and envelope impedance control network, and the left and right sides are copper pins. The reliability experiment of the power device 18 is completed by connecting the left and right pins 19 to the experimental fixture, and the left and right pins 19 are a pair. Generally, this kind of power device has 1-3 pairs of pins. As shown in Figure 1 The power device 18 in the present embodiment has two pairs of pins 19.
[0030] The present application provides a reliability experiment fixture for GaN power device, comprising: a metal base plate 1, a PCB circuit board 2 and a pressure block assembly.
[0031] As shown in Figure 2 and Figure 3 As shown in the drawings, the corresponding positions of the metal base plate 1 and the PCB circuit board 2 are reserved with first screw holes 21, and the PCB circuit board 2 is fixed on the metal base plate 1 by screws, and the diameter of the screws is M2. The metal base plate 1 provides support and heat dissipation function.
[0032] PCB circuit board 2 includes n columns of test groups 3. Test group 3 includes gate circuit 4, drain circuit 5, gate PAD 6, drain PAD 7, test unit 8 and test slot 9; test slot 9 is arranged between gate circuit 4 and drain circuit 5, and penetrates through the PCB circuit board 2; gate circuit 4 is connected with gate PAD 6, and drain circuit 5 is connected with drain PAD 7.
[0033] Test unit 8 arranged symmetrically with respect to test slot 9 is arranged on gate circuit 4 and drain circuit 5, and test unit 8 includes test PAD 10 and resistor 11; test PAD 10 is arranged at the edge of test slot 9, and a pair of test PAD 10 arranged symmetrically is in contact with a pair of pins 19 of power device 18 to be tested. Test PAD 10 on one side of gate circuit 4 is connected with resistor 11 in series and then connected into gate circuit 4; test PAD 10 on one side of drain circuit 5 is connected with resistor 11 in series and then connected into drain circuit 5.
[0034] Preferably, the resistance value of resistor 11 is generally 10Ω.
[0035] As shown in Figure 1 and Figure 3 , in the embodiment, power device 18 to be tested has 4 pins 19, and PCB circuit board 2 has 5 test groups 5, each test group 5 includes 5 power devices 18 to be tested, so each test group 5 includes 20 test units 8. The PCB circuit board 2 can simultaneously test 25 power devices.
[0036] In order to ensure that the pins 19 of power device 18 to be tested are in good contact with test PAD 10, each power device 18 to be tested needs to be fixed by using a compression block during testing, and each power device 18 to be tested is matched with a set of compression block assemblies. The compression block assembly includes two first compression blocks 12 and one second compression block 13 arranged on the upper part of the two first compression blocks 12. As shown in Figure 5 and Figure 6 , the compression block assembly includes two first compression blocks 12 and one second compression block 13 arranged on the upper part of the two first compression blocks 12; the first compression block 12 is a cuboid with a protruding part 14, and the position of the protruding part 14 corresponds to the pins 19 on the side of gate circuit 4 or drain circuit 5. As shown in Figure 7 and Figure 8 , the second compression block 13 is a rectangular plate with two notches 15, and the two notches 15 are clamped with each other; two screw holes are arranged on the second compression block 13, and the second compression block 13 can be fixed to the metal base plate 1 by screws.
[0037] The protruding part 14 of the first compression block 12 ensures that the pins 19 and the test PAD 10 are completely attached, and then the second compression block 13 is fixed to the metal base plate 1 by screws to completely fix the entire power device to be tested.
[0038] Preferably, the first compression block 12 is made of polytetrafluoroethylene, and the second compression block 13 is made of wood.
[0039] Before starting the experiment, the experimental fixture is assembled first, as shown in Figure 2 The first screw hole 21 is reserved on the metal substrate 1 and the PCB circuit board 2, and fixed with the metal substrate 1 and the PCB circuit board 2 through the M2 diameter screw. Then, 25 power devices 18 to be tested are placed in the test slot 9 in turn. As shown in Figure 9 The middle region of the power device 18 to be tested is placed in the test slot 9, and the upper part of the middle region is provided with a ceramic tube shell 20, and the lower part is in direct contact with the metal substrate 1, which can ensure the heat dissipation of the power device during the test. Two pairs of pins 19 are placed corresponding to the test PAD 10, and the assembled compression block assembly is pressed on the ceramic tube shell 20. In this embodiment, two screw holes are provided on the second compression block 13, and the M4 diameter screw is used to fix the second compression block 13 and the metal plate 1, so as to ensure that the pins 19 are tightly compressed with the test PAD 10, and the connection at the pins is good, without short circuit or open circuit problem.
[0040] After the fixture is completely connected, it is placed in the reliability test box, and the 5 gate PAD 6 is connected in parallel with the external power supply, and the 5 drain PAD 7 is connected in parallel with the external power supply, so as to realize parallel connection of all test units, and the reliability test can be started. Only one set of power supply is needed for testing a set of experimental fixture.
[0041] Preferably, as shown in Figure 4 The heat dissipation through hole 16 and the standby input capacitor circuit 18 are provided near the test PAD 10, and the standby input capacitor circuit 18 can filter out the noise entering the device.
[0042] In order to further utilize the vertical space in the test box, a shelf containing 2-3 layers of partitions can be customized according to the size of the test box, and a set of experimental fixture is placed on each layer of partition, and fixed with the partition through the third screw hole 23 provided on the metal substrate 1 and the PCB circuit board 2, so as to realize the stacking of multiple fixtures, and further improve the experimental efficiency.
[0043] The above is only the preferred embodiment of the present application, and does not limit the scope of the present application. It should be noted that for ordinary technicians in the technical field, without departing from the technical principles of the present application, a number of improvements and modifications can be made, which should be covered in the protection scope of the present application.
Claims
1. A reliability experiment fixture for GaN power devices, characterized by, The utility model relates to a kind of reliability experimental fixture of GaN power device, including: Metal substrate (1), PCB circuit board (2) and pressure block assembly; The PCB circuit board (2) is fixed on the metal substrate (1) by screw; The PCB circuit board (2) includes n column test groups (3), and the test group (3) includes gate circuit (4), drain circuit (5), gate PAD (6), drain PAD (7), test unit (8) and test slot (9);The test slot (9) is arranged between the gate circuit (4) and the drain circuit (5), and penetrates the PCB circuit board (2);The gate circuit (4) is connected with the gate PAD (6), and the drain circuit (5) is connected with the drain PAD (7); The gate circuit (4) and the drain circuit (5) are provided with the test unit (8) symmetrically arranged about the test slot (9), and the test unit (8) includes test PAD (10) and resistance (11), the test PAD (10) is arranged at the edge of the test slot (9), and a pair of symmetric test PAD (10) is in contact with a pair of pins (19) of the power device to be tested;The test PAD (10) on one side of the gate circuit (4) is connected with the resistance (11) in series and then connected into the gate circuit (4);The test PAD (10) on one side of the drain circuit (5) is connected with the resistance (11) in series and then connected into the drain circuit (5); Each of the power device to be tested is matched with a set of pressure block assembly;The pressure block assembly includes two first pressure blocks (12) and a second pressure block (13) arranged on the upper portion thereof;The first pressure block (12) is a cuboid with a protruding portion (14), and the position of the protruding portion (14) corresponds to the pin (19) on the side of the gate circuit (4) or the side of the drain circuit (5);The second pressure block (13) is a rectangular plate with two notches (15), and the two notches (15) are clamped with the two first pressure blocks (12);Screw holes are formed in the second pressure block (13), and the second pressure block (13) can be fixed on the metal substrate (1) by screws.
2. The reliability experimental fixture of a GaN power device according to claim 1, wherein, N gate PAD (6) is connected with external power supply in parallel, and n drain PAD (7) is connected with external power supply in parallel.
3. The reliability experimental fixture of a GaN power device according to claim 1, wherein, A heat dissipation through hole (16) and a standby input capacitor circuit are arranged near the test PAD (10).
4. The reliability experimental fixture of a GaN power device of claim 1, wherein, The material of the first pressure block (12) is polytetrafluoroethylene, and the material of the second pressure block (13) is wood.
5. The reliability experimental fixture of a GaN power device of claim 1, wherein, The resistance (11) generally has a resistance of 10Ω.
6. The reliability experimental fixture of GaN power device according to claim 1, wherein Multiple sets of the fixture can be stacked by a shelf with a partition, and the metal substrate (1) and the PCB circuit board (2) are provided with third screw holes (23) for fixing the partition.