High-temperature raw sheet detection device

Abstract

The utility model discloses a high-temperature raw sheet detection device which comprises a detection conveying belt, a first screening box is fixedly installed on one side of the detection conveying belt, a second screening box is fixedly installed on the other side of the detection conveying belt, and meanwhile a third screening box is arranged at the tail end of the detection conveying belt. High-temperature raw sheets are placed on the surface of the detection conveying belt, and impurity particles exist on the surfaces of the high-temperature raw sheets. According to the high-temperature raw sheet detection device, impurities generated in high-temperature raw sheet production can be detected, and raw sheets with few impurities or without impurities are stacked together to be manufactured into a traction roller; the conditions of extrusion cracks and poor production at the clamped position of the glass substrate mother board can be avoided, and the traction roller does not need to be checked to remove impurities or replaced; and meanwhile, the operation difficulty is reduced, and the operation risk of personnel is reduced.

Description

Technical Field

[0001] This utility model relates to the field of liquid crystal substrate glass manufacturing, specifically a high-temperature original film testing device. Background Technology

[0002] In the production of LCD glass, the traction roller, used to pull the substrate glass, is mainly composed of asbestos ore. Because manufacturers cannot remove impurities, the finished glass sheets contain embedded impurities. These sheets are stacked together to form the traction roller, which rotates downwards with clamping force from both sides, pulling the glass substrate downwards. Due to the contact between the traction roller and the high-temperature substrate glass, wear occurs in the diameter direction during use, exposing the embedded impurities on the surface. When the impurity-laden area of ​​the traction roller rotates to contact the glass substrate, it can cause compression cracks in the clamped area of ​​the glass substrate, resulting in production defects. Therefore, a high-temperature substrate inspection device is urgently needed to solve these defects. Utility Model Content

[0003] The purpose of this invention is to provide a high-temperature raw film testing device to solve the defects mentioned in the background art.

[0004] To achieve the above objectives, a high-temperature raw film testing device is provided, comprising a testing conveyor belt, a first screening box fixedly installed on one side of the testing conveyor belt, a second screening box fixedly installed on the other side of the testing conveyor belt, and a third screening box provided at the tail end of the testing conveyor belt. High-temperature raw films are placed on the surface of the testing conveyor belt, and the surface of the high-temperature raw films contains impurity particles. A first limit stop and a second limit stop are respectively installed on both sides of the surface of the testing conveyor belt. The first limit stop and the second limit stop are both fixedly installed on the outer frame of the testing conveyor belt through adjusting seats. A fixed platform is fixedly installed on the outer frame of the testing conveyor belt, and a mounting frame is provided on the surface of the fixed platform. An X-ray scanning device is screwed onto the surface of the mounting frame.

[0005] Preferably, the bottom of the X-ray scanning device is equipped with an end cap, which is positioned above the middle of the inspection conveyor belt, and the mounting frame at the bottom of the X-ray scanning device is U-shaped.

[0006] Preferably, the first limit stop and the second limit stop are symmetrical about the central axis of the detection conveyor belt, and the cross-sections of the first limit stop and the second limit stop are both "L" shaped.

[0007] Preferably, baffles are fixedly provided at the ends of the first limit stop and the second limit stop, and a detection limit channel is formed between the first limit stop and the second limit stop. At the same time, a high-temperature original plate is provided inside the detection limit channel.

[0008] Preferably, the end of the adjusting seat is fixedly mounted on the outer frame of the detection conveyor belt, and the adjusting seat has an adjusting port in the middle. A stud is inserted inside the adjusting port, and a nut is screwed onto the stud.

[0009] Preferably, a positioning seat is fixedly installed at the bottom of the stud, and the bottom of the positioning seat is welded to the surface of the first limit stop.

[0010] Preferably, the surface of the high-temperature original sheet is provided with a sample sheet, which is rectangular in shape, and six sets of reference steel balls are uniformly arranged on the surface of the sample sheet, with the diameters of the six sets of reference steel balls increasing in a geometric sequence.

[0011] Compared with the prior art, the beneficial effects of this utility model are as follows: The size and distribution area of ​​impurities are detected by the detection equipment; the impurity size corresponding to the diameter of the high-temperature raw sheet is used according to the actual production process; they are divided into three grades, A, B, and C, and placed inside the first, second, and third screening boxes respectively; they are detected by professional equipment; and they are transferred to the sorting area and placed into different sorting boxes according to the judgment results; impurities generated during the production of high-temperature raw sheets can be detected, and raw sheets with fewer or no impurities are stacked together to form traction rollers; this avoids the occurrence of extrusion cracks and production defects in the clamping position of the glass substrate motherboard, eliminating the need to inspect and remove impurities from the traction rollers or replace them; it reduces abnormal maintenance time, while also reducing operational difficulty and personnel operational risks. Attached Figure Description

[0012] Figure 1 This is a front view schematic diagram of the structure of this utility model;

[0013] Figure 2 for Figure 1 A bottom view;

[0014] Figure 3 for Figure 1 Top view;

[0015] Figure 4 for Figure 1 A sectional view.

[0016] The following are labels in the diagram: 1. Inspection conveyor belt; 2. Fixed platform; 3. Mounting frame; 4. X-ray scanning device; 41. End; 5. First screening box; 51. Second screening box; 52. Third screening box; 6. High-temperature raw film; 61. Impurity particles; 62. Sample film; 63. Reference steel ball; 7. First limit stop; 71. Second limit stop; 8. Adjusting seat; 81. Adjusting port; 82. Nut; 83. Stud; 84. Positioning seat. Detailed Implementation

[0017] Please see Figure 1-4This utility model provides a high-temperature raw film testing device, including a testing conveyor belt 1, a first screening box 5 fixedly installed on one side of the testing conveyor belt 1, and a second screening box 51 fixedly installed on the other side of the testing conveyor belt 1. At the same time, a third screening box 52 is provided at the tail end of the testing conveyor belt 1. A high-temperature raw film 6 is placed on the surface of the testing conveyor belt 1, and the surface of the high-temperature raw film 6 has impurity particles 61. A first limit stop 7 and a second limit stop 71 are respectively installed on both sides of the surface of the testing conveyor belt 1. The first limit stop 7 and the second limit stop 71 are both fixedly installed on the outer frame of the testing conveyor belt 1 through adjusting seats 8. A fixed platform 2 is fixedly installed on the outer frame of the testing conveyor belt 1. A mounting frame 3 is provided on the surface of the fixed platform 2, and an X-ray scanning device 4 is screwed onto the surface of the mounting frame 3.

[0018] When multiple sets of high-temperature original films 6 move on the surface of the detection conveyor belt 1, the surface of the detection conveyor belt 1 is respectively provided with a first limit stop 7 and a second limit stop 71; a detection limiting channel is formed between the first limit stop 7 and the second limit stop 71, and the high-temperature original films 6 are placed inside the detection limiting channel, so that the high-temperature original films 6 will not tilt or move when moving, so that the high-temperature original films 6 can be accurately detected by the end 41 at the bottom of the X-ray scanning device 4; the distance between the first limit stop 7 and the second limit stop 71 can be adjusted by adjusting seat 8, adjusting port 81, nut 82, stud 83 and positioning seat 84, so as to adapt to high-temperature original films 6 of different diameters;

[0019] Based on the traction roller material used in glass substrate production and the process requirements, the high-temperature raw sheet 6 is inspected and classified. Impurities ≥1.5mm in size are marked. The high-temperature raw sheet 6 is classified and used according to the operating conditions. A professional inspection device, X-ray scanning device 4, can detect the location and size of impurities inside the raw sheet and mark them. The high-temperature raw sheet 6 is scanned with X-rays. The high-temperature raw sheet 6 is scanned using the strong penetrating power of X-rays. The density of the object is detected based on the density difference of the object to be tested. The substance with the higher internal density is marked in black. The higher the relative density, the darker the color. Conversely, the lighter the color, the lower the relative density. A sample sheet 62 is attached to the surface of the high-temperature raw sheet 6 being tested.

[0020] A row of reference steel balls 63 is distributed on sample 62; the diameters of the six sets of reference steel balls 63 increase in a geometric progression; the size of the detected impurity particles 61 is determined; the size and position of the known steel balls on the detection diagram are measured by actual measurement; the size and positional relationship of the detected impurity particles 61 on the high-temperature original sheet 6 are confirmed by ratio conversion; based on the two necessary conditions of the size of the detected impurity particles 61 and the diameter of the impurity on the circumference, a sorting device is added with a first screening box 5, a second screening box 51, and a third screening box 52; they are classified into three grades: A, B, and C; grade A is used for the traction roller #2; grade B is used for rollers #4, #6, #8, and #10; grade C is used for the coating roller #1; it is known that professional testing equipment can detect substances with a diameter of 0.1mm under no-load accuracy; with the addition of the high-temperature original sheet 6 for testing; multiple measurements and comparisons are performed; the smallest detectable impurity is 0.3mm in diameter, far exceeding the process requirement of ≤1.5mm;

[0021] like Figure 1-3 As shown: X-ray scanning device 4 is a professional testing equipment; for the first testing of the original film, a sample film 62 needs to be attached to the surface of the high-temperature original film 6; after passing through the testing equipment; based on the image detected by the equipment; the size is compared with the known size of the original film; the size of the known steel ball on the sample film 62 is compared with the image; the size of the impurities detected on the high-temperature original film 6 is compared with the known size of the steel ball on the sample film 62; based on the actual test results, the size of the impurities and their distribution along the diameter of the high-temperature original film 6 are determined.

[0022] like Figure 1-3 As shown: A sample piece 62 is installed on the high-temperature original sheet 6; the size ratio of the image after testing with the actual high-temperature original sheet 6 is calculated; the size of the steel ball of the sample piece 62 and its distance from the center of the high-temperature original sheet 6 are marked on the image to confirm its position.

[0023] like Figure 1-3 As shown: After the high-temperature original sheet 6 is fitted with sample sheet 62, the size and distribution area of ​​impurities are detected by the testing equipment. According to the actual production process, the impurity size corresponding to the diameter of the high-temperature original sheet 6 is divided into three levels: A, B, and C. After being tested by professional equipment, the sample sheet 6 is transferred to the sorting area and placed into different sorting boxes according to the judgment results.

[0024] In a preferred embodiment, the bottom of the X-ray scanning device 4 is equipped with an end 41, and the end 41 is positioned above the middle of the inspection conveyor belt 1. Meanwhile, the mounting bracket 3 at the bottom of the X-ray scanning device 4 is U-shaped.

[0025] The first limit stop 7 and the second limit stop 71 are symmetrical about the central axis of the detection conveyor belt 1, and the cross-sections of the first limit stop 7 and the second limit stop 71 are both set in an "L" shape.

[0026] In a preferred embodiment, baffles are fixedly provided at the ends of the first limit stop 7 and the second limit stop 71, and a detection limit channel is formed between the first limit stop 7 and the second limit stop 71. At the same time, a high-temperature plate 6 is provided inside the detection limit channel.

[0027] The adjusting seat 8 is fixedly mounted on the outer frame of the detection conveyor belt 1 at its end, and an adjusting port 81 is opened in the middle of the adjusting seat 8. A stud 83 is inserted inside the adjusting port 81, and a nut 82 is screwed onto the stud 83.

[0028] In a preferred embodiment, a positioning seat 84 is fixedly installed at the bottom of the stud 83, and the bottom of the positioning seat 84 is welded to the surface of the first limit stop 7.

[0029] The surface of the high-temperature original sheet 6 is provided with a sample sheet 62, which is rectangular. At the same time, six sets of reference steel balls 63 are evenly distributed on the surface of the sample sheet 62, and the diameters of the six sets of reference steel balls 63 increase in a geometric sequence.

Claims

1. A high temperature wafer inspection apparatus comprising an inspection conveyor belt (1), characterized in that: The side of the detection conveying belt (1) is fixedly provided with a first screening box (5), and the other side of the detection conveying belt (1) is fixedly provided with a second screening box (51), and the tail end of the detection conveying belt (1) is provided with a third screening box (52), and the surface of the detection conveying belt (1) is placed with a high-temperature original sheet (6), the surface of the high-temperature original sheet (6) has impurity particles (61), and the surface of the detection conveying belt (1) is provided with a first limiting stop (7) and a second limiting stop (71) respectively, and the first limiting stop (7) and the second limiting stop (71) are fixedly arranged on the outer frame of the detection conveying belt (1) through adjusting seats (8), and the outer frame of the detection conveying belt (1) is fixedly provided with a fixed table (2), and the surface of the fixed table (2) is provided with a mounting bracket (3), and the surface of the mounting bracket (3) is screw-connected with an X-ray scanning device (4).

2. The high temperature wafer inspection apparatus of claim 1, wherein: The bottom of the X-ray scanning device (4) is provided with an end (41), and the end (41) is arranged above the middle of the detection conveying belt (1), and the mounting bracket (3) at the bottom of the X-ray scanning device (4) is arranged in a "U" shape.

3. The high temperature wafer inspection apparatus of claim 1, wherein: The first limiting stop (7) and the second limiting stop (71) are symmetrical structures about the central axis of the detection conveying belt (1), and the cross sections of the first limiting stop (7) and the second limiting stop (71) are arranged in an "L" shape.

4. The high temperature wafer inspection apparatus of claim 3, wherein: The end of the first limiting stop (7) and the second limiting stop (71) is fixedly provided with a baffle, and a detection limiting channel is formed between the first limiting stop (7) and the second limiting stop (71), and the high-temperature original sheet (6) is arranged in the detection limiting channel.

5. The high temperature wafer inspection apparatus of claim 1, wherein: The end of the adjusting seat (8) is fixedly arranged on the outer frame of the detection conveying belt (1), and the middle part of the adjusting seat (8) is provided with an adjusting opening (81), and the adjusting opening (81) is provided with a stud (83), and the stud (83) is screw-connected with a nut (82).

6. The high temperature wafer inspection apparatus of claim 5, wherein: The bottom of the stud (83) is fixedly provided with a positioning seat (84), and the bottom of the positioning seat (84) is welded on the surface of the first limiting stop (7).

7. The high temperature wafer inspection apparatus of claim 1, wherein: The surface of the high-temperature original sheet (6) is provided with a sample sheet (62), and the sample sheet (62) is arranged in a rectangular shape, and the surface of the sample sheet (62) is uniformly provided with six groups of reference steel balls (63), and the diameters of the six groups of reference steel balls (63) increase in equal ratio.

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