Switching device of ATE test board

Abstract

The utility model belongs to the technical field of chip testing, and discloses a switching device of an ATE test board. The switching device of the ATE test board comprises a test machine table, a load substrate, a switching board and a connecting device, the load substrate is arranged on the test machine table; the adapter plate is detachably arranged on the load substrate, the size of the adapter plate is smaller than that of the load substrate, a socket is arranged on the adapter plate, and the socket is used for fixing a chip to be tested; the connecting device is arranged between the load substrate and the adapter plate, and the load substrate and the adapter plate can be conducted through the connecting device; the testing machine, the load substrate, the connecting device, the adapter plate and the socket are electrically connected. When the small-sized semiconductor chip is tested, only the adapter plate is replaced, and the size of the adapter plate is smaller than that of the load substrate, so that the time for reallocating resources by probes of a testing machine is saved, the material processing cost is reduced, and the testing efficiency of the small-sized semiconductor chip is improved.

Description

TECHNICAL FIELD

[0001] The utility model relates to chip test technical field especially relates to a switching device of ATE test board. BACKGROUND

[0002] With the rapid development of semiconductor technology, the complexity and integration of chips are continuously improved, and the requirements for testing are increasingly strict. ATE (Automatic Test Equipment) test machine is an important equipment for detecting the performance and defects of chips in the semiconductor manufacturing process. ATE test machines have various types, and each type has its specific application scenario and testing advantage. Among them, ATE test board, as an important tool for semiconductor testing, can be matched with ATE test machine to efficiently complete the function and performance test of chips and ensure the quality of chips. ATE test board plays a core role in the field of semiconductor testing and is commonly known as Loadboard, load test board or load substrate. It is a substrate specially designed for the semiconductor testing link, and its main function is to carry and test the performance of IC (Integrated Circuit) on the test machine. Through precise circuit layout and interface design, ATE test board ensures that IC can stably and accurately exhibit its electrical characteristics and functional performance during testing, thereby providing key data support for quality control and performance evaluation of semiconductor products. The design and production of ATE test board need to be customized according to the specific testing requirements and different types of test machines and chips to be tested.

[0003] Because the test machine allocates test resources according to the testing requirements of the chip to be tested, it needs to replace the test board or reallocate resources for the test board every time a chip test is performed. After replacing the test board each time, a period of time is needed for debugging and calibration to align the test board card with the test interface. The size of the test board of different test machines is fixed, but it belongs to large-size printed board. The larger the size of the test board, the higher the cost and the longer the processing time. When testing small semiconductor chips, using large-size test boards will increase the testing cost and testing time. UTILITY MODEL CONTENT

[0004] The utility model aims at providing a switching device of ATE test board to solve the problem that the size of the test board of different test machines is fixed in the prior art, but it belongs to large-size printed board, the larger the size of the test board, the higher the cost and the longer the processing time, and if large-size test boards are used when testing small semiconductor chips, it will increase the testing cost and testing time, reduce the testing cost of small semiconductor chips and improve the testing efficiency of small semiconductor chips.

[0005] To achieve this purpose, the utility model adopts the following technical solutions:

[0006] The application provides a switching device of an ATE test board, which comprises:

[0007] a test machine;

[0008] a load substrate arranged on the test machine;

[0009] a switching board which is detachably arranged on the load substrate, wherein the size of the switching board is smaller than that of the load substrate, and the switching board is provided with a socket for fixing a chip to be tested;

[0010] a connecting device arranged between the load substrate and the switching board, wherein the connecting device can make the load substrate and the switching board conductive;

[0011] The test machine, the load substrate, the connecting device, the switching board and the socket are electrically connected.

[0012] As an optional technical scheme of the switching device of the ATE test board, the first landing disc module and the second landing disc module are arranged on the side of the load substrate and the switching board which are close to each other, the connecting device comprises a double-end spring needle, and the double-end spring needle is elastically abutted with the metal disc of the first landing disc module and the metal disc of the second landing disc module at two ends.

[0013] As an optional technical scheme of the switching device of the ATE test board, the third landing disc module is arranged on the other side of the load substrate, and the test machine is provided with a probe which is connected with the metal disc of the third landing disc module.

[0014] As an optional technical scheme of the switching device of the ATE test board, the pin definition of the first landing disc module is associated with the pin definition of the third landing disc module, so that the connecting device is electrically connected with the test machine through the load substrate.

[0015] As an optional technical scheme of the switching device of the ATE test board, the socket is arranged on the other side of the switching board, the pin definition of the socket is associated with the pin definition of the second landing disc module, so that the socket is electrically connected with the test machine through the switching board, the connecting device and the load substrate.

[0016] As an optional technical scheme of the switching device of the ATE test board, the first landing disc module, the second landing disc module and the connecting device are multiple and one-to-one corresponding.

[0017] As an optional technical scheme of the adapter device of the ATE test board, the connecting device further comprises a connecting body and a positioning column, the positioning column is arranged on the side of the connecting body close to the load substrate, the load substrate is provided with a first positioning hole, and the positioning column can be inserted into the first positioning hole to position the relative positions of the double-end spring needle and the first landing disc module.

[0018] As an optional technical scheme of the adapter device of the ATE test board, the connecting device further comprises a connecting ear, the connecting ear is arranged on the side wall of the connecting body, the connecting ear is provided with a first through hole, the load substrate is provided with a first threaded hole, and a first bolt can be screwed into the first threaded hole through the first through hole.

[0019] As an optional technical scheme of the adapter device of the ATE test board, the load substrate is provided with a second positioning hole, the adapter plate is provided with a third positioning hole, a positioning pin is fixed to the load substrate through the second positioning hole, and the positioning pin can pass through the third positioning hole to position the relative positions of the double-end spring needle and the second landing disc module.

[0020] As an optional technical scheme of the adapter device of the ATE test board, the adapter plate is provided with a second through hole, the load substrate is provided with a second threaded hole, and a second bolt can be screwed into the second threaded hole through the second through hole.

[0021] The beneficial effects of the utility model are as follows:

[0022] The application discloses an adapter device of an ATE test board, which comprises a test machine, a load substrate, an adapter plate and a connecting device. BRIEF DESCRIPTION OF DRAWINGS

[0023] In order to more clearly illustrate the technical scheme in the embodiments of the utility model, the drawings needed to be used in the description of the embodiments of the utility model will be briefly introduced.

[0024] Figure 1 is a structural schematic view of the switching device of the ATE test board provided by the utility model;

[0025] Figure 2 is a first exploded view of part of the structure of the switching device of the ATE test board provided by the utility model;

[0026] Figure 3 is a first schematic view of part of the structure of the switching device of the ATE test board provided by the utility model;

[0027] Figure 4 is a top view of part of the structure of the switching device of the ATE test board provided by the utility model;

[0028] Figure 5 is a second schematic view of part of the structure of the switching device of the ATE test board provided by the utility model;

[0029] Figure 6 is a second exploded view of part of the structure of the switching device of the ATE test board provided by the utility model;

[0030] Figure 7 is a third exploded view of part of the structure of the switching device of the ATE test board provided by the utility model;

[0031] Figure 8 is a third schematic view of part of the structure of the switching device of the ATE test board provided by the utility model;

[0032] Figure 9 is a side view of part of the structure of the switching device of the ATE test board provided by the utility model.

[0033] In the drawings:

[0034] 10, test machine table;

[0035] 20, load substrate; 21, first landing disc module; 22, third landing disc module; 23, second positioning hole; 24, second threaded hole;

[0036] 30, switching board; 31, socket; 32, second landing disc module; 33, third positioning hole; 34, positioning pin; 35, second through hole; 36, second bolt;

[0037] 40, connecting device; 41, double-end spring needle; 42, connecting body; 43, positioning column; 44, connecting lug; 441, first through hole; 45, first bolt. DETAILED DESCRIPTION

[0038] The utility model will be described in further detail below in combination with the drawings and embodiments. It can be understood that the specific embodiments described herein are merely intended to explain the utility model and not to limit the utility model. In addition, it should be noted that only the parts related to the utility model are shown in the drawings for ease of description, not all the structures.

[0039] In the description of the utility model, unless explicitly defined and limited, the terms "connected", "connected", "fixed" should be understood broadly, for example, it can be fixedly connected, or it can be detachably connected, or it can be integrated; it can be mechanically connected, or it can be electrically connected; it can be directly connected, or it can be indirectly connected through an intermediate medium; it can be the internal communication of two elements or the interaction relationship of two elements. For ordinary skilled in the art, the specific meaning of the above terms in the utility model can be understood according to the specific circumstances.

[0040] In the utility model, unless explicitly defined and limited, the first feature "on" or "below" the second feature can include that the first and second features are in direct contact, or that the first and second features are not in direct contact but are in contact through another feature between them. Moreover, the first feature "on", "above" and "above" the second feature includes that the first feature is directly above and obliquely above the second feature, or only indicates that the horizontal height of the first feature is higher than that of the second feature. The first feature "below", "below" and "below" the second feature includes that the first feature is directly below and obliquely below the second feature, or only indicates that the horizontal height of the first feature is less than that of the second feature.

[0041] In the description of the embodiment, the terms "up", "down", "right", etc. orientation or position relationship is based on the orientation or position relationship shown in the drawings, only for the convenience of description and simplification of operation, and does not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, therefore it cannot be understood as a limitation on the utility model. In addition, the terms "first", "second" are only used to distinguish in the description, and have no special meaning.

[0042] In the prior art, since the test machine allocates test resources according to the test requirements of the chip to be tested, a test board needs to be replaced or resources need to be reallocated for each chip test, and a period of time is needed for debugging and calibration after replacing the test board each time, so that the test board card is aligned with the test interface; the size of the test board of different test machines is fixed, but it belongs to large-size printed board, the larger the size of the test board, the higher the cost, and the longer the processing time; when testing small semiconductor chips, if a large-size test board is used, the test cost and test time will increase.

[0043] To solve the above problems, the embodiment provides an ATE test board switching device, which is referred toFigures 1-9 , including test machine 10, load substrate 20, adapter plate 30 and connecting device 40, load substrate 20 is arranged on test machine 10; adapter plate 30 is detachably arranged on load substrate 20, the size of adapter plate 30 is smaller than the size of load substrate 20, socket 31 is arranged on adapter plate 30, socket 31 is used to fix the chip to be tested; connecting device 40 is arranged between load substrate 20 and adapter plate 30, connecting device 40 can make load substrate 20 and adapter plate 30 conductive; test machine 10, load substrate 20, connecting device 40, adapter plate 30 and socket 31 are electrically connected. When testing small semiconductor chips, only replace adapter plate 30, the size of adapter plate 30 is smaller than the size of load substrate 20, the time of probe redistribution resource of test machine 10 is saved, and the material processing cost is reduced, and the test efficiency of small semiconductor chips is improved.

[0044] Specifically, referring to Figure 2 、 Figure 6 and Figure 8 , load substrate 20 and adapter plate 30 are arranged with first landing disc module 21 and second landing disc module 32 respectively on the side close to each other, connecting device 40 includes double-ended spring needle 41, double-ended spring needle 41 is telescopic at both ends, and is elastically abutted with metal disc of first landing disc module 21 and metal disc of second landing disc module 32 respectively. Double-ended spring needle 41 is connected by abutting with metal disc of first landing disc module 21 and metal disc of second landing disc module 32, without welding, which is convenient for dismounting and replacing adapter plate 30.

[0045] Specifically, first landing disc module 21, second landing disc module 32 and connecting device 40 are multiple and one-to-one correspondence. In the embodiment, eight connecting devices 40 are arranged, and the eight connecting devices 40 are placed in rectangular and placed in the geometric center of load substrate 20.

[0046] Further, referring to Figure 8 and Figure 9 , connecting device 40 further includes connecting body 42 and positioning column 43, positioning column 43 is arranged on the side of connecting body 42 close to load substrate 20, load substrate 20 is provided with first positioning hole, positioning column 43 can be inserted into first positioning hole to position the relative position of double-ended spring needle 41 and first landing disc module 21. Specifically, connecting body 42 is arranged as a cuboid, two positioning columns 43 are arranged on the two sides of connecting body 42 along the length direction at the bottom of each connecting body 42. In other embodiments, four positioning columns 43 can be arranged at four corner portions of connecting body 42.

[0047] Further, referring to Figures 2-4The connecting device 40 further comprises connecting ears 44 provided on the side walls of the connecting body 42, and the connecting ears 44 are provided with first through holes 441, the load substrate 20 is provided with first threaded holes, and first bolts 45 can be screwed into the first threaded holes through the first through holes 441. In the embodiment, the connecting ears 44 are two and are respectively provided on the two sides of the connecting body 42 along the length direction. In other embodiments, the connecting ears 44 can also be provided on the two sides of the connecting body 42 along the width direction. In other embodiments, the connecting ears 44 can be cancelled, and the connecting body 42 can be fixed by buckling or the like.

[0048] Further, referring to Figure 5 , the other side of the load substrate 20 is provided with a third land module 22, and the top of the test machine 10 is provided with a probe connected with the metal disc of the third land module 22. Specifically, the metal disc of the third land module 22 is distributed on one side of the load substrate 20. In the embodiment, the metal disc of the third land module 22 is provided with two pieces.

[0049] Further, the pin definition of the first land module 21 is associated with the pin definition of the third land module 22, so that the connecting device 40 is electrically connected with the test machine 10 through the load substrate 20. Specifically, the first land module 21 and the third land module 22 have the same number of pins, and the bottom, toe and side are the same.

[0050] Further, referring to Figure 7 , the socket 31 is provided on the other side of the adapter plate 30, and the pin definition of the socket 31 is associated with the pin definition of the second land module 32, so that the socket 31 is electrically connected with the test machine 10 through the adapter plate 30, the connecting device 40 and the load substrate 20. Specifically, the socket 31 is two and is provided on the other side of the adapter plate 30, which is convenient for plugging the chip.

[0051] Further, referring to Figures 2-4 , Figure 6 and Figure 7 , the load substrate 20 is provided with a second positioning hole 23, the adapter plate 30 is provided with a third positioning hole 33, and the positioning pin 34 is fixed to the load substrate 20 through the second positioning hole 23 (the positioning pin 34 is fixed in the second positioning hole 23), and the positioning pin 34 can pass through the third positioning hole 33 to position the relative position of the double-end spring needle 41 and the second land module 32. Specifically, the second positioning hole 23 and the positioning pin 34 are provided at the corners of the rectangle formed by the connecting device 40, and the third positioning hole 33 is provided at the corner of the adapter plate 30. In order to more quickly position the relative position of the double-end spring needle 41 and the second land module 32, the second positioning hole 23 and the positioning pin 34 are only provided with two, which are provided at the opposite corners of the rectangle.

[0052] Further, in order to detachably fix the adapter plate 30, the adapter plate 30 is provided with second through holes 35, the load substrate 20 is provided with second threaded holes 24, and the second bolts 36 can be screwed into the second threaded holes 24 through the second through holes 35. Specifically, the second threaded holes 24 are arranged along the edges of the rectangle formed by the connecting device 40, and the second through holes 35 are arranged along the edges of the adapter plate 30. In the embodiment, six second threaded holes 24 are arranged, and in order to increase the fixing stability of the adapter plate 30, two second threaded holes 24 are further arranged at the center of the rectangle formed by the connecting device 40.

[0053] Further, the lengths of the first bolts 45 and the second bolts 36 are such that the needle tips of the double-end spring needles 41 are slightly pressed after the connecting body 42 and the adapter plate 30 are fixed.

[0054] Obviously, the above embodiments of the present application are merely illustrative, and are not intended to limit the embodiments of the present application. For those skilled in the art, various obvious changes, re-adjustments and substitutions can be made without departing from the protection scope of the present application. Here, it is unnecessary and impossible to enumerate all the embodiments. Any modification, equivalent substitution and improvement within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. An adaptor for an ATE test board, characterized by, The utility model relates to a test platform (10); Load substrate (20), load substrate (20) is located test platform (10); Adapter board (30), adapter board (30) is detachably arranged in load substrate (20), the size of adapter board (30) is less than the size of load substrate (20), socket (31) is arranged on adapter board (30), and socket (31) is used for fixing the chip to be tested; Connecting device (40), connecting device (40) is arranged between load substrate (20) and adapter board (30), and connecting device (40) can make load substrate (20) and adapter board (30) conductive; Test platform (10), load substrate (20), connecting device (40), adapter board (30) and socket (31) are electrically connected. The side of load substrate (20) and adapter board (30) is close to each other is provided with first landing disc module (21) and second landing disc module (32) respectively, connecting device (40) includes double-end spring needle (41), and the both ends of double-end spring needle (41) are telescopic and are elastically abutted with the metal disc of first landing disc module (21) and the metal disc of second landing disc module (32) respectively.

2. The adapter for ATE test boards of claim 1, wherein, The other side of load substrate (20) is provided with third landing disc module (22), and the top of test platform (10) is provided with probe, and the probe is connected with the metal disc of third landing disc module (22).

3. The adapter for ATE test boards of claim 2, wherein, The pin definition of first landing disc module (21) is associated with the pin definition of third landing disc module (22), so that connecting device (40) is electrically connected with test platform (10) through load substrate (20).

4. The adapter for ATE test boards of claim 3, wherein, Socket (31) is arranged on the other side of adapter board (30), and the pin definition of socket (31) is associated with the pin definition of second landing disc module (32), so that socket (31) is electrically connected with test platform (10) through adapter board (30), connecting device (40) and load substrate (20).

5. The adapter for ATE test boards of claim 2, wherein, First landing disc module (21), second landing disc module (32) and connecting device (40) are multiple and one-to-one correspondence.

6. The adapter for ATE test boards of claim 2, wherein, Connecting device (40) further includes connecting body (42) and positioning column (43), positioning column (43) is arranged on the side of connecting body (42) close to load substrate (20), load substrate (20) is provided with first positioning hole, and positioning column (43) can be inserted into first positioning hole to position the relative position of double-end spring needle (41) and first landing disc module (21).

7. The adaptor means for an ATE test board according to any one of claims 2 to 6, wherein, Connecting device (40) further includes connecting lug (44), connecting lug (44) is arranged on the side wall of connecting body (42), first through hole (441) is arranged on connecting lug (44), load substrate (20) is provided with first threaded hole, and first bolt (45) can be screwed to first threaded hole through first through hole (441).

8. The adapter for ATE test boards of claim 7, wherein, ​ 9. The adapter for ATE test boards of any of claims 2-6, wherein, The load substrate (20) is provided with a second positioning hole (23), the adapter plate (30) is provided with a third positioning hole (33), a positioning pin (34) is fixed to the load substrate (20) through the second positioning hole (23), and the positioning pin (34) can pass through the third positioning hole (33) to position the relative position of the double-end spring needle (41) and the second landing disc module (32).

10. The adapter for an ATE test board of any of claims 2-6, wherein, The adapter plate (30) is provided with a second through hole (35), the load substrate (20) is provided with a second threaded hole (24), and a second bolt (36) can be screwed to the second threaded hole (24) through the second through hole (35).

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