Insulated gate bipolar transistor (IGBT) thermal performance test tool

Abstract

The utility model discloses an IGBT thermal performance test tool which comprises a supporting box body, a test box body is fixedly installed above the supporting box body, a first linear sliding rail which is horizontally arranged is installed between the test box body and the supporting box body, and a heating table which reciprocates in the horizontal direction is installed above the first linear sliding rail. A plurality of object carrying grooves are uniformly distributed in the upper surface of the heating table; an electrical socket is fixedly mounted at the side part of the inner cavity of the test box body; an electrical plug matched with the electrical socket is fixedly mounted at the side part of the heating table; and a thermal imaging mechanism reciprocating along the horizontal direction is mounted at the upper part of the inner cavity of the test box body. According to the IGBT thermal performance test tool provided by the utility model, synchronous testing of batch devices can be realized, the automation degree of the synchronous testing process is relatively high, and the thermal performance test efficiency can be significantly improved.

Description

Technical Field

[0001] This utility model relates to an IGBT thermal performance testing fixture, belonging to the field of thermal testing technology. Background Technology

[0002] IGBT, or Insulated Gate Bipolar Transistor, is a composite, fully controllable, voltage-driven power semiconductor device composed of a BJT (Bipolar Junction Transistor) and a MOSFET (Metal-Oxide-Semiconductor Field-Effect Transistor). It combines the advantages of the high input impedance of a MOSFET and the low on-state voltage drop of a GTR. It is ideally suited for applications in converter systems with DC voltages of 600V and above, such as AC motors, frequency converters, switching power supplies, lighting circuits, and traction drives.

[0003] IGBT modules generate heat during operation. As the heat accumulates, the output power will decrease significantly, and the module will not be able to perform at its full potential. Therefore, thermal performance testing is required during the design and production of IGBT modules.

[0004] However, traditional IGBT thermal performance testing fixtures can only perform clamping and testing of single devices, resulting in low testing efficiency and hindering the simultaneous testing of batches of devices. Furthermore, the automation of the thermal performance testing process is low, leaving significant room for improvement.

[0005] In conclusion, the existing technology obviously has inconveniences and defects in practical use, so it is necessary to improve it. Utility Model Content

[0006] This invention addresses the shortcomings of the prior art by providing an IGBT thermal performance testing fixture that enables simultaneous testing of batches of devices. The simultaneous testing process is highly automated, significantly improving the efficiency of thermal performance testing.

[0007] To solve the above technical problems, the present invention adopts the following technical solution:

[0008] The IGBT thermal performance testing fixture includes a support housing, a test housing fixedly mounted on top of the support housing, a horizontally arranged first linear slide rail between the test housing and the support housing, a heating stage reciprocating horizontally mounted above the first linear slide rail, and multiple uniformly distributed loading slots on the upper surface of the heating stage; an electrical socket fixedly mounted on the side of the inner cavity of the test housing, and an electrical plug compatible with the electrical socket fixedly mounted on the side of the heating stage; and a thermal imaging mechanism reciprocating horizontally mounted on the upper part of the inner cavity of the test housing.

[0009] Furthermore, the bottom of the heating platform is slidably mounted on the first linear slide rail via the first slider.

[0010] Furthermore, the heating platform is connected to the head of the second telescopic cylinder on the side near the test chamber, and the cylinder body of the second telescopic cylinder is fixed to the outer wall of the test chamber in a horizontal manner.

[0011] Furthermore, the test chamber has an opening on its side, and a sealing gate is installed at the opening.

[0012] Furthermore, the top of the sealing gate is connected to a first telescopic cylinder that is vertically downward.

[0013] Furthermore, the first telescopic cylinder is fixed to the top of the test chamber via a bracket.

[0014] Furthermore, the thermal imaging mechanism is fixedly installed at the bottom of the second slider, the second slider is slidably mounted on the second linear slide rail, and the second linear slide rail is horizontally mounted and fixed to the top of the inner cavity of the test chamber.

[0015] Furthermore, the side of the thermal imaging mechanism is connected to the head of the third telescopic cylinder, and the cylinder body of the third telescopic cylinder is horizontally fixed to the outer wall of the test chamber.

[0016] Compared with the prior art, the present invention, by adopting the above technical solution, has the following advantages:

[0017] In this invention, the second telescopic cylinder retracts to slide the heating stage and the test piece into the inner cavity of the test chamber, while the first telescopic cylinder drives the sealing gate to seal the inner cavity of the test chamber, ensuring a stable testing environment inside the test chamber. The electrical plug is connected to the electrical socket as the heating stage moves, and the heating stage is powered on to perform the heating function. The third telescopic cylinder drives the thermal imaging mechanism to move, and thermal images of each test piece on the heating stage can be collected during the movement.

[0018] This invention enables simultaneous testing of batches of devices. The simultaneous testing process is highly automated and can significantly improve the efficiency of thermal performance testing.

[0019] The present invention will now be described in detail with reference to the accompanying drawings and embodiments. Attached Figure Description

[0020] Figure 1 This is a schematic diagram of the structure of this utility model;

[0021] Figure 2 This is a schematic diagram of the utility model in use.

[0022] In the figure, 1-support box, 2-test box, 3-sealing gate, 4-first telescopic cylinder, 5-bracket, 6-first linear slide rail, 7-first slider, 8-heating table, 9-test piece, 10-second telescopic cylinder, 11-electric plug, 12-electric socket, 13-thermal imaging mechanism, 14-second slider, 15-second linear slide rail, 16-third telescopic cylinder. Detailed Implementation

[0023] To provide a clearer understanding of the technical features, objectives, and effects of this utility model, the specific embodiments of this utility model are now described with reference to the accompanying drawings.

[0024] like Figure 1 and Figure 2 As shown in the figure, this utility model provides an IGBT thermal performance testing fixture, including a support box 1, a test box 2 fixedly installed on the top of the support box 1, a horizontally arranged first linear slide rail 6 installed between the test box 2 and the support box 1, a heating stage 8 that reciprocates in the horizontal direction installed above the first linear slide rail 6, and the bottom of the heating stage 8 is slidably disposed on the first linear slide rail 6 by a first slider 7.

[0025] The upper surface of the heating stage 8 has multiple uniformly distributed loading slots, and the test piece 9 is placed in each loading slot.

[0026] The heating platform 8 is connected to the head of the second telescopic cylinder 10 on the side near the test chamber 2. The cylinder body of the second telescopic cylinder 10 is horizontally fixed to the outer wall of the test chamber 2. The second telescopic cylinder 10 provides power for the reciprocating motion of the heating platform 8.

[0027] The test chamber 2 has an open end on its side, and a sealing gate 3 is installed at the open end. The top of the sealing gate 3 is connected to a first telescopic cylinder 4 that is set vertically downward. The first telescopic cylinder 4 is fixed to the top of the test chamber 2 by a bracket 5. The sealing gate 3 is used to seal the inner cavity of the test chamber 2 to ensure a stable test environment inside the test chamber 2.

[0028] An electrical socket 12 is fixedly installed on the inner side of the test chamber 2, and an electrical plug 11 that mates with the electrical socket 12 is fixedly installed on the side of the heating platform 8. The electrical plug 11 moves back and forth with the heating platform 8, and during the movement, it connects with the electrical socket 12. After connection, the heating platform 8 is powered and realizes the heating function.

[0029] A thermal imaging mechanism 13 that reciprocates in the horizontal direction is installed on the upper part of the inner cavity of the test chamber 2. During the movement, the thermal imaging mechanism 13 can collect thermal images of each test piece 9 on the heating platform 8.

[0030] The thermal imaging mechanism 13 is fixedly installed at the bottom of the second slider 14, the second slider 14 is slidably mounted on the second linear slide rail 15, and the second linear slide rail 15 is horizontally mounted and fixed to the top of the inner cavity of the test chamber 2.

[0031] The side of the thermal imaging mechanism 13 is connected to the head of the third telescopic cylinder 16. The cylinder body of the third telescopic cylinder 16 is horizontally fixed to the outer wall of the test chamber 2. The third telescopic cylinder 16 provides power for the reciprocating motion of the thermal imaging mechanism 13.

[0032] The specific working principle of this utility model is as follows:

[0033] The IGBT test piece 9 is placed in the loading slot of the heating stage 8. The second telescopic cylinder 10 retracts, sliding the heating stage 8 and the test piece 9 into the inner cavity of the test chamber 2. The first telescopic cylinder 4 extends, driving the sealing gate 3 to descend and seal the inner cavity of the test chamber 2, ensuring a stable testing environment inside the test chamber 2. The electrical plug 11 is connected to the electrical socket 12 as the heating stage 8 moves. After connection, the heating stage 8 is powered and realizes the heating function. The third telescopic cylinder 16 drives the thermal imaging mechanism 13 to move, and during the movement, thermal images of each test piece 9 on the heating stage 8 can be collected.

[0034] The above description provides examples of the preferred embodiments of this utility model. Any aspects not detailed herein are common knowledge to those skilled in the art. The scope of protection of this utility model is determined by the claims. Any equivalent modifications based on the technical teachings of this utility model are also within the scope of protection of this utility model.

Claims

1. An IGBT thermal performance test fixture, characterized in that: The utility model provides a test box, including support box (1), the upper portion of support box (1) is fixedly installed with test box (2), and the first linear slide (6) of horizontal setting is installed between test box (2) and support box (1), the heating table (8) of reciprocating motion along horizontal direction is installed above first linear slide (6), and the upper surface of heating table (8) has multiple load grooves that distribute uniformly, the inner chamber side of test box (2) is fixedly installed with electrical socket (12), and the side of heating table (8) is fixedly installed with the electrical plug (11) matched with electrical socket (12), and the inner chamber upper portion of test box (2) is installed with the thermal imaging mechanism (13) of reciprocating motion along horizontal direction.

2. The IGBT thermal performance test fixture of claim 1, wherein: The bottom of the heating table (8) is slidably arranged on the first linear slide (6) through the first sliding block (7).

3. The IGBT thermal performance test fixture of claim 1, wherein: The side of the heating table (8) close to the test box (2) is connected with the head of the second telescopic cylinder (10), and the cylinder body of the second telescopic cylinder (10) is fixedly arranged on the outer wall of the test box (2) in a horizontal manner.

4. The IGBT thermal performance test fixture of claim 1, wherein: The side of the test box (2) is provided with an open end, and the sealing gate (3) is installed at the open end.

5. The IGBT thermal performance test fixture of claim 4, wherein: The top of the sealing gate (3) is connected with the first telescopic cylinder (4) arranged in a vertical downward manner.

6. The IGBT thermal performance test fixture of claim 5, wherein: The first telescopic cylinder (4) is fixedly connected to the upper portion of the test box (2) through the support (5).

7. The IGBT thermal performance test fixture of claim 1, wherein: The thermal imaging mechanism (13) is fixedly installed at the bottom of the second sliding block (14), the second sliding block (14) is slidably arranged on the second linear slide (15), and the second linear slide (15) is fixedly arranged on the top of the inner chamber of the test box (2) in a horizontal manner.

8. The IGBT thermal performance test fixture of claim 7, wherein: The side of the thermal imaging mechanism (13) is connected with the head of the third telescopic cylinder (16), and the cylinder body of the third telescopic cylinder (16) is fixedly arranged on the outer wall of the test box (2) in a horizontal manner.

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